The Mobile
Broadband Standard

3GPP TDocs (written contributions) at meeting

Meeting: R4-89 - 2018-11-12 to 2018-11-16, Spokane

meeting id: R4-89 (click id for more info on this meeting)

Click on the Tdoc to open its file.

TDoc Title Source Remarks
R4‑1814400 Agenda for RAN4#89 RAN4 Chairman imported from 3GU
R4‑1814400 Agenda for RAN4#89 RAN4 Chairman imported from 3GU
R4‑1814400 Agenda for RAN4#89 RAN4 Chairman imported from 3GU
R4‑1814401 RAN4#88-Bis Meeting Report ETSI MCC imported from 3GU
R4‑1814401 RAN4#88-Bis Meeting Report ETSI MCC imported from 3GU
R4‑1814401 RAN4#88-Bis Meeting Report ETSI MCC imported from 3GU
R4‑1814402 LS on RSRP measurements using RSS for Rel-16 LTE-MTC RAN1, Ericsson imported from 3GU
R4‑1814402 LS on RSRP measurements using RSS for Rel-16 LTE-MTC RAN1, Ericsson imported from 3GU
R4‑1814402 LS on RSRP measurements using RSS for Rel-16 LTE-MTC RAN1, Ericsson imported from 3GU
R4‑1814403 Reply LS on power class for FR1 EN-DC and NR CA RAN1, Samsung imported from 3GU
R4‑1814403 Reply LS on power class for FR1 EN-DC and NR CA RAN1, Samsung imported from 3GU
R4‑1814403 Reply LS on power class for FR1 EN-DC and NR CA RAN1, Samsung imported from 3GU
R4‑1814404 LS on wideband carrier operation for NR-U RAN1, Ericsson imported from 3GU
R4‑1814404 LS on wideband carrier operation for NR-U RAN1, Ericsson imported from 3GU
R4‑1814404 LS on wideband carrier operation for NR-U RAN1, Ericsson imported from 3GU
R4‑1814405 Reply LS on intra-band combination for NR CA and MR-DC RAN1, Intel imported from 3GU
R4‑1814405 Reply LS on intra-band combination for NR CA and MR-DC RAN1, Intel imported from 3GU
R4‑1814405 Reply LS on intra-band combination for NR CA and MR-DC RAN1, Intel imported from 3GU
R4‑1814406 LS on RAN1 NR UE features update RAN1, NTT DOCOMO, INC., AT&T imported from 3GU
R4‑1814406 LS on RAN1 NR UE features update RAN1, NTT DOCOMO, INC., AT&T imported from 3GU
R4‑1814406 LS on RAN1 NR UE features update RAN1, NTT DOCOMO, INC., AT&T imported from 3GU
R4‑1814407 LS on the interruption time during mobility in LTE RAN2, Nokia imported from 3GU
R4‑1814407 LS on the interruption time during mobility in LTE RAN2, Nokia imported from 3GU
R4‑1814407 LS on the interruption time during mobility in LTE RAN2, Nokia imported from 3GU
R4‑1814408 LS on frequency separation class RAN2, Qualcomm imported from 3GU
R4‑1814408 LS on frequency separation class RAN2, Qualcomm imported from 3GU
R4‑1814408 LS on frequency separation class RAN2, Qualcomm imported from 3GU
R4‑1814409 LS on SFN offset for OTDOA RAN2, Intel imported from 3GU
R4‑1814409 LS on SFN offset for OTDOA RAN2, Intel imported from 3GU
R4‑1814409 LS on SFN offset for OTDOA RAN2, Intel imported from 3GU
R4‑1814410 LS on MIMO layer configuration RAN2, MediaTek imported from 3GU
R4‑1814410 LS on MIMO layer configuration RAN2, MediaTek imported from 3GU
R4‑1814410 LS on MIMO layer configuration RAN2, MediaTek imported from 3GU
R4‑1814411 LS on late drop UE capabilities RAN2, Huawei imported from 3GU
R4‑1814411 LS on late drop UE capabilities RAN2, Huawei imported from 3GU
R4‑1814411 LS on late drop UE capabilities RAN2, Huawei imported from 3GU
R4‑1814412 Reply LS on RAN4 design on channel bandwidth RAN2, Qualcomm imported from 3GU
R4‑1814412 Reply LS on RAN4 design on channel bandwidth RAN2, Qualcomm imported from 3GU
R4‑1814412 Reply LS on RAN4 design on channel bandwidth RAN2, Qualcomm imported from 3GU
R4‑1814413 LS to RAN4 on uncertainties for OTA signalling test setup RAN5, Anritsu imported from 3GU
R4‑1814413 LS to RAN4 on uncertainties for OTA signalling test setup RAN5, Anritsu imported from 3GU
R4‑1814413 LS to RAN4 on uncertainties for OTA signalling test setup RAN5, Anritsu imported from 3GU
R4‑1814414 LS to RAN4 on simultaneous LTE and NR transmissions in EN-DC RAN5, Keysight imported from 3GU
R4‑1814414 LS to RAN4 on simultaneous LTE and NR transmissions in EN-DC RAN5, Keysight imported from 3GU
R4‑1814414 LS to RAN4 on simultaneous LTE and NR transmissions in EN-DC RAN5, Keysight imported from 3GU
R4‑1814415 LS on RAN4-RAN5 5G-NR RF pending issues during RAN5#3-5G-NR Adhoc RAN5, NTT DOCOMO imported from 3GU
R4‑1814415 LS on RAN4-RAN5 5G-NR RF pending issues during RAN5#3-5G-NR Adhoc RAN5, NTT DOCOMO imported from 3GU
R4‑1814415 LS on RAN4-RAN5 5G-NR RF pending issues during RAN5#3-5G-NR Adhoc RAN5, NTT DOCOMO imported from 3GU
R4‑1814416 Definition of test methods for Over-The-Air unwanted emissions of IMT radio equipment ITU-R Working Party 5D imported from 3GU
R4‑1814416 Definition of test methods for Over-The-Air unwanted emissions of IMT radio equipment ITU-R Working Party 5D imported from 3GU
R4‑1814416 Definition of test methods for Over-The-Air unwanted emissions of IMT radio equipment ITU-R Working Party 5D imported from 3GU
R4‑1814417 CHARACTERISTICS OF IMT-ADVANCED, IMT-2020 AND ADVANCED ANTENNA SYSTEMS FOR ITU-R SHARING AND COMPATIBILITY ^^STUDIES IN THE FREQUENCY BAND 3 300-3 400 MHz ITU-R Working Party 5D imported from 3GU
R4‑1814417 CHARACTERISTICS OF IMT-ADVANCED, IMT-2020 AND ADVANCED ANTENNA SYSTEMS FOR ITU-R SHARING AND COMPATIBILITY ^^STUDIES IN THE FREQUENCY BAND 3 300-3 400 MHz ITU-R Working Party 5D imported from 3GU
R4‑1814417 CHARACTERISTICS OF IMT-ADVANCED, IMT-2020 AND ADVANCED ANTENNA SYSTEMS FOR ITU-R SHARING AND COMPATIBILITY STUDIES IN THE FREQUENCY BAND 3 300-3 400 MHz ITU-R Working Party 5D imported from 3GU
R4‑1814418 CEPT/ECC developments in the 410 - 430MHz band CEPT ECC Working Group FM imported from 3GU
R4‑1814418 CEPT/ECC developments in the 410 - 430MHz band CEPT ECC Working Group FM imported from 3GU
R4‑1814418 CEPT/ECC developments in the 410 - 430MHz band CEPT ECC Working Group FM imported from 3GU
R4‑1814419 On Min. EIRP at target CDF for spherical coverage Keysight Technologies UK Ltd, Rohde & Schwarz imported from 3GU
R4‑1814419 On Min. EIRP at target CDF for spherical coverage Keysight Technologies UK Ltd, Rohde & Schwarz imported from 3GU
R4‑1814419 On Min. EIRP at target CDF for spherical coverage Keysight Technologies UK Ltd, Rohde & Schwarz imported from 3GU
R4‑1814420 On Beam Peak Search Measurement Grids Keysight Technologies UK Ltd imported from 3GU
R4‑1814420 On Beam Peak Search Measurement Grids Keysight Technologies UK Ltd imported from 3GU
R4‑1814420 On Beam Peak Search Measurement Grids Keysight Technologies UK Ltd imported from 3GU
R4‑1814421 Correction to applicability of requirements for Category M1 and M2 UEs Spirent Communications imported from 3GU
R4‑1814421 Correction to applicability of requirements for Category M1 and M2 UEs Spirent Communications imported from 3GU
R4‑1814421 Correction to applicability of requirements for Category M1 and M2 UEs Spirent Communications imported from 3GU
R4‑1814422 Correction to applicability of requirements for Category M1 and M2 UEs Spirent Communications imported from 3GU
R4‑1814422 Correction to applicability of requirements for Category M1 and M2 UEs Spirent Communications imported from 3GU
R4‑1814422 Correction to applicability of requirements for Category M1 and M2 UEs Spirent Communications imported from 3GU
R4‑1814423 Baseline text proposal for TS 38.171 Spirent Communications imported from 3GU
R4‑1814423 Baseline text proposal for TS 38.171 Spirent Communications imported from 3GU
R4‑1814423 Baseline text proposal for TS 38.171 Spirent Communications imported from 3GU
R4‑1814424 Draft TS 38.171 v0.2.0 Spirent Communications imported from 3GU
R4‑1814424 Draft TS 38.171 Spirent Communications imported from 3GU
R4‑1814424 Draft TS 38.171 v0.2.0 Spirent Communications imported from 3GU
R4‑1814425 Simplification of requirements for EN-DC configuration including FR2 NTT DOCOMO, INC. imported from 3GU
R4‑1814425 Simplification of requirements for EN-DC configuration including FR2 NTT DOCOMO, INC. imported from 3GU
R4‑1814425 Simplification of requirements for EN-DC configuration including FR2 NTT DOCOMO, INC. imported from 3GU
R4‑1814426 Correction on REFSENS exception of CA_3A-28A-42C for REL-14 SoftBank Corp. imported from 3GU
R4‑1814426 Correction on REFSENS exception of CA_3A-28A-42C for REL-14 SoftBank Corp. imported from 3GU
R4‑1814426 Correction on REFSENS exception of CA_3A-28A-42C for REL-14 SoftBank Corp. imported from 3GU
R4‑1814427 TP to TS 38.141-1: transmitted signal quality (Section 6.5) ZTE Corporation imported from 3GU
R4‑1814427 TP to TS 38.141-1: transmitted signal quality (Section 6.5) ZTE Corporation imported from 3GU
R4‑1814427 TP to TS 38.141-1: transmitted signal quality (Section 6.5) ZTE Corporation imported from 3GU
R4‑1814428 Correction on REFSENS exception of CA_3A-28A-42C for REL-15 SoftBank Corp. imported from 3GU
R4‑1814428 Correction on REFSENS exception of CA_3A-28A-42C for REL-15 SoftBank Corp. imported from 3GU
R4‑1814428 Correction on REFSENS exception of CA_3A-28A-42C for REL-15 SoftBank Corp. imported from 3GU
R4‑1814429 TP to TS 38.141-1: Transmit ON/OFF power (Section 6.4) ZTE Corporation imported from 3GU
R4‑1814429 TP to TS 38.141-1: Transmit ON/OFF power (Section 6.4) ZTE Corporation imported from 3GU
R4‑1814429 TP to TS 38.141-1: Transmit ON/OFF power (Section 6.4) ZTE Corporation imported from 3GU
R4‑1814430 PDCCH demodulation requirements for 4Rx AL16 China Telecom imported from 3GU
R4‑1814430 PDCCH demodulation requirements for 4Rx AL16 China Telecom imported from 3GU
R4‑1814430 PDCCH demodulation requirements for 4Rx AL16 China Telecom imported from 3GU
R4‑1814431 PBCH demodulation requirements for 4Rx China Telecom imported from 3GU
R4‑1814431 PBCH demodulation requirements for 4Rx China Telecom imported from 3GU
R4‑1814431 PBCH demodulation requirements for 4Rx China Telecom imported from 3GU
R4‑1814432 Summary of ideal results for NR BS demodulation requirements China Telecom imported from 3GU
R4‑1814432 Summary of ideal results for NR BS demodulation requirements China Telecom imported from 3GU
R4‑1814432 Summary of ideal results for NR BS demodulation requirements China Telecom imported from 3GU
R4‑1814433 Summary of impairment results for NR BS demodulation requirements China Telecom imported from 3GU
R4‑1814433 Summary of impairment results for NR BS demodulation requirements China Telecom imported from 3GU
R4‑1814433 Summary of impairment results for NR BS demodulation requirements China Telecom imported from 3GU
R4‑1814434 Further discussion on BS test applicability for different SCS and CHBW China Telecom imported from 3GU
R4‑1814434 Further discussion on BS test applicability for different SCS and CHBW China Telecom imported from 3GU
R4‑1814434 Further discussion on BS test applicability for different SCS and CHBW China Telecom imported from 3GU
R4‑1814435 TP to TS 38.141-1: Measurement system set-up for BS type 1-H performance requirements China Telecom imported from 3GU
R4‑1814435 TP to TS 38.141-1: Measurement system set-up for BS type 1-H performance requirements China Telecom imported from 3GU
R4‑1814435 TP to TS 38.141-1: Measurement system set-up for BS type 1-H performance requirements China Telecom imported from 3GU
R4‑1814436 Remaining issues for NR PUSCH demodulation requirements China Telecom imported from 3GU
R4‑1814436 Remaining issues for NR PUSCH demodulation requirements China Telecom imported from 3GU
R4‑1814436 Remaining issues for NR PUSCH demodulation requirements China Telecom imported from 3GU
R4‑1814437 Ideal simulation results for NR PUSCH China Telecom imported from 3GU
R4‑1814437 Ideal simulation results for NR PUSCH China Telecom imported from 3GU
R4‑1814437 Ideal simulation results for NR PUSCH China Telecom imported from 3GU
R4‑1814438 Impairment simulation results for NR PUSCH China Telecom imported from 3GU
R4‑1814438 Impairment simulation results for NR PUSCH China Telecom imported from 3GU
R4‑1814438 Impairment simulation results for NR PUSCH China Telecom imported from 3GU
R4‑1814439 Draft CR to TS 38.104: Performance requirements for DFT-s-OFDM based PUSCH China Telecom imported from 3GU
R4‑1814439 Draft CR to TS 38.104: Performance requirements for DFT-s-OFDM based PUSCH China Telecom imported from 3GU
R4‑1814439 Draft CR to TS 38.104: Performance requirements for DFT-s-OFDM based PUSCH China Telecom imported from 3GU
R4‑1814440 TP to TS 38.141-1: Update of AWGN power level and FRC index for DFT-s-OFDM based PUSCH demodulation requirements China Telecom imported from 3GU
R4‑1814440 TP to TS 38.141-1: Update of AWGN power level and FRC index for DFT-s-OFDM based PUSCH demodulation requirements China Telecom imported from 3GU
R4‑1814440 TP to TS 38.141-1: Update of AWGN power level and FRC index for DFT-s-OFDM based PUSCH demodulation requirements China Telecom imported from 3GU
R4‑1814441 TP to TS 38.141-2: Radiated test requirements for DFT-s-OFDM based PUSCH China Telecom imported from 3GU
R4‑1814441 TP to TS 38.141-2: Radiated test requirements for DFT-s-OFDM based PUSCH China Telecom imported from 3GU
R4‑1814441 TP to TS 38.141-2: Radiated test requirements for DFT-s-OFDM based PUSCH China Telecom imported from 3GU
R4‑1814442 Draft CR to TS 38.104: FRC definitions for FR1 DFT-s-OFDM based PUSCH and FR2 PUSCH China Telecom imported from 3GU
R4‑1814442 Draft CR to TS 38.104: FRC definitions for FR1 DFT-s-OFDM based PUSCH and FR2 PUSCH China Telecom imported from 3GU
R4‑1814442 Draft CR to TS 38.104: FRC definitions for FR1 DFT-s-OFDM based PUSCH and FR2 PUSCH China Telecom imported from 3GU
R4‑1814443 TP to TS 38.141-1: FRC definitions for FR1 DFT-s-OFDM based PUSCH China Telecom imported from 3GU
R4‑1814443 TP to TS 38.141-1: FRC definitions for FR1 DFT-s-OFDM based PUSCH China Telecom imported from 3GU
R4‑1814443 TP to TS 38.141-1: FRC definitions for FR1 DFT-s-OFDM based PUSCH China Telecom imported from 3GU
R4‑1814444 TP to TS 38.141-2: FRC definitions for PUSCH and test parameters for PRACH China Telecom imported from 3GU
R4‑1814444 TP to TS 38.141-2: FRC definitions for PUSCH and test parameters for PRACH China Telecom imported from 3GU
R4‑1814444 TP to TS 38.141-2: FRC definitions for PUSCH and test parameters for PRACH China Telecom imported from 3GU
R4‑1814445 Remaining issues for NR PRACH demodulation requirements China Telecom imported from 3GU
R4‑1814445 Remaining issues for NR PRACH demodulation requirements China Telecom imported from 3GU
R4‑1814445 Remaining issues for NR PRACH demodulation requirements China Telecom imported from 3GU
R4‑1814446 Discussion on reply LS for LTE_feMob China Telecom imported from 3GU
R4‑1814446 Discussion on reply LS for LTE_feMob China Telecom imported from 3GU
R4‑1814446 Discussion on reply LS for LTE_feMob China Telecom imported from 3GU
R4‑1814447 Draft WID on NR performance requirement enhancement China Telecom imported from 3GU
R4‑1814447 Draft WID on NR performance requirement enhancement China Telecom imported from 3GU
R4‑1814447 Draft WID on NR performance requirement enhancement China Telecom imported from 3GU
R4‑1814448 TP to TS 38.141-2: OTA transmitter OFF power (Section 6.5.1) ZTE Corporation imported from 3GU
R4‑1814448 TP to TS 38.141-2: OTA transmitter OFF power (Section 6.5.1) ZTE Corporation imported from 3GU
R4‑1814448 TP to TS 38.141-2: OTA transmitter OFF power (Section 6.5.1) ZTE Corporation imported from 3GU
R4‑1814449 TP to TS 38.141-2: OTA transmitted signal quality (Section 6.6) ZTE Corporation imported from 3GU
R4‑1814449 TP to TS 38.141-2: OTA transmitted signal quality (Section 6.6) ZTE Corporation imported from 3GU
R4‑1814449 TP to TS 38.141-2: OTA transmitted signal quality (Section 6.6) ZTE Corporation imported from 3GU
R4‑1814450 Further discussion on FR2 OTA TDD transient time ZTE Corporation imported from 3GU
R4‑1814450 Further discussion on FR2 OTA TDD transient time ZTE Corporation imported from 3GU
R4‑1814450 Further discussion on FR2 OTA TDD transient time ZTE Corporation imported from 3GU
R4‑1814451 Correction to frequency of CA_4A-7A for MSD with inter-band 2UL Anritsu Corporation imported from 3GU
R4‑1814451 Correction to frequency of CA_4A-7A for MSD with inter-band 2UL Anritsu Corporation imported from 3GU
R4‑1814451 Correction to frequency of CA_4A-7A for MSD with inter-band 2UL Anritsu Corporation imported from 3GU
R4‑1814452 Correction to frequency of CA_4A-7A for MSD with inter-band 2UL Anritsu Corporation imported from 3GU
R4‑1814452 Correction to frequency of CA_4A-7A for MSD with inter-band 2UL Anritsu Corporation imported from 3GU
R4‑1814452 Correction to frequency of CA_4A-7A for MSD with inter-band 2UL Anritsu Corporation imported from 3GU
R4‑1814453 Correction to frequency of CA_4A-7A for MSD with inter-band 2UL Anritsu Corporation imported from 3GU
R4‑1814453 Correction to frequency of CA_4A-7A for MSD with inter-band 2UL Anritsu Corporation imported from 3GU
R4‑1814453 Correction to frequency of CA_4A-7A for MSD with inter-band 2UL Anritsu Corporation imported from 3GU
R4‑1814454 Correction to frequency of CA_4A-7A for MSD with inter-band 2UL Anritsu Corporation imported from 3GU
R4‑1814454 Correction to frequency of CA_4A-7A for MSD with inter-band 2UL Anritsu Corporation imported from 3GU
R4‑1814454 Correction to frequency of CA_4A-7A for MSD with inter-band 2UL Anritsu Corporation imported from 3GU
R4‑1814455 CR for PDSCH demodulation NTT DOCOMO, INC. imported from 3GU
R4‑1814455 CR for PDSCH demodulation NTT DOCOMO, INC. imported from 3GU
R4‑1814455 CR for PDSCH demodulation NTT DOCOMO, INC. imported from 3GU
R4‑1814456 New WID Generic requirements for NR intra-band contiguous CA for FR1 Rel-16 China Telecom imported from 3GU
R4‑1814456 New WID Generic requirements for NR intra-band contiguous CA for FR1 Rel-16 China Telecom imported from 3GU
R4‑1814456 New WID Generic requirements for NR intra-band contiguous CA for FR1 Rel-16 China Telecom imported from 3GU
R4‑1814457 New WID Add support of DL 256QAM for NR FR2 China Telecom imported from 3GU
R4‑1814457 New WID Add support of DL 256QAM for NR FR2 China Telecom imported from 3GU
R4‑1814457 New WID Add support of DL 256QAM for NR FR2 China Telecom imported from 3GU
R4‑1814458 Motivations on NR DL 256QAM support for FR2 China Telecom imported from 3GU
R4‑1814458 Motivations on NR DL 256QAM support for FR2 China Telecom imported from 3GU
R4‑1814458 Motivations on NR DL 256QAM support for FR2 China Telecom imported from 3GU
R4‑1814459 MSD analysis for DC band combination of Band 5, 41 and n79 China Telecom imported from 3GU
R4‑1814459 MSD analysis for DC band combination of Band 5, 41 and n79 China Telecom imported from 3GU
R4‑1814459 MSD analysis for DC band combination of Band 5, 41 and n79 China Telecom imported from 3GU
R4‑1814460 TP for TR 37.716-21-11: RefSens requirement for DC band combination of Band 5, 41 and n79 China Telecom imported from 3GU
R4‑1814460 TP for TR 37.716-21-11: RefSens requirement for DC band combination of Band 5, 41 and n79 China Telecom imported from 3GU
R4‑1814460 TP for TR 37.716-21-11: RefSens requirement for DC band combination of Band 5, 41 and n79 China Telecom imported from 3GU
R4‑1814461 TP for TR 37.716-41-11: DC band combination of Band 1, 3, 5, 41 and n79 China Telecom imported from 3GU
R4‑1814461 TP for TR 37.716-41-11: DC band combination of Band 1, 3, 5, 41 and n79 China Telecom imported from 3GU
R4‑1814461 TP for TR 37.716-41-11: DC band combination of Band 1, 3, 5, 41 and n79 China Telecom imported from 3GU
R4‑1814462 Darft CR for EN-DC MTTD and MRTD requirement (section 7.5 and 7.6) Samsung imported from 3GU
R4‑1814462 Darft CR for EN-DC MTTD and MRTD requirement (section 7.5 and 7.6) Samsung imported from 3GU
R4‑1814462 Darft CR for EN-DC MTTD and MRTD requirement (section 7.5 and 7.6) Samsung imported from 3GU
R4‑1814463 CR for correction on measurement gap sharing in EN-DC Samsung imported from 3GU
R4‑1814463 CR for correction on measurement gap sharing in EN-DC Samsung imported from 3GU
R4‑1814463 CR for correction on measurement gap sharing in EN-DC Samsung imported from 3GU
R4‑1814464 Draft CR for further clarification on measurement gap sharing (section 9.1.2) Samsung imported from 3GU
R4‑1814464 Draft CR for further clarification on measurement gap sharing (section 9.1.2) Samsung imported from 3GU
R4‑1814464 Draft CR for further clarification on measurement gap sharing (section 9.1.2) Samsung imported from 3GU
R4‑1814465 Darft CR for adding note on applicability of value RSRP_127 (section 10.1.6) Samsung imported from 3GU
R4‑1814465 Darft CR for adding note on applicability of value RSRP_127 (section 10.1.6) Samsung imported from 3GU
R4‑1814465 Darft CR for adding note on applicability of value RSRP_127 (section 10.1.6) Samsung imported from 3GU
R4‑1814466 Reply LS on frequency separation class Samsung imported from 3GU
R4‑1814466 Reply LS on frequency separation class Samsung imported from 3GU
R4‑1814466 Reply LS on frequency separation class Samsung imported from 3GU
R4‑1814467 Draft CR for correction of random access test cases for FR1 (section A.4.3.2.2 and A.6.3.2.2) Samsung imported from 3GU
R4‑1814467 Draft CR for correction of random access test cases for FR1 (section A.4.3.2.2 and A.6.3.2.2) Samsung imported from 3GU
R4‑1814467 Draft CR for correction of random access test cases for FR1 (section A.4.3.2.2 and A.6.3.2.2) Samsung imported from 3GU
R4‑1814468 Draft CR for correction of random access test cases for FR2 (section A.5.3.2.2 and A.7.3.2.2) Samsung imported from 3GU
R4‑1814468 Draft CR for correction of random access test cases for FR2 (section A.5.3.2.2 and A.7.3.2.2) Samsung imported from 3GU
R4‑1814468 Draft CR for correction of random access test cases for FR2 (section A.5.3.2.2 and A.7.3.2.2) Samsung imported from 3GU
R4‑1814469 Remaining issues for random access test cases Samsung imported from 3GU
R4‑1814469 Remaining issues for random access test cases Samsung imported from 3GU
R4‑1814469 Remaining issues for random access test cases Samsung imported from 3GU
R4‑1814470 Draft CR for correction of test cases on inter-frequency FR1 RSRQ measurement accuracy (section A.4.7.2 and A.6.7.2) Samsung imported from 3GU
R4‑1814470 Draft CR for correction of test cases on inter-frequency FR1 RSRQ measurement accuracy (section A.4.7.2 and A.6.7.2) Samsung imported from 3GU
R4‑1814470 Draft CR for correction of test cases on inter-frequency FR1 RSRQ measurement accuracy (section A.4.7.2 and A.6.7.2) Samsung imported from 3GU
R4‑1814471 Draft CR for correction of test cases on inter-frequency FR2 RSRQ measurement accuracy (section A.5.7.2 and A.7.7.2) Samsung imported from 3GU
R4‑1814471 Draft CR for correction of test cases on inter-frequency FR2 RSRQ measurement accuracy (section A.5.7.2 and A.7.7.2) Samsung imported from 3GU
R4‑1814471 Draft CR for correction of test cases on inter-frequency FR2 RSRQ measurement accuracy (section A.5.7.2 and A.7.7.2) Samsung imported from 3GU
R4‑1814472 Discussion on RRM testing methodology Samsung imported from 3GU
R4‑1814472 Discussion on RRM testing methodology Samsung imported from 3GU
R4‑1814472 Discussion on RRM testing methodology Samsung imported from 3GU
R4‑1814473 Reply LS on the interruption time during mobility in LTE Samsung imported from 3GU
R4‑1814473 Reply LS on the interruption time during mobility in LTE Samsung imported from 3GU
R4‑1814473 Reply LS on the interruption time during mobility in LTE Samsung imported from 3GU
R4‑1814474 Discussion and simulation results for NR PUSCH Samsung imported from 3GU
R4‑1814474 Discussion and simulation results for NR PUSCH Samsung imported from 3GU
R4‑1814474 Discussion and simulation results for NR PUSCH Samsung imported from 3GU
R4‑1814475 Discussion and simulation results for NR PUCCH Samsung imported from 3GU
R4‑1814475 Discussion and simulation results for NR PUCCH Samsung imported from 3GU
R4‑1814475 Discussion and simulation results for NR PUCCH Samsung imported from 3GU
R4‑1814476 Discussion and simulation results for NR PRACH Samsung imported from 3GU
R4‑1814476 Discussion and simulation results for NR PRACH Samsung imported from 3GU
R4‑1814476 Discussion and simulation results for NR PRACH Samsung imported from 3GU
R4‑1814477 Draft CR on PUCCH format2 performance requirements for TS 38.104 Samsung imported from 3GU
R4‑1814477 Draft CR on PUCCH format2 performance requirements for TS 38.104 Samsung imported from 3GU
R4‑1814477 Draft CR on PUCCH format2 performance requirements for TS 38.104 Samsung imported from 3GU
R4‑1814478 TP for TS 38.141-1 on NR PUCCH format2 conducted performance requirements Samsung imported from 3GU
R4‑1814478 TP for TS 38.141-1 on NR PUCCH format2 conducted performance requirements Samsung imported from 3GU
R4‑1814478 TP for TS 38.141-1 on NR PUCCH format2 conducted performance requirements Samsung imported from 3GU
R4‑1814479 TP for TS 38.141-2 on NR PUCCH format2 radiated performance requirements Samsung imported from 3GU
R4‑1814479 TP for TS 38.141-2 on NR PUCCH format2 radiated performance requirements Samsung imported from 3GU
R4‑1814479 TP for TS 38.141-2 on NR PUCCH format2 radiated performance requirements Samsung imported from 3GU
R4‑1814480 Conclusion of T-put results Samsung imported from 3GU
R4‑1814480 Conclusion of T-put results Samsung imported from 3GU
R4‑1814480 Conclusion of T-put results Samsung imported from 3GU
R4‑1814481 Analysis of UE distinction methodology Samsung imported from 3GU
R4‑1814481 Analysis of UE distinction methodology Samsung imported from 3GU
R4‑1814481 Analysis of UE distinction methodology Samsung imported from 3GU
R4‑1814482 Simulation results summary for NR CSI (FR1 TDD) Samsung imported from 3GU
R4‑1814482 Simulation results summary for NR CSI (FR1 TDD) Samsung imported from 3GU
R4‑1814482 Simulation results summary for NR CSI (FR1 TDD) Samsung imported from 3GU
R4‑1814483 Simulation results summary for NR CSI (FR1 FDD) Samsung imported from 3GU
R4‑1814483 Simulation results summary for NR CSI (FR1 FDD) Samsung imported from 3GU
R4‑1814483 Simulation results summary for NR CSI (FR1 FDD) Samsung imported from 3GU
R4‑1814484 Simulation results summary for NR CSI (FR2 TDD) Samsung imported from 3GU
R4‑1814484 Simulation results summary for NR CSI (FR2 TDD) Samsung imported from 3GU
R4‑1814484 Simulation results summary for NR CSI (FR2 TDD) Samsung imported from 3GU
R4‑1814485 Simulation assumption for NR UE CSI requirements Samsung imported from 3GU
R4‑1814485 Simulation assumption for NR UE CSI requirements Samsung imported from 3GU
R4‑1814485 Simulation assumption for NR UE CSI requirements Samsung imported from 3GU
R4‑1814486 Simulation results for PDSCH (FR1) Samsung imported from 3GU
R4‑1814486 Simulation results for PDSCH (FR1) Samsung imported from 3GU
R4‑1814486 Simulation results for PDSCH (FR1) Samsung imported from 3GU
R4‑1814487 TP for TS38.101-4 section 2 (Reference) Samsung imported from 3GU
R4‑1814487 TP for TS38.101-4 section 2 (Reference) Samsung imported from 3GU
R4‑1814487 TP for TS38.101-4 section 2 (Reference) Samsung imported from 3GU
R4‑1814488 TP for TS38.101-4 section 3 (Definitions, symbols and abbreviations) Samsung imported from 3GU
R4‑1814488 TP for TS38.101-4 section 3 (Definitions, symbols and abbreviations) Samsung imported from 3GU
R4‑1814488 TP for TS38.101-4 section 3 (Definitions, symbols and abbreviations) Samsung imported from 3GU
R4‑1814489 Simulation results for PDSCH (FR2) Samsung imported from 3GU
R4‑1814489 Simulation results for PDSCH (FR2) Samsung imported from 3GU
R4‑1814489 Simulation results for PDSCH (FR2) Samsung imported from 3GU
R4‑1814490 Open issues of CSI test cases Samsung imported from 3GU
R4‑1814490 Open issues of CSI test cases Samsung imported from 3GU
R4‑1814490 Open issues of CSI test cases Samsung imported from 3GU
R4‑1814491 Simulation results for CQI test cases Samsung imported from 3GU
R4‑1814491 Simulation results for CQI test cases Samsung imported from 3GU
R4‑1814491 Simulation results for CQI test cases Samsung imported from 3GU
R4‑1814492 Simulation results for PMI test cases Samsung imported from 3GU
R4‑1814492 Simulation results for PMI test cases Samsung imported from 3GU
R4‑1814492 Simulation results for PMI test cases Samsung imported from 3GU
R4‑1814493 Simulation results for RI test cases Samsung imported from 3GU
R4‑1814493 Simulation results for RI test cases Samsung imported from 3GU
R4‑1814493 Simulation results for RI test cases Samsung imported from 3GU
R4‑1814494 Introduction of NR band protection in TS36.101 Samsung imported from 3GU
R4‑1814494 Introduction of NR band protection in TS36.101 Samsung imported from 3GU
R4‑1814494 Introduction of NR band protection in TS36.101 Samsung imported from 3GU
R4‑1814495 Introduction of NR band protection in TS25.101 Samsung imported from 3GU
R4‑1814495 Introduction of NR band protection in TS25.101 Samsung imported from 3GU
R4‑1814495 Introduction of NR band protection in TS25.101 Samsung imported from 3GU
R4‑1814496 Introduction of NR band protection in TS25.102 Samsung imported from 3GU
R4‑1814496 Introduction of NR band protection in TS25.102 Samsung imported from 3GU
R4‑1814496 Introduction of NR band protection in TS25.102 Samsung imported from 3GU
R4‑1814497 Correction on UL MIMO requirement for PC1 UE Samsung imported from 3GU
R4‑1814497 Correction on UL MIMO requirement for PC1 UE Samsung imported from 3GU
R4‑1814497 Correction on UL MIMO requirement for PC1 UE Samsung imported from 3GU
R4‑1814498 Revised WID on Rel-16 NR Inter-band Carrier Aggregation/Dual Connectivity for 2 bands DL with x bands UL (x=1,2) ZTE Corporation imported from 3GU
R4‑1814498 Revised WID on Rel-16 NR Inter-band Carrier Aggregation/Dual Connectivity for 2 bands DL with x bands UL (x=1,2) ZTE Corporation imported from 3GU
R4‑1814498 Revised WID on Rel-16 NR Inter-band Carrier Aggregation/Dual Connectivity for 2 bands DL with x bands UL (x=1,2) ZTE Corporation imported from 3GU
R4‑1814499 Draft CR to TS 38.104: Some corrections on OTA RX requirement related to multi-band operation ZTE Corporation imported from 3GU
R4‑1814499 Draft CR to TS 38.104: Some corrections on OTA RX requirement related to multi-band operation ZTE Corporation imported from 3GU
R4‑1814499 Draft CR to TS 38.104: Some corrections on OTA RX requirement related to multi-band operation ZTE Corporation imported from 3GU
R4‑1814500 Draft CR to TS 38.104: Transmitter OFF power for CA (Section 6.4.1&9.5.2) ZTE Corporation imported from 3GU
R4‑1814500 Draft CR to TS 38.104: Transmitter OFF power for CA (Section 6.4.1&9.5.2) ZTE Corporation imported from 3GU
R4‑1814500 Draft CR to TS 38.104: Transmitter OFF power for CA (Section 6.4.1&9.5.2) ZTE Corporation imported from 3GU
R4‑1814501 TP to TS38.141-2: OTA ACLR (Section 6.7.3) ZTE Corporation imported from 3GU
R4‑1814501 TP to TS38.141-2: OTA ACLR (Section 6.7.3) ZTE Corporation imported from 3GU
R4‑1814501 TP to TS38.141-2: OTA ACLR (Section 6.7.3) ZTE Corporation imported from 3GU
R4‑1814502 TP to TS38.141-2: OTA total power dynamic range(Section 6.4.3) ZTE Corporation imported from 3GU
R4‑1814502 TP to TS38.141-2: OTA total power dynamic range(Section 6.4.3) ZTE Corporation imported from 3GU
R4‑1814502 TP to TS38.141-2: OTA total power dynamic range(Section 6.4.3) ZTE Corporation imported from 3GU
R4‑1814503 TP to TS38.141-2: OTA UEM for BS type 1-O(Section 6.7.4.5) ZTE Corporation imported from 3GU
R4‑1814503 TP to TS38.141-2: OTA UEM for BS type 1-O(Section 6.7.4.5) ZTE Corporation imported from 3GU
R4‑1814503 TP to TS38.141-2: OTA UEM for BS type 1-O(Section 6.7.4.5) ZTE Corporation imported from 3GU
R4‑1814504 TP to TS38.141-2: Removal of the multi-band test for BS type 2-O ZTE Corporation imported from 3GU
R4‑1814504 TP to TS38.141-2: Removal of the multi-band test for BS type 2-O ZTE Corporation imported from 3GU
R4‑1814504 TP to TS38.141-2: Removal of the multi-band test for BS type 2-O ZTE Corporation imported from 3GU
R4‑1814505 TP for TR38.716-02-00: MSD requirements due to cross band isolation for 1UL/2UL for CA_n3-n41 ZTE Corporation, CMCC imported from 3GU
R4‑1814505 TP for TR38.716-02-00: MSD requirements due to cross band isolation for 1UL/2UL for CA_n3-n41 ZTE Corporation, CMCC imported from 3GU
R4‑1814505 TP for TR38.716-02-00: MSD requirements due to cross band isolation for 1UL/2UL for CA_n3-n41 ZTE Corporation, CMCC imported from 3GU
R4‑1814506 Draft CR to TS38.104_Transmitter intermodulation(Section 6.7 and 9.8) ZTE Corporation imported from 3GU
R4‑1814506 Draft CR to TS38.104_Transmitter intermodulation(Section 6.7 and 9.8) ZTE Corporation imported from 3GU
R4‑1814506 Draft CR to TS38.104_Transmitter intermodulation(Section 6.7 and 9.8) ZTE Corporation imported from 3GU
R4‑1814507 TP to TS 38.141-1_Corrections on transmitter intermodulation (section 3.2 and 6.7) ZTE Corporation imported from 3GU
R4‑1814507 TP to TS 38.141-1_Corrections on transmitter intermodulation (section 3.2 and 6.7) ZTE Corporation imported from 3GU
R4‑1814507 TP to TS 38.141-1_Corrections on transmitter intermodulation (section 3.2 and 6.7) ZTE Corporation imported from 3GU
R4‑1814508 TP to TS 38.141-2_Corrections on transmitter intermodulation (section 3.2 and 6.8) ZTE Corporation imported from 3GU
R4‑1814508 TP to TS 38.141-2_Corrections on transmitter intermodulation (section 3.2 and 6.8) ZTE Corporation imported from 3GU
R4‑1814508 TP to TS 38.141-2_Corrections on transmitter intermodulation (section 3.2 and 6.8) ZTE Corporation imported from 3GU
R4‑1814509 Clarification on MSD and uplink configuration tables for EN DC and NR CA ZTE Corporation imported from 3GU
R4‑1814509 Clarification on MSD and uplink configuration tables for EN DC and NR CA ZTE Corporation imported from 3GU
R4‑1814509 Clarification on MSD and uplink configuration tables for EN DC and NR CA ZTE Corporation imported from 3GU
R4‑1814510 Draft CR to TS38.101-1_Clarifications on MSD and UL configuration tables for inter-band CA ZTE Corporation imported from 3GU
R4‑1814510 Draft CR to TS38.101-1_Clarifications on MSD and UL configuration tables for inter-band CA ZTE Corporation imported from 3GU
R4‑1814510 Draft CR to TS38.101-1_Clarifications on MSD and UL configuration tables for inter-band CA ZTE Corporation imported from 3GU
R4‑1814511 Draft CR to TS38.101-3_Clarifications on MSD and UL configuration tables for EN-DC ZTE Corporation imported from 3GU
R4‑1814511 Draft CR to TS38.101-3_Clarifications on MSD and UL configuration tables for EN-DC ZTE Corporation imported from 3GU
R4‑1814511 Draft CR to TS38.101-3_Clarifications on MSD and UL configuration tables for EN-DC ZTE Corporation imported from 3GU
R4‑1814512 Draft CR to TS38.101-3_Corrections on MSD requirments for EN-DC combinations of band 8 and n77 n78(Section 7.3B.2.3.1) ZTE Corporation imported from 3GU
R4‑1814512 Draft CR to TS38.101-3_Corrections on MSD requirments for EN-DC combinations of band 8 and n77 n78(Section 7.3B.2.3.1) ZTE Corporation imported from 3GU
R4‑1814512 Draft CR to TS38.101-3_Corrections on MSD requirments for EN-DC combinations of band 8 and n77 n78(Section 7.3B.2.3.1) ZTE Corporation imported from 3GU
R4‑1814513 EIRP measurement grids with test time Samsung imported from 3GU
R4‑1814513 EIRP measurement grids with test time Samsung imported from 3GU
R4‑1814513 EIRP measurement grids with test time Samsung imported from 3GU
R4‑1814514 Draft CR to TR 38.810: EIRP measurement grids Samsung imported from 3GU
R4‑1814514 Draft CR to TR 38.810: EIRP measurement grids Samsung imported from 3GU
R4‑1814514 Draft CR to TR 38.810: EIRP measurement grids Samsung imported from 3GU
R4‑1814515 TP to TS 38.141-2: OTA transmitter transient period (Section 6.5.2) ZTE Corporation imported from 3GU
R4‑1814515 TP to TS 38.141-2: OTA transmitter transient period (Section 6.5.2) ZTE Corporation imported from 3GU
R4‑1814515 TP to TS 38.141-2: OTA transmitter transient period (Section 6.5.2) ZTE Corporation imported from 3GU
R4‑1814516 Timing alignment for intra-band contiguous CA ZTE Corporation imported from 3GU
R4‑1814516 Timing alignment for intra-band contiguous CA ZTE Corporation imported from 3GU
R4‑1814516 Timing alignment for intra-band contiguous CA ZTE Corporation imported from 3GU
R4‑1814517 Correction to FDD-FS3 Intra-frequency event triggered reporting in DRX ANRITSU LTD imported from 3GU
R4‑1814517 Correction to FDD-FS3 Intra-frequency event triggered reporting in DRX ANRITSU LTD imported from 3GU
R4‑1814517 Correction to FDD-FS3 Intra-frequency event triggered reporting in DRX ANRITSU LTD imported from 3GU
R4‑1814518 Correction to FDD-FS3 Intra-frequency event triggered reporting in DRX ANRITSU LTD imported from 3GU
R4‑1814518 Correction to FDD-FS3 Intra-frequency event triggered reporting in DRX ANRITSU LTD imported from 3GU
R4‑1814518 Correction to FDD-FS3 Intra-frequency event triggered reporting in DRX ANRITSU LTD imported from 3GU
R4‑1814519 Correction to FDD-FS3 Intra-frequency event triggered reporting in DRX ANRITSU LTD imported from 3GU
R4‑1814519 Correction to FDD-FS3 Intra-frequency event triggered reporting in DRX ANRITSU LTD imported from 3GU
R4‑1814519 Correction to FDD-FS3 Intra-frequency event triggered reporting in DRX ANRITSU LTD imported from 3GU
R4‑1814520 Correction to DL CA Activation and Deactivation Test cases ANRITSU LTD imported from 3GU
R4‑1814520 Correction to DL CA Activation and Deactivation Test cases ANRITSU LTD imported from 3GU
R4‑1814520 Correction to DL CA Activation and Deactivation Test cases ANRITSU LTD imported from 3GU
R4‑1814521 Measurement time savings for multi-beam 3D EIRP scans using beam sweeping Fraunhofer HHI, Fraunhofer IIS, Spirent imported from 3GU
R4‑1814521 Measurement time savings for multi-beam 3D EIRP scans using beam sweeping Fraunhofer HHI, Fraunhofer IIS, Spirent imported from 3GU
R4‑1814521 Measurement time savings for multi-beam 3D EIRP scans using beam sweeping Fraunhofer HHI, Fraunhofer IIS, Spirent imported from 3GU
R4‑1814522 FR2 demod: Noc level and Band groups ANRITSU LTD imported from 3GU
R4‑1814522 FR2 demod: Noc level and Band groups ANRITSU LTD imported from 3GU
R4‑1814522 FR2 demod: Noc level and Band groups ANRITSU LTD imported from 3GU
R4‑1814523 FR2 demod: Noc, Band groups and Ref point - TP for TS 38.101-4 ANRITSU LTD imported from 3GU
R4‑1814523 FR2 demod: Noc, Band groups and Ref point - TP for TS 38.101-4 ANRITSU LTD imported from 3GU
R4‑1814523 FR2 demod: Noc, Band groups and Ref point - TP for TS 38.101-4 ANRITSU LTD imported from 3GU
R4‑1814524 FR2 demod: Noc and Band groups update ANRITSU LTD imported from 3GU
R4‑1814524 FR2 demod: Noc and Band groups update ANRITSU LTD imported from 3GU
R4‑1814524 FR2 demod: Noc and Band groups update ANRITSU LTD imported from 3GU
R4‑1814525 Noc and SNR range for UE RRM test cases with 1 AoA ANRITSU LTD imported from 3GU
R4‑1814525 Noc and SNR range for UE RRM test cases with 1 AoA ANRITSU LTD imported from 3GU
R4‑1814525 Noc and SNR range for UE RRM test cases with 1 AoA ANRITSU LTD imported from 3GU
R4‑1814526 RRM update, 1 AoA with signal coming from the RX beam peak direction ANRITSU LTD imported from 3GU
R4‑1814526 RRM update, 1 AoA with signal coming from the RX beam peak direction ANRITSU LTD imported from 3GU
R4‑1814526 RRM update, 1 AoA with signal coming from the RX beam peak direction ANRITSU LTD imported from 3GU
R4‑1814527 Discussion about inter-frequency accuracy requirement Intel Corporation imported from 3GU
R4‑1814527 Discussion about inter-frequency accuracy requirement Intel Corporation imported from 3GU
R4‑1814527 Discussion about inter-frequency accuracy requirement Intel Corporation imported from 3GU
R4‑1814528 Discussion about NR RLM remaining issue Intel Corporation imported from 3GU
R4‑1814528 Discussion about NR RLM remaining issue Intel Corporation imported from 3GU
R4‑1814528 Discussion about NR RLM remaining issue Intel Corporation imported from 3GU
R4‑1814529 Discussion about RRM performance requirement test for FR2 Intel Corporation imported from 3GU
R4‑1814529 Discussion about RRM performance requirement test for FR2 Intel Corporation imported from 3GU
R4‑1814529 Discussion about RRM performance requirement test for FR2 Intel Corporation imported from 3GU
R4‑1814530 Discussion about L1-RSRP measurement requirement for beam management Intel Corporation imported from 3GU
R4‑1814530 Discussion about L1-RSRP measurement requirement for beam management Intel Corporation imported from 3GU
R4‑1814530 Discussion about L1-RSRP measurement requirement for beam management Intel Corporation imported from 3GU
R4‑1814531 Discussion about SNR levels for SSB RLM test Intel Corporation imported from 3GU
R4‑1814531 Discussion about SNR levels for SSB RLM test Intel Corporation imported from 3GU
R4‑1814531 Discussion about SNR levels for SSB RLM test Intel Corporation imported from 3GU
R4‑1814532 Discussion about SNR levels for CSI-RS RLM test Intel Corporation imported from 3GU
R4‑1814532 Discussion about SNR levels for CSI-RS RLM test Intel Corporation imported from 3GU
R4‑1814532 Discussion about SNR levels for CSI-RS RLM test Intel Corporation imported from 3GU
R4‑1814533 On UE timing adjustment with beam switching Intel Corporation imported from 3GU
R4‑1814533 On UE timing adjustment with beam switching Intel Corporation imported from 3GU
R4‑1814533 On UE timing adjustment with beam switching Intel Corporation imported from 3GU
R4‑1814534 On MRTD and MTTD requirements for intra-band synchronous EN-DC Intel Corporation imported from 3GU
R4‑1814534 On MRTD and MTTD requirements for intra-band synchronous EN-DC Intel Corporation imported from 3GU
R4‑1814534 On MRTD and MTTD requirements for intra-band synchronous EN-DC Intel Corporation imported from 3GU
R4‑1814535 On remaining issues for BWP switching delay Intel Corporation imported from 3GU
R4‑1814535 On remaining issues for BWP switching delay Intel Corporation imported from 3GU
R4‑1814535 On remaining issues for BWP switching delay Intel Corporation imported from 3GU
R4‑1814536 CR on BWP switching requirement in TS38.133 (Section 8.6) Intel Corporation imported from 3GU
R4‑1814536 CR on BWP switching requirement in TS38.133 (Section 8.6) Intel Corporation imported from 3GU
R4‑1814536 CR on BWP switching requirement in TS38.133 (Section 8.6) Intel Corporation imported from 3GU
R4‑1814537 On remaining issues for interruption due to BWP switching Intel Corporation imported from 3GU
R4‑1814537 On remaining issues for interruption due to BWP switching Intel Corporation imported from 3GU
R4‑1814537 On remaining issues for interruption due to BWP switching Intel Corporation imported from 3GU
R4‑1814538 Cleanup on short MGL supporting in SA MG applicability (section 9.1.2) Intel Corporation imported from 3GU
R4‑1814538 Cleanup on short MGL supporting in SA MG applicability (section 9.1.2) Intel Corporation imported from 3GU
R4‑1814538 Cleanup on short MGL supporting in SA MG applicability (section 9.1.2) Intel Corporation imported from 3GU
R4‑1814539 CR on test cases for inter-frequency measurement in EN-DC with PScell in FR1 (section A.4.6.2) Intel Corporation imported from 3GU
R4‑1814539 CR on test cases for inter-frequency measurement in EN-DC with PScell in FR1 (section A.4.6.2) Intel Corporation imported from 3GU
R4‑1814539 CR on test cases for inter-frequency measurement in EN-DC with PScell in FR1 (section A.4.6.2) Intel Corporation imported from 3GU
R4‑1814540 CR on test cases for inter-frequency measurement in EN-DC with PScell in FR2 (section A.5.6.2) Intel Corporation imported from 3GU
R4‑1814540 CR on test cases for inter-frequency measurement in EN-DC with PScell in FR2 (section A.5.6.2) Intel Corporation imported from 3GU
R4‑1814540 CR on test cases for inter-frequency measurement in EN-DC with PScell in FR2 (section A.5.6.2) Intel Corporation imported from 3GU
R4‑1814541 CR on test cases for inter-frequency measurement in SA with PCell in FR1 (section A.6.6.2) Intel Corporation imported from 3GU
R4‑1814541 CR on test cases for inter-frequency measurement in SA with PCell in FR1 (section A.6.6.2) Intel Corporation imported from 3GU
R4‑1814541 CR on test cases for inter-frequency measurement in SA with PCell in FR1 (section A.6.6.2) Intel Corporation imported from 3GU
R4‑1814542 CR on test cases for inter-frequency measurement in SA with PCell in FR2 (section A.7.6.2) Intel Corporation imported from 3GU
R4‑1814542 CR on test cases for inter-frequency measurement in SA with PCell in FR2 (section A.7.6.2) Intel Corporation imported from 3GU
R4‑1814542 CR on test cases for inter-frequency measurement in SA with PCell in FR2 (section A.7.6.2) Intel Corporation imported from 3GU
R4‑1814543 Motivation to introduce new SI of measurement gap enhancement Intel Corporation imported from 3GU
R4‑1814543 Motivation to introduce new SI of measurement gap enhancement Intel Corporation imported from 3GU
R4‑1814543 Motivation to introduce new SI of measurement gap enhancement Intel Corporation imported from 3GU
R4‑1814544 New SID measurement gap enhancement Intel Corporation imported from 3GU
R4‑1814544 New SID measurement gap enhancement Intel Corporation imported from 3GU
R4‑1814544 New SID measurement gap enhancement Intel Corporation imported from 3GU
R4‑1814545 CR on applicability requirement for non-BL CE UE in R14 Intel Corporation imported from 3GU
R4‑1814545 CR on applicability requirement for non-BL CE UE in R14 Intel Corporation imported from 3GU
R4‑1814545 CR on applicability requirement for non-BL CE UE in R14 Intel Corporation imported from 3GU
R4‑1814546 CR on applicability requirement for non-BL CE UE in R15 Intel Corporation imported from 3GU
R4‑1814546 CR on applicability requirement for non-BL CE UE in R15 Intel Corporation imported from 3GU
R4‑1814546 CR on applicability requirement for non-BL CE UE in R15 Intel Corporation imported from 3GU
R4‑1814547 Views on EN-DC interworking NR UE performance requirements Intel Corporation imported from 3GU
R4‑1814547 Views on EN-DC interworking NR UE performance requirements Intel Corporation imported from 3GU
R4‑1814547 Views on EN-DC interworking NR UE performance requirements Intel Corporation imported from 3GU
R4‑1814548 Views on NR UE Demodulation and CSI requirements applicability Intel Corporation imported from 3GU
R4‑1814548 Views on NR UE Demodulation and CSI requirements applicability Intel Corporation imported from 3GU
R4‑1814548 Views on NR UE Demodulation and CSI requirements applicability Intel Corporation imported from 3GU
R4‑1814549 Views on NR MIMO layer configuration Intel Corporation imported from 3GU
R4‑1814549 Views on NR MIMO layer configuration Intel Corporation imported from 3GU
R4‑1814549 Views on NR MIMO layer configuration Intel Corporation imported from 3GU
R4‑1814550 Draft LS reply on NR MIMO layer configuration Intel Corporation imported from 3GU
R4‑1814550 Draft LS reply on NR MIMO layer configuration Intel Corporation imported from 3GU
R4‑1814550 Draft LS reply on NR MIMO layer configuration Intel Corporation imported from 3GU
R4‑1814551 On NR V2X RF and RRM characteristics Intel Corporation imported from 3GU
R4‑1814551 On NR V2X RF and RRM characteristics Intel Corporation imported from 3GU
R4‑1814551 On NR V2X RF and RRM characteristics Intel Corporation imported from 3GU
R4‑1814552 Comibned CR to TR 38.810 after RAN4 #88bis and RAN4 #89 Intel Corporation imported from 3GU
R4‑1814552 Comibned CR to TR 38.810 after RAN4 #88bis and RAN4 #89 Intel Corporation imported from 3GU
R4‑1814552 Comibned CR to TR 38.810 after RAN4 #88bis and RAN4 #89 Intel Corporation imported from 3GU
R4‑1814553 Remaining details of the NR FR2 RRM testing methodology Intel Corporation imported from 3GU
R4‑1814553 Remaining details of the NR FR2 RRM testing methodology Intel Corporation imported from 3GU
R4‑1814553 Remaining details of the NR FR2 RRM testing methodology Intel Corporation imported from 3GU
R4‑1814554 Remaining details of the NR FR2 UE Demodulation testing methodology Intel Corporation imported from 3GU
R4‑1814554 Remaining details of the NR FR2 UE Demodulation testing methodology Intel Corporation imported from 3GU
R4‑1814554 Remaining details of the NR FR2 UE Demodulation testing methodology Intel Corporation imported from 3GU
R4‑1814555 Draft CR to TR 38.810 – Test methods applicability to FR2 UE power classes Intel Corporation imported from 3GU
R4‑1814555 Draft CR to TR 38.810 – Test methods applicability to FR2 UE power classes Intel Corporation imported from 3GU
R4‑1814555 Draft CR to TR 38.810 – Test methods applicability to FR2 UE power classes Intel Corporation imported from 3GU
R4‑1814556 Discussion on the situation for the reply LS on intra-band combination for NR CA and MR-DC (R4- 1813862) in RAN4#88Bis Intel Corporation imported from 3GU
R4‑1814556 Discussion on the situation for the reply LS on intra-band combination for NR CA and MR-DC (R4- 1813862) in RAN4#88Bis Intel Corporation imported from 3GU
R4‑1814556 Discussion on the situation for the reply LS on intra-band combination for NR CA and MR-DC (R4- 1813862) in RAN4#88Bis Intel Corporation imported from 3GU
R4‑1814557 Updated LS on intra-band combination for NR CA and MR-DC Intel Corporation imported from 3GU
R4‑1814557 Updated LS on intra-band combination for NR CA and MR-DC Intel Corporation imported from 3GU
R4‑1814557 Updated LS on intra-band combination for NR CA and MR-DC Intel Corporation imported from 3GU
R4‑1814558 Phase discontinuity issue in intra-band EN-DC with 1-PA Intel Corporation imported from 3GU
R4‑1814558 Phase discontinuity issue in intra-band EN-DC with 1-PA Intel Corporation imported from 3GU
R4‑1814558 Phase discontinuity issue in intra-band EN-DC with 1-PA Intel Corporation imported from 3GU
R4‑1814559 Requirements in fading channel conditions with 1024QAM Intel Corporation imported from 3GU
R4‑1814559 Requirements in fading channel conditions with 1024QAM Intel Corporation imported from 3GU
R4‑1814559 Requirements in fading channel conditions with 1024QAM Intel Corporation imported from 3GU
R4‑1814560 SDR Requirements with 1024QAM Intel Corporation imported from 3GU
R4‑1814560 SDR Requirements with 1024QAM Intel Corporation imported from 3GU
R4‑1814560 SDR Requirements with 1024QAM Intel Corporation imported from 3GU
R4‑1814561 CQI Reporting requirements with 1024QAM Intel Corporation imported from 3GU
R4‑1814561 CQI Reporting requirements with 1024QAM Intel Corporation imported from 3GU
R4‑1814561 CQI Reporting requirements with 1024QAM Intel Corporation imported from 3GU
R4‑1814562 On Remaining issues for Beam Failure Detection Intel Corporation imported from 3GU
R4‑1814562 On Remaining issues for Beam Failure Detection Intel Corporation imported from 3GU
R4‑1814562 On Remaining issues for Beam Failure Detection Intel Corporation imported from 3GU
R4‑1814563 On Remaining issues for Candidate Beam Detection Intel Corporation imported from 3GU
R4‑1814563 On Remaining issues for Candidate Beam Detection Intel Corporation imported from 3GU
R4‑1814563 On Remaining issues for Candidate Beam Detection Intel Corporation imported from 3GU
R4‑1814564 On testcases for Beam failure detection and link recovery Intel Corporation imported from 3GU
R4‑1814564 On testcases for Beam failure detection and link recovery Intel Corporation imported from 3GU
R4‑1814564 On testcases for Beam failure detection and link recovery Intel Corporation imported from 3GU
R4‑1814565 NR PDCCH simulation results Intel Corporation imported from 3GU
R4‑1814565 NR PDCCH simulation results Intel Corporation imported from 3GU
R4‑1814565 NR PDCCH simulation results Intel Corporation imported from 3GU
R4‑1814566 NR PDCCH UE Demodulation Requirements Intel Corporation imported from 3GU
R4‑1814566 NR PDCCH UE Demodulation Requirements Intel Corporation imported from 3GU
R4‑1814566 NR PDCCH UE Demodulation Requirements Intel Corporation imported from 3GU
R4‑1814567 NR PBCH UE Performance Requirements Intel Corporation imported from 3GU
R4‑1814567 NR PBCH UE Performance Requirements Intel Corporation imported from 3GU
R4‑1814567 NR PBCH UE Performance Requirements Intel Corporation imported from 3GU
R4‑1814568 eV2X UE normal PSSCH demodulation requirements Intel Corporation imported from 3GU
R4‑1814568 eV2X UE normal PSSCH demodulation requirements Intel Corporation imported from 3GU
R4‑1814568 eV2X UE normal PSSCH demodulation requirements Intel Corporation imported from 3GU
R4‑1814569 CR on eV2X UE soft buffer and SDR requirements Intel Corporation imported from 3GU
R4‑1814569 CR on eV2X UE soft buffer and SDR requirements Intel Corporation imported from 3GU
R4‑1814569 CR on eV2X UE soft buffer and SDR requirements Intel Corporation imported from 3GU
R4‑1814570 UE demodulation requirements for network-based CRS interference mitigation Intel Corporation imported from 3GU
R4‑1814570 UE demodulation requirements for network-based CRS interference mitigation Intel Corporation imported from 3GU
R4‑1814570 UE demodulation requirements for network-based CRS interference mitigation Intel Corporation imported from 3GU
R4‑1814571 NR PDSCH UE demodulation requirements Intel Corporation imported from 3GU
R4‑1814571 NR PDSCH UE demodulation requirements Intel Corporation imported from 3GU
R4‑1814571 NR PDSCH UE demodulation requirements Intel Corporation imported from 3GU
R4‑1814572 NR PDSCH simulation results Intel Corporation imported from 3GU
R4‑1814572 NR PDSCH simulation results Intel Corporation imported from 3GU
R4‑1814572 NR PDSCH simulation results Intel Corporation imported from 3GU
R4‑1814573 Summary of PDSCH simulation results of NR UE demod (FR1 FDD) Intel Corporation imported from 3GU
R4‑1814573 Summary of PDSCH simulation results of NR UE demod (FR1 FDD) Intel Corporation imported from 3GU
R4‑1814573 Summary of PDSCH simulation results of NR UE demod (FR1 FDD) Intel Corporation imported from 3GU
R4‑1814574 Summary of PDSCH simulation results of NR UE demod (FR1 TDD) Intel Corporation imported from 3GU
R4‑1814574 Summary of PDSCH simulation results of NR UE demod (FR1 TDD) Intel Corporation imported from 3GU
R4‑1814574 Summary of PDSCH simulation results of NR UE demod (FR1 TDD) Intel Corporation imported from 3GU
R4‑1814575 Summary of PDSCH simulation results of NR UE demod (FR2) Intel Corporation imported from 3GU
R4‑1814575 Summary of PDSCH simulation results of NR UE demod (FR2) Intel Corporation imported from 3GU
R4‑1814575 Summary of PDSCH simulation results of NR UE demod (FR2) Intel Corporation imported from 3GU
R4‑1814576 NR SDR performance requirements Intel Corporation imported from 3GU
R4‑1814576 NR SDR performance requirements Intel Corporation imported from 3GU
R4‑1814576 NR SDR performance requirements Intel Corporation imported from 3GU
R4‑1814577 TP to TS 38.101-4: FR1 PDSCH demodulation requirements (5.2) Intel Corporation imported from 3GU
R4‑1814577 TP to TS 38.101-4: FR1 PDSCH demodulation requirements (5.2) Intel Corporation imported from 3GU
R4‑1814577 TP to TS 38.101-4: FR1 PDSCH demodulation requirements (5.2) Intel Corporation imported from 3GU
R4‑1814578 TP to TS 38.101-4: FR1 SDR requirements (5.5) Intel Corporation imported from 3GU
R4‑1814578 TP to TS 38.101-4: FR1 SDR requirements (5.5) Intel Corporation imported from 3GU
R4‑1814578 TP to TS 38.101-4: FR1 SDR requirements (5.5) Intel Corporation imported from 3GU
R4‑1814579 TP to TS 38.101-4: Annex A Measurement channels - PDSCH Intel Corporation imported from 3GU
R4‑1814579 TP to TS 38.101-4: Annex A Measurement channels - PDSCH Intel Corporation imported from 3GU
R4‑1814579 TP to TS 38.101-4: Annex A Measurement channels - PDSCH Intel Corporation imported from 3GU
R4‑1814580 TP to TS 38.101-4: Annex A Measurement channels - DL Control Intel Corporation imported from 3GU
R4‑1814580 TP to TS 38.101-4: Annex A Measurement channels - DL Control Intel Corporation imported from 3GU
R4‑1814580 TP to TS 38.101-4: Annex A Measurement channels - DL Control Intel Corporation imported from 3GU
R4‑1814581 TP to TS 38.101-4: Annex A Measurement channels - CSI Intel Corporation imported from 3GU
R4‑1814581 TP to TS 38.101-4: Annex A Measurement channels - CSI Intel Corporation imported from 3GU
R4‑1814581 TP to TS 38.101-4: Annex A Measurement channels - CSI Intel Corporation imported from 3GU
R4‑1814582 CA MPR in FR2 Intel Corporation imported from 3GU
R4‑1814582 CA MPR in FR2 Intel Corporation imported from 3GU
R4‑1814582 CA MPR in FR2 Intel Corporation imported from 3GU
R4‑1814583 UL CA in FR2 Intel Corporation imported from 3GU
R4‑1814583 UL CA in FR2 Intel Corporation imported from 3GU
R4‑1814583 UL CA in FR2 Intel Corporation imported from 3GU
R4‑1814584 On Beam Correspondence requirements Intel Corporation imported from 3GU
R4‑1814584 On Beam Correspondence requirements Intel Corporation imported from 3GU
R4‑1814584 On Beam Correspondence requirements Intel Corporation imported from 3GU
R4‑1814585 Draft CR to TS 38.101-2 UL CA power control in FR2 Intel Corporation imported from 3GU
R4‑1814585 Draft CR to TS 38.101-2 UL CA power control in FR2 Intel Corporation imported from 3GU
R4‑1814585 Draft CR to TS 38.101-2 UL CA power control in FR2 Intel Corporation imported from 3GU
R4‑1814586 Considerations on Scell activation delay in FR2 Intel Corporation imported from 3GU
R4‑1814586 Considerations on Scell activation delay in FR2 Intel Corporation imported from 3GU
R4‑1814586 Considerations on Scell activation delay in FR2 Intel Corporation imported from 3GU
R4‑1814587 CR on Scell activation delay in FR2 in TS38.133 Intel Corporation imported from 3GU
R4‑1814587 CR on Scell activation delay in FR2 in TS38.133 Intel Corporation imported from 3GU
R4‑1814587 CR on Scell activation delay in FR2 in TS38.133 Intel Corporation imported from 3GU
R4‑1814588 Further discussion on measurement requirements in NR RRC_IDLE Intel Corporation imported from 3GU
R4‑1814588 Further discussion on measurement requirements in NR RRC_IDLE Intel Corporation imported from 3GU
R4‑1814588 Further discussion on measurement requirements in NR RRC_IDLE Intel Corporation imported from 3GU
R4‑1814589 CR for NR idle/inactive measurement requirements in TS38.133 Intel Corporation imported from 3GU
R4‑1814589 CR for NR idle/inactive measurement requirements in TS38.133 Intel Corporation imported from 3GU
R4‑1814589 CR for NR idle/inactive measurement requirements in TS38.133 Intel Corporation imported from 3GU
R4‑1814590 Test case for handover to FR1 NR cell (A.6.3.1) Intel imported from 3GU
R4‑1814590 Test case for handover to FR1 NR cell (A.6.3.1) Intel imported from 3GU
R4‑1814590 Test case for handover to FR1 NR cell (A.6.3.1) Intel imported from 3GU
R4‑1814591 Test case for handover to FR2 NR cell (A.7.3.1) Intel imported from 3GU
R4‑1814591 Test case for handover to FR2 NR cell (A.7.3.1) Intel imported from 3GU
R4‑1814591 Test case for handover to FR2 NR cell (A.7.3.1) Intel imported from 3GU
R4‑1814592 CR on TS38.133 for threshold in RRC re-establishment requirements (Section 6.2.1) Intel imported from 3GU
R4‑1814592 CR on TS38.133 for threshold in RRC re-establishment requirements (Section 6.2.1) Intel imported from 3GU
R4‑1814592 CR on TS38.133 for threshold in RRC re-establishment requirements (Section 6.2.1) Intel imported from 3GU
R4‑1814593 Discussion on inter-RAT RSTD measurement Intel imported from 3GU
R4‑1814593 Discussion on inter-RAT RSTD measurement Intel imported from 3GU
R4‑1814593 Discussion on inter-RAT RSTD measurement Intel imported from 3GU
R4‑1814594 CR on inter-RAT RSTD requirement (Section 9.4.4) Intel imported from 3GU
R4‑1814594 CR on inter-RAT RSTD requirement (Section 9.4.4) Intel imported from 3GU
R4‑1814594 CR on inter-RAT RSTD requirement (Section 9.4.4) Intel imported from 3GU
R4‑1814595 CR on Timing advance Test for EN-DC (A.4.4.3 & A.5.4.3) Intel imported from 3GU
R4‑1814595 CR on Timing advance Test for EN-DC (A.4.4.3 & A.5.4.3) Intel imported from 3GU
R4‑1814595 CR on Timing advance Test for EN-DC (A.4.4.3 & A.5.4.3) Intel imported from 3GU
R4‑1814596 CR on Timing advance Test for SA (A.6.4.3 & A.7.4.3) Intel imported from 3GU
R4‑1814596 CR on Timing advance Test for SA (A.6.4.3 & A.7.4.3) Intel imported from 3GU
R4‑1814596 CR on Timing advance Test for SA (A.6.4.3 & A.7.4.3) Intel imported from 3GU
R4‑1814597 Nominal channel spacing for NR CA Intel Corporation imported from 3GU
R4‑1814597 Nominal channel spacing for NR CA Intel Corporation imported from 3GU
R4‑1814597 Nominal channel spacing for NR CA Intel Corporation imported from 3GU
R4‑1814598 ACS and IBB intra-band contiguous requirements for all BW Classes Intel Corporation imported from 3GU
R4‑1814598 ACS and IBB intra-band contiguous requirements for all BW Classes Intel Corporation imported from 3GU
R4‑1814598 ACS and IBB intra-band contiguous requirements for all BW Classes Intel Corporation imported from 3GU
R4‑1814599 CR to 38.101-1: OBB intra-band contiguous CA Intel Corporation imported from 3GU
R4‑1814599 Out of Band Blocking intra-band contiguous requirements for all BW Classes Intel Corporation imported from 3GU
R4‑1814599 CR to 38.101-1: OBB intra-band contiguous CA Intel Corporation imported from 3GU
R4‑1814600 LTE and NR band combinations definition Intel Corporation imported from 3GU
R4‑1814600 LTE and NR band combinations definition Intel Corporation imported from 3GU
R4‑1814600 LTE and NR band combinations definition Intel Corporation imported from 3GU
R4‑1814601 CR to 38.104 (5.3.4) RB alignment Huawei, HiSilicon imported from 3GU
R4‑1814601 CR to 38.104 (5.3.4) RB alignment Huawei, HiSilicon imported from 3GU
R4‑1814601 CR to 38.104 (5.3.4) RB alignment Huawei, HiSilicon imported from 3GU
R4‑1814602 Inter-band EN-DC - Pcmax testing InterDigital, Inc. imported from 3GU
R4‑1814602 Inter-band EN-DC - Pcmax testing InterDigital, Inc. imported from 3GU
R4‑1814602 Inter-band EN-DC - Pcmax testing InterDigital, Inc. imported from 3GU
R4‑1814603 Intra-band EN-DC - Pcmax InterDigital, Inc. imported from 3GU
R4‑1814603 Intra-band EN-DC - Pcmax InterDigital, Inc. imported from 3GU
R4‑1814603 Intra-band EN-DC - Pcmax InterDigital, Inc. imported from 3GU
R4‑1814604 New WID on introduction of n48 US Cellular Corporation imported from 3GU
R4‑1814604 New WID on introduction of n48 US Cellular Corporation imported from 3GU
R4‑1814604 New WID on introduction of n48 US Cellular Corporation imported from 3GU
R4‑1814605 DraftCR to TR38.810 to update TRP Measurement Grids Annex Keysight Technologies UK Ltd imported from 3GU
R4‑1814605 DraftCR to TR38.810 to update TRP Measurement Grids Annex Keysight Technologies UK Ltd imported from 3GU
R4‑1814605 DraftCR to TR38.810 to update TRP Measurement Grids Annex Keysight Technologies UK Ltd imported from 3GU
R4‑1814606 CR to TS 37.141: Clarification on NB-IoT test models Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814606 CR to TS 37.141: Clarification on NB-IoT test models Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814606 CR to TS 37.141: Clarification on NB-IoT test models Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814607 CR to TS 37.141: Clarification on NB-IoT test models Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814607 CR to TS 37.141: Clarification on NB-IoT test models Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814607 CR to TS 37.141: Clarification on NB-IoT test models Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814608 CR to TS 37.141: Clarification on NB-IoT test models Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814608 CR to TS 37.141: Clarification on NB-IoT test models Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814608 CR to TS 37.141: Clarification on NB-IoT test models Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814609 Proposals on manufacturer declarations for AAS conducted requirements testing Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814609 Proposals on manufacturer declarations for AAS conducted requirements testing Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814609 Proposals on manufacturer declarations for AAS conducted requirements testing Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814610 CR to TS 37.145-1: Manufacturer declarations for AAS conducted requirements testing Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814610 CR to TS 37.145-1: Manufacturer declarations for AAS conducted requirements testing Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814610 CR to TS 37.145-1: Manufacturer declarations for AAS conducted requirements testing Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814611 Proposals on manufacturer declarations for AAS radiated requirements testing Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814611 Proposals on manufacturer declarations for AAS radiated requirements testing Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814611 Proposals on manufacturer declarations for AAS radiated requirements testing Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814612 CR to TS 37.145-2: Manufacturer declarations for AAS radiated requirements testing Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814612 CR to TS 37.145-2: Manufacturer declarations for AAS radiated requirements testing Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814612 CR to TS 37.145-2: Manufacturer declarations for AAS radiated requirements testing Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814613 Draft CR to TS 37.843: Measurement uncertainty for Out-of-band Blocking requirements Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814613 Draft CR to TS 37.843: Measurement uncertainty for Out-of-band Blocking requirements Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814613 Draft CR to TS 37.843: Measurement uncertainty for Out-of-band Blocking requirements Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814614 UL PRB to DL PRB center offset for TDD NB-IoT Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814614 UL PRB to DL PRB center offset for TDD NB-IoT Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814614 UL PRB to DL PRB center offset for TDD NB-IoT Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814615 CR to TS 36.101: Implementation of UL PRB to DL PRB center offset for TDD NB-IoT Nokia, Nokia Shanghai Bell, Ericsson imported from 3GU
R4‑1814615 CR to TS 36.101: Implementation of UL PRB to DL PRB center offset for TDD NB-IoT Nokia, Nokia Shanghai Bell, Ericsson imported from 3GU
R4‑1814615 CR to TS 36.101: Implementation of UL PRB to DL PRB center offset for TDD NB-IoT Nokia, Nokia Shanghai Bell, Ericsson imported from 3GU
R4‑1814616 CR to TS 36.104: Implementation of UL PRB to DL PRB center offset for TDD NB-IoT Nokia, Nokia Shanghai Bell, Ericsson imported from 3GU
R4‑1814616 CR to TS 36.104: Implementation of UL PRB to DL PRB center offset for TDD NB-IoT Nokia, Nokia Shanghai Bell, Ericsson imported from 3GU
R4‑1814616 CR to TS 36.104: Implementation of UL PRB to DL PRB center offset for TDD NB-IoT Nokia, Nokia Shanghai Bell, Ericsson imported from 3GU
R4‑1814617 CR to TS 36.141: Implementation of UL PRB to DL PRB center offset for TDD NB-IoT Nokia, Nokia Shanghai Bell, Ericsson imported from 3GU
R4‑1814617 CR to TS 36.141: Implementation of UL PRB to DL PRB center offset for TDD NB-IoT Nokia, Nokia Shanghai Bell, Ericsson imported from 3GU
R4‑1814617 CR to TS 36.141: Implementation of UL PRB to DL PRB center offset for TDD NB-IoT Nokia, Nokia Shanghai Bell, Ericsson imported from 3GU
R4‑1814618 UL PRB to DL PRB center offset for TDD NB-IoT Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814618 UL PRB to DL PRB center offset for TDD NB-IoT Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814618 UL PRB to DL PRB center offset for TDD NB-IoT Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814619 Draft CR to TS 38.817-02: Measurement uncertainty for Out-of-band Blocking requirements Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814619 Draft CR to TS 38.817-02: Measurement uncertainty for Out-of-band Blocking requirements Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814619 Draft CR to TS 38.817-02: Measurement uncertainty for Out-of-band Blocking requirements Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814620 TP to TS 38.141-1 on Characteristics of the interfering signals Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814620 TP to TS 38.141-1 on Characteristics of the interfering signals Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814620 TP to TS 38.141-1 on Characteristics of the interfering signals Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814621 TP to TS 38.141-1 on manufacturer declarations for NR conducted requirements testing Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814621 TP to TS 38.141-1 on manufacturer declarations for NR conducted requirements testing Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814621 TP to TS 38.141-1 on manufacturer declarations for NR conducted requirements testing Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814622 TP to TS 38.141-2 on Characteristics of the interfering signals Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814622 TP to TS 38.141-2 on Characteristics of the interfering signals Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814622 TP to TS 38.141-2 on Characteristics of the interfering signals Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814623 TP to TS 38.141-2 on manufacturer declarations for NR radiated requirements testing Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814623 TP to TS 38.141-2 on manufacturer declarations for NR radiated requirements testing Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814623 TP to TS 38.141-2 on manufacturer declarations for NR radiated requirements testing Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814624 Summary of simulation results for eV2X demodulation requirements CATT imported from 3GU
R4‑1814624 Summary of simulation results for eV2X demodulation requirements CATT imported from 3GU
R4‑1814624 Summary of simulation results for eV2X demodulation requirements CATT imported from 3GU
R4‑1814625 CR for eV2X single link PSSCH tests and PSCCH decoding capability test cases CATT imported from 3GU
R4‑1814625 CR for eV2X single link PSSCH tests and PSCCH decoding capability test cases CATT imported from 3GU
R4‑1814625 CR for eV2X single link PSSCH tests and PSCCH decoding capability test cases CATT imported from 3GU
R4‑1814626 Simulation results for eV2X test cases CATT imported from 3GU
R4‑1814626 Simulation results for eV2X test cases CATT imported from 3GU
R4‑1814626 Simulation results for eV2X test cases CATT imported from 3GU
R4‑1814627 Simulation results for NR PDCCH CATT imported from 3GU
R4‑1814627 Simulation results for NR PDCCH CATT imported from 3GU
R4‑1814627 Simulation results for NR PDCCH CATT imported from 3GU
R4‑1814628 TP to TS38.101-4 Section 7.3: PDCCH demodulation requirements CATT imported from 3GU
R4‑1814628 TP to TS38.101-4 Section 7.3: PDCCH demodulation requirements CATT imported from 3GU
R4‑1814628 TP to TS38.101-4 Section 7.3: PDCCH demodulation requirements CATT imported from 3GU
R4‑1814629 Simulation results for NR PUSCH CATT imported from 3GU
R4‑1814629 Simulation results for NR PUSCH CATT imported from 3GU
R4‑1814629 Simulation results for NR PUSCH CATT imported from 3GU
R4‑1814630 Simulation results for NR PUCCH CATT imported from 3GU
R4‑1814630 Simulation results for NR PUCCH CATT imported from 3GU
R4‑1814630 Simulation results for NR PUCCH CATT imported from 3GU
R4‑1814631 Simulation results for NR PRACH CATT imported from 3GU
R4‑1814631 Simulation results for NR PRACH CATT imported from 3GU
R4‑1814631 Simulation results for NR PRACH CATT imported from 3GU
R4‑1814632 Draft CR for TS38.104: Performance requirements for PRACH CATT imported from 3GU
R4‑1814632 Draft CR for TS38.104: Performance requirements for PRACH CATT imported from 3GU
R4‑1814632 Draft CR for TS38.104: Performance requirements for PRACH CATT imported from 3GU
R4‑1814633 TP to TS38.141-1: Performance requirements for PRACH CATT imported from 3GU
R4‑1814633 TP to TS38.141-1: Performance requirements for PRACH CATT imported from 3GU
R4‑1814633 TP to TS38.141-1: Performance requirements for PRACH CATT imported from 3GU
R4‑1814634 TP to TS38.141-2: Performance requirements for PRACH CATT imported from 3GU
R4‑1814634 TP to TS38.141-2: Performance requirements for PRACH CATT imported from 3GU
R4‑1814634 TP to TS38.141-2: Performance requirements for PRACH CATT imported from 3GU
R4‑1814635 Draft CR for TS38.104: Correction on OTA transmitter and receiver intermodulation CATT imported from 3GU
R4‑1814635 Draft CR for TS38.104: Correction on OTA transmitter and receiver intermodulation CATT imported from 3GU
R4‑1814635 Draft CR for TS38.104: Correction on OTA transmitter and receiver intermodulation CATT imported from 3GU
R4‑1814636 Draft CR for TS37.105: Clean up multi-band RIBs CATT imported from 3GU
R4‑1814636 Draft CR for TS37.105: Clean up multi-band RIBs CATT imported from 3GU
R4‑1814636 Draft CR for TS37.105: Clean up multi-band RIBs CATT imported from 3GU
R4‑1814637 TP to TS 38.141-1: Correction on power boosting for FR1 test model CATT imported from 3GU
R4‑1814637 TP to TS 38.141-1: Correction on power boosting for FR1 test model CATT imported from 3GU
R4‑1814637 TP to TS 38.141-1: Correction on power boosting for FR1 test model CATT imported from 3GU
R4‑1814638 Discussion on EIRP OFF power for measuring FR2 transient period CATT imported from 3GU
R4‑1814638 Discussion on EIRP OFF power for measuring FR2 transient period CATT imported from 3GU
R4‑1814638 Discussion on EIRP OFF power for measuring FR2 transient period CATT imported from 3GU
R4‑1814639 Further discussion on Scell activation requirements in FR2 CATT imported from 3GU
R4‑1814639 Further discussion on Scell activation requirements in FR2 CATT imported from 3GU
R4‑1814639 Further discussion on Scell activation requirements in FR2 CATT imported from 3GU
R4‑1814640 CR on Scell activation requirements in FR2 CATT imported from 3GU
R4‑1814640 CR on Scell activation requirements in FR2 CATT imported from 3GU
R4‑1814640 CR on Scell activation requirements in FR2 CATT imported from 3GU
R4‑1814641 CR on MTTD and MRTD for inter-band CA CATT imported from 3GU
R4‑1814641 CR on MTTD and MRTD for inter-band CA CATT imported from 3GU
R4‑1814641 CR on MTTD and MRTD for inter-band CA CATT imported from 3GU
R4‑1814642 Test cases for SCell activation/deactivation in SA CATT imported from 3GU
R4‑1814642 Test cases for SCell activation/deactivation in SA CATT imported from 3GU
R4‑1814642 Test cases for SCell activation/deactivation in SA CATT imported from 3GU
R4‑1814643 Test cases for BWP switching in SA CATT imported from 3GU
R4‑1814643 Test cases for BWP switching in SA CATT imported from 3GU
R4‑1814643 Test cases for BWP switching in SA CATT imported from 3GU
R4‑1814644 Correction and updates to test cases for interruption at transitions in EN-DC CATT imported from 3GU
R4‑1814644 Correction and updates to test cases for interruption at transitions in EN-DC CATT imported from 3GU
R4‑1814644 Correction and updates to test cases for interruption at transitions in EN-DC CATT imported from 3GU
R4‑1814645 Correction and updates to test cases for interruption due to deactivated SCell operations in EN-DC CATT imported from 3GU
R4‑1814645 Correction and updates to test cases for interruption due to deactivated SCell operations in EN-DC CATT imported from 3GU
R4‑1814645 Correction and updates to test cases for interruption due to deactivated SCell operations in EN-DC CATT imported from 3GU
R4‑1814646 Further discussion on Pcmax for inter band EN-DC on FR1 CATT imported from 3GU
R4‑1814646 Further discussion on Pcmax for inter band EN-DC on FR1 CATT imported from 3GU
R4‑1814646 Further discussion on Pcmax for inter band EN-DC on FR1 CATT imported from 3GU
R4‑1814647 Pcmax requirement for inter band EN-DC on FR1 CATT imported from 3GU
R4‑1814647 Pcmax requirement for inter band EN-DC on FR1 CATT imported from 3GU
R4‑1814647 Pcmax requirement for inter band EN-DC on FR1 CATT imported from 3GU
R4‑1814648 Evaluation for 2 RX exception in Rel-15 for vehicle mounted UE CATT imported from 3GU
R4‑1814648 Evaluation for 2 RX exception in Rel-15 for vehicle mounted UE CATT imported from 3GU
R4‑1814648 Evaluation for 2 RX exception in Rel-15 for vehicle mounted UE CATT imported from 3GU
R4‑1814649 NR V2X RF operating parameters for RAN1 evaluation CATT imported from 3GU
R4‑1814649 NR V2X RF operating parameters for RAN1 evaluation CATT imported from 3GU
R4‑1814649 NR V2X RF operating parameters for RAN1 evaluation CATT imported from 3GU
R4‑1814650 TP for TR38.716-02-00: Inerferenc analysis and reuiqrements for inter-band CA_n8-n41 CATT imported from 3GU
R4‑1814650 TP for TR38.716-02-00: Inerferenc analysis and reuiqrements for inter-band CA_n8-n41 CATT imported from 3GU
R4‑1814650 TP for TR38.716-02-00: Inerferenc analysis and reuiqrements for inter-band CA_n8-n41 CATT imported from 3GU
R4‑1814651 TP for TR38.716-02-00: Interference analysis and requirements for inter-band CA_n41-n79 CATT imported from 3GU
R4‑1814651 TP for TR38.716-02-00: Interference analysis and requirements for inter-band CA_n41-n79 CATT imported from 3GU
R4‑1814651 TP for TR38.716-02-00: Interference analysis and requirements for inter-band CA_n41-n79 CATT imported from 3GU
R4‑1814652 TP for 37.716-11-11: MSD for inter-band EN DC_3A-n41A CATT imported from 3GU
R4‑1814652 TP for 37.716-11-11: MSD for inter-band EN DC_3A-n41A CATT imported from 3GU
R4‑1814652 TP for 37.716-11-11: MSD for inter-band EN DC_3A-n41A CATT imported from 3GU
R4‑1814653 TP for 37.716-11-11: Interference analysis and requirements for inter-band EN DC_39A-n41A CATT imported from 3GU
R4‑1814653 TP for 37.716-11-11: Interference analysis and requirements for inter-band EN DC_39A-n41A CATT imported from 3GU
R4‑1814653 TP for 37.716-11-11: Interference analysis and requirements for inter-band EN DC_39A-n41A CATT imported from 3GU
R4‑1814654 PDSCH Performance with LTE NR Coexistence AT&T imported from 3GU
R4‑1814654 PDSCH Performance with LTE NR Coexistence AT&T imported from 3GU
R4‑1814654 PDSCH Performance with LTE NR Coexistence AT&T imported from 3GU
R4‑1814655 On wideband carrier operation for NR-U AT&T imported from 3GU
R4‑1814655 On wideband carrier operation for NR-U AT&T imported from 3GU
R4‑1814655 On wideband carrier operation for NR-U AT&T imported from 3GU
R4‑1814656 Beam Correspondence for Rel-15 Sony, Ericsson imported from 3GU
R4‑1814656 Beam Correspondence for Rel-15 Sony, Ericsson imported from 3GU
R4‑1814656 Beam Correspondence for Rel-15 Sony, Ericsson imported from 3GU
R4‑1814657 UE RSRP accuracy and RAN5 OTA Signalling test cases for FR2 ANRITSU LTD imported from 3GU
R4‑1814657 UE RSRP accuracy and RAN5 OTA Signalling test cases for FR2 ANRITSU LTD imported from 3GU
R4‑1814657 UE RSRP accuracy and RAN5 OTA Signalling test cases for FR2 ANRITSU LTD imported from 3GU
R4‑1814658 Intra-frequency Relative SS RSRP Accuracy for FR2 ANRITSU LTD imported from 3GU
R4‑1814658 Intra-frequency Relative SS RSRP Accuracy for FR2 ANRITSU LTD imported from 3GU
R4‑1814658 Intra-frequency Relative SS RSRP Accuracy for FR2 ANRITSU LTD imported from 3GU
R4‑1814659 Correction of MPR for NB-IoT Power Class 6 Rel-14 Sony imported from 3GU
R4‑1814659 Correction of MPR for NB-IoT Power Class 6 Rel-14 Sony imported from 3GU
R4‑1814659 Correction of MPR for NB-IoT Power Class 6 Rel-14 Sony imported from 3GU
R4‑1814660 Correction of MPR for NB-IoT Power Class 6 Rel-15 Sony imported from 3GU
R4‑1814660 Correction of MPR for NB-IoT Power Class 6 Rel-15 Sony imported from 3GU
R4‑1814660 Correction of MPR for NB-IoT Power Class 6 Rel-15 Sony imported from 3GU
R4‑1814661 Simulation results and discussion on NR CQI reporting under AWGN conditions Intel Corporation imported from 3GU
R4‑1814661 Simulation results and discussion on NR CQI reporting under AWGN conditions Intel Corporation imported from 3GU
R4‑1814661 Simulation results and discussion on NR CQI reporting under AWGN conditions Intel Corporation imported from 3GU
R4‑1814662 Simulation results and discussion on NR CQI reporting under fading conditions Intel Corporation imported from 3GU
R4‑1814662 Simulation results and discussion on NR CQI reporting under fading conditions Intel Corporation imported from 3GU
R4‑1814662 Simulation results and discussion on NR CQI reporting under fading conditions Intel Corporation imported from 3GU
R4‑1814663 Simulation results and discussion on NR PMI reporting Intel Corporation imported from 3GU
R4‑1814663 Simulation results and discussion on NR PMI reporting Intel Corporation imported from 3GU
R4‑1814663 Simulation results and discussion on NR PMI reporting Intel Corporation imported from 3GU
R4‑1814664 Simulation results and discussion on NR RI reporting Intel Corporation imported from 3GU
R4‑1814664 Simulation results and discussion on NR RI reporting Intel Corporation imported from 3GU
R4‑1814664 Simulation results and discussion on NR RI reporting Intel Corporation imported from 3GU
R4‑1814665 TP to TS 38.101-4: FR2 CQI requirements (8.2) Intel Corporation imported from 3GU
R4‑1814665 TP to TS 38.101-4: FR2 CQI requirements (8.2) Intel Corporation imported from 3GU
R4‑1814665 TP to TS 38.101-4: FR2 CQI requirements (8.2) Intel Corporation imported from 3GU
R4‑1814666 CR on clarification of applicability of performance requirements for UE supporting CE Intel Corporation imported from 3GU
R4‑1814666 CR on clarification of applicability of performance requirements for UE supporting CE Intel Corporation imported from 3GU
R4‑1814666 CR on clarification of applicability of performance requirements for UE supporting CE Intel Corporation imported from 3GU
R4‑1814667 CR on clarification of applicability of performance requirements for UE supporting CE Intel Corporation imported from 3GU
R4‑1814667 CR on clarification of applicability of performance requirements for UE supporting CE Intel Corporation imported from 3GU
R4‑1814667 CR on clarification of applicability of performance requirements for UE supporting CE Intel Corporation imported from 3GU
R4‑1814668 Discussion on eFeMTC UE demodulation performance requirements Intel Corporation imported from 3GU
R4‑1814668 Discussion on eFeMTC UE demodulation performance requirements Intel Corporation imported from 3GU
R4‑1814668 Discussion on eFeMTC UE demodulation performance requirements Intel Corporation imported from 3GU
R4‑1814669 Discussion on applicability of performance requirements for 8Rx UEs Intel Corporation imported from 3GU
R4‑1814669 Discussion on applicability of performance requirements for 8Rx UEs Intel Corporation imported from 3GU
R4‑1814669 Discussion on applicability of performance requirements for 8Rx UEs Intel Corporation imported from 3GU
R4‑1814670 PDSCH simulation results and discussion for 8Rx UEs Intel Corporation imported from 3GU
R4‑1814670 PDSCH simulation results and discussion for 8Rx UEs Intel Corporation imported from 3GU
R4‑1814670 PDSCH simulation results and discussion for 8Rx UEs Intel Corporation imported from 3GU
R4‑1814671 Simulation results and discussion for 8Rx SDR tests Intel Corporation imported from 3GU
R4‑1814671 Simulation results and discussion for 8Rx SDR tests Intel Corporation imported from 3GU
R4‑1814671 Simulation results and discussion for 8Rx SDR tests Intel Corporation imported from 3GU
R4‑1814672 Discussion on 8Rx UE CSI performance requirement tests Intel Corporation imported from 3GU
R4‑1814672 Discussion on 8Rx UE CSI performance requirement tests Intel Corporation imported from 3GU
R4‑1814672 Discussion on 8Rx UE CSI performance requirement tests Intel Corporation imported from 3GU
R4‑1814673 Clarifications to CRS-IM applicability requirements Qualcomm Incorporated imported from 3GU
R4‑1814673 Clarifications to CRS-IM applicability requirements Qualcomm Incorporated imported from 3GU
R4‑1814673 Clarifications to CRS-IM applicability requirements Qualcomm Incorporated imported from 3GU
R4‑1814674 Clarifications to efeMTC CRS-IM applicability requirements Qualcomm Incorporated imported from 3GU
R4‑1814674 Clarifications to efeMTC CRS-IM applicability requirements Qualcomm Incorporated imported from 3GU
R4‑1814674 Clarifications to efeMTC CRS-IM applicability requirements Qualcomm Incorporated imported from 3GU
R4‑1814675 Clarifications to RRM requirements for dormant SCell Qualcomm Incorporated imported from 3GU
R4‑1814675 Clarifications to RRM requirements for dormant SCell Qualcomm Incorporated imported from 3GU
R4‑1814675 Clarifications to RRM requirements for dormant SCell Qualcomm Incorporated imported from 3GU
R4‑1814676 NB-IoT RSTD accuracy tests using Type 2 NPRS - Rel14 Qualcomm Incorporated imported from 3GU
R4‑1814676 NB-IoT RSTD accuracy tests using Type 2 NPRS - Rel14 Qualcomm Incorporated imported from 3GU
R4‑1814676 NB-IoT RSTD accuracy tests using Type 2 NPRS - Rel14 Qualcomm Incorporated imported from 3GU
R4‑1814677 NB-IoT RSTD accuracy tests using Type 2 NPRS - Rel15 Qualcomm Incorporated imported from 3GU
R4‑1814677 NB-IoT RSTD accuracy tests using Type 2 NPRS - Rel15 Qualcomm Incorporated imported from 3GU
R4‑1814677 NB-IoT RSTD accuracy tests using Type 2 NPRS - Rel15 Qualcomm Incorporated imported from 3GU
R4‑1814678 PDSCH traffic pattern in 4Rx PHICH Demodulation test Qualcomm Incorporated imported from 3GU
R4‑1814678 PDSCH traffic pattern in 4Rx PHICH Demodulation test Qualcomm Incorporated imported from 3GU
R4‑1814678 PDSCH traffic pattern in 4Rx PHICH Demodulation test Qualcomm Incorporated imported from 3GU
R4‑1814679 PDSCH traffic pattern in 4Rx PHICH Demodulation test - Rel-14 Qualcomm Incorporated imported from 3GU
R4‑1814679 PDSCH traffic pattern in 4Rx PHICH Demodulation test - Rel-14 Qualcomm Incorporated imported from 3GU
R4‑1814679 PDSCH traffic pattern in 4Rx PHICH Demodulation test - Rel-14 Qualcomm Incorporated imported from 3GU
R4‑1814680 PDSCH traffic pattern in 4Rx PHICH Demodulation test - Rel-15 Qualcomm Incorporated imported from 3GU
R4‑1814680 PDSCH traffic pattern in 4Rx PHICH Demodulation test - Rel-15 Qualcomm Incorporated imported from 3GU
R4‑1814680 PDSCH traffic pattern in 4Rx PHICH Demodulation test - Rel-15 Qualcomm Incorporated imported from 3GU
R4‑1814681 Size of exclusion zones for EMC immunity for OTA AAS and NR BS 1-O Ericsson imported from 3GU
R4‑1814681 Size of exclusion zones for EMC immunity for OTA AAS and NR BS 1-O Ericsson imported from 3GU
R4‑1814681 Size of exclusion zones for EMC immunity for OTA AAS and NR BS 1-O Ericsson imported from 3GU
R4‑1814682 CR to TS 37.113: Exclusion Bands for Radiated Immunity Test Ericsson imported from 3GU
R4‑1814682 CR to TS 37.113: Exclusion Bands for Radiated Immunity Test Ericsson imported from 3GU
R4‑1814682 CR to TS 37.113: Exclusion Bands for Radiated Immunity Test Ericsson imported from 3GU
R4‑1814683 Draft CR to TS 37.114: Exclusion Bands for Radiated Immunity Test Ericsson imported from 3GU
R4‑1814683 Draft CR to TS 37.114: Exclusion Bands for Radiated Immunity Test Ericsson imported from 3GU
R4‑1814683 Draft CR to TS 37.114: Exclusion Bands for Radiated Immunity Test Ericsson imported from 3GU
R4‑1814684 Draft CR to TS 38.113: Exclusion Bands for Radiated Immunity Test Ericsson imported from 3GU
R4‑1814684 Draft CR to TS 38.113: Exclusion Bands for Radiated Immunity Test Ericsson imported from 3GU
R4‑1814684 Draft CR to TS 38.113: Exclusion Bands for Radiated Immunity Test Ericsson imported from 3GU
R4‑1814685 CR to TS 37.114: Clarification on Exclusion Bands for Radiated Immunity Test in FR2 Ericsson imported from 3GU
R4‑1814685 CR to TS 37.114: Clarification on Exclusion Bands for Radiated Immunity Test in FR2 Ericsson imported from 3GU
R4‑1814685 CR to TS 37.114: Clarification on Exclusion Bands for Radiated Immunity Test in FR2 Ericsson imported from 3GU
R4‑1814686 Draft CR to TS 38.113: Clarification on Exclusion Bands for Radiated Immunity Test in FR2 Ericsson imported from 3GU
R4‑1814686 Draft CR to TS 38.113: Clarification on Exclusion Bands for Radiated Immunity Test in FR2 Ericsson imported from 3GU
R4‑1814686 Draft CR to TS 38.113: Clarification on Exclusion Bands for Radiated Immunity Test in FR2 Ericsson imported from 3GU
R4‑1814687 CR to TS 37.113: Clarification on Radiated Immunity Test for BS capable of multi-band operation Ericsson imported from 3GU
R4‑1814687 CR to TS 37.113: Clarification on Radiated Immunity Test for BS capable of multi-band operation Ericsson imported from 3GU
R4‑1814687 CR to TS 37.113: Clarification on Radiated Immunity Test for BS capable of multi-band operation Ericsson imported from 3GU
R4‑1814688 CR to TS 37.114: Clarification on Radiated Immunity Test for BS capable of multi-band operation Ericsson imported from 3GU
R4‑1814688 CR to TS 37.114: Clarification on Radiated Immunity Test for BS capable of multi-band operation Ericsson imported from 3GU
R4‑1814688 CR to TS 37.114: Clarification on Radiated Immunity Test for BS capable of multi-band operation Ericsson imported from 3GU
R4‑1814689 Draft CR to TS 38.113: Clarification on Radiated Immunity Test for BS capable of multi-band operation Ericsson imported from 3GU
R4‑1814689 Draft CR to TS 38.113: Clarification on Radiated Immunity Test for BS capable of multi-band operation Ericsson imported from 3GU
R4‑1814689 Draft CR to TS 38.113: Clarification on Radiated Immunity Test for BS capable of multi-band operation Ericsson imported from 3GU
R4‑1814690 Draft CR to TS 38.113: Adjustment of Scope Ericsson imported from 3GU
R4‑1814690 Draft CR to TS 38.113: Adjustment of Scope Ericsson imported from 3GU
R4‑1814690 Draft CR to TS 38.113: Adjustment of Scope Ericsson imported from 3GU
R4‑1814691 Draft CR to TS 38.113: Ancillary equipment definition Ericsson imported from 3GU
R4‑1814691 Draft CR to TS 38.113: Ancillary equipment definition Ericsson imported from 3GU
R4‑1814691 Draft CR to TS 38.113: Ancillary equipment definition Ericsson imported from 3GU
R4‑1814692 Draft CR to TS 38.113: Arrangements for establishing a communication link Ericsson imported from 3GU
R4‑1814692 Draft CR to TS 38.113: Arrangements for establishing a communication link Ericsson imported from 3GU
R4‑1814692 Draft CR to TS 38.113: Arrangements for establishing a communication link Ericsson imported from 3GU
R4‑1814693 Draft CR to TS 38.113: Performance criteria for transient phenomena for BS Ericsson imported from 3GU
R4‑1814693 Draft CR to TS 38.113: Performance criteria for transient phenomena for BS Ericsson imported from 3GU
R4‑1814693 Draft CR to TS 38.113: Performance criteria for transient phenomena for BS Ericsson imported from 3GU
R4‑1814694 Draft CR to TS 38.113: Performance criteria for transient phenomena for Ancillary equipment Ericsson imported from 3GU
R4‑1814694 Draft CR to TS 38.113: Performance criteria for transient phenomena for Ancillary equipment Ericsson imported from 3GU
R4‑1814694 Draft CR to TS 38.113: Performance criteria for transient phenomena for Ancillary equipment Ericsson imported from 3GU
R4‑1814695 LS on NR ATF to include per branch relative phase UE measurement Keysight Technologies UK Ltd imported from 3GU
R4‑1814695 LS on NR ATF to include per branch relative phase UE measurement Keysight Technologies UK Ltd imported from 3GU
R4‑1814695 LS on NR ATF to include per branch relative phase UE measurement Keysight Technologies UK Ltd imported from 3GU
R4‑1814696 Further views on SDL+SUL pairing AT&T imported from 3GU
R4‑1814696 Further views on SDL+SUL pairing AT&T imported from 3GU
R4‑1814696 Further views on SDL+SUL pairing AT&T imported from 3GU
R4‑1814697 Draft CR to TS38.101-2 to correct UL CA scope for FR2 in Rel-15 Apple Inc. imported from 3GU
R4‑1814697 Draft CR to TS38.101-2 to correct UL CA scope for FR2 in Rel-15 Apple Inc. imported from 3GU
R4‑1814697 Draft CR to TS38.101-2 to correct UL CA scope for FR2 in Rel-15 Apple Inc. imported from 3GU
R4‑1814698 Draft CR to TS38.101-2 updating references Apple Inc. imported from 3GU
R4‑1814698 Draft CR to TS38.101-2 updating references Apple Inc. imported from 3GU
R4‑1814698 Draft CR to TS38.101-2 updating references Apple Inc. imported from 3GU
R4‑1814699 Draft CR to TS38.101-2 correcting the Pcmax requirement Apple Inc. imported from 3GU
R4‑1814699 Draft CR to TS38.101-2 correcting the Pcmax requirement Apple Inc. imported from 3GU
R4‑1814699 Draft CR to TS38.101-2 correcting the Pcmax requirement Apple Inc. imported from 3GU
R4‑1814700 Draft CR to TS38.101-2 introducing the CA Pcmax requirement Apple Inc. imported from 3GU
R4‑1814700 Draft CR to TS38.101-2 introducing the CA Pcmax requirement Apple Inc. imported from 3GU
R4‑1814700 Draft CR to TS38.101-2 introducing the CA Pcmax requirement Apple Inc. imported from 3GU
R4‑1814701 Draft CR to TS38.101-2 correcting the TPC requirement Apple Inc. imported from 3GU
R4‑1814701 Draft CR to TS38.101-2 correcting the TPC requirement Apple Inc. imported from 3GU
R4‑1814701 Draft CR to TS38.101-2 correcting the TPC requirement Apple Inc. imported from 3GU
R4‑1814702 Further views on extending FR2 power class requirements to multi-band UEs Apple Inc. imported from 3GU
R4‑1814702 Further views on extending FR2 power class requirements to multi-band UEs Apple Inc. imported from 3GU
R4‑1814702 Further views on extending FR2 power class requirements to multi-band UEs Apple Inc. imported from 3GU
R4‑1814703 Draft CR to TS 38.101-2: Introducing multi-band applicability for PC3 Apple Inc. imported from 3GU
R4‑1814703 Draft CR to TS 38.101-2: Introducing multi-band applicability for PC3 Apple Inc. imported from 3GU
R4‑1814703 Draft CR to TS 38.101-2: Introducing multi-band applicability for PC3 Apple Inc. imported from 3GU
R4‑1814704 Draft reply LS on frequency separation class Intel Corporation imported from 3GU
R4‑1814704 Draft reply LS on frequency separation class Intel Corporation imported from 3GU
R4‑1814704 Draft reply LS on frequency separation class Intel Corporation imported from 3GU
R4‑1814705 Discussion on PCmax of V2X. Qualcomm Inc. imported from 3GU
R4‑1814705 Discussion on PCmax of V2X. Qualcomm Inc. imported from 3GU
R4‑1814705 Discussion on PCmax of V2X. Qualcomm Inc. imported from 3GU
R4‑1814706 Support of 7.5 kHz carrier shift for additional operating bands Ericsson, KDDI imported from 3GU
R4‑1814706 Support of 7.5 kHz carrier shift for additional operating bands Ericsson, KDDI imported from 3GU
R4‑1814706 Support of 7.5 kHz carrier shift for additional operating bands Ericsson, KDDI imported from 3GU
R4‑1814707 Support of 7.5 kHz carrier shift for additional operating bands Ericsson, KDDI imported from 3GU
R4‑1814707 Support of 7.5 kHz carrier shift for additional operating bands Ericsson, KDDI imported from 3GU
R4‑1814707 Support of 7.5 kHz carrier shift for additional operating bands Ericsson, KDDI imported from 3GU
R4‑1814708 Reply LS on simultaneous LTE and NR transmissions in EN-DC Ericsson imported from 3GU
R4‑1814708 Reply LS on simultaneous LTE and NR transmissions in EN-DC Ericsson imported from 3GU
R4‑1814708 Reply LS on simultaneous LTE and NR transmissions in EN-DC Ericsson imported from 3GU
R4‑1814709 Verification of Pcmax for inter-band EN-DC: total transmitted power Ericsson imported from 3GU
R4‑1814709 Verification of Pcmax for inter-band EN-DC: total transmitted power Ericsson imported from 3GU
R4‑1814709 Verification of Pcmax for inter-band EN-DC: total transmitted power Ericsson imported from 3GU
R4‑1814710 Verification of Pcmax for inter-band EN-DC: power reduction and dropping Ericsson imported from 3GU
R4‑1814710 Verification of Pcmax for inter-band EN-DC: power reduction and dropping Ericsson imported from 3GU
R4‑1814710 Verification of Pcmax for inter-band EN-DC: power reduction and dropping Ericsson imported from 3GU
R4‑1814711 Configured maximum output power for inter-band EN-DC within FR1 Ericsson imported from 3GU
R4‑1814711 Configured maximum output power for inter-band EN-DC within FR1 Ericsson imported from 3GU
R4‑1814711 Configured maximum output power for inter-band EN-DC within FR1 Ericsson imported from 3GU
R4‑1814712 Verification of Pcmax for intra-band EN-DC Ericsson imported from 3GU
R4‑1814712 Verification of Pcmax for intra-band EN-DC Ericsson imported from 3GU
R4‑1814712 Verification of Pcmax for intra-band EN-DC Ericsson imported from 3GU
R4‑1814713 Completion of configured maximum output power for intra-band contiguous EN-DC Ericsson imported from 3GU
R4‑1814713 Completion of configured maximum output power for intra-band contiguous EN-DC Ericsson imported from 3GU
R4‑1814713 Completion of configured maximum output power for intra-band contiguous EN-DC Ericsson imported from 3GU
R4‑1814714 Configured maximum output power for intra-band non-contiguous EN-DC Ericsson imported from 3GU
R4‑1814714 Configured maximum output power for intra-band non-contiguous EN-DC Ericsson imported from 3GU
R4‑1814714 Configured maximum output power for intra-band non-contiguous EN-DC Ericsson imported from 3GU
R4‑1814715 Phase discontinuity and other “single PA” capabilities Ericsson imported from 3GU
R4‑1814715 Phase discontinuity and other “single PA” capabilities Ericsson imported from 3GU
R4‑1814715 Phase discontinuity and other “single PA” capabilities Ericsson imported from 3GU
R4‑1814716 A-MPR for intra-band EN-DC Ericsson imported from 3GU
R4‑1814716 A-MPR for intra-band EN-DC Ericsson imported from 3GU
R4‑1814716 A-MPR for intra-band EN-DC Ericsson imported from 3GU
R4‑1814717 HPUE for EN-DC Ericsson imported from 3GU
R4‑1814717 HPUE for EN-DC Ericsson imported from 3GU
R4‑1814717 HPUE for EN-DC Ericsson imported from 3GU
R4‑1814718 Configured maximum output power for HPUE for intra-band EN-DC Ericsson imported from 3GU
R4‑1814718 Configured maximum output power for HPUE for intra-band EN-DC Ericsson imported from 3GU
R4‑1814718 Configured maximum output power for HPUE for intra-band EN-DC Ericsson imported from 3GU
R4‑1814719 Update on RF EMF regulations of relevance for handheld devices operating in the FR2 bands Ericsson, Sony imported from 3GU
R4‑1814719 Update on RF EMF regulations of relevance for handheld devices operating in the FR2 bands Ericsson, Sony imported from 3GU
R4‑1814719 Update on RF EMF regulations of relevance for handheld devices operating in the FR2 bands Ericsson, Sony imported from 3GU
R4‑1814720 Verification of beam correspondence Ericsson, Sony imported from 3GU
R4‑1814720 Verification of beam correspondence Ericsson, Sony imported from 3GU
R4‑1814720 Verification of beam correspondence Ericsson, Sony imported from 3GU
R4‑1814721 P-Max indication for FR2 Ericsson imported from 3GU
R4‑1814721 P-Max indication for FR2 Ericsson imported from 3GU
R4‑1814721 P-Max indication for FR2 Ericsson imported from 3GU
R4‑1814722 LS on P-Max indication for FR2 Ericsson imported from 3GU
R4‑1814722 LS on P-Max indication for FR2 Ericsson imported from 3GU
R4‑1814722 LS on P-Max indication for FR2 Ericsson imported from 3GU
R4‑1814723 On the specification of PCG Ericsson imported from 3GU
R4‑1814723 On the specification of PCG Ericsson imported from 3GU
R4‑1814723 On the specification of PCG Ericsson imported from 3GU
R4‑1814724 Correction of PCmax requirement for V2X Qualcomm Inc. imported from 3GU
R4‑1814724 Correction of PCmax requirement for V2X Qualcomm Inc. imported from 3GU
R4‑1814724 Correction of PCmax requirement for V2X Qualcomm Inc. imported from 3GU
R4‑1814725 Simulation Results for eV2X single link demodulation test Qualcomm Inc. imported from 3GU
R4‑1814725 Simulation Results for eV2X single link demodulation test Qualcomm Inc. imported from 3GU
R4‑1814725 Simulation Results for eV2X single link demodulation test Qualcomm Inc. imported from 3GU
R4‑1814726 draft CR on beam correspondence requirements in FR2 LG Electronics imported from 3GU
R4‑1814726 draft CR on beam correspondence requirements in FR2 LG Electronics imported from 3GU
R4‑1814726 draft CR on beam correspondence requirements in FR2 LG Electronics imported from 3GU
R4‑1814727 draft CR of MPR for Power Class 2 in FR2 LG Electronics imported from 3GU
R4‑1814727 draft CR of MPR for Power Class 2 in FR2 LG Electronics imported from 3GU
R4‑1814727 draft CR of MPR for Power Class 2 in FR2 LG Electronics imported from 3GU
R4‑1814728 Discussion on UE behavior on the slot before or after MG LG Electronics imported from 3GU
R4‑1814728 Discussion on UE behavior on the slot before or after MG LG Electronics imported from 3GU
R4‑1814728 Discussion on UE behavior on the slot before or after MG LG Electronics imported from 3GU
R4‑1814729 CR on MRTD requirement for intra-band synchronous EN-DC (section 7.6.3) Intel Corporation imported from 3GU
R4‑1814729 CR on MRTD requirement for intra-band synchronous EN-DC (section 7.6.3) Intel Corporation imported from 3GU
R4‑1814729 CR on MRTD requirement for intra-band synchronous EN-DC (section 7.6.3) Intel Corporation imported from 3GU
R4‑1814730 CR on interruption due to BWP switching requirement in TS38.133 (Section 8.2) Intel Corporation imported from 3GU
R4‑1814730 CR on interruption due to BWP switching requirement in TS38.133 (Section 8.2) Intel Corporation imported from 3GU
R4‑1814730 CR on interruption due to BWP switching requirement in TS38.133 (Section 8.2) Intel Corporation imported from 3GU
R4‑1814731 draft CR on UE behavior in the slot before or after MG LG Electronics imported from 3GU
R4‑1814731 draft CR on UE behavior in the slot before or after MG LG Electronics imported from 3GU
R4‑1814731 draft CR on UE behavior in the slot before or after MG LG Electronics imported from 3GU
R4‑1814732 CR for 36.133 on E-UTRAN measurement to support gap pattern 4, 6,7,8,10 (section 8.1.2.1, 8.1.2.3.1.2, 8.1.2.3.2.2, 8.17.3) CMCC, MediaTek, Huawei, HiSilicon imported from 3GU
R4‑1814732 CR for 36.133 on E-UTRAN measurement to support gap pattern 4, 6,7,8,10 (section 8.1.2.1, 8.1.2.3.1.2, 8.1.2.3.2.2, 8.17.3) CMCC, MediaTek, Huawei, HiSilicon imported from 3GU
R4‑1814732 CR for 36.133 on E-UTRAN measurement to support gap pattern 4, 6,7,8,10 (section 8.1.2.1, 8.1.2.3.1.2, 8.1.2.3.2.2, 8.17.3) CMCC, MediaTek, Huawei, HiSilicon imported from 3GU
R4‑1814733 Further discussion on the RLM test cases CMCC imported from 3GU
R4‑1814733 Further discussion on the RLM test cases CMCC imported from 3GU
R4‑1814733 Further discussion on the RLM test cases CMCC imported from 3GU
R4‑1814734 Discussion on DRX in EN-DC CMCC imported from 3GU
R4‑1814734 Discussion on DRX in EN-DC CMCC imported from 3GU
R4‑1814734 Discussion on DRX in EN-DC CMCC imported from 3GU
R4‑1814735 Draft CR for 38.133 on inter-frequency measurement accuracy (section 10.1.4.1, 10.1.9.1, 10.1.14.1) CMCC imported from 3GU
R4‑1814735 Draft CR for 38.133 on inter-frequency measurement accuracy (section 10.1.4.1, 10.1.9.1, 10.1.14.1) CMCC imported from 3GU
R4‑1814735 Draft CR for 38.133 on inter-frequency measurement accuracy (section 10.1.4.1, 10.1.9.1, 10.1.14.1) CMCC imported from 3GU
R4‑1814736 Draft CR for 38.133 on applicability for Gap Pattern Configurations (section 9.1.2) CMCC imported from 3GU
R4‑1814736 Draft CR for 38.133 on applicability for Gap Pattern Configurations (section 9.1.2) CMCC imported from 3GU
R4‑1814736 Draft CR for 38.133 on applicability for Gap Pattern Configurations (section 9.1.2) CMCC imported from 3GU
R4‑1814737 Discussion on beam reporting CMCC imported from 3GU
R4‑1814737 Discussion on beam reporting CMCC imported from 3GU
R4‑1814737 Discussion on beam reporting CMCC imported from 3GU
R4‑1814738 Discussion on measurement accuracy of inter-frequency measurement for FR1 CMCC imported from 3GU
R4‑1814738 Discussion on measurement accuracy of inter-frequency measurement for FR1 CMCC imported from 3GU
R4‑1814738 Discussion on measurement accuracy of inter-frequency measurement for FR1 CMCC imported from 3GU
R4‑1814739 New WID on NR support for high speed train scenario CMCC imported from 3GU
R4‑1814739 New WID on NR support for high speed train scenario CMCC imported from 3GU
R4‑1814739 New WID on NR support for high speed train scenario CMCC imported from 3GU
R4‑1814740 Motivation for NR support for High speed train scenario CMCC imported from 3GU
R4‑1814740 Motivation for NR support for High speed train scenario CMCC imported from 3GU
R4‑1814740 Motivation for NR support for High speed train scenario CMCC imported from 3GU
R4‑1814741 On UE feature: short measurement gap CMCC imported from 3GU
R4‑1814741 On UE feature: short measurement gap CMCC imported from 3GU
R4‑1814741 On UE feature: short measurement gap CMCC imported from 3GU
R4‑1814742 Updated simulation and impairment results for NR PDSCH CMCC imported from 3GU
R4‑1814742 Updated simulation and impairment results for NR PDSCH CMCC imported from 3GU
R4‑1814742 Updated simulation and impairment results for NR PDSCH CMCC imported from 3GU
R4‑1814743 Discussion on NR PDCCH demodulation requirements for AL16 CMCC imported from 3GU
R4‑1814743 Discussion on NR PDCCH demodulation requirements for AL16 CMCC imported from 3GU
R4‑1814743 Discussion on NR PDCCH demodulation requirements for AL16 CMCC imported from 3GU
R4‑1814744 Further discussion on NR PBCH demodulation requirements CMCC imported from 3GU
R4‑1814744 Further discussion on NR PBCH demodulation requirements CMCC imported from 3GU
R4‑1814744 Further discussion on NR PBCH demodulation requirements CMCC imported from 3GU
R4‑1814745 Summary results for alignment and impairments of NR PBCH demodulation tests in Rel-15 CMCC imported from 3GU
R4‑1814745 Summary results for alignment and impairments of NR PBCH demodulation tests in Rel-15 CMCC imported from 3GU
R4‑1814745 Summary results for alignment and impairments of NR PBCH demodulation tests in Rel-15 CMCC imported from 3GU
R4‑1814746 Updated simulation and impairment results for NR PUSCH CMCC imported from 3GU
R4‑1814746 Updated simulation and impairment results for NR PUSCH CMCC imported from 3GU
R4‑1814746 Updated simulation and impairment results for NR PUSCH CMCC imported from 3GU
R4‑1814747 Updated simulation and impairment results for NR PUCCH CMCC imported from 3GU
R4‑1814747 Updated simulation and impairment results for NR PUCCH CMCC imported from 3GU
R4‑1814747 Updated simulation and impairment results for NR PUCCH CMCC imported from 3GU
R4‑1814748 Updated simulation and impairment results for NR PRACH CMCC imported from 3GU
R4‑1814748 Updated simulation and impairment results for NR PRACH CMCC imported from 3GU
R4‑1814748 Updated simulation and impairment results for NR PRACH CMCC imported from 3GU
R4‑1814749 Motivation for Power Class 2 UE for EN-DC (1 LTE band +1 NR band) CMCC imported from 3GU
R4‑1814749 Motivation for Power Class 2 UE for EN-DC (1 LTE band +1 NR band) CMCC imported from 3GU
R4‑1814749 Motivation for Power Class 2 UE for EN-DC (1 LTE band +1 NR band) CMCC imported from 3GU
R4‑1814750 New WID on Power Class 2 UE for EN-DC (1 LTE band +1 NR band) CMCC imported from 3GU
R4‑1814750 New WID on Power Class 2 UE for EN-DC (1 LTE band +1 NR band) CMCC imported from 3GU
R4‑1814750 New WID on Power Class 2 UE for EN-DC (1 LTE band +1 NR band) CMCC imported from 3GU
R4‑1814751 FR1 pi/2 BPSK Power Boost and n41 CMCC, Qualcomm imported from 3GU
R4‑1814751 FR1 pi/2 BPSK Power Boost and n41 CMCC, Qualcomm imported from 3GU
R4‑1814751 FR1 pi/2 BPSK Power Boost and n41 CMCC, Qualcomm imported from 3GU
R4‑1814752 DraftCR to TS 38.101-1 pi/2 BPSK in n41 CMCC,Qualcomm imported from 3GU
R4‑1814752 DraftCR to TS 38.101-1 pi/2 BPSK in n41 CMCC,Qualcomm imported from 3GU
R4‑1814752 DraftCR to TS 38.101-1 pi/2 BPSK in n41 CMCC,Qualcomm imported from 3GU
R4‑1814753 Discussion on OTA TDD transient time for FR2 CMCC imported from 3GU
R4‑1814753 Discussion on OTA TDD transient time for FR2 CMCC imported from 3GU
R4‑1814753 Discussion on OTA TDD transient time for FR2 CMCC imported from 3GU
R4‑1814754 Discussion on inter-band EN-DC power control CMCC imported from 3GU
R4‑1814754 Discussion on inter-band EN-DC power control CMCC imported from 3GU
R4‑1814754 Discussion on inter-band EN-DC power control CMCC imported from 3GU
R4‑1814755 draft CR on clarification of UE behavior during interrupted slots by MGL LG Electronics imported from 3GU
R4‑1814755 draft CR on clarification of UE behavior during interrupted slots by MGL LG Electronics imported from 3GU
R4‑1814755 draft CR on clarification of UE behavior during interrupted slots by MGL LG Electronics imported from 3GU
R4‑1814756 Conclusion of vehicle UE distinction methodology LG Electronics Deutschland imported from 3GU
R4‑1814756 Conclusion of vehicle UE distinction methodology LG Electronics Deutschland imported from 3GU
R4‑1814756 Conclusion of vehicle UE distinction methodology LG Electronics Deutschland imported from 3GU
R4‑1814757 Draft CR to TS 38.113 Arrangements for establishing a communication link (subclause 4.2) ZTE Corporation imported from 3GU
R4‑1814757 Draft CR to TS 38.113 Arrangements for establishing a communication link (subclause 4.2) ZTE Corporation imported from 3GU
R4‑1814757 Draft CR to TS 38.113 Arrangements for establishing a communication link (subclause 4.2) ZTE Corporation imported from 3GU
R4‑1814758 Draft CR to TS 38.113 Test configurations (subclause 4.5) ZTE Corporation imported from 3GU
R4‑1814758 Draft CR to TS 38.113 Test configurations (subclause 4.5) ZTE Corporation imported from 3GU
R4‑1814758 Draft CR to TS 38.113 Test configurations (subclause 4.5) ZTE Corporation imported from 3GU
R4‑1814759 on RX exclusion band for RI test ZTE Corporation imported from 3GU
R4‑1814759 on RX exclusion band for RI test ZTE Corporation imported from 3GU
R4‑1814759 on RX exclusion band for RI test ZTE Corporation imported from 3GU
R4‑1814760 on wanted signal power for RI test and the comparison with OTA blocking test ZTE Corporation imported from 3GU
R4‑1814760 on wanted signal power for RI test and the comparison with OTA blocking test ZTE Corporation imported from 3GU
R4‑1814760 on wanted signal power for RI test and the comparison with OTA blocking test ZTE Corporation imported from 3GU
R4‑1814761 on Conducted emission test methods at AC mains power input port ZTE Corporation imported from 3GU
R4‑1814761 on Conducted emission test methods at AC mains power input port ZTE Corporation imported from 3GU
R4‑1814761 on Conducted emission test methods at AC mains power input port ZTE Corporation imported from 3GU
R4‑1814762 CR to TS 36.113 (subclause 2 and 8.4.2 ) ZTE Corporation imported from 3GU
R4‑1814762 CR to TS 36.113 (subclause 2 and 8.4.2 ) ZTE Corporation imported from 3GU
R4‑1814762 CR to TS 36.113 (subclause 2 and 8.4.2 ) ZTE Corporation imported from 3GU
R4‑1814763 CR to TS 37.113 (subclause 2 and 8.4.2 ) ZTE Corporation imported from 3GU
R4‑1814763 CR to TS 37.113 (subclause 2 and 8.4.2 ) ZTE Corporation imported from 3GU
R4‑1814763 CR to TS 37.113 (subclause 2 and 8.4.2 ) ZTE Corporation imported from 3GU
R4‑1814764 Draft CR to TS 38.113 (subclause 2 and 8.4.2 ) ZTE Corporation imported from 3GU
R4‑1814764 Draft CR to TS 38.113 (subclause 2 and 8.4.2 ) ZTE Corporation imported from 3GU
R4‑1814764 Draft CR to TS 38.113 (subclause 2 and 8.4.2 ) ZTE Corporation imported from 3GU
R4‑1814765 Draft CR to TS 38.113 (subclause 3.3 ) ZTE Corporation imported from 3GU
R4‑1814765 Draft CR to TS 38.113 (subclause 3.3 ) ZTE Corporation imported from 3GU
R4‑1814765 Draft CR to TS 38.113 (subclause 3.3 ) ZTE Corporation imported from 3GU
R4‑1814766 Draft CR to TS 38.113 (subclause 4.1) ZTE Corporation imported from 3GU
R4‑1814766 Draft CR to TS 38.113 (subclause 4.1) ZTE Corporation imported from 3GU
R4‑1814766 Draft CR to TS 38.113 (subclause 4.1) ZTE Corporation imported from 3GU
R4‑1814767 Draft CR on 2Rx exceptions for vehicle mounted NR UE LG Electronics Deutschland imported from 3GU
R4‑1814767 Draft CR on 2Rx exceptions for vehicle mounted NR UE LG Electronics Deutschland imported from 3GU
R4‑1814767 Draft CR on 2Rx exceptions for vehicle mounted NR UE LG Electronics Deutschland imported from 3GU
R4‑1814768 TR 36.716-03-02 v0.2.0 update: LTE-A x bands DL (x=3,4,5) with 2 bands UL inter-band CA in rel-16 LG Electronics France imported from 3GU
R4‑1814768 TR 36.716-03-02 v0.2.0 update: LTE-A x bands DL (x=3,4,5) with 2 bands UL inter-band CA in rel-16 LG Electronics France imported from 3GU
R4‑1814768 TR 36.716-03-02 v0.2.0 update: LTE-A x bands DL (x=3,4,5) with 2 bands UL inter-band CA in rel-16 LG Electronics France imported from 3GU
R4‑1814769 TR 37.716-21-21 v0.2.0 update: LTE(xDL/1UL)+ NR(2DL/1UL) DC in rel-16 LG Electronics France imported from 3GU
R4‑1814769 TR 37.716-21-21 v0.2.0 update: LTE(xDL/1UL)+ NR(2DL/1UL) DC in rel-16 LG Electronics France imported from 3GU
R4‑1814769 TR 37.716-21-21 v0.2.0 update: LTE(xDL/1UL)+ NR(2DL/1UL) DC in rel-16 LG Electronics France imported from 3GU
R4‑1814770 Revised WID on LTE (xDL/UL x=1.2,3,4) with NR 2 bands (2DL/1UL) EN DC in rel-16 LG Electronics France imported from 3GU
R4‑1814770 Revised WID on LTE (xDL/UL x=1.2,3,4) with NR 2 bands (2DL/1UL) EN DC in rel-16 LG Electronics France imported from 3GU
R4‑1814770 Revised WID on LTE (xDL/UL x=1.2,3,4) with NR 2 bands (2DL/1UL) EN DC in rel-16 LG Electronics France imported from 3GU
R4‑1814771 Introducing CR on new EN-DC LTE(xDL/1UL)+ NR(2DL/1UL) DC in rel-16 LG Electronics France imported from 3GU
R4‑1814771 Introducing CR on new EN-DC LTE(xDL/1UL)+ NR(2DL/1UL) DC in rel-16 LG Electronics France imported from 3GU
R4‑1814771 Introducing CR on new EN-DC LTE(xDL/1UL)+ NR(2DL/1UL) DC in rel-16 LG Electronics France imported from 3GU
R4‑1814772 Draft CR on FR1-FR2 UE-to-UE coexistence for TS38.101-1 LG Electronics France imported from 3GU
R4‑1814772 Draft CR on FR1-FR2 UE-to-UE coexistence for TS38.101-1 LG Electronics France imported from 3GU
R4‑1814772 Draft CR on FR1-FR2 UE-to-UE coexistence for TS38.101-1 LG Electronics France imported from 3GU
R4‑1814773 UE type for FR2 Power Class in Rel-15 LG Electronics imported from 3GU
R4‑1814773 UE type for FR2 Power Class in Rel-15 LG Electronics imported from 3GU
R4‑1814773 UE type for FR2 Power Class in Rel-15 LG Electronics imported from 3GU
R4‑1814774 Draft CR on FR1-FR2 UE-to-UE coexistence for TS38.101-3 LG Electronics France imported from 3GU
R4‑1814774 Draft CR on FR1-FR2 UE-to-UE coexistence for TS38.101-3 LG Electronics France imported from 3GU
R4‑1814774 Draft CR on FR1-FR2 UE-to-UE coexistence for TS38.101-3 LG Electronics France imported from 3GU
R4‑1814775 Updated WF on 2 Rx vehicle UE: Link budget simulation assumptions Samsung imported from 3GU
R4‑1814775 Updated WF on 2 Rx vehicle UE: Link budget simulation assumptions Samsung imported from 3GU
R4‑1814775 Updated WF on 2 Rx vehicle UE: Link budget simulation assumptions Samsung imported from 3GU
R4‑1814776 draft CR on UE type for Power Class 2 in FR2 LG Electronics, SK Telecom, KT, LG Uplus, Sumitomo Elec. Industries Ltd imported from 3GU
R4‑1814776 draft CR on UE type for Power Class 2 in FR2 LG Electronics, SK Telecom, KT, LG Uplus, Sumitomo Elec. Industries Ltd imported from 3GU
R4‑1814776 draft CR on UE type for Power Class 2 in FR2 LG Electronics, SK Telecom, KT, LG Uplus, Sumitomo Elec. Industries Ltd imported from 3GU
R4‑1814777 MCG/SCG Abbreviations in TS36.101 in rel-15 LG Electronics France imported from 3GU
R4‑1814777 MCG/SCG Abbreviations in TS36.101 in rel-15 LG Electronics France imported from 3GU
R4‑1814777 MCG/SCG Abbreviations in TS36.101 in rel-15 LG Electronics France imported from 3GU
R4‑1814778 MCG/SCG Abbreviations in TS36.101 in rel-14 LG Electronics France imported from 3GU
R4‑1814778 MCG/SCG Abbreviations in TS36.101 in rel-14 LG Electronics France imported from 3GU
R4‑1814778 MCG/SCG Abbreviations in TS36.101 in rel-14 LG Electronics France imported from 3GU
R4‑1814779 MCG/SCG Abbreviations in TS36.101 in rel-13 LG Electronics France imported from 3GU
R4‑1814779 MCG/SCG Abbreviations in TS36.101 in rel-13 LG Electronics France imported from 3GU
R4‑1814779 MCG/SCG Abbreviations in TS36.101 in rel-13 LG Electronics France imported from 3GU
R4‑1814780 MCG/SCG Abbreviations in TS36.101 in rel-12 LG Electronics France imported from 3GU
R4‑1814780 MCG/SCG Abbreviations in TS36.101 in rel-12 LG Electronics France imported from 3GU
R4‑1814780 MCG/SCG Abbreviations in TS36.101 in rel-12 LG Electronics France imported from 3GU
R4‑1814781 MPE/SAR requirements in TS38.101-1 LG Electronics France imported from 3GU
R4‑1814781 MPE/SAR requirements in TS38.101-1 LG Electronics France imported from 3GU
R4‑1814781 MPE/SAR requirements in TS38.101-1 LG Electronics France imported from 3GU
R4‑1814782 Draft CR for RF exposure compliance in TS38.101-2 LG Electronics France imported from 3GU
R4‑1814782 Draft CR for RF exposure compliance in TS38.101-2 LG Electronics France imported from 3GU
R4‑1814782 Draft CR for RF exposure compliance in TS38.101-2 LG Electronics France imported from 3GU
R4‑1814783 MPE/SAR requirements in TS38.101-2 LG Electronics France imported from 3GU
R4‑1814783 MPE/SAR requirements in TS38.101-2 LG Electronics France imported from 3GU
R4‑1814783 MPE/SAR requirements in TS38.101-2 LG Electronics France imported from 3GU
R4‑1814784 Draft CR for RF exposure compliance in TS38.101-3 LG Electronics France imported from 3GU
R4‑1814784 Draft CR for RF exposure compliance in TS38.101-3 LG Electronics France imported from 3GU
R4‑1814784 Draft CR for RF exposure compliance in TS38.101-3 LG Electronics France imported from 3GU
R4‑1814785 TR 38.826 v0.2.0 update: 2Rx vehicle NR UE at FR1 LG Electronics France imported from 3GU
R4‑1814785 TR 38.826 v0.2.0 update: 2Rx vehicle NR UE at FR1 LG Electronics France imported from 3GU
R4‑1814785 TR 38.826 v0.2.0 update: 2Rx vehicle NR UE at FR1 LG Electronics France imported from 3GU
R4‑1814786 System coverage analysis based on 2RX vehicle NR UE link budget evaluation LG Electronics France imported from 3GU
R4‑1814786 System coverage analysis based on 2RX vehicle NR UE link budget evaluation LG Electronics France imported from 3GU
R4‑1814786 System coverage analysis based on 2RX vehicle NR UE link budget evaluation LG Electronics France imported from 3GU
R4‑1814787 Draft reply LS on NR V2X UE RF parameters LG Electronics France imported from 3GU
R4‑1814787 Draft reply LS on NR V2X UE RF parameters LG Electronics France imported from 3GU
R4‑1814787 Draft reply LS on NR V2X UE RF parameters LG Electronics France imported from 3GU
R4‑1814788 Remaining Issue Discussion on RRC re-establishment for SA NR MediaTek inc. imported from 3GU
R4‑1814788 Remaining Issue Discussion on RRC re-establishment for SA NR MediaTek inc. imported from 3GU
R4‑1814788 Remaining Issue Discussion on RRC re-establishment for SA NR MediaTek inc. imported from 3GU
R4‑1814789 CR on TS38.133 BWP switch test case(section A4.5.6.1) MediaTek inc. imported from 3GU
R4‑1814789 CR on TS38.133 BWP switch test case(section A4.5.6.1) MediaTek inc. imported from 3GU
R4‑1814789 CR on TS38.133 BWP switch test case(section A4.5.6.1) MediaTek inc. imported from 3GU
R4‑1814790 CR on TS38.133 BWP switch test case(section A5.5.6.1) MediaTek inc. imported from 3GU
R4‑1814790 CR on TS38.133 BWP switch test case(section A5.5.6.1) MediaTek inc. imported from 3GU
R4‑1814790 CR on TS38.133 BWP switch test case(section A5.5.6.1) MediaTek inc. imported from 3GU
R4‑1814791 CR on TS38.133 for Handover(section 6.1) MediaTek inc. imported from 3GU
R4‑1814791 CR on TS38.133 for Handover(section 6.1) MediaTek inc. imported from 3GU
R4‑1814791 CR on TS38.133 for Handover(section 6.1) MediaTek inc. imported from 3GU
R4‑1814792 CR on TS38.133 BWP configuration(section A.3.9) MediaTek inc. imported from 3GU
R4‑1814792 CR on TS38.133 BWP configuration(section A.3.9) MediaTek inc. imported from 3GU
R4‑1814792 CR on TS38.133 BWP configuration(section A.3.9) MediaTek inc. imported from 3GU
R4‑1814793 MSD test results for new x bands DL (x=3, 4, 5) with 2 bands UL CA in Rel-16 LG Electronics Finland imported from 3GU
R4‑1814793 MSD test results for new x bands DL (x=3, 4, 5) with 2 bands UL CA in Rel-16 LG Electronics Finland imported from 3GU
R4‑1814793 MSD test results for new x bands DL (x=3, 4, 5) with 2 bands UL CA in Rel-16 LG Electronics Finland imported from 3GU
R4‑1814794 Revised WID on x bands DL (x=3,4,5) with 2 bands UL inter-band CA in rel-16 LG Electronics France imported from 3GU
R4‑1814794 Revised WID on x bands DL (x=3,4,5) with 2 bands UL inter-band CA in rel-16 LG Electronics France imported from 3GU
R4‑1814794 Revised WID on x bands DL (x=3,4,5) with 2 bands UL inter-band CA in rel-16 LG Electronics France imported from 3GU
R4‑1814795 Remove the brackets in Rel-14 V2V AMPR Huawei, HiSilicon imported from 3GU
R4‑1814795 Remove the brackets in Rel-14 V2V AMPR Huawei, HiSilicon imported from 3GU
R4‑1814795 Remove the brackets in Rel-14 V2V AMPR Huawei, HiSilicon imported from 3GU
R4‑1814796 Remove the brackets in Rel-14 V2V AMPR Huawei, HiSilicon imported from 3GU
R4‑1814796 Remove the brackets in Rel-14 V2V AMPR Huawei, HiSilicon imported from 3GU
R4‑1814796 Remove the brackets in Rel-14 V2V AMPR Huawei, HiSilicon imported from 3GU
R4‑1814797 Draft CR on SUL band combinations to TS 38.101-1 Huawei, HiSilicon imported from 3GU
R4‑1814797 Draft CR on SUL band combinations to TS 38.101-1 Huawei, HiSilicon imported from 3GU
R4‑1814797 Draft CR on SUL band combinations to TS 38.101-1 Huawei, HiSilicon imported from 3GU
R4‑1814798 Draft CR on SUL band combinations to TS 38.101-3 Huawei, HiSilicon imported from 3GU
R4‑1814798 Draft CR on SUL band combinations to TS 38.101-3 Huawei, HiSilicon imported from 3GU
R4‑1814798 Draft CR on SUL band combinations to TS 38.101-3 Huawei, HiSilicon imported from 3GU
R4‑1814799 Revised WID on Band combinations for SA NR Supplementary uplink (SUL), NSA NR SUL, NSA NR SUL with UL sharing from the UE perspective (ULSUP) Huawei, HiSilicon imported from 3GU
R4‑1814799 Revised WID on Band combinations for SA NR Supplementary uplink (SUL), NSA NR SUL, NSA NR SUL with UL sharing from the UE perspective (ULSUP) Huawei, HiSilicon imported from 3GU
R4‑1814799 Revised WID on Band combinations for SA NR Supplementary uplink (SUL), NSA NR SUL, NSA NR SUL with UL sharing from the UE perspective (ULSUP) Huawei, HiSilicon imported from 3GU
R4‑1814800 TP for TR 37.716-00-00: Updated specific requirements for SUL band combinations Huawei, HiSilicon imported from 3GU
R4‑1814800 TP for TR 37.716-00-00: Updated specific requirements for SUL band combinations Huawei, HiSilicon imported from 3GU
R4‑1814800 TP for TR 37.716-00-00: Updated specific requirements for SUL band combinations Huawei, HiSilicon imported from 3GU
R4‑1814801 Draft CR on some changes for SUL band combinations to TS 38.101-1 Huawei, HiSilicon imported from 3GU
R4‑1814801 Draft CR on some changes for SUL band combinations to TS 38.101-1 Huawei, HiSilicon imported from 3GU
R4‑1814801 Draft CR on some changes for SUL band combinations to TS 38.101-1 Huawei, HiSilicon imported from 3GU
R4‑1814802 CR on MSD for EN-DC including Band 66 and n78 to TR 37.872 Huawei, HiSilicon imported from 3GU
R4‑1814802 CR on MSD for EN-DC including Band 66 and n78 to TR 37.872 Huawei, HiSilicon imported from 3GU
R4‑1814802 CR on MSD for EN-DC including Band 66 and n78 to TR 37.872 Huawei, HiSilicon imported from 3GU
R4‑1814803 Draft CR on editorial error for EN-DC band combinations to TS 38.101-3 Huawei, HiSilicon imported from 3GU
R4‑1814803 Draft CR on editorial error for EN-DC band combinations to TS 38.101-3 Huawei, HiSilicon imported from 3GU
R4‑1814803 Draft CR on editorial error for EN-DC band combinations to TS 38.101-3 Huawei, HiSilicon imported from 3GU
R4‑1814804 CR on MSD for EN-DC including Band 66 and n78 to TR 37.863-01-01 Huawei, HiSilicon imported from 3GU
R4‑1814804 CR on MSD for EN-DC including Band 66 and n78 to TR 37.863-01-01 Huawei, HiSilicon imported from 3GU
R4‑1814804 CR on MSD for EN-DC including Band 66 and n78 to TR 37.863-01-01 Huawei, HiSilicon imported from 3GU
R4‑1814805 Spectrum utilization improvement in unlicensed bands Huawei, HiSilicon imported from 3GU
R4‑1814805 Spectrum utilization improvement in unlicensed bands Huawei, HiSilicon imported from 3GU
R4‑1814805 Spectrum utilization improvement in unlicensed bands Huawei, HiSilicon imported from 3GU
R4‑1814806 Discussion on wideband carrier operation for NR-U Huawei, HiSilicon imported from 3GU
R4‑1814806 Discussion on wideband carrier operation for NR-U Huawei, HiSilicon imported from 3GU
R4‑1814806 Discussion on wideband carrier operation for NR-U Huawei, HiSilicon imported from 3GU
R4‑1814807 Draft LS reply on wideband carrier operation for NR-U Huawei, HiSilicon imported from 3GU
R4‑1814807 Draft LS reply on wideband carrier operation for NR-U Huawei, HiSilicon imported from 3GU
R4‑1814807 Draft LS reply on wideband carrier operation for NR-U Huawei, HiSilicon imported from 3GU
R4‑1814808 Discussion on the parameters for NR-V evaluation Huawei, HiSilicon imported from 3GU
R4‑1814808 Discussion on the parameters for NR-V evaluation Huawei, HiSilicon imported from 3GU
R4‑1814808 Discussion on the parameters for NR-V evaluation Huawei, HiSilicon imported from 3GU
R4‑1814809 Draft LS reply on IBE model for V2X Huawei, HiSilicon imported from 3GU
R4‑1814809 Draft LS reply on IBE model for V2X Huawei, HiSilicon imported from 3GU
R4‑1814809 Draft LS reply on IBE model for V2X Huawei, HiSilicon imported from 3GU
R4‑1814810 Evaluation on coverage for 2RX vehicle UE Huawei, HiSilicon imported from 3GU
R4‑1814810 Evaluation on coverage for 2RX vehicle UE Huawei, HiSilicon imported from 3GU
R4‑1814810 Evaluation on coverage for 2RX vehicle UE Huawei, HiSilicon imported from 3GU
R4‑1814811 Summary and proposal on distinguish UE types Huawei, HiSilicon imported from 3GU
R4‑1814811 Summary and proposal on distinguish UE types Huawei, HiSilicon imported from 3GU
R4‑1814811 Summary and proposal on distinguish UE types Huawei, HiSilicon imported from 3GU
R4‑1814812 Introducing CR on new x bands DL(x=3,4,5) with 2 bands UL CA band combinations in TS36.101 rel-16 LG Electronics France imported from 3GU
R4‑1814812 Introducing CR on new x bands DL(x=3,4,5) with 2 bands UL CA band combinations in TS36.101 rel-16 LG Electronics France imported from 3GU
R4‑1814812 Introducing CR on new x bands DL(x=3,4,5) with 2 bands UL CA band combinations in TS36.101 rel-16 LG Electronics France imported from 3GU
R4‑1814813 Discussion on measurement grids for EIRP spherical coverage and TX beam peak search LG Electronics Finland imported from 3GU
R4‑1814813 Discussion on measurement grids for EIRP spherical coverage and TX beam peak search LG Electronics Finland imported from 3GU
R4‑1814813 Discussion on measurement grids for EIRP spherical coverage and TX beam peak search LG Electronics Finland imported from 3GU
R4‑1814814 Discussions on EN-DC power control Apple Inc. imported from 3GU
R4‑1814814 Discussions on EN-DC power control Apple Inc. imported from 3GU
R4‑1814814 Discussions on EN-DC power control Apple Inc. imported from 3GU
R4‑1814815 Further discussion on UE behaviour and network configuration without SCS restriction ZTE Wistron Telecom AB imported from 3GU
R4‑1814815 Further discussion on UE behaviour and network configuration without SCS restriction ZTE Wistron Telecom AB imported from 3GU
R4‑1814815 Further discussion on UE behaviour and network configuration without SCS restriction ZTE Wistron Telecom AB imported from 3GU
R4‑1814816 Discussion on BS In-channel requirements for the case where UE CBW differs from BS CBW ZTE Wistron Telecom AB imported from 3GU
R4‑1814816 Discussion on BS In-channel requirements for the case where UE CBW differs from BS CBW ZTE Wistron Telecom AB imported from 3GU
R4‑1814816 Discussion on BS In-channel requirements for the case where UE CBW differs from BS CBW ZTE Wistron Telecom AB imported from 3GU
R4‑1814817 Draft CR on FR2 PUCCH format 1 performance requirement for TS 38.104 ZTE Wistron Telecom AB imported from 3GU
R4‑1814817 Draft CR on FR2 PUCCH format 1 performance requirement for TS 38.104 ZTE Wistron Telecom AB imported from 3GU
R4‑1814817 Draft CR on FR2 PUCCH format 1 performance requirement for TS 38.104 ZTE Wistron Telecom AB imported from 3GU
R4‑1814818 TP for TS38.141-2: PUCCH format 1 OTA conformance test ZTE Wistron Telecom AB imported from 3GU
R4‑1814818 TP for TS38.141-2: PUCCH format 1 OTA conformance test ZTE Wistron Telecom AB imported from 3GU
R4‑1814818 TP for TS38.141-2: PUCCH format 1 OTA conformance test ZTE Wistron Telecom AB imported from 3GU
R4‑1814819 Simulation results on NR PUSCH ZTE Wistron Telecom AB imported from 3GU
R4‑1814819 Simulation results on NR PUSCH ZTE Wistron Telecom AB imported from 3GU
R4‑1814819 Simulation results on NR PUSCH ZTE Wistron Telecom AB imported from 3GU
R4‑1814820 Simulation results on NR PUCCH ZTE Wistron Telecom AB imported from 3GU
R4‑1814820 Simulation results on NR PUCCH ZTE Wistron Telecom AB imported from 3GU
R4‑1814820 Simulation results on NR PUCCH ZTE Wistron Telecom AB imported from 3GU
R4‑1814821 Simulation results on NR PRACH ZTE Wistron Telecom AB imported from 3GU
R4‑1814821 Simulation results on NR PRACH ZTE Wistron Telecom AB imported from 3GU
R4‑1814821 Simulation results on NR PRACH ZTE Wistron Telecom AB imported from 3GU
R4‑1814822 TR 38.716-02-00 v0.2.0 update: NR inter-band CA/DC for 2 bands DL with up to 2 bands UL ZTE Wistron Telecom AB imported from 3GU
R4‑1814822 TR 38.716-02-00 v0.2.0 update: NR inter-band CA/DC for 2 bands DL with up to 2 bands UL ZTE Wistron Telecom AB imported from 3GU
R4‑1814822 TR 38.716-02-00 v0.2.0 update: NR inter-band CA/DC for 2 bands DL with up to 2 bands UL ZTE Wistron Telecom AB imported from 3GU
R4‑1814823 Draft CR for Intra-frequency SS-RSRQ Accuracy Test Cases for EN-DC FR1 (section A.4.7.2) LG Electronics Inc. imported from 3GU
R4‑1814823 Draft CR for Intra-frequency SS-RSRQ Accuracy Test Cases for EN-DC FR1 (section A.4.7.2) LG Electronics Inc. imported from 3GU
R4‑1814823 Draft CR for Intra-frequency SS-RSRQ Accuracy Test Cases for EN-DC FR1 (section A.4.7.2) LG Electronics Inc. imported from 3GU
R4‑1814824 n50 A-MPR Qualcomm Incorporated imported from 3GU
R4‑1814824 n50 A-MPR Qualcomm Incorporated imported from 3GU
R4‑1814824 n50 A-MPR Qualcomm Incorporated imported from 3GU
R4‑1814825 Draft CR for Intra-frequency SS-RSRQ Accuracy Test Cases for EN-DC FR2 (section A.5.7.2) LG Electronics Inc. imported from 3GU
R4‑1814825 Draft CR for Intra-frequency SS-RSRQ Accuracy Test Cases for EN-DC FR2 (section A.5.7.2) LG Electronics Inc. imported from 3GU
R4‑1814825 Draft CR for Intra-frequency SS-RSRQ Accuracy Test Cases for EN-DC FR2 (section A.5.7.2) LG Electronics Inc. imported from 3GU
R4‑1814826 NS_03 A-MPR Qualcomm Incorporated imported from 3GU
R4‑1814826 NS_03 A-MPR Qualcomm Incorporated imported from 3GU
R4‑1814826 NS_03 A-MPR Qualcomm Incorporated imported from 3GU
R4‑1814827 Draft CR for Intra-frequency SS-RSRQ Accuracy Test Cases for SA FR1 (section A.6.7.2) LG Electronics Inc. imported from 3GU
R4‑1814827 Draft CR for Intra-frequency SS-RSRQ Accuracy Test Cases for SA FR1 (section A.6.7.2) LG Electronics Inc. imported from 3GU
R4‑1814827 Draft CR for Intra-frequency SS-RSRQ Accuracy Test Cases for SA FR1 (section A.6.7.2) LG Electronics Inc. imported from 3GU
R4‑1814828 Draft CR for Intra-frequency SS-RSRQ Accuracy Test Cases for SA FR2 (section A.7.7.2) LG Electronics Inc. imported from 3GU
R4‑1814828 Draft CR for Intra-frequency SS-RSRQ Accuracy Test Cases for SA FR2 (section A.7.7.2) LG Electronics Inc. imported from 3GU
R4‑1814828 Draft CR for Intra-frequency SS-RSRQ Accuracy Test Cases for SA FR2 (section A.7.7.2) LG Electronics Inc. imported from 3GU
R4‑1814829 Intra-band CA ACS, IBB, OBB for all BW class for NR bands Qualcomm Incorporated imported from 3GU
R4‑1814829 Intra-band CA ACS, IBB, OBB for all BW class for NR bands Qualcomm Incorporated imported from 3GU
R4‑1814829 Intra-band CA ACS, IBB, OBB for all BW class for NR bands Qualcomm Incorporated imported from 3GU
R4‑1814830 Discussion on Noc level and test setup for RRM test case in FR2 LG Electronics Inc. imported from 3GU
R4‑1814830 Discussion on Noc level and test setup for RRM test case in FR2 LG Electronics Inc. imported from 3GU
R4‑1814830 Discussion on Noc level and test setup for RRM test case in FR2 LG Electronics Inc. imported from 3GU
R4‑1814831 Performance Metrics for FR1 NR MIMO OTA testing Keysight Technologies UK Ltd imported from 3GU
R4‑1814831 Performance Metrics for FR1 NR MIMO OTA testing Keysight Technologies UK Ltd imported from 3GU
R4‑1814831 Performance Metrics for FR1 NR MIMO OTA testing Keysight Technologies UK Ltd imported from 3GU
R4‑1814832 Performance Metrics for FR2 NR MIMO OTA testing Keysight Technologies UK Ltd imported from 3GU
R4‑1814832 Performance Metrics for FR2 NR MIMO OTA testing Keysight Technologies UK Ltd imported from 3GU
R4‑1814832 Performance Metrics for FR2 NR MIMO OTA testing Keysight Technologies UK Ltd imported from 3GU
R4‑1814833 2D vs 3D MPAC Probe Configuration for FR1 CDL channel models Keysight Technologies UK Ltd imported from 3GU
R4‑1814833 2D vs 3D MPAC Probe Configuration for FR1 CDL channel models Keysight Technologies UK Ltd imported from 3GU
R4‑1814833 2D vs 3D MPAC Probe Configuration for FR1 CDL channel models Keysight Technologies UK Ltd imported from 3GU
R4‑1814834 Extension of RTS test method from 2Rx to 4Rx and up to 7.25 GHz Keysight Technologies UK Ltd, GTS imported from 3GU
R4‑1814834 Extension of RTS test method from 2Rx to 4Rx and up to 7.25 GHz Keysight Technologies UK Ltd, GTS imported from 3GU
R4‑1814834 Extension of RTS test method from 2Rx to 4Rx and up to 7.25 GHz Keysight Technologies UK Ltd, GTS imported from 3GU
R4‑1814835 On Feasibility of MPAC Systems for FR2 Keysight Technologies UK Ltd imported from 3GU
R4‑1814835 On Feasibility of MPAC Systems for FR2 Keysight Technologies UK Ltd imported from 3GU
R4‑1814835 On Feasibility of MPAC Systems for FR2 Keysight Technologies UK Ltd imported from 3GU
R4‑1814836 Request for Dynamic Geometry Scenario Examples Keysight Technologies UK Ltd imported from 3GU
R4‑1814836 Request for Dynamic Geometry Scenario Examples Keysight Technologies UK Ltd imported from 3GU
R4‑1814836 Request for Dynamic Geometry Scenario Examples Keysight Technologies UK Ltd imported from 3GU
R4‑1814837 On EIRP Spherical Coverage Measurement Grids Keysight Technologies UK Ltd imported from 3GU
R4‑1814837 On EIRP Spherical Coverage Measurement Grids Keysight Technologies UK Ltd imported from 3GU
R4‑1814837 On EIRP Spherical Coverage Measurement Grids Keysight Technologies UK Ltd imported from 3GU
R4‑1814838 On EIS Spherical Coverage Measurement Grids Keysight Technologies UK Ltd imported from 3GU
R4‑1814838 On EIS Spherical Coverage Measurement Grids Keysight Technologies UK Ltd imported from 3GU
R4‑1814838 On EIS Spherical Coverage Measurement Grids Keysight Technologies UK Ltd imported from 3GU
R4‑1814839 On Coarse and Fine Measurement Grids for Beam Peak Searches Keysight Technologies UK Ltd imported from 3GU
R4‑1814839 On Coarse and Fine Measurement Grids for Beam Peak Searches Keysight Technologies UK Ltd imported from 3GU
R4‑1814839 On Coarse and Fine Measurement Grids for Beam Peak Searches Keysight Technologies UK Ltd imported from 3GU
R4‑1814840 DraftCR to TR38.810 to correct QoQZ Procedure Applicability Keysight Technologies UK Ltd imported from 3GU
R4‑1814840 DraftCR to TR38.810 to correct QoQZ Procedure Applicability Keysight Technologies UK Ltd imported from 3GU
R4‑1814840 DraftCR to TR38.810 to correct QoQZ Procedure Applicability Keysight Technologies UK Ltd imported from 3GU
R4‑1814841 On FR2 Temperature Testing Keysight Technologies UK Ltd imported from 3GU
R4‑1814841 On FR2 Temperature Testing Keysight Technologies UK Ltd imported from 3GU
R4‑1814841 On FR2 Temperature Testing Keysight Technologies UK Ltd imported from 3GU
R4‑1814842 Channel model and test system for NR MIMO OTA in FR1 NTT DOCOMO, INC imported from 3GU
R4‑1814842 Channel model and test system for NR MIMO OTA in FR1 NTT DOCOMO, INC imported from 3GU
R4‑1814842 Channel model and test system for NR MIMO OTA in FR1 NTT DOCOMO, INC imported from 3GU
R4‑1814843 Discussion on PCMAX for inter-band EN-DC within FR1 OPPO imported from 3GU
R4‑1814843 Discussion on PCMAX for inter-band EN-DC within FR1 OPPO imported from 3GU
R4‑1814843 Discussion on PCMAX for inter-band EN-DC within FR1 OPPO imported from 3GU
R4‑1814844 Draft CR to introduce Intra-band CA blocking requirements for all BW class Qualcomm Incorporated imported from 3GU
R4‑1814844 Draft CR to introduce Intra-band CA blocking requirements for all BW class Qualcomm Incorporated imported from 3GU
R4‑1814844 Draft CR to introduce Intra-band CA blocking requirements for all BW class Qualcomm Incorporated imported from 3GU
R4‑1814845 Environmental conditions for NR MIMO OTA in FR1 NTT DOCOMO, INC imported from 3GU
R4‑1814845 Environmental conditions for NR MIMO OTA in FR1 NTT DOCOMO, INC imported from 3GU
R4‑1814845 Environmental conditions for NR MIMO OTA in FR1 NTT DOCOMO, INC imported from 3GU
R4‑1814846 FR2 EESS A-MPR Qualcomm Incorporated imported from 3GU
R4‑1814846 FR2 EESS A-MPR Qualcomm Incorporated imported from 3GU
R4‑1814846 FR2 EESS A-MPR Qualcomm Incorporated imported from 3GU
R4‑1814847 Draft CR to 38.101-2: On FR2 EESS A-MPR for n258 Qualcomm Incorporated imported from 3GU
R4‑1814847 Draft CR to 38.101-2: On FR2 EESS A-MPR for n258 Qualcomm Incorporated imported from 3GU
R4‑1814847 Draft CR to 38.101-2: On FR2 EESS A-MPR for n258 Qualcomm Incorporated imported from 3GU
R4‑1814848 CR on scaling factor in FR2 for idle state requirement Intel Corporation imported from 3GU
R4‑1814848 CR on scaling factor in FR2 for idle state requirement Intel Corporation imported from 3GU
R4‑1814848 CR on scaling factor in FR2 for idle state requirement Intel Corporation imported from 3GU
R4‑1814849 Reply LS on SFN offset for OTDOA Intel Corporation imported from 3GU
R4‑1814849 Reply LS on SFN offset for OTDOA Intel Corporation imported from 3GU
R4‑1814849 Reply LS on SFN offset for OTDOA Intel Corporation imported from 3GU
R4‑1814850 Draft CR to 38.101-2: On FR2 CA MPR v2 Qualcomm Incorporated imported from 3GU
R4‑1814850 Draft CR to 38.101-2: On FR2 CA MPR v2 Qualcomm Incorporated imported from 3GU
R4‑1814850 Draft CR to 38.101-2: On FR2 CA MPR v2 Qualcomm Incorporated imported from 3GU
R4‑1814851 n41 – B40 Coexistence Qualcomm Incorporated imported from 3GU
R4‑1814851 n41 – B40 Coexistence Qualcomm Incorporated imported from 3GU
R4‑1814851 n41 – B40 Coexistence Qualcomm Incorporated imported from 3GU
R4‑1814852 Introduction of LTE inter-band Carrier Aggregation for x bands DL (x=4, 5) with 1 band UL to TS36.101 Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814852 Introduction of LTE inter-band Carrier Aggregation for x bands DL (x=4, 5) with 1 band UL to TS36.101 Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814852 Introduction of LTE inter-band Carrier Aggregation for x bands DL (x=4, 5) with 1 band UL to TS36.101 Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814853 Corrections to CA REFSENS exception Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814853 Corrections to CA REFSENS exception Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814853 Corrections to CA REFSENS exception Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814854 Corrections of REFSENS exceptions in Rel-14 CAs Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814854 Corrections of REFSENS exceptions in Rel-14 CAs Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814854 Corrections of REFSENS exceptions in Rel-14 CAs Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814855 Corrections of REFSENS exceptions in Rel-15 Cas Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814855 Corrections of REFSENS exceptions in Rel-15 Cas Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814855 Corrections of REFSENS exceptions in Rel-14 CAs Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814856 Misc corrections on Rel-15 CAs Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814856 Misc corrections on Rel-15 CAs Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814856 Misc corrections on Rel-15 CAs Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814857 On the open issues of beam correspondence Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814857 On the open issues of beam correspondence Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814857 On the open issues of beam correspondence Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814858 On release independence of FR2 non-contiguous UL CA Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814858 On release independence of FR2 non-contiguous UL CA Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814858 On release independence of FR2 non-contiguous UL CA Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814859 Configuration of channel BW in RRC Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814859 Configuration of channel BW in RRC Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814859 Configuration of channel BW in RRC Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814860 Carrier bandwidth configurations and RF requirement Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814860 Carrier bandwidth configurations and RF requirement Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814860 Carrier bandwidth configurations and RF requirement Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814861 [draft] Further Reply LS on RAN4 design on channel bandwidth Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814861 [draft] Further Reply LS on RAN4 design on channel bandwidth Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814861 [draft] Further Reply LS on RAN4 design on channel bandwidth Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814862 FR2 UE RF exposure compliance and its system implications Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814862 FR2 UE RF exposure compliance and its system implications Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814862 FR2 UE RF exposure compliance and its system implications Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814863 Switching time between LTE UL and NR UL based on PA architecture Apple Inc. imported from 3GU
R4‑1814863 Switching time between LTE UL and NR UL based on PA architecture Apple Inc. imported from 3GU
R4‑1814863 Switching time between LTE UL and NR UL based on PA architecture Apple Inc. imported from 3GU
R4‑1814864 Remaining issues on RLM MediaTek inc. imported from 3GU
R4‑1814864 Remaining issues on RLM MediaTek inc. imported from 3GU
R4‑1814864 Remaining issues on RLM MediaTek inc. imported from 3GU
R4‑1814865 CR on RMC for RLM (section A.3.8) MediaTek inc. imported from 3GU
R4‑1814865 CR on RMC for RLM (section A.3.8) MediaTek inc. imported from 3GU
R4‑1814865 CR on RMC for RLM (section A.3.8) MediaTek inc. imported from 3GU
R4‑1814866 CR for RLM (Section 8.1.1, 8.1.2.2, 8.1.3.1, and 8.1.3.2) MediaTek inc. imported from 3GU
R4‑1814866 CR for RLM (Section 8.1.1, 8.1.2.2, 8.1.3.1, and 8.1.3.2) MediaTek inc. imported from 3GU
R4‑1814866 CR for RLM (Section 8.1.1, 8.1.2.2, 8.1.3.1, and 8.1.3.2) MediaTek inc. imported from 3GU
R4‑1814867 Remaining issues on RLM test cases MediaTek inc. imported from 3GU
R4‑1814867 Remaining issues on RLM test cases MediaTek inc. imported from 3GU
R4‑1814867 Remaining issues on RLM test cases MediaTek inc. imported from 3GU
R4‑1814868 CR on TS38.133 for EN-DC FR1 SSB based RLM (section A.4.5.1.1, A.4.5.1.2, A.4.5.1.3, A.4.5.1.4) MediaTek inc. imported from 3GU
R4‑1814868 CR on TS38.133 for EN-DC FR1 SSB based RLM (section A.4.5.1.1, A.4.5.1.2, A.4.5.1.3, A.4.5.1.4) MediaTek inc. imported from 3GU
R4‑1814868 CR on TS38.133 for EN-DC FR1 SSB based RLM (section A.4.5.1.1, A.4.5.1.2, A.4.5.1.3, A.4.5.1.4) MediaTek inc. imported from 3GU
R4‑1814869 CR on TS38.133 for EN-DC FR2 SSB based RLM (section A.5.5.1.1, A.5.5.1.2, A.5.5.1.3, A.5.5.1.4) MediaTek inc. imported from 3GU
R4‑1814869 CR on TS38.133 for EN-DC FR2 SSB based RLM (section A.5.5.1.1, A.5.5.1.2, A.5.5.1.3, A.5.5.1.4) MediaTek inc. imported from 3GU
R4‑1814869 CR on TS38.133 for EN-DC FR2 SSB based RLM (section A.5.5.1.1, A.5.5.1.2, A.5.5.1.3, A.5.5.1.4) MediaTek inc. imported from 3GU
R4‑1814870 CR on TS38.133 for SA FR1 SSB based RLM (section A.6.5.1.1, A.6.5.1.2, A.6.5.1.3, A.6.5.1.4) MediaTek inc. imported from 3GU
R4‑1814870 CR on TS38.133 for SA FR1 SSB based RLM (section A.6.5.1.1, A.6.5.1.2, A.6.5.1.3, A.6.5.1.4) MediaTek inc. imported from 3GU
R4‑1814870 CR on TS38.133 for SA FR1 SSB based RLM (section A.6.5.1.1, A.6.5.1.2, A.6.5.1.3, A.6.5.1.4) MediaTek inc. imported from 3GU
R4‑1814871 CR on TS38.133 for SA FR2 SSB based RLM (section A.7.5.1.1, A.7.5.1.2, A.7.5.1.3, A.7.5.1.4) MediaTek inc. imported from 3GU
R4‑1814871 CR on TS38.133 for SA FR2 SSB based RLM (section A.7.5.1.1, A.7.5.1.2, A.7.5.1.3, A.7.5.1.4) MediaTek inc. imported from 3GU
R4‑1814871 CR on TS38.133 for SA FR2 SSB based RLM (section A.7.5.1.1, A.7.5.1.2, A.7.5.1.3, A.7.5.1.4) MediaTek inc. imported from 3GU
R4‑1814872 Summary of PDCCH simulation results for RLM MediaTek inc. imported from 3GU
R4‑1814872 Summary of PDCCH simulation results for RLM MediaTek inc. imported from 3GU
R4‑1814872 Summary of PDCCH simulation results for RLM MediaTek inc. imported from 3GU
R4‑1814873 Discussion on requirements for beam failure detection MediaTek inc. imported from 3GU
R4‑1814873 Discussion on requirements for beam failure detection MediaTek inc. imported from 3GU
R4‑1814873 Discussion on requirements for beam failure detection MediaTek inc. imported from 3GU
R4‑1814874 CR for condition for non-Rx beam sweeping in BFD requirements (section 8.5.2.2 and 8.5.3.2) MediaTek inc. imported from 3GU
R4‑1814874 CR for condition for non-Rx beam sweeping in BFD requirements (section 8.5.2.2 and 8.5.3.2) MediaTek inc. imported from 3GU
R4‑1814874 CR for condition for non-Rx beam sweeping in BFD requirements (section 8.5.2.2 and 8.5.3.2) MediaTek inc. imported from 3GU
R4‑1814875 Discussion on requirements for candidate beam detection MediaTek inc. imported from 3GU
R4‑1814875 Discussion on requirements for candidate beam detection MediaTek inc. imported from 3GU
R4‑1814875 Discussion on requirements for candidate beam detection MediaTek inc. imported from 3GU
R4‑1814876 Discussion on requirements for L1-RSRP measurement for reporting in FR2 MediaTek inc. imported from 3GU
R4‑1814876 Discussion on requirements for L1-RSRP measurement for reporting in FR2 MediaTek inc. imported from 3GU
R4‑1814876 Discussion on requirements for L1-RSRP measurement for reporting in FR2 MediaTek inc. imported from 3GU
R4‑1814877 Discussion on SCell activation delay requirement MediaTek inc. imported from 3GU
R4‑1814877 Discussion on SCell activation delay requirement MediaTek inc. imported from 3GU
R4‑1814877 Discussion on SCell activation delay requirement MediaTek inc. imported from 3GU
R4‑1814878 Switching time between LTE UL and NR UL based on PA architecture Apple Inc. imported from 3GU
R4‑1814878 Switching time between LTE UL and NR UL based on PA architecture Apple Inc. imported from 3GU
R4‑1814878 Switching time between LTE UL and NR UL based on PA architecture Apple Inc. imported from 3GU
R4‑1814879 Draft CR to 38.101-1. Introduce RB restriction for n41 – B40 Coexistence Qualcomm Incorporated imported from 3GU
R4‑1814879 Draft CR to 38.101-1. Introduce RB restriction for n41 – B40 Coexistence Qualcomm Incorporated imported from 3GU
R4‑1814879 Draft CR to 38.101-1. Introduce RB restriction for n41 – B40 Coexistence Qualcomm Incorporated imported from 3GU
R4‑1814880 EN-DC Interband RX Requirements Qualcomm Incorporated imported from 3GU
R4‑1814880 EN-DC Interband RX Requirements Qualcomm Incorporated imported from 3GU
R4‑1814880 EN-DC Interband RX Requirements Qualcomm Incorporated imported from 3GU
R4‑1814881 Discussion on PCMAX for inter-band EN-DC within FR1 OPPO imported from 3GU
R4‑1814881 Discussion on PCMAX for inter-band EN-DC within FR1 OPPO imported from 3GU
R4‑1814881 Discussion on PCMAX for inter-band EN-DC within FR1 OPPO imported from 3GU
R4‑1814882 Draft CR on Pcmax for inter band EN-DC within FR1 OPPO imported from 3GU
R4‑1814882 Draft CR on Pcmax for inter band EN-DC within FR1 OPPO imported from 3GU
R4‑1814882 Draft CR on Pcmax for inter band EN-DC within FR1 OPPO imported from 3GU
R4‑1814883 Draft CR on Pcmax for intra-band EN-DC OPPO imported from 3GU
R4‑1814883 Draft CR on Pcmax for intra-band EN-DC OPPO imported from 3GU
R4‑1814883 Draft CR on Pcmax for intra-band EN-DC OPPO imported from 3GU
R4‑1814884 Draft CR on Power Class for inter band EN-DC within FR1 OPPO imported from 3GU
R4‑1814884 Draft CR on Power Class for inter band EN-DC within FR1 OPPO imported from 3GU
R4‑1814884 Draft CR on Power Class for inter band EN-DC within FR1 OPPO imported from 3GU
R4‑1814885 Discussion on output power dynamic for intra-band EN-DC OPPO imported from 3GU
R4‑1814885 Discussion on output power dynamic for intra-band EN-DC OPPO imported from 3GU
R4‑1814885 Discussion on output power dynamic for intra-band EN-DC OPPO imported from 3GU
R4‑1814886 Draft CR on output power dynamic for DC OPPO imported from 3GU
R4‑1814886 Draft CR on output power dynamic for DC OPPO imported from 3GU
R4‑1814886 Draft CR on output power dynamic for DC OPPO imported from 3GU
R4‑1814887 Draft CR on A-MPR for inter band EN-DC within FR1 OPPO imported from 3GU
R4‑1814887 Draft CR on A-MPR for inter band EN-DC within FR1 OPPO imported from 3GU
R4‑1814887 Draft CR on A-MPR for inter band EN-DC within FR1 OPPO imported from 3GU
R4‑1814888 FR2 OTA transmit ON/OFF power test system concerns Keysight Technologies UK Ltd imported from 3GU
R4‑1814888 FR2 OTA transmit ON/OFF power test system concerns Keysight Technologies UK Ltd imported from 3GU
R4‑1814888 FR2 OTA transmit ON/OFF power test system concerns Keysight Technologies UK Ltd imported from 3GU
R4‑1814889 TP for TR 37.716-11-11: UE requirements for DC_3-3_n77, DC_3-3_n78 CHTTL imported from 3GU
R4‑1814889 TP for TR 37.716-11-11: UE requirements for DC_3-3_n77, DC_3-3_n78 CHTTL imported from 3GU
R4‑1814889 TP for TR 37.716-11-11: UE requirements for DC_3-3_n77, DC_3-3_n78 CHTTL imported from 3GU
R4‑1814890 Concerns about measuring FR2 out-of-band unwanted emission (OBUE) performance and suggested measurement options Keysight Technologies UK Ltd imported from 3GU
R4‑1814890 Concerns about measuring FR2 out-of-band unwanted emission (OBUE) performance and suggested measurement options Keysight Technologies UK Ltd imported from 3GU
R4‑1814890 Concerns about measuring FR2 out-of-band unwanted emission (OBUE) performance and suggested measurement options Keysight Technologies UK Ltd imported from 3GU
R4‑1814891 Temperature condition for EIRP verification MediaTek Inc. imported from 3GU
R4‑1814891 Temperature condition for EIRP verification MediaTek Inc. imported from 3GU
R4‑1814891 Temperature condition for EIRP verification MediaTek Inc. imported from 3GU
R4‑1814892 EN_DC Intra-band RX Requirements Qualcomm Incorporated imported from 3GU
R4‑1814892 EN_DC Intra-band RX Requirements Qualcomm Incorporated imported from 3GU
R4‑1814892 EN_DC Intra-band RX Requirements Qualcomm Incorporated imported from 3GU
R4‑1814893 Selection of FR2 SCC for Neighboring Cell Search MediaTek inc. imported from 3GU
R4‑1814893 Selection of FR2 SCC for Neighboring Cell Search MediaTek inc. imported from 3GU
R4‑1814893 Selection of FR2 SCC for Neighboring Cell Search MediaTek inc. imported from 3GU
R4‑1814894 UE Behavior Before and After Measurement Gap MediaTek inc. imported from 3GU
R4‑1814894 UE Behavior Before and After Measurement Gap MediaTek inc. imported from 3GU
R4‑1814894 UE Behavior Before and After Measurement Gap MediaTek inc. imported from 3GU
R4‑1814895 On the autonomous gap for inter-RAT RSTD MediaTek inc. imported from 3GU
R4‑1814895 On the autonomous gap for inter-RAT RSTD MediaTek inc. imported from 3GU
R4‑1814895 On the autonomous gap for inter-RAT RSTD MediaTek inc. imported from 3GU
R4‑1814896 Remaining issues on SFTD MediaTek inc. imported from 3GU
R4‑1814896 Remaining issues on SFTD MediaTek inc. imported from 3GU
R4‑1814896 Remaining issues on SFTD MediaTek inc. imported from 3GU
R4‑1814897 Corrections on SFTD (section 7.35.2 and 8.1.2.4.26.1) MediaTek inc. imported from 3GU
R4‑1814897 Corrections on SFTD (section 7.35.2 and 8.1.2.4.26.1) MediaTek inc. imported from 3GU
R4‑1814897 Corrections on SFTD (section 7.35.2 and 8.1.2.4.26.1) MediaTek inc. imported from 3GU
R4‑1814898 CR on introducing requirement of max allowed transition times for TDD Intra-band CA (Section 7.8) MediaTek inc. imported from 3GU
R4‑1814898 CR on introducing requirement of max allowed transition times for TDD Intra-band CA (Section 7.8) MediaTek inc. imported from 3GU
R4‑1814898 CR on introducing requirement of max allowed transition times for TDD Intra-band CA (Section 7.8) MediaTek inc. imported from 3GU
R4‑1814899 Impact of FR2 intra-band NCCA MRTD to UE Rx beam switch MediaTek inc. imported from 3GU
R4‑1814899 Impact of FR2 intra-band NCCA MRTD to UE Rx beam switch MediaTek inc. imported from 3GU
R4‑1814899 Impact of FR2 intra-band NCCA MRTD to UE Rx beam switch MediaTek inc. imported from 3GU
R4‑1814900 Remaining issue on BWP switch delay MediaTek inc. imported from 3GU
R4‑1814900 Remaining issue on BWP switch delay MediaTek inc. imported from 3GU
R4‑1814900 Remaining issue on BWP switch delay MediaTek inc. imported from 3GU
R4‑1814901 Remaining issue on BWP switch interruption MediaTek inc. imported from 3GU
R4‑1814901 Remaining issue on BWP switch interruption MediaTek inc. imported from 3GU
R4‑1814901 Remaining issue on BWP switch interruption MediaTek inc. imported from 3GU
R4‑1814902 CR on updating requirement for BWP switching interruption in TS36.133 (Section 7.32.2.7) MediaTek inc. imported from 3GU
R4‑1814902 CR on updating requirement for BWP switching interruption in TS36.133 (Section 7.32.2.7) MediaTek inc. imported from 3GU
R4‑1814902 CR on TS36.133 for interruption due to BWP switch MediaTek inc. imported from 3GU
R4‑1814903 CR on TS38.133 for interruption due to BWP switch (section 8.2.1.2.7 and 8.2.2.2.5) MediaTek inc. imported from 3GU
R4‑1814903 CR on TS38.133 for interruption due to BWP switch (section 8.2.1.2.7 and 8.2.2.2.5) MediaTek inc. imported from 3GU
R4‑1814903 CR on TS38.133 for interruption due to BWP switch (section 8.2.1.2.7 and 8.2.2.2.5) MediaTek inc. imported from 3GU
R4‑1814904 CR on Clarification in RMSI RMC (Section A.3.1.2) MediaTek inc., Ericsson imported from 3GU
R4‑1814904 CR on Clarification in RMSI RMC (Section A.3.1.2) MediaTek inc., Ericsson imported from 3GU
R4‑1814904 CR on Clarification in RMSI RMC (Section A.3.1.2) MediaTek inc., Ericsson imported from 3GU
R4‑1814905 Out of band blocking for Band 42 Qualcomm Incorporated imported from 3GU
R4‑1814905 Out of band blocking for Band 42 Qualcomm Incorporated imported from 3GU
R4‑1814905 Out of band blocking for Band 42 Qualcomm Incorporated imported from 3GU
R4‑1814906 TR 37.716-00-00 V0.2.0 Huawei, HiSilicon imported from 3GU
R4‑1814906 TR 37.716-00-00 V0.2.0 Huawei, HiSilicon imported from 3GU
R4‑1814906 TR 37.716-00-00 V0.2.0 Huawei, HiSilicon imported from 3GU
R4‑1814907 DL measurement signal for FR2 UE beam correspondence verification MediaTek Inc. imported from 3GU
R4‑1814907 DL measurement signal for FR2 UE beam correspondence verification MediaTek Inc. imported from 3GU
R4‑1814907 DL measurement signal for FR2 UE beam correspondence verification MediaTek Inc. imported from 3GU
R4‑1814908 CR to TS37.141 on NR test model ZTE Corporation imported from 3GU
R4‑1814908 CR to TS37.141 on NR test model ZTE Corporation imported from 3GU
R4‑1814908 CR to TS37.141 on NR test model ZTE Corporation imported from 3GU
R4‑1814909 TP for TR 37.716-21-11 UE requirements for DC_7-8_n77, DC_7-8_n78 CHTTL imported from 3GU
R4‑1814909 TP for TR 37.716-21-11 UE requirements for DC_7-8_n77, DC_7-8_n78 CHTTL imported from 3GU
R4‑1814909 TP for TR 37.716-21-11 UE requirements for DC_7-8_n77, DC_7-8_n78 CHTTL imported from 3GU
R4‑1814910 FR2 UE EIS verifications and beam correspondence MediaTek Inc. imported from 3GU
R4‑1814910 FR2 UE EIS verifications and beam correspondence MediaTek Inc. imported from 3GU
R4‑1814910 FR2 UE EIS verifications and beam correspondence MediaTek Inc. imported from 3GU
R4‑1814911 New WI proposal: LTE/NR spectrum sharing of band 41 KDDI Corporation imported from 3GU
R4‑1814911 New WI proposal: LTE/NR spectrum sharing of band 41 KDDI Corporation imported from 3GU
R4‑1814911 New WI proposal: LTE/NR spectrum sharing of band 41 KDDI Corporation imported from 3GU
R4‑1814912 TP for TR 37.716-21-11: DC_18-42_n79 KDDI Corporation imported from 3GU
R4‑1814912 TP for TR 37.716-21-11: DC_18-42_n79 KDDI Corporation imported from 3GU
R4‑1814912 TP for TR 37.716-21-11: DC_18-42_n79 KDDI Corporation imported from 3GU
R4‑1814913 CR to TS 36.101 – revision of OOB for B42 Qualcomm Incorporated imported from 3GU
R4‑1814913 CR to TS 36.101 – revision of OOB for B42 Qualcomm Incorporated imported from 3GU
R4‑1814913 CR to TS 36.101 – revision of OOB for B42 Qualcomm Incorporated imported from 3GU
R4‑1814914 TP for TR 37.716-21-11: DC_3-41_n79 KDDI Corporation imported from 3GU
R4‑1814914 TP for TR 37.716-21-11: DC_3-41_n79 KDDI Corporation imported from 3GU
R4‑1814914 TP for TR 37.716-21-11: DC_3-41_n79 KDDI Corporation imported from 3GU
R4‑1814915 CR to TS 36.101 – Add RF requirements for CA 66C Qualcomm Incorporated imported from 3GU
R4‑1814915 CR to TS 36.101 – Add RF requirements for CA 66C Qualcomm Incorporated imported from 3GU
R4‑1814915 CR to TS 36.101 – Add RF requirements for CA 66C Qualcomm Incorporated imported from 3GU
R4‑1814916 CR to TR 36.715 – To correct AMPR for CA_NS_09 Qualcomm Incorporated imported from 3GU
R4‑1814916 CR to TR 36.715 – To correct AMPR for CA_NS_09 Qualcomm Incorporated imported from 3GU
R4‑1814916 CR to TR 36.715 – To correct AMPR for CA_NS_09 Qualcomm Incorporated imported from 3GU
R4‑1814917 TP for TR 37.716-21-11: DC_3-41_n77 KDDI Corporation imported from 3GU
R4‑1814917 TP for TR 37.716-21-11: DC_3-41_n77 KDDI Corporation imported from 3GU
R4‑1814917 TP for TR 37.716-21-11: DC_3-41_n77 KDDI Corporation imported from 3GU
R4‑1814918 TP for TR 37.716-21-11: DC_3-18_n78 KDDI Corporation imported from 3GU
R4‑1814918 TP for TR 37.716-21-11: DC_3-18_n78 KDDI Corporation imported from 3GU
R4‑1814918 TP for TR 37.716-21-11: DC_3-18_n78 KDDI Corporation imported from 3GU
R4‑1814919 TP for TR 37.716-21-11: DC_3-18_n77 KDDI Corporation imported from 3GU
R4‑1814919 TP for TR 37.716-21-11: DC_3-18_n77 KDDI Corporation imported from 3GU
R4‑1814919 TP for TR 37.716-21-11: DC_3-18_n77 KDDI Corporation imported from 3GU
R4‑1814920 TP for TR 37.716-31-11: DC_3-18-42_n79 KDDI Corporation imported from 3GU
R4‑1814920 TP for TR 37.716-31-11: DC_3-18-42_n79 KDDI Corporation imported from 3GU
R4‑1814920 TP for TR 37.716-31-11: DC_3-18-42_n79 KDDI Corporation imported from 3GU
R4‑1814921 Draft CR to 38.104 on channel spacing for intra-band CA ZTE Corporation imported from 3GU
R4‑1814921 Draft CR to 38.104 on channel spacing for intra-band CA ZTE Corporation imported from 3GU
R4‑1814921 Draft CR to 38.104 on channel spacing for intra-band CA ZTE Corporation imported from 3GU
R4‑1814922 Views on HST tests NTT DOCOMO, INC. imported from 3GU
R4‑1814922 Views on HST tests NTT DOCOMO, INC. imported from 3GU
R4‑1814922 Views on HST tests NTT DOCOMO, INC. imported from 3GU
R4‑1814923 Simulation results for PDSCH demodulation tests with follow PMI NTT DOCOMO, INC. imported from 3GU
R4‑1814923 Simulation results for PDSCH demodulation tests with follow PMI NTT DOCOMO, INC. imported from 3GU
R4‑1814923 Simulation results for PDSCH demodulation tests with follow PMI NTT DOCOMO, INC. imported from 3GU
R4‑1814924 Simulation results for SDR test NTT DOCOMO, INC. imported from 3GU
R4‑1814924 Simulation results for SDR test NTT DOCOMO, INC. imported from 3GU
R4‑1814924 Simulation results for SDR test NTT DOCOMO, INC. imported from 3GU
R4‑1814925 Draft CR to 38.101-1 on intra-band contiguous CA configurations for FR1 ZTE Corporation imported from 3GU
R4‑1814925 Draft CR to 38.101-1 on intra-band contiguous CA configurations for FR1 ZTE Corporation imported from 3GU
R4‑1814925 Draft CR to 38.101-1 on intra-band contiguous CA configurations for FR1 ZTE Corporation imported from 3GU
R4‑1814926 TP for TR 37.716-31-11: DC_3-18-42_n77 KDDI Corporation imported from 3GU
R4‑1814926 TP for TR 37.716-31-11: DC_3-18-42_n77 KDDI Corporation imported from 3GU
R4‑1814926 TP for TR 37.716-31-11: DC_3-18-42_n77 KDDI Corporation imported from 3GU
R4‑1814927 TP for TR 38.716-01-01 for CA_2DL_n41C_1UL_n41A Huawei, HiSilicon imported from 3GU
R4‑1814927 TP for TR 38.716-01-01 for CA_2DL_n41C_1UL_n41A Huawei, HiSilicon imported from 3GU
R4‑1814927 TP for TR 38.716-01-01 for CA_2DL_n41C_1UL_n41A Huawei, HiSilicon imported from 3GU
R4‑1814928 TP for TR 38.716-01-01 for CA_2DL_n41(2A)_1UL_n41A Huawei, HiSilicon imported from 3GU
R4‑1814928 TP for TR 38.716-01-01 for CA_2DL_n41(2A)_1UL_n41A Huawei, HiSilicon imported from 3GU
R4‑1814928 TP for TR 38.716-01-01 for CA_2DL_n41(2A)_1UL_n41A Huawei, HiSilicon imported from 3GU
R4‑1814929 TP for TR 38.716-01-01 for CA_2DL_n41(2A)_2UL_n41(2A) Huawei, HiSilicon imported from 3GU
R4‑1814929 TP for TR 38.716-01-01 for CA_2DL_n41(2A)_2UL_n41(2A) Huawei, HiSilicon imported from 3GU
R4‑1814929 TP for TR 38.716-01-01 for CA_2DL_n41(2A)_2UL_n41(2A) Huawei, HiSilicon imported from 3GU
R4‑1814930 TP for TR 36.716-03-02: LTE inter-band CA 3 bands DL with 2 bands UL Verizon, LG Electronics Finland imported from 3GU
R4‑1814930 TP for TR 36.716-03-02: LTE inter-band CA 3 bands DL with 2 bands UL Verizon, LG Electronics Finland imported from 3GU
R4‑1814930 TP for TR 36.716-03-02: LTE inter-band CA 3 bands DL with 2 bands UL Verizon, LG Electronics Finland imported from 3GU
R4‑1814931 TP for TR 37.716-31-11: DC_1-18-42_n79 KDDI Corporation imported from 3GU
R4‑1814931 TP for TR 37.716-31-11: DC_1-18-42_n79 KDDI Corporation imported from 3GU
R4‑1814931 TP for TR 37.716-31-11: DC_1-18-42_n79 KDDI Corporation imported from 3GU
R4‑1814932 TP for TR 36.716-03-02: LTE inter-band CA 4 bands DL with 2 bands UL Verizon, LG Electronics Finland imported from 3GU
R4‑1814932 TP for TR 36.716-03-02: LTE inter-band CA 4 bands DL with 2 bands UL Verizon, LG Electronics Finland imported from 3GU
R4‑1814932 TP for TR 36.716-03-02: LTE inter-band CA 4 bands DL with 2 bands UL Verizon, LG Electronics Finland imported from 3GU
R4‑1814933 Preliminary MPR Measurements for DC_3_n3 for 1 and 2 UL antenna architecture Skyworks Solutions Inc. imported from 3GU
R4‑1814933 Preliminary MPR Measurements for DC_3_n3 for 1 and 2 UL antenna architecture Skyworks Solutions Inc. imported from 3GU
R4‑1814933 Preliminary MPR Measurements for DC_3_n3 for 1 and 2 UL antenna architecture Skyworks Solutions Inc. imported from 3GU
R4‑1814934 TP for TR 37.716-31-11: DC_1-18-42_n77 KDDI Corporation imported from 3GU
R4‑1814934 TP for TR 37.716-31-11: DC_1-18-42_n77 KDDI Corporation imported from 3GU
R4‑1814934 TP for TR 37.716-31-11: DC_1-18-42_n77 KDDI Corporation imported from 3GU
R4‑1814935 Draft CR to 38.101-2 on UE maximum output power with additional requirements ZTE Corporation imported from 3GU
R4‑1814935 Draft CR to 38.101-2 on UE maximum output power with additional requirements ZTE Corporation imported from 3GU
R4‑1814935 Draft CR to 38.101-2 on UE maximum output power with additional requirements ZTE Corporation imported from 3GU
R4‑1814936 MSD for DC_3_n3 One and Two UL Antenna Architectures Skyworks Solutions Inc. imported from 3GU
R4‑1814936 MSD for DC_3_n3 One and Two UL Antenna Architectures Skyworks Solutions Inc. imported from 3GU
R4‑1814936 MSD for DC_3_n3 One and Two UL Antenna Architectures Skyworks Solutions Inc. imported from 3GU
R4‑1814937 TP to TR 37.716-21-21: finalize UE requirements for DC_3_n1-n77 CHTTL imported from 3GU
R4‑1814937 TP to TR 37.716-21-21: finalize UE requirements for DC_3_n1-n77 CHTTL imported from 3GU
R4‑1814937 TP to TR 37.716-21-21: finalize UE requirements for DC_3_n1-n77 CHTTL imported from 3GU
R4‑1814938 Draft CR to 38.101-3 on operating bands for CA and DC ZTE Corporation imported from 3GU
R4‑1814938 Draft CR to 38.101-3 on operating bands for CA and DC ZTE Corporation imported from 3GU
R4‑1814938 Draft CR to 38.101-3 on operating bands for CA and DC ZTE Corporation imported from 3GU
R4‑1814939 TP for TR 37.716-41-11: DC_1-3-41-42_n79 KDDI Corporation imported from 3GU
R4‑1814939 TP for TR 37.716-41-11: DC_1-3-41-42_n79 KDDI Corporation imported from 3GU
R4‑1814939 TP for TR 37.716-41-11: DC_1-3-41-42_n79 KDDI Corporation imported from 3GU
R4‑1814940 TP to TR 37.716-21-21: finalize UE requirements for DC_3_n1-n77 CHTTL imported from 3GU
R4‑1814940 TP to TR 37.716-21-21: finalize UE requirements for DC_3_n1-n77 CHTTL imported from 3GU
R4‑1814940 TP to TR 37.716-21-21: finalize UE requirements for DC_3_n1-n77 CHTTL imported from 3GU
R4‑1814941 Draft CR to 38.101-3 rel16 to introduce MSD for DC_(n)71AA and BCS1 Skyworks Solutions Inc., T-Mobile USA imported from 3GU
R4‑1814941 Draft CR to 38.101-3 rel16 to introduce MSD for DC_(n)71AA and BCS1 Skyworks Solutions Inc., T-Mobile USA imported from 3GU
R4‑1814941 Draft CR to 38.101-3 rel16 to introduce MSD for DC_(n)71AA and BCS1 Skyworks Solutions Inc., T-Mobile USA imported from 3GU
R4‑1814942 TP to TR 37.716-21-21: UE requirements for DC_3_n1-n78 CHTTL imported from 3GU
R4‑1814942 TP to TR 37.716-21-21: UE requirements for DC_3_n1-n78 CHTTL imported from 3GU
R4‑1814942 TP to TR 37.716-21-21: UE requirements for DC_3_n1-n78 CHTTL imported from 3GU
R4‑1814943 TP for TR 37.716-41-11: DC_1-3-41-42_n77 KDDI Corporation imported from 3GU
R4‑1814943 TP for TR 37.716-41-11: DC_1-3-41-42_n77 KDDI Corporation imported from 3GU
R4‑1814943 TP for TR 37.716-41-11: DC_1-3-41-42_n77 KDDI Corporation imported from 3GU
R4‑1814944 CR to 37.865-01-01: Corrections on configurations for intra-band CA ZTE Corporation imported from 3GU
R4‑1814944 CR to 37.865-01-01: Corrections on configurations for intra-band CA ZTE Corporation imported from 3GU
R4‑1814944 CR to 37.865-01-01: Corrections on configurations for intra-band CA ZTE Corporation imported from 3GU
R4‑1814945 TP for TR 37.716-41-11: DC_1-3-18-42_n79 KDDI Corporation imported from 3GU
R4‑1814945 TP for TR 37.716-41-11: DC_1-3-18-42_n79 KDDI Corporation imported from 3GU
R4‑1814945 TP for TR 37.716-41-11: DC_1-3-18-42_n79 KDDI Corporation imported from 3GU
R4‑1814946 Test setup for FR2 RRM Tests Qualcomm Incorporated, Vodafone, AT&T, Verizon, KT, T-Mobile USA, NTT Docomo, KDDI imported from 3GU
R4‑1814946 Test setup for FR2 RRM Tests Qualcomm Incorporated, Vodafone, AT&T, Verizon, KT, T-Mobile USA, NTT Docomo, KDDI imported from 3GU
R4‑1814946 Test setup for FR2 RRM Tests Qualcomm Incorporated, Vodafone, AT&T, Verizon, KT, T-Mobile USA, NTT Docomo, KDDI imported from 3GU
R4‑1814947 Wide Beams and Narrow Beams in FR2 Qualcomm Incorporated imported from 3GU
R4‑1814947 Wide Beams and Narrow Beams in FR2 Qualcomm Incorporated imported from 3GU
R4‑1814947 Wide Beams and Narrow Beams in FR2 Qualcomm Incorporated imported from 3GU
R4‑1814948 AoA Setup for FR2 RRM Testing Qualcomm Incorporated imported from 3GU
R4‑1814948 AoA Setup for FR2 RRM Testing Qualcomm Incorporated imported from 3GU
R4‑1814948 AoA Setup for FR2 RRM Testing Qualcomm Incorporated imported from 3GU
R4‑1814949 FR2 RRM Side Conditions Qualcomm Incorporated imported from 3GU
R4‑1814949 FR2 RRM Side Conditions Qualcomm Incorporated imported from 3GU
R4‑1814949 FR2 RRM Side Conditions Qualcomm Incorporated imported from 3GU
R4‑1814950 FR2 RRM Side Conditions Qualcomm Incorporated imported from 3GU
R4‑1814950 FR2 RRM Side Conditions Qualcomm Incorporated imported from 3GU
R4‑1814950 FR2 RRM Side Conditions Qualcomm Incorporated imported from 3GU
R4‑1814951 TP for TR 37.716-41-11: DC_1-3-18-42_n77 KDDI Corporation imported from 3GU
R4‑1814951 TP for TR 37.716-41-11: DC_1-3-18-42_n77 KDDI Corporation imported from 3GU
R4‑1814951 TP for TR 37.716-41-11: DC_1-3-18-42_n77 KDDI Corporation imported from 3GU
R4‑1814952 SRS switch IL simulation in FR1 OPPO imported from 3GU
R4‑1814952 SRS switch IL simulation in FR1 OPPO imported from 3GU
R4‑1814952 SRS switch IL simulation in FR1 OPPO imported from 3GU
R4‑1814953 Draft CR on introduction of SRS switch IL in FR1 OPPO imported from 3GU
R4‑1814953 Draft CR on introduction of SRS switch IL in FR1 OPPO imported from 3GU
R4‑1814953 Draft CR on introduction of SRS switch IL in FR1 OPPO imported from 3GU
R4‑1814954 Discussion on intra-band EN-DC HPUE in FR1 OPPO imported from 3GU
R4‑1814954 Discussion on intra-band EN-DC HPUE in FR1 OPPO imported from 3GU
R4‑1814954 Discussion on intra-band EN-DC HPUE in FR1 OPPO imported from 3GU
R4‑1814955 Introduction of maxUplinkDutyCycle to ENDC HPUE in FR1 OPPO imported from 3GU
R4‑1814955 Introduction of maxUplinkDutyCycle to ENDC HPUE in FR1 OPPO imported from 3GU
R4‑1814955 Introduction of maxUplinkDutyCycle to ENDC HPUE in FR1 OPPO imported from 3GU
R4‑1814956 Draft LS on UE capability of maxUplinkDutyCycle for intra-band EN-DC power class 2 in FR1 OPPO imported from 3GU
R4‑1814956 Draft LS on UE capability of maxUplinkDutyCycle for intra-band EN-DC power class 2 in FR1 OPPO imported from 3GU
R4‑1814956 Draft LS on UE capability of maxUplinkDutyCycle for intra-band EN-DC power class 2 in FR1 OPPO imported from 3GU
R4‑1814957 Discussion on UE RF exposure compliance in FR2 OPPO imported from 3GU
R4‑1814957 Discussion on UE RF exposure compliance in FR2 OPPO imported from 3GU
R4‑1814957 Discussion on UE RF exposure compliance in FR2 OPPO imported from 3GU
R4‑1814958 Draft CR on introduction of maxUplinkDutyCycle in FR2 OPPO imported from 3GU
R4‑1814958 Draft CR on introduction of maxUplinkDutyCycle in FR2 OPPO imported from 3GU
R4‑1814958 Draft CR on introduction of maxUplinkDutyCycle in FR2 OPPO imported from 3GU
R4‑1814959 Changes to Max input power UL and DL configuratgions in FR1 OPPO imported from 3GU
R4‑1814959 Changes to Max input power UL and DL configuratgions in FR1 OPPO imported from 3GU
R4‑1814959 Changes to Max input power UL and DL configuratgions in FR1 OPPO imported from 3GU
R4‑1814960 Discussion on UE RF requirement verification with extreme conditions in FR2 OPPO imported from 3GU
R4‑1814960 Discussion on UE RF requirement verification with extreme conditions in FR2 OPPO imported from 3GU
R4‑1814960 Discussion on UE RF requirement verification with extreme conditions in FR2 OPPO imported from 3GU
R4‑1814961 Discussion on form factor desense in FR2 OPPO imported from 3GU
R4‑1814961 Discussion on form factor desense in FR2 OPPO imported from 3GU
R4‑1814961 Discussion on form factor desense in FR2 OPPO imported from 3GU
R4‑1814962 TP on figure of merit in FR1 and FR2 static MIMO OTA OPPO imported from 3GU
R4‑1814962 TP on figure of merit in FR1 and FR2 static MIMO OTA OPPO imported from 3GU
R4‑1814962 TP on figure of merit in FR1 and FR2 static MIMO OTA OPPO imported from 3GU
R4‑1814963 Discussion on environmental conditions in FR1 MIMO OTA OPPO imported from 3GU
R4‑1814963 Discussion on environmental conditions in FR1 MIMO OTA OPPO imported from 3GU
R4‑1814963 Discussion on environmental conditions in FR1 MIMO OTA OPPO imported from 3GU
R4‑1814964 Addition of LTE B35 B36 B37 to out of band co-existence & co-location requirements with further change in 25.104 Huawei, HiSilicon imported from 3GU
R4‑1814964 Addition of LTE B35 B36 B37 to out of band co-existence & co-location requirements with further change in 25.104 Huawei, HiSilicon imported from 3GU
R4‑1814964 Addition of LTE B35 B36 B37 to out of band co-existence & co-location requirements with further change in 25.104 Huawei, HiSilicon imported from 3GU
R4‑1814965 Addition of LTE B35 B36 B37 to out of band co-existence & co-location requirements with further change in 25.141 Huawei, HiSilicon imported from 3GU
R4‑1814965 Addition of LTE B35 B36 B37 to out of band co-existence & co-location requirements with further change in 25.141 Huawei, HiSilicon imported from 3GU
R4‑1814965 Addition of LTE B35 B36 B37 to out of band co-existence & co-location requirements with further change in 25.141 Huawei, HiSilicon imported from 3GU
R4‑1814966 TR 37.716-41-11 V0.1.0 Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814966 TR 37.716-41-11 V0.1.0 Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814966 TR 37.716-41-11 V0.1.0 Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814967 Updated scope of TR 37.716-41-11 V0.1.0 Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814967 Updated scope of TR 37.716-41-11 V0.1.0 Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814967 Updated scope of TR 37.716-41-11 V0.1.0 Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814968 Revised WID on Dual Connectivity (EN-DC) of 4 bands LTE inter-band CA (4DL/1UL) and 1 NR band (1DL/1UL) Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814968 Revised WID on Dual Connectivity (EN-DC) of 4 bands LTE inter-band CA (4DL/1UL) and 1 NR band (1DL/1UL) Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814968 Revised WID on Dual Connectivity (EN-DC) of 4 bands LTE inter-band CA (4DL/1UL) and 1 NR band (1DL/1UL) Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814969 Introduction of EN-DC 4 LTE bands + 1 NR band into TS 38.101-3 Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814969 Introduction of EN-DC 4 LTE bands + 1 NR band into TS 38.101-3 Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814969 Introduction of EN-DC 4 LTE bands + 1 NR band into TS 38.101-3 Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814970 NR FR1 relative power tolerance CR Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814970 NR FR1 relative power tolerance CR Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814970 NR FR1 relative power tolerance CR Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814971 CR to introduce new features into 38.307 Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814971 CR to introduce new features into 38.307 Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814971 CR to introduce new features into 38.307 Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814972 A-MPR for NS_03 and NS_03U and re-formulation of NS_100 Nokia imported from 3GU
R4‑1814972 A-MPR for NS_03 and NS_03U and re-formulation of NS_100 Nokia imported from 3GU
R4‑1814972 A-MPR for NS_03 and NS_03U and re-formulation of NS_100 Nokia imported from 3GU
R4‑1814973 On DC_(n)71AA new A-MPR approach and intraband contiguous EN-DC Pcmax Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814973 On DC_(n)71AA new A-MPR approach and intraband contiguous EN-DC Pcmax Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814973 On DC_(n)71AA new A-MPR approach and intraband contiguous EN-DC Pcmax Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814974 CR to 38.101-3: Pcmax for intra-band contiguous EN-DC Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814974 CR to 38.101-3: Pcmax for intra-band contiguous EN-DC Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814974 CR to 38.101-3: Pcmax for intra-band contiguous EN-DC Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814975 Correction for Intra-band contiguous EN-DC A-MPR definition Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814975 Correction for Intra-band contiguous EN-DC A-MPR definition Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814975 Correction for Intra-band contiguous EN-DC A-MPR definition Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814976 Correction for Maximum output power for inter-band EN-DC (two bands) Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814976 Correction for Maximum output power for inter-band EN-DC (two bands) Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814976 Correction for Maximum output power for inter-band EN-DC (two bands) Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814977 Correction for ?TIB,c for EN-DC Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814977 Correction for ?TIB,c for EN-DC Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814977 Correction for ?TIB,c for EN-DC Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814978 MPR and A-MPR for interband EN-DC Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814978 MPR and A-MPR for interband EN-DC Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814978 MPR and A-MPR for interband EN-DC Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814979 Simplification of EN-DC and CA between FR1 and FR2 UE to UE co-ex table by adopting CA band approach Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814979 Simplification of EN-DC and CA between FR1 and FR2 UE to UE co-ex table by adopting CA band approach Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814979 Simplification of EN-DC and CA between FR1 and FR2 UE to UE co-ex table by adopting CA band approach Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814980 Correction for intra-band EN-DC bandwidth class Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814980 Correction for intra-band EN-DC bandwidth class Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814980 Correction for intra-band EN-DC bandwidth class Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814981 WI proposal for LTE 410 MHz Nokia imported from 3GU
R4‑1814981 WI proposal for LTE 410 MHz Nokia imported from 3GU
R4‑1814981 WI proposal for LTE 410 MHz Nokia imported from 3GU
R4‑1814982 Introduction of band 53 into TS 25.101 Nokia, Globalstar imported from 3GU
R4‑1814982 Introduction of band 53 into TS 25.101 Nokia, Globalstar imported from 3GU
R4‑1814982 Introduction of band 53 into TS 25.101 Nokia imported from 3GU
R4‑1814983 Introduction of band 53 into TS 36.124 Nokia, Globalstar imported from 3GU
R4‑1814983 Introduction of band 53 into TS 36.124 Nokia imported from 3GU
R4‑1814983 Introduction of band 53 into TS 36.124 Nokia, Globalstar imported from 3GU
R4‑1814984 Corrections to feMTC RRM test cases A.7.2.6 and A.7.2.7 (Rel-13) Rohde & Schwarz imported from 3GU
R4‑1814984 Corrections to feMTC RRM test cases A.7.2.6 and A.7.2.7 (Rel-13) Rohde & Schwarz imported from 3GU
R4‑1814984 Corrections to feMTC RRM test cases A.7.2.6 and A.7.2.7 (Rel-13) Rohde & Schwarz imported from 3GU
R4‑1814985 Corrections to feMTC RRM test cases A.7.2.6 and A.7.2.7 (Rel-14) Rohde & Schwarz imported from 3GU
R4‑1814985 Corrections to feMTC RRM test cases A.7.2.6 and A.7.2.7 (Rel-14) Rohde & Schwarz imported from 3GU
R4‑1814985 Corrections to feMTC RRM test cases A.7.2.6 and A.7.2.7 (Rel-14) Rohde & Schwarz imported from 3GU
R4‑1814986 Corrections to feMTC RRM test cases A.7.2.6 and A.7.2.7 (Rel-15) Rohde & Schwarz imported from 3GU
R4‑1814986 Corrections to feMTC RRM test cases A.7.2.6 and A.7.2.7 (Rel-15) Rohde & Schwarz imported from 3GU
R4‑1814986 Corrections to feMTC RRM test cases A.7.2.6 and A.7.2.7 (Rel-15) Rohde & Schwarz imported from 3GU
R4‑1814987 Corrections to feMTC RRM test case A.8.1.28 (Rel-13) Rohde & Schwarz imported from 3GU
R4‑1814987 Corrections to feMTC RRM test case A.8.1.28 (Rel-13) Rohde & Schwarz imported from 3GU
R4‑1814987 Corrections to feMTC RRM test case A.8.1.28 (Rel-13) Rohde & Schwarz imported from 3GU
R4‑1814988 Corrections to feMTC RRM test case A.8.1.28 (Rel-14) Rohde & Schwarz imported from 3GU
R4‑1814988 Corrections to feMTC RRM test case A.8.1.28 (Rel-14) Rohde & Schwarz imported from 3GU
R4‑1814988 Corrections to feMTC RRM test case A.8.1.28 (Rel-14) Rohde & Schwarz imported from 3GU
R4‑1814989 Corrections to feMTC RRM test case A.8.1.28 (Rel-15) Rohde & Schwarz imported from 3GU
R4‑1814989 Corrections to feMTC RRM test case A.8.1.28 (Rel-15) Rohde & Schwarz imported from 3GU
R4‑1814989 Corrections to feMTC RRM test case A.8.1.28 (Rel-15) Rohde & Schwarz imported from 3GU
R4‑1814990 Corrections to NB-IOT RSTD reporting delay requirements and tests (Rel-14) Rohde & Schwarz, Spirent Communications imported from 3GU
R4‑1814990 Corrections to NB-IOT RSTD reporting delay requirements and tests (Rel-14) Rohde & Schwarz, Spirent Communications imported from 3GU
R4‑1814990 Corrections to NB-IOT RSTD reporting delay requirements and tests (Rel-14) Rohde & Schwarz imported from 3GU
R4‑1814991 Corrections to NB-IOT RSTD reporting delay requirements and tests (Rel-15) Rohde & Schwarz imported from 3GU
R4‑1814991 Corrections to NB-IOT RSTD reporting delay requirements and tests (Rel-15) Rohde & Schwarz imported from 3GU
R4‑1814991 Corrections to NB-IOT RSTD reporting delay requirements and tests (Rel-15) Rohde & Schwarz imported from 3GU
R4‑1814992 Corrections to generic CA RRM test cases up to 5 DL CCs (Rel-15) Rohde & Schwarz imported from 3GU
R4‑1814992 Corrections to generic CA RRM test cases up to 5 DL CCs (Rel-15) Rohde & Schwarz imported from 3GU
R4‑1814992 Corrections to generic CA RRM test cases up to 5 DL CCs (Rel-15) Rohde & Schwarz imported from 3GU
R4‑1814993 Corrections to generic CA RRM test cases for 6 and 7 DL CCs (Rel-15) Rohde & Schwarz imported from 3GU
R4‑1814993 Corrections to generic CA RRM test cases for 6 and 7 DL CCs (Rel-15) Rohde & Schwarz imported from 3GU
R4‑1814993 Corrections to generic CA RRM test cases for 6 and 7 DL CCs (Rel-15) Rohde & Schwarz imported from 3GU
R4‑1814994 draft CR for introduce DC of LTE 4band + NR 1band for TS 38.101-3 KDDI Corporation imported from 3GU
R4‑1814994 draft CR for introduce DC of LTE 4band + NR 1band for TS 38.101-3 KDDI Corporation imported from 3GU
R4‑1814994 draft CR for introduce DC of LTE 4band + NR 1band for TS 38.101-3 KDDI Corporation imported from 3GU
R4‑1814995 draft CR for introduce DC of LTE 3band + NR 1band for TS 38.101-3 KDDI Corporation imported from 3GU
R4‑1814995 draft CR for introduce DC of LTE 3band + NR 1band for TS 38.101-3 KDDI Corporation imported from 3GU
R4‑1814995 draft CR for introduce DC of LTE 3band + NR 1band for TS 38.101-3 KDDI Corporation imported from 3GU
R4‑1814996 draft CR for introduce DC of LTE 2band + NR 1band for TS 38.101-3 KDDI Corporation imported from 3GU
R4‑1814996 draft CR for introduce DC of LTE 2band + NR 1band for TS 38.101-3 KDDI Corporation imported from 3GU
R4‑1814996 draft CR for introduce DC of LTE 2band + NR 1band for TS 38.101-3 KDDI Corporation imported from 3GU
R4‑1814997 draft CR for introduce DC of LTE 1band + NR 1band for TS 38.101-3 KDDI Corporation imported from 3GU
R4‑1814997 draft CR for introduce DC of LTE 1band + NR 1band for TS 38.101-3 KDDI Corporation imported from 3GU
R4‑1814997 draft CR for introduce DC of LTE 1band + NR 1band for TS 38.101-3 KDDI Corporation imported from 3GU
R4‑1814998 Finalizing SUL specifications Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814998 Finalizing SUL specifications Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814998 Finalizing SUL specifications Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814999 draft CR to 38.101-1: SUL clarifications Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814999 draft CR to 38.101-1: SUL clarifications Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1814999 draft CR to 38.101-1: SUL clarifications Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815000 draft CR to 38.101-3: SUL clarifications Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815000 draft CR to 38.101-3: SUL clarifications Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815000 draft CR to 38.101-3: SUL clarifications Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815001 Draft Response LS on UE capability for SUL and SDL Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815001 Draft Response LS on UE capability for SUL and SDL Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815001 Draft Response LS on UE capability for SUL and SDL Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815002 UE capabilities for pairing of SDL and SUL Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815002 UE capabilities for pairing of SDL and SUL Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815002 UE capabilities for pairing of SDL and SUL Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815003 EIRP accuracy in extreme conditions for FR2 Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815003 EIRP accuracy in extreme conditions for FR2 Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815003 EIRP accuracy in extreme conditions for FR2 Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815004 Measurement procedures and interpretation of measurement results Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815004 Measurement procedures and interpretation of measurement results Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815004 Measurement procedures and interpretation of measurement results Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815005 TP to 38.141-2: MU clarifications Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815005 TP to 38.141-2: MU clarifications Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815005 TP to 38.141-2: MU clarifications Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815006 CR to 37.145-2: MU clarifications Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815006 CR to 37.145-2: MU clarifications Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815006 CR to 37.145-2: MU clarifications Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815007 CR to 38.104: Corrections to co-location requirements Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815007 CR to 38.104: Corrections to co-location requirements Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815007 CR to 38.104: Corrections to co-location requirements Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815008 TP to 38.141-2: Corrections to co-location requirements Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815008 TP to 38.141-2: Corrections to co-location requirements Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815008 TP to 38.141-2: Corrections to co-location requirements Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815009 CR to 37.105: Corrections to co-location requirements Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815009 CR to 37.105: Corrections to co-location requirements Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815009 CR to 37.105: Corrections to co-location requirements Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815010 CR to 37.145-2: Corrections to co-location requirements Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815010 CR to 37.145-2: Corrections to co-location requirements Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815010 CR to 37.145-2: Corrections to co-location requirements Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815011 TP to TS 38.141-1: test model and data content (Section 4.9.2) ZTE Corporation imported from 3GU
R4‑1815011 TP to TS 38.141-1: test model and data content (Section 4.9.2) ZTE Corporation imported from 3GU
R4‑1815011 TP to TS 38.141-1: test model and data content (Section 4.9.2) ZTE Corporation imported from 3GU
R4‑1815012 Intra-frequency measurement requirements in DRX mode for EN-DC NTT DOCOMO, INC. imported from 3GU
R4‑1815012 Intra-frequency measurement requirements in DRX mode for EN-DC NTT DOCOMO, INC. imported from 3GU
R4‑1815012 Intra-frequency measurement requirements in DRX mode for EN-DC NTT DOCOMO, INC. imported from 3GU
R4‑1815013 Inter-frequency measurement requirements in DRX mode for EN-DC NTT DOCOMO, INC. imported from 3GU
R4‑1815013 Inter-frequency measurement requirements in DRX mode for EN-DC NTT DOCOMO, INC. imported from 3GU
R4‑1815013 Inter-frequency measurement requirements in DRX mode for EN-DC NTT DOCOMO, INC. imported from 3GU
R4‑1815014 Applicability rule on measurement requirements in DRX mode for EN-DC NTT DOCOMO, INC. imported from 3GU
R4‑1815014 Applicability rule on measurement requirements in DRX mode for EN-DC NTT DOCOMO, INC. imported from 3GU
R4‑1815014 Applicability rule on measurement requirements in DRX mode for EN-DC NTT DOCOMO, INC. imported from 3GU
R4‑1815015 The necessity of MTTD requirement for intra-band synchronous EN-DC NTT DOCOMO, INC. imported from 3GU
R4‑1815015 The necessity of MTTD requirement for intra-band synchronous EN-DC NTT DOCOMO, INC. imported from 3GU
R4‑1815015 The necessity of MTTD requirement for intra-band synchronous EN-DC NTT DOCOMO, INC. imported from 3GU
R4‑1815016 Remaining issues on Radio Link Monitoring NTT DOCOMO, INC. imported from 3GU
R4‑1815016 Remaining issues on Radio Link Monitoring NTT DOCOMO, INC. imported from 3GU
R4‑1815016 Remaining issues on Radio Link Monitoring NTT DOCOMO, INC. imported from 3GU
R4‑1815017 CR on TS38.133 for UE scheduling availability of UE performing radio link monitoring on FR2 NTT DOCOMO, INC. imported from 3GU
R4‑1815017 CR on TS38.133 for UE scheduling availability of UE performing radio link monitoring on FR2 NTT DOCOMO, INC. imported from 3GU
R4‑1815017 CR on TS38.133 for UE scheduling availability of UE performing radio link monitoring on FR2 NTT DOCOMO, INC. imported from 3GU
R4‑1815018 Remaining issues on Candidate beam detection NTT DOCOMO, INC. imported from 3GU
R4‑1815018 Remaining issues on Candidate beam detection NTT DOCOMO, INC. imported from 3GU
R4‑1815018 Remaining issues on Candidate beam detection NTT DOCOMO, INC. imported from 3GU
R4‑1815019 Remaining issues on L1-RSRP Computation for reporting NTT DOCOMO, INC. imported from 3GU
R4‑1815019 Remaining issues on L1-RSRP Computation for reporting NTT DOCOMO, INC. imported from 3GU
R4‑1815019 Remaining issues on L1-RSRP Computation for reporting NTT DOCOMO, INC. imported from 3GU
R4‑1815020 Measurement condition for EIS in FR2 NTT DOCOMO, INC. imported from 3GU
R4‑1815020 Measurement condition for EIS in FR2 NTT DOCOMO, INC. imported from 3GU
R4‑1815020 Measurement condition for EIS in FR2 NTT DOCOMO, INC. imported from 3GU
R4‑1815021 Beam correspondence requirement NTT DOCOMO, INC. imported from 3GU
R4‑1815021 Beam correspondence requirement NTT DOCOMO, INC. imported from 3GU
R4‑1815021 Beam correspondence requirement NTT DOCOMO, INC. imported from 3GU
R4‑1815022 Draft CR to 38.133 on UE behaviour before and after measurement gap (section 9.1.2) ZTE imported from 3GU
R4‑1815022 Draft CR to 38.133 on UE behaviour before and after measurement gap (section 9.1.2) ZTE imported from 3GU
R4‑1815022 Draft CR to 38.133 on UE behaviour before and after measurement gap (section 9.1.2) ZTE imported from 3GU
R4‑1815023 Draft CR to 38.133 on correction of measurement gap and interruption time (section 9.1.2) ZTE imported from 3GU
R4‑1815023 Draft CR to 38.133 on correction of measurement gap and interruption time (section 9.1.2) ZTE imported from 3GU
R4‑1815023 Draft CR to 38.133 on correction of measurement gap and interruption time (section 9.1.2) ZTE imported from 3GU
R4‑1815024 Further discussion on UE behaviour before and after measurement gap ZTE imported from 3GU
R4‑1815024 Further discussion on UE behaviour before and after measurement gap ZTE imported from 3GU
R4‑1815024 Further discussion on UE behaviour before and after measurement gap ZTE imported from 3GU
R4‑1815025 Draft CR to 38.133 on CSI-RS based RLM requirements (section 8.1.3) ZTE imported from 3GU
R4‑1815025 Draft CR to 38.133 on CSI-RS based RLM requirements (section 8.1.3) ZTE imported from 3GU
R4‑1815025 Draft CR to 38.133 on CSI-RS based RLM requirements (section 8.1.3) ZTE imported from 3GU
R4‑1815026 Discussion on remaining issues on CSI-RS based RLM ZTE imported from 3GU
R4‑1815026 Discussion on remaining issues on CSI-RS based RLM ZTE imported from 3GU
R4‑1815026 Discussion on remaining issues on CSI-RS based RLM ZTE imported from 3GU
R4‑1815027 Draft CR to 38.133 on NR FR1 inter-RAT handover test cases (section A.6.3.1) ZTE imported from 3GU
R4‑1815027 Draft CR to 38.133 on NR FR1 inter-RAT handover test cases (section A.6.3.1) ZTE imported from 3GU
R4‑1815027 Draft CR to 38.133 on NR FR1 inter-RAT handover test cases (section A.6.3.1) ZTE imported from 3GU
R4‑1815028 Discussion on inter frequency measurement accuracy and side conditions ZTE imported from 3GU
R4‑1815028 Discussion on inter frequency measurement accuracy and side conditions ZTE imported from 3GU
R4‑1815028 Discussion on inter frequency measurement accuracy and side conditions ZTE imported from 3GU
R4‑1815029 Draft CR to TS38.101-1: Corrections on TS for MSD calculations based on ENDC bands combination including of bands n1,n3,n8, n77, and n78 MediaTek Inc. imported from 3GU
R4‑1815029 Draft CR to TS38.101-1: Corrections on TS for MSD calculations based on ENDC bands combination including of bands n1,n3,n8, n77, and n78 MediaTek Inc. imported from 3GU
R4‑1815029 Draft CR to TS38.101-1: Corrections on TS for MSD calculations based on ENDC bands combination including of bands n1,n3,n8, n77, and n78 MediaTek Inc. imported from 3GU
R4‑1815030 NR BS test model 3.2 and 3.3 for FR2 NTT DOCOMO, INC. imported from 3GU
R4‑1815030 NR BS test model 3.2 and 3.3 for FR2 NTT DOCOMO, INC. imported from 3GU
R4‑1815030 NR BS test model 3.2 and 3.3 for FR2 NTT DOCOMO, INC. imported from 3GU
R4‑1815031 NR BS FR2 TDD transmitter OFF power and transient period NTT DOCOMO, INC. imported from 3GU
R4‑1815031 NR BS FR2 TDD transmitter OFF power and transient period NTT DOCOMO, INC. imported from 3GU
R4‑1815031 NR BS FR2 TDD transmitter OFF power and transient period NTT DOCOMO, INC. imported from 3GU
R4‑1815032 TP to TS 38.141-2 Update on test procedure of NR BS OTA transmit ON/OFF power NTT DOCOMO, INC. imported from 3GU
R4‑1815032 TP to TS 38.141-2 Update on test procedure of NR BS OTA transmit ON/OFF power NTT DOCOMO, INC. imported from 3GU
R4‑1815032 TP to TS 38.141-2 Update on test procedure of NR BS OTA transmit ON/OFF power NTT DOCOMO, INC. imported from 3GU
R4‑1815033 TP to TS 38.141-1 Correction on conducted EVM test procedure for NR BS NTT DOCOMO, INC. imported from 3GU
R4‑1815033 TP to TS 38.141-1 Correction on conducted EVM test procedure for NR BS NTT DOCOMO, INC. imported from 3GU
R4‑1815033 TP to TS 38.141-1 Correction on conducted EVM test procedure for NR BS NTT DOCOMO, INC. imported from 3GU
R4‑1815034 TP to TS 38.141-2 Correction on OTA EVM test procedure for NR BS NTT DOCOMO, INC. imported from 3GU
R4‑1815034 TP to TS 38.141-2 Correction on OTA EVM test procedure for NR BS NTT DOCOMO, INC. imported from 3GU
R4‑1815034 TP to TS 38.141-2 Correction on OTA EVM test procedure for NR BS NTT DOCOMO, INC. imported from 3GU
R4‑1815035 TP to TS 38.141-2: Correction on scaling for NR BS OBUE limits NTT DOCOMO, INC. imported from 3GU
R4‑1815035 TP to TS 38.141-2: Correction on scaling for NR BS OBUE limits NTT DOCOMO, INC. imported from 3GU
R4‑1815035 TP to TS 38.141-2: Correction on scaling for NR BS OBUE limits NTT DOCOMO, INC. imported from 3GU
R4‑1815036 Clarification on fractional bandwidth definition for NR BS NTT DOCOMO, INC. imported from 3GU
R4‑1815036 Clarification on fractional bandwidth definition for NR BS NTT DOCOMO, INC. imported from 3GU
R4‑1815036 Clarification on fractional bandwidth definition for NR BS NTT DOCOMO, INC. imported from 3GU
R4‑1815037 Draft CR for TS 38.104: Correction on fractional bandwidth for NR BS NTT DOCOMO, INC. imported from 3GU
R4‑1815037 Draft CR for TS 38.104: Correction on fractional bandwidth for NR BS NTT DOCOMO, INC. imported from 3GU
R4‑1815037 Draft CR for TS 38.104: Correction on fractional bandwidth for NR BS NTT DOCOMO, INC. imported from 3GU
R4‑1815038 TP to TS 38.141-2 Correction on fractional bandwidth for NR BS NTT DOCOMO, INC. imported from 3GU
R4‑1815038 TP to TS 38.141-2 Correction on fractional bandwidth for NR BS NTT DOCOMO, INC. imported from 3GU
R4‑1815038 TP to TS 38.141-2 Correction on fractional bandwidth for NR BS NTT DOCOMO, INC. imported from 3GU
R4‑1815039 TP to TS 38.141-2 Correction on declaration NTT DOCOMO, INC. imported from 3GU
R4‑1815039 TP to TS 38.141-2 Correction on declaration NTT DOCOMO, INC. imported from 3GU
R4‑1815039 TP to TS 38.141-2 Correction on declaration NTT DOCOMO, INC. imported from 3GU
R4‑1815040 Directivity for calculation of TRP NTT DOCOMO, INC. imported from 3GU
R4‑1815040 Directivity for calculation of TRP NTT DOCOMO, INC. imported from 3GU
R4‑1815040 Directivity for calculation of TRP NTT DOCOMO, INC. imported from 3GU
R4‑1815041 Draft CR to TS38.101-3: Corrections on TS for MSD calculations based on ENDC bands combination including of bands 1,3,8, n77, and n78 MediaTek Inc. imported from 3GU
R4‑1815041 Draft CR to TS38.101-3: Corrections on TS for MSD calculations based on ENDC bands combination including of bands 1,3,8, n77, and n78 MediaTek Inc. imported from 3GU
R4‑1815041 Draft CR to TS38.101-3: Corrections on TS for MSD calculations based on ENDC bands combination including of bands 1,3,8, n77, and n78 MediaTek Inc. imported from 3GU
R4‑1815042 TP for TR 38.716-02-00: MSD for CA_n1A-n77A due to the 2nd harmonic MediaTek Inc. imported from 3GU
R4‑1815042 TP for TR 38.716-02-00: MSD for CA_n1A-n77A due to the 2nd harmonic MediaTek Inc. imported from 3GU
R4‑1815042 TP for TR 38.716-02-00: MSD for CA_n1A-n77A due to the 2nd harmonic MediaTek Inc. imported from 3GU
R4‑1815043 MSD analysis for DC band combination of Band 20, 38 and n78 Huawei, HiSilicon imported from 3GU
R4‑1815043 MSD analysis for DC band combination of Band 20, 38 and n78 Huawei, HiSilicon imported from 3GU
R4‑1815043 MSD analysis for DC band combination of Band 20, 38 and n78 Huawei, HiSilicon imported from 3GU
R4‑1815044 MSD analysis for DC band combination of Band 8, 20 and n78 Huawei, HiSilicon imported from 3GU
R4‑1815044 MSD analysis for DC band combination of Band 8, 20 and n78 Huawei, HiSilicon imported from 3GU
R4‑1815044 MSD analysis for DC band combination of Band 8, 20 and n78 Huawei, HiSilicon imported from 3GU
R4‑1815045 MPR/A-MPR consideration for intra-band DC_(n)41 Huawei, HiSilicon imported from 3GU
R4‑1815045 MPR/A-MPR consideration for intra-band DC_(n)41 Huawei, HiSilicon imported from 3GU
R4‑1815045 MPR/A-MPR consideration for intra-band DC_(n)41 Huawei, HiSilicon imported from 3GU
R4‑1815046 TDD configuration for UE demodulation requirements NTT DOCOMO, INC. imported from 3GU
R4‑1815046 TDD configuration for UE demodulation requirements NTT DOCOMO, INC. imported from 3GU
R4‑1815046 TDD configuration for UE demodulation requirements NTT DOCOMO, INC. imported from 3GU
R4‑1815047 Remaining issues on PDSCH demodulation requirements NTT DOCOMO, INC. imported from 3GU
R4‑1815047 Remaining issues on PDSCH demodulation requirements NTT DOCOMO, INC. imported from 3GU
R4‑1815047 Remaining issues on PDSCH demodulation requirements NTT DOCOMO, INC. imported from 3GU
R4‑1815048 On inter band EN-DC configured power NTT DOCOMO, INC. imported from 3GU
R4‑1815048 On inter band EN-DC configured power NTT DOCOMO, INC. imported from 3GU
R4‑1815048 On inter band EN-DC configured power NTT DOCOMO, INC. imported from 3GU
R4‑1815049 Remaining issues on RAN4 UE feature list NTT DOCOMO, INC. imported from 3GU
R4‑1815049 Remaining issues on RAN4 UE feature list NTT DOCOMO, INC. imported from 3GU
R4‑1815049 Remaining issues on RAN4 UE feature list NTT DOCOMO, INC. imported from 3GU
R4‑1815050 Remaining issues on SDR requirements NTT DOCOMO, INC. imported from 3GU
R4‑1815050 Remaining issues on SDR requirements NTT DOCOMO, INC. imported from 3GU
R4‑1815050 Remaining issues on SDR requirements NTT DOCOMO, INC. imported from 3GU
R4‑1815051 draft CR for OBB for Inter band EN-DC for TS 38.101-3 NTT DOCOMO, INC. imported from 3GU
R4‑1815051 draft CR for OBB for Inter band EN-DC for TS 38.101-3 NTT DOCOMO, INC. imported from 3GU
R4‑1815051 draft CR for OBB for Inter band EN-DC for TS 38.101-3 NTT DOCOMO, INC. imported from 3GU
R4‑1815052 OBB for inter band EN-DC NTT DOCOMO, INC. imported from 3GU
R4‑1815052 OBB for inter band EN-DC NTT DOCOMO, INC. imported from 3GU
R4‑1815052 OBB for inter band EN-DC NTT DOCOMO, INC. imported from 3GU
R4‑1815053 draft CR for finalizing ACS in FR1 for TS 38.101-1 NTT DOCOMO, INC. imported from 3GU
R4‑1815053 draft CR for finalizing ACS in FR1 for TS 38.101-1 NTT DOCOMO, INC. imported from 3GU
R4‑1815053 draft CR for finalizing ACS in FR1 for TS 38.101-1 NTT DOCOMO, INC. imported from 3GU
R4‑1815054 Interpretation of ACS requirement for Class C NR CA in FR1 NTT DOCOMO, INC. imported from 3GU
R4‑1815054 Interpretation of ACS requirement for Class C NR CA in FR1 NTT DOCOMO, INC. imported from 3GU
R4‑1815054 Interpretation of ACS requirement for Class C NR CA in FR1 NTT DOCOMO, INC. imported from 3GU
R4‑1815055 Extreme condition requirement for FR2 NTT DOCOMO, INC. imported from 3GU
R4‑1815055 Extreme condition requirement for FR2 NTT DOCOMO, INC. imported from 3GU
R4‑1815055 Extreme condition requirement for FR2 NTT DOCOMO, INC. imported from 3GU
R4‑1815056 Handling UE types in FR2 NTT DOCOMO, INC. imported from 3GU
R4‑1815056 Handling UE types in FR2 NTT DOCOMO, INC. imported from 3GU
R4‑1815056 Handling UE types in FR2 NTT DOCOMO, INC. imported from 3GU
R4‑1815057 Draft CR for Introducing missing requirement for power class 4 in FR2 for TS 38.101-2 NTT DOCOMO, INC. imported from 3GU
R4‑1815057 Draft CR for Introducing missing requirement for power class 4 in FR2 for TS 38.101-2 NTT DOCOMO, INC. imported from 3GU
R4‑1815057 Draft CR for Introducing missing requirement for power class 4 in FR2 for TS 38.101-2 NTT DOCOMO, INC. imported from 3GU
R4‑1815058 draft CR for removing UE types in FR2 for TS 38.101-2 NTT DOCOMO, INC. imported from 3GU
R4‑1815058 draft CR for removing UE types in FR2 for TS 38.101-2 NTT DOCOMO, INC. imported from 3GU
R4‑1815058 draft CR for removing UE types in FR2 for TS 38.101-2 NTT DOCOMO, INC. imported from 3GU
R4‑1815059 Draft CR for correction for missing agreed DC combinations in Rel-15 for TS 38.101-3 NTT DOCOMO, INC. imported from 3GU
R4‑1815059 Draft CR for correction for missing agreed DC combinations in Rel-15 for TS 38.101-3 NTT DOCOMO, INC. imported from 3GU
R4‑1815059 Draft CR for correction for missing agreed DC combinations in Rel-15 for TS 38.101-3 NTT DOCOMO, INC. imported from 3GU
R4‑1815060 draft CR for adding note about the fallback of NR CA in FR1 for TS 38.101-1 NTT DOCOMO, INC. imported from 3GU
R4‑1815060 draft CR for adding note about the fallback of NR CA in FR1 for TS 38.101-1 NTT DOCOMO, INC. imported from 3GU
R4‑1815060 draft CR for adding note about the fallback of NR CA in FR1 for TS 38.101-1 NTT DOCOMO, INC. imported from 3GU
R4‑1815061 draft CR for adding note about the fallback of EN-DC in Applicability of minimum requirements for TS 38.101-3 NTT DOCOMO, INC. imported from 3GU
R4‑1815061 draft CR for adding note about the fallback of EN-DC in Applicability of minimum requirements for TS 38.101-3 NTT DOCOMO, INC. imported from 3GU
R4‑1815061 draft CR for adding note about the fallback of EN-DC in Applicability of minimum requirements for TS 38.101-3 NTT DOCOMO, INC. imported from 3GU
R4‑1815062 introducing P-max to Pcmax in FR2 NTT DOCOMO, INC. imported from 3GU
R4‑1815062 introducing P-max to Pcmax in FR2 NTT DOCOMO, INC. imported from 3GU
R4‑1815062 introducing P-max to Pcmax in FR2 NTT DOCOMO, INC. imported from 3GU
R4‑1815063 draft CR for introducing P-max to Pcmax in FR2 for TS 38.101-2 NTT DOCOMO, INC. imported from 3GU
R4‑1815063 draft CR for introducing P-max to Pcmax in FR2 for TS 38.101-2 NTT DOCOMO, INC. imported from 3GU
R4‑1815063 draft CR for introducing P-max to Pcmax in FR2 for TS 38.101-2 NTT DOCOMO, INC. imported from 3GU
R4‑1815064 RF exposure compliance for FR2 NTT DOCOMO, INC. imported from 3GU
R4‑1815064 RF exposure compliance for FR2 NTT DOCOMO, INC. imported from 3GU
R4‑1815064 RF exposure compliance for FR2 NTT DOCOMO, INC. imported from 3GU
R4‑1815065 draft CR for adding missing transmit singnal quality for inter band EN-DC for TS 38.101-3 NTT DOCOMO, INC. imported from 3GU
R4‑1815065 draft CR for adding missing transmit singnal quality for inter band EN-DC for TS 38.101-3 NTT DOCOMO, INC. imported from 3GU
R4‑1815065 draft CR for adding missing transmit singnal quality for inter band EN-DC for TS 38.101-3 NTT DOCOMO, INC. imported from 3GU
R4‑1815066 TP for TR 37.716-01-01 CA_n257_UL_n257 NTT DOCOMO, INC. imported from 3GU
R4‑1815066 TP for TR 37.716-01-01 CA_n257_UL_n257 NTT DOCOMO, INC. imported from 3GU
R4‑1815066 TP for TR 37.716-01-01 CA_n257_UL_n257 NTT DOCOMO, INC. imported from 3GU
R4‑1815067 Updated TR 37.716-11-11_V0.2.0_Rel16_DC band combo of 1 LTE band + 1 NR band NTT DOCOMO, INC. imported from 3GU
R4‑1815067 Updated TR 37.716-11-11_V0.2.0_Rel16_DC band combo of 1 LTE band + 1 NR band NTT DOCOMO, INC. imported from 3GU
R4‑1815067 Updated TR 37.716-11-11_V0.2.0_Rel16_DC band combo of 1 LTE band + 1 NR band NTT DOCOMO, INC. imported from 3GU
R4‑1815068 revised WID on EN-DC of 1 LTE band and 1 NR band NTT DOCOMO, INC. imported from 3GU
R4‑1815068 revised WID on EN-DC of 1 LTE band and 1 NR band NTT DOCOMO, INC. imported from 3GU
R4‑1815068 revised WID on EN-DC of 1 LTE band and 1 NR band NTT DOCOMO, INC. imported from 3GU
R4‑1815069 Draft CR to reflect agreed EN-DC of 1 LTE band and 1 NR band in TR 37.716-11-11 for TS 38.101-3 NTT DOCOMO, INC. imported from 3GU
R4‑1815069 Draft CR to reflect agreed EN-DC of 1 LTE band and 1 NR band in TR 37.716-11-11 for TS 38.101-3 NTT DOCOMO, INC. imported from 3GU
R4‑1815069 Draft CR to reflect agreed EN-DC of 1 LTE band and 1 NR band in TR 37.716-11-11 for TS 38.101-3 NTT DOCOMO, INC. imported from 3GU
R4‑1815070 Draft CR for EN-DC of 1 band LTE and1 band NR for TS 38.101-3 without FR2 NTT DOCOMO, INC. imported from 3GU
R4‑1815070 Draft CR for EN-DC of 1 band LTE and1 band NR for TS 38.101-3 without FR2 NTT DOCOMO, INC. imported from 3GU
R4‑1815070 Draft CR for EN-DC of 1 band LTE and1 band NR for TS 38.101-3 without FR2 NTT DOCOMO, INC. imported from 3GU
R4‑1815071 Draft CR for EN-DC of 1 band LTE and1 band NR for TS 38.101-3 with FR2 NTT DOCOMO, INC. imported from 3GU
R4‑1815071 Draft CR for EN-DC of 1 band LTE and1 band NR for TS 38.101-3 with FR2 NTT DOCOMO, INC. imported from 3GU
R4‑1815071 Draft CR for EN-DC of 1 band LTE and1 band NR for TS 38.101-3 with FR2 NTT DOCOMO, INC. imported from 3GU
R4‑1815072 Draft CR for EN-DC of 2 band LTE and1 band NR for TS 38.101-3 without FR2 NTT DOCOMO, INC. imported from 3GU
R4‑1815072 Draft CR for EN-DC of 2 band LTE and1 band NR for TS 38.101-3 without FR2 NTT DOCOMO, INC. imported from 3GU
R4‑1815072 Draft CR for EN-DC of 2 band LTE and1 band NR for TS 38.101-3 without FR2 NTT DOCOMO, INC. imported from 3GU
R4‑1815073 Draft CR for EN-DC of 2 band LTE and1 band NR for TS 38.101-3 with FR2 NTT DOCOMO, INC. imported from 3GU
R4‑1815073 Draft CR for EN-DC of 2 band LTE and1 band NR for TS 38.101-3 with FR2 NTT DOCOMO, INC. imported from 3GU
R4‑1815073 Draft CR for EN-DC of 2 band LTE and1 band NR for TS 38.101-3 with FR2 NTT DOCOMO, INC. imported from 3GU
R4‑1815074 Draft CR for EN-DC of 3 band LTE and1 band NR for TS 38.101-3 without FR2 NTT DOCOMO, INC. imported from 3GU
R4‑1815074 Draft CR for EN-DC of 3 band LTE and1 band NR for TS 38.101-3 without FR2 NTT DOCOMO, INC. imported from 3GU
R4‑1815074 Draft CR for EN-DC of 3 band LTE and1 band NR for TS 38.101-3 without FR2 NTT DOCOMO, INC. imported from 3GU
R4‑1815075 Draft CR for EN-DC of 3 band LTE and1 band NR for TS 38.101-3 with FR2 NTT DOCOMO, INC. imported from 3GU
R4‑1815075 Draft CR for EN-DC of 3 band LTE and1 band NR for TS 38.101-3 with FR2 NTT DOCOMO, INC. imported from 3GU
R4‑1815075 Draft CR for EN-DC of 3 band LTE and1 band NR for TS 38.101-3 with FR2 NTT DOCOMO, INC. imported from 3GU
R4‑1815076 Draft CR for EN-DC of 4 band LTE and1 band NR for TS 38.101-3 without FR2 NTT DOCOMO, INC. imported from 3GU
R4‑1815076 Draft CR for EN-DC of 4 band LTE and1 band NR for TS 38.101-3 without FR2 NTT DOCOMO, INC. imported from 3GU
R4‑1815076 Draft CR for EN-DC of 4 band LTE and1 band NR for TS 38.101-3 without FR2 NTT DOCOMO, INC. imported from 3GU
R4‑1815077 TP for TR 37.716-41-11 EN-DC 3-19-21-42_n77 NTT DOCOMO, INC. imported from 3GU
R4‑1815077 TP for TR 37.716-41-11 EN-DC 3-19-21-42_n77 NTT DOCOMO, INC. imported from 3GU
R4‑1815077 TP for TR 37.716-41-11 EN-DC 3-19-21-42_n77 NTT DOCOMO, INC. imported from 3GU
R4‑1815078 TP for TR 37.716-41-11 EN-DC 3-19-21-42_n78 NTT DOCOMO, INC. imported from 3GU
R4‑1815078 TP for TR 37.716-41-11 EN-DC 3-19-21-42_n78 NTT DOCOMO, INC. imported from 3GU
R4‑1815078 TP for TR 37.716-41-11 EN-DC 3-19-21-42_n78 NTT DOCOMO, INC. imported from 3GU
R4‑1815079 TP for TR 37.716-41-11 EN-DC 3-19-21-42_n79 NTT DOCOMO, INC. imported from 3GU
R4‑1815079 TP for TR 37.716-41-11 EN-DC 3-19-21-42_n79 NTT DOCOMO, INC. imported from 3GU
R4‑1815079 TP for TR 37.716-41-11 EN-DC 3-19-21-42_n79 NTT DOCOMO, INC. imported from 3GU
R4‑1815080 Draft CR for EN-DC of 4 band LTE and1 band NR for TS 38.101-3 with FR2 NTT DOCOMO, INC. imported from 3GU
R4‑1815080 Draft CR for EN-DC of 4 band LTE and1 band NR for TS 38.101-3 with FR2 NTT DOCOMO, INC. imported from 3GU
R4‑1815080 Draft CR for EN-DC of 4 band LTE and1 band NR for TS 38.101-3 with FR2 NTT DOCOMO, INC. imported from 3GU
R4‑1815081 TP on evaluation on coverage for 2RX vehicle UE Huawei, HiSilicon imported from 3GU
R4‑1815081 TP on evaluation on coverage for 2RX vehicle UE Huawei, HiSilicon imported from 3GU
R4‑1815081 TP on evaluation on coverage for 2RX vehicle UE Huawei, HiSilicon imported from 3GU
R4‑1815082 TP on methods to distinguish UE types Huawei, HiSilicon imported from 3GU
R4‑1815082 TP on methods to distinguish UE types Huawei, HiSilicon imported from 3GU
R4‑1815082 TP on methods to distinguish UE types Huawei, HiSilicon imported from 3GU
R4‑1815083 CR for L1 indication interval for RLM and BFD (section 8.1.6, 8.5.4) Huawei, HiSilicon imported from 3GU
R4‑1815083 CR for L1 indication interval for RLM and BFD (section 8.1.6, 8.5.4) Huawei, HiSilicon imported from 3GU
R4‑1815083 CR for L1 indication interval for RLM and BFD (section 8.1.6, 8.5.4) Huawei, HiSilicon imported from 3GU
R4‑1815084 CR for measurement capability (section 9.2.3.2) Huawei, HiSilicon imported from 3GU
R4‑1815084 CR for measurement capability (section 9.2.3.2) Huawei, HiSilicon imported from 3GU
R4‑1815084 CR for measurement capability (section 9.2.3.2) Huawei, HiSilicon imported from 3GU
R4‑1815085 Discussion on the remaining issues of UE measurement capability Huawei, HiSilicon imported from 3GU
R4‑1815085 Discussion on the remaining issues of UE measurement capability Huawei, HiSilicon imported from 3GU
R4‑1815085 Discussion on the remaining issues of UE measurement capability Huawei, HiSilicon imported from 3GU
R4‑1815086 Draft LS on UE measurement capability Huawei, HiSilicon imported from 3GU
R4‑1815086 Draft LS on UE measurement capability Huawei, HiSilicon imported from 3GU
R4‑1815086 Draft LS on UE measurement capability Huawei, HiSilicon imported from 3GU
R4‑1815087 CR for MO merging in 36.133 (section 8.1.2.1.1b.1) Huawei, HiSilicon imported from 3GU
R4‑1815087 CR for MO merging in 36.133 (section 8.1.2.1.1b.1) Huawei, HiSilicon imported from 3GU
R4‑1815087 CR for MO merging in 36.133 (section 8.1.2.1.1b.1) Huawei, HiSilicon imported from 3GU
R4‑1815088 CR for MO merging in 38.133 (section 9.1.3.2) Huawei, HiSilicon imported from 3GU
R4‑1815088 CR for MO merging in 38.133 (section 9.1.3.2) Huawei, HiSilicon imported from 3GU
R4‑1815088 CR for MO merging in 38.133 (section 9.1.3.2) Huawei, HiSilicon imported from 3GU
R4‑1815089 CR for scheduling availability in 38.133 (section 8.1.7.2, 8.1.7.3, 8.5.7.3, 9.2.5.3.2 and 9.2.5.3.3) Huawei, HiSilicon imported from 3GU
R4‑1815089 CR for scheduling availability in 38.133 (section 8.1.7.2, 8.1.7.3, 8.5.7.3, 9.2.5.3.2 and 9.2.5.3.3) Huawei, HiSilicon imported from 3GU
R4‑1815089 CR for scheduling availability in 38.133 (section 8.1.7.2, 8.1.7.3, 8.5.7.3, 9.2.5.3.2 and 9.2.5.3.3) Huawei, HiSilicon imported from 3GU
R4‑1815090 Discussion on Rx beam selection for RRM measurements Huawei, HiSilicon imported from 3GU
R4‑1815090 Discussion on Rx beam selection for RRM measurements Huawei, HiSilicon imported from 3GU
R4‑1815090 Discussion on Rx beam selection for RRM measurements Huawei, HiSilicon imported from 3GU
R4‑1815091 Discussion on the impact of dual SMTCs on intra-frequency carrier Huawei, HiSilicon imported from 3GU
R4‑1815091 Discussion on the impact of dual SMTCs on intra-frequency carrier Huawei, HiSilicon imported from 3GU
R4‑1815091 Discussion on the impact of dual SMTCs on intra-frequency carrier Huawei, HiSilicon imported from 3GU
R4‑1815092 CR for measurement report mapping table (section 10.1.6) Huawei, HiSilicon imported from 3GU
R4‑1815092 CR for measurement report mapping table (section 10.1.6) Huawei, HiSilicon imported from 3GU
R4‑1815092 CR for measurement report mapping table (section 10.1.6) Huawei, HiSilicon imported from 3GU
R4‑1815093 Maintenance CR for PHR mapping tables R15 Huawei, HiSilicon imported from 3GU
R4‑1815093 Maintenance CR for PHR mapping tables R15 Huawei, HiSilicon imported from 3GU
R4‑1815093 Maintenance CR for PHR mapping tables R15 Huawei, HiSilicon imported from 3GU
R4‑1815094 Introducing TDD NPRACH configuration for NB test cases Huawei, HiSilicon imported from 3GU
R4‑1815094 Introducing TDD NPRACH configuration for NB test cases Huawei, HiSilicon imported from 3GU
R4‑1815094 Introducing TDD NPRACH configuration for NB test cases Huawei, HiSilicon imported from 3GU
R4‑1815095 TDD contention based random access test case under normal coverage Huawei, HiSilicon imported from 3GU
R4‑1815095 TDD contention based random access test case under normal coverage Huawei, HiSilicon imported from 3GU
R4‑1815095 TDD contention based random access test case under normal coverage Huawei, HiSilicon imported from 3GU
R4‑1815096 TDD contention based random access test case under enhanced coverage Huawei, HiSilicon imported from 3GU
R4‑1815096 TDD contention based random access test case under enhanced coverage Huawei, HiSilicon imported from 3GU
R4‑1815096 TDD contention based random access test case under enhanced coverage Huawei, HiSilicon imported from 3GU
R4‑1815097 TDD contention based random access test case on non-anchor carriers Huawei, HiSilicon imported from 3GU
R4‑1815097 TDD contention based random access test case on non-anchor carriers Huawei, HiSilicon imported from 3GU
R4‑1815097 TDD contention based random access test case on non-anchor carriers Huawei, HiSilicon imported from 3GU
R4‑1815098 TDD intra-frequency RSTD measurement accuracy test case under normal coverage Huawei, HiSilicon imported from 3GU
R4‑1815098 TDD intra-frequency RSTD measurement accuracy test case under normal coverage Huawei, HiSilicon imported from 3GU
R4‑1815098 TDD intra-frequency RSTD measurement accuracy test case under normal coverage Huawei, HiSilicon imported from 3GU
R4‑1815099 TDD inter-frequency RSTD measurement accuracy test case under normal coverage Huawei, HiSilicon imported from 3GU
R4‑1815099 TDD inter-frequency RSTD measurement accuracy test case under normal coverage Huawei, HiSilicon imported from 3GU
R4‑1815099 TDD inter-frequency RSTD measurement accuracy test case under normal coverage Huawei, HiSilicon imported from 3GU
R4‑1815100 TDD intra-frequency RSTD measurement accuracy test case under enhanced coverage Huawei, HiSilicon imported from 3GU
R4‑1815100 TDD intra-frequency RSTD measurement accuracy test case under enhanced coverage Huawei, HiSilicon imported from 3GU
R4‑1815100 TDD intra-frequency RSTD measurement accuracy test case under enhanced coverage Huawei, HiSilicon imported from 3GU
R4‑1815101 TDD inter-frequency RSTD measurement accuracy test case under enhanced coverage Huawei, HiSilicon imported from 3GU
R4‑1815101 TDD inter-frequency RSTD measurement accuracy test case under enhanced coverage Huawei, HiSilicon imported from 3GU
R4‑1815101 TDD inter-frequency RSTD measurement accuracy test case under enhanced coverage Huawei, HiSilicon imported from 3GU
R4‑1815102 TDD idle intra-frequency RSTD measurement test case under enhanced coverage Huawei, HiSilicon imported from 3GU
R4‑1815102 TDD idle intra-frequency RSTD measurement test case under enhanced coverage Huawei, HiSilicon imported from 3GU
R4‑1815102 TDD idle intra-frequency RSTD measurement test case under enhanced coverage Huawei, HiSilicon imported from 3GU
R4‑1815103 TDD idle inter-frequency RSTD measurement test case under enhanced coverage Huawei, HiSilicon imported from 3GU
R4‑1815103 TDD idle inter-frequency RSTD measurement test case under enhanced coverage Huawei, HiSilicon imported from 3GU
R4‑1815103 TDD idle inter-frequency RSTD measurement test case under enhanced coverage Huawei, HiSilicon imported from 3GU
R4‑1815104 CR on TDD support in conditions for NB-IoT measurements Huawei, HiSilicon imported from 3GU
R4‑1815104 CR on TDD support in conditions for NB-IoT measurements Huawei, HiSilicon imported from 3GU
R4‑1815104 CR on TDD support in conditions for NB-IoT measurements Huawei, HiSilicon imported from 3GU
R4‑1815105 CR on TDD support in measurement accuracy requirements for NB-IoT Huawei, HiSilicon imported from 3GU
R4‑1815105 CR on TDD support in measurement accuracy requirements for NB-IoT Huawei, HiSilicon imported from 3GU
R4‑1815105 CR on TDD support in measurement accuracy requirements for NB-IoT Huawei, HiSilicon imported from 3GU
R4‑1815106 CR on NRSRP accuracy applicability for UE Category NB1 R13 Huawei, HiSilicon imported from 3GU
R4‑1815106 CR on NRSRP accuracy applicability for UE Category NB1 R13 Huawei, HiSilicon imported from 3GU
R4‑1815106 CR on NRSRP accuracy applicability for UE Category NB1 R13 Huawei, HiSilicon imported from 3GU
R4‑1815107 CR on NRSRP accuracy applicability for UE Category NB1 and NB2 R14 Huawei, HiSilicon imported from 3GU
R4‑1815107 CR on NRSRP accuracy applicability for UE Category NB1 and NB2 R14 Huawei, HiSilicon imported from 3GU
R4‑1815107 CR on NRSRP accuracy applicability for UE Category NB1 and NB2 R14 Huawei, HiSilicon imported from 3GU
R4‑1815108 CR on NRSRP accuracy applicability for UE Category NB1 and NB2 R15 Huawei, HiSilicon imported from 3GU
R4‑1815108 CR on NRSRP accuracy applicability for UE Category NB1 and NB2 R15 Huawei, HiSilicon imported from 3GU
R4‑1815108 CR on NRSRP accuracy applicability for UE Category NB1 and NB2 R15 Huawei, HiSilicon imported from 3GU
R4‑1815109 CR on NB idle state RSTD measurement requirements R14 Huawei, HiSilicon imported from 3GU
R4‑1815109 CR on NB idle state RSTD measurement requirements R14 Huawei, HiSilicon imported from 3GU
R4‑1815109 CR on NB idle state RSTD measurement requirements R14 Huawei, HiSilicon imported from 3GU
R4‑1815110 CR on NB idle state RSTD measurement requirements R15 Huawei, HiSilicon imported from 3GU
R4‑1815110 CR on NB idle state RSTD measurement requirements R15 Huawei, HiSilicon imported from 3GU
R4‑1815110 CR on NB idle state RSTD measurement requirements R15 Huawei, HiSilicon imported from 3GU
R4‑1815111 CR on NB RSTD test cases R14 Huawei, HiSilicon imported from 3GU
R4‑1815111 CR on NB RSTD test cases R14 Huawei, HiSilicon imported from 3GU
R4‑1815111 CR on NB RSTD test cases R14 Huawei, HiSilicon imported from 3GU
R4‑1815112 CR on NB RSTD test cases R15 Huawei, HiSilicon imported from 3GU
R4‑1815112 CR on NB RSTD test cases R15 Huawei, HiSilicon imported from 3GU
R4‑1815112 CR on NB RSTD test cases R15 Huawei, HiSilicon imported from 3GU
R4‑1815113 CR on NPRACH configurations for NB R14 Huawei, HiSilicon imported from 3GU
R4‑1815113 CR on NPRACH configurations for NB R14 Huawei, HiSilicon imported from 3GU
R4‑1815113 CR on NPRACH configurations for NB R14 Huawei, HiSilicon imported from 3GU
R4‑1815114 CR on NB random access test cases R13 Huawei, HiSilicon imported from 3GU
R4‑1815114 CR on NB random access test cases R13 Huawei, HiSilicon imported from 3GU
R4‑1815114 CR on NB random access test cases R13 Huawei, HiSilicon imported from 3GU
R4‑1815115 CR on NB random access test cases R14 Huawei, HiSilicon imported from 3GU
R4‑1815115 CR on NB random access test cases R14 Huawei, HiSilicon imported from 3GU
R4‑1815115 CR on NB random access test cases R14 Huawei, HiSilicon imported from 3GU
R4‑1815116 CR on NB random access test cases R15 Huawei, HiSilicon imported from 3GU
R4‑1815116 CR on NB random access test cases R15 Huawei, HiSilicon imported from 3GU
R4‑1815116 CR on NB random access test cases R15 Huawei, HiSilicon imported from 3GU
R4‑1815117 CR on the remaining issues about WU and CD requirements Huawei, HiSilicon imported from 3GU
R4‑1815117 CR on the remaining issues about WU and CD requirements Huawei, HiSilicon imported from 3GU
R4‑1815117 CR on the remaining issues about WU and CD requirements Huawei, HiSilicon imported from 3GU
R4‑1815118 Introducing principle for LTE UE connected to 5GC test cases Huawei, HiSilicon imported from 3GU
R4‑1815118 Introducing principle for LTE UE connected to 5GC test cases Huawei, HiSilicon imported from 3GU
R4‑1815118 Introducing principle for LTE UE connected to 5GC test cases Huawei, HiSilicon imported from 3GU
R4‑1815119 Discussion on the remaining issues on the MO merging Huawei, HiSilicon imported from 3GU
R4‑1815119 Discussion on the remaining issues on the MO merging Huawei, HiSilicon imported from 3GU
R4‑1815119 Discussion on the remaining issues on the MO merging Huawei, HiSilicon imported from 3GU
R4‑1815120 Discussion on the redirection to NR requirements without target cell timing Huawei, HiSilicon imported from 3GU
R4‑1815120 Discussion on the redirection to NR requirements without target cell timing Huawei, HiSilicon imported from 3GU
R4‑1815120 Discussion on the redirection to NR requirements without target cell timing Huawei, HiSilicon imported from 3GU
R4‑1815121 draftCR on the release with redirection to NR (section 6.2.3) Huawei, HiSilicon imported from 3GU
R4‑1815121 draftCR on the release with redirection to NR (section 6.2.3) Huawei, HiSilicon imported from 3GU
R4‑1815121 draftCR on the release with redirection to NR (section 6.2.3) Huawei, HiSilicon imported from 3GU
R4‑1815122 draftCR on re-establishement requirements for XdB value (section 6.2.1) Huawei, HiSilicon imported from 3GU
R4‑1815122 draftCR on re-establishement requirements for XdB value (section 6.2.1) Huawei, HiSilicon imported from 3GU
R4‑1815122 draftCR on re-establishement requirements for XdB value (section 6.2.1) Huawei, HiSilicon imported from 3GU
R4‑1815123 Discussion on the delay requirements for BWP switch Huawei, HiSilicon imported from 3GU
R4‑1815123 Discussion on the delay requirements for BWP switch Huawei, HiSilicon imported from 3GU
R4‑1815123 Discussion on the delay requirements for BWP switch Huawei, HiSilicon imported from 3GU
R4‑1815124 Discussion on the requirements for BWP switch interruptions on other serving CCs Huawei, HiSilicon imported from 3GU
R4‑1815124 Discussion on the requirements for BWP switch interruptions on other serving CCs Huawei, HiSilicon imported from 3GU
R4‑1815124 Discussion on the requirements for BWP switch interruptions on other serving CCs Huawei, HiSilicon imported from 3GU
R4‑1815125 draftCR on BWP switching delay (section 8.6) Huawei, HiSilicon imported from 3GU
R4‑1815125 draftCR on BWP switching delay (section 8.6) Huawei, HiSilicon imported from 3GU
R4‑1815125 draftCR on BWP switching delay (section 8.6) Huawei, HiSilicon imported from 3GU
R4‑1815126 draftCR on BWP switching interruptions on NR (section 8.2.1 and 8.2.2) Huawei, HiSilicon imported from 3GU
R4‑1815126 draftCR on BWP switching interruptions on NR (section 8.2.1 and 8.2.2) Huawei, HiSilicon imported from 3GU
R4‑1815126 draftCR on BWP switching interruptions on NR (section 8.2.1 and 8.2.2) Huawei, HiSilicon imported from 3GU
R4‑1815127 CR on BWP switching interruptions on LTE Pcell in EN-DC Huawei, HiSilicon imported from 3GU
R4‑1815127 CR on BWP switching interruptions on LTE Pcell in EN-DC Huawei, HiSilicon imported from 3GU
R4‑1815127 CR on BWP switching interruptions on LTE Pcell in EN-DC Huawei, HiSilicon imported from 3GU
R4‑1815128 Maintenance CR for intra cell search test cases EN-DC FR1 (section A.4.6.1) Huawei, HiSilicon imported from 3GU
R4‑1815128 Maintenance CR for intra cell search test cases EN-DC FR1 (section A.4.6.1) Huawei, HiSilicon imported from 3GU
R4‑1815128 Maintenance CR for intra cell search test cases EN-DC FR1 (section A.4.6.1) Huawei, HiSilicon imported from 3GU
R4‑1815129 Maintenance CR for intra cell search test cases EN-DC FR2 (section A.5.6.1) Huawei, HiSilicon imported from 3GU
R4‑1815129 Maintenance CR for intra cell search test cases EN-DC FR2 (section A.5.6.1) Huawei, HiSilicon imported from 3GU
R4‑1815129 Maintenance CR for intra cell search test cases EN-DC FR2 (section A.5.6.1) Huawei, HiSilicon imported from 3GU
R4‑1815130 Maintenance CR for intra cell search test cases SA FR1 (section A.6.6.1) Huawei, HiSilicon imported from 3GU
R4‑1815130 Maintenance CR for intra cell search test cases SA FR1 (section A.6.6.1) Huawei, HiSilicon imported from 3GU
R4‑1815130 Maintenance CR for intra cell search test cases SA FR1 (section A.6.6.1) Huawei, HiSilicon imported from 3GU
R4‑1815131 Maintenance CR for intra cell search test cases SA FR2 (section A.7.6.1) Huawei, HiSilicon imported from 3GU
R4‑1815131 Maintenance CR for intra cell search test cases SA FR2 (section A.7.6.1) Huawei, HiSilicon imported from 3GU
R4‑1815131 Maintenance CR for intra cell search test cases SA FR2 (section A.7.6.1) Huawei, HiSilicon imported from 3GU
R4‑1815132 Section A.3 maintenance CR (section A.3) Huawei, HiSilicon imported from 3GU
R4‑1815132 Section A.3 maintenance CR (section A.3) Huawei, HiSilicon imported from 3GU
R4‑1815132 Section A.3 maintenance CR (section A.3) Huawei, HiSilicon imported from 3GU
R4‑1815133 Idle mode cell reselection test cases list Huawei, HiSilicon imported from 3GU
R4‑1815133 Idle mode cell reselection test cases list Huawei, HiSilicon imported from 3GU
R4‑1815133 Idle mode cell reselection test cases list Huawei, HiSilicon imported from 3GU
R4‑1815134 Inactive state test cases principle CR Huawei, HiSilicon imported from 3GU
R4‑1815134 Inactive state test cases principle CR Huawei, HiSilicon imported from 3GU
R4‑1815134 Inactive state test cases principle CR Huawei, HiSilicon imported from 3GU
R4‑1815135 Cell reselection to intra-frequency NR test cases for FR1 (section A.6.1.1) Huawei, HiSilicon imported from 3GU
R4‑1815135 Cell reselection to intra-frequency NR test cases for FR1 (section A.6.1.1) Huawei, HiSilicon imported from 3GU
R4‑1815135 Cell reselection to intra-frequency NR test cases for FR1 (section A.6.1.1) Huawei, HiSilicon imported from 3GU
R4‑1815136 Cell reselection to FR1 inter-frequency NR test cases for FR1 (section A.6.1.1) Huawei, HiSilicon imported from 3GU
R4‑1815136 Cell reselection to FR1 inter-frequency NR test cases for FR1 (section A.6.1.1) Huawei, HiSilicon imported from 3GU
R4‑1815136 Cell reselection to FR1 inter-frequency NR test cases for FR1 (section A.6.1.1) Huawei, HiSilicon imported from 3GU
R4‑1815137 Cell reselection to higher priority E-UTRAN test cases (section A.6.1.2) Huawei, HiSilicon imported from 3GU
R4‑1815137 Cell reselection to higher priority E-UTRAN test cases (section A.6.1.2) Huawei, HiSilicon imported from 3GU
R4‑1815137 Cell reselection to higher priority E-UTRAN test cases (section A.6.1.2) Huawei, HiSilicon imported from 3GU
R4‑1815138 Cell reselection to lower priority E-UTRAN test cases (section A.6.1.2) Huawei, HiSilicon imported from 3GU
R4‑1815138 Cell reselection to lower priority E-UTRAN test cases (section A.6.1.2) Huawei, HiSilicon imported from 3GU
R4‑1815138 Cell reselection to lower priority E-UTRAN test cases (section A.6.1.2) Huawei, HiSilicon imported from 3GU
R4‑1815139 Cell reselection to intra-frequency NR test cases for FR2 (section A.7.1.1) Huawei, HiSilicon imported from 3GU
R4‑1815139 Cell reselection to intra-frequency NR test cases for FR2 (section A.7.1.1) Huawei, HiSilicon imported from 3GU
R4‑1815139 Cell reselection to intra-frequency NR test cases for FR2 (section A.7.1.1) Huawei, HiSilicon imported from 3GU
R4‑1815140 Cell reselection to FR2 inter-frequency NR test cases for FR2 (section A.7.1.1) Huawei, HiSilicon imported from 3GU
R4‑1815140 Cell reselection to FR2 inter-frequency NR test cases for FR2 (section A.7.1.1) Huawei, HiSilicon imported from 3GU
R4‑1815140 Cell reselection to FR2 inter-frequency NR test cases for FR2 (section A.7.1.1) Huawei, HiSilicon imported from 3GU
R4‑1815141 Applicability for SSB Rx beam in intra-band FR2 Huawei, HiSilicon imported from 3GU
R4‑1815141 Applicability for SSB Rx beam in intra-band FR2 Huawei, HiSilicon imported from 3GU
R4‑1815141 Applicability for SSB Rx beam in intra-band FR2 Huawei, HiSilicon imported from 3GU
R4‑1815142 Clarfication on measurement objects in gap sharing Huawei, HiSilicon imported from 3GU
R4‑1815142 Clarfication on measurement objects in gap sharing Huawei, HiSilicon imported from 3GU
R4‑1815142 Clarfication on measurement objects in gap sharing Huawei, HiSilicon imported from 3GU
R4‑1815143 Gap sharing mehtod for TS36.133 Huawei, HiSilicon imported from 3GU
R4‑1815143 Gap sharing mehtod for TS36.133 Huawei, HiSilicon imported from 3GU
R4‑1815143 Gap sharing mehtod for TS36.133 Huawei, HiSilicon imported from 3GU
R4‑1815144 Measurement requirements during BWP switching Huawei, HiSilicon imported from 3GU
R4‑1815144 Measurement requirements during BWP switching Huawei, HiSilicon imported from 3GU
R4‑1815144 Measurement requirements during BWP switching Huawei, HiSilicon imported from 3GU
R4‑1815145 CR on measurement requirements at transitions Huawei, HiSilicon imported from 3GU
R4‑1815145 CR on measurement requirements at transitions Huawei, HiSilicon imported from 3GU
R4‑1815145 CR on measurement requirements at transitions Huawei, HiSilicon imported from 3GU
R4‑1815146 CSSF for PRS periodicy=160ms in TS38.133 Huawei, HiSilicon imported from 3GU
R4‑1815146 CSSF for PRS periodicy=160ms in TS38.133 Huawei, HiSilicon imported from 3GU
R4‑1815146 CSSF for PRS periodicy=160ms in TS38.133 Huawei, HiSilicon imported from 3GU
R4‑1815147 Correction on inter-RAT measurement in TS 38.133 Huawei, HiSilicon imported from 3GU
R4‑1815147 Correction on inter-RAT measurement in TS 38.133 Huawei, HiSilicon imported from 3GU
R4‑1815147 Correction on inter-RAT measurement in TS 38.133 Huawei, HiSilicon imported from 3GU
R4‑1815148 Discussion on applicable DRX cycle in EN-DC Huawei, HiSilicon imported from 3GU
R4‑1815148 Discussion on applicable DRX cycle in EN-DC Huawei, HiSilicon imported from 3GU
R4‑1815148 Discussion on applicable DRX cycle in EN-DC Huawei, HiSilicon imported from 3GU
R4‑1815149 DraftCR on applicable DRX cycle in EN-DC Huawei, HiSilicon imported from 3GU
R4‑1815149 DraftCR on applicable DRX cycle in EN-DC Huawei, HiSilicon imported from 3GU
R4‑1815149 DraftCR on applicable DRX cycle in EN-DC Huawei, HiSilicon imported from 3GU
R4‑1815150 Discussion on the cell reselection measurement requirements in idle mode Huawei, HiSilicon imported from 3GU
R4‑1815150 Discussion on the cell reselection measurement requirements in idle mode Huawei, HiSilicon imported from 3GU
R4‑1815150 Discussion on the cell reselection measurement requirements in idle mode Huawei, HiSilicon imported from 3GU
R4‑1815151 CR on cell reselection requirements in idle mode in TS 38.133 Huawei, HiSilicon imported from 3GU
R4‑1815151 CR on cell reselection requirements in idle mode in TS 38.133 Huawei, HiSilicon imported from 3GU
R4‑1815151 CR on cell reselection requirements in idle mode in TS 38.133 Huawei, HiSilicon imported from 3GU
R4‑1815152 Discussion on Trs definition Huawei, HiSilicon imported from 3GU
R4‑1815152 Discussion on Trs definition Huawei, HiSilicon imported from 3GU
R4‑1815152 Discussion on Trs definition Huawei, HiSilicon imported from 3GU
R4‑1815153 Correction on Trs in handover requirements Huawei, HiSilicon imported from 3GU
R4‑1815153 Correction on Trs in handover requirements Huawei, HiSilicon imported from 3GU
R4‑1815153 Correction on Trs in handover requirements Huawei, HiSilicon imported from 3GU
R4‑1815154 CR on PSCell addition delay in TS36.133 Huawei, HiSilicon imported from 3GU
R4‑1815154 CR on PSCell addition delay in TS36.133 Huawei, HiSilicon imported from 3GU
R4‑1815154 CR on PSCell addition delay in TS36.133 Huawei, HiSilicon imported from 3GU
R4‑1815155 Applicability for single CC BWP switching delay tests Huawei, HiSilicon imported from 3GU
R4‑1815155 Applicability for single CC BWP switching delay tests Huawei, HiSilicon imported from 3GU
R4‑1815155 Applicability for single CC BWP switching delay tests Huawei, HiSilicon imported from 3GU
R4‑1815156 Maintenance CR for SUL test cases Huawei, HiSilicon imported from 3GU
R4‑1815156 Maintenance CR for SUL test cases Huawei, HiSilicon imported from 3GU
R4‑1815156 Maintenance CR for SUL test cases Huawei, HiSilicon imported from 3GU
R4‑1815157 Test case for EN-DC UE UL carrier RRC reconfiguration Delay (section A.4.5.4) Huawei, HiSilicon imported from 3GU
R4‑1815157 Test case for EN-DC UE UL carrier RRC reconfiguration Delay (section A.4.5.4) Huawei, HiSilicon imported from 3GU
R4‑1815157 Test case for EN-DC UE UL carrier RRC reconfiguration Delay (section A.4.5.4) Huawei, HiSilicon imported from 3GU
R4‑1815158 Test case for NR standalone UE UL carrier RRC reconfiguration Delay (section A.6.5.4) Huawei, HiSilicon imported from 3GU
R4‑1815158 Test case for NR standalone UE UL carrier RRC reconfiguration Delay (section A.6.5.4) Huawei, HiSilicon imported from 3GU
R4‑1815158 Test case for NR standalone UE UL carrier RRC reconfiguration Delay (section A.6.5.4) Huawei, HiSilicon imported from 3GU
R4‑1815159 Discussion on LS on the interruption time during mobility in LTE Huawei, HiSilicon imported from 3GU
R4‑1815159 Discussion on LS on the interruption time during mobility in LTE Huawei, HiSilicon imported from 3GU
R4‑1815159 Discussion on LS on the interruption time during mobility in LTE Huawei, HiSilicon imported from 3GU
R4‑1815160 Reply LS on the interruption time during mobility in LTE Huawei, HiSilicon imported from 3GU
R4‑1815160 Reply LS on the interruption time during mobility in LTE Huawei, HiSilicon imported from 3GU
R4‑1815160 Reply LS on the interruption time during mobility in LTE Huawei, HiSilicon imported from 3GU
R4‑1815161 Defining MG starting point in 36.133 Huawei, HiSilicon imported from 3GU
R4‑1815161 Defining MG starting point in 36.133 Huawei, HiSilicon imported from 3GU
R4‑1815161 Defining MG starting point in 36.133 Huawei, HiSilicon imported from 3GU
R4‑1815162 UE UL transmission after MG (section 9.1.2) Huawei, HiSilicon imported from 3GU
R4‑1815162 UE UL transmission after MG (section 9.1.2) Huawei, HiSilicon imported from 3GU
R4‑1815162 UE UL transmission after MG (section 9.1.2) Huawei, HiSilicon imported from 3GU
R4‑1815163 Further discussion on UE behavior around MG Huawei, HiSilicon imported from 3GU
R4‑1815163 Further discussion on UE behavior around MG Huawei, HiSilicon imported from 3GU
R4‑1815163 Further discussion on UE behavior around MG Huawei, HiSilicon imported from 3GU
R4‑1815164 Introducing dual SMTC in measurement requriements (section 9.1.5, 9.2.5, 9.2.6) Huawei, HiSilicon imported from 3GU
R4‑1815164 Introducing dual SMTC in measurement requriements (section 9.1.5, 9.2.5, 9.2.6) Huawei, HiSilicon imported from 3GU
R4‑1815164 Introducing dual SMTC in measurement requriements (section 9.1.5, 9.2.5, 9.2.6) Huawei, HiSilicon imported from 3GU
R4‑1815165 Clarification of intra-frequency cell/SSB identification requirements (section 9.2.5.1, 9.2.6.2) Huawei, HiSilicon imported from 3GU
R4‑1815165 Clarification of intra-frequency cell/SSB identification requirements (section 9.2.5.1, 9.2.6.2) Huawei, HiSilicon imported from 3GU
R4‑1815165 Clarification of intra-frequency cell/SSB identification requirements (section 9.2.5.1, 9.2.6.2) Huawei, HiSilicon imported from 3GU
R4‑1815166 On identification delay for new SSB of an already detected cell Huawei, HiSilicon imported from 3GU
R4‑1815166 On identification delay for new SSB of an already detected cell Huawei, HiSilicon imported from 3GU
R4‑1815166 On identification delay for new SSB of an already detected cell Huawei, HiSilicon imported from 3GU
R4‑1815167 Clarification of inter-frequency cell/SSB identification requirements (section 9.3.4) Huawei, HiSilicon imported from 3GU
R4‑1815167 Clarification of inter-frequency cell/SSB identification requirements (section 9.3.4) Huawei, HiSilicon imported from 3GU
R4‑1815167 Clarification of inter-frequency cell/SSB identification requirements (section 9.3.4) Huawei, HiSilicon imported from 3GU
R4‑1815168 Discussion on remaining issues for inter-RAT RSTD measurement Huawei, HiSilicon imported from 3GU
R4‑1815168 Discussion on remaining issues for inter-RAT RSTD measurement Huawei, HiSilicon imported from 3GU
R4‑1815168 Discussion on remaining issues for inter-RAT RSTD measurement Huawei, HiSilicon imported from 3GU
R4‑1815169 Update to inter-RAT RSTD measurement requirements Huawei, HiSilicon imported from 3GU
R4‑1815169 Update to inter-RAT RSTD measurement requirements Huawei, HiSilicon imported from 3GU
R4‑1815169 Update to inter-RAT RSTD measurement requirements Huawei, HiSilicon imported from 3GU
R4‑1815170 Further discussion on RLM requirements Huawei, HiSilicon imported from 3GU
R4‑1815170 Further discussion on RLM requirements Huawei, HiSilicon imported from 3GU
R4‑1815170 Further discussion on RLM requirements Huawei, HiSilicon imported from 3GU
R4‑1815171 CR to RLM requriements (section 8.1.1-3) Huawei, HiSilicon imported from 3GU
R4‑1815171 CR to RLM requriements (section 8.1.1-3) Huawei, HiSilicon imported from 3GU
R4‑1815171 CR to RLM requriements (section 8.1.1-3) Huawei, HiSilicon imported from 3GU
R4‑1815172 CR to RLM scheduling restriction (section 8.1.7) Huawei, HiSilicon imported from 3GU
R4‑1815172 CR to RLM scheduling restriction (section 8.1.7) Huawei, HiSilicon imported from 3GU
R4‑1815172 CR to RLM scheduling restriction (section 8.1.7) Huawei, HiSilicon imported from 3GU
R4‑1815173 CR for remaining issues in SCell activation and deactivation (section 8.3) Huawei, HiSilicon imported from 3GU
R4‑1815173 CR for remaining issues in SCell activation and deactivation (section 8.3) Huawei, HiSilicon imported from 3GU
R4‑1815173 CR for remaining issues in SCell activation and deactivation (section 8.3) Huawei, HiSilicon imported from 3GU
R4‑1815174 Further discussion on BFD requirements Huawei, HiSilicon imported from 3GU
R4‑1815174 Further discussion on BFD requirements Huawei, HiSilicon imported from 3GU
R4‑1815174 Further discussion on BFD requirements Huawei, HiSilicon imported from 3GU
R4‑1815175 CR to BFD requriements (section 8.5.2, 8.5.3) Huawei, HiSilicon imported from 3GU
R4‑1815175 CR to BFD requriements (section 8.5.2, 8.5.3) Huawei, HiSilicon imported from 3GU
R4‑1815175 CR to BFD requriements (section 8.5.2, 8.5.3) Huawei, HiSilicon imported from 3GU
R4‑1815176 CR to BFD scheduling restriction (section 8.5.7) Huawei, HiSilicon imported from 3GU
R4‑1815176 CR to BFD scheduling restriction (section 8.5.7) Huawei, HiSilicon imported from 3GU
R4‑1815176 CR to BFD scheduling restriction (section 8.5.7) Huawei, HiSilicon imported from 3GU
R4‑1815177 On requirements for L1-RSRP measurement for beam reporting Huawei, HiSilicon imported from 3GU
R4‑1815177 On requirements for L1-RSRP measurement for beam reporting Huawei, HiSilicon imported from 3GU
R4‑1815177 On requirements for L1-RSRP measurement for beam reporting Huawei, HiSilicon imported from 3GU
R4‑1815178 CR for L1-RSRP measurement accuracy (section 10.1) Huawei, HiSilicon imported from 3GU
R4‑1815178 CR for L1-RSRP measurement accuracy (section 10.1) Huawei, HiSilicon imported from 3GU
R4‑1815178 CR for L1-RSRP measurement accuracy (section 10.1) Huawei, HiSilicon imported from 3GU
R4‑1815179 CR for L1-RSRP measurement accuracy (section 8.7 9.5) Huawei, HiSilicon imported from 3GU
R4‑1815179 CR for L1-RSRP measurement accuracy (section 8.7 9.5) Huawei, HiSilicon imported from 3GU
R4‑1815179 CR for L1-RSRP measurement accuracy (section 8.7 9.5) Huawei, HiSilicon imported from 3GU
R4‑1815180 CR to L1-RSRP scheduling restriction (section 9.5) Huawei, HiSilicon imported from 3GU
R4‑1815180 CR to L1-RSRP scheduling restriction (section 9.5) Huawei, HiSilicon imported from 3GU
R4‑1815180 CR to L1-RSRP scheduling restriction (section 9.5) Huawei, HiSilicon imported from 3GU
R4‑1815181 [draft] LS on maximum periodicity for L1-RSRP reporting Huawei, HiSilicon imported from 3GU
R4‑1815181 [draft] LS on maximum periodicity for L1-RSRP reporting Huawei, HiSilicon imported from 3GU
R4‑1815181 [draft] LS on maximum periodicity for L1-RSRP reporting Huawei, HiSilicon imported from 3GU
R4‑1815182 Further discussion on FR2 RRM Huawei, HiSilicon imported from 3GU
R4‑1815182 Further discussion on FR2 RRM Huawei, HiSilicon imported from 3GU
R4‑1815182 Further discussion on FR2 RRM Huawei, HiSilicon imported from 3GU
R4‑1815183 Way forward on FR2 RRM test Huawei, HiSilicon imported from 3GU
R4‑1815183 Way forward on FR2 RRM test Huawei, HiSilicon imported from 3GU
R4‑1815183 Way forward on FR2 RRM test Huawei, HiSilicon imported from 3GU
R4‑1815184 Introduction of AoA configuration for FR2 RRM tests (section A.3.8) Huawei, HiSilicon imported from 3GU
R4‑1815184 Introduction of AoA configuration for FR2 RRM tests (section A.3.8) Huawei, HiSilicon imported from 3GU
R4‑1815184 Introduction of AoA configuration for FR2 RRM tests (section A.3.8) Huawei, HiSilicon imported from 3GU
R4‑1815185 Maintenace of TC for EN-DC FR1 inter-f RSRP accuracy (section A.4.7.1) Huawei, HiSilicon imported from 3GU
R4‑1815185 Maintenace of TC for EN-DC FR1 inter-f RSRP accuracy (section A.4.7.1) Huawei, HiSilicon imported from 3GU
R4‑1815185 Maintenace of TC for EN-DC FR1 inter-f RSRP accuracy (section A.4.7.1) Huawei, HiSilicon imported from 3GU
R4‑1815186 Maintenace of TC for EN-DC FR2 inter-f RSRP accuracy (section A.5.7.1) Huawei, HiSilicon imported from 3GU
R4‑1815186 Maintenace of TC for EN-DC FR2 inter-f RSRP accuracy (section A.5.7.1) Huawei, HiSilicon imported from 3GU
R4‑1815186 Maintenace of TC for EN-DC FR2 inter-f RSRP accuracy (section A.5.7.1) Huawei, HiSilicon imported from 3GU
R4‑1815187 Maintenace of TC for SA FR1 inter-f RSRP accuracy (section A.6.7.1) Huawei, HiSilicon imported from 3GU
R4‑1815187 Maintenace of TC for SA FR1 inter-f RSRP accuracy (section A.6.7.1) Huawei, HiSilicon imported from 3GU
R4‑1815187 Maintenace of TC for SA FR1 inter-f RSRP accuracy (section A.6.7.1) Huawei, HiSilicon imported from 3GU
R4‑1815188 Maintenace of TC for SA FR2 inter-f RSRP accuracy (section A.7.7.1) Huawei, HiSilicon imported from 3GU
R4‑1815188 Maintenace of TC for SA FR2 inter-f RSRP accuracy (section A.7.7.1) Huawei, HiSilicon imported from 3GU
R4‑1815188 Maintenace of TC for SA FR2 inter-f RSRP accuracy (section A.7.7.1) Huawei, HiSilicon imported from 3GU
R4‑1815189 Discussion on test case design for L1-RSRP reporting Huawei, HiSilicon imported from 3GU
R4‑1815189 Discussion on test case design for L1-RSRP reporting Huawei, HiSilicon imported from 3GU
R4‑1815189 Discussion on test case design for L1-RSRP reporting Huawei, HiSilicon imported from 3GU
R4‑1815190 CR for adding CSI-RS configuration for L1-RSRP tests (A.3.1.4) Huawei, HiSilicon imported from 3GU
R4‑1815190 CR for adding CSI-RS configuration for L1-RSRP tests (A.3.1.4) Huawei, HiSilicon imported from 3GU
R4‑1815190 CR for adding CSI-RS configuration for L1-RSRP tests (A.3.1.4) Huawei, HiSilicon imported from 3GU
R4‑1815191 CR for adding SSB configuration for L1-RSRP tests (A.3.1.10) Huawei, HiSilicon imported from 3GU
R4‑1815191 CR for adding SSB configuration for L1-RSRP tests (A.3.1.10) Huawei, HiSilicon imported from 3GU
R4‑1815191 CR for adding SSB configuration for L1-RSRP tests (A.3.1.10) Huawei, HiSilicon imported from 3GU
R4‑1815192 TC for EN-DC CSI-RS based L1-RSRP measurement for FR1 (section A.4.7.4) Huawei, HiSilicon imported from 3GU
R4‑1815192 TC for EN-DC CSI-RS based L1-RSRP measurement for FR1 (section A.4.7.4) Huawei, HiSilicon imported from 3GU
R4‑1815192 TC for EN-DC CSI-RS based L1-RSRP measurement for FR1 (section A.4.7.4) Huawei, HiSilicon imported from 3GU
R4‑1815193 TC for EN-DC SSB based L1-RSRP measurement for FR1 (section A.4.7.4) Huawei, HiSilicon imported from 3GU
R4‑1815193 TC for EN-DC SSB based L1-RSRP measurement for FR1 (section A.4.7.4) Huawei, HiSilicon imported from 3GU
R4‑1815193 TC for EN-DC SSB based L1-RSRP measurement for FR1 (section A.4.7.4) Huawei, HiSilicon imported from 3GU
R4‑1815194 TC for EN-DC CSI-RS based L1-RSRP measurement for FR2 (section A.5.7.4) Huawei, HiSilicon imported from 3GU
R4‑1815194 TC for EN-DC CSI-RS based L1-RSRP measurement for FR2 (section A.5.7.4) Huawei, HiSilicon imported from 3GU
R4‑1815194 TC for EN-DC CSI-RS based L1-RSRP measurement for FR2 (section A.5.7.4) Huawei, HiSilicon imported from 3GU
R4‑1815195 TC for EN-DC SSB based L1-RSRP measurement for FR2 (section A.5.7.4) Huawei, HiSilicon imported from 3GU
R4‑1815195 TC for EN-DC SSB based L1-RSRP measurement for FR2 (section A.5.7.4) Huawei, HiSilicon imported from 3GU
R4‑1815195 TC for EN-DC SSB based L1-RSRP measurement for FR2 (section A.5.7.4) Huawei, HiSilicon imported from 3GU
R4‑1815196 TC for SA CSI-RS based L1-RSRP measurement for FR1 (section A.6.7.4) Huawei, HiSilicon imported from 3GU
R4‑1815196 TC for SA CSI-RS based L1-RSRP measurement for FR1 (section A.6.7.4) Huawei, HiSilicon imported from 3GU
R4‑1815196 TC for SA CSI-RS based L1-RSRP measurement for FR1 (section A.6.7.4) Huawei, HiSilicon imported from 3GU
R4‑1815197 TC for SA SSB based L1-RSRP measurement for FR1 (section A.6.7.4) Huawei, HiSilicon imported from 3GU
R4‑1815197 TC for SA SSB based L1-RSRP measurement for FR1 (section A.6.7.4) Huawei, HiSilicon imported from 3GU
R4‑1815197 TC for SA SSB based L1-RSRP measurement for FR1 (section A.6.7.4) Huawei, HiSilicon imported from 3GU
R4‑1815198 TC for SA CSI-RS based L1-RSRP measurement for FR2 (section A.7.7.4) Huawei, HiSilicon imported from 3GU
R4‑1815198 TC for SA CSI-RS based L1-RSRP measurement for FR2 (section A.7.7.4) Huawei, HiSilicon imported from 3GU
R4‑1815198 TC for SA CSI-RS based L1-RSRP measurement for FR2 (section A.7.7.4) Huawei, HiSilicon imported from 3GU
R4‑1815199 TC for SA SSB based L1-RSRP measurement for FR2 (section A.7.7.4) Huawei, HiSilicon imported from 3GU
R4‑1815199 TC for SA SSB based L1-RSRP measurement for FR2 (section A.7.7.4) Huawei, HiSilicon imported from 3GU
R4‑1815199 TC for SA SSB based L1-RSRP measurement for FR2 (section A.7.7.4) Huawei, HiSilicon imported from 3GU
R4‑1815200 Synchrnoization for NR TM Design Ericsson imported from 3GU
R4‑1815200 Synchrnoization for NR TM Design Ericsson imported from 3GU
R4‑1815200 Synchrnoization for NR TM Design Ericsson imported from 3GU
R4‑1815201 TP to TS 38.141-1: Section 4.9.2 2 NR FR1 Test Models Ericsson imported from 3GU
R4‑1815201 TP to TS 38.141-1: Section 4.9.2 2 NR FR1 Test Models Ericsson imported from 3GU
R4‑1815201 TP to TS 38.141-1: Section 4.9.2 2 NR FR1 Test Models Ericsson imported from 3GU
R4‑1815202 TP to TS 38.141-2: Section 4.9.2 2 NR FR2 Test Models Ericsson imported from 3GU
R4‑1815202 TP to TS 38.141-2: Section 4.9.2 2 NR FR2 Test Models Ericsson imported from 3GU
R4‑1815202 TP to TS 38.141-2: Section 4.9.2 2 NR FR2 Test Models Ericsson imported from 3GU
R4‑1815203 TP to TS 38.141-1: Editorial corrections to align naming Ericsson imported from 3GU
R4‑1815203 TP to TS 38.141-1: Editorial corrections to align naming Ericsson imported from 3GU
R4‑1815203 TP to TS 38.141-1: Editorial corrections to align naming Ericsson imported from 3GU
R4‑1815204 TP to TS 38.141-2: Editorial corrections to align naming Ericsson imported from 3GU
R4‑1815204 TP to TS 38.141-2: Editorial corrections to align naming Ericsson imported from 3GU
R4‑1815204 TP to TS 38.141-2: Editorial corrections to align naming Ericsson imported from 3GU
R4‑1815205 TP to TS 38.141-1: Section 4.9.2.3 Data content for PHY channels Ericsson imported from 3GU
R4‑1815205 TP to TS 38.141-1: Section 4.9.2.3 Data content for PHY channels Ericsson imported from 3GU
R4‑1815205 TP to TS 38.141-1: Section 4.9.2.3 Data content for PHY channels Ericsson imported from 3GU
R4‑1815206 TP to TS 38.141-2: Section 4.9.2.3 Data content for PHY channels Ericsson imported from 3GU
R4‑1815206 TP to TS 38.141-2: Section 4.9.2.3 Data content for PHY channels Ericsson imported from 3GU
R4‑1815206 TP to TS 38.141-2: Section 4.9.2.3 Data content for PHY channels Ericsson imported from 3GU
R4‑1815207 Correction to interband EN-DC OOBE emission requirements Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815207 Correction to interband EN-DC OOBE emission requirements Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815207 Correction to interband EN-DC OOBE emission requirements Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815208 on UL PRB to DL PRB center offset for TDD NB-IoT Huawei, HiSilicon imported from 3GU
R4‑1815208 on UL PRB to DL PRB center offset for TDD NB-IoT Huawei, HiSilicon imported from 3GU
R4‑1815208 on UL PRB to DL PRB center offset for TDD NB-IoT Huawei, HiSilicon imported from 3GU
R4‑1815209 Peak Current Consumption and MPR for NB-IoT Power Class 6 Huawei, HiSilicon imported from 3GU
R4‑1815209 Peak Current Consumption and MPR for NB-IoT Power Class 6 Huawei, HiSilicon imported from 3GU
R4‑1815209 Peak Current Consumption and MPR for NB-IoT Power Class 6 Huawei, HiSilicon imported from 3GU
R4‑1815210 TR 37.716-21-11 v0.2.0 Huawei, HiSilicon imported from 3GU
R4‑1815210 TR 37.716-21-11 v0.2.0 Huawei, HiSilicon imported from 3GU
R4‑1815210 TR 37.716-21-11 v0.2.0 Huawei, HiSilicon imported from 3GU
R4‑1815211 Revised WID: Dual Connectivity (EN-DC) of 2 bands LTE inter-band CA (2DL/1UL) and 1 NR band (1DL/1UL) Huawei, HiSilicon imported from 3GU
R4‑1815211 Revised WID: Dual Connectivity (EN-DC) of 2 bands LTE inter-band CA (2DL/1UL) and 1 NR band (1DL/1UL) Huawei, HiSilicon imported from 3GU
R4‑1815211 Revised WID: Dual Connectivity (EN-DC) of 2 bands LTE inter-band CA (2DL/1UL) and 1 NR band (1DL/1UL) Huawei, HiSilicon imported from 3GU
R4‑1815212 Introduction of completed EN-DC of 2 bands LTE and 1 band NR into Rel-16 TS 38.101-3 Huawei, HiSilicon imported from 3GU
R4‑1815212 Introduction of completed EN-DC of 2 bands LTE and 1 band NR into Rel-16 TS 38.101-3 Huawei, HiSilicon imported from 3GU
R4‑1815212 Introduction of completed EN-DC of 2 bands LTE and 1 band NR into Rel-16 TS 38.101-3 Huawei, HiSilicon imported from 3GU
R4‑1815213 Discussion on new UE RF architecture capability for intra-band EN-DC and intra-band NR UL CA CHTTL imported from 3GU
R4‑1815213 Discussion on new UE RF architecture capability for intra-band EN-DC and intra-band NR UL CA CHTTL imported from 3GU
R4‑1815213 Discussion on new UE RF architecture capability for intra-band EN-DC and intra-band NR UL CA CHTTL imported from 3GU
R4‑1815214 draft LS on new UE capability for intra-band EN-DC and intra-band NR UL CA CHTTL imported from 3GU
R4‑1815214 draft LS on new UE capability for intra-band EN-DC and intra-band NR UL CA CHTTL imported from 3GU
R4‑1815214 draft LS on new UE capability for intra-band EN-DC and intra-band NR UL CA CHTTL imported from 3GU
R4‑1815215 TP to TR38.819: Background Dish Network, HNS imported from 3GU
R4‑1815215 TP to TR38.819: Background Dish Network, HNS imported from 3GU
R4‑1815215 TP to TR38.819: Background Dish Network, HNS imported from 3GU
R4‑1815216 TP to TR38.819: Adjacents bands Dish Network, HNS imported from 3GU
R4‑1815216 TP to TR38.819: Adjacents bands Dish Network, HNS imported from 3GU
R4‑1815216 TP to TR38.819: Adjacents bands Dish Network, HNS imported from 3GU
R4‑1815217 TP to TR38.819: List of band specific issues Dish Network, HNS imported from 3GU
R4‑1815217 TP to TR38.819: List of band specific issues Dish Network, HNS imported from 3GU
R4‑1815217 TP to TR38.819: List of band specific issues Dish Network, HNS imported from 3GU
R4‑1815218 CA_n70A-n71A requirements Dish Network imported from 3GU
R4‑1815218 CA_n70A-n71A requirements Dish Network imported from 3GU
R4‑1815218 CA_n70A-n71A requirements Dish Network imported from 3GU
R4‑1815219 TP to TR38.819: UE aspect issues Dish Network, HNS imported from 3GU
R4‑1815219 TP to TR38.819: UE aspect issues Dish Network, HNS imported from 3GU
R4‑1815219 TP to TR38.819: UE aspect issues Dish Network, HNS imported from 3GU
R4‑1815220 Summary of simulation results for sTTI UE demodulation requirements Ericsson imported from 3GU
R4‑1815220 Summary of simulation results for sTTI UE demodulation requirements Ericsson imported from 3GU
R4‑1815220 Summary of simulation results for sTTI UE demodulation requirements Ericsson imported from 3GU
R4‑1815221 Introduction of Slot/Subslot-PDSCH demodulation requirements Ericsson imported from 3GU
R4‑1815221 Introduction of Slot/Subslot-PDSCH demodulation requirements Ericsson imported from 3GU
R4‑1815221 Introduction of Slot/Subslot-PDSCH demodulation requirements Ericsson imported from 3GU
R4‑1815222 Open issues for SPDCCH demodulation requirements Ericsson imported from 3GU
R4‑1815222 Open issues for SPDCCH demodulation requirements Ericsson imported from 3GU
R4‑1815222 Open issues for SPDCCH demodulation requirements Ericsson imported from 3GU
R4‑1815223 Introduction of SPDCCH demodulation requirements Ericsson imported from 3GU
R4‑1815223 Introduction of SPDCCH demodulation requirements Ericsson imported from 3GU
R4‑1815223 Introduction of SPDCCH demodulation requirements Ericsson imported from 3GU
R4‑1815224 sTTI CQI reporting tests Ericsson imported from 3GU
R4‑1815224 sTTI CQI reporting tests Ericsson imported from 3GU
R4‑1815224 sTTI CQI reporting tests Ericsson imported from 3GU
R4‑1815225 Introduction of CQI tests for sTTI Ericsson imported from 3GU
R4‑1815225 Introduction of CQI tests for sTTI Ericsson imported from 3GU
R4‑1815225 Introduction of CQI tests for sTTI Ericsson imported from 3GU
R4‑1815226 Introduction of SPUCCH demodulation requirements Ericsson imported from 3GU
R4‑1815226 Introduction of SPUCCH demodulation requirements Ericsson imported from 3GU
R4‑1815226 Introduction of SPUCCH demodulation requirements Ericsson imported from 3GU
R4‑1815227 Simulation results of UE demodulation requirements for eFeMTC Ericsson imported from 3GU
R4‑1815227 Simulation results of UE demodulation requirements for eFeMTC Ericsson imported from 3GU
R4‑1815227 Simulation results of UE demodulation requirements for eFeMTC Ericsson imported from 3GU
R4‑1815228 Open issues for eFeMTC UE demodulation requirements Ericsson imported from 3GU
R4‑1815228 Open issues for eFeMTC UE demodulation requirements Ericsson imported from 3GU
R4‑1815228 Open issues for eFeMTC UE demodulation requirements Ericsson imported from 3GU
R4‑1815229 Introduction of UE demodulation requirements for eFeMTC Ericsson imported from 3GU
R4‑1815229 Introduction of UE demodulation requirements for eFeMTC Ericsson imported from 3GU
R4‑1815229 Introduction of UE demodulation requirements for eFeMTC Ericsson imported from 3GU
R4‑1815230 CQI requirements for eFeMTC Ericsson imported from 3GU
R4‑1815230 CQI requirements for eFeMTC Ericsson imported from 3GU
R4‑1815230 CQI requirements for eFeMTC Ericsson imported from 3GU
R4‑1815231 Introduction of CQI reporting requirements for eFeMTC Ericsson imported from 3GU
R4‑1815231 Introduction of CQI reporting requirements for eFeMTC Ericsson imported from 3GU
R4‑1815231 Introduction of CQI reporting requirements for eFeMTC Ericsson imported from 3GU
R4‑1815232 Summary of simulation results for eFeMTC BS demodulation requirements Ericsson imported from 3GU
R4‑1815232 Summary of simulation results for eFeMTC BS demodulation requirements Ericsson imported from 3GU
R4‑1815232 Summary of simulation results for eFeMTC BS demodulation requirements Ericsson imported from 3GU
R4‑1815233 Simulation result of BS demodulation requirements for eFeMTC Ericsson, Sierra Wireless imported from 3GU
R4‑1815233 Simulation result of BS demodulation requirements for eFeMTC Ericsson, Sierra Wireless imported from 3GU
R4‑1815233 Simulation result of BS demodulation requirements for eFeMTC Ericsson, Sierra Wireless imported from 3GU
R4‑1815234 Introduction of BS demodulation requirements for eFeMTC (TS36.104) Ericsson imported from 3GU
R4‑1815234 Introduction of BS demodulation requirements for eFeMTC (TS36.104) Ericsson imported from 3GU
R4‑1815234 Introduction of BS demodulation requirements for eFeMTC (TS36.104) Ericsson imported from 3GU
R4‑1815235 Introduction of BS demodulation requirements for eFeMTC (TS36.141) Ericsson imported from 3GU
R4‑1815235 Introduction of BS demodulation requirements for eFeMTC (TS36.141) Ericsson imported from 3GU
R4‑1815235 Introduction of BS demodulation requirements for eFeMTC (TS36.141) Ericsson imported from 3GU
R4‑1815236 Test case for MSG3-based channel quality report Ericsson imported from 3GU
R4‑1815236 Test case for MSG3-based channel quality report Ericsson imported from 3GU
R4‑1815236 Test case for MSG3-based channel quality report Ericsson imported from 3GU
R4‑1815237 Introduction of MSG3-based channel quality reporting test Ericsson imported from 3GU
R4‑1815237 Introduction of MSG3-based channel quality reporting test Ericsson imported from 3GU
R4‑1815237 Introduction of MSG3-based channel quality reporting test Ericsson imported from 3GU
R4‑1815238 Introduction of MSG3-based channel quality reporting test Ericsson imported from 3GU
R4‑1815238 Introduction of MSG3-based channel quality reporting test Ericsson imported from 3GU
R4‑1815238 Introduction of MSG3-based channel quality reporting test Ericsson imported from 3GU
R4‑1815239 Simulation results of PDSCH demodulation for 1024QAM Ericsson imported from 3GU
R4‑1815239 Simulation results of PDSCH demodulation for 1024QAM Ericsson imported from 3GU
R4‑1815239 Simulation results of PDSCH demodulation for 1024QAM Ericsson imported from 3GU
R4‑1815240 Simulation results of NR PBCH demodulation Ericsson imported from 3GU
R4‑1815240 Simulation results of NR PBCH demodulation Ericsson imported from 3GU
R4‑1815240 Simulation results of NR PBCH demodulation Ericsson imported from 3GU
R4‑1815241 TP to TS 38.101-4: 5.4 FR1 PBCH demodulation requirements Ericsson imported from 3GU
R4‑1815241 TP to TS 38.101-4: 5.4 FR1 PBCH demodulation requirements Ericsson imported from 3GU
R4‑1815241 TP to TS 38.101-4: 5.4 FR1 PBCH demodulation requirements Ericsson imported from 3GU
R4‑1815242 TP to TS 38.101-4: 7.4 FR1 PBCH demodulation requirements Ericsson imported from 3GU
R4‑1815242 TP to TS 38.101-4: 7.4 FR1 PBCH demodulation requirements Ericsson imported from 3GU
R4‑1815242 TP to TS 38.101-4: 7.4 FR1 PBCH demodulation requirements Ericsson imported from 3GU
R4‑1815243 TDD configuration for UE RF Tx requirements RMC Ericsson imported from 3GU
R4‑1815243 TDD configuration for UE RF Tx requirements RMC Ericsson imported from 3GU
R4‑1815243 TDD configuration for UE RF Tx requirements RMC Ericsson imported from 3GU
R4‑1815244 TDD configuration for UE Tx test in FR1 Ericsson imported from 3GU
R4‑1815244 TDD configuration for UE Tx test in FR1 Ericsson imported from 3GU
R4‑1815244 TDD configuration for UE Tx test in FR1 Ericsson imported from 3GU
R4‑1815245 TDD configuration for UE Tx test in FR2 Ericsson imported from 3GU
R4‑1815245 TDD configuration for UE Tx test in FR2 Ericsson imported from 3GU
R4‑1815245 TDD configuration for UE Tx test in FR2 Ericsson imported from 3GU
R4‑1815246 LTE TDD configuration for UE Tx test in EN-DC Ericsson imported from 3GU
R4‑1815246 LTE TDD configuration for UE Tx test in EN-DC Ericsson imported from 3GU
R4‑1815246 LTE TDD configuration for UE Tx test in EN-DC Ericsson imported from 3GU
R4‑1815247 Measurement BW for CSI-RS based candidate beam detection Ericsson imported from 3GU
R4‑1815247 Measurement BW for CSI-RS based candidate beam detection Ericsson imported from 3GU
R4‑1815247 Measurement BW for CSI-RS based candidate beam detection Ericsson imported from 3GU
R4‑1815248 TDD configuration for RRM performance requirements Ericsson imported from 3GU
R4‑1815248 TDD configuration for RRM performance requirements Ericsson imported from 3GU
R4‑1815248 TDD configuration for RRM performance requirements Ericsson imported from 3GU
R4‑1815249 Introduction of TDD configuration for EN-DC RRM tests Ericsson imported from 3GU
R4‑1815249 Introduction of TDD configuration for EN-DC RRM tests Ericsson imported from 3GU
R4‑1815249 Introduction of TDD configuration for EN-DC RRM tests Ericsson imported from 3GU
R4‑1815250 TP to TR38.819: MSR specific issues Dish Network, HNS imported from 3GU
R4‑1815250 TP to TR38.819: MSR specific issues Dish Network, HNS imported from 3GU
R4‑1815250 TP to TR38.819: MSR specific issues Dish Network, HNS imported from 3GU
R4‑1815251 TP for TR38.716-02-00: Requirements for CA_n70A-n71A Dish Network imported from 3GU
R4‑1815251 TP for TR38.716-02-00: Requirements for CA_n70A-n71A Dish Network imported from 3GU
R4‑1815251 TP for TR38.716-02-00: Requirements for CA_n70A-n71A Dish Network imported from 3GU
R4‑1815252 TP to TR38.819: Channel numbering Dish Network, HNS imported from 3GU
R4‑1815252 TP to TR38.819: Channel numbering Dish Network, HNS imported from 3GU
R4‑1815252 TP to TR38.819: Channel numbering Dish Network, HNS imported from 3GU
R4‑1815253 n65 MPR/A-MPR addition to 38.101-1 Dish Network imported from 3GU
R4‑1815253 n65 MPR/A-MPR addition to 38.101-1 Dish Network imported from 3GU
R4‑1815253 n65 MPR/A-MPR addition to 38.101-1 Dish Network imported from 3GU
R4‑1815254 Intra-band CA UE RX requirements for <2700MHz Dish Network imported from 3GU
R4‑1815254 Intra-band CA UE RX requirements for <2700MHz Dish Network imported from 3GU
R4‑1815254 Intra-band CA UE RX requirements for <2700MHz Dish Network imported from 3GU
R4‑1815255 Draft CR to 37.141: Introduction of Band n65 Dish Network, HNS imported from 3GU
R4‑1815255 Draft CR to 37.141: Introduction of Band n65 Dish Network, HNS imported from 3GU
R4‑1815255 Draft CR to 37.141: Introduction of Band n65 Dish Network, HNS imported from 3GU
R4‑1815256 WP update for n65 WI Dish Network, HNS imported from 3GU
R4‑1815256 WP update for n65 WI Dish Network, HNS imported from 3GU
R4‑1815256 WP update for n65 WI Dish Network, HNS imported from 3GU
R4‑1815257 MPR for efeMTC Power class 5 sub-PRB transmission Sony imported from 3GU
R4‑1815257 MPR for efeMTC Power class 5 sub-PRB transmission Sony imported from 3GU
R4‑1815257 MPR for efeMTC Power class 5 sub-PRB transmission Sony imported from 3GU
R4‑1815258 Power class 5 UE Cat-M1 and Cat-M2 MPR specification Sony imported from 3GU
R4‑1815258 Power class 5 UE Cat-M1 and Cat-M2 MPR specification Sony imported from 3GU
R4‑1815258 Power class 5 UE Cat-M1 and Cat-M2 MPR specification Sony imported from 3GU
R4‑1815259 NR OTA performance test AWGN level settings description Keysight Technologies UK Ltd imported from 3GU
R4‑1815259 NR OTA performance test AWGN level settings description Keysight Technologies UK Ltd imported from 3GU
R4‑1815259 NR OTA performance test AWGN level settings description Keysight Technologies UK Ltd imported from 3GU
R4‑1815260 TP for TR 37.716-21-11: DC_2-7_n78 Huawei, HiSilicon imported from 3GU
R4‑1815260 TP for TR 37.716-21-11: DC_2-7_n78 Huawei, HiSilicon imported from 3GU
R4‑1815260 TP for TR 37.716-21-11: DC_2-7_n78 Huawei, HiSilicon imported from 3GU
R4‑1815261 TP for TR 37.716-21-11: DC_2-66_n78 Huawei, HiSilicon imported from 3GU
R4‑1815261 TP for TR 37.716-21-11: DC_2-66_n78 Huawei, HiSilicon imported from 3GU
R4‑1815261 TP for TR 37.716-21-11: DC_2-66_n78 Huawei, HiSilicon imported from 3GU
R4‑1815262 TP for TR 37.716-11-11: DC_5_n71 Huawei, HiSilicon imported from 3GU
R4‑1815262 TP for TR 37.716-11-11: DC_5_n71 Huawei, HiSilicon imported from 3GU
R4‑1815262 TP for TR 37.716-11-11: DC_5_n71 Huawei, HiSilicon imported from 3GU
R4‑1815263 TP for TR 37.716-11-11: DC_12_n71 Huawei, HiSilicon imported from 3GU
R4‑1815263 TP for TR 37.716-11-11: DC_12_n71 Huawei, HiSilicon imported from 3GU
R4‑1815263 TP for TR 37.716-11-11: DC_12_n71 Huawei, HiSilicon imported from 3GU
R4‑1815264 TP for TR 37.716-11-11: DC_8_n41 Huawei, HiSilicon imported from 3GU
R4‑1815264 TP for TR 37.716-11-11: DC_8_n41 Huawei, HiSilicon imported from 3GU
R4‑1815264 TP for TR 37.716-11-11: DC_8_n41 Huawei, HiSilicon imported from 3GU
R4‑1815265 CR MPR for NB-IoT PC6 rel-14 Huawei, HiSilicon imported from 3GU
R4‑1815265 CR MPR for NB-IoT PC6 rel-14 Huawei, HiSilicon imported from 3GU
R4‑1815265 CR MPR for NB-IoT PC6 rel-14 Huawei, HiSilicon imported from 3GU
R4‑1815266 CR MPR for NB-IoT PC6 Rel-15 Huawei, HiSilicon imported from 3GU
R4‑1815266 CR MPR for NB-IoT PC6 Rel-15 Huawei, HiSilicon imported from 3GU
R4‑1815266 CR MPR for NB-IoT PC6 Rel-15 Huawei, HiSilicon imported from 3GU
R4‑1815267 Receiver requirements for interband EN-DC Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815267 Receiver requirements for interband EN-DC Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815267 Receiver requirements for interband EN-DC Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815268 TP to TS 38.141-2 on General radiated receiver characteristics Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815268 TP to TS 38.141-2 on General radiated receiver characteristics Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815268 TP to TS 38.141-2 on General radiated receiver characteristics Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815269 TP to TS 38.141-2 on OTA demodulation branches Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815269 TP to TS 38.141-2 on OTA demodulation branches Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815269 TP to TS 38.141-2 on OTA demodulation branches Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815270 Views on NR PDSCH demodulation performance requirement MediaTek inc. imported from 3GU
R4‑1815270 Views on NR PDSCH demodulation performance requirement MediaTek inc. imported from 3GU
R4‑1815270 Views on NR PDSCH demodulation performance requirement MediaTek inc. imported from 3GU
R4‑1815271 NR PDSCH simulation result MediaTek inc. imported from 3GU
R4‑1815271 NR PDSCH simulation result MediaTek inc. imported from 3GU
R4‑1815271 NR PDSCH simulation result MediaTek inc. imported from 3GU
R4‑1815272 NR PDCCH simulation result MediaTek inc. imported from 3GU
R4‑1815272 NR PDCCH simulation result MediaTek inc. imported from 3GU
R4‑1815272 NR PDCCH simulation result MediaTek inc. imported from 3GU
R4‑1815273 NR PBCH simulation result MediaTek inc. imported from 3GU
R4‑1815273 NR PBCH simulation result MediaTek inc. imported from 3GU
R4‑1815273 NR PBCH simulation result MediaTek inc. imported from 3GU
R4‑1815274 NR CSI simulation result MediaTek inc. imported from 3GU
R4‑1815274 NR CSI simulation result MediaTek inc. imported from 3GU
R4‑1815274 NR CSI simulation result MediaTek inc. imported from 3GU
R4‑1815275 Discussion PCMAX for intra-band EN-DC MediaTek Inc. imported from 3GU
R4‑1815275 Discussion PCMAX for intra-band EN-DC MediaTek Inc. imported from 3GU
R4‑1815275 Discussion PCMAX for intra-band EN-DC MediaTek Inc. imported from 3GU
R4‑1815276 TS 38.141-1 v1.1.0 Huawei imported from 3GU
R4‑1815276 TS 38.141-1 v1.1.0 Huawei imported from 3GU
R4‑1815276 TS 38.141-1 v1.1.0 Huawei imported from 3GU
R4‑1815277 TS 38.141-2 v1.1.0 Huawei imported from 3GU
R4‑1815277 TS 38.141-2 v1.1.0 Huawei imported from 3GU
R4‑1815277 TS 38.141-2 v1.1.0 Huawei imported from 3GU
R4‑1815278 Discussion on annexes alignment among NR BS specifications Huawei, HiSilicon imported from 3GU
R4‑1815278 Discussion on annexes alignment among NR BS specifications Huawei, HiSilicon imported from 3GU
R4‑1815278 Discussion on annexes alignment among NR BS specifications Huawei, HiSilicon imported from 3GU
R4‑1815279 TP to TS 38.141-1: Remaining annexes Huawei, HiSilicon imported from 3GU
R4‑1815279 TP to TS 38.141-1: Remaining annexes Huawei, HiSilicon imported from 3GU
R4‑1815279 TP to TS 38.141-1: Remaining annexes Huawei, HiSilicon imported from 3GU
R4‑1815280 Further consideration on category B spurious emission Huawei, HiSilicon imported from 3GU
R4‑1815280 Further consideration on category B spurious emission Huawei, HiSilicon imported from 3GU
R4‑1815280 Further consideration on category B spurious emission Huawei, HiSilicon imported from 3GU
R4‑1815281 TP to TS 38.141-1: On Applicability of test configurations Huawei imported from 3GU
R4‑1815281 TP to TS 38.141-1: On Applicability of test configurations Huawei imported from 3GU
R4‑1815281 TP to TS 38.141-1: On Applicability of test configurations Huawei imported from 3GU
R4‑1815282 TP to TS 38.141-1: Cleanup Huawei imported from 3GU
R4‑1815282 TP to TS 38.141-1: Cleanup Huawei imported from 3GU
R4‑1815282 TP to TS 38.141-1: Cleanup Huawei imported from 3GU
R4‑1815283 TP to TS 38.141-2: Correction on OBUE requirements for MR and LA BS Huawei imported from 3GU
R4‑1815283 TP to TS 38.141-2: Correction on OBUE requirements for MR and LA BS Huawei imported from 3GU
R4‑1815283 TP to TS 38.141-2: Correction on OBUE requirements for MR and LA BS Huawei imported from 3GU
R4‑1815284 TP to TS 38.141-1: Corrections on additional spurious emissions requirements Huawei imported from 3GU
R4‑1815284 TP to TS 38.141-1: Corrections on additional spurious emissions requirements Huawei imported from 3GU
R4‑1815284 TP to TS 38.141-1: Corrections on additional spurious emissions requirements Huawei imported from 3GU
R4‑1815285 Corrections for test models and data content for FR1 and FR2 Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815285 Corrections for test models and data content for FR1 and FR2 Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815285 Corrections for test models and data content for FR1 and FR2 Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815286 TP to TS 38.141-1: 4.9.2.3 Data content of Physical channels and Signals for NR-FR1-TM Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815286 TP to TS 38.141-1: 4.9.2.3 Data content of Physical channels and Signals for NR-FR1-TM Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815286 TP to TS 38.141-1: 4.9.2.3 Data content of Physical channels and Signals for NR-FR1-TM Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815287 TP to TS 38.141-2: 4.9.2.3 Data content of Physical channels and Signals for NR-FR2-TM Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815287 TP to TS 38.141-2: 4.9.2.3 Data content of Physical channels and Signals for NR-FR2-TM Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815287 TP to TS 38.141-2: 4.9.2.3 Data content of Physical channels and Signals for NR-FR2-TM Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815288 TP to TS 38.141-1: 4.9.2 Test models Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815288 TP to TS 38.141-1: 4.9.2 Test models Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815288 TP to TS 38.141-1: 4.9.2 Test models Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815289 TP to TS 38.141-2: 4.9.2 Test models Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815289 TP to TS 38.141-2: 4.9.2 Test models Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815289 TP to TS 38.141-2: 4.9.2 Test models Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815290 TP to TS 38.141-1: Section 4.9.1: RF channels for conducted test applicability table Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815290 TP to TS 38.141-1: Section 4.9.1: RF channels for conducted test applicability table Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815290 TP to TS 38.141-1: Section 4.9.1: RF channels for conducted test applicability table Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815291 TP to TS 38.141-2: Section 4.9.1: RF channels for OTA tests applicability table Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815291 TP to TS 38.141-2: Section 4.9.1: RF channels for OTA tests applicability table Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815291 TP to TS 38.141-2: Section 4.9.1: RF channels for OTA tests applicability table Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815292 TP to 38.141-1: Section 6.6.5 – correction of RF channels for test Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815292 TP to 38.141-1: Section 6.6.5 – correction of RF channels for test Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815292 TP to 38.141-1: Section 6.6.5 – correction of RF channels for test Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815293 On the Wideband operation for NR-U Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815293 On the Wideband operation for NR-U Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815293 On the Wideband operation for NR-U Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815294 Draft LS reply on wideband carrier operation for NR-U Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815294 Draft LS reply on wideband carrier operation for NR-U Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815294 Draft LS reply on wideband carrier operation for NR-U Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815295 TP to 38.141-1: Correction to Section 7.1 Conducted receiver characteristics Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815295 TP to 38.141-1: Correction to Section 7.1 Conducted receiver characteristics Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815295 TP to 38.141-1: Correction to Section 7.1 Conducted receiver characteristics Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815296 UE behavior and network configuration with multiple SCS Huawei, HiSilicon imported from 3GU
R4‑1815296 UE behavior and network configuration with multiple SCS Huawei, HiSilicon imported from 3GU
R4‑1815296 UE behavior and network configuration with multiple SCS Huawei, HiSilicon imported from 3GU
R4‑1815297 TP for TS38.141-1 base conformation test models Huawei, HiSilicon imported from 3GU
R4‑1815297 TP for TS38.141-1 base conformation test models Huawei, HiSilicon imported from 3GU
R4‑1815297 TP for TS38.141-1 base conformation test models Huawei, HiSilicon imported from 3GU
R4‑1815298 TP for TS38.141-2 base conformation test models Huawei, HiSilicon imported from 3GU
R4‑1815298 TP for TS38.141-2 base conformation test models Huawei, HiSilicon imported from 3GU
R4‑1815298 TP for TS38.141-2 base conformation test models Huawei, HiSilicon imported from 3GU
R4‑1815299 Boosting patterns in test models in TS38.141-1 Huawei, HiSilicon imported from 3GU
R4‑1815299 Boosting patterns in test models in TS38.141-1 Huawei, HiSilicon imported from 3GU
R4‑1815299 Boosting patterns in test models in TS38.141-1 Huawei, HiSilicon imported from 3GU
R4‑1815300 Draft CR to 38.101-1 (5.3.4) RB alignment Huawei, HiSilicon imported from 3GU
R4‑1815300 Draft CR to 38.101-1 (5.3.4) RB alignment Huawei, HiSilicon imported from 3GU
R4‑1815300 Draft CR to 38.101-1 (5.3.4) RB alignment Huawei, HiSilicon imported from 3GU
R4‑1815301 Draft CR to 38.101-2 (5.3.4) RB alignment Huawei, HiSilicon imported from 3GU
R4‑1815301 Draft CR to 38.101-2 (5.3.4) RB alignment Huawei, HiSilicon imported from 3GU
R4‑1815301 Draft CR to 38.101-2 (5.3.4) RB alignment Huawei, HiSilicon imported from 3GU
R4‑1815302 PSDCH/PDCCH data content in test models in TS38.141-1 Huawei, HiSilicon imported from 3GU
R4‑1815302 PSDCH/PDCCH data content in test models in TS38.141-1 Huawei, HiSilicon imported from 3GU
R4‑1815302 PSDCH/PDCCH data content in test models in TS38.141-1 Huawei, HiSilicon imported from 3GU
R4‑1815303 PSDCH/PDCCH data content in test models in TS38.141-2 Huawei, HiSilicon imported from 3GU
R4‑1815303 PSDCH/PDCCH data content in test models in TS38.141-2 Huawei, HiSilicon imported from 3GU
R4‑1815303 PSDCH/PDCCH data content in test models in TS38.141-2 Huawei, HiSilicon imported from 3GU
R4‑1815304 TP to TS 38.141-2: Alignment of test procedure for OTA out-of-band blocking in sub-clause 7.6 Ericsson imported from 3GU
R4‑1815304 TP to TS 38.141-2: Alignment of test procedure for OTA out-of-band blocking in sub-clause 7.6 Ericsson imported from 3GU
R4‑1815304 TP to TS 38.141-2: Alignment of test procedure for OTA out-of-band blocking in sub-clause 7.6 Ericsson imported from 3GU
R4‑1815305 TP to TS 38.141-2: Improvement of test specification text with respect to directions for OTA out-of-band blocking in sub-clause 7.6 Ericsson imported from 3GU
R4‑1815305 TP to TS 38.141-2: Improvement of test specification text with respect to directions for OTA out-of-band blocking in sub-clause 7.6 Ericsson imported from 3GU
R4‑1815305 TP to TS 38.141-2: Improvement of test specification text with respect to directions for OTA out-of-band blocking in sub-clause 7.6 Ericsson imported from 3GU
R4‑1815306 TP to TS 38.141-2: Improvement of specification text related to injection of interferer power for OTA TX IMD in sub-clause 6.8 Ericsson imported from 3GU
R4‑1815306 TP to TS 38.141-2: Improvement of specification text related to injection of interferer power for OTA TX IMD in sub-clause 6.8 Ericsson imported from 3GU
R4‑1815306 TP to TS 38.141-2: Improvement of specification text related to injection of interferer power for OTA TX IMD in sub-clause 6.8 Ericsson imported from 3GU
R4‑1815307 CR to TR 37.843: Addition of polarization description in clause 2, clause 3 and sub-clause 4.7 Ericsson imported from 3GU
R4‑1815307 CR to TR 37.843: Addition of polarization description in clause 2, clause 3 and sub-clause 4.7 Ericsson imported from 3GU
R4‑1815307 CR to TR 37.843: Addition of polarization description in clause 2, clause 3 and sub-clause 4.7 Ericsson imported from 3GU
R4‑1815308 CR to TS 37.105: Improvement of polarization aspects for OTA out-of-band blocking in sub-clauses 10.6 Ericsson imported from 3GU
R4‑1815308 CR to TS 37.105: Improvement of polarization aspects for OTA out-of-band blocking in sub-clauses 10.6 Ericsson imported from 3GU
R4‑1815308 CR to TS 37.105: Improvement of polarization aspects for OTA out-of-band blocking in sub-clauses 10.6 Ericsson imported from 3GU
R4‑1815309 CR to TS 37.145-2: Improvement of description related to polarization for OTA out-of-band blocking in sub-clause 7.6 Ericsson imported from 3GU
R4‑1815309 CR to TS 37.145-2: Improvement of description related to polarization for OTA out-of-band blocking in sub-clause 7.6 Ericsson imported from 3GU
R4‑1815309 CR to TS 37.145-2: Improvement of description related to polarization for OTA out-of-band blocking in sub-clause 7.6 Ericsson imported from 3GU
R4‑1815310 Draft CR to TS 38.104: Improvement of polarization description for OTA out-of-band blockling in sub-clause 10.6 Ericsson imported from 3GU
R4‑1815310 Draft CR to TS 38.104: Improvement of polarization description for OTA out-of-band blockling in sub-clause 10.6 Ericsson imported from 3GU
R4‑1815310 Draft CR to TS 38.104: Improvement of polarization description for OTA out-of-band blockling in sub-clause 10.6 Ericsson imported from 3GU
R4‑1815311 TP to TS 38.141-2: Improvement of polarization description for OTA out-of-band blocking in sub-clause 7.6 Ericsson imported from 3GU
R4‑1815311 TP to TS 38.141-2: Improvement of polarization description for OTA out-of-band blocking in sub-clause 7.6 Ericsson imported from 3GU
R4‑1815311 TP to TS 38.141-2: Improvement of polarization description for OTA out-of-band blocking in sub-clause 7.6 Ericsson imported from 3GU
R4‑1815312 TP to TS 38.141-2: Improvement of polarization description text for in-band blocking in sub-clause 7.5.2 Ericsson imported from 3GU
R4‑1815312 TP to TS 38.141-2: Improvement of polarization description text for in-band blocking in sub-clause 7.5.2 Ericsson imported from 3GU
R4‑1815312 TP to TS 38.141-2: Improvement of polarization description text for in-band blocking in sub-clause 7.5.2 Ericsson imported from 3GU
R4‑1815313 TP to TS 38.141-2: Improvement of polarization description text for ACS in sub-clause 7.5.1 Ericsson imported from 3GU
R4‑1815313 TP to TS 38.141-2: Improvement of polarization description text for ACS in sub-clause 7.5.1 Ericsson imported from 3GU
R4‑1815313 TP to TS 38.141-2: Improvement of polarization description text for ACS in sub-clause 7.5.1 Ericsson imported from 3GU
R4‑1815314 TP to TS 38.141-2: Test distance for blocking interferer signal in sub-clause 7.6 Ericsson imported from 3GU
R4‑1815314 TP to TS 38.141-2: Test distance for blocking interferer signal in sub-clause 7.6 Ericsson imported from 3GU
R4‑1815314 TP to TS 38.141-2: Test distance for blocking interferer signal in sub-clause 7.6 Ericsson imported from 3GU
R4‑1815315 On test aspects for FR2 TDD OFF power and transient period Ericsson imported from 3GU
R4‑1815315 On test aspects for FR2 TDD OFF power and transient period Ericsson imported from 3GU
R4‑1815315 On test aspects for FR2 TDD OFF power and transient period Ericsson imported from 3GU
R4‑1815316 TP to TS 38.141-2: Improvement of test procedure for OTA TDD OFF power in sub-clause 6.5 Ericsson imported from 3GU
R4‑1815316 TP to TS 38.141-2: Improvement of test procedure for OTA TDD OFF power in sub-clause 6.5 Ericsson imported from 3GU
R4‑1815316 TP to TS 38.141-2: Improvement of test procedure for OTA TDD OFF power in sub-clause 6.5 Ericsson imported from 3GU
R4‑1815317 CR to TR 38.817-02: Addtion of FR2 extreme EIRP requirements in sub-clause 9.2 Ericsson imported from 3GU
R4‑1815317 CR to TR 38.817-02: Addtion of FR2 extreme EIRP requirements in sub-clause 9.2 Ericsson imported from 3GU
R4‑1815317 CR to TR 38.817-02: Addtion of FR2 extreme EIRP requirements in sub-clause 9.2 Ericsson imported from 3GU
R4‑1815318 TP to TS 38.141-2: Addition of calibration procedure for extreme temperature testing in Annex B.7 Ericsson imported from 3GU
R4‑1815318 TP to TS 38.141-2: Addition of calibration procedure for extreme temperature testing in Annex B.7 Ericsson imported from 3GU
R4‑1815318 TP to TS 38.141-2: Addition of calibration procedure for extreme temperature testing in Annex B.7 Ericsson imported from 3GU
R4‑1815319 CR to TR 38.817-02: Adding technical background FBW declaration of EIRP in sub-clause 9.2.1 Ericsson imported from 3GU
R4‑1815319 CR to TR 38.817-02: Adding technical background FBW declaration of EIRP in sub-clause 9.2.1 Ericsson imported from 3GU
R4‑1815319 CR to TR 38.817-02: Adding technical background FBW declaration of EIRP in sub-clause 9.2.1 Ericsson imported from 3GU
R4‑1815320 On improvements of EIRP declarations for wide operating Ericsson imported from 3GU
R4‑1815320 On improvements of EIRP declarations for wide operating Ericsson imported from 3GU
R4‑1815320 On improvements of EIRP declarations for wide operating Ericsson imported from 3GU
R4‑1815321 Draft CR to TS 38.104: Improvement of FBW EIRP declarations in sub-clause 9.2.1 Ericsson imported from 3GU
R4‑1815321 Draft CR to TS 38.104: Improvement of FBW EIRP declarations in sub-clause 9.2.1 Ericsson imported from 3GU
R4‑1815321 Draft CR to TS 38.104: Improvement of FBW EIRP declarations in sub-clause 9.2.1 Ericsson imported from 3GU
R4‑1815322 CR to 38.817-02: Extending background information forradiated transmit power in sub-clause 9.2.1 Ericsson imported from 3GU
R4‑1815322 CR to 38.817-02: Extending background information forradiated transmit power in sub-clause 9.2.1 Ericsson imported from 3GU
R4‑1815322 CR to 38.817-02: Extending background information forradiated transmit power in sub-clause 9.2.1 Ericsson imported from 3GU
R4‑1815323 On editorial clean-up of co-location general chamber in TR 37.843, clause 10 Ericsson imported from 3GU
R4‑1815323 On editorial clean-up of co-location general chamber in TR 37.843, clause 10 Ericsson imported from 3GU
R4‑1815323 On editorial clean-up of co-location general chamber in TR 37.843, clause 10 Ericsson imported from 3GU
R4‑1815324 CR to TR 37.843: Procedure for RC and framework for MU and MU table Ericsson imported from 3GU
R4‑1815324 CR to TR 37.843: Procedure for RC and framework for MU and MU table Ericsson imported from 3GU
R4‑1815324 CR to TR 37.843: Procedure for RC and framework for MU and MU table Ericsson imported from 3GU
R4‑1815325 On introduction of RC for TRP measurements Ericsson, RISE imported from 3GU
R4‑1815325 On introduction of RC for TRP measurements Ericsson, RISE imported from 3GU
R4‑1815325 On introduction of RC for TRP measurements Ericsson, RISE imported from 3GU
R4‑1815326 Reverberation chamber validation measurements Ericsson imported from 3GU
R4‑1815326 Reverberation chamber validation measurements Ericsson imported from 3GU
R4‑1815326 Reverberation chamber validation measurements Ericsson imported from 3GU
R4‑1815327 CR to 38.817-02: Addition of RC MU tables for unwanted emission Ericsson imported from 3GU
R4‑1815327 CR to 38.817-02: Addition of RC MU tables for unwanted emission Ericsson imported from 3GU
R4‑1815327 CR to 38.817-02: Addition of RC MU tables for unwanted emission Ericsson imported from 3GU
R4‑1815328 On FR2 extreme EIRP MU and description of error sources Ericsson imported from 3GU
R4‑1815328 On FR2 extreme EIRP MU and description of error sources Ericsson imported from 3GU
R4‑1815328 On FR2 extreme EIRP MU and description of error sources Ericsson imported from 3GU
R4‑1815329 Draft CR to TS 38.104: Correction to FBW definition in sub-clause 3.1 Ericsson imported from 3GU
R4‑1815329 Draft CR to TS 38.104: Correction to FBW definition in sub-clause 3.1 Ericsson imported from 3GU
R4‑1815329 Draft CR to TS 38.104: Correction to FBW definition in sub-clause 3.1 Ericsson imported from 3GU
R4‑1815330 TP to TS 38.141-2: Correction to FBW definition in sub-clause 3.1 Ericsson imported from 3GU
R4‑1815330 TP to TS 38.141-2: Correction to FBW definition in sub-clause 3.1 Ericsson imported from 3GU
R4‑1815330 TP to TS 38.141-2: Correction to FBW definition in sub-clause 3.1 Ericsson imported from 3GU
R4‑1815331 TP to TS: Declaration updates and corrections to TS 38.141-2 Ericsson imported from 3GU
R4‑1815331 TP to TS: Declaration updates and corrections to TS 38.141-2 Ericsson imported from 3GU
R4‑1815331 TP to TS: Declaration updates and corrections to TS 38.141-2 Ericsson imported from 3GU
R4‑1815332 Draft CR to TS 38.104: Improvement of FBW EIRP declarations in sub-clause 3.2 Ericsson imported from 3GU
R4‑1815332 Draft CR to TS 38.104: Improvement of FBW EIRP declarations in sub-clause 3.2 Ericsson imported from 3GU
R4‑1815332 Draft CR to TS 38.104: Improvement of FBW EIRP declarations in sub-clause 3.2 Ericsson imported from 3GU
R4‑1815333 Clarification on LAA channel access for multi-carrier operation and channel bonding supersets Charter Communications, Inc imported from 3GU
R4‑1815333 Clarification on LAA channel access for multi-carrier operation and channel bonding supersets Charter Communications, Inc imported from 3GU
R4‑1815333 Clarification on LAA channel access for multi-carrier operation and channel bonding supersets Charter Communications, Inc imported from 3GU
R4‑1815334 Implementing Constant Density Measurement Grids in an Optimal Way EMITE imported from 3GU
R4‑1815334 Implementing Constant Density Measurement Grids in an Optimal Way EMITE imported from 3GU
R4‑1815334 Implementing Constant Density Measurement Grids in an Optimal Way EMITE imported from 3GU
R4‑1815335 LS to Ran Plenary, RAN1, and RAN2 on LAA fair co-existence with Wi-Fi Charter Communications, Inc imported from 3GU
R4‑1815335 LS to Ran Plenary, RAN1, and RAN2 on LAA fair co-existence with Wi-Fi Charter Communications, Inc imported from 3GU
R4‑1815335 LS to Ran Plenary, RAN1, and RAN2 on LAA fair co-existence with Wi-Fi Charter Communications, Inc imported from 3GU
R4‑1815336 Pcmax computation and evaluation for inter band ENDC Qualcomm imported from 3GU
R4‑1815336 Pcmax computation and evaluation for inter band ENDC Qualcomm imported from 3GU
R4‑1815336 Pcmax computation and evaluation for inter band ENDC Qualcomm imported from 3GU
R4‑1815337 On how to obtain UE beam peak directions with Reverberation Chamber test method EMITE imported from 3GU
R4‑1815337 On how to obtain UE beam peak directions with Reverberation Chamber test method EMITE imported from 3GU
R4‑1815337 On how to obtain UE beam peak directions with Reverberation Chamber test method EMITE imported from 3GU
R4‑1815338 Transient period for SRS Antenna Switching for FR1 Qualcomm imported from 3GU
R4‑1815338 Transient period for SRS Antenna Switching for FR1 Qualcomm imported from 3GU
R4‑1815338 Transient period for SRS Antenna Switching for FR1 Qualcomm imported from 3GU
R4‑1815339 Revised WID: Rel16 LTE inter-band CA for 2 bands DL with 1 band UL Qualcomm Incorporated imported from 3GU
R4‑1815339 Revised WID: Rel16 LTE inter-band CA for 2 bands DL with 1 band UL Qualcomm Incorporated imported from 3GU
R4‑1815339 Revised WID: Rel16 LTE inter-band CA for 2 bands DL with 1 band UL Qualcomm Incorporated imported from 3GU
R4‑1815340 TR 36.716-02-01-020 Qualcomm Incorporated imported from 3GU
R4‑1815340 TR 36.716-02-01-020 Qualcomm Incorporated imported from 3GU
R4‑1815340 TR 36.716-02-01-020 Qualcomm Incorporated imported from 3GU
R4‑1815341 Introduction of Rel-16 LTE inter-band CA for 2 bands DL with 1 band UL combinations in TS36101 Qualcomm Incorporated imported from 3GU
R4‑1815341 Introduction of Rel-16 LTE inter-band CA for 2 bands DL with 1 band UL combinations in TS36101 Qualcomm Incorporated imported from 3GU
R4‑1815341 Introduction of Rel-16 LTE inter-band CA for 2 bands DL with 1 band UL combinations in TS36101 Qualcomm Incorporated imported from 3GU
R4‑1815342 CR on introduction of 6CCs and 7CCs LAA CA demodulation performance requirements Qualcomm Incorporated imported from 3GU
R4‑1815342 CR on introduction of 6CCs and 7CCs LAA CA demodulation performance requirements Qualcomm Incorporated imported from 3GU
R4‑1815342 CR on introduction of 6CCs and 7CCs LAA CA demodulation performance requirements Qualcomm Incorporated imported from 3GU
R4‑1815343 Noc level definition and SNR range for RF2 RRM testing Qualcomm Incorporated imported from 3GU
R4‑1815343 Noc level definition and SNR range for RF2 RRM testing Qualcomm Incorporated imported from 3GU
R4‑1815343 Noc level definition and SNR range for RF2 RRM testing Qualcomm Incorporated imported from 3GU
R4‑1815344 NBIOT B26 GB operation Qualcomm imported from 3GU
R4‑1815344 NBIOT B26 GB operation Qualcomm imported from 3GU
R4‑1815344 NBIOT B26 GB operation Qualcomm imported from 3GU
R4‑1815345 Transient period to include SRS antenna switching Qualcomm imported from 3GU
R4‑1815345 Transient period to include SRS antenna switching Qualcomm imported from 3GU
R4‑1815345 Transient period to include SRS antenna switching Qualcomm imported from 3GU
R4‑1815346 TP for TR 37.716-21-11: DC_7-66_n78 Huawei, HiSilicon imported from 3GU
R4‑1815346 TP for TR 37.716-21-11: DC_7-66_n78 Huawei, HiSilicon imported from 3GU
R4‑1815346 TP for TR 37.716-21-11: DC_7-66_n78 Huawei, HiSilicon imported from 3GU
R4‑1815347 CR for TS 36.104 Rel-13: Clarification on LAA channel access Charter Communications Inc, Broadcom, Cable Labs imported from 3GU
R4‑1815347 CR for TS 36.104 Rel-13: Clarification on LAA channel access Charter Communications Inc, Broadcom, Cable Labs imported from 3GU
R4‑1815347 CR for TS 36.104 Rel-13: Clarification on LAA channel access Charter Communications, Inc imported from 3GU
R4‑1815348 TP to TS 38.141-2: Radiated test requirements for CP-OFDM based PUSCH in FR1 Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815348 TP to TS 38.141-2: Radiated test requirements for CP-OFDM based PUSCH in FR1 Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815348 TP to TS 38.141-2: Radiated test requirements for CP-OFDM based PUSCH in FR1 Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815349 NR PUSCH simulation results Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815349 NR PUSCH simulation results Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815349 NR PUSCH simulation results Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815350 NR PUCCH simulation results Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815350 NR PUCCH simulation results Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815350 NR PUCCH simulation results Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815351 NR PRACH simulation results Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815351 NR PRACH simulation results Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815351 NR PRACH simulation results Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815352 CR for TS 36.104 Rel-14: Clarification on LAA and eLAA channel access Charter Communications Inc., Broadcom, Cable Labs imported from 3GU
R4‑1815352 CR for TS 36.104 Rel-14: Clarification on LAA and eLAA channel access Charter Communications Inc., Broadcom, Cable Labs imported from 3GU
R4‑1815352 CR for TS 36.104 Rel-14: Clarification on LAA and eLAA channel access Charter Communications, Inc imported from 3GU
R4‑1815353 CR for TS 36.104 Rel-15: Clarification on LAA and eLAA channel access Charter Communications Inc., Broadcom, Cable Labs imported from 3GU
R4‑1815353 CR for TS 36.104 Rel-15: Clarification on LAA and eLAA channel access Charter Communications Inc., Broadcom, Cable Labs imported from 3GU
R4‑1815353 CR for TS 36.104 Rel-15: Clarification on LAA and eLAA channel access Charter Communications, Inc imported from 3GU
R4‑1815354 TR for E-UTRA 2.4 GHz TDD Band for US Nokia, Globalstar imported from 3GU
R4‑1815354 TR for E-UTRA 2.4 GHz TDD Band for US^^ Nokia, Globalstar imported from 3GU
R4‑1815354 TR for E-UTRA 2.4 GHz TDD Band for US Nokia, Globalstar imported from 3GU
R4‑1815355 Proposed text for NR introduction TS 37.145-1 - Test Cases and Applicability Ericsson imported from 3GU
R4‑1815355 Proposed text for NR introduction TS 37.145-1 - Test Cases and Applicability Ericsson imported from 3GU
R4‑1815355 Proposed text for NR introduction TS 37.145-1 - Test Cases and Applicability Ericsson imported from 3GU
R4‑1815356 Proposed text for NR introduction TS 37.145-2 - Test Cases and Applicability Ericsson imported from 3GU
R4‑1815356 Proposed text for NR introduction TS 37.145-2 - Test Cases and Applicability Ericsson imported from 3GU
R4‑1815356 Proposed text for NR introduction TS 37.145-2 - Test Cases and Applicability Ericsson imported from 3GU
R4‑1815357 NB-IoT TDD and UL offset to DL (RAN1 LS request) Ericsson imported from 3GU
R4‑1815357 NB-IoT TDD and UL offset to DL (RAN1 LS request) Ericsson imported from 3GU
R4‑1815357 NB-IoT TDD and UL offset to DL (RAN1 LS request) Ericsson imported from 3GU
R4‑1815358 LS reply on UL PRB to DL PRB center offset for TDD NB-IoT Ericsson imported from 3GU
R4‑1815358 LS reply on UL PRB to DL PRB center offset for TDD NB-IoT Ericsson imported from 3GU
R4‑1815358 LS reply on UL PRB to DL PRB center offset for TDD NB-IoT Ericsson imported from 3GU
R4‑1815359 Remaining issues for PUCCH demodulation: metric for PUCCH format 2 Ericsson imported from 3GU
R4‑1815359 Remaining issues for PUCCH demodulation: metric for PUCCH format 2 Ericsson imported from 3GU
R4‑1815359 Remaining issues for PUCCH demodulation: metric for PUCCH format 2 Ericsson imported from 3GU
R4‑1815360 Simulation results on PUCCH demodulation Ericsson imported from 3GU
R4‑1815360 Simulation results on PUCCH demodulation Ericsson imported from 3GU
R4‑1815360 Simulation results on PUCCH demodulation Ericsson imported from 3GU
R4‑1815361 Simulation results on PRACH demodulation Ericsson imported from 3GU
R4‑1815361 Simulation results on PRACH demodulation Ericsson imported from 3GU
R4‑1815361 Simulation results on PRACH demodulation Ericsson imported from 3GU
R4‑1815362 Draft CR to TS 38.104: PUCCH format 0 requirement Ericsson imported from 3GU
R4‑1815362 Draft CR to TS 38.104: PUCCH format 0 requirement Ericsson imported from 3GU
R4‑1815362 Draft CR to TS 38.104: PUCCH format 0 requirement Ericsson imported from 3GU
R4‑1815363 TP to TS 38.141-1: PUCCH format 0 requirement testing Ericsson imported from 3GU
R4‑1815363 TP to TS 38.141-1: PUCCH format 0 requirement testing Ericsson imported from 3GU
R4‑1815363 TP to TS 38.141-1: PUCCH format 0 requirement testing Ericsson imported from 3GU
R4‑1815364 TP to TS 38.141-2: PUCCH format 0 requirement testing Ericsson imported from 3GU
R4‑1815364 TP to TS 38.141-2: PUCCH format 0 requirement testing Ericsson imported from 3GU
R4‑1815364 TP to TS 38.141-2: PUCCH format 0 requirement testing Ericsson imported from 3GU
R4‑1815365 BS demodulation - further considerations on applicability rules Ericsson imported from 3GU
R4‑1815365 BS demodulation - further considerations on applicability rules Ericsson imported from 3GU
R4‑1815365 BS demodulation - further considerations on applicability rules Ericsson imported from 3GU
R4‑1815366 Further agreements on NR PRACH demodulation Ericsson imported from 3GU
R4‑1815366 Further agreements on NR PRACH demodulation Ericsson imported from 3GU
R4‑1815366 Further agreements on NR PRACH demodulation Ericsson imported from 3GU
R4‑1815367 MSR test configurations for overlapping bands Ericsson imported from 3GU
R4‑1815367 MSR test configurations for overlapping bands Ericsson imported from 3GU
R4‑1815367 MSR test configurations for overlapping bands Ericsson imported from 3GU
R4‑1815368 Draft CR to TS 38.104: merging EVM annexes (B, C) Huawei imported from 3GU
R4‑1815368 Draft CR to TS 38.104: merging EVM annexes (B, C) Huawei imported from 3GU
R4‑1815368 Draft CR to TS 38.104: merging EVM annexes (B, C) Huawei imported from 3GU
R4‑1815369 Draft CR to TS 38.104: co-location with NR BS (6.6.5.2.4) Huawei imported from 3GU
R4‑1815369 Draft CR to TS 38.104: co-location with NR BS (6.6.5.2.4) Huawei imported from 3GU
R4‑1815369 Draft CR to TS 38.104: co-location with NR BS (6.6.5.2.4) Huawei imported from 3GU
R4‑1815370 TP to TS 38.141-2: remaining annexes Huawei imported from 3GU
R4‑1815370 TP to TS 38.141-2: remaining annexes Huawei imported from 3GU
R4‑1815370 TP to TS 38.141-2: remaining annexes Huawei imported from 3GU
R4‑1815371 TP to TS 38.141-1: additional spurious emissions requirement corrections for PHS and Band n41 (6.6.5.5.1.3) Huawei imported from 3GU
R4‑1815371 TP to TS 38.141-1: additional spurious emissions requirement corrections for PHS and Band n41 (6.6.5.5.1.3) Huawei imported from 3GU
R4‑1815371 TP to TS 38.141-1: additional spurious emissions requirement corrections for PHS and Band n41 (6.6.5.5.1.3) Huawei imported from 3GU
R4‑1815372 TP to TS 38.141-1: Interpretation of measurement results and the Shared Risk principle Huawei imported from 3GU
R4‑1815372 TP to TS 38.141-1: Interpretation of measurement results and the Shared Risk principle Huawei imported from 3GU
R4‑1815372 TP to TS 38.141-1: Interpretation of measurement results and the Shared Risk principle Huawei imported from 3GU
R4‑1815373 TP to TS 38.141-2: narrowest beam selection for OTA testing Huawei imported from 3GU
R4‑1815373 TP to TS 38.141-2: narrowest beam selection for OTA testing Huawei imported from 3GU
R4‑1815373 TP to TS 38.141-2: narrowest beam selection for OTA testing Huawei imported from 3GU
R4‑1815374 TP to TS 38.141-2: additional spurious emissions requirement corrections for PHS and Band n41 (6.7.5.4.5.1) Huawei imported from 3GU
R4‑1815374 TP to TS 38.141-2: additional spurious emissions requirement corrections for PHS and Band n41 (6.7.5.4.5.1) Huawei imported from 3GU
R4‑1815374 TP to TS 38.141-2: additional spurious emissions requirement corrections for PHS and Band n41 (6.7.5.4.5.1) Huawei imported from 3GU
R4‑1815375 TP to TS 38.141-2: Interpretation of measurement results and the Shared Risk principle Huawei imported from 3GU
R4‑1815375 TP to TS 38.141-2: Interpretation of measurement results and the Shared Risk principle Huawei imported from 3GU
R4‑1815375 TP to TS 38.141-2: Interpretation of measurement results and the Shared Risk principle Huawei imported from 3GU
R4‑1815376 CR to TS 37.113: introduction of the NR to MSR EMC specification Huawei imported from 3GU
R4‑1815376 CR to TS 37.113: introduction of the NR to MSR EMC specification Huawei imported from 3GU
R4‑1815376 CR to TS 37.113: introduction of the NR to MSR EMC specification Huawei imported from 3GU
R4‑1815377 CR to TS 37.113: update of the Voltage dips and interruptions requirement Huawei imported from 3GU
R4‑1815377 CR to TS 37.113: update of the Voltage dips and interruptions requirement Huawei imported from 3GU
R4‑1815377 CR to TS 37.113: update of the Voltage dips and interruptions requirement Huawei imported from 3GU
R4‑1815378 DraftCR to TS 38.104: cleanup for the performance requirements sections (8, 11) Huawei imported from 3GU
R4‑1815378 DraftCR to TS 38.104: cleanup for the performance requirements sections (8, 11) Huawei imported from 3GU
R4‑1815378 DraftCR to TS 38.104: cleanup for the performance requirements sections (8, 11) Huawei imported from 3GU
R4‑1815379 DraftCR to TS 38.104: clarification on the use of "RX antennas" for the OTA demodulation (11.1.1) Huawei imported from 3GU
R4‑1815379 DraftCR to TS 38.104: clarification on the use of "RX antennas" for the OTA demodulation (11.1.1) Huawei imported from 3GU
R4‑1815379 DraftCR to TS 38.104: clarification on the use of "RX antennas" for the OTA demodulation (11.1.1) Huawei imported from 3GU
R4‑1815380 DraftCR to TS 38.104: OTA demodulation branches (11.1.2) Huawei imported from 3GU
R4‑1815380 DraftCR to TS 38.104: OTA demodulation branches (11.1.2) Huawei imported from 3GU
R4‑1815380 DraftCR to TS 38.104: OTA demodulation branches (11.1.2) Huawei imported from 3GU
R4‑1815381 TP to 38.141-2: OTA demodulation alignment with TS38.104 (8.1) Huawei imported from 3GU
R4‑1815381 TP to 38.141-2: OTA demodulation alignment with TS38.104 (8.1) Huawei imported from 3GU
R4‑1815381 TP to 38.141-2: OTA demodulation alignment with TS38.104 (8.1) Huawei imported from 3GU
R4‑1815382 OTA demodulation testing scope for multiple demodulation branches Huawei imported from 3GU
R4‑1815382 OTA demodulation testing scope for multiple demodulation branches Huawei imported from 3GU
R4‑1815382 OTA demodulation testing scope for multiple demodulation branches Huawei imported from 3GU
R4‑1815383 CR to TS 37.114: additional inputs for introduction of NR to the AAS EMC specification Huawei imported from 3GU
R4‑1815383 CR to TS 37.114: additional inputs for introduction of NR to the AAS EMC specification Huawei imported from 3GU
R4‑1815383 CR to TS 37.114: additional inputs for introduction of NR to the AAS EMC specification Huawei imported from 3GU
R4‑1815384 CR to TS 37.114: RAT-specific AAS BS operation terminology corrections Huawei imported from 3GU
R4‑1815384 CR to TS 37.114: RAT-specific AAS BS operation terminology corrections Huawei imported from 3GU
R4‑1815384 CR to TS 37.114: RAT-specific AAS BS operation terminology corrections Huawei imported from 3GU
R4‑1815385 CR to TS 37.114: Consideration of the narrowband responses and communication link Huawei imported from 3GU
R4‑1815385 CR to TS 37.114: Consideration of the narrowband responses and communication link Huawei imported from 3GU
R4‑1815385 CR to TS 37.114: Consideration of the narrowband responses and communication link Huawei imported from 3GU
R4‑1815386 CR to TS 37.114: clarification on CSA and RCSA capability sets Huawei imported from 3GU
R4‑1815386 CR to TS 37.114: clarification on CSA and RCSA capability sets Huawei imported from 3GU
R4‑1815386 CR to TS 37.114: clarification on CSA and RCSA capability sets Huawei imported from 3GU
R4‑1815387 CR to TS 37.145-2: UTRA TDD removal Huawei imported from 3GU
R4‑1815387 CR to TS 37.145-2: UTRA TDD removal Huawei imported from 3GU
R4‑1815387 CR to TS 37.145-2: UTRA TDD removal Huawei imported from 3GU
R4‑1815388 CR to TS 37.145-2: fix for the EUTRA demodulation requirements Huawei imported from 3GU
R4‑1815388 CR to TS 37.145-2: fix for the EUTRA demodulation requirements Huawei imported from 3GU
R4‑1815388 CR to TS 37.145-2: fix for the EUTRA demodulation requirements Huawei imported from 3GU
R4‑1815389 CR to TS 37.105: Text alignment for the OTA demodulation branches Huawei imported from 3GU
R4‑1815389 CR to TS 37.105: Text alignment for the OTA demodulation branches Huawei imported from 3GU
R4‑1815389 CR to TS 37.105: Text alignment for the OTA demodulation branches Huawei imported from 3GU
R4‑1815390 Antenna Interface Function support Huawei imported from 3GU
R4‑1815390 Antenna Interface Function support Huawei imported from 3GU
R4‑1815390 Antenna Interface Function support Huawei imported from 3GU
R4‑1815391 Draft CR to 38.101-1: Update to UE co-existence requirements Rohde & Schwarz imported from 3GU
R4‑1815391 Draft CR to 38.101-1: Update to UE co-existence requirements Rohde & Schwarz imported from 3GU
R4‑1815391 Draft CR to 38.101-1: Update to UE co-existence requirements Rohde & Schwarz imported from 3GU
R4‑1815392 Draft CR to 38.101-1: Update to NS_04 requirements Rohde & Schwarz imported from 3GU
R4‑1815392 Draft CR to 38.101-1: Update to NS_04 requirements Rohde & Schwarz imported from 3GU
R4‑1815392 Draft CR to 38.101-1: Update to NS_04 requirements Rohde & Schwarz imported from 3GU
R4‑1815393 Discussion on Noc level for FR1 and SNR definition Rohde & Schwarz imported from 3GU
R4‑1815393 Discussion on Noc level for FR1 and SNR definition Rohde & Schwarz imported from 3GU
R4‑1815393 Discussion on Noc level for FR1 and SNR definition Rohde & Schwarz imported from 3GU
R4‑1815394 On Spherical Coverage Measurement Grids for NR FR2 Rohde & Schwarz imported from 3GU
R4‑1815394 On Spherical Coverage Measurement Grids for NR FR2 Rohde & Schwarz imported from 3GU
R4‑1815394 On Spherical Coverage Measurement Grids for NR FR2 Rohde & Schwarz imported from 3GU
R4‑1815395 Beam Peak and Spherical Coverage Procedure Rohde & Schwarz imported from 3GU
R4‑1815395 Beam Peak and Spherical Coverage Procedure Rohde & Schwarz imported from 3GU
R4‑1815395 Beam Peak and Spherical Coverage Procedure Rohde & Schwarz imported from 3GU
R4‑1815396 Addition of Beam Peak direction search and Spherical Coverage to 38.810 Rohde & Schwarz imported from 3GU
R4‑1815396 Addition of Beam Peak direction search and Spherical Coverage to 38.810 Rohde & Schwarz imported from 3GU
R4‑1815396 Addition of Beam Peak direction search and Spherical Coverage to 38.810 Rohde & Schwarz imported from 3GU
R4‑1815397 Methodology for MIMO OTA FR1 Rohde & Schwarz imported from 3GU
R4‑1815397 Methodology for MIMO OTA FR1 Rohde & Schwarz imported from 3GU
R4‑1815397 Methodology for MIMO OTA FR1 Rohde & Schwarz imported from 3GU
R4‑1815398 CR to 36.133: Introduction of Band 53 Nokia, Globalstar imported from 3GU
R4‑1815398 CR to 36.133: Introduction of Band 53 Nokia, Globalstar imported from 3GU
R4‑1815398 CR to 36.133: Introduction of Band 53 Nokia, Globalstar imported from 3GU
R4‑1815399 CR to 25.133: Introduction of Band 53 Nokia, Globalstar imported from 3GU
R4‑1815399 CR to 25.133: Introduction of Band 53 Nokia, Globalstar imported from 3GU
R4‑1815399 CR to 25.133: Introduction of Band 53 Nokia, Globalstar imported from 3GU
R4‑1815400 CR to 25.123: Introduction of Band 53 Nokia, Globalstar imported from 3GU
R4‑1815400 CR to 25.123: Introduction of Band 53 Nokia, Globalstar imported from 3GU
R4‑1815400 CR to 25.123: Introduction of Band 53 Nokia, Globalstar imported from 3GU
R4‑1815401 CR introducing out-of-sync RLM test for NB-IoT TDD in normal coverage with DRX Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815401 CR introducing out-of-sync RLM test for NB-IoT TDD in normal coverage with DRX Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815401 CR introducing out-of-sync RLM test for NB-IoT TDD in normal coverage with DRX Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815402 CR introducing out-of-sync RLM test for NB-IoT TDD in enhanced coverage with DRX Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815402 CR introducing out-of-sync RLM test for NB-IoT TDD in enhanced coverage with DRX Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815402 CR introducing out-of-sync RLM test for NB-IoT TDD in enhanced coverage with DRX Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815403 CR introducing in-sync RLM test for NB-IoT TDD in normal coverage with DRX Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815403 CR introducing in-sync RLM test for NB-IoT TDD in normal coverage with DRX Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815403 CR introducing in-sync RLM test for NB-IoT TDD in normal coverage with DRX Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815404 CR introducing in-sync RLM test for NB-IoT TDD in enhanced coverage with DRX Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815404 CR introducing in-sync RLM test for NB-IoT TDD in enhanced coverage with DRX Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815404 CR introducing in-sync RLM test for NB-IoT TDD in enhanced coverage with DRX Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815405 CR introducing in-sync RLM test for NB-IoT TDD in normal coverage without DRX Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815405 CR introducing in-sync RLM test for NB-IoT TDD in normal coverage without DRX Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815405 CR introducing in-sync RLM test for NB-IoT TDD in normal coverage without DRX Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815406 CR introducing in-sync RLM test for NB-IoT TDD in enhanced coverage without DRX Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815406 CR introducing in-sync RLM test for NB-IoT TDD in enhanced coverage without DRX Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815406 CR introducing in-sync RLM test for NB-IoT TDD in enhanced coverage without DRX Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815407 CR introducing Out-of-sync RLM test for NB-IoT TDD in normal coverage without DRX in stand alone mode Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815407 CR introducing Out-of-sync RLM test for NB-IoT TDD in normal coverage without DRX in stand alone mode Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815407 CR introducing Out-of-sync RLM test for NB-IoT TDD in normal coverage without DRX in stand alone mode Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815408 CR introducing Out-of-sync RLM test for NB-IoT TDD in enhanced coverage without DRX in guard band Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815408 CR introducing Out-of-sync RLM test for NB-IoT TDD in enhanced coverage without DRX in guard band Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815408 CR introducing Out-of-sync RLM test for NB-IoT TDD in enhanced coverage without DRX in guard band Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815409 euCA and known Dormant SCell condition Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815409 euCA and known Dormant SCell condition Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815409 euCA and known Dormant SCell condition Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815410 LS on UE behaviour for dormant SCell without PCell UL synchronization Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815410 LS on UE behaviour for dormant SCell without PCell UL synchronization Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815410 LS on UE behaviour for dormant SCell without PCell UL synchronization Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815411 UE known dormant SCell condition Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815411 UE known dormant SCell condition Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815411 UE known dormant SCell condition Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815412 Measurement accuracy requirements for CA IDLE mode measurements Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815412 Measurement accuracy requirements for CA IDLE mode measurements Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815412 Measurement accuracy requirements for CA IDLE mode measurements Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815413 Introduction of IDLE mode measurement accuracy requirements Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815413 Introduction of IDLE mode measurement accuracy requirements Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815413 Introduction of IDLE mode measurement accuracy requirements Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815414 CR introducing test case for enhanced utilization of CA and idle mode measurements for early reporting Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815414 CR introducing test case for enhanced utilization of CA and idle mode measurements for early reporting Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815414 CR introducing test case for enhanced utilization of CA and idle mode measurements for early reporting Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815415 euCA and direct SCell activation during handover Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815415 euCA and direct SCell activation during handover Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815415 euCA and direct SCell activation during handover Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815416 Introducing enhanced utilization of CA and direct activation in HO Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815416 Introducing enhanced utilization of CA and direct activation in HO Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815416 Introducing enhanced utilization of CA and direct activation in HO Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815417 CR for introducing CSI-RS-based RLM in EN-DC and SA (A.4.5. A.6.5. A.7.5) Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815417 CR for introducing CSI-RS-based RLM in EN-DC and SA Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815417 CR for introducing CSI-RS-based RLM in EN-DC and SA (A.4.5. A.6.5. A.7.5) Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815418 CR for introducing test cases for beam failure detection and link recovery procedure for SA with PCell in FR1 Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815418 CR for introducing test cases for beam failure detection and link recovery procedure for SA with PCell in FR1 Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815418 CR for introducing test cases for beam failure detection and link recovery procedure for SA with PCell in FR1 Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815419 CR for introducing test cases for beam failure detection and link recovery procedure for SA with PCell in FR2 Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815419 CR for introducing test cases for beam failure detection and link recovery procedure for SA with PCell in FR2 Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815419 CR for introducing test cases for beam failure detection and link recovery procedure for SA with PCell in FR2 Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815420 CR for introducing test cases for beam failure detection and link recovery procedure for EN-DC with PSCell in FR1 Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815420 CR for introducing test cases for beam failure detection and link recovery procedure for EN-DC with PSCell in FR1 Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815420 CR for introducing test cases for beam failure detection and link recovery procedure for EN-DC with PSCell in FR1 Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815421 CR for introducing test cases for beam failure detection and link recovery procedure for EN-DC with PSCell in FR2 Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815421 CR for introducing test cases for beam failure detection and link recovery procedure for EN-DC with PSCell in FR2 Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815421 CR for introducing test cases for beam failure detection and link recovery procedure for EN-DC with PSCell in FR2 Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815422 CR to section 9.2 NR intra-frequency measurements Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815422 CR to section 9.2 NR intra-frequency measurements Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815422 CR to section 9.2 NR intra-frequency measurements Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815423 CR to section 9.3 NR inter-frequency measurements Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815423 CR to section 9.3 NR inter-frequency measurements Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815423 CR to section 9.3 NR inter-frequency measurements Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815424 Clarification on IncMon when UE is configured with EN-DC Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815424 Clarification on IncMon when UE is configured with EN-DC Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815424 Clarification on IncMon when UE is configured with EN-DC Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815425 CR to Link Recovery Procedures section 8.5 Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815425 CR to Link Recovery Procedures section 8.5 Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815425 CR to Link Recovery Procedures section 8.5 Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815426 CR to Link Recovery Procedures section 8.5.4 Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815426 CR to Link Recovery Procedures section 8.5.4 Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815426 CR to Link Recovery Procedures section 8.5.4 Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815427 CR to Link Recovery Procedures section 8.5.5 and 8.5.6 Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815427 CR to Link Recovery Procedures section 8.5.5 and 8.5.6 Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815427 CR to Link Recovery Procedures section 8.5.5 and 8.5.6 Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815428 Simulation results for L1-RSRP accuracy measurements Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815428 Simulation results for L1-RSRP accuracy measurements Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815428 Simulation results for L1-RSRP accuracy measurements Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815429 CR for L1-RSRP measurement requirements Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815429 CR for L1-RSRP measurement requirements Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815429 CR for L1-RSRP measurement requirements Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815430 UE RRM measurements and averaging in FR2 Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815430 UE RRM measurements and averaging in FR2 Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815430 UE RRM measurements and averaging in FR2 Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815431 Draft CR on UE measurement averaging Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815431 Draft CR on UE measurement averaging Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815431 Draft CR on UE measurement averaging Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815432 Draft CR on UE spherical measurement coverage Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815432 Draft CR on UE spherical measurement coverage Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815432 Draft CR on UE spherical measurement coverage Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815433 NR Beam Failure Detection Discussion Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815433 NR Beam Failure Detection Discussion Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815433 NR Beam Failure Detection Discussion Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815434 NR Link Recovery Discussion Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815434 NR Link Recovery Discussion Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815434 NR Link Recovery Discussion Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815435 NR L1-RSRP measurements and Reporting Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815435 NR L1-RSRP measurements and Reporting Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815435 NR L1-RSRP measurements and Reporting Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815436 Cell re-selection delay correction for category M1/M2 UEs Ericsson imported from 3GU
R4‑1815436 Cell re-selection delay correction for category M1/M2 UEs Ericsson imported from 3GU
R4‑1815436 Cell re-selection delay correction for category M1/M2 UEs Ericsson imported from 3GU
R4‑1815437 RRC re-establishment delay correction for category M1/M2 UEs Ericsson imported from 3GU
R4‑1815437 RRC re-establishment delay correction for category M1/M2 UEs Ericsson imported from 3GU
R4‑1815437 RRC re-establishment delay correction for category M1/M2 UEs Ericsson imported from 3GU
R4‑1815438 Intra-frequency handover test case for UE category M1/M2 with enhanced SI reading Ericsson imported from 3GU
R4‑1815438 Intra-frequency handover test case for UE category M1/M2 with enhanced SI reading Ericsson imported from 3GU
R4‑1815438 Intra-frequency handover test case for UE category M1/M2 with enhanced SI reading Ericsson imported from 3GU
R4‑1815439 Inter-frequency handover test case for UE category M1/M2 with enhanced SI reading Ericsson imported from 3GU
R4‑1815439 Inter-frequency handover test case for UE category M1/M2 with enhanced SI reading Ericsson imported from 3GU
R4‑1815439 Inter-frequency handover test case for UE category M1/M2 with enhanced SI reading Ericsson imported from 3GU
R4‑1815440 Cell re-selection test case for TDD Intra frequency case for UE category NB1 in in-band mode in normal coverage Ericsson imported from 3GU
R4‑1815440 Cell re-selection test case for TDD Intra frequency case for UE category NB1 in in-band mode in normal coverage Ericsson imported from 3GU
R4‑1815440 Cell re-selection test case for TDD Intra frequency case for UE category NB1 in in-band mode in normal coverage Ericsson imported from 3GU
R4‑1815441 TDD Inter-frequency RRC Re-establishment for UE category NB1 in In-Band mode under normal coverage Ericsson imported from 3GU
R4‑1815441 TDD Inter-frequency RRC Re-establishment for UE category NB1 in In-Band mode under normal coverage Ericsson imported from 3GU
R4‑1815441 TDD Inter-frequency RRC Re-establishment for UE category NB1 in In-Band mode under normal coverage Ericsson imported from 3GU
R4‑1815442 UE Transmit Timing Accuracy Test for category NB1 UE In-Band in Normal coverage Ericsson imported from 3GU
R4‑1815442 UE Transmit Timing Accuracy Test for category NB1 UE In-Band in Normal coverage Ericsson imported from 3GU
R4‑1815442 UE Transmit Timing Accuracy Test for category NB1 UE In-Band in Normal coverage Ericsson imported from 3GU
R4‑1815443 Further discussions on WUS requirements for efeMTC Ericsson imported from 3GU
R4‑1815443 Further discussions on WUS requirements for efeMTC Ericsson imported from 3GU
R4‑1815443 Further discussions on WUS requirements for efeMTC Ericsson imported from 3GU
R4‑1815444 Updated simulation assumptions for Rel-15 MTC WUS Ericsson imported from 3GU
R4‑1815444 Updated simulation assumptions for Rel-15 MTC WUS Ericsson imported from 3GU
R4‑1815444 Updated simulation assumptions for Rel-15 MTC WUS Ericsson imported from 3GU
R4‑1815445 Further discussions on WUS requirements for Rel-15 NB-IoT Ericsson imported from 3GU
R4‑1815445 Further discussions on WUS requirements for Rel-15 NB-IoT Ericsson imported from 3GU
R4‑1815445 Further discussions on WUS requirements for Rel-15 NB-IoT Ericsson imported from 3GU
R4‑1815446 Updated simulation assumptions for Rel-15 NB-IoT WUS Ericsson imported from 3GU
R4‑1815446 Updated simulation assumptions for Rel-15 NB-IoT WUS Ericsson imported from 3GU
R4‑1815446 Updated simulation assumptions for Rel-15 NB-IoT WUS Ericsson imported from 3GU
R4‑1815447 UE Transmit Timing Accuracy Test for category NB1 UE In-Band in Enhanced coverage Ericsson imported from 3GU
R4‑1815447 UE Transmit Timing Accuracy Test for category NB1 UE In-Band in Enhanced coverage Ericsson imported from 3GU
R4‑1815447 UE Transmit Timing Accuracy Test for category NB1 UE In-Band in Enhanced coverage Ericsson imported from 3GU
R4‑1815448 UE Timing advance adjustment test Test for category NB1 UE standalone under Enhanced coverage Ericsson imported from 3GU
R4‑1815448 UE Timing advance adjustment test Test for category NB1 UE standalone under Enhanced coverage Ericsson imported from 3GU
R4‑1815448 UE Timing advance adjustment test Test for category NB1 UE standalone under Enhanced coverage Ericsson imported from 3GU
R4‑1815449 TDD Intra-frequency RRC Re-establishment for UE category NB1 in In-Band mode under enhanced coverage Ericsson imported from 3GU
R4‑1815449 TDD Intra-frequency RRC Re-establishment for UE category NB1 in In-Band mode under enhanced coverage Ericsson imported from 3GU
R4‑1815449 TDD Intra-frequency RRC Re-establishment for UE category NB1 in In-Band mode under enhanced coverage Ericsson imported from 3GU
R4‑1815450 Cell re-selection test case for TDD Inter- frequency case for UE category NB1 in in-band mode in enhanced coverage Ericsson imported from 3GU
R4‑1815450 Cell re-selection test case for TDD Inter- frequency case for UE category NB1 in in-band mode in enhanced coverage Ericsson imported from 3GU
R4‑1815450 Cell re-selection test case for TDD Inter- frequency case for UE category NB1 in in-band mode in enhanced coverage Ericsson imported from 3GU
R4‑1815451 Cell re-selection test case for TDD Intra frequency case for UE category NB1 in in-band mode in enhanced coverage Ericsson imported from 3GU
R4‑1815451 Cell re-selection test case for TDD Intra frequency case for UE category NB1 in in-band mode in enhanced coverage Ericsson imported from 3GU
R4‑1815451 Cell re-selection test case for TDD Intra frequency case for UE category NB1 in in-band mode in enhanced coverage Ericsson imported from 3GU
R4‑1815452 Introduction of NPRACH configuration for NB-IoT TDD Ericsson imported from 3GU
R4‑1815452 Introduction of NPRACH configuration for NB-IoT TDD Ericsson imported from 3GU
R4‑1815452 Introduction of NPRACH configuration for NB-IoT TDD Ericsson imported from 3GU
R4‑1815453 Discussions on RRM test case impact due to enhanced MIB/SIB1-BR delays access structures Ericsson imported from 3GU
R4‑1815453 Discussions on RRM test case impact due to enhanced MIB/SIB1-BR delays access structures Ericsson imported from 3GU
R4‑1815453 Discussions on RRM test case impact due to enhanced MIB/SIB1-BR delays access structures Ericsson imported from 3GU
R4‑1815454 efeMTC features applicability rule for non-BL CE UEs Ericsson imported from 3GU
R4‑1815454 efeMTC features applicability rule for non-BL CE UEs Ericsson imported from 3GU
R4‑1815454 efeMTC features applicability rule for non-BL CE UEs Ericsson imported from 3GU
R4‑1815455 Correction of references in CONNECTED mode requirements for category M1 Ericsson imported from 3GU
R4‑1815455 Correction of references in CONNECTED mode requirements for category M1 Ericsson imported from 3GU
R4‑1815455 Correction of references in CONNECTED mode requirements for category M1 Ericsson imported from 3GU
R4‑1815456 Correction of references in CONNECTED mode requirements for category M1 Ericsson imported from 3GU
R4‑1815456 Correction of references in CONNECTED mode requirements for category M1 Ericsson imported from 3GU
R4‑1815456 Correction of references in CONNECTED mode requirements for category M1 Ericsson imported from 3GU
R4‑1815457 Correction of references in CONNECTED mode requirements for category M1 Ericsson imported from 3GU
R4‑1815457 Correction of references in CONNECTED mode requirements for category M1 Ericsson imported from 3GU
R4‑1815457 Correction of references in CONNECTED mode requirements for category M1 Ericsson imported from 3GU
R4‑1815458 Draft reply LS to RAN on LS on LTE UE feature list Ericsson imported from 3GU
R4‑1815458 Draft reply LS to RAN on LS on LTE UE feature list Ericsson imported from 3GU
R4‑1815458 Draft reply LS to RAN on LS on LTE UE feature list Ericsson imported from 3GU
R4‑1815459 Introduction of enhanced PHR for category NB1 Ericsson imported from 3GU
R4‑1815459 Introduction of enhanced PHR for category NB1 Ericsson imported from 3GU
R4‑1815459 Introduction of enhanced PHR for category NB1 Ericsson imported from 3GU
R4‑1815460 Remaining work on minimum WUS reception requirements for NB-IoT Ericsson imported from 3GU
R4‑1815460 Remaining work on minimum WUS reception requirements for NB-IoT Ericsson imported from 3GU
R4‑1815460 Remaining work on minimum WUS reception requirements for NB-IoT Ericsson imported from 3GU
R4‑1815461 Introduction of WUS requirements for efeMTC Ericsson imported from 3GU
R4‑1815461 Introduction of WUS requirements for efeMTC Ericsson imported from 3GU
R4‑1815461 Introduction of WUS requirements for efeMTC Ericsson imported from 3GU
R4‑1815462 Clarification of high-velocity requirements for category M1 Ericsson imported from 3GU
R4‑1815462 Clarification of high-velocity requirements for category M1 Ericsson imported from 3GU
R4‑1815462 Clarification of high-velocity requirements for category M1 Ericsson imported from 3GU
R4‑1815463 Correction of terminology for non-BL CE UE for Rel-15 Ericsson imported from 3GU
R4‑1815463 Correction of terminology for non-BL CE UE for Rel-15 Ericsson imported from 3GU
R4‑1815463 Correction of terminology for non-BL CE UE for Rel-15 Ericsson imported from 3GU
R4‑1815464 Updated simulation results for WUS reception performance for NB-IoT Ericsson imported from 3GU
R4‑1815464 Updated simulation results for WUS reception performance for NB-IoT Ericsson imported from 3GU
R4‑1815464 Updated simulation results for WUS reception performance for NB-IoT Ericsson imported from 3GU
R4‑1815465 Method to distinguish vehicle NR UE with 2Rx Exception Vodafone Romania S.A. imported from 3GU
R4‑1815465 Method to distinguish vehicle NR UE with 2Rx Exception Vodafone Romania S.A. imported from 3GU
R4‑1815465 Method to distinguish vehicle NR UE with 2Rx Exception Vodafone Romania S.A. imported from 3GU
R4‑1815466 Addition of missing Band 71 in 36.133 NB-IoT bands Dish Network imported from 3GU
R4‑1815466 Addition of missing Band 71 in 36.133 NB-IoT bands Dish Network imported from 3GU
R4‑1815466 Addition of missing Band 71 in 36.133 NB-IoT bands Dish Network imported from 3GU
R4‑1815467 Network controlled FR2 IBE relaxations for better FR2 UE MPR performance Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815467 Network controlled FR2 IBE relaxations for better FR2 UE MPR performance Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815467 Network controlled FR2 IBE relaxations for better FR2 UE MPR performance Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815468 Draft CR to TR 38.817-02: Addition of description of conducted testing of performance requirements Ericsson imported from 3GU
R4‑1815468 Draft CR to TR 38.817-02: Addition of description of conducted testing of performance requirements Ericsson imported from 3GU
R4‑1815468 Draft CR to TR 38.817-02: Addition of description of conducted testing of performance requirements Ericsson imported from 3GU
R4‑1815469 Correction of hybrid BS demodulation declarations Ericsson imported from 3GU
R4‑1815469 Correction of hybrid BS demodulation declarations Ericsson imported from 3GU
R4‑1815469 Correction of hybrid BS demodulation declarations Ericsson imported from 3GU
R4‑1815470 Correction of hybrid BS demodulation declarations Ericsson imported from 3GU
R4‑1815470 Correction of hybrid BS demodulation declarations Ericsson imported from 3GU
R4‑1815470 Correction of hybrid BS demodulation declarations Ericsson imported from 3GU
R4‑1815471 Correction of hybrid BS demodulation declarations Ericsson imported from 3GU
R4‑1815471 Correction of hybrid BS demodulation declarations Ericsson imported from 3GU
R4‑1815471 Correction of hybrid BS demodulation declarations Ericsson imported from 3GU
R4‑1815472 TP to TS 38.141-1: Addition of declaration of TAB connectors used for demodulation testing Ericsson imported from 3GU
R4‑1815472 TP to TS 38.141-1: Addition of declaration of TAB connectors used for demodulation testing Ericsson imported from 3GU
R4‑1815472 TP to TS 38.141-1: Addition of declaration of TAB connectors used for demodulation testing Ericsson imported from 3GU
R4‑1815473 Correction of occupied bandwidth requirement for NR Ericsson imported from 3GU
R4‑1815473 Correction of occupied bandwidth requirement for NR Ericsson imported from 3GU
R4‑1815473 Correction of occupied bandwidth requirement for NR Ericsson imported from 3GU
R4‑1815474 Addition of NR band n74 Ericsson, NTT DoCoMo imported from 3GU
R4‑1815474 Addition of NR band n74 Ericsson, NTT DoCoMo imported from 3GU
R4‑1815474 Addition of NR band n74 Ericsson, NTT DoCoMo imported from 3GU
R4‑1815475 NR RX narrowband blocking requirement implementation in MSR Ericsson imported from 3GU
R4‑1815475 NR RX narrowband blocking requirement implementation in MSR Ericsson imported from 3GU
R4‑1815475 NR RX narrowband blocking requirement implementation in MSR Ericsson imported from 3GU
R4‑1815476 Correction of CS16/17 NBB requirement Ericsson imported from 3GU
R4‑1815476 Correction of CS16/17 NBB requirement Ericsson imported from 3GU
R4‑1815476 Correction of CS16/17 NBB requirement Ericsson imported from 3GU
R4‑1815477 Correction of narrowband blocking requirement for NR Ericsson imported from 3GU
R4‑1815477 Correction of narrowband blocking requirement for NR Ericsson imported from 3GU
R4‑1815477 Correction of narrowband blocking requirement for NR Ericsson imported from 3GU
R4‑1815478 Draft CR to 38.104: Cleanup to conducted requirements text Ericsson imported from 3GU
R4‑1815478 Draft CR to 38.104: Cleanup to conducted requirements text Ericsson imported from 3GU
R4‑1815478 Draft CR to 38.104: Cleanup to conducted requirements text Ericsson imported from 3GU
R4‑1815479 TP to TS 38.141-1: Cleanup to conducted requirements text Ericsson imported from 3GU
R4‑1815479 TP to TS 38.141-1: Cleanup to conducted requirements text Ericsson imported from 3GU
R4‑1815479 TP to TS 38.141-1: Cleanup to conducted requirements text Ericsson imported from 3GU
R4‑1815480 Cleanup to conducted requirements text Ericsson imported from 3GU
R4‑1815480 Cleanup to conducted requirements text Ericsson imported from 3GU
R4‑1815480 Cleanup to conducted requirements text Ericsson imported from 3GU
R4‑1815481 Cleanup to conducted requirements text Ericsson imported from 3GU
R4‑1815481 Cleanup to conducted requirements text Ericsson imported from 3GU
R4‑1815481 Cleanup to conducted requirements text Ericsson imported from 3GU
R4‑1815482 Cleanup to conducted requirements text Ericsson imported from 3GU
R4‑1815482 Cleanup to conducted requirements text Ericsson imported from 3GU
R4‑1815482 Cleanup to conducted requirements text Ericsson imported from 3GU
R4‑1815483 Cleanup to conducted requirements text Ericsson imported from 3GU
R4‑1815483 Cleanup to conducted requirements text Ericsson imported from 3GU
R4‑1815483 Cleanup to conducted requirements text Ericsson imported from 3GU
R4‑1815484 Cleanup to conducted requirements text Ericsson imported from 3GU
R4‑1815484 Cleanup to conducted requirements text Ericsson imported from 3GU
R4‑1815484 Cleanup to conducted requirements text Ericsson imported from 3GU
R4‑1815485 Cleanup to conducted requirements text Ericsson imported from 3GU
R4‑1815485 Cleanup to conducted requirements text Ericsson imported from 3GU
R4‑1815485 Cleanup to conducted requirements text Ericsson imported from 3GU
R4‑1815486 Draft CR to 38.104: Cleanup to OTA requirements text Ericsson imported from 3GU
R4‑1815486 Draft CR to 38.104: Cleanup to OTA requirements text Ericsson imported from 3GU
R4‑1815486 Draft CR to 38.104: Cleanup to OTA requirements text Ericsson imported from 3GU
R4‑1815487 TP to TS 38.141-2: Cleanup to OTA requirements text Ericsson imported from 3GU
R4‑1815487 TP to TS 38.141-2: Cleanup to OTA requirements text Ericsson imported from 3GU
R4‑1815487 TP to TS 38.141-2: Cleanup to OTA requirements text Ericsson imported from 3GU
R4‑1815488 Cleanup to OTA requirements text Ericsson imported from 3GU
R4‑1815488 Cleanup to OTA requirements text Ericsson imported from 3GU
R4‑1815488 Cleanup to OTA requirements text Ericsson imported from 3GU
R4‑1815489 Cleanup to OTA requirements text Ericsson imported from 3GU
R4‑1815489 Cleanup to OTA requirements text Ericsson imported from 3GU
R4‑1815489 Cleanup to OTA requirements text Ericsson imported from 3GU
R4‑1815490 TP to TS 38.141-1: Correction to description of ACLR test limits Ericsson imported from 3GU
R4‑1815490 TP to TS 38.141-1: Correction to description of ACLR test limits Ericsson imported from 3GU
R4‑1815490 TP to TS 38.141-1: Correction to description of ACLR test limits Ericsson imported from 3GU
R4‑1815491 Clarification to ACLR test requirements Ericsson imported from 3GU
R4‑1815491 Clarification to ACLR test requirements Ericsson imported from 3GU
R4‑1815491 Clarification to ACLR test requirements Ericsson imported from 3GU
R4‑1815492 Clarification to ACLR test requirements Ericsson imported from 3GU
R4‑1815492 Clarification to ACLR test requirements Ericsson imported from 3GU
R4‑1815492 Clarification to ACLR test requirements Ericsson imported from 3GU
R4‑1815493 Clarification to ACLR test requirements Ericsson imported from 3GU
R4‑1815493 Clarification to ACLR test requirements Ericsson imported from 3GU
R4‑1815493 Clarification to ACLR test requirements Ericsson imported from 3GU
R4‑1815494 On directions and test requirements for FR1 RX blocking Ericsson imported from 3GU
R4‑1815494 On directions and test requirements for FR1 RX blocking Ericsson imported from 3GU
R4‑1815494 On directions and test requirements for FR1 RX blocking Ericsson imported from 3GU
R4‑1815495 Correction to directions for FR1 OTA in-band blocking requirement Ericsson imported from 3GU
R4‑1815495 Correction to directions for FR1 OTA in-band blocking requirement Ericsson imported from 3GU
R4‑1815495 Correction to directions for FR1 OTA in-band blocking requirement Ericsson imported from 3GU
R4‑1815496 TP to TS 38.141-2: Correction to RX receiver test directions Ericsson imported from 3GU
R4‑1815496 TP to TS 38.141-2: Correction to RX receiver test directions Ericsson imported from 3GU
R4‑1815496 TP to TS 38.141-2: Correction to RX receiver test directions Ericsson imported from 3GU
R4‑1815497 Draft CR to 37.843: Correction to directions for in-band blocking requirement Ericsson imported from 3GU
R4‑1815497 Draft CR to 37.843: Correction to directions for in-band blocking requirement Ericsson imported from 3GU
R4‑1815497 Draft CR to 37.843: Correction to directions for in-band blocking requirement Ericsson imported from 3GU
R4‑1815498 Correction to RX receiver test directions Ericsson imported from 3GU
R4‑1815498 Correction to RX receiver test directions Ericsson imported from 3GU
R4‑1815498 Correction to RX receiver test directions Ericsson imported from 3GU
R4‑1815499 TP to TS 38.141-1: Correction of manufacturer declarations Ericsson imported from 3GU
R4‑1815499 TP to TS 38.141-1: Correction of manufacturer declarations Ericsson imported from 3GU
R4‑1815499 TP to TS 38.141-1: Correction of manufacturer declarations Ericsson imported from 3GU
R4‑1815500 Issues with the FR2 uplink sensitivity requirement Ericsson imported from 3GU
R4‑1815500 Issues with the FR2 uplink sensitivity requirement Ericsson imported from 3GU
R4‑1815500 Issues with the FR2 uplink sensitivity requirement Ericsson imported from 3GU
R4‑1815501 Draft CR to 38.104: Correction to FR2 OTA REFSENS requirement Ericsson imported from 3GU
R4‑1815501 Draft CR to 38.104: Correction to FR2 OTA REFSENS requirement Ericsson imported from 3GU
R4‑1815501 Draft CR to 38.104: Correction to FR2 OTA REFSENS requirement Ericsson imported from 3GU
R4‑1815502 TP to TS 38.141-2: Correction to FR2 OTA REFSENS requirement Ericsson imported from 3GU
R4‑1815502 TP to TS 38.141-2: Correction to FR2 OTA REFSENS requirement Ericsson imported from 3GU
R4‑1815502 TP to TS 38.141-2: Correction to FR2 OTA REFSENS requirement Ericsson imported from 3GU
R4‑1815503 Introduction of NR to 37.145-1: General Ericsson, Nokia imported from 3GU
R4‑1815503 Introduction of NR to 37.145-1: General Ericsson, Nokia imported from 3GU
R4‑1815503 Introduction of NR to 37.145-1: General Ericsson, Nokia imported from 3GU
R4‑1815504 Introduction of NR to 37.145-1: TX parts Ericsson, Nokia imported from 3GU
R4‑1815504 Introduction of NR to 37.145-1: TX parts Ericsson, Nokia imported from 3GU
R4‑1815504 Introduction of NR to 37.145-1: TX parts Ericsson, Nokia imported from 3GU
R4‑1815505 Introduction of NR to 37.145-1: RX parts Ericsson, Nokia imported from 3GU
R4‑1815505 Introduction of NR to 37.145-1: RX parts Ericsson, Nokia imported from 3GU
R4‑1815505 Introduction of NR to 37.145-1: RX parts Ericsson, Nokia imported from 3GU
R4‑1815506 Introduction of NR to 37.145-2: General Ericsson, Nokia imported from 3GU
R4‑1815506 Introduction of NR to 37.145-2: General Ericsson, Nokia imported from 3GU
R4‑1815506 Introduction of NR to 37.145-2: General Ericsson, Nokia imported from 3GU
R4‑1815507 Introduction of NR to 37.145-2: TX parts Ericsson, Nokia imported from 3GU
R4‑1815507 Introduction of NR to 37.145-2: TX parts Ericsson, Nokia imported from 3GU
R4‑1815507 Introduction of NR to 37.145-2: TX parts Ericsson, Nokia imported from 3GU
R4‑1815508 Introduction of NR to 37.145-2: RX parts Ericsson, Nokia imported from 3GU
R4‑1815508 Introduction of NR to 37.145-2: RX parts Ericsson, Nokia imported from 3GU
R4‑1815508 Introduction of NR to 37.145-2: RX parts Ericsson, Nokia imported from 3GU
R4‑1815509 Introduction of NR to 37.145-1 Ericsson imported from 3GU
R4‑1815509 Introduction of NR to 37.145-1 Ericsson imported from 3GU
R4‑1815509 Introduction of NR to 37.145-1 Ericsson imported from 3GU
R4‑1815510 Introduction of NR to 37.145-2 Ericsson imported from 3GU
R4‑1815510 Introduction of NR to 37.145-2 Ericsson imported from 3GU
R4‑1815510 Introduction of NR to 37.145-2 Ericsson imported from 3GU
R4‑1815511 On link budget for OTA demodulation testing in FR1 Ericsson imported from 3GU
R4‑1815511 On link budget for OTA demodulation testing in FR1 Ericsson imported from 3GU
R4‑1815511 On link budget for OTA demodulation testing in FR1 Ericsson imported from 3GU
R4‑1815512 On link budget for OTA demodulation testing in FR2 Ericsson imported from 3GU
R4‑1815512 On link budget for OTA demodulation testing in FR2 Ericsson imported from 3GU
R4‑1815512 On link budget for OTA demodulation testing in FR2 Ericsson imported from 3GU
R4‑1815513 Draft CR to 38.104: Correction to annex on EIRP based regulations Ericsson imported from 3GU
R4‑1815513 Draft CR to 38.104: Correction to annex on EIRP based regulations Ericsson imported from 3GU
R4‑1815513 Draft CR to 38.104: Correction to annex on EIRP based regulations Ericsson imported from 3GU
R4‑1815514 Corrections on V2X core requirements in TS36.133 R14 Huawei, HiSilicon imported from 3GU
R4‑1815514 Corrections on V2X core requirements in TS36.133 R14 Huawei, HiSilicon imported from 3GU
R4‑1815514 Corrections on V2X core requirements in TS36.133 R14 Huawei, HiSilicon imported from 3GU
R4‑1815515 Corrections on V2X core requirements in TS36.133 R15 Huawei, HiSilicon imported from 3GU
R4‑1815515 Corrections on V2X core requirements in TS36.133 R15 Huawei, HiSilicon imported from 3GU
R4‑1815515 Corrections on V2X core requirements in TS36.133 R15 Huawei, HiSilicon imported from 3GU
R4‑1815516 Corrections on Conditions for Selection/Reselection to Intra-frequency SyncRef UE R14 Huawei, HiSilicon imported from 3GU
R4‑1815516 Corrections on Conditions for Selection/Reselection to Intra-frequency SyncRef UE R14 Huawei, HiSilicon imported from 3GU
R4‑1815516 Corrections on Conditions for Selection/Reselection to Intra-frequency SyncRef UE R14 Huawei, HiSilicon imported from 3GU
R4‑1815517 Corrections on Conditions for Selection/Reselection to Intra-frequency SyncRef UE R15 Huawei, HiSilicon imported from 3GU
R4‑1815517 Corrections on Conditions for Selection/Reselection to Intra-frequency SyncRef UE R15 Huawei, HiSilicon imported from 3GU
R4‑1815517 Corrections on Conditions for Selection/Reselection to Intra-frequency SyncRef UE R15 Huawei, HiSilicon imported from 3GU
R4‑1815518 Corrections on UE category M1 intra-frequency measurements with CE Mode A R14 Huawei, HiSilicon imported from 3GU
R4‑1815518 Corrections on UE category M1 intra-frequency measurements with CE Mode A R14 Huawei, HiSilicon imported from 3GU
R4‑1815518 Corrections on UE category M1 intra-frequency measurements with CE Mode A R14 Huawei, HiSilicon imported from 3GU
R4‑1815519 Corrections on UE category M1 intra-frequency measurements with CE Mode A R15 Huawei, HiSilicon imported from 3GU
R4‑1815519 Corrections on UE category M1 intra-frequency measurements with CE Mode A R15 Huawei, HiSilicon imported from 3GU
R4‑1815519 Corrections on UE category M1 intra-frequency measurements with CE Mode A R15 Huawei, HiSilicon imported from 3GU
R4‑1815520 Corrections on UE category M1 intra-frequency measurements with CE Mode B R14 Huawei, HiSilicon imported from 3GU
R4‑1815520 Corrections on UE category M1 intra-frequency measurements with CE Mode B R14 Huawei, HiSilicon imported from 3GU
R4‑1815520 Corrections on UE category M1 intra-frequency measurements with CE Mode B R14 Huawei, HiSilicon imported from 3GU
R4‑1815521 Corrections on UE category M1 intra-frequency measurements with CE Mode B R15 Huawei, HiSilicon imported from 3GU
R4‑1815521 Corrections on UE category M1 intra-frequency measurements with CE Mode B R15 Huawei, HiSilicon imported from 3GU
R4‑1815521 Corrections on UE category M1 intra-frequency measurements with CE Mode B R15 Huawei, HiSilicon imported from 3GU
R4‑1815522 Corrections on UE category M1 inter-frequency measurements with CE Mode B R14 Huawei, HiSilicon imported from 3GU
R4‑1815522 Corrections on UE category M1 inter-frequency measurements with CE Mode B R14 Huawei, HiSilicon imported from 3GU
R4‑1815522 Corrections on UE category M1 inter-frequency measurements with CE Mode B R14 Huawei, HiSilicon imported from 3GU
R4‑1815523 Corrections on UE category M1 inter-frequency measurements with CE Mode B R15 Huawei, HiSilicon imported from 3GU
R4‑1815523 Corrections on UE category M1 inter-frequency measurements with CE Mode B R15 Huawei, HiSilicon imported from 3GU
R4‑1815523 Corrections on UE category M1 inter-frequency measurements with CE Mode B R15 Huawei, HiSilicon imported from 3GU
R4‑1815524 Corrections on RSRP and RSRQ measurement accuracy requirements for UE category M1 R14 Huawei, HiSilicon imported from 3GU
R4‑1815524 Corrections on RSRP and RSRQ measurement accuracy requirements for UE category M1 R14 Huawei, HiSilicon imported from 3GU
R4‑1815524 Corrections on RSRP and RSRQ measurement accuracy requirements for UE category M1 R14 Huawei, HiSilicon imported from 3GU
R4‑1815525 Corrections on RSRP and RSRQ measurement accuracy requirements for UE category M1 R15 Huawei, HiSilicon imported from 3GU
R4‑1815525 Corrections on RSRP and RSRQ measurement accuracy requirements for UE category M1 R15 Huawei, HiSilicon imported from 3GU
R4‑1815525 Corrections on RSRP and RSRQ measurement accuracy requirements for UE category M1 R15 Huawei, HiSilicon imported from 3GU
R4‑1815526 Discussion on test principles for Synchronization Reference Source Selection/Reselection for V2X CA Huawei, HiSilicon imported from 3GU
R4‑1815526 Discussion on test principles for Synchronization Reference Source Selection/Reselection for V2X CA Huawei, HiSilicon imported from 3GU
R4‑1815526 Discussion on test principles for Synchronization Reference Source Selection/Reselection for V2X CA Huawei, HiSilicon imported from 3GU
R4‑1815527 CR on introducing test cases of Synchronization Reference Source Selection/Reselection requirements for V2X CA Huawei, HiSilicon imported from 3GU
R4‑1815527 CR on introducing test cases of Synchronization Reference Source Selection/Reselection requirements for V2X CA Huawei, HiSilicon imported from 3GU
R4‑1815527 CR on introducing test cases of Synchronization Reference Source Selection/Reselection requirements for V2X CA Huawei, HiSilicon imported from 3GU
R4‑1815528 Discussion on test principles for interruptions due to V2X CA Huawei, HiSilicon imported from 3GU
R4‑1815528 Discussion on test principles for interruptions due to V2X CA Huawei, HiSilicon imported from 3GU
R4‑1815528 Discussion on test principles for interruptions due to V2X CA Huawei, HiSilicon imported from 3GU
R4‑1815529 CR on introducing test cases of interruptions due to V2X CA Huawei, HiSilicon imported from 3GU
R4‑1815529 CR on introducing test cases of interruptions due to V2X CA Huawei, HiSilicon imported from 3GU
R4‑1815529 CR on introducing test cases of interruptions due to V2X CA Huawei, HiSilicon imported from 3GU
R4‑1815530 Discussion on the scaling factor CSSF for multiple SCells Huawei, HiSilicon imported from 3GU
R4‑1815530 Discussion on the scaling factor CSSF for multiple SCells Huawei, HiSilicon imported from 3GU
R4‑1815530 Discussion on the scaling factor CSSF for multiple SCells Huawei, HiSilicon imported from 3GU
R4‑1815531 DraftCR on the scaling factor CSSF for outside gaps in TS38.133 Huawei, HiSilicon imported from 3GU
R4‑1815531 DraftCR on the scaling factor CSSF for outside gaps in TS38.133 Huawei, HiSilicon imported from 3GU
R4‑1815531 DraftCR on the scaling factor CSSF for outside gaps in TS38.133 Huawei, HiSilicon imported from 3GU
R4‑1815532 Discussion on defining SMTC overlapping of intra-frequency measurements Huawei, HiSilicon imported from 3GU
R4‑1815532 Discussion on defining SMTC overlapping of intra-frequency measurements Huawei, HiSilicon imported from 3GU
R4‑1815532 Discussion on defining SMTC overlapping of intra-frequency measurements Huawei, HiSilicon imported from 3GU
R4‑1815533 DraftCR on defining SMTC period for intra-frequency measurements in TS38.133 Huawei, HiSilicon imported from 3GU
R4‑1815533 DraftCR on defining SMTC period for intra-frequency measurements in TS38.133 Huawei, HiSilicon imported from 3GU
R4‑1815533 DraftCR on defining SMTC period for intra-frequency measurements in TS38.133 Huawei, HiSilicon imported from 3GU
R4‑1815534 DraftCR on SSB index reading time for inter-freuency measurements in TS38.133 Huawei, HiSilicon imported from 3GU
R4‑1815534 DraftCR on SSB index reading time for inter-freuency measurements in TS38.133 Huawei, HiSilicon imported from 3GU
R4‑1815534 DraftCR on SSB index reading time for inter-freuency measurements in TS38.133 Huawei, HiSilicon imported from 3GU
R4‑1815535 DraftCR on maintaining UE timing requirements in TS38.133 Huawei, HiSilicon imported from 3GU
R4‑1815535 DraftCR on maintaining UE timing requirements in TS38.133 Huawei, HiSilicon imported from 3GU
R4‑1815535 DraftCR on maintaining UE timing requirements in TS38.133 Huawei, HiSilicon imported from 3GU
R4‑1815536 Discussion on beam transition impacts on UE timing requirements Huawei, HiSilicon imported from 3GU
R4‑1815536 Discussion on beam transition impacts on UE timing requirements Huawei, HiSilicon imported from 3GU
R4‑1815536 Discussion on beam transition impacts on UE timing requirements Huawei, HiSilicon imported from 3GU
R4‑1815537 DraftCR on modifying UE timing requirements for beam transition in TS38.133 Huawei, HiSilicon imported from 3GU
R4‑1815537 DraftCR on modifying UE timing requirements for beam transition in TS38.133 Huawei, HiSilicon imported from 3GU
R4‑1815537 DraftCR on modifying UE timing requirements for beam transition in TS38.133 Huawei, HiSilicon imported from 3GU
R4‑1815538 Further discussion on L1-RSRP measurement requirements for CBD Huawei, HiSilicon imported from 3GU
R4‑1815538 Further discussion on L1-RSRP measurement requirements for CBD Huawei, HiSilicon imported from 3GU
R4‑1815538 Further discussion on L1-RSRP measurement requirements for CBD Huawei, HiSilicon imported from 3GU
R4‑1815539 DraftCR on modifying candidate beam detection requirements in TS38.133 Huawei, HiSilicon imported from 3GU
R4‑1815539 DraftCR on modifying candidate beam detection requirements in TS38.133 Huawei, HiSilicon imported from 3GU
R4‑1815539 DraftCR on modifying candidate beam detection requirements in TS38.133 Huawei, HiSilicon imported from 3GU
R4‑1815540 DraftCR on updating conditions for NR measurement accuracy requirements in TS38.133 Huawei, HiSilicon imported from 3GU
R4‑1815540 DraftCR on updating conditions for NR measurement accuracy requirements in TS38.133 Huawei, HiSilicon imported from 3GU
R4‑1815540 DraftCR on updating conditions for NR measurement accuracy requirements in TS38.133 Huawei, HiSilicon imported from 3GU
R4‑1815541 DraftCR on correcting receiver sensitivity relaxation requirments in TS38.133 Huawei, HiSilicon imported from 3GU
R4‑1815541 DraftCR on correcting receiver sensitivity relaxation requirments in TS38.133 Huawei, HiSilicon imported from 3GU
R4‑1815541 DraftCR on correcting receiver sensitivity relaxation requirments in TS38.133 Huawei, HiSilicon imported from 3GU
R4‑1815542 DraftCR on requirement classification for statistical testing in TS38.133 Huawei, HiSilicon imported from 3GU
R4‑1815542 DraftCR on requirement classification for statistical testing in TS38.133 Huawei, HiSilicon imported from 3GU
R4‑1815542 DraftCR on requirement classification for statistical testing in TS38.133 Huawei, HiSilicon imported from 3GU
R4‑1815543 DraftCR on correcting applicability rules for RRM test cases in TS38.133 Huawei, HiSilicon imported from 3GU
R4‑1815543 DraftCR on correcting applicability rules for RRM test cases in TS38.133 Huawei, HiSilicon imported from 3GU
R4‑1815543 DraftCR on correcting applicability rules for RRM test cases in TS38.133 Huawei, HiSilicon imported from 3GU
R4‑1815544 DraftCR on correcting RMSI CORESET configurations in TS38.133 Huawei, HiSilicon imported from 3GU
R4‑1815544 DraftCR on correcting RMSI CORESET configurations in TS38.133 Huawei, HiSilicon imported from 3GU
R4‑1815544 DraftCR on correcting RMSI CORESET configurations in TS38.133 Huawei, HiSilicon imported from 3GU
R4‑1815545 DraftCR on correcting SSB Configurations in TS38.133 Huawei, HiSilicon imported from 3GU
R4‑1815545 DraftCR on correcting SSB Configurations in TS38.133 Huawei, HiSilicon imported from 3GU
R4‑1815545 DraftCR on correcting SSB Configurations in TS38.133 Huawei, HiSilicon imported from 3GU
R4‑1815546 Discussion on defining SNR values in NR RLM tests Huawei, HiSilicon imported from 3GU
R4‑1815546 Discussion on defining SNR values in NR RLM tests Huawei, HiSilicon imported from 3GU
R4‑1815546 Discussion on defining SNR values in NR RLM tests Huawei, HiSilicon imported from 3GU
R4‑1815547 Clarification on the applicability of side condition for CE UE R13 Huawei, HiSilicon imported from 3GU
R4‑1815547 Clarification on the applicability of side condition for CE UE R13 Huawei, HiSilicon imported from 3GU
R4‑1815547 Clarification on the applicability of side condition for CE UE R13 Huawei, HiSilicon imported from 3GU
R4‑1815548 Clarification on the applicability of side condition for CE UE R14 Huawei, HiSilicon imported from 3GU
R4‑1815548 Clarification on the applicability of side condition for CE UE R14 Huawei, HiSilicon imported from 3GU
R4‑1815548 Clarification on the applicability of side condition for CE UE R14 Huawei, HiSilicon imported from 3GU
R4‑1815549 Clarification on the applicability of side condition for CE UE R15 Huawei, HiSilicon imported from 3GU
R4‑1815549 Clarification on the applicability of side condition for CE UE R15 Huawei, HiSilicon imported from 3GU
R4‑1815549 Clarification on the applicability of side condition for CE UE R15 Huawei, HiSilicon imported from 3GU
R4‑1815550 Clarification of G factor for feMTC RRM test cases Huawei, HiSilicon imported from 3GU
R4‑1815550 Clarification of G factor for feMTC RRM test cases Huawei, HiSilicon imported from 3GU
R4‑1815550 Clarification of G factor for feMTC RRM test cases Huawei, HiSilicon imported from 3GU
R4‑1815551 Clarification of G factor for feMTC RRM test cases R15 Huawei, HiSilicon imported from 3GU
R4‑1815551 Clarification of G factor for feMTC RRM test cases R15 Huawei, HiSilicon imported from 3GU
R4‑1815551 Clarification of G factor for feMTC RRM test cases R15 Huawei, HiSilicon imported from 3GU
R4‑1815552 Applicability of non-BL CE requriements for Cat-1bis Huawei, HiSilicon imported from 3GU
R4‑1815552 Applicability of non-BL CE requriements for Cat-1bis Huawei, HiSilicon imported from 3GU
R4‑1815552 Applicability of non-BL CE requriements for Cat-1bis Huawei, HiSilicon imported from 3GU
R4‑1815553 Applicability of non-BL CE requriements for Cat-1bis Huawei, HiSilicon imported from 3GU
R4‑1815553 Applicability of non-BL CE requriements for Cat-1bis Huawei, HiSilicon imported from 3GU
R4‑1815553 Applicability of non-BL CE requriements for Cat-1bis Huawei, HiSilicon imported from 3GU
R4‑1815554 Applicability of requirements for non-BL CE UE in Rel-15 Huawei, HiSilicon imported from 3GU
R4‑1815554 Applicability of requirements for non-BL CE UE in Rel-15 Huawei, HiSilicon imported from 3GU
R4‑1815554 Applicability of requirements for non-BL CE UE in Rel-15 Huawei, HiSilicon imported from 3GU
R4‑1815555 Correction to CRS muting applicability in efeMTC Huawei, HiSilicon imported from 3GU
R4‑1815555 Correction to CRS muting applicability in efeMTC Huawei, HiSilicon imported from 3GU
R4‑1815555 Correction to CRS muting applicability in efeMTC Huawei, HiSilicon imported from 3GU
R4‑1815556 Requirements for high velocity measurement for efeMTC Huawei, HiSilicon imported from 3GU
R4‑1815556 Requirements for high velocity measurement for efeMTC Huawei, HiSilicon imported from 3GU
R4‑1815556 Requirements for high velocity measurement for efeMTC Huawei, HiSilicon imported from 3GU
R4‑1815557 CR on TS38.133 for SSB-based intra-frequency measurements (Section 9.2.5 and Section 9.2.6) MediaTek inc. imported from 3GU
R4‑1815557 CR on TS38.133 for SSB-based intra-frequency measurements (Section 9.2.5 and Section 9.2.6) MediaTek inc. imported from 3GU
R4‑1815557 CR on TS38.133 for SSB-based intra-frequency measurements (Section 9.2.5 and Section 9.2.6) MediaTek inc. imported from 3GU
R4‑1815558 Discussion on dual SMTC periodicities MediaTek inc. imported from 3GU
R4‑1815558 Discussion on dual SMTC periodicities MediaTek inc. imported from 3GU
R4‑1815558 Discussion on dual SMTC periodicities MediaTek inc. imported from 3GU
R4‑1815559 CR on TS38.133 for SSB-based inter-frequency measurements (section 9.3.4 and 9.3.5) MediaTek inc. imported from 3GU
R4‑1815559 CR on TS38.133 for SSB-based inter-frequency measurements (section 9.3.4 and 9.3.5) MediaTek inc. imported from 3GU
R4‑1815559 CR on TS38.133 for SSB-based inter-frequency measurements (section 9.3.4 and 9.3.5) MediaTek inc. imported from 3GU
R4‑1815560 CR on TS38.133 carrier-specific scaling factor for multiple measurement objects (section 9.1.5) MediaTek inc. imported from 3GU
R4‑1815560 CR on TS38.133 carrier-specific scaling factor for multiple measurement objects (section 9.1.5) MediaTek inc. imported from 3GU
R4‑1815560 CR on TS38.133 carrier-specific scaling factor for multiple measurement objects (section 9.1.5) MediaTek inc. imported from 3GU
R4‑1815561 Remaining issues on scaling factor for multiple measurement objects MediaTek inc. imported from 3GU
R4‑1815561 Remaining issues on scaling factor for multiple measurement objects MediaTek inc. imported from 3GU
R4‑1815561 Remaining issues on scaling factor for multiple measurement objects MediaTek inc. imported from 3GU
R4‑1815562 CR to TS 38.104 on Combined updates from RAN4 #88bis and #89 Ericsson imported from 3GU
R4‑1815562 CR to TS 38.104 on Combined updates from RAN4 #88bis and #89 Ericsson imported from 3GU
R4‑1815562 CR to TS 38.104 on Combined updates from RAN4 #88bis and #89 Ericsson imported from 3GU
R4‑1815563 Draft CR to 38.101-1 on Clarification on 7.5 KHz raster shift in NR re-farmed bands Ericsson imported from 3GU
R4‑1815563 Draft CR to 38.101-1 on Clarification on 7.5 KHz raster shift in NR re-farmed bands Ericsson imported from 3GU
R4‑1815563 Draft CR to 38.101-1 on Clarification on 7.5 KHz raster shift in NR re-farmed bands Ericsson imported from 3GU
R4‑1815564 Draft CR to 38.104 on Clarification on 7.5 KHz raster shift in NR re-farmed bands Ericsson imported from 3GU
R4‑1815564 Draft CR to 38.104 on Clarification on 7.5 KHz raster shift in NR re-farmed bands Ericsson imported from 3GU
R4‑1815564 Draft CR to 38.104 on Clarification on 7.5 KHz raster shift in NR re-farmed bands Ericsson imported from 3GU
R4‑1815565 Spread sheet for GSCN raster ranges Ericsson imported from 3GU
R4‑1815565 Spread sheet for GSCN raster ranges Ericsson imported from 3GU
R4‑1815565 Spread sheet for GSCN raster ranges Ericsson imported from 3GU
R4‑1815566 Draft CR for TS 38.101-1: Sync raster corrections (5.4.3) Ericsson imported from 3GU
R4‑1815566 Draft CR for TS 38.101-1: Sync raster corrections (5.4.3) Ericsson imported from 3GU
R4‑1815566 Draft CR for TS 38.101-1: Sync raster corrections (5.4.3) Ericsson imported from 3GU
R4‑1815567 Draft CR for TS 38.104: Sync raster corrections (5.4.3) Ericsson imported from 3GU
R4‑1815567 Draft CR for TS 38.104: Sync raster corrections (5.4.3) Ericsson imported from 3GU
R4‑1815567 Draft CR for TS 38.104: Sync raster corrections (5.4.3) Ericsson imported from 3GU
R4‑1815568 Outcome of ECC SE21 meeting #103 concerning spurious emissions Ericsson, Nokia, Qualcomm imported from 3GU
R4‑1815568 Outcome of ECC SE21 meeting #103 concerning spurious emissions Ericsson, Nokia, Qualcomm imported from 3GU
R4‑1815568 Outcome of ECC SE21 meeting #103 concerning spurious emissions Ericsson, Nokia, Qualcomm imported from 3GU
R4‑1815569 Finalizing BS spurious emission Category B for FR2 Ericsson imported from 3GU
R4‑1815569 Finalizing BS spurious emission Category B for FR2 Ericsson imported from 3GU
R4‑1815569 Finalizing BS spurious emission Category B for FR2 Ericsson imported from 3GU
R4‑1815570 CR to 38.104 on Combined CRs for BS Demodulation performance Ericsson imported from 3GU
R4‑1815570 CR to 38.104 on Combined CRs for BS Demodulation performance Ericsson imported from 3GU
R4‑1815570 Draft CR to 38.104 on Combined CRs for BS Demodulation performance Ericsson imported from 3GU
R4‑1815571 Draft CR to 38.104 on Noise definition for BS demodulation Ericsson imported from 3GU
R4‑1815571 Draft CR to 38.104 on Noise definition for BS demodulation Ericsson imported from 3GU
R4‑1815571 Draft CR to 38.104 on Noise definition for BS demodulation Ericsson imported from 3GU
R4‑1815572 Draft CR to TR 38.817-02 for Conformance testing (Ch 12) after RAN4#88bis Ericsson imported from 3GU
R4‑1815572 Draft CR to TR 38.817-02 for Conformance testing (Ch 12) after RAN4#88bis Ericsson imported from 3GU
R4‑1815572 Draft CR to TR 38.817-02 for Conformance testing (Ch 12) after RAN4#88bis Ericsson imported from 3GU
R4‑1815573 CR to TR 38.817-02 for Conformance testing (Ch 12) after RAN4#89 Ericsson imported from 3GU
R4‑1815573 CR to TR 38.817-02 for Conformance testing (Ch 12) after RAN4#89 Ericsson imported from 3GU
R4‑1815573 CR to TR 38.817-02 for Conformance testing (Ch 12) after RAN4#89 Ericsson imported from 3GU
R4‑1815574 LS reply on Characteristics of IMT-Advanced, IMT-2020 and Advanced Antenna Systems for ITU-R sharing and compatibility studies in the frequency band 3 300-3 400 MHz Ericsson imported from 3GU
R4‑1815574 LS reply on Characteristics of IMT-Advanced, IMT-2020 and Advanced Antenna Systems for ITU-R sharing and compatibility studies in the frequency band 3 300-3 400 MHz Ericsson imported from 3GU
R4‑1815574 LS on Characteristics of IMT-Advanced, IMT-2020 and Advanced Antenna Systems for ITU-R Sharing and Compatibility Studies in the Frequency Band 3 300-3 400 MHz Ericsson imported from 3GU
R4‑1815575 Introduction of RX beamforming in intrafrequency FR2 requirements for PC4 in section 9.2 Ericsson, Docomo, Verizon imported from 3GU
R4‑1815575 Introduction of RX beamforming in intrafrequency FR2 requirements for PC4 in section 9.2 Ericsson, Docomo, Verizon imported from 3GU
R4‑1815575 Introduction of RX beamforming in intrafrequency FR2 requirements for PC4 in section 9.2 Ericsson, Docomo, Verizon imported from 3GU
R4‑1815576 Introduction of RX beamforming in interfrequency FR2 requirements for PC4 in section 9.3 Ericsson, Docomo, Verizon imported from 3GU
R4‑1815576 Introduction of RX beamforming in interfrequency FR2 requirements for PC4 in section 9.3 Ericsson, Docomo, Verizon imported from 3GU
R4‑1815576 Introduction of RX beamforming in interfrequency FR2 requirements for PC4 in section 9.3 Ericsson, Docomo, Verizon imported from 3GU
R4‑1815577 Introduction of RX beamforming in FR2 requirements for PC4 Ericsson, Docomo, Verizon imported from 3GU
R4‑1815577 Introduction of RX beamforming in FR2 requirements for PC4 Ericsson, Docomo, Verizon imported from 3GU
R4‑1815577 Introduction of RX beamforming in FR2 requirements for PC4 Ericsson, Docomo, Verizon imported from 3GU
R4‑1815578 Considerations on further enhancements for mobility Ericsson imported from 3GU
R4‑1815578 Considerations on further enhancements for mobility Ericsson imported from 3GU
R4‑1815578 Considerations on further enhancements for mobility Ericsson imported from 3GU
R4‑1815579 Introduction of search window for 4ms MGL in LTE interfrequency requirements Ericsson imported from 3GU
R4‑1815579 Introduction of search window for 4ms MGL in LTE interfrequency requirements Ericsson imported from 3GU
R4‑1815579 Introduction of search window for 4ms MGL in LTE interfrequency requirements Ericsson imported from 3GU
R4‑1815580 Introduction of search window for short MGL in LTE interRAT requirements section 9.4.1 Ericsson imported from 3GU
R4‑1815580 Introduction of search window for short MGL in LTE interRAT requirements section 9.4.1 Ericsson imported from 3GU
R4‑1815580 Introduction of search window for short MGL in LTE interRAT requirements section 9.4.1 Ericsson imported from 3GU
R4‑1815581 CSSFoutside_gap,i definition for FR1+FR2 carrier aggregation Ericsson imported from 3GU
R4‑1815581 CSSFoutside_gap,i definition for FR1+FR2 carrier aggregation Ericsson imported from 3GU
R4‑1815581 CSSFoutside_gap,i definition for FR1+FR2 carrier aggregation Ericsson imported from 3GU
R4‑1815582 CSSFoutside_gap,i definition for FR1+FR2 carrier in section 9.1.5 Ericsson imported from 3GU
R4‑1815582 CSSFoutside_gap,i definition for FR1+FR2 carrier in section 9.1.5 Ericsson imported from 3GU
R4‑1815582 CSSFoutside_gap,i definition for FR1+FR2 carrier in section 9.1.5 Ericsson imported from 3GU
R4‑1815583 Corrections to DRX cycle for EN-DC operation Ericsson imported from 3GU
R4‑1815583 Corrections to DRX cycle for EN-DC operation Ericsson imported from 3GU
R4‑1815583 Corrections to DRX cycle for EN-DC operation Ericsson imported from 3GU
R4‑1815584 Corrections to DRX cycle for EN-DC operation in sections 9.2.x, 9.3.x and 9.4.x Ericsson imported from 3GU
R4‑1815584 Corrections to DRX cycle for EN-DC operation in sections 9.2.x, 9.3.x and 9.4.x Ericsson imported from 3GU
R4‑1815584 Corrections to DRX cycle for EN-DC operation in sections 9.2.x, 9.3.x and 9.4.x Ericsson imported from 3GU
R4‑1815585 DRX requirements for RRM in EN-DC Ericsson imported from 3GU
R4‑1815585 DRX requirements for RRM in EN-DC Ericsson imported from 3GU
R4‑1815585 DRX requirements for RRM in EN-DC Ericsson imported from 3GU
R4‑1815586 Correction of dual SMTC in requierments in 38.133 section 6.1, 6.2, 8.3, 9.1 and 9. Ericsson imported from 3GU
R4‑1815586 Correction of dual SMTC in requierments in 38.133 section 6.1, 6.2, 8.3, 9.1 and 9. Ericsson imported from 3GU
R4‑1815586 Correction of dual SMTC in requierments in 38.133 section 6.1, 6.2, 8.3, 9.1 and 9. Ericsson imported from 3GU
R4‑1815587 Dual SMTC requirements Ericsson imported from 3GU
R4‑1815587 Dual SMTC requirements Ericsson imported from 3GU
R4‑1815587 Dual SMTC requirements Ericsson imported from 3GU
R4‑1815588 Correction of side condition in FR2 handover in section 6.1.1 Ericsson imported from 3GU
R4‑1815588 Correction of side condition in FR2 handover in section 6.1.1 Ericsson imported from 3GU
R4‑1815588 Correction of side condition in FR2 handover in section 6.1.1 Ericsson imported from 3GU
R4‑1815589 Correction of side condition in FR2 handover Ericsson imported from 3GU
R4‑1815589 Correction of side condition in FR2 handover Ericsson imported from 3GU
R4‑1815589 Correction of side condition in FR2 handover Ericsson imported from 3GU
R4‑1815590 Side condition for FR2 handover Ericsson imported from 3GU
R4‑1815590 Side condition for FR2 handover Ericsson imported from 3GU
R4‑1815590 Side condition for FR2 handover Ericsson imported from 3GU
R4‑1815591 Ideal SS-RSRP in OTA tests Ericsson imported from 3GU
R4‑1815591 Ideal SS-RSRP in OTA tests Ericsson imported from 3GU
R4‑1815591 Ideal SS-RSRP in OTA tests Ericsson imported from 3GU
R4‑1815592 RRM test case planning for Q1/2 2019 Ericsson imported from 3GU
R4‑1815592 RRM test case planning for Q1/2 2019 Ericsson imported from 3GU
R4‑1815592 RRM test case planning for Q1/2 2019 Ericsson imported from 3GU
R4‑1815593 RRM test case planning for Q1/2 2019 Ericsson imported from 3GU
R4‑1815593 RRM test case planning for Q1/2 2019 Ericsson imported from 3GU
R4‑1815593 RRM test case planning for Q1/2 2019 Ericsson imported from 3GU
R4‑1815594 Corrections to FR1 SS-RSRP measurement accuracy test for EN-DC NR Ericsson imported from 3GU
R4‑1815594 Corrections to FR1 SS-RSRP measurement accuracy test for EN-DC NR Ericsson imported from 3GU
R4‑1815594 Corrections to FR1 SS-RSRP measurement accuracy test for EN-DC NR Ericsson imported from 3GU
R4‑1815595 Corrections to FR2 SS-RSRP measurement accuracy test for EN-DC NR Ericsson imported from 3GU
R4‑1815595 Corrections to FR2 SS-RSRP measurement accuracy test for EN-DC NR Ericsson imported from 3GU
R4‑1815595 Corrections to FR2 SS-RSRP measurement accuracy test for EN-DC NR Ericsson imported from 3GU
R4‑1815596 FR1 SS-RSRP measurement accuracy test for SA NR Ericsson imported from 3GU
R4‑1815596 FR1 SS-RSRP measurement accuracy test for SA NR Ericsson imported from 3GU
R4‑1815596 FR1 SS-RSRP measurement accuracy test for SA NR Ericsson imported from 3GU
R4‑1815597 FR2 SS-RSRP measurement accuracy test for SA NR Ericsson imported from 3GU
R4‑1815597 FR2 SS-RSRP measurement accuracy test for SA NR Ericsson imported from 3GU
R4‑1815597 FR2 SS-RSRP measurement accuracy test for SA NR Ericsson imported from 3GU
R4‑1815598 Corrections to incmon testcases Ericsson imported from 3GU
R4‑1815598 Corrections to incmon testcases Ericsson imported from 3GU
R4‑1815598 Corrections to incmon testcases Ericsson imported from 3GU
R4‑1815599 SIB5 reporting for Idle Mode CA Measurement Ericsson imported from 3GU
R4‑1815599 SIB5 reporting for Idle Mode CA Measurement Ericsson imported from 3GU
R4‑1815599 SIB5 reporting for Idle Mode CA Measurement Ericsson imported from 3GU
R4‑1815600 SIB5 reporting corrections for Idle Mode CA Measurement Ericsson imported from 3GU
R4‑1815600 SIB5 reporting corrections for Idle Mode CA Measurement Ericsson imported from 3GU
R4‑1815600 SIB5 reporting corrections for Idle Mode CA Measurement Ericsson imported from 3GU
R4‑1815601 Corrections to incmon testcases Ericsson imported from 3GU
R4‑1815601 Corrections to incmon testcases Ericsson imported from 3GU
R4‑1815601 Corrections to incmon testcases Ericsson imported from 3GU
R4‑1815602 Corrections to incmon testcases Ericsson imported from 3GU
R4‑1815602 Corrections to incmon testcases Ericsson imported from 3GU
R4‑1815602 Corrections to incmon testcases Ericsson imported from 3GU
R4‑1815603 Corrections to incmon testcases Ericsson imported from 3GU
R4‑1815603 Corrections to incmon testcases Ericsson imported from 3GU
R4‑1815603 Corrections to incmon testcases Ericsson imported from 3GU
R4‑1815604 Correction of PCmax requirement for V2X Qualcomm Inc. imported from 3GU
R4‑1815604 Correction of PCmax requirement for V2X Qualcomm Inc. imported from 3GU
R4‑1815604 Correction of PCmax requirement for V2X Qualcomm Inc. imported from 3GU
R4‑1815605 TP for TR 37.716-11-11 NR Inter-band DC x-n260 band combination Verizon, Ericsson imported from 3GU
R4‑1815605 TP for TR 37.716-11-11 NR Inter-band DC x-n260 band combination Verizon, Ericsson imported from 3GU
R4‑1815605 TP for TR 37.716-11-11 NR Inter-band DC x-n260 band combination Verizon, Ericsson imported from 3GU
R4‑1815606 Discuss FR2 TX OFF and ON/OFF transient Huawei imported from 3GU
R4‑1815606 Discuss FR2 TX OFF and ON/OFF transient Huawei imported from 3GU
R4‑1815606 Discuss FR2 TX OFF and ON/OFF transient Huawei imported from 3GU
R4‑1815607 TP to TS 38.141-2 - update TX OFF measurement procedure. Huawei imported from 3GU
R4‑1815607 TP to TS 38.141-2 - update TX OFF measurement procedure. Huawei imported from 3GU
R4‑1815607 TP to TS 38.141-2 - update TX OFF measurement procedure. Huawei imported from 3GU
R4‑1815608 CR to TR 38.817-02 - capture FR2 TX ON/OFF transient background Huawei imported from 3GU
R4‑1815608 CR to TR 38.817-02 - capture FR2 TX ON/OFF transient background Huawei imported from 3GU
R4‑1815608 CR to TR 38.817-02 - capture FR2 TX ON/OFF transient background Huawei imported from 3GU
R4‑1815609 Discussion on FR2 extreme temperature MU Huawei imported from 3GU
R4‑1815609 Discussion on FR2 extreme temperature MU Huawei imported from 3GU
R4‑1815609 Discussion on FR2 extreme temperature MU Huawei imported from 3GU
R4‑1815610 TP to TS 38.141-2 - update FR2 extreme MU and TT Huawei imported from 3GU
R4‑1815610 TP to TS 38.141-2 - update FR2 extreme MU and TT Huawei imported from 3GU
R4‑1815610 TP to TS 38.141-2 - update FR2 extreme MU and TT Huawei imported from 3GU
R4‑1815611 draft CR to TR 38.817-02 extreme temperature MU background Huawei imported from 3GU
R4‑1815611 draft CR to TR 38.817-02 extreme temperature MU background Huawei imported from 3GU
R4‑1815611 draft CR to TR 38.817-02 extreme temperature MU background Huawei imported from 3GU
R4‑1815612 Discuss open issues on polarisation wording improvements Huawei imported from 3GU
R4‑1815612 Discuss open issues on polarisation wording improvements Huawei imported from 3GU
R4‑1815612 Discuss open issues on polarisation wording improvements Huawei imported from 3GU
R4‑1815613 draft CR to TR 38.843 - polarisation wording improvements for OTA sensitivity and reference sensitivity Huawei imported from 3GU
R4‑1815613 draft CR to TR 38.843 - polarisation wording improvements for OTA sensitivity and reference sensitivity Huawei imported from 3GU
R4‑1815613 draft CR to TR 38.843 - polarisation wording improvements for OTA sensitivity and reference sensitivity Huawei imported from 3GU
R4‑1815614 CR to TS 37.105 - polarisation wording improvements for OTA s reference sensitivity Huawei imported from 3GU
R4‑1815614 CR to TS 37.105 - polarisation wording improvements for OTA s reference sensitivity Huawei imported from 3GU
R4‑1815614 CR to TS 37.105 - polarisation wording improvements for OTA s reference sensitivity Huawei imported from 3GU
R4‑1815615 CR to TS 37.145-2 - polarisation wording improvements for OTA reference sensitivity Huawei imported from 3GU
R4‑1815615 CR to TS 37.145-2 - polarisation wording improvements for OTA reference sensitivity Huawei imported from 3GU
R4‑1815615 CR to TS 37.145-2 - polarisation wording improvements for OTA reference sensitivity Huawei imported from 3GU
R4‑1815616 CR to TR 38.817-02 - polarisation wording improvements for OTA reference sensitivity Huawei imported from 3GU
R4‑1815616 CR to TR 38.817-02 - polarisation wording improvements for OTA reference sensitivity Huawei imported from 3GU
R4‑1815616 CR to TR 38.817-02 - polarisation wording improvements for OTA reference sensitivity Huawei imported from 3GU
R4‑1815617 TP to TS 38.141-2 - polarisation wording improvements for OTA sensitivity and reference sensitivity Huawei imported from 3GU
R4‑1815617 TP to TS 38.141-2 - polarisation wording improvements for OTA sensitivity and reference sensitivity Huawei imported from 3GU
R4‑1815617 TP to TS 38.141-2 - polarisation wording improvements for OTA sensitivity and reference sensitivity Huawei imported from 3GU
R4‑1815618 draft CR to TR 37.843 - updates from RAN4#88bis Huawei imported from 3GU
R4‑1815618 draft CR to TR 37.843 - updates from RAN4#88bis Huawei imported from 3GU
R4‑1815618 draft CR to TR 37.843 - updates from RAN4#88bis Huawei imported from 3GU
R4‑1815619 Draft CR on LTE RMC for TDD EN-DC UE RF Tests Qualcomm Incorporated imported from 3GU
R4‑1815619 Draft CR on LTE RMC for TDD EN-DC UE RF Tests Qualcomm Incorporated imported from 3GU
R4‑1815619 Draft CR on LTE RMC for TDD EN-DC UE RF Tests Qualcomm Incorporated imported from 3GU
R4‑1815620 Draft CR to 38.101-2: FR2 EIS Spherical Coverage Requirement Qualcomm Incorporated imported from 3GU
R4‑1815620 Draft CR to 38.101-2: FR2 EIS Spherical Coverage Requirement Qualcomm Incorporated imported from 3GU
R4‑1815620 Draft CR to 38.101-2: FR2 EIS Spherical Coverage Requirement Qualcomm Incorporated imported from 3GU
R4‑1815621 Draft CR to 38.101-2: FR2 Multiband Framework Qualcomm Incorporated imported from 3GU
R4‑1815621 Draft CR to 38.101-2: FR2 Multiband Framework Qualcomm Incorporated imported from 3GU
R4‑1815621 Draft CR to 38.101-2: FR2 Multiband Framework Qualcomm Incorporated imported from 3GU
R4‑1815622 Draft CR to 38.101-2: FR2 ULCA removal of out-of-scope items for Rel. 15 Qualcomm Incorporated imported from 3GU
R4‑1815622 Draft CR to 38.101-2: FR2 ULCA removal of out-of-scope items for Rel. 15 Qualcomm Incorporated imported from 3GU
R4‑1815622 Draft CR to 38.101-2: FR2 ULCA removal of out-of-scope items for Rel. 15 Qualcomm Incorporated imported from 3GU
R4‑1815623 Draft CR to 38.101-2: FR2 Max. Input Power UL Configuration Qualcomm Incorporated, OPPO imported from 3GU
R4‑1815623 Draft CR to 38.101-2: FR2 Max. Input Power UL Configuration Qualcomm Incorporated, OPPO imported from 3GU
R4‑1815623 Draft CR to 38.101-2: FR2 Max. Input Power UL Configuration Qualcomm Incorporated, OPPO imported from 3GU
R4‑1815624 dCR for 38.810: Revise formula for FR2 OTA EIS metric Qualcomm Incorporated imported from 3GU
R4‑1815624 dCR for 38.810: Revise formula for FR2 OTA EIS metric Qualcomm Incorporated imported from 3GU
R4‑1815624 dCR for 38.810: Revise formula for FR2 OTA EIS metric Qualcomm Incorporated imported from 3GU
R4‑1815625 Draft CR to 38.101-2: FR2 EIS DL Signal Polarization Clarification Qualcomm Incorporated imported from 3GU
R4‑1815625 Draft CR to 38.101-2: FR2 EIS DL Signal Polarization Clarification Qualcomm Incorporated imported from 3GU
R4‑1815625 Draft CR to 38.101-2: FR2 EIS DL Signal Polarization Clarification Qualcomm Incorporated imported from 3GU
R4‑1815626 On OTA EIS metric in FR2 Qualcomm Incorporated imported from 3GU
R4‑1815626 On OTA EIS metric in FR2 Qualcomm Incorporated imported from 3GU
R4‑1815626 On OTA EIS metric in FR2 Qualcomm Incorporated imported from 3GU
R4‑1815627 On FR2 PC3 UE MB Relaxations Qualcomm Incorporated imported from 3GU
R4‑1815627 On FR2 PC3 UE MB Relaxations Qualcomm Incorporated imported from 3GU
R4‑1815627 On FR2 PC3 UE MB Relaxations Qualcomm Incorporated imported from 3GU
R4‑1815628 On PC2 UL MIMO Huawei, HiSilicon imported from 3GU
R4‑1815628 On PC2 UL MIMO Huawei, HiSilicon imported from 3GU
R4‑1815628 On PC2 UL MIMO Huawei, HiSilicon imported from 3GU
R4‑1815629 Discussion on LTE RMC for UE RF Test in EN-DC configuration Qualcomm Incorporated imported from 3GU
R4‑1815629 Discussion on LTE RMC for UE RF Test in EN-DC configuration Qualcomm Incorporated imported from 3GU
R4‑1815629 Discussion on LTE RMC for UE RF Test in EN-DC configuration Qualcomm Incorporated imported from 3GU
R4‑1815630 MRTD Requirements for Inter-band FR1-FR2 NR CA Qualcomm Incorporated imported from 3GU
R4‑1815630 MRTD Requirements for Inter-band FR1-FR2 NR CA Qualcomm Incorporated imported from 3GU
R4‑1815630 MRTD Requirements for Inter-band FR1-FR2 NR CA Qualcomm Incorporated imported from 3GU
R4‑1815631 Further discussions on band 46 intra-band DL LAA Type B multi-carrier channel access structures Ericsson imported from 3GU
R4‑1815631 Further discussions on band 46 intra-band DL LAA Type B multi-carrier channel access structures Ericsson imported from 3GU
R4‑1815631 Further discussions on band 46 intra-band DL LAA Type B multi-carrier channel access structures Ericsson imported from 3GU
R4‑1815632 CR for TS 36.104 Rel-13: Clarification on LAA and eLAA channel access Ericsson imported from 3GU
R4‑1815632 CR for TS 36.104 Rel-13: Clarification on LAA and eLAA channel access Ericsson imported from 3GU
R4‑1815632 CR for TS 36.104 Rel-13: Clarification on LAA and eLAA channel access Ericsson imported from 3GU
R4‑1815633 CR for TS 36.104 Rel-14: Clarification on LAA and eLAA channel access Ericsson imported from 3GU
R4‑1815633 CR for TS 36.104 Rel-14: Clarification on LAA and eLAA channel access Ericsson imported from 3GU
R4‑1815633 CR for TS 36.104 Rel-14: Clarification on LAA and eLAA channel access Ericsson imported from 3GU
R4‑1815634 CR for TS 36.104 Rel-15: Clarification on LAA and eLAA channel access Ericsson imported from 3GU
R4‑1815634 CR for TS 36.104 Rel-15: Clarification on LAA and eLAA channel access Ericsson imported from 3GU
R4‑1815634 CR for TS 36.104 Rel-15: Clarification on LAA and eLAA channel access Ericsson imported from 3GU
R4‑1815635 Reply LS to RAN plenary on channel combinations for LAA in 5GHz Ericsson imported from 3GU
R4‑1815635 Reply LS to RAN plenary on channel combinations for LAA in 5GHz Ericsson imported from 3GU
R4‑1815635 Reply LS to RAN plenary on channel combinations for LAA in 5GHz Ericsson imported from 3GU
R4‑1815636 LS to RAN2 on removing a sentence related to restriction for intra-band LAA aggregation with 4 or less carriers Ericsson imported from 3GU
R4‑1815636 LS to RAN2 on removing a sentence related to restriction for intra-band LAA aggregation with 4 or less carriers Ericsson imported from 3GU
R4‑1815636 LS to RAN2 on removing a sentence related to restriction for intra-band LAA aggregation with 4 or less carriers Ericsson imported from 3GU
R4‑1815637 LS to RAN1 for intra-band LAA aggregation Ericsson imported from 3GU
R4‑1815637 LS to RAN1 for intra-band LAA aggregation Ericsson imported from 3GU
R4‑1815637 LS to RAN1 for intra-band LAA aggregation Ericsson imported from 3GU
R4‑1815638 MRTD and MTTD requirements for NE-DC Ericsson imported from 3GU
R4‑1815638 MRTD and MTTD requirements for NE-DC Ericsson imported from 3GU
R4‑1815638 MRTD and MTTD requirements for NE-DC Ericsson imported from 3GU
R4‑1815639 Draft CR for TS 38.133: MRTD and MTTD for NE-DC Ericsson imported from 3GU
R4‑1815639 Draft CR for TS 38.133: MRTD and MTTD for NE-DC Ericsson imported from 3GU
R4‑1815639 Draft CR for TS 38.133: MRTD and MTTD for NE-DC Ericsson imported from 3GU
R4‑1815640 UE capability issues for NE-DC Ericsson imported from 3GU
R4‑1815640 UE capability issues for NE-DC Ericsson imported from 3GU
R4‑1815640 UE capability issues for NE-DC Ericsson imported from 3GU
R4‑1815641 LS to RAN2 on UE capability for NE-DC Ericsson imported from 3GU
R4‑1815641 LS to RAN2 on UE capability for NE-DC Ericsson imported from 3GU
R4‑1815641 LS to RAN2 on UE capability for NE-DC Ericsson imported from 3GU
R4‑1815642 MRTD and MTTD requirements for intra-band synchronous EN-DC Ericsson imported from 3GU
R4‑1815642 MRTD and MTTD requirements for intra-band synchronous EN-DC Ericsson imported from 3GU
R4‑1815642 MRTD and MTTD requirements for intra-band synchronous EN-DC Ericsson imported from 3GU
R4‑1815643 Draft CR for TS 38.133: MRTD and MTTD for intra-band synchornous EN-DC Ericsson imported from 3GU
R4‑1815643 Draft CR for TS 38.133: MRTD and MTTD for intra-band synchornous EN-DC Ericsson imported from 3GU
R4‑1815643 Draft CR for TS 38.133: MRTD and MTTD for intra-band synchornous EN-DC Ericsson imported from 3GU
R4‑1815644 LS to RAN2 on UE capability related to intra-band synch EN-DC Ericsson imported from 3GU
R4‑1815644 LS to RAN2 on UE capability related to intra-band synch EN-DC Ericsson imported from 3GU
R4‑1815644 LS to RAN2 on UE capability related to intra-band synch EN-DC Ericsson imported from 3GU
R4‑1815645 Overview of UE RF requirements for NR-NR DC Ericsson imported from 3GU
R4‑1815645 Overview of UE RF requirements for NR-NR DC Ericsson imported from 3GU
R4‑1815645 Overview of UE RF requirements for NR-NR DC Ericsson imported from 3GU
R4‑1815646 MRTD and MTTD requirements for synchronous NR-NR DC Ericsson imported from 3GU
R4‑1815646 MRTD and MTTD requirements for synchronous NR-NR DC Ericsson imported from 3GU
R4‑1815646 MRTD and MTTD requirements for synchronous NR-NR DC Ericsson imported from 3GU
R4‑1815647 Draft CR for TS 38.133: MRTD and MTTD for inter-band synchornous NR-NR DC Ericsson imported from 3GU
R4‑1815647 Draft CR for TS 38.133: MRTD and MTTD for inter-band synchornous NR-NR DC Ericsson imported from 3GU
R4‑1815647 Draft CR for TS 38.133: MRTD and MTTD for inter-band synchornous NR-NR DC Ericsson imported from 3GU
R4‑1815648 Further discussions on FR1-FR2 inter-band NR CA MRTD requirements Ericsson imported from 3GU
R4‑1815648 Further discussions on FR1-FR2 inter-band NR CA MRTD requirements Ericsson imported from 3GU
R4‑1815648 Further discussions on FR1-FR2 inter-band NR CA MRTD requirements Ericsson imported from 3GU
R4‑1815649 Way forward on MRTD and MTTD for inter-band NR CA between FR1 and FR2 Ericsson, CATT, T-Mobile Inc., ZTE, Nokia, Nokia Shanghai Bell, Verizon, AT&T, Vodafone, Orange, NTT Docomo Inc., Deutsche Telekom, Telecom Italia imported from 3GU
R4‑1815649 Way forward on MRTD and MTTD for inter-band NR CA between FR1 and FR2 Ericsson, CATT, T-Mobile Inc., ZTE, Nokia, Nokia Shanghai Bell, Verizon, AT&T, Vodafone, Orange, NTT Docomo Inc., Deutsche Telekom, Telecom Italia imported from 3GU
R4‑1815649 Way forward on MRTD and MTTD for inter-band NR CA between FR1 and FR2 Ericsson, CATT, T-Mobile Inc., ZTE, Nokia, Nokia Shanghai Bell, Verizon, AT&T, Vodafone, Orange, NTT Docomo Inc., Deutsche Telekom, Telecom Italia imported from 3GU
R4‑1815650 MTTD requirements for Inter-band NR CA Ericsson imported from 3GU
R4‑1815650 MTTD requirements for Inter-band NR CA Ericsson imported from 3GU
R4‑1815650 MTTD requirements for Inter-band NR CA Ericsson imported from 3GU
R4‑1815651 Draft CR for TS 38.133: MRTD and MTTD for FR1-FR2 inter-band NR CA Ericsson imported from 3GU
R4‑1815651 Draft CR for TS 38.133: MRTD and MTTD for FR1-FR2 inter-band NR CA Ericsson imported from 3GU
R4‑1815651 Draft CR for TS 38.133: MRTD and MTTD for FR1-FR2 inter-band NR CA Ericsson imported from 3GU
R4‑1815652 Scope and workplan for Rel-15 NR-U SI in RAN4 Ericsson imported from 3GU
R4‑1815652 Scope and workplan for Rel-15 NR-U SI in RAN4 Ericsson imported from 3GU
R4‑1815652 Scope and workplan for Rel-15 NR-U SI in RAN4 Ericsson imported from 3GU
R4‑1815653 Potential spectrum arrangements for NR-U Ericsson imported from 3GU
R4‑1815653 Potential spectrum arrangements for NR-U Ericsson imported from 3GU
R4‑1815653 Potential spectrum arrangements for NR-U Ericsson imported from 3GU
R4‑1815654 Assessing the need for adjacent channel coexistence studies in NR-U operation Ericsson imported from 3GU
R4‑1815654 Assessing the need for adjacent channel coexistence studies in NR-U operation Ericsson imported from 3GU
R4‑1815654 Assessing the need for adjacent channel coexistence studies in NR-U operation Ericsson imported from 3GU
R4‑1815655 Information about current regulatory work on 6GHz Ericsson imported from 3GU
R4‑1815655 Information about current regulatory work on 6GHz Ericsson imported from 3GU
R4‑1815655 Information about current regulatory work on 6GHz Ericsson imported from 3GU
R4‑1815656 On different carrier BW in 5GHz NR-U operation Ericsson imported from 3GU
R4‑1815656 On different carrier BW in 5GHz NR-U operation Ericsson imported from 3GU
R4‑1815656 On different carrier BW in 5GHz NR-U operation Ericsson imported from 3GU
R4‑1815657 TP to TR 38.889 V0.1.0 (2018-08): Conclusions from RAN4 on “Study on NR-based Access to Unlicensed Spectrum (Release 16)” Ericsson imported from 3GU
R4‑1815657 TP to TR 38.889 V0.1.0 (2018-08): Conclusions from RAN4 on “Study on NR-based Access to Unlicensed Spectrum (Release 16)” Ericsson imported from 3GU
R4‑1815657 TP to TR 38.889 V0.1.0 (2018-08): Conclusions from RAN4 on “Study on NR-based Access to Unlicensed Spectrum (Release 16)” Ericsson imported from 3GU
R4‑1815658 LS to RAN1 on TP to TR 38.889 from RAN4 Ericsson imported from 3GU
R4‑1815658 LS to RAN1 on TP to TR 38.889 from RAN4 Ericsson imported from 3GU
R4‑1815658 LS to RAN1 on TP to TR 38.889 from RAN4 Ericsson imported from 3GU
R4‑1815659 Discussion: “RAN1 LS on wideband carrier operation for NR-U” Ericsson imported from 3GU
R4‑1815659 Discussion: “RAN1 LS on wideband carrier operation for NR-U” Ericsson imported from 3GU
R4‑1815659 Discussion: “RAN1 LS on wideband carrier operation for NR-U” Ericsson imported from 3GU
R4‑1815660 Reply LS on wideband carrier operation for NR-U Ericsson imported from 3GU
R4‑1815660 Reply LS on wideband carrier operation for NR-U Ericsson imported from 3GU
R4‑1815660 Reply LS on wideband carrier operation for NR-U Ericsson imported from 3GU
R4‑1815661 Revised WI: Rel'16 LTE inter-band CA for x bands DL (x=4, 5) with 1 band UL Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815661 Revised WI: Rel'16 LTE inter-band CA for x bands DL (x=4, 5) with 1 band UL Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815661 Revised WI: Rel'16 LTE inter-band CA for x bands DL (x=4, 5) with 1 band UL Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815662 TR 36.716-04-01 v0.2.0 Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815662 TR 36.716-04-01 v0.2.0 Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815662 TR 36.716-04-01 v0.2.0 Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815663 Draft CR to 25.461: Introduction of Band 53 Nokia, Globalstar imported from 3GU
R4‑1815663 Draft CR to 25.461: Introduction of Band 53 Nokia, Globalstar imported from 3GU
R4‑1815663 Draft CR to 25.461: Introduction of Band 53 Nokia, Globalstar imported from 3GU
R4‑1815664 CR to 25.104: Introduction of Band 53 Nokia, Globalstar imported from 3GU
R4‑1815664 CR to 25.104: Introduction of Band 53 Nokia, Globalstar imported from 3GU
R4‑1815664 CR to 25.104: Introduction of Band 53 Nokia, Globalstar imported from 3GU
R4‑1815665 CR to 25.141: Introduction of Band 53 Nokia, Globalstar imported from 3GU
R4‑1815665 CR to 25.141: Introduction of Band 53 Nokia, Globalstar imported from 3GU
R4‑1815665 CR to 25.141: Introduction of Band 53 Nokia, Globalstar imported from 3GU
R4‑1815666 CR to 36.113: Introduction of Band 53 Nokia, Globalstar imported from 3GU
R4‑1815666 CR to 36.113: Introduction of Band 53 Nokia, Globalstar imported from 3GU
R4‑1815666 CR to 36.113: Introduction of Band 53 Nokia, Globalstar imported from 3GU
R4‑1815667 CR to 36.141: Introduction of Band 53 Nokia, Globalstar imported from 3GU
R4‑1815667 CR to 36.141: Introduction of Band 53 Nokia, Globalstar imported from 3GU
R4‑1815667 CR to 36.141: Introduction of Band 53 Nokia, Globalstar imported from 3GU
R4‑1815668 CR to 37.104: Introduction of Band 53 Nokia, Globalstar imported from 3GU
R4‑1815668 CR to 37.104: Introduction of Band 53 Nokia, Globalstar imported from 3GU
R4‑1815668 CR to 37.104: Introduction of Band 53 Nokia, Globalstar imported from 3GU
R4‑1815669 CR to 37.141: Introduction of Band 53 Nokia, Globalstar imported from 3GU
R4‑1815669 CR to 37.141: Introduction of Band 53 Nokia, Globalstar imported from 3GU
R4‑1815669 CR to 37.141: Introduction of Band 53 Nokia, Globalstar imported from 3GU
R4‑1815670 Usage of 5 GHz edge channels Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815670 Usage of 5 GHz edge channels Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815670 Usage of 5 GHz edge channels Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815671 CR for TS 36.104 Rel-13: Clarification on LAA channel access Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815671 CR for TS 36.104 Rel-13: Clarification on LAA channel access Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815671 CR for TS 36.104 Rel-13: Clarification on LAA channel access Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815672 CR for TS 36.104 Rel-14: Clarification on LAA and eLAA channel access Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815672 CR for TS 36.104 Rel-14: Clarification on LAA and eLAA channel access Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815672 CR for TS 36.104 Rel-14: Clarification on LAA and eLAA channel access Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815673 CR for TS 36.104 Rel-15: Clarification on LAA and eLAA channel access Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815673 CR for TS 36.104 Rel-15: Clarification on LAA and eLAA channel access Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815673 CR for TS 36.104 Rel-15: Clarification on LAA and eLAA channel access Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815674 Introduction of NR operation in MSR specification 37.141 (general) Nokia, Nokia Shanghai Bell, Ericsson imported from 3GU
R4‑1815674 Introduction of NR operation in MSR specification 37.141 (general) Nokia, Nokia Shanghai Bell, Ericsson imported from 3GU
R4‑1815674 Introduction of NR operation in MSR specification 37.141 (general) Nokia, Nokia Shanghai Bell, Ericsson imported from 3GU
R4‑1815675 Introduction of NR operation in MSR specification 37.141 (test configuration related) Nokia, Nokia Shanghai Bell, Ericsson imported from 3GU
R4‑1815675 Introduction of NR operation in MSR specification 37.141 (test configuration related) Nokia, Nokia Shanghai Bell, Ericsson imported from 3GU
R4‑1815675 Introduction of NR operation in MSR specification 37.141 (test configuration related) Nokia, Nokia Shanghai Bell, Ericsson imported from 3GU
R4‑1815676 Introduction of NR operation in MSR specification 37.141 (transmitter) Nokia, Nokia Shanghai Bell, Ericsson imported from 3GU
R4‑1815676 Introduction of NR operation in MSR specification 37.141 (transmitter) Nokia, Nokia Shanghai Bell, Ericsson imported from 3GU
R4‑1815676 Introduction of NR operation in MSR specification 37.141 (transmitter) Nokia, Nokia Shanghai Bell, Ericsson imported from 3GU
R4‑1815677 Introduction of NR operation in MSR specification 37.141 (receiver) Nokia, Nokia Shanghai Bell, Ericsson imported from 3GU
R4‑1815677 Introduction of NR operation in MSR specification 37.141 (receiver) Nokia, Nokia Shanghai Bell, Ericsson imported from 3GU
R4‑1815677 Introduction of NR operation in MSR specification 37.141 (receiver) Nokia, Nokia Shanghai Bell, Ericsson imported from 3GU
R4‑1815678 Introduction of NR operation in MSR specification 37.141 Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815678 Introduction of NR operation in MSR specification 37.141 Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815678 Introduction of NR operation in MSR specification 37.141 Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815679 Test configurations for MSR with NR Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815679 Test configurations for MSR with NR Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815679 Test configurations for MSR with NR Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815680 Corrections to NR operation in MSR specification 37.104 Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815680 Corrections to NR operation in MSR specification 37.104 Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815680 Corrections to NR operation in MSR specification 37.104 Nokia, Nokia Shanghai Bell imported from 3GU
R4‑1815681 Discussion on RF parameter for NR V2X Qualcomm Inc. imported from 3GU
R4‑1815681 Discussion on RF parameter for NR V2X Qualcomm Inc. imported from 3GU
R4‑1815681 Discussion on RF parameter for NR V2X Qualcomm Inc. imported from 3GU
R4‑1815682 CR to TR 38.817-02:Improvements of applicability table (5.6) NEC imported from 3GU
R4‑1815682 CR to TR 38.817-02:Improvements of applicability table (5.6) NEC imported from 3GU
R4‑1815682 CR to TR 38.817-02:Improvements of applicability table (5.6) NEC imported from 3GU
R4‑1815683 TP to 38.141-2: Radiated transmit power testing extreme environment conditions (6.2) NEC imported from 3GU
R4‑1815683 TP to 38.141-2: Radiated transmit power testing extreme environment conditions (6.2) NEC imported from 3GU
R4‑1815683 TP to 38.141-2: Radiated transmit power testing extreme environment conditions (6.2) NEC imported from 3GU
R4‑1815684 CR to TR 38.817-02: Classification of radiated Tx requirements (9.1) NEC imported from 3GU
R4‑1815684 CR to TR 38.817-02: Classification of radiated Tx requirements (9.1) NEC imported from 3GU
R4‑1815684 CR to TR 38.817-02: Classification of radiated Tx requirements (9.1) NEC imported from 3GU
R4‑1815685 TP to 38.141-2: OTA receiver spurious emission (7.7) NEC imported from 3GU
R4‑1815685 TP to 38.141-2: OTA receiver spurious emission (7.7) NEC imported from 3GU
R4‑1815685 TP to 38.141-2: OTA receiver spurious emission (7.7) NEC imported from 3GU
R4‑1815686 TP to 38.141-2: alignment of OTA requirement names NEC imported from 3GU
R4‑1815686 TP to 38.141-2: alignment of OTA requirement names NEC imported from 3GU
R4‑1815686 TP to 38.141-2: alignment of OTA requirement names NEC imported from 3GU
R4‑1815687 Draft CR to TS 38.104: Out-of-band blocking/OTA out-of-band blocking co-location requirement NEC imported from 3GU
R4‑1815687 Draft CR to TS 38.104: Out-of-band blocking/OTA out-of-band blocking co-location requirement NEC imported from 3GU
R4‑1815687 Draft CR to TS 38.104: Out-of-band blocking/OTA out-of-band blocking co-location requirement NEC imported from 3GU
R4‑1815688 TP to 38.141-1: Out-of-band blocking co-location requirement (7.5) NEC imported from 3GU
R4‑1815688 TP to 38.141-1: Out-of-band blocking co-location requirement (7.5) NEC imported from 3GU
R4‑1815688 TP to 38.141-1: Out-of-band blocking co-location requirement (7.5) NEC imported from 3GU
R4‑1815689 TP to 38.141-2: OTA out-of-band blocking co-location requirement (7.6) NEC imported from 3GU
R4‑1815689 TP to 38.141-2: OTA out-of-band blocking co-location requirement (7.6) NEC imported from 3GU
R4‑1815689 TP to 38.141-2: OTA out-of-band blocking co-location requirement (7.6) NEC imported from 3GU
R4‑1815690 TP to 38.141-2: Cleanup on OTA modulation quality (6.6) NEC imported from 3GU
R4‑1815690 TP to 38.141-2: Cleanup on OTA modulation quality (6.6) NEC imported from 3GU
R4‑1815690 TP to 38.141-2: Cleanup on OTA modulation quality (6.6) NEC imported from 3GU
R4‑1815691 TP to 38.141-2: Cleanup on test configurations (4.7) NEC imported from 3GU
R4‑1815691 TP to 38.141-2: Cleanup on test configurations (4.7) NEC imported from 3GU
R4‑1815691 TP to 38.141-2: Cleanup on test configurations (4.7) NEC imported from 3GU
R4‑1815692 NR CSI Reporting Simulation Results Qualcomm Incorporated imported from 3GU
R4‑1815692 NR CSI Reporting Simulation Results Qualcomm Incorporated imported from 3GU
R4‑1815692 NR CSI Reporting Simulation Results Qualcomm Incorporated imported from 3GU
R4‑1815693 CR to TR 37.843: Adding reverberation chamber in 10.8 Ericsson imported from 3GU
R4‑1815693 CR to TR 37.843: Adding reverberation chamber in 10.8 Ericsson imported from 3GU
R4‑1815693 CR to TR 37.843: Adding reverberation chamber in 10.8 Ericsson imported from 3GU
R4‑1815694 NR PDCCH Demodulation Performance Simulation Results Qualcomm Incorporated imported from 3GU
R4‑1815694 NR PDCCH Demodulation Performance Simulation Results Qualcomm Incorporated imported from 3GU
R4‑1815694 NR PDCCH Demodulation Performance Simulation Results Qualcomm Incorporated imported from 3GU
R4‑1815695 NR PBCH Demodulation Performance Simulation Results Qualcomm Incorporated imported from 3GU
R4‑1815695 NR PBCH Demodulation Performance Simulation Results Qualcomm Incorporated imported from 3GU
R4‑1815695 NR PBCH Demodulation Performance Simulation Results Qualcomm Incorporated imported from 3GU
R4‑1815696 Draft CR to TR 38.810 – RRM testing methodology Intel Corporation imported from 3GU
R4‑1815696 Draft CR to TR 38.810 – RRM testing methodology Intel Corporation imported from 3GU
R4‑1815696 Draft CR to TR 38.810 – RRM testing methodology Intel Corporation imported from 3GU
R4‑1815697 Draft CR to TR 38.810 – UE demodulation testing methodology Intel Corporation imported from 3GU
R4‑1815697 Draft CR to TR 38.810 – UE demodulation testing methodology Intel Corporation imported from 3GU
R4‑1815697 Draft CR to TR 38.810 – UE demodulation testing methodology Intel Corporation imported from 3GU
R4‑1815698 Spherical coverage performance for UE RRM requirements Intel Corporation imported from 3GU
R4‑1815698 Spherical coverage performance for UE RRM requirements Intel Corporation imported from 3GU
R4‑1815698 Spherical coverage performance for UE RRM requirements Intel Corporation imported from 3GU
R4‑1815699 TP to TS 38.101-4: Requirements applicability Intel Corporation imported from 3GU
R4‑1815699 TP to TS 38.101-4: Requirements applicability Intel Corporation imported from 3GU
R4‑1815699 TP to TS 38.101-4: Requirements applicability Intel Corporation imported from 3GU
R4‑1815700 General discussion on MIMO layer configuration from RAN2 LS Ericsson imported from 3GU
R4‑1815700 General discussion on MIMO layer configuration from RAN2 LS Ericsson imported from 3GU
R4‑1815700 General discussion on MIMO layer configuration from RAN2 LS Ericsson imported from 3GU
R4‑1815701 Reply LS to RAN2 on MIMO layer configuration Ericsson imported from 3GU
R4‑1815701 Reply LS to RAN2 on MIMO layer configuration Ericsson imported from 3GU
R4‑1815701 Reply LS to RAN2 on MIMO layer configuration Ericsson imported from 3GU
R4‑1815702 NR UE performance test open issues Ericsson imported from 3GU
R4‑1815702 NR UE performance test open issues Ericsson imported from 3GU
R4‑1815702 NR UE performance test open issues Ericsson imported from 3GU
R4‑1815703 Simulation results for NR UE PDSCH demodulation tests Ericsson imported from 3GU
R4‑1815703 Simulation results for NR UE PDSCH demodulation tests Ericsson imported from 3GU
R4‑1815703 Simulation results for NR UE PDSCH demodulation tests Ericsson imported from 3GU
R4‑1815704 Simulation results for NR UE PDCCH demodulation tests Ericsson imported from 3GU
R4‑1815704 Simulation results for NR UE PDCCH demodulation tests Ericsson imported from 3GU
R4‑1815704 Simulation results for NR UE PDCCH demodulation tests Ericsson imported from 3GU
R4‑1815705 Simulation results for NR UE CSI tests Ericsson imported from 3GU
R4‑1815705 Simulation results for NR UE CSI tests Ericsson imported from 3GU
R4‑1815705 Simulation results for NR UE CSI tests Ericsson imported from 3GU
R4‑1815706 Summary of alignment and impairment results for NR UE PDCCH demodulation tests Ericsson imported from 3GU
R4‑1815706 Summary of alignment and impairment results for NR UE PDCCH demodulation tests Ericsson imported from 3GU
R4‑1815706 Summary of alignment and impairment results for NR UE PDCCH demodulation tests Ericsson imported from 3GU
R4‑1815707 TP on performance specification 38.101-4 Chapterr 5~8 general part with applicability rules Ericsson imported from 3GU
R4‑1815707 TP on performance specification 38.101-4 Chapterr 5~8 general part with applicability rules Ericsson imported from 3GU
R4‑1815707 TP on performance specification 38.101-4 Chapterr 5~8 general part with applicability rules Ericsson imported from 3GU
R4‑1815708 Draft CR to TS 38.104 – PUSCH requirements with CP-OFDM for FR2 Ericsson imported from 3GU
R4‑1815708 Draft CR to TS 38.104 – PUSCH requirements with CP-OFDM for FR2 Ericsson imported from 3GU
R4‑1815708 Draft CR to TS 38.104 – PUSCH requirements with CP-OFDM for FR2 Ericsson imported from 3GU
R4‑1815709 TP to 38.141-2 – PUSCH requirements with CP-OFDM for FR2 Ericsson imported from 3GU
R4‑1815709 TP to 38.141-2 – PUSCH requirements with CP-OFDM for FR2 Ericsson imported from 3GU
R4‑1815709 TP to 38.141-2 – PUSCH requirements with CP-OFDM for FR2 Ericsson imported from 3GU
R4‑1815710 Open issues for FR2 BS Demodulation Simulations with Impairments Ericsson imported from 3GU
R4‑1815710 Open issues for FR2 BS Demodulation Simulations with Impairments Ericsson imported from 3GU
R4‑1815710 Open issues for FR2 BS Demodulation Simulations with Impairments Ericsson imported from 3GU
R4‑1815711 Discussion and FR1 simulation results for NR PUSCH demodulation requirements Ericsson imported from 3GU
R4‑1815711 Discussion and FR1 simulation results for NR PUSCH demodulation requirements Ericsson imported from 3GU
R4‑1815711 Discussion and FR1 simulation results for NR PUSCH demodulation requirements Ericsson imported from 3GU
R4‑1815712 FR2 ideal simulation results for NR PUSCH demodulation requirements Ericsson imported from 3GU
R4‑1815712 FR2 ideal simulation results for NR PUSCH demodulation requirements Ericsson imported from 3GU
R4‑1815712 FR2 ideal simulation results for NR PUSCH demodulation requirements Ericsson imported from 3GU
R4‑1815713 Simulation results and proposals for network-based CRS interference mitigation UE demodulation tests Ericsson imported from 3GU
R4‑1815713 Simulation results and proposals for network-based CRS interference mitigation UE demodulation tests Ericsson imported from 3GU
R4‑1815713 Simulation results and proposals for network-based CRS interference mitigation UE demodulation tests Ericsson imported from 3GU
R4‑1815714 CR for demodulation performance requirements for network-based CRS interference mitigation Ericsson imported from 3GU
R4‑1815714 CR for demodulation performance requirements for network-based CRS interference mitigation Ericsson imported from 3GU
R4‑1815714 CR for demodulation performance requirements for network-based CRS interference mitigation Ericsson imported from 3GU
R4‑1815715 Summary of alignment and impairment results of for network-based CRS interference mitigation Ericsson imported from 3GU
R4‑1815715 Summary of alignment and impairment results of for network-based CRS interference mitigation Ericsson imported from 3GU
R4‑1815715 Summary of alignment and impairment results of for network-based CRS interference mitigation Ericsson imported from 3GU
R4‑1815716 NR PDSCH Demodulation Performance Simulation Results Qualcomm Incorporated imported from 3GU
R4‑1815716 NR PDSCH Demodulation Performance Simulation Results Qualcomm Incorporated imported from 3GU
R4‑1815716 NR PDSCH Demodulation Performance Simulation Results Qualcomm Incorporated imported from 3GU
R4‑1815717 exception for NBIOT B26 GB operation Qualcomm imported from 3GU
R4‑1815717 exception for NBIOT B26 GB operation Qualcomm imported from 3GU
R4‑1815717 exception for NBIOT B26 GB operation Qualcomm imported from 3GU
R4‑1815718 NR PDSCH SDR Performance Simulation Results Qualcomm Incorporated imported from 3GU
R4‑1815718 NR PDSCH SDR Performance Simulation Results Qualcomm Incorporated imported from 3GU
R4‑1815718 NR PDSCH SDR Performance Simulation Results Qualcomm Incorporated imported from 3GU
R4‑1815719 NR RLM Simulation Results Qualcomm Incorporated imported from 3GU
R4‑1815719 NR RLM Simulation Results Qualcomm Incorporated imported from 3GU
R4‑1815719 NR RLM Simulation Results Qualcomm Incorporated imported from 3GU
R4‑1815720 Interruption on Serving Cells due to BWP Switching Ericsson imported from 3GU
R4‑1815720 Interruption on Serving Cells due to BWP Switching Ericsson imported from 3GU
R4‑1815720 Interruption on Serving Cells due to BWP Switching Ericsson imported from 3GU
R4‑1815721 Interruption Requirements on LTE Serving Cells due to BWP Switching in EN-DC Ericsson imported from 3GU
R4‑1815721 Interruption Requirements on LTE Serving Cells due to BWP Switching in EN-DC Ericsson imported from 3GU
R4‑1815721 Interruption Requirements on LTE Serving Cells due to BWP Switching in EN-DC Ericsson imported from 3GU
R4‑1815722 Correction to SS-RSRQ Measurement Report Mapping Ericsson, Mediatek imported from 3GU
R4‑1815722 Correction to SS-RSRQ Measurement Report Mapping Ericsson, Mediatek imported from 3GU
R4‑1815722 Correction to SS-RSRQ Measurement Report Mapping Ericsson, Mediatek imported from 3GU
R4‑1815723 Analysis of requirements for RRC connection release with redirection from LTE to NR Ericsson imported from 3GU
R4‑1815723 Analysis of requirements for RRC connection release with redirection from LTE to NR Ericsson imported from 3GU
R4‑1815723 Analysis of requirements for RRC connection release with redirection from LTE to NR Ericsson imported from 3GU
R4‑1815724 RRC connection release with redirection delay from LTE to NR Ericsson imported from 3GU
R4‑1815724 RRC connection release with redirection delay from LTE to NR Ericsson imported from 3GU
R4‑1815724 RRC connection release with redirection delay from LTE to NR Ericsson imported from 3GU
R4‑1815725 Correction to RRC connection release with redirection delay to NR Ericsson imported from 3GU
R4‑1815725 Correction to RRC connection release with redirection delay to NR Ericsson imported from 3GU
R4‑1815725 Correction to RRC connection release with redirection delay to NR Ericsson imported from 3GU
R4‑1815726 Analysis of inter-frequency measurement requirements under colliding SMTC occasions in Idle/Inactive States Ericsson imported from 3GU
R4‑1815726 Analysis of inter-frequency measurement requirements under colliding SMTC occasions in Idle/Inactive States Ericsson imported from 3GU
R4‑1815726 Analysis of inter-frequency measurement requirements under colliding SMTC occasions in Idle/Inactive States Ericsson imported from 3GU
R4‑1815727 Inter-frequency Measurement Requirements under SMTC Collision in Idle/Inactive States Ericsson, Mediatek, Intel imported from 3GU
R4‑1815727 Inter-frequency Measurement Requirements under SMTC Collision in Idle/Inactive States Ericsson, Mediatek, Intel imported from 3GU
R4‑1815727 Inter-frequency Measurement Requirements under SMTC Collision in Idle/Inactive States Ericsson, Mediatek, Intel imported from 3GU
R4‑1815728 Phase I-17B: Inter-RAT E-UTRAN Event Trigger Reporting in FR1 in DRX Test Case Ericsson imported from 3GU
R4‑1815728 Phase I-17B: Inter-RAT E-UTRAN Event Trigger Reporting in FR1 in DRX Test Case Ericsson imported from 3GU
R4‑1815728 Phase I-17B: Inter-RAT E-UTRAN Event Trigger Reporting in FR1 in DRX Test Case Ericsson imported from 3GU
R4‑1815729 Correction to Phase I-17 B: Inter-RAT E-UTRAN Event Trigger Reporting Test Case Ericsson imported from 3GU
R4‑1815729 Correction to Phase I-17 B: Inter-RAT E-UTRAN Event Trigger Reporting Test Case Ericsson imported from 3GU
R4‑1815729 Correction to Phase I-17 B: Inter-RAT E-UTRAN Event Trigger Reporting Test Case Ericsson imported from 3GU
R4‑1815730 Correction to SSB Configurations for RRM Test Cases Ericsson imported from 3GU
R4‑1815730 Correction to SSB Configurations for RRM Test Cases Ericsson imported from 3GU
R4‑1815730 Correction to SSB Configurations for RRM Test Cases Ericsson imported from 3GU
R4‑1815731 Correction to SMTC Configurations for RRM Test Cases Ericsson imported from 3GU
R4‑1815731 Correction to SMTC Configurations for RRM Test Cases Ericsson imported from 3GU
R4‑1815731 Correction to SMTC Configurations for RRM Test Cases Ericsson imported from 3GU
R4‑1815732 DRX Configurations for RRM Test Cases Ericsson imported from 3GU
R4‑1815732 DRX Configurations for RRM Test Cases Ericsson imported from 3GU
R4‑1815732 DRX Configurations for RRM Test Cases Ericsson imported from 3GU
R4‑1815733 Applicability Rules for RRM Test Cases with different SSB configurations Ericsson imported from 3GU
R4‑1815733 Applicability Rules for RRM Test Cases with different SSB configurations Ericsson imported from 3GU
R4‑1815733 Applicability Rules for RRM Test Cases with different SSB configurations Ericsson imported from 3GU
R4‑1815734 Applicability Rules for RRM Test Cases with Different Channel Bandwidths Ericsson imported from 3GU
R4‑1815734 Applicability Rules for RRM Test Cases with Different Channel Bandwidths Ericsson imported from 3GU
R4‑1815734 Applicability Rules for RRM Test Cases with Different Channel Bandwidths Ericsson imported from 3GU
R4‑1815735 Applicability Rules for RRM DC/CA Test Cases with Different Channel Bandwidth Combinations Ericsson imported from 3GU
R4‑1815735 Applicability Rules for RRM DC/CA Test Cases with Different Channel Bandwidth Combinations Ericsson imported from 3GU
R4‑1815735 Applicability Rules for RRM DC/CA Test Cases with Different Channel Bandwidth Combinations Ericsson imported from 3GU
R4‑1815736 Applicability Rules for RRM test cases with Different Duplex Modes Ericsson imported from 3GU
R4‑1815736 Applicability Rules for RRM test cases with Different Duplex Modes Ericsson imported from 3GU
R4‑1815736 Applicability Rules for RRM test cases with Different Duplex Modes Ericsson imported from 3GU
R4‑1815737 Applicability Rules for RRM EN-DC test cases with Synchronous and Asynchronous EN-DC Ericsson imported from 3GU
R4‑1815737 Applicability Rules for RRM EN-DC test cases with Synchronous and Asynchronous EN-DC Ericsson imported from 3GU
R4‑1815737 Applicability Rules for RRM EN-DC test cases with Synchronous and Asynchronous EN-DC Ericsson imported from 3GU
R4‑1815738 Further Analysis of SCell Direct Activation and Direct Hibernation at RRC Configuration during HO Ericsson imported from 3GU
R4‑1815738 Further Analysis of SCell Direct Activation and Direct Hibernation at RRC Configuration during HO Ericsson imported from 3GU
R4‑1815738 Further Analysis of SCell Direct Activation and Direct Hibernation at RRC Configuration during HO Ericsson imported from 3GU
R4‑1815739 Requirements for SCell Direct Activation and Direct Hibernation at RRC Configuration during HO Ericsson imported from 3GU
R4‑1815739 Requirements for SCell Direct Activation and Direct Hibernation at RRC Configuration during HO Ericsson imported from 3GU
R4‑1815739 Requirements for SCell Direct Activation and Direct Hibernation at RRC Configuration during HO Ericsson imported from 3GU
R4‑1815740 Hypothetical PDCCH parameters for RLM and BFD Qualcomm Incorporated imported from 3GU
R4‑1815740 Hypothetical PDCCH parameters for RLM and BFD Qualcomm Incorporated imported from 3GU
R4‑1815740 Hypothetical PDCCH parameters for RLM and BFD Qualcomm Incorporated imported from 3GU
R4‑1815741 Draft CR on Hypothetical PDCCH parameters for RLM and Beam Failure Detection Requirements Qualcomm Incorporated imported from 3GU
R4‑1815741 Draft CR on Hypothetical PDCCH parameters for RLM and Beam Failure Detection Requirements Qualcomm Incorporated imported from 3GU
R4‑1815741 Draft CR on Hypothetical PDCCH parameters for RLM and Beam Failure Detection Requirements Qualcomm Incorporated imported from 3GU
R4‑1815742 CR to 38.133 on Link Recovery Procedures (Section 8.5) Intel Corporation imported from 3GU
R4‑1815742 CR to 38.133 on Link Recovery Procedures (Section 8.5) Intel Corporation imported from 3GU
R4‑1815742 CR to 38.133 on Link Recovery Procedures (Section 8.5) Intel Corporation imported from 3GU
R4‑1815743 Views on PDSCH Demodulation Performance Tests Qualcomm Incorporated imported from 3GU
R4‑1815743 Views on PDSCH Demodulation Performance Tests Qualcomm Incorporated imported from 3GU
R4‑1815743 Views on PDSCH Demodulation Performance Tests Qualcomm Incorporated imported from 3GU
R4‑1815744 Cleanup in RRM requirements Ericsson imported from 3GU
R4‑1815744 Cleanup in RRM requirements Ericsson imported from 3GU
R4‑1815744 Cleanup in RRM requirements Ericsson imported from 3GU
R4‑1815745 Corrections in network-based CRS interference mitigation requirements Ericsson imported from 3GU
R4‑1815745 Corrections in network-based CRS interference mitigation requirements Ericsson imported from 3GU
R4‑1815745 Corrections in network-based CRS interference mitigation requirements Ericsson imported from 3GU
R4‑1815746 On sTTI with network-based CRS interference mitigation Ericsson imported from 3GU
R4‑1815746 On sTTI with network-based CRS interference mitigation Ericsson imported from 3GU
R4‑1815746 On sTTI with network-based CRS interference mitigation Ericsson imported from 3GU
R4‑1815747 Intra-frequency FDD test cases for RSTD measurement period under new measurement gaps for CE Mode B Ericsson imported from 3GU
R4‑1815747 Intra-frequency FDD test cases for RSTD measurement period under new measurement gaps for CE Mode B Ericsson imported from 3GU
R4‑1815747 Intra-frequency FDD test cases for RSTD measurement period under new measurement gaps for CE Mode B Ericsson imported from 3GU
R4‑1815748 Intra-frequency HD-FDD test cases for RSTD measurement period under new measurement gaps for CE Mode B Ericsson imported from 3GU
R4‑1815748 Intra-frequency HD-FDD test cases for RSTD measurement period under new measurement gaps for CE Mode B Ericsson imported from 3GU
R4‑1815748 Intra-frequency HD-FDD test cases for RSTD measurement period under new measurement gaps for CE Mode B Ericsson imported from 3GU
R4‑1815749 Intra-frequency TDD test cases for RSTD measurement period under new measurement gaps for CE Mode B Ericsson imported from 3GU
R4‑1815749 Intra-frequency TDD test cases for RSTD measurement period under new measurement gaps for CE Mode B Ericsson imported from 3GU
R4‑1815749 Intra-frequency TDD test cases for RSTD measurement period under new measurement gaps for CE Mode B Ericsson imported from 3GU
R4‑1815750 Inter-frequency FDD test cases for RSTD measurement period under new measurement gaps for CE Mode B Ericsson imported from 3GU
R4‑1815750 Inter-frequency FDD test cases for RSTD measurement period under new measurement gaps for CE Mode B Ericsson imported from 3GU
R4‑1815750 Inter-frequency FDD test cases for RSTD measurement period under new measurement gaps for CE Mode B Ericsson imported from 3GU
R4‑1815751 Inter-frequency HD-FDD test cases for RSTD measurement period under new measurement gaps for CE Mode B Ericsson imported from 3GU
R4‑1815751 Inter-frequency HD-FDD test cases for RSTD measurement period under new measurement gaps for CE Mode B Ericsson imported from 3GU
R4‑1815751 Inter-frequency HD-FDD test cases for RSTD measurement period under new measurement gaps for CE Mode B Ericsson imported from 3GU
R4‑1815752 Inter-frequency TDD test cases for RSTD measurement period under new measurement gaps for CE Mode B Ericsson imported from 3GU
R4‑1815752 Inter-frequency TDD test cases for RSTD measurement period under new measurement gaps for CE Mode B Ericsson imported from 3GU
R4‑1815752 Inter-frequency TDD test cases for RSTD measurement period under new measurement gaps for CE Mode B Ericsson imported from 3GU
R4‑1815753 Correction in FeMTC RSTD test cases Ericsson imported from 3GU
R4‑1815753 Correction in FeMTC RSTD test cases Ericsson imported from 3GU
R4‑1815753 Correction in FeMTC RSTD test cases Ericsson imported from 3GU
R4‑1815754 Correction in FeMTC RSTD test cases Ericsson imported from 3GU
R4‑1815754 Correction in FeMTC RSTD test cases Ericsson imported from 3GU
R4‑1815754 Correction in FeMTC RSTD test cases Ericsson imported from 3GU
R4‑1815755 Inter-RAT NR measurement accuracy requirements Ericsson imported from 3GU
R4‑1815755 Inter-RAT NR measurement accuracy requirements Ericsson imported from 3GU
R4‑1815755 Inter-RAT NR measurement accuracy requirements Ericsson imported from 3GU
R4‑1815756 Side conditions for inter-RAT NR measurements in EN-DC case Ericsson imported from 3GU
R4‑1815756 Side conditions for inter-RAT NR measurements in EN-DC case Ericsson imported from 3GU
R4‑1815756 Side conditions for inter-RAT NR measurements in EN-DC case Ericsson imported from 3GU
R4‑1815757 Side conditions for inter-RAT NR measurements in non-EN-DC case Ericsson imported from 3GU
R4‑1815757 Side conditions for inter-RAT NR measurements in non-EN-DC case Ericsson imported from 3GU
R4‑1815757 Side conditions for inter-RAT NR measurements in non-EN-DC case Ericsson imported from 3GU
R4‑1815758 Adding references to SUL-related side conditions Ericsson imported from 3GU
R4‑1815758 Adding references to SUL-related side conditions Ericsson imported from 3GU
R4‑1815758 Adding references to SUL-related side conditions Ericsson imported from 3GU
R4‑1815759 Phase 2-21B: FR1-SA interruptions at UL carrier RRC reconfiguration Ericsson imported from 3GU
R4‑1815759 Phase 2-21B: FR1-SA interruptions at UL carrier RRC reconfiguration Ericsson imported from 3GU
R4‑1815759 Phase 2-21B: FR1-SA interruptions at UL carrier RRC reconfiguration Ericsson imported from 3GU
R4‑1815760 Phase 2-21B: FR2-SA interruptions at UL carrier RRC reconfiguration Ericsson imported from 3GU
R4‑1815760 Phase 2-21B: FR2-SA interruptions at UL carrier RRC reconfiguration Ericsson imported from 3GU
R4‑1815760 Phase 2-21B: FR2-SA interruptions at UL carrier RRC reconfiguration Ericsson imported from 3GU
R4‑1815761 On SFN acquisition requirements for E-UTRA RSTD measurements Ericsson imported from 3GU
R4‑1815761 On SFN acquisition requirements for E-UTRA RSTD measurements Ericsson imported from 3GU
R4‑1815761 On SFN acquisition requirements for E-UTRA RSTD measurements Ericsson imported from 3GU
R4‑1815762 SFN acquisition requirements for E-UTRA FDD RSTD measurements Ericsson imported from 3GU
R4‑1815762 SFN acquisition requirements for E-UTRA FDD RSTD measurements Ericsson imported from 3GU
R4‑1815762 SFN acquisition requirements for E-UTRA FDD RSTD measurements Ericsson imported from 3GU
R4‑1815763 SFN acquisition requirements for E-UTRA TDD RSTD measurements Ericsson imported from 3GU
R4‑1815763 SFN acquisition requirements for E-UTRA TDD RSTD measurements Ericsson imported from 3GU
R4‑1815763 SFN acquisition requirements for E-UTRA TDD RSTD measurements Ericsson imported from 3GU
R4‑1815764 LS on SFN offset for OTDOA Ericsson imported from 3GU
R4‑1815764 LS on SFN offset for OTDOA Ericsson imported from 3GU
R4‑1815764 LS on SFN offset for OTDOA Ericsson imported from 3GU
R4‑1815765 Beamsweeping in RRC_IDLE mode Ericsson imported from 3GU
R4‑1815765 Beamsweeping in RRC_IDLE mode Ericsson imported from 3GU
R4‑1815765 Beamsweeping in RRC_IDLE mode Ericsson imported from 3GU
R4‑1815766 Correction in NR RLM Ericsson imported from 3GU
R4‑1815766 Correction in NR RLM Ericsson imported from 3GU
R4‑1815766 Correction in NR RLM Ericsson imported from 3GU
R4‑1815767 Updates in bands grouping Ericsson imported from 3GU
R4‑1815767 Updates in bands grouping Ericsson imported from 3GU
R4‑1815767 Updates in bands grouping Ericsson imported from 3GU
R4‑1815768 Introduction of completed LTE CA for 2 bands DL with 2 bands UL into Rel-16 TS 36.101 Huawei, HiSilicon imported from 3GU
R4‑1815768 Introduction of completed LTE CA for 2 bands DL with 2 bands UL into Rel-16 TS 36.101 Huawei, HiSilicon imported from 3GU
R4‑1815768 Introduction of completed LTE CA for 2 bands DL with 2 bands UL into Rel-16 TS 36.101 Huawei, HiSilicon imported from 3GU
R4‑1815769 Band 71 and Band 41 Intra-Band EN_DC Measurements for Back-Off Compensation Scheme and Band 41 MPR Skyworks Solutions Inc. imported from 3GU
R4‑1815769 Band 71 and Band 41 Intra-Band EN_DC Measurements for Back-Off Compensation Scheme and Band 41 MPR