The Mobile
Broadband Standard

3GPP TDocs (written contributions) at meeting

Meeting: R5-81 - 2018-11-12 to 2018-11-16, Spokane

meeting id: R5-81 (click id for more info on this meeting)

Click on the Tdoc to open its file.

TDoc Title Source Remarks
R5‑186400 Agenda - opening session WG Chairman imported from 3GU
R5‑186401 Agenda - mid week session WG Chairman imported from 3GU
R5‑186402 Agenda - closing session WG Chairman imported from 3GU
R5‑186403 RAN5#81 Session Programme WG Chairman imported from 3GU
R5‑186404 RAN5 Leadership Team WG Chairman imported from 3GU
R5‑186405 RAN5#80 WG Minutes ETSI Secretariat imported from 3GU
R5‑186406 RAN5#80 WG Action Points ETSI Secretariat imported from 3GU
R5‑186407 RAN5#3 5G-NR Adhoc Minutes ETSI Secretariat imported from 3GU
R5‑186408 Latest RAN Plenary notes WG Chairman imported from 3GU
R5‑186409 Latest RAN Plenary draft Report WG Chairman imported from 3GU
R5‑186410 Post Plenary Active Work Item update ETSI Secretariat imported from 3GU
R5‑186411 RAN5 SR to RP#81 WG Chairman imported from 3GU
R5‑186412 TF160 SR to RP#81 WG Chairman imported from 3GU
R5‑186413 RAN Chair Report to SA#81 WG Chairman imported from 3GU
R5‑186414 RAN5#81 LS Template WG Chairman imported from 3GU
R5‑186415 RAN5 5GS Text Proposal / pCR cover sheet template Ericsson imported from 3GU
R5‑186416 Meeting schedule for 2018-19 WG Chairman imported from 3GU
R5‑186417 WI Progress and Target Completion Date Review WG Chairman imported from 3GU
R5‑186418 Review deadlines for next quarter WG Chairman imported from 3GU
R5‑186419 Input to TF160 and RAN5 Regarding TTCN Development PTCRB imported from 3GU
R5‑186420 LS on Joint ETSI - OSA Workshop: Open Implementations & Standardization ETSI imported from 3GU
R5‑186421 Carrier Aggregation Optimization PTCRB PVG imported from 3GU
R5‑186422 LS on Definition of test methods for OTA unwanted emissions of IMT radio equipment TSG RAN imported from 3GU
R5‑186423 Reply LS on LTE OTA TRP and TRS requirements definition in 3GPP TSG RAN imported from 3GU
R5‑186424 LS to RAN5 on TM9 FGI bits 103 and 104 TSG RAN imported from 3GU
R5‑186425 dummy LS a ETSI Secretariat imported from 3GU
R5‑186426 dummy LS b ETSI Secretariat imported from 3GU
R5‑186427 Update SIB1 Ericsson, Huawei, HiSilicon imported from 3GU
R5‑186428 Addition of new Test Configuration on TC 6.2.2A.2 DEKRA imported from 3GU
R5‑186429 Addition of new Test Configuration on TC 6.2.3A.2 DEKRA imported from 3GU
R5‑186430 Addition of new Test Configuration on TC 6.2.3A.2_1 DEKRA imported from 3GU
R5‑186431 Addition of new Test Configuration on TC 6.2.4A.2 DEKRA imported from 3GU
R5‑186432 Addition of new Test Configuration on TC 6.2.4A.2_1 DEKRA imported from 3GU
R5‑186433 Addition of new Test Configuration on TC 6.2.5A.3 DEKRA imported from 3GU
R5‑186434 Addition of new Test Configuration on TC 6.3.4A.1.2 DEKRA imported from 3GU
R5‑186435 Addition of new Test Configuration on TC 6.3.5A.1.2 DEKRA imported from 3GU
R5‑186436 Addition of new Test Configuration on TC 6.3.5A.3.2 DEKRA imported from 3GU
R5‑186437 Addition of new Test Configuration on TC 6.5.1A.2 DEKRA imported from 3GU
R5‑186438 Addition of new Test Configuration on TC 6.5.2A.1.2 DEKRA imported from 3GU
R5‑186439 Addition of new Test Configuration on TC 6.5.2A.1.2_1 DEKRA imported from 3GU
R5‑186440 Addition of new Test Configuration on TC 6.5.2A.2.2 DEKRA imported from 3GU
R5‑186441 Addition of new Test Configuration on TC 6.5.2A.3.2 DEKRA imported from 3GU
R5‑186442 Addition of new Test Configuration on TC 6.6.1A.2 DEKRA imported from 3GU
R5‑186443 Addition of new Test Configuration on TC 6.6.2.1A.2 DEKRA imported from 3GU
R5‑186444 Addition of new Test Configuration on TC 6.6.2.2A.2_1 DEKRA imported from 3GU
R5‑186445 Addition of new Test Configuration on TC 6.6.2.2A.2_1 DEKRA imported from 3GU
R5‑186446 Addition of new Test Configuration on TC 6.6.2.3A.2 DEKRA imported from 3GU
R5‑186447 Addition of new Test Configuration on TC 6.6.2.3A.2_1 DEKRA imported from 3GU
R5‑186448 Addition of new Test Configuration on TC 6.6.3.1A.2 DEKRA imported from 3GU
R5‑186449 Addition of new Test Configuration on TC 6.7A.2 DEKRA imported from 3GU
R5‑186450 Addition of test point calculation for BW combination 75-25 in TC 6.2.4A.2 DEKRA imported from 3GU
R5‑186451 Discussion paper on Session Timer coverage ROHDE & SCHWARZ, Intel imported from 3GU
R5‑186452 Corrections to IMS test case G.17.2 ROHDE & SCHWARZ imported from 3GU
R5‑186453 Updates to clause 4.3.3,^^physical channel allocations Ericsson imported from 3GU
R5‑186454 TP analysis for test case 6.5.2.4.2 Ericsson imported from 3GU
R5‑186455 TP analysis for EN-DC test case 6.2B.2.3 Ericsson imported from 3GU
R5‑186456 Corrections to C.32 and C.32a ROHDE & SCHWARZ imported from 3GU
R5‑186457 Correction to E-UTRA test frequency for intra-band contiguous configuration for band 41 Ericsson imported from 3GU
R5‑186458 Corrections to EMM test case 9.2.3.1.8b ROHDE & SCHWARZ, INTEL imported from 3GU
R5‑186459 Corrections to IMS test case 15.25 ROHDE & SCHWARZ imported from 3GU
R5‑186460 Update Clause 1 Scope of TS 38.522 CMCC imported from 3GU
R5‑186461 Update Clause 3 of TS 38.522 CMCC imported from 3GU
R5‑186462 TP for Clause 4.1.1 of TS 38.522 CMCC imported from 3GU
R5‑186463 TP for Clause 4.1.2 of TS 38.522 CMCC imported from 3GU
R5‑186464 TP for Clause 4.1.3 of TS 38.522 CMCC imported from 3GU
R5‑186465 Introduction of TC 7.7D Spurious response for UL-MIMO CMCC, Huawei imported from 3GU
R5‑186466 Correction to TC 7.7B Spurious response for UL-MIMO CMCC imported from 3GU
R5‑186467 Clarifications on applicability of OIR and TIR ROHDE & SCHWARZ imported from 3GU
R5‑186468 E-UTRA test frequencies for EN-DC intra-band contiguous configurations for band 71 Ericsson imported from 3GU
R5‑186469 Addition to E-UTRA test frequencies for intra-band contiguous configuration for band 41 Ericsson imported from 3GU
R5‑186470 Wordings for Uplink NAS messages ROHDE & SCHWARZ imported from 3GU
R5‑186471 Impacted 5G NR TSs and clauses by agreed CRs at RAN5#3-5G-NR ad-hoc Ericsson imported from 3GU
R5‑186472 NB-IoT Band70 In-band frequency for 10Mhz Mid range ROHDE & SCHWARZ imported from 3GU
R5‑186473 New NCell for NB-IOT RRM Intra-Freq Cell reselection ROHDE & SCHWARZ imported from 3GU
R5‑186474 Chapter 9 RRM Generic CA tests - Anpplicability ROHDE & SCHWARZ imported from 3GU
R5‑186475 Completion of TC 9.1.69 and 9.1.70 ROHDE & SCHWARZ imported from 3GU
R5‑186476 Completion of TC 9.2.56 and 9.2.57 ROHDE & SCHWARZ imported from 3GU
R5‑186477 Chapter 9 RRM Generic CA tests - Annexes ROHDE & SCHWARZ imported from 3GU
R5‑186478 Alignment NPRACH configuration (Editorial) ROHDE & SCHWARZ imported from 3GU
R5‑186479 Correction for 4.2.19 ROHDE & SCHWARZ imported from 3GU
R5‑186480 Correction for 4.2.24 Cell ID selection procedure ROHDE & SCHWARZ imported from 3GU
R5‑186481 Core spec alignment 4.2.24 ROHDE & SCHWARZ imported from 3GU
R5‑186482 Corrections for 7.2.6 and 7.2.7 ROHDE & SCHWARZ imported from 3GU
R5‑186483 Correction for 7.3.50 and 7.3.51 ROHDE & SCHWARZ imported from 3GU
R5‑186484 Correction for 8.1.28 ROHDE & SCHWARZ imported from 3GU
R5‑186485 Removal of reference to H.7.1-2 for RRM 7.3.5x series ROHDE & SCHWARZ imported from 3GU
R5‑186486 Add band group FDD B1 and B2 to RSRQ tests - Rel8 ROHDE & SCHWARZ imported from 3GU
R5‑186487 Add band group FDD B1 and B2 to RSRQ tests - Rel11 ROHDE & SCHWARZ imported from 3GU
R5‑186488 Add band group FDD B1 and B2 to RSRQ tests - Rel12 ROHDE & SCHWARZ imported from 3GU
R5‑186489 Resubmission of CR 0269 ROHDE & SCHWARZ imported from 3GU
R5‑186490 Update chapter 4.5 for RF connected procedure Ericsson imported from 3GU
R5‑186491 Update chapter 4.5 for RF connected procedure Ericsson, Keysight Technologies imported from 3GU
R5‑186492 Update chapter 4.5.4 RRC_CONNECTED Ericsson imported from 3GU
R5‑186493 Introduction of TC 7.6.4 Narrow-band blocking CAICT imported from 3GU
R5‑186494 Introduction of TC 7.7 Spurious response CAICT imported from 3GU
R5‑186495 Discussion on test point selection for NR Narrow-band in FR1 CAICT imported from 3GU
R5‑186496 Discussion on test point selection for NR Spurious response in FR1 CAICT imported from 3GU
R5‑186497 CR to TS 38.521-1: pi/2 BPSK on n41 CMCC, Huawei imported from 3GU
R5‑186498 Corrections to NAS test case 9.1.5.1.14 ROHDE & SCHWARZ imported from 3GU
R5‑186499 Default cell configurations for NAS ROHDE & SCHWARZ imported from 3GU
R5‑186500 Update IE SI-SchedulingInfo Ericsson, Huawei, HiSilicon imported from 3GU
R5‑186501 Applicability rules implementation in 38.522 Qualcomm Finland RFFE Oy imported from 3GU
R5‑186502 FR2 Spurious Emission test case updates Qualcomm Finland RFFE Oy imported from 3GU
R5‑186503 FR2 Spurious Emission test case updates Qualcomm Finland RFFE Oy imported from 3GU
R5‑186504 FR2 RefSens test case updates Qualcomm Finland RFFE Oy imported from 3GU
R5‑186505 Update Text on Store Beam Peak Coordinate Qualcomm Finland RFFE Oy imported from 3GU
R5‑186506 Update Text on Store Beam Peak Coordinate Qualcomm Finland RFFE Oy imported from 3GU
R5‑186507 38.521-3 Applicability Rules Qualcomm Finland RFFE Oy imported from 3GU
R5‑186508 FR2 UE and TE radiated connection diagram Qualcomm Finland RFFE Oy imported from 3GU
R5‑186509 FR2 Spurious Emission measurement grids and offset values Qualcomm Inc, Anritsu. imported from 3GU
R5‑186510 Structure updates to Annex C and G Qualcomm Finland RFFE Oy imported from 3GU
R5‑186511 Addition CA 2A2A29A and CA 2A2A29A30A 36.521-2 ECIT imported from 3GU
R5‑186512 Addition CA 2A2A29A and CA 2A2A29A30A 36.523-2 ECIT imported from 3GU
R5‑186513 Addition CA 2A29A66A 36.521-2 ECIT imported from 3GU
R5‑186514 Addition CA 2A29A66A 36.523-2 ECIT imported from 3GU
R5‑186515 Addition CA 2A30A66A66A 36.521-2 ECIT imported from 3GU
R5‑186516 Addition CA 2A30A66A66A 36.523-2 ECIT imported from 3GU
R5‑186517 Addition CA 7A66A and CA 2A7A66A 36.521-2 ECIT imported from 3GU
R5‑186518 Addition CA 7A66A and CA 2A7A66A 36.523-2 ECIT imported from 3GU
R5‑186519 Addition CA combination 36.521-1_CA_2A-2A-29A and CA_2A-2A-29A-30A ECIT imported from 3GU
R5‑186520 Addition CA combination 36.521-1_CA_2A-29A-66A ECIT imported from 3GU
R5‑186521 Addition CA 2A2A7A and CA 2A2A7A66A 36.521-2 ECIT imported from 3GU
R5‑186522 Addition CA 2A2A7A and CA 2A2A7A66A 36.523-2 ECIT imported from 3GU
R5‑186523 Addition CA 2A2A14A and CA 2A2A14A30A and CA 2A2A14A66A and CA 2A2A14A30A66A 36.521-2 ECIT imported from 3GU
R5‑186524 Addition CA 2A2A14A and CA 2A2A14A30A and CA 2A2A14A66A and CA 2A2A14A30A66A 36.523-2 ECIT imported from 3GU
R5‑186525 Addition CA 2A12A30A66A66A 36.521-2 ECIT imported from 3GU
R5‑186526 Addition CA 2A12A30A66A66A 36.523-2 ECIT imported from 3GU
R5‑186527 CA 2A14A30A66A66A 36.521-2 ECIT imported from 3GU
R5‑186528 Addition CA 2A14A30A66A66A 36.523-2 ECIT imported from 3GU
R5‑186529 Addition CA 2A14A66A66A and CA 2A2A14A66A66A 36.521-2 ECIT imported from 3GU
R5‑186530 Addition CA 2A14A66A66A and CA 2A2A14A66A66A 36.523-2 ECIT imported from 3GU
R5‑186531 Addition CA 2A29A30A66A 36.521-2 ECIT imported from 3GU
R5‑186532 Addition CA 2A29A30A66A 36.523-2 ECIT imported from 3GU
R5‑186533 Addition CA combination 36.521-1_CA_2A-12A-30A-66A-66A ECIT imported from 3GU
R5‑186534 Addition CA combination 36.521-1_CA_2A-29A-30A-66A ECIT imported from 3GU
R5‑186535 Addition CA 2A2A29A and CA 2A2A29A30A 36.521-2 ECIT imported from 3GU
R5‑186536 Addition CA 2A2A29A and CA 2A2A29A30A 36.523-2 ECIT imported from 3GU
R5‑186537 Addition CA 2A29A66A 36.521-2 ECIT imported from 3GU
R5‑186538 Addition CA 2A29A66A 36.523-2 ECIT imported from 3GU
R5‑186539 Addition CA 2A30A66A66A 36.521-2 ECIT imported from 3GU
R5‑186540 Addition CA 2A30A66A66A 36.523-2 ECIT imported from 3GU
R5‑186541 Addition CA 7A66A and CA 2A7A66A 36.521-2 ECIT imported from 3GU
R5‑186542 Addition CA 7A66A and CA 2A7A66A 36.523-2 ECIT imported from 3GU
R5‑186543 Addition CA combination 36.521-1_CA_2A-2A-29A and CA_2A-2A-29A-30A ECIT imported from 3GU
R5‑186544 Addition CA combination 36.521-1_CA_2A-29A-66A ECIT imported from 3GU
R5‑186545 Update chapter 4.5.4 RRC_CONNECTED Ericsson imported from 3GU
R5‑186546 Correction of RRM IncMon TC 4.2.10 Ericsson imported from 3GU
R5‑186547 Correction of RRM IncMon TC 4.2.11 Ericsson imported from 3GU
R5‑186548 Correction of RRM IncMon TC 4.3.1.5 Ericsson imported from 3GU
R5‑186549 Correction of RRM IncMon TC 4.3.2A Ericsson imported from 3GU
R5‑186550 Correction of RRM IncMon TC 4.3.3A Ericsson imported from 3GU
R5‑186551 Correction of RRM IncMon TC 4.3.4.4 Ericsson imported from 3GU
R5‑186552 Correction of RRM IncMon TC 8.4.8 Ericsson imported from 3GU
R5‑186553 Correction of RRM IncMon TC 8.4.9 Ericsson imported from 3GU
R5‑186554 Correction of RRM IncMon TC 8.5.8 Ericsson imported from 3GU
R5‑186555 Correction of RRM IncMon TC 8.6.3 Ericsson imported from 3GU
R5‑186556 Correction of RRM IncMon TC 8.7.5 Ericsson imported from 3GU
R5‑186557 Correction of RRM IncMon TC 8.7A.1 Ericsson imported from 3GU
R5‑186558 Definition of additional cells for IncMon RRM Test Cases Ericsson imported from 3GU
R5‑186559 Message content for IncMon RRM Test Cases Ericsson imported from 3GU
R5‑186560 Applicability for IncMon RRM Test Cases Ericsson imported from 3GU
R5‑186561 Cell Configuration for IncMon RRM Test Cases Ericsson imported from 3GU
R5‑186562 New rows in Annex F tables for IncMon RRM Test Cases Ericsson imported from 3GU
R5‑186563 Updates of MU in TS 38.521-1 Annex F during RAN5#81 NTT DOCOMO, INC. imported from 3GU
R5‑186564 Updates of TT in TS 38.521-1 Annex F during RAN5#81 NTT DOCOMO, INC. imported from 3GU
R5‑186565 Updates of MU in TS 38.521-2 Annex F during RAN5#81 NTT DOCOMO, INC. imported from 3GU
R5‑186566 Updates of TT in TS 38.521-2 Annex F during RAN5#81 NTT DOCOMO, INC. imported from 3GU
R5‑186567 Updates of MU in TS 38.521-3 Annex F during RAN5#81 NTT DOCOMO, INC. imported from 3GU
R5‑186568 Updates of TT in TS 38.521-3 Annex F during RAN5#81 NTT DOCOMO, INC. imported from 3GU
R5‑186569 Editorial_Cleaning up for description of test requirement in clause 6 NTT DOCOMO, INC. imported from 3GU
R5‑186570 Editorial_Cleaning up for description of test requirement in clause 7 NTT DOCOMO, INC. imported from 3GU
R5‑186571 Update Clause 7.5B.3 in TS 38.521-3 CMCC imported from 3GU
R5‑186572 New NAS test case 9.1.3.1 ROHDE & SCHWARZ imported from 3GU
R5‑186573 New NAS test case 9.1.5.1.2 ROHDE & SCHWARZ imported from 3GU
R5‑186574 New NAS test case 9.1.6.1.4 ROHDE & SCHWARZ imported from 3GU
R5‑186575 Update IE ServingCellConfig Ericsson imported from 3GU
R5‑186576 Addition of applicability for NAS test case 9.1.5.1.14 ROHDE & SCHWARZ imported from 3GU
R5‑186577 Addition of applicability for new NAS test case 9.1.3.1 ROHDE & SCHWARZ imported from 3GU
R5‑186578 Addition of applicability for new NAS test case 9.1.5.1.2 ROHDE & SCHWARZ imported from 3GU
R5‑186579 Addition of applicability for new NAS test case 9.1.6.1.4 ROHDE & SCHWARZ imported from 3GU
R5‑186580 Update NB-IOT Spurious Emission UE co-existence Huawei, HiSilicon imported from 3GU
R5‑186581 Update the general sections for Rel-14 NB-IOT (Editorial) Huawei, HiSilicon, CMCC imported from 3GU
R5‑186582 Update the 6.2.3FA to reduce test points Huawei, HiSilicon, CMCC imported from 3GU
R5‑186583 Update Rel-14 NB-IOT Tx test cases to support category NB2 Huawei, HiSilicon, CAICT, CMCC imported from 3GU
R5‑186584 Update Rel-14 NB-IOT Rx test cases to support category NB2 Huawei, HiSilicon, CMCC imported from 3GU
R5‑186585 Update the test applicability for Rel-14 NB-IOT RF test cases Huawei, HiSilicon, CAICT, CMCC imported from 3GU
R5‑186586 Update the test applicability for Rel-14 NB-IOT RRM test cases Huawei, HiSilicon, CMCC imported from 3GU
R5‑186587 Update Rel-14 NB-IOT RRM test cases to support category NB2 Huawei, HiSilicon, CMCC imported from 3GU
R5‑186588 Update 8.1.2.2 Definition of CA capability for 4DL and 5DL CA Huawei, HiSilicon imported from 3GU
R5‑186589 Update 4DL and 5DL performance test cases (Editorial) Huawei, HiSilicon imported from 3GU
R5‑186590 Addition of Statistic information for 4DL and 5DL test cases Huawei, HiSilicon imported from 3GU
R5‑186591 Addition of new CA configurations into 36.521-2 Huawei, HiSilicon imported from 3GU
R5‑186592 Update the test applicability of TDD 4DL and 5DL CA performance test cases Huawei, HiSilicon imported from 3GU
R5‑186593 Update 8.16.78 to add TT information Huawei, HiSilicon imported from 3GU
R5‑186594 Addition of new CA configurations into 36.523-2 Huawei, HiSilicon imported from 3GU
R5‑186595 WP - Support for V2X services Huawei imported from 3GU
R5‑186596 SR - Support for V2X services Huawei imported from 3GU
R5‑186597 WP - LTE Carrier Aggregation Enhancement Beyond 5 Carriers: PUCCH on Scell Huawei imported from 3GU
R5‑186598 SR - LTE Carrier Aggregation Enhancement Beyond 5 Carriers: PUCCH on Scell Huawei imported from 3GU
R5‑186599 WP - Rel-14 eNB-IoT Huawei imported from 3GU
R5‑186600 SR - Rel-14 eNB-IoT Huawei imported from 3GU
R5‑186601 5G NR_EN_DC with FR1_Text update for Intra-Band Contiguous RX sensitivity Qualcomm inc. imported from 3GU
R5‑186602 5G NR_Text update for TX spurious emission intra-band contiguous EN-DC Qualcomm Inc. imported from 3GU
R5‑186603 5G_FR1 Text update for 7.3A Reference sensitivity for CA Qualcomm Inc. imported from 3GU
R5‑186604 5G_FR1 Text update for 7.3 Reference sensitivity Qualcomm Inc. imported from 3GU
R5‑186605 5R_FR1 Text Update for 6.5.3.1_General spurious emissions Qualcomm Inc imported from 3GU
R5‑186606 5R FR1 Text Update for 6.5.3.2 Spurious emission for UE co-existence Qualcomm Inc imported from 3GU
R5‑186607 5G NR_EN_DC with FR1_Text update for Inter-Band RX sensitivity Qualcomm Inc imported from 3GU
R5‑186608 Spurious emission band UE co-existence for Inter-band EN-DC within FR1 Qualcomm Inc imported from 3GU
R5‑186609 TP_analysis for TX spurious emission UE co-existence for intra-band contiguous EN-DC with FR1 Qualcomm Inc imported from 3GU
R5‑186610 TP analysis for Reference sensitivity for Intra-band Contiguous EN-DC with FR1 Qualcomm Inc imported from 3GU
R5‑186611 TP analysis for Reference sensitivity for Inter-band EN-DC with FR1 Qualcomm Inc imported from 3GU
R5‑186612 Add CounterCheck Ericsson imported from 3GU
R5‑186613 Update DLInformationTransfer Ericsson imported from 3GU
R5‑186614 Correction to applicability of A-GNSS tests for Category M1 and M2 UEs Spirent Communications, European Commission imported from 3GU
R5‑186615 Clarification of the meaning of A-GPS Spirent Communications imported from 3GU
R5‑186616 Addition of two missing triple-GNSS test cases Spirent Communications, European Commission imported from 3GU
R5‑186617 Updates to Table 4B.2-1 Spirent Communications, European Commission imported from 3GU
R5‑186618 Addition of NR background information Spirent Communications, European Commission imported from 3GU
R5‑186619 Addition of applicabilities for two missing Minimum Performance triple-GNSS test cases Spirent Communications, European Commission imported from 3GU
R5‑186620 Correction to applicabilities of Modernized GPS for Minimum Performance test cases Spirent Communications imported from 3GU
R5‑186621 Addition of Category NB2 information Spirent Communications imported from 3GU
R5‑186622 Addition of PICs for support of Acquisition Assistance for Galileo E5A and GPS L5 signals Spirent Communications, European Commission imported from 3GU
R5‑186623 Addition of NR signalling background information Spirent Communications, European Commission imported from 3GU
R5‑186624 Correction of implementation errors from R5-184028 Spirent Communications imported from 3GU
R5‑186625 Correction of GNSS-IonosphericModel sub-tests list Spirent Communications, European Commission imported from 3GU
R5‑186626 Clarification of notes for Galileo signal information Spirent Communications, European Commission imported from 3GU
R5‑186627 Clarification of use of Modernized GPS for Minimum Performance test cases Spirent Communications imported from 3GU
R5‑186628 Clarification of use of Assistance Data for Galileo and Modernized GPS signalling test cases Spirent Communications, European Commission imported from 3GU
R5‑186629 Addition of information for two missing Minimum Performance triple-GNSS test cases Spirent Communications, European Commission imported from 3GU
R5‑186630 Addition of NR signalling background information Spirent Communications, European Commission imported from 3GU
R5‑186631 Correction to GNSS scenario #3 for V2X test cases Spirent Communications, European Commission imported from 3GU
R5‑186632 Correction to values for GNSS scenario #3 for V2X test cases Spirent Communications, European Commission imported from 3GU
R5‑186633 Update IE SchedulingRequestResourceConfig Ericsson, MCC TF160 imported from 3GU
R5‑186634 Addition of new 5GC TC 9.1.5.1.10 CAICT imported from 3GU
R5‑186635 Addition of new 5GC TC 9.1.5.1.11 CAICT imported from 3GU
R5‑186636 Addition of new 5GC TC 9.1.8.14 CAICT imported from 3GU
R5‑186637 Addition of new 5GC TC 9.1.8.18 CAICT imported from 3GU
R5‑186638 Addition of new 5GC TC 10.1.3.4 CAICT imported from 3GU
R5‑186639 Addition of new 5GC TC 10.1.3.5 CAICT imported from 3GU
R5‑186640 Addition of new 5GC TC 10.1.3.6 CAICT imported from 3GU
R5‑186641 Update IE SchedulingRequestResourceConfig Ericsson, MCC TF160 imported from 3GU
R5‑186642 Addition of new 5GC TC 10.1.3.7 CAICT imported from 3GU
R5‑186643 Update IE RadioBearerConfig Ericsson imported from 3GU
R5‑186644 Addition of new 5GC TC 10.1.3.8 CAICT imported from 3GU
R5‑186645 Addition of new 5GC TC 10.1.6.1 CAICT imported from 3GU
R5‑186646 Addition of new 5GC TC 10.1.6.2 CAICT imported from 3GU
R5‑186647 Addition of new 5GC TC 10.1.6.3 CAICT imported from 3GU
R5‑186648 Correction to NR RLC test case 7.1.2.3.3 and 7.1.2.3.4 ANRITSU LTD imported from 3GU
R5‑186649 Correction to NR PDCP test case 7.1.3.5.1 ANRITSU LTD imported from 3GU
R5‑186650 Correction to NR PDCP test case 7.1.3.5.2 ANRITSU LTD imported from 3GU
R5‑186651 Correction to Signal levels for conducted testing ANRITSU LTD imported from 3GU
R5‑186652 Correction to NR RRC test case 8.2.3.5.1 ANRITSU LTD imported from 3GU
R5‑186653 Correction to NR RRC test case 8.2.3.9.1 and 8.2.3.10.1 ANRITSU LTD imported from 3GU
R5‑186654 Addition of 6.3D.4.1 Absolute Power tolerance for UL-MIMO China Telecommunications imported from 3GU
R5‑186655 Addition of 6.3D.4.2 Relative Power Tolerance for UL-MIMO China Telecommunications imported from 3GU
R5‑186656 Addition of 6.3D.4.3 Aggregate Power tolerance for UL-MIMO China Telecommunications imported from 3GU
R5‑186657 New WID on UE Conformance Test Aspects - Bluetooth/WLAN measurement collection in LTE Minimization of Drive Tests (MDT) CMCC imported from 3GU
R5‑186658 Addition of 5GC Test case 10.1.4.1 ANRITSU LTD imported from 3GU
R5‑186659 Add applicability for 5GC test case 10.1.4.1 ANRITSU LTD imported from 3GU
R5‑186660 Introduction of the support of ProSe for B72 Airbus DS SLC imported from 3GU
R5‑186661 Introduction of the support of ProSe for B72 Airbus DS SLC imported from 3GU
R5‑186662 Revised WID on UE Conformance Test Aspects - ProSe Support for Band 72 in LTE Airbus DS SLC imported from 3GU
R5‑186663 Updates to test case 6.5B.2.1.3, Adjacent channel leakage ratio for intra-band contiguous EN-DC Ericsson imported from 3GU
R5‑186664 Introduction of B68 in ProSe test frequencies table Airbus DS SLC imported from 3GU
R5‑186665 Update LocationMeasurementIndication Ericsson imported from 3GU
R5‑186666 Update MeasurementReport Ericsson imported from 3GU
R5‑186667 Introduction of Power Class 1 for B31 and B72 Airbus DS SLC imported from 3GU
R5‑186668 Update chapter 4.5.2 RRC_IDLE Ericsson imported from 3GU
R5‑186669 Introduction of Power Class 1 for B31 and B72 Airbus DS SLC imported from 3GU
R5‑186670 Updating test case 6.2.3 UE additional maximum output power reduction Ericsson-LG Co., LTD imported from 3GU
R5‑186671 Updating test case 6.5.2.3 Additional spectrum emission mask Ericsson-LG Co., LTD imported from 3GU
R5‑186672 Updating test case 6.2B.3.1 Additional Maximum Output Power reduction for Intra-band contiguous EN-DC Ericsson-LG Co., LTD imported from 3GU
R5‑186673 Updating test case 6.5B.2.1.2 Additional spectrum emissions mask for intra-band contiguous EN-DC Ericsson-LG Co., LTD imported from 3GU
R5‑186674 Test point analysis for AMPR Intra-band contiguous EN-DC in FR1 for NS_35 Ericsson-LG Co., LTD imported from 3GU
R5‑186675 Updating test case 6.2.3 maximum output power with additional requirements Ericsson-LG Co., LTD imported from 3GU
R5‑186676 Correction to NR MAC DRX test cases 7.1.5.1.1 and 7.1.5.1.2 ANRITSU LTD imported from 3GU
R5‑186677 Resubmission of update to 38.508 for mid channel bandwidth Qualcomm Finland RFFE Oy imported from 3GU
R5‑186678 new TC for PDSCH FR1 demod Qualcomm Finland RFFE Oy imported from 3GU
R5‑186679 Corrections to PDCP test case 7.1.3.5.3 ROHDE & SCHWARZ imported from 3GU
R5‑186680 Update of test case 6.5.2.4.2, UTRA ACLR in 38.521-1 Ericsson imported from 3GU
R5‑186681 Updates to EN-DC test case 6.2B.2.1, UE Maximum Output Power reduction for Intra-Band Contiguous EN-DC Ericsson imported from 3GU
R5‑186682 Update MobilityFromNRCommand Ericsson imported from 3GU
R5‑186683 Updates to EN-DC test case 6.2B.2.2, UE Maximum Output Power reduction for Intra-Band Non-Contiguous EN-DC Ericsson imported from 3GU
R5‑186684 Updates to test case 6.2B.2.3, UE Maximum Output Power reduction for Inter-Band EN-DC within FR1 Ericsson imported from 3GU
R5‑186685 Addition of new 5GC TC 9.1.6.1.6 MediaTek Inc. imported from 3GU
R5‑186686 Addition of new 5GC TC 9.1.6.1.7 MediaTek Inc. imported from 3GU
R5‑186687 Addition of new 5GC TC 9.1.6.2.8 MediaTek Inc. imported from 3GU
R5‑186688 Add applicability of 5GC TC 9.1.6.1.6, 9.1.6.1.7, 9.1.6.2.8 and 9.1.6.2.10 MediaTek Inc. imported from 3GU
R5‑186689 Correction to various Radio resource control IEs ANRITSU LTD imported from 3GU
R5‑186690 Addition of B72 for test cases with 5MHz channel bandwidth Airbus DS SLC imported from 3GU
R5‑186691 Update Paging Ericsson imported from 3GU
R5‑186692 Update RRCReestablishment Ericsson imported from 3GU
R5‑186693 Update of V2X EVM TCs CAICT imported from 3GU
R5‑186694 Update RRCReconfiguration Ericsson imported from 3GU
R5‑186695 Addition of Rel-12 missing IEs to LPP message contents ROHDE & SCHWARZ imported from 3GU
R5‑186696 Addition of Rel-15 missing IEs to LPP message contents ROHDE & SCHWARZ imported from 3GU
R5‑186697 Positioning NSA Protocol tests - LPP Procedures ROHDE & SCHWARZ imported from 3GU
R5‑186698 Handling of power on / power off cycles and UE Automation in RRM and SIG testing for FR2 ROHDE & SCHWARZ imported from 3GU
R5‑186699 On RRM test case numbering ROHDE & SCHWARZ imported from 3GU
R5‑186700 On RRM FR1 MU and TT analysis ROHDE & SCHWARZ imported from 3GU
R5‑186701 On TS 38.533 Annex Structure ROHDE & SCHWARZ imported from 3GU
R5‑186702 Resubmission of R5-185614 with modifications ROHDE & SCHWARZ imported from 3GU
R5‑186703 TP on new RRM 5G Test Cases 4.7.1.1 and 4.7.1.2 ROHDE & SCHWARZ imported from 3GU
R5‑186704 TP on new RRM 5G Test Cases 6.7.1.1 and 6.7.1.2 ROHDE & SCHWARZ imported from 3GU
R5‑186705 TP on Annexes for TS 38.533 ROHDE & SCHWARZ imported from 3GU
R5‑186706 TP on references and common sections for TS 38.533 ROHDE & SCHWARZ imported from 3GU
R5‑186707 Draft TS 38.533 v0.0.3 ROHDE & SCHWARZ imported from 3GU
R5‑186708 Adding test case 6.2B.2.4, UE Maximum Output Power reduction for Inter-Band EN-DC including FR2 Ericsson imported from 3GU
R5‑186709 Introduction of FR1 7.4 Maximum input level CAICT imported from 3GU
R5‑186710 TP analysis for test case 6.2B.2.4, UE Maximum Output Power reduction for Inter-Band EN-DC including FR2 Ericsson imported from 3GU
R5‑186711 5GS conditions Ericsson imported from 3GU
R5‑186712 Test Point analysis for FR1 7.4 Maximum input level CAICT, Huawei imported from 3GU
R5‑186713 Test Point analysis for FR1 MPR test case CAICT, Huawei imported from 3GU
R5‑186714 Update RRCReject Ericsson imported from 3GU
R5‑186715 MCC TF160 Status Report MCC TF160 imported from 3GU
R5‑186716 MCC TF160 ToR 2019 MCC TF160 imported from 3GU
R5‑186717 eNB-IoT: Test Model updates MCC TF160 imported from 3GU
R5‑186718 V2X: Test Model updates MCC TF160 imported from 3GU
R5‑186719 Updates related to introduction of test frequencies MCC TF160, Ericsson imported from 3GU
R5‑186720 New annex for NR test frequency calculations MCC TF160, Ericsson imported from 3GU
R5‑186721 Updates to E-UTRA RRC_CONNECTED generic procedure MCC TF160, Ericsson, Qualcomm imported from 3GU
R5‑186722 Update SecurityAlgorithmConfig MCC TF160 imported from 3GU
R5‑186723 Updates to MeasResults MCC TF160 imported from 3GU
R5‑186724 EN-DC test model handling of different types of bearers MCC TF160 imported from 3GU
R5‑186725 Correction to 5GS test case 7.1.2.2.5 MCC TF160, Mediatek Inc. imported from 3GU
R5‑186726 Updates to EN-DC TC 8.2.5.3.1 MCC TF160, Qualcomm imported from 3GU
R5‑186727 Default NR TBS Tables for SIG test cases MCC TF160, Motorola Mobility imported from 3GU
R5‑186728 SA Option2: Initial Test Model aspects MCC TF160 imported from 3GU
R5‑186729 EN-DC: Misc. Test Model updates MCC TF160 imported from 3GU
R5‑186730 Alignments of UE Test Loop Mode H description MCC TF160 imported from 3GU
R5‑186731 Alignments of UE Test Loop Mode H description MCC TF160 imported from 3GU
R5‑186732 Alignments of UE Test Loop Mode H description MCC TF160 imported from 3GU
R5‑186733 Routine maintenance for TS 36.523-3 MCC TF160 imported from 3GU
R5‑186734 Update RRCRelease Ericsson imported from 3GU
R5‑186735 Update of FR1 6.2.2 MPR CAICT, Huawei, CMCC imported from 3GU
R5‑186736 Update of FR1 Transmit OFF power CAICT, Huawei imported from 3GU
R5‑186737 Test Point analysis for FR2 7.4 Maximum input level CAICT, Huawei imported from 3GU
R5‑186738 Update of FR2 6.3.2 Transmit OFF power CAICT, Huawei imported from 3GU
R5‑186739 Update of FR2 test case 7.4 CAICT, Anritsu, Huawei imported from 3GU
R5‑186740 General sections updated to 38.521-2 CAICT, Huawei imported from 3GU
R5‑186741 Addition of B72 for test cases with 5MHz channel bandwidth Airbus DS SLC imported from 3GU
R5‑186742 SR UE Conformance Test Aspects - ProSe Support for Band 72 in LTE Airbus DS SLC imported from 3GU
R5‑186743 SR UE Conformance Test Aspects - Addition of Power Class 1 UE to bands B31/B72 for LTE Airbus DS SLC imported from 3GU
R5‑186744 Update RRCResume Ericsson imported from 3GU
R5‑186745 Add RRCResumeComplete Ericsson imported from 3GU
R5‑186746 Addition of new_TC_9_1_8_5 Starpoint, TDIA imported from 3GU
R5‑186747 Addition of new 5GC TC 9.1.6.2.10 MediaTek Inc. imported from 3GU
R5‑186748 Addition of new 5GC TC 9.1.6.2.5 MediaTek Inc. imported from 3GU
R5‑186749 Test Point analysis for NR Narrow band in FR1 CAICT imported from 3GU
R5‑186750 Test Point analysis for NR spurious response in FR1 CAICT imported from 3GU
R5‑186751 Addition of new TC 9.1.8.7 Starpoint,TDIA,CATT imported from 3GU
R5‑186752 WP - UE Conformance Test Aspects - Voice and Video Enhancement for LTE CATT imported from 3GU
R5‑186753 SR - UE Conformance Test Aspects - Voice and Video Enhancement for LTE CATT imported from 3GU
R5‑186754 WP - UE Conformance Test Aspects - UL Data Compression in LTE CATT imported from 3GU
R5‑186755 Addition of new 5GS mobility management TC 9.1.7.1 Tejet,ZTE,SRTC imported from 3GU
R5‑186756 SR - UE Conformance Test Aspects - UL Data Compression in LTE CATT imported from 3GU
R5‑186757 Addition of new 5GS mobility management TC 9.1.7.2 Tejet,ZTE,SRTC imported from 3GU
R5‑186758 Add applicability of new 5GS mobility management TC 9.1.7.1 and TC 9.1.7.2 Tejet, ZTE, SRTC imported from 3GU
R5‑186759 Correction on V2X testcase 24.3.1 CATT imported from 3GU
R5‑186760 Correction on V2X testcase 24.3.2 CATT imported from 3GU
R5‑186761 Introduction of RRC TC QoE Measurement Collection in 8.3.5.1 Huawei, HiSilicon imported from 3GU
R5‑186762 Introduction of RRC TC Qoemtsi Measurement Collection in 8.3.5.2 Huawei, HiSilicon imported from 3GU
R5‑186763 Addition of SRB4 configuration to RRC connection Huawei, HiSilicon imported from 3GU
R5‑186764 Addition of Condition QMC for LTE QMC test Huawei, HiSilicon imported from 3GU
R5‑186765 Update of operating bands and channel arrangement to TS 38.521-1 China Unicom imported from 3GU
R5‑186766 Correction on V2X testcase 24.3.1 CATT imported from 3GU
R5‑186767 Modify the values of IEs in sps-AssistanceInformation-r14 CATT imported from 3GU
R5‑186768 Modify the values of IEs in sps-AssistanceInformation-r14 CATT imported from 3GU
R5‑186769 Addition of Time alignment error for UL-MIMO to TS38.521-1 China Unicom imported from 3GU
R5‑186770 Addition of new LTE_UDC-UEConTest test case 7.3.10.1 CATT imported from 3GU
R5‑186771 Addition of new LTE_UDC-UEConTest test case 7.3.10.2 CATT imported from 3GU
R5‑186772 Addition of new LTE_UDC-UEConTest test case 7.3.10.3 CATT imported from 3GU
R5‑186773 Addition of 6.3D.1 Minimum output power for UL-MIMO China Telecommunications imported from 3GU
R5‑186774 Addition of 6.3D.1 Minimum output power for UL-MIMO China Telecommunications imported from 3GU
R5‑186775 Addition of new LTE_UDC-UEConTest test case 8.4.2.29 CATT imported from 3GU
R5‑186776 Addition of 6.3D.2 Transmit OFF power for UL-MIMO China Telecommunications imported from 3GU
R5‑186777 Addition of new LTE_UDC-UEConTest test case 8.5.1.9 CATT imported from 3GU
R5‑186778 Addition of new TC 9.1.8.8 Starpoint,TDIA,CATT imported from 3GU
R5‑186779 Addition of the message content of PDCP-config for UDC CATT imported from 3GU
R5‑186780 Addition of applicability and tests conditions for UDC test cases CATT imported from 3GU
R5‑186781 Addition of 6.3D.3 Transmit ONOFF time mask for UL-MIMO China Telecommunications imported from 3GU
R5‑186782 Update RRCResumeRequest Ericsson imported from 3GU
R5‑186783 Addition of new TC 9.1.8.12 Starpoint,TDIA,CATT imported from 3GU
R5‑186784 WP - LTE_QMC_Streaming-UEConTest for RAN5#81 China Unicom imported from 3GU
R5‑186785 Add RRCSetup Ericsson imported from 3GU
R5‑186786 SR - LTE_QMC_Streaming-UEConTest for RAN5#81 China Unicom imported from 3GU
R5‑186787 Add UE capability data centric Ericsson imported from 3GU
R5‑186788 Minor update OBW, SEM and ACLR inter-band FR1 test cases Keysight Technologies UK Ltd imported from 3GU
R5‑186789 WP - UE Conformance Test Aspects - 450 MHz Band for LTE in Region 3 China Unicom imported from 3GU
R5‑186790 SR - UE Conformance Test Aspects - 450 MHz Band for LTE in Region 3 for RAN5#81 China Unicom imported from 3GU
R5‑186791 TP analysis OBW intraband contiguous EN-DC Keysight Technologies UK Ltd imported from 3GU
R5‑186792 TP analysis SEM intraband contiguous EN-DC Keysight Technologies UK Ltd imported from 3GU
R5‑186793 New Work Item Proposal: UE Conformance Test Aspects – Enhanced LTE Support for Aerial Vehicles NTT DOCOMO INC. imported from 3GU
R5‑186794 Addition of new TC 9.1.8.16 Starpoint,TDIA,CATT imported from 3GU
R5‑186795 Addition of applicability statements for LTE QMC test cases China Unicom imported from 3GU
R5‑186796 Correction to NB-IoT test case 22.4.19a ROHDE & SCHWARZ imported from 3GU
R5‑186797 Adding test cases for new features in the latest IR.92 NTT DOCOMO INC. imported from 3GU
R5‑186798 Update specific messages to simplify TS 38.523-1 NTT DOCOMO INC. imported from 3GU
R5‑186799 Correction to NB-IoT test case 22.4.22 ROHDE & SCHWARZ imported from 3GU
R5‑186800 Correction to NB-IoT test case 22.3.3.5 ROHDE & SCHWARZ, Qualcomm Incorporated imported from 3GU
R5‑186801 Update RRC TC 8.2.2.2.1 - Split SRB Establishment and Release / EN-DC Tech Mahindra Limited and Qualcomm imported from 3GU
R5‑186802 Update RRC TC 8.2.2.7.1 - Bearer Modification / Handling for bearer type change without security key change / EN-DC Tech Mahindra Limited and Qualcomm imported from 3GU
R5‑186803 Update RRC TC8.2.3.7.1 - Measurement configuration control and reporting / Event A4 (intra-frequency, inter-frequency and inter-band measurements) / Measurement of Neighbour NR cell / EN-DC Tech Mahindra Limited and Qualcomm imported from 3GU
R5‑186804 Update chapter 4.5.3 RRC_INACTIVE Ericsson imported from 3GU
R5‑186805 TP analysis for time alignment error for MIMO FR1 China Unicom imported from 3GU
R5‑186806 Alignment of 256QAM EVM Test Tolerance between LTE and NR Intel Deutschland GmbH imported from 3GU
R5‑186807 GCF 3GPP TCL after GCF CAG#56 Ericsson imported from 3GU
R5‑186808 RAN5#81 summary of changes to RAN5 test cases with potential impact on GCF and PTCRB Ericsson, Samsung imported from 3GU
R5‑186809 WP UE Conformance Test Aspects - Increasing the minimum number of carriers for UE monitoring in UTRA and E-UTRA Ericsson imported from 3GU
R5‑186810 SR UE Conformance Test Aspects - Increasing the minimum number of carriers for UE monitoring in UTRA and E-UTRA Ericsson imported from 3GU
R5‑186811 WP UE Conformance Test Aspects - Rel-13 LTE CA configurations Ericsson imported from 3GU
R5‑186812 SR UE Conformance Test Aspects - Rel-13 LTE CA configurations Ericsson imported from 3GU
R5‑186813 WP UE Conformance Test Aspects - Rel-14 LTE CA configurations Ericsson imported from 3GU
R5‑186814 SR UE Conformance Test Aspects - Rel-14 LTE CA configurations Ericsson imported from 3GU
R5‑186815 WP UE Conformance Test Aspects - Rel-15 LTE CA configurations Ericsson imported from 3GU
R5‑186816 SR UE Conformance Test Aspects - Rel-15 LTE CA configurations Ericsson imported from 3GU
R5‑186817 WP UE Conformance Test Aspects - Rel-16 LTE CA configurations Ericsson imported from 3GU
R5‑186818 SR UE Conformance Test Aspects - Rel-16 LTE CA configurations Ericsson imported from 3GU
R5‑186819 Revised WID on: UE Conformance Test Aspects - Rel-16 LTE CA configurations Ericsson imported from 3GU
R5‑186820 WP UE Conformance Test Aspects - 5G system with NR and LTE Ericsson imported from 3GU
R5‑186821 SR UE Conformance Test Aspects - 5G system with NR and LTE Ericsson imported from 3GU
R5‑186822 Update of RAN5 5G NR phases and target update RAN5#81 Ericsson imported from 3GU
R5‑186823 3GPP RAN5 CA status list (pre-RAN5#81 meeting) Ericsson imported from 3GU
R5‑186824 3GPP RAN5 CA status list (post-RAN5#81 meeting) Ericsson imported from 3GU
R5‑186825 Correction of test frequencies for NR band n1 Ericsson imported from 3GU
R5‑186826 Correction of test frequencies for NR band n2 Ericsson imported from 3GU
R5‑186827 Correction of test frequencies for NR band n3 Ericsson imported from 3GU
R5‑186828 Correction of test frequencies for NR band n5 Ericsson imported from 3GU
R5‑186829 Correction of test frequencies for NR band n7 Ericsson imported from 3GU
R5‑186830 Correction of test frequencies for NR band n8 Ericsson imported from 3GU
R5‑186831 Correction of test frequencies for NR band n12 Ericsson imported from 3GU
R5‑186832 Correction of test frequencies for NR band n20 Ericsson imported from 3GU
R5‑186833 Correction of test frequencies for NR band n25 Ericsson imported from 3GU
R5‑186834 Correction of test frequencies for NR band n28 Ericsson imported from 3GU
R5‑186835 Correction of test frequencies for NR band n34 Ericsson imported from 3GU
R5‑186836 Correction of test frequencies for NR band n38 Ericsson imported from 3GU
R5‑186837 Correction of test frequencies for NR band n39 Ericsson imported from 3GU
R5‑186838 Correction of test frequencies for NR band n40 Ericsson imported from 3GU
R5‑186839 Correction of test frequencies for NR band n41 Ericsson imported from 3GU
R5‑186840 Correction of test frequencies for NR band n51 Ericsson imported from 3GU
R5‑186841 Introduction of test frequencies for NR band n66 Ericsson imported from 3GU
R5‑186842 Introduction of test frequencies for NR band n70 Ericsson imported from 3GU
R5‑186843 Correction of test frequencies for NR band n71 Ericsson imported from 3GU
R5‑186844 Correction of test frequencies for NR band n75 Ericsson imported from 3GU
R5‑186845 Correction of test frequencies for NR band n76 Ericsson imported from 3GU
R5‑186846 Correction of test frequencies for NR band n77 Ericsson imported from 3GU
R5‑186847 Correction of test frequencies for NR band n78 Ericsson imported from 3GU
R5‑186848 Correction of test frequencies for NR band n79 Ericsson imported from 3GU
R5‑186849 Correction of test frequencies for NR band n257 Ericsson imported from 3GU
R5‑186850 Correction of test frequencies for NR band n258 Ericsson imported from 3GU
R5‑186851 Correction of test frequencies for NR band n260 Ericsson imported from 3GU
R5‑186852 Correction of test frequencies for NR band n261 Ericsson imported from 3GU
R5‑186853 Correction of test frequencies for signalling testing in clause 6 Ericsson imported from 3GU
R5‑186854 Correction to DCI formats 0_0 and 0_1 Ericsson, MCC TF160, Huawei, HiSilicon imported from 3GU
R5‑186855 Introduction of preamble test states Ericsson imported from 3GU
R5‑186856 Introduction of SDL and SUL cells in simulated cells in clause 4.4.2 Ericsson imported from 3GU
R5‑186857 Introduction DCI format 1_0 for paging, SI and random access Ericsson, MCC TF160 imported from 3GU
R5‑186858 Correction to DCI format 1_1 Ericsson, MCC TF160 imported from 3GU
R5‑186859 Update IE RateMatchPattern Ericsson imported from 3GU
R5‑186860 Correction to RRC_IDLE procedure Ericsson imported from 3GU
R5‑186861 Correction of generic procedure parameter naming for test loop function Ericsson imported from 3GU
R5‑186862 Correction of test procedures to activate and deactivate UE Beamlock Function Ericsson imported from 3GU
R5‑186863 Update of Test Control UE Beamlock Function messages Ericsson imported from 3GU
R5‑186864 New test case for UL-SCH transport block size selection for DCI format 0 and 256QAM UL Ericsson imported from 3GU
R5‑186865 New test case for PUSCH transmission in UpPTS in frame structure 2 Ericsson imported from 3GU
R5‑186866 Applicability of new uplink capacity enhancement test cases for LTE Ericsson imported from 3GU
R5‑186867 Applicability and ICS for CA RF and RRM test cases Ericsson imported from 3GU
R5‑186868 LS on NR Test Methods applicability for different UE power classes TSG RAN4 imported from 3GU
R5‑186869 LS on Vehicle mounted UE antenna performance TSG RAN4 imported from 3GU
R5‑186870 LS to RAN5 and GCF on method to distinguish vehicle UE from handheld UE TSG RAN4 imported from 3GU
R5‑186871 Specifying Test procedure to check that UE is in RRC_IDLE state on a certain NR cell Samsung imported from 3GU
R5‑186872 Removal of RRC SCG failure TC 8.2.5.5.1 Samsung imported from 3GU
R5‑186873 Removal of RRC SCG failure TC 8.2.5.6.1 Samsung imported from 3GU
R5‑186874 Update to 5G TC TA registration update Samsung imported from 3GU
R5‑186875 Removal of applicability for RRC SCG failure tests Samsung imported from 3GU
R5‑186876 Adding applicability for 5G TC TA registration update Samsung imported from 3GU
R5‑186877 Adding applicability for new 38.521-1 CA TCs Samsung imported from 3GU
R5‑186878 Correction to Generic Test Procedure for MCPTT pre-established session establishment CO Samsung imported from 3GU
R5‑186879 Editorial update of the default SDP and Resource-list Messages Samsung imported from 3GU
R5‑186880 Update of default MCPTT media plane control messages and other information elements to reflect latest Rel-13 core specs Samsung imported from 3GU
R5‑186881 Update of XML schema for MCPTT location information to reflect latest Rel-13 core specs Samsung imported from 3GU
R5‑186882 Update of MCPTT Client off-network operation TCs Core requirements to reflect latest Rel-13 core specs Samsung imported from 3GU
R5‑186883 Update of MCPTT Private Calls with Floor Control TCs Core requirements to reflect latest Rel-13 core specs Samsung imported from 3GU
R5‑186884 Update of MCPTT Private Calls without Floor Control TCs Core requirements to reflect latest Rel-13 core specs Samsung imported from 3GU
R5‑186885 Update of MCPTT Private Calls within a pre-established session TCs Core requirements to reflect latest Rel-13 core specs Samsung imported from 3GU
R5‑186886 Update of PRD13 Samsung imported from 3GU
R5‑186887 NR FR1 TT Way Forward update Telecom Italia, Orange, AT&T imported from 3GU
R5‑186888 NR FR2 TT Proposal Telecom Italia, China Mobile, China Telecom, China Unicom, DISH Network, Orange, Sprint imported from 3GU
R5‑186889 Correction to the default Pre-Test Conditions for AM and UM RLC test cases Keysight Technologies UK Ltd imported from 3GU
R5‑186890 Correction to NR RRC test case 8.2.3.14.1 Keysight Technologies UK Ltd imported from 3GU
R5‑186891 Correction to NR RRC test case 8.2.3.13.1 Keysight Technologies UK Ltd imported from 3GU
R5‑186892 Correction to NR PDCP test case 7.1.3.4.2 Keysight Technologies UK Ltd imported from 3GU
R5‑186893 Corrections to the notes in the OTA signal level tables Keysight Technologies UK Ltd imported from 3GU
R5‑186894 Update on RTS Linearization Keysight Technologies UK Ltd imported from 3GU
R5‑186895 Correction to eMDT2 test case 8.6.1.3 Intel Corporation (UK) Ltd imported from 3GU
R5‑186896 5GS inactive state Ericsson imported from 3GU
R5‑186897 Correction to eMDT2 test case 8.6.1.3 Intel Corporation (UK) Ltd, Keysight Technologies UK Ltd. imported from 3GU
R5‑186898 5GS AKA/EAP default Ericsson imported from 3GU
R5‑186899 Addition OBW intra-band contiguous EN-DC Keysight Technologies UK Ltd imported from 3GU
R5‑186900 Addition SEM intra-band contiguous EN-DC Keysight Technologies UK Ltd imported from 3GU
R5‑186901 Update SEM requirements to TS 38.101-1 v15.3.0 Keysight Technologies UK Ltd imported from 3GU
R5‑186902 Update ACS and inband blocking test cases in TS 38.521-1 Keysight Technologies UK Ltd imported from 3GU
R5‑186903 Update MU budget in TR 38.903 Keysight Technologies UK Ltd imported from 3GU
R5‑186904 5GS S-NSSAI Ericsson imported from 3GU
R5‑186905 Uplink PTRS disable for RF testing Keysight Technologies UK Ltd imported from 3GU
R5‑186906 Addition OBW intraband non contiguous EN-DC Keysight Technologies UK Ltd imported from 3GU
R5‑186907 Update general parameter Connection without release in initial conditions in TS 38.521-3 Keysight Technologies UK Ltd imported from 3GU
R5‑186908 Correction to LTE<>GERAN idle mode test case 6.2.3.30 Keysight Technologies UK Ltd imported from 3GU
R5‑186909 5GS follow-on Ericsson imported from 3GU
R5‑186910 5GS IMS Ericsson imported from 3GU
R5‑186911 Add RRCSetupComplete Ericsson imported from 3GU
R5‑186912 Add RRCSetupRequest Ericsson imported from 3GU
R5‑186913 Add RRCSystemInfoRequest Ericsson imported from 3GU
R5‑186914 Update of Test case 8.5.4.1 with UE DL and UL Cat 22,23,24,25,26 capability check Intel Corporation (UK) Ltd imported from 3GU
R5‑186915 Correction to SRVCC test cases for IMS Reregistration over UTRAN Keysight Technologies UK Ltd imported from 3GU
R5‑186916 Add SecurityModeCommand Ericsson imported from 3GU
R5‑186917 Addition of DL and UL Category 22,23,24,25,26 to Table A.4.3.2-2 and A.4.3.2-3 Intel Corporation (UK) Ltd imported from 3GU
R5‑186918 Update SystemInformation Ericsson imported from 3GU
R5‑186919 Correction to SRVCC test cases for IMS Reregistration over UTRAN Keysight Technologies UK Ltd imported from 3GU
R5‑186920 Add UEAssistanceInformation Ericsson imported from 3GU
R5‑186921 Update UECapabilityEnquiry Ericsson imported from 3GU
R5‑186922 Update ULInformationTransfer Ericsson imported from 3GU
R5‑186923 Update IE PTRS-UplinkConfig Ericsson imported from 3GU
R5‑186924 Update IE RLF-TimersAndConstants Ericsson imported from 3GU
R5‑186925 Update RRCResumeRequest Ericsson imported from 3GU
R5‑186926 Add UE implementation capabilities Ericsson imported from 3GU
R5‑186927 Introduction of FR1 TC 7.6D.2 Inband blocking for UL MIMO CAICT imported from 3GU
R5‑186928 Introduction of FR1 TC 7.6D.3 Out-of-band blocking for UL MIMO CAICT imported from 3GU
R5‑186929 Update PTRS-DownlinkConfig NTT DOCOMO INC. imported from 3GU
R5‑186930 Introduction of FR1 TC 7.6D.4 Narrow-band blocking for UL MIMO CAICT imported from 3GU
R5‑186931 Update CSI related information elements NTT DOCOMO INC. imported from 3GU
R5‑186932 Introduction of FR1 TC 7.8D Intermodulation characteristics for UL-MIMO CAICT imported from 3GU
R5‑186933 Introduction of FR2 TC 6.2.2 UE maximum output power reduction CAICT imported from 3GU
R5‑186934 Update ServingCellConfigCommon and TDD-UL-DL-Config NTT DOCOMO INC. imported from 3GU
R5‑186935 Update SRS-Config NTT DOCOMO INC. imported from 3GU
R5‑186936 Update PUCCH-SpatialRelationInfo NTT DOCOMO INC. imported from 3GU
R5‑186937 Update some information elements for measurements NTT DOCOMO INC. imported from 3GU
R5‑186938 Update CellGroupConfig and related information elements NTT DOCOMO INC. imported from 3GU
R5‑186939 Add PICS for 5GMM implementation cabilities MediaTek Inc. imported from 3GU
R5‑186940 Addition of specific RDS message contents for NB-IoT test case 22.5.19 TDIA, CATT imported from 3GU
R5‑186941 CR of NR 508-1 clause 4.6.2_SIB2, SIB4 Huawei, Hisilicon, Ericssion, TF160 imported from 3GU
R5‑186942 CR of NR 508-1 Table 4.4.2-2_Default NR Cells parameters Huawei, Hisilicon, Hisilicon, Ericssion, TF160 imported from 3GU
R5‑186943 CR of NR 508-1 Table 4.6.3-107_ReportConfigNR Huawei, Hisilicon imported from 3GU
R5‑186944 Addition of NR test case 6.1.1.2_PLMN selection of Other PLMN Huawei, Hisilicon imported from 3GU
R5‑186945 Addition of NR test case 6.1.1.3_Cell reselection of ePLMN Huawei, Hisilicon imported from 3GU
R5‑186946 Addition of NR test case 6.1.1.4_PLMN selection in shared network environment Huawei, Hisilicon imported from 3GU
R5‑186947 Addition of NR test case 6.1.1.5_PLMN selection Huawei, Hisilicon imported from 3GU
R5‑186948 Addition of NR test case 6.1.2.1_Cell selection_Qrxlevmin Huawei, Hisilicon imported from 3GU
R5‑186949 Addition of NR test case 6.1.2.2_Cell selection_Qqualmin Huawei, Hisilicon imported from 3GU
R5‑186950 Addition of NR test case 6.1.2.3_Cell selection_Serving cell bar Huawei, Hisilicon imported from 3GU
R5‑186951 Addition of NR test case 6.1.2.4_Cell selection_Serving cell Squal below Zero Huawei, Hisilicon imported from 3GU
R5‑186952 Addition of NR test case 6.1.2.5_Cell Reselection Huawei, Hisilicon imported from 3GU
R5‑186953 Addition of NR test case 6.1.2.6_Cell Reselection for interband operation Huawei, Hisilicon imported from 3GU
R5‑186954 Addition of NR test case 6.1.2.9_Cell Reselection using Qhyst, Qoffset and Treselection Huawei, Hisilicon imported from 3GU
R5‑186955 Addition of NR test case 6.1.2.20_Inter-frequency cell reselection according to priority Huawei, Hisilicon imported from 3GU
R5‑186956 Addition of NR test case 6.1.2.21_Cell reselection,SIntra SearchQ and SnonIntraSeqrchQ Huawei, Hisilicon imported from 3GU
R5‑186957 Addition of NR test case 6.1.2.22_Inter-frequency cell reselection with parameters ThreshX, HighQ, ThreshX, LowQ and ThreshServing, LowQ Huawei, Hisilicon imported from 3GU
R5‑186958 Addition of NR test case 7.1.1.1.3_SI Request Huawei, Hisilicon imported from 3GU
R5‑186959 Addition of NR test case 7.1.1.1.6_Random access Huawei, Hisilicon imported from 3GU
R5‑186960 Addition of NR test case 7.1.1.2.3_CCCH HARQ Huawei, Hisilicon imported from 3GU
R5‑186961 Addition of NR test case 7.1.1.2.4_BCCH HARQ Huawei, Hisilicon imported from 3GU
R5‑186962 CR of NR test case 7.1.1.1.4_Beam Failure Huawei, Hisilicon imported from 3GU
R5‑186963 CR of NR test case 7.1.1.1.5_SUL Huawei, Hisilicon imported from 3GU
R5‑186964 CR of NR test case 7.1.1.3.7_Power Headroom Reporting Huawei, Hisilicon imported from 3GU
R5‑186965 CR of NR test case 7.1.1.5.4_DRX Huawei, Hisilicon imported from 3GU
R5‑186966 CR of NR test case 7.1.1.6.1_Correct handling of DL assignmentSemi persistent Huawei, Hisilicon imported from 3GU
R5‑186967 CR of NR test case 7.1.1.6.2_configured grant Type 1 Huawei, Hisilicon imported from 3GU
R5‑186968 CR of NR test case 7.1.1.6.3_configured grant Type 2 Huawei, Hisilicon imported from 3GU
R5‑186969 CR of NR test case 7.1.2.3.9_RLC Reassembling Huawei, Hisilicon imported from 3GU
R5‑186970 Addition of NR test case 8.1.1.1.2_Paging Huawei, Hisilicon imported from 3GU
R5‑186971 Addition of NR test case 8.1.1.2.1_RRC connection establishment Huawei, Hisilicon imported from 3GU
R5‑186972 Addition of NR test case 8.1.1.2.3_T300 expiry Huawei, Hisilicon imported from 3GU
R5‑186973 Addition of NR test case 8.1.1.3.1_Redirection to NR Huawei, Hisilicon imported from 3GU
R5‑186974 Addition of NR test case 8.1.3.1.1_Event A1 Huawei, Hisilicon imported from 3GU
R5‑186975 Addition of NR test case 8.1.3.1.2_ Measurement Event A2 Huawei, Hisilicon imported from 3GU
R5‑186976 Addition of NR test case 8.1.3.1.12.1_Measurement Event A6 Huawei, Hisilicon imported from 3GU
R5‑186977 Addition of NR test case 8.1.5.3.1_PWS notification Huawei, Hisilicon imported from 3GU
R5‑186978 Addition of NR test case 9.1.5.1.1_Registration Request Huawei, Hisilicon, Caict, CATT, Samsung, TF160, R&S, Motorola, Ericssion, Qualcomm imported from 3GU
R5‑186979 Addition of NR test case 9.1.6.1.2_T3521 timeout Huawei, Hisilicon imported from 3GU
R5‑186980 CR of 5G_NR_Applicability Huawei, Hisilicon imported from 3GU
R5‑186981 CR of 5G_NR_NAS_Applicability Huawei, Hisilicon imported from 3GU
R5‑186982 Update RLC-Config NTT DOCOMO INC. imported from 3GU
R5‑186983 CR of 5G_NR_Capabilities Huawei, Hisilicon imported from 3GU
R5‑186984 CR of applicability for NR test case 7.1.1.1.5_SUL Huawei, Hisilicon imported from 3GU
R5‑186985 Correction to SSAC connected mode test case 13.5.2a Keysight Technologies UK Ltd, Qualcomm Incorporated imported from 3GU
R5‑186986 Correction to NB-IoT test case 22.3.1.8 and 22.4.24 TDIA, CATT imported from 3GU
R5‑186987 Addition of SIB3 message_Resubmission of 185792 Huawei, Hisilicon imported from 3GU
R5‑186988 Addition of SIB5 message_Resubmission of 186054 Huawei, Hisilicon imported from 3GU
R5‑186989 Addition of SIB6 - SIB8 message_Resubmission of 186055 Huawei, Hisilicon imported from 3GU
R5‑186990 Addition of SIB9 message_Resubmission of 186056 Huawei, Hisilicon imported from 3GU
R5‑186991 Addition of NR test case 8.2.3.11.1_gapFR1_Resubmission of 186152 Huawei, Hisilicon imported from 3GU
R5‑186992 Addition of NR test case 8.2.3.11.2_gapFR2_Resubmission of 186153 Huawei, Hisilicon imported from 3GU
R5‑186993 Addition of NR test case 7.1.1.1.4_Beam Failure_Resubmission of 186078 Huawei, Hisilicon imported from 3GU
R5‑186994 Addition of NR test case 7.1.1.1.5_SUL_Resubmission of 186079 Huawei, Hisilicon imported from 3GU
R5‑186995 CR of test case 8.2.4.2_NR CA release_Resubmission of 186101 Huawei, Hisilicon imported from 3GU
R5‑186996 Correction to NB-IoT Test case 22.3.1.9 TDIA, MCC TF160, CATT imported from 3GU
R5‑186997 New WID proposal: UE Conformance Test Aspects – Enhancing LTE CA Utilization Nokia, Nokia Shanghai Bell imported from 3GU
R5‑186998 Correction to NB-IoT test case 22.3.2.6 TDIA, CATT imported from 3GU
R5‑186999 Correction to applicability for NB-IoT testcase 22.3.2.7 TDIA, MCC TF160, CATT imported from 3GU
R5‑187000 Correction to NB-IoT Test case 22.4.25 TDIA, CATT imported from 3GU
R5‑187001 Update NB-IoT Rel-14 DCI format N0/N1 with HARQ process number TDIA, MCC TF160, CATT imported from 3GU
R5‑187002 Correction to Table 8.1.6.1-15a SCPTMConfiguration-NB TDIA, CATT imported from 3GU
R5‑187003 Update NB-IOT Random Access test cases 6.2.16, 6.2.17 and 6.2.18 Huawei, HiSilicon imported from 3GU
R5‑187004 Update 6.2.4G.1 the V2V AMPR test case to remove brackets and add Power Class 2 Huawei, HiSilicon imported from 3GU
R5‑187005 Adding connection diagram for eNB-IoT RRM test case 6.2.18 Huawei, HiSilicon, CMCC imported from 3GU
R5‑187006 Add RRCSetup Ericsson imported from 3GU
R5‑187007 TDD configuration for UE Tx test in FR1 Ericsson imported from 3GU
R5‑187008 Introduction of Annex on Characteristics of the Interfering Signal Samsung,CMCC imported from 3GU
R5‑187009 Introduction of test case for Frequency error for CA Samsung,CMCC imported from 3GU
R5‑187010 Introduction of test cases for Transmit modulation quality for CA Samsung,CMCC imported from 3GU
R5‑187011 Introduction of test case for Spectrum emission mask for Inter-band CA Samsung,CMCC imported from 3GU
R5‑187012 Introduction of test case for NR ACLR for Inter-band CA Samsung,CMCC imported from 3GU
R5‑187013 Introduction of test case for UTRA ACLR for Inter-band CA Samsung,CMCC imported from 3GU
R5‑187014 Introduction of test case for General spurious emissions for Inter-band CA Samsung,CMCC imported from 3GU
R5‑187015 Introduction of test case for Spurious emission for UE co-existence for CA Samsung,CMCC imported from 3GU
R5‑187016 Introduction of test case for Transmit intermodulation for Inter-band CA Samsung,CMCC imported from 3GU
R5‑187017 Discussion on test configuration for some inter-band UL CA test cases Samsung imported from 3GU
R5‑187018 Calculation and specification of default values for SIB1 IE offsetToPointA Ericsson imported from 3GU
R5‑187019 TDD configuration for UE Tx test in FR2 Ericsson imported from 3GU
R5‑187020 Clarification of test channel BW and SCS selection NTT DOCOMO, INC. imported from 3GU
R5‑187021 Update RRCReconfiguration Ericsson imported from 3GU
R5‑187022 Necessity for functional testing in RAN5 NTT DOCOMO, INC. imported from 3GU
R5‑187023 Editorial update of Annex B Huawei, HiSilicon imported from 3GU
R5‑187024 Addition of MU contribution for demodulation test cases Huawei, HiSilicon imported from 3GU
R5‑187025 Addition of MU contribution for RRM test cases Huawei, HiSilicon imported from 3GU
R5‑187026 Addition of P-Max in Test environment for RF test Huawei, HiSilicon imported from 3GU
R5‑187027 Addition of Combinations of system information blocks in 4.4.3.1.2 Huawei, HiSilicon imported from 3GU
R5‑187028 Addition of test frequencies for SUL band n80 Huawei, HiSilicon imported from 3GU
R5‑187029 Addition of test frequencies for SUL band n81 Huawei, HiSilicon imported from 3GU
R5‑187030 Addition of test frequencies for SUL band n82 Huawei, HiSilicon imported from 3GU
R5‑187031 Addition of test frequencies for SUL band n83 Huawei, HiSilicon imported from 3GU
R5‑187032 Addition of test frequencies for SUL band n84 Huawei, HiSilicon imported from 3GU
R5‑187033 Addition of test frequencies for SUL band n86 Huawei, HiSilicon imported from 3GU
R5‑187034 Adding edge allcation into common uplink configuration in 6.1 Huawei, HiSilicon,CAICT imported from 3GU
R5‑187035 Update test points analysis for multiple FR1 test cases Huawei, HiSilicon, Keysight, CAICT imported from 3GU
R5‑187036 Removing the Editor's notes of SA messages and procedures for all FR1 test cases Huawei, HiSilicon imported from 3GU
R5‑187037 Removing the Editor's notes of SA messages and procedures for all FR2 test cases Huawei, HiSilicon imported from 3GU
R5‑187038 Update test points for multiple FR1 test cases Huawei, HiSilicon, Keysight, CAICT imported from 3GU
R5‑187039 Update MU and TT in Annex F of 38.521-2 Huawei, HiSilicon imported from 3GU
R5‑187040 Addition of new band into RF baseline implementation capabilities NTT DOCOMO, INC. imported from 3GU
R5‑187041 LTE TDD configuration for UE Tx test in EN-DC Ericsson imported from 3GU
R5‑187042 Update IE RadioBearerConfig Ericsson imported from 3GU
R5‑187043 Editorial correction to LAA Event Trigger Reporting Test 8.26.7 Anritsu imported from 3GU
R5‑187044 Editorial correction to the E-UTRA operating band group for Cat-M1 Clause 9 Tests Anritsu imported from 3GU
R5‑187045 Editorial correction to 9.1.10.1 Anritsu imported from 3GU
R5‑187046 Correction to Cat-M1 intra-frequency event triggered reporting tests Anritsu imported from 3GU
R5‑187047 Changing the cell configuration mapping tables to cater for generic duplex mode tests Anritsu imported from 3GU
R5‑187048 Correction to 3DL CA clause 8 generic duplex mode tests Anritsu imported from 3GU
R5‑187049 Editorial correction to 4CA and 5CA ACS test cases Anritsu imported from 3GU
R5‑187050 Editorial correction to 5DL CA blocking tests Anritsu imported from 3GU
R5‑187051 Correction to the test configuration table of 7.3A.6 Anritsu imported from 3GU
R5‑187052 Correction to frequency of CA_4A-7A for MSD with inter-band 2UL Anritsu imported from 3GU
R5‑187053 Core alignment of Delta RIB table Anritsu imported from 3GU
R5‑187054 Editorial correction to 6.6.3.1A.2 Transmitter Spurious emissions for CA Anritsu imported from 3GU
R5‑187055 Editorial correction to 6.5.1A.2 Frequency error for CA Anritsu imported from 3GU
R5‑187056 Correction to 6.2.5A.3 Configured UE transmitted Output Power for CA Anritsu imported from 3GU
R5‑187057 Core alignment of Delta TIB table Anritsu imported from 3GU
R5‑187058 Addition of test frequency for CA_48C and CA_48A-48A Anritsu imported from 3GU
R5‑187059 Addition of test frequency for CA_40A-40A and CA_40A-40C Anritsu imported from 3GU
R5‑187060 Correction to 4x4 CA demodulation tests Anritsu imported from 3GU
R5‑187061 Correction to 6.1.9 FDD Intra-frequency RRC Re-establishment for Cat-M1 UE in CEModeA Anritsu imported from 3GU
R5‑187062 Correction to Minimum Test time for 8.12.1.1.2 Demodulation of NPDSCH Anritsu imported from 3GU
R5‑187063 Correction to 8.26.7 FS3 Intra-frequency event triggered reporting Anritsu imported from 3GU
R5‑187064 Editorial correction to FR3 RRM clause 8 Tests Anritsu imported from 3GU
R5‑187065 Removal of TC 7.3F.2 Reference sensitivity level with repetition for Category NB1 Anritsu imported from 3GU
R5‑187066 Correction to LAA CQI tests Anritsu imported from 3GU
R5‑187067 Correction to FS3 CSI-RSRP accuracy tests Anritsu imported from 3GU
R5‑187068 Correction to 6.6.3.3A.2 Additional spurious emissions for CA Anritsu imported from 3GU
R5‑187069 Correction to 6.2.4A.2 Additional Maximum Power Reduction (A-MPR) for CA Anritsu imported from 3GU
R5‑187070 Correction to 6.2.4A.2_1 and 6.6.2.2A.2_1 Anritsu imported from 3GU
R5‑187071 Editorial correction to 6.6.2.2A.2 Additional Spectrum Emission Mask for CA Anritsu imported from 3GU
R5‑187072 Correction to 2x4 CA demodulation tests Anritsu imported from 3GU
R5‑187073 Correction to the MU for UL CA Anritsu imported from 3GU
R5‑187074 Editorial: 6.2.2EC, UE Maximum Output Power for UE category M2 Ericsson imported from 3GU
R5‑187075 Introduction of tc 6.2.3EC, Maximum Power Reduction (MPR) for UE category M2 Ericsson imported from 3GU
R5‑187076 Introduction of tc 6.2.5EC Configured UE transmitted Power for UE category M2 Ericsson imported from 3GU
R5‑187077 Introduction of tc 6.3.2EC, Minimum Output Power for UE category M2 Ericsson imported from 3GU
R5‑187078 Introduction of tc 6.3.3EC, UE Transmit OFF power for UE category M2 Ericsson imported from 3GU
R5‑187079 Introduction of 6.3.4EC.1, General ON/OFF time mask for UE category M2 Ericsson imported from 3GU
R5‑187080 Introduction of 6.3.5EC.1, Power Control Absolute power tolerance for UE category M2 Ericsson imported from 3GU
R5‑187081 Introduction of 6.3.5EC.2, Power Control Relative power tolerance for UE category M2 Ericsson imported from 3GU
R5‑187082 Introduction of 6.3.5EC.3, Aggregate power control tolerance for UE category M2 Ericsson imported from 3GU
R5‑187083 Test Point analysis for FR1 PRACH test case KTL imported from 3GU
R5‑187084 Introduction of New test case 6.4B.2.2.1 Error Vector Magnitude for intra-band non-contiguous EN-DC KTL imported from 3GU
R5‑187085 Introduction of New test case 6.4B.2.2.2 Carrier Leakage for intra-band non-contiguous EN-DC KTL imported from 3GU
R5‑187086 Specifying Test procedure to check that UE is camped on a new NR cell belonging to a new TA Samsung imported from 3GU
R5‑187087 Introduction of New test case 6.4B.2.2.3 In-band Emissions for intra-band non-contiguous EN-DC KTL imported from 3GU
R5‑187088 Introduction of New test case 6.4B.2.3.1 Error Vector Magnitude for inter-band EN-DC within FR1 KTL imported from 3GU
R5‑187089 Introduction of New test case 6.4B.2.3.2 Carrier Leakage for inter-band EN-DC within FR1 KTL, MTCC imported from 3GU
R5‑187090 Introduction of New test case 6.4B.2.3.3 In-band Emissions for inter-band EN-DC within FR1 KTL, MTCC imported from 3GU
R5‑187091 Update to FR1 test case 6.3.3.4 PRACH time mask KTL imported from 3GU
R5‑187092 Introduction of New test case 6.6.2.2A.1_2 Additional Spectrum Emission Mask for CA (intra-band contiguous DL CA and UL CA) for UL 256QAM KTL imported from 3GU
R5‑187093 Introduction of New test case 6.6.2.2A.2_2 Additional Spectrum Emission Mask for CA (inter-band DL CA and UL CA) for UL 256QAM KTL imported from 3GU
R5‑187094 Update to Tx test cases for UL 256QAM KTL imported from 3GU
R5‑187095 Addition of applicability and ICS for Tx test cases for UL 256QAM CA KTL imported from 3GU
R5‑187096 Update to 3 Tx test case for 3UL CA KTL imported from 3GU
R5‑187097 Addition of applicability and ICS for Tx test cases for 3UL CA KTL imported from 3GU
R5‑187098 Update TC 6.6.3G.2_1 Huawei, HiSilicon imported from 3GU
R5‑187099 Inter-band con-current V2X configurations- Add 3A_47A Spurious Emission Test points analysis Huawei, HiSilicon imported from 3GU
R5‑187100 PRD-17 on Guidance to Work Item Codes version 3.14 (post RAN#82 version) Rapporteur (BlackBerry) imported from 3GU
R5‑187101 TS 36.523-1 Status before RAN5#81 Rapporteur (BlackBerry) imported from 3GU
R5‑187102 TS 36.523-1 Status after RAN5#81 Rapporteur (BlackBerry) imported from 3GU
R5‑187103 Proposed Word Template for RAN5 WI Work Plan BlackBerry UK Limited imported from 3GU
R5‑187104 Correcton to MAC test cases Motorola Mobility and MCC TF160 imported from 3GU
R5‑187105 Correcton to RLC UM test cases Motorola Mobility and MCC TF160 imported from 3GU
R5‑187106 Correcton to RLC AM test cases Motorola Mobility and MCC TF160 imported from 3GU
R5‑187107 Correcton to PDCP Ciphering test cases Motorola Mobility and MCC TF160 imported from 3GU
R5‑187108 Correcton to PDCP Integrity test cases Motorola Mobility and MCC TF160 imported from 3GU
R5‑187109 Correcton to SDAP test cases Motorola Mobility imported from 3GU
R5‑187110 Correcton to default message contents for SRB3 configuration Motorola Mobility and MCC TF160 imported from 3GU
R5‑187111 Correcton to MAC TBS test cases Motorola Mobility and MCC TF160 imported from 3GU
R5‑187112 Addition of Test Loop for SDAP testing Ericsson, Motorola Mobility and Samsung imported from 3GU
R5‑187113 Correction of 5GC terminology Motorola Mobility and MCC TF160 imported from 3GU
R5‑187114 Correction to RRCConnectionReconfiguration Motorola Mobility, Qualcomm, Huawei, MCC TF160 imported from 3GU
R5‑187115 Addition of PICS Motorola Mobility, CMCC imported from 3GU
R5‑187116 Correcton to Selection Expressions Motorola Mobility and MCC TF160 imported from 3GU
R5‑187117 WP UE Conformance Test Aspects – 5G System Non-3GPP Access Motorola Mobility imported from 3GU
R5‑187118 SR UE Conformance Test Aspects – 5G System Non-3GPP Access Motorola Mobility imported from 3GU
R5‑187119 Correction to test case 8.2.4.1 for CAT-M1 UEs ROHDE & SCHWARZ,Qualcomm Incorporated imported from 3GU
R5‑187120 Correction to test case 8.2.4.2 for CAT-M1 UEs ROHDE & SCHWARZ, Qualcomm Incorporated imported from 3GU
R5‑187121 Correction to test case 8.2.4.5 for CAT-M1 UEs ROHDE & SCHWARZ, Qualcomm Incorporated imported from 3GU
R5‑187122 Correction to test case 8.2.4.7 for CAT-M1 UEs ROHDE & SCHWARZ, Qualcomm Incorporated imported from 3GU
R5‑187123 Correction to test case 8.2.4.8 for CAT-M1 UEs ROHDE & SCHWARZ, Qualcomm Incorporated imported from 3GU
R5‑187124 Correction to test cases 8.3.1.10, 8.3.1.11a, 8.3.1.15 and 8.3.1.16 for CAT-M1 UEs ROHDE & SCHWARZ, Qualcomm Incorporated imported from 3GU
R5‑187125 Correction to test case 8.3.1.8 for CAT-M1 UEs ROHDE & SCHWARZ imported from 3GU
R5‑187126 Correction to test case 8.3.1.9 for CAT-M1 UEs ROHDE & SCHWARZ, Qualcomm Incorporated imported from 3GU
R5‑187127 Correction to test case 8.3.1.11 for CAT-M1 UEs ROHDE & SCHWARZ, Qualcomm Incorporated imported from 3GU
R5‑187128 Correction to test case 9.2.2.1.9 for CAT-M UEs ROHDE & SCHWARZ, Qualcomm Incorporated imported from 3GU
R5‑187129 Maximum Output Power for CA Sprint Corporaton imported from 3GU
R5‑187130 MOP for CA (intra-band contiguous DL CA and UL CA) Sprint Corporaton imported from 3GU
R5‑187131 A-MPR for CA (intra-band contiguous DL CA and UL CA) Sprint Corporaton imported from 3GU
R5‑187132 Configured UE transmitted output power for CA (intra-band contiguous DL CA and UL CA) Sprint Corporaton imported from 3GU
R5‑187133 ACLR for CA (intra-band contiguous DL CA and UL CA) Sprint Corporaton imported from 3GU
R5‑187134 Test point selection in A-MPR test cases Sprint Corporaton imported from 3GU
R5‑187135 Applicability Sprint Corporaton imported from 3GU
R5‑187136 UE Conformance Test Aspects - Add UE Power Class 2 to band 41 intra-band contiguous LTE Carrier Aggregation Sprint Corporaton imported from 3GU
R5‑187137 UE Conformance Test Aspects - Add UE Power Class 2 to band 41 intra-band contiguous LTE Carrier Aggregation Sprint Corporaton imported from 3GU
R5‑187138 Updated RF clause 9.8 to cover Cat-M2 requirement Bureau Veritas imported from 3GU
R5‑187139 Updated RRM clause 4 tests to cover Cat-M2 requirement Bureau Veritas imported from 3GU
R5‑187140 Updated RRM clause 5 tests to cover Cat-M2 requirement Bureau Veritas imported from 3GU
R5‑187141 Updated RRM clause 6 tests to cover Cat-M2 requirement Bureau Veritas imported from 3GU
R5‑187142 Updated RRM clause 7 tests to cover Cat-M2 requirement Bureau Veritas imported from 3GU
R5‑187143 Align CA information in clause 5 with TS36.101 v15.4.0 Bureau Veritas imported from 3GU
R5‑187144 Align CA information in clause 7.3A.0 with TS36.101 v15.4.0 Bureau Veritas imported from 3GU
R5‑187145 Updated test requirement to RF clause 7 test cases for CA band Bureau Veritas imported from 3GU
R5‑187146 Updated to TC9.6.1.1_A.4 for 5DL CA requirement Bureau Veritas imported from 3GU
R5‑187147 Correction to test configuration table for CA band combination Bureau Veritas, Anritsu, SGS Wireless imported from 3GU
R5‑187148 General clauses updated for TR38.903 Bureau Veritas, Huawei, HiSilicon imported from 3GU
R5‑187149 Updated to Annexes for FR1 tests Bureau Veritas imported from 3GU
R5‑187150 General clauses updated for TS38.521-1 Bureau Veritas imported from 3GU
R5‑187151 Updated to Annexes for FR2 tests Bureau Veritas imported from 3GU
R5‑187152 General Information updated for TS38.521-2 Bureau Veritas imported from 3GU
R5‑187153 Updated EN-DC configuration information in clause 5 Bureau Veritas imported from 3GU
R5‑187154 Added applicability of requirements for UEs supporting coverage enhancement Bureau Veritas imported from 3GU
R5‑187155 Added ICS item for missing Category DL and UL Bureau Veritas imported from 3GU
R5‑187156 Correction to tested CA configuration selection criteria for Rx tests Bureau Veritas imported from 3GU
R5‑187157 Correction to RLC test case 7.2.3.13 ROHDE & SCHWARZ imported from 3GU
R5‑187158 Updates to Authentication 5GMM messages Ericsson imported from 3GU
R5‑187159 Updates to Configuration Update 5GMM messages Ericsson imported from 3GU
R5‑187160 Updates to De-registration 5GMM messages Ericsson imported from 3GU
R5‑187161 Updates to Identity 5GMM messages Ericsson imported from 3GU
R5‑187162 Updates to NAS Transport 5GMM messages Ericsson imported from 3GU
R5‑187163 Updates to Notification 5GMM messages Ericsson imported from 3GU
R5‑187164 Updates to PDU session authentication 5GSM messages Ericsson imported from 3GU
R5‑187165 Updates to PDU session establishment 5GSM messages Ericsson imported from 3GU
R5‑187166 Updates to PDU session modification 5GSM messages Ericsson imported from 3GU
R5‑187167 Updates to PDU session release 5GSM messages Ericsson imported from 3GU
R5‑187168 Updates to Registration 5GMM messages Ericsson imported from 3GU
R5‑187169 Updates to Security mode 5GMM messages Ericsson imported from 3GU
R5‑187170 Updates to Security protected 5GS NAS and 5GMM status messages Ericsson imported from 3GU
R5‑187171 Updates to Service Request 5GMM messages Ericsson imported from 3GU
R5‑187172 Removal of Editor’s Notes in section 4.6.3 Ericsson imported from 3GU
R5‑187173 Addition of new Information Elements in section 4.6.3 Ericsson imported from 3GU
R5‑187174 Addition and updates to Information Elements in section 4.6.4 Ericsson imported from 3GU
R5‑187175 Addition and updates to Information Elements in section 4.6.5 Ericsson imported from 3GU
R5‑187176 New feMTC IEs Ericsson imported from 3GU
R5‑187177 New feMTC test case 21.2.2 Ericsson imported from 3GU
R5‑187178 Removal of feMTC test case 8.2.2.6.6 Ericsson imported from 3GU
R5‑187179 Updates to feMTC test case applicabilities Ericsson imported from 3GU
R5‑187180 WP UE Conformance Test Aspects – Further enhanced MTC for LTE Ericsson imported from 3GU
R5‑187181 SR UE Conformance Test Aspects – Further enhanced MTC for LTE Ericsson imported from 3GU
R5‑187182 Clarification for Cat-M1 Reference Sensitivity Test Requirement PCTEST Engineering Lab, Verizon, AT&T imported from 3GU
R5‑187183 Correction to number of almanac elements for Galileo ROHDE & SCHWARZ, Spirent Communications imported from 3GU
R5‑187184 Correction to V2V TC 24.1.4 ROHDE & SCHWARZ, Qualcomm Incorporated imported from 3GU
R5‑187185 Discussion on duplicated testing of UL 64QAM and UL 256QAM in Tx test cases CETECOM GmbH imported from 3GU
R5‑187186 Corrections to clause 5.5.9 of 36.579-1 NIST imported from 3GU
R5‑187187 Change of applicability in UL 64QAM MPR and A-MPR tests due to UL 256QAM support CETECOM GmbH imported from 3GU
R5‑187188 Change of applicability in UL 64QAM A-SEM and ACLR and Additional spurious tests due to UL 256QAM support CETECOM GmbH imported from 3GU
R5‑187189 Corrections to clause 5.5.7.1 of 36.579-1 NIST imported from 3GU
R5‑187190 Correction of LWA Test Case 8.2.5.8 Intel Corporation (UK) Ltd imported from 3GU
R5‑187191 Change of test point applicability in TC 6.2.3_4 due to 256QAM support CETECOM GmbH imported from 3GU
R5‑187192 Change of test point applicability in TC 6.2.4_2 due to 256QAM support CETECOM GmbH imported from 3GU
R5‑187193 Change of test point applicability in TC 6.6.2.2_1 due to 256QAM support CETECOM GmbH imported from 3GU
R5‑187194 Corrections to LWA TC 8.2.5.7 Intel Corporation (UK) Ltd imported from 3GU
R5‑187195 Change of test point applicability in TC 6.6.2.3_4 due to 256QAM support CETECOM GmbH imported from 3GU
R5‑187196 Aligning CA delta TiB in sub-clause 6.2.5.3 with TS 36.101 v15.4.0 Ericsson imported from 3GU
R5‑187197 Change of test point applicability in TC 6.6.3.3_1 due to 256QAM support CETECOM GmbH imported from 3GU
R5‑187198 Correction to GCF WI-086 EUTRA EPC Testcases 9.2.1.2.1b and 9.2.1.2.1c ANRITSU LTD imported from 3GU
R5‑187199 Correction of LWA Test Case 8.2.5.4 and LWIP 8.2.5.5 Intel Corporation (UK) Ltd imported from 3GU
R5‑187200 Aligning CA delta RiB in sub-clause 7.3.3 with TS 36.101 v15.4.0 Ericsson imported from 3GU
R5‑187201 Addition of support for LWA/LWIP Test Cases in generic procedures Intel Corporation (UK) Ltd imported from 3GU
R5‑187202 Addition of new UL 256QAM test case - MPR for intra-band contiguous CETECOM GmbH imported from 3GU
R5‑187203 Update for Resource-lists in 36.579-1 NIST imported from 3GU
R5‑187204 Addition of new UL 256QAM test case - MPR for inter-band CETECOM GmbH imported from 3GU
R5‑187205 Addition of new UL 256QAM test case - ACLR for multi cluster CETECOM GmbH imported from 3GU
R5‑187206 SR - UE Conformance Test Aspects - Mission Critical Improvements (UID - 790052) MCImp-UEConTest NIST imported from 3GU
R5‑187207 WP - UE Conformance Test Aspects - Mission Critical Improvements (UID - 790052) MCImp-UEConTest NIST imported from 3GU
R5‑187208 Addition of new UL 256QAM test case - MPR for intra-band contiguous CETECOM GmbH imported from 3GU
R5‑187209 Correction to Table 5.5.1-1 in 36.579-1 NIST imported from 3GU
R5‑187210 Addition of new UL 256QAM test case - ALCR for intra-band contiguous CETECOM GmbH imported from 3GU
R5‑187211 Addition of new UL 256QAM test case - MPR for inter-band CETECOM GmbH imported from 3GU
R5‑187212 Addition of new UL 256QAM test case - ACLR for inter-band CETECOM GmbH imported from 3GU
R5‑187213 Correction to Table 5.5.4.10.1-1 in 36.579-1 NIST imported from 3GU
R5‑187214 Discussion on Mid test channel bandwidth in Band n257 NTT DOCOMO, INC. imported from 3GU
R5‑187215 Update of Mid test channel bandwidth in Band n257 NTT DOCOMO, INC. imported from 3GU
R5‑187216 Corrections to LWA/LWIP Test Cases 8.2.5.1, 8.2.5.2, 8.2.5.6 Intel Corporation (UK) Ltd imported from 3GU
R5‑187217 Corrections to Test Case 8.2.5.2 Intel Corporation (UK) Ltd imported from 3GU
R5‑187218 Corrections to Test Case 8.2.5.6 Intel Corporation (UK) Ltd imported from 3GU
R5‑187219 Characterization of the quality of quiet zone for 30 cm DUT size IFF Anritsu imported from 3GU
R5‑187220 MU contribution of “Mismatch” Anritsu imported from 3GU
R5‑187221 MU contribution of “Uncertainty of the RF power measurement" Anritsu imported from 3GU
R5‑187222 MU contribution of "Amplifier Uncertainties" Anritsu imported from 3GU
R5‑187223 MU contribution of “Influence of the XPD“ Anritsu imported from 3GU
R5‑187224 Correction to measurement error contribution descriptions of XPD Anritsu imported from 3GU
R5‑187225 MU contribution of "Insertion loss variation" Anritsu imported from 3GU
R5‑187226 MU contribution of “RF leakage” Anritsu imported from 3GU
R5‑187227 Correction to measurement error contribution descriptions of RF leakage Anritsu imported from 3GU
R5‑187228 Consideration on MU contribution caused by antenna switching Anritsu imported from 3GU
R5‑187229 MU contribution of “gNB uncertainty on absolute level” Anritsu imported from 3GU
R5‑187230 MU contribution of “Uncertainty of network analyzer” Anritsu imported from 3GU
R5‑187231 MU contribution of “Mean signal level shift due to Meas.Ant directivity and AUT-position uncertainty” Anritsu imported from 3GU
R5‑187232 MU contribution of “Influence of noise due to low SNR” Anritsu imported from 3GU
R5‑187233 Update of MU budget tables in TR 38.903 Anritsu imported from 3GU
R5‑187234 Simplification of QoQZ characterization at out-of-band region Anritsu imported from 3GU
R5‑187235 Consideration of TT values in different frequency ranges for FR2 Apple Inc. imported from 3GU
R5‑187236 Update RRC TC 8.2.1.2.1 - BandwidthPart Configuration / SCG / EN-DC Qualcomm Korea (TTA) imported from 3GU
R5‑187237 Update RRC TC 8.2.2.4.1 - PSCell addition, modification and release / SCG DRB / EN-DC Qualcomm Korea (TTA) imported from 3GU
R5‑187238 Update RRC TC 8.2.2.8.1 - Bearer Modification / Handling for bearer type change with security key change / EN-DC Qualcomm Korea (TTA) imported from 3GU
R5‑187239 Update RRC TC 8.2.2.9.1 - Bearer Modification / Uplink data path / Split DRB Reconfiguration / EN-DC Qualcomm Korea (TTA) imported from 3GU
R5‑187240 Update RRC TC 8.2.3.1.1 - Measurement configuration control and reporting / Inter-RAT measurements / Event B1 / Measurement of NR cells / EN-DC Qualcomm Korea (TTA) imported from 3GU
R5‑187241 Update RRC SCG failure TC 8.2.5.1.1 Qualcomm Korea (TTA) imported from 3GU
R5‑187242 Update RRC SCG failure TC 8.2.5.3.1 Qualcomm Korea (TTA) imported from 3GU
R5‑187243 Update RRC TC 8.2.1.1.1 - UE capability transfer / Success / EN-DC Qualcomm Korea (TTA) imported from 3GU
R5‑187244 Addition of 5GS SA RRC TC 8.1.1.1.1 Qualcomm Korea (TTA) imported from 3GU
R5‑187245 Addition of 5GS SA RRC TC 8.1.1.1.3 Qualcomm Korea (TTA) imported from 3GU
R5‑187246 Addition of 5GS SA RRC TC 8.1.1.2.5 Qualcomm Korea (TTA) imported from 3GU
R5‑187247 Addition of 5GS SA RRC TC 8.1.5.2.1 Qualcomm Korea (TTA) imported from 3GU
R5‑187248 Correction to MAC Test case 7.1.1.1.2 Random access procedure / Successful / C-RNTI Based / Preamble selected by MAC itself Qualcomm Europe Inc.(Spain) imported from 3GU
R5‑187249 Correction to MAC Test case 7.1.1.5.3 DRX operation / Short cycle configured / Parameters configured by RRC Qualcomm Europe Inc.(Spain) imported from 3GU
R5‑187250 Correction to RLC Test case 7.1.2.3.10 AM RLC / Re-transmission of RLC PDU with and without re-segmentation Qualcomm Europe Inc.(Spain) imported from 3GU
R5‑187251 Correction to RLC Test case 7.1.2.3.11 AM RLC / RLC re-establishment procedure Qualcomm Europe Inc.(Spain) imported from 3GU
R5‑187252 Correction to PDCP Test case 7.1.3.4.1 PDCP handover / Lossless handover / PDCP sequence number maintenance / PDCP status report to convey the information on missing or acknowledged PDCP SDUs at handover / In-order delivery and duplicate elimination Qualcomm Europe Inc.(Spain) imported from 3GU
R5‑187253 Correction to PDCP Test case 7.1.3.5.4 PDCP reordering / Maximum re-ordering delay below t-Reordering / t-Reordering timer operations Qualcomm Europe Inc.(Spain) imported from 3GU
R5‑187254 Update RRC TCs 8.2.4.1.1.1, 8.2.4.1.1.2 and 8.2.4.1.1.3 NR CA / NR SCell addition / modification / release / Success Qualcomm Europe Inc.(Spain) imported from 3GU
R5‑187255 Correction to EN-DC NAS test case 10.2.1.1 - Default EPS bearer context activation Qualcomm Europe Inc.(Spain) imported from 3GU
R5‑187256 Addition of 5GC TC - Initial registration / 5GS services / NSSAI handling Qualcomm Europe Inc.(Spain) imported from 3GU
R5‑187257 Addition of Idle Mode TC - Steering of UE in roaming during registration/security check successful using List Type Qualcomm Europe Inc.(Spain) imported from 3GU
R5‑187258 UE Capability in EN-DC Qualcomm Europe Inc.(Spain) imported from 3GU
R5‑187259 Updates to SIG OTA Calibration for FR2 Qualcomm Europe Inc.(Spain) imported from 3GU
R5‑187260 Addition of 5GC TC - Initial registration / SMS over NAS service Qualcomm Europe Inc.(Spain) imported from 3GU
R5‑187261 EN-DC B41_n41 update for Signaling Qualcomm Europe Inc.(Spain) imported from 3GU
R5‑187262 Introduction of 4 DL CA Activation and Deactivation of Known SCell in Non-DRX with generic duplex modes LG Electronics imported from 3GU
R5‑187263 pCR for Addition of Test Case 4.4.3.1 EN-DC FR1 timing advance adjustment accuracy Qualcomm CDMA Technologies imported from 3GU
R5‑187264 Introduction of 4 DL CA Activation and Deactivation of Unknown SCell in Non-DRX with generic duplex modes LG Electronics imported from 3GU
R5‑187265 Introduction of 5 DL CA Activation and Deactivation of Known SCell in Non-DRX with generic duplex modes LG Electronics imported from 3GU
R5‑187266 Introduction of 5 DL CA Activation and Deactivation of Unknown SCell in Non-DRX with generic duplex modes LG Electronics imported from 3GU
R5‑187267 Editorial correction to FS3 RRM clause 8 Tests Anritsu imported from 3GU
R5‑187268 CA_3A-28A - Updates of test points analysis KDDI Corporation imported from 3GU
R5‑187269 Addition of new TC 9.1.8.4 Starpoint,TDIA,CATT imported from 3GU
R5‑187270 Updating 4.2.1^^ General functional requirements Anritsu imported from 3GU
R5‑187271 Update the section for test equipment requirements for TRx Anritsu imported from 3GU
R5‑187272 FR2 downlink signal level(38.508-1) Anritsu imported from 3GU
R5‑187273 Consideration on MU and TT for FR2 Tx test cases with low SNR Anritsu imported from 3GU
R5‑187274 SNR estimation for priority 1 and 2 FR2 Tx test cases Anritsu imported from 3GU
R5‑187275 Discussion of MU for occupied BW for FR1 Anritsu imported from 3GU
R5‑187276 On the FR2 MU for occupied BW and ACLR Anritsu imported from 3GU
R5‑187277 Introduction of receiver spurious emission tests for FR1 inter-band EN-DC Anritsu imported from 3GU
R5‑187278 TP analysis for receiver spurious emission tests for FR1 inter-band EN-DC Anritsu imported from 3GU
R5‑187279 Introduction of wideband intermodulation tests for FR1 inter-band EN-DC Anritsu imported from 3GU
R5‑187280 TP analysis for wideband intermodulation tests for FR1 inter-band EN-DC Anritsu imported from 3GU
R5‑187281 Introduction of receiver spurious emission tests for FR1 SA Anritsu imported from 3GU
R5‑187282 TP analysis for receiver spurious emission tests for FR1 SA Anritsu imported from 3GU
R5‑187283 Introduction of wideband intermodulation tests for FR1 SA Anritsu imported from 3GU
R5‑187284 TP analysis for wideband intermodulation tests for FR1 SA Anritsu imported from 3GU
R5‑187285 Updating power levels for LTE Anchor Link Anritsu imported from 3GU
R5‑187286 FR2 downlink signal level(38.521-2) Anritsu imported from 3GU
R5‑187287 LTE Anchor Link configuration for FR2 Anritsu imported from 3GU
R5‑187288 Correction to RB numbers for DFT-s-OFDM Anritsu imported from 3GU
R5‑187289 On the test procedure for FR2 maximum input level test Anritsu imported from 3GU
R5‑187290 On the testability issue for the FR2 TRx tests Anritsu imported from 3GU
R5‑187291 CA_3A-28A - Updates of some Tx test cases KDDI Corporation imported from 3GU
R5‑187292 CA_11A-18A - Updates of test points analysis KDDI Corporation imported from 3GU
R5‑187293 CA_11A-18A - Updates of some Tx test cases KDDI Corporation imported from 3GU
R5‑187294 CA_3A-41A-42C(1UL) - Updates of test points analysis KDDI Corporation imported from 3GU
R5‑187295 CA_3A-41A-42C(1UL) - Updates of 7.3A.9 REFSENS KDDI Corporation imported from 3GU
R5‑187296 Ambiguity on procedure of selecting CA configuration in SDR CA (4layer) tests NTT DOCOMO, INC. imported from 3GU
R5‑187297 CA_3A-41C-42A(1UL) - Updates of test points analysis KDDI Corporation imported from 3GU
R5‑187298 CA_3A-41C-42A(1UL) - Updates of 7.3A.9 REFSENS KDDI Corporation imported from 3GU
R5‑187299 CA_3A-41C-42C(1UL) - Updates of test points analysis KDDI Corporation imported from 3GU
R5‑187300 CA_3A-41C-42C(1UL) - Updates of 7.3A.10 REFSENS KDDI Corporation imported from 3GU
R5‑187301 Addition of new TC 9.1.8.6 Starpoint,TDIA,CATT imported from 3GU
R5‑187302 Correction to test case 8.2.4.3.1.1 TDIA, CATT imported from 3GU
R5‑187303 Addition of new 5GC TC 9.1.5.2.2 CATT, TDIA imported from 3GU
R5‑187304 Correction of RB allocation for 3DL_CA_1A-3A-41A Qualcomm Incorporated imported from 3GU
R5‑187305 Addition of new TC 9.1.8.7 Starpoint,TDIA,CATT imported from 3GU
R5‑187306 Addition of new 5GC TC 9.1.6.1.1 CATT,TDIA imported from 3GU
R5‑187307 Introduction of New FR1 test case 6.3.3.6 SRS time mask MTCC, KTL imported from 3GU
R5‑187308 5G_FR1 Text update for 6.5.3.3 Additonal Spurious emission Qualcomm Incorporated imported from 3GU
R5‑187309 Introduction of New FR1 test case 6.3.3.7 PUSCH-PUCCH and PUSCH-SRS time masks MTCC, KTL imported from 3GU
R5‑187310 Editorial change to applicability condition for TC8.2.1.3.1_A.1 TTA imported from 3GU
R5‑187311 Addition of general test procedures for 5GC testing CATT imported from 3GU
R5‑187312 Additonal Spurious Emissions for Intra-band contiguous EN-DC Qualcomm Incorporated imported from 3GU
R5‑187313 Additonal Spurious Emissions for Intra-band non-contiguous EN-DC Qualcomm Incorporated imported from 3GU
R5‑187314 Addition of test applicabilities for 5GC testcases CATT imported from 3GU
R5‑187315 Addition of notes to clarify test point selection into general section of TS 38.521-1 NTT DOCOMO, INC. imported from 3GU
R5‑187316 Addition of new TC 9.1.8.11 Starpoint,TDIA,CATT imported from 3GU
R5‑187317 Additonal Spurious emission for inter-band EN-DC Qualcomm Incorporated imported from 3GU
R5‑187318 Addition of notes to clarify test point selection into general section of TS 38.521-2 NTT DOCOMO, INC. imported from 3GU
R5‑187319 Addition of notes to clarify test point selection into general section of TS 38.521-3 NTT DOCOMO, INC. imported from 3GU
R5‑187320 Spurious emission band UE co-existence for intra-band non-contiguous EN-DC Qualcomm Incorporated imported from 3GU
R5‑187321 Core alignment CR to capture TS 38.101-1 updates during RAN4#89 NTT DOCOMO, INC. imported from 3GU
R5‑187322 Correction to clause 9.1.1.4.2 TTA imported from 3GU
R5‑187323 Core alignment CR to capture TS 38.101-2 updates during RAN4#89 NTT DOCOMO, INC. imported from 3GU
R5‑187324 Core alignment CR to capture TS 38.101-3 updates during RAN4#89 NTT DOCOMO, INC. imported from 3GU
R5‑187325 Addition of new 5GC TC 9.1.2.1 TDIA, CATT imported from 3GU
R5‑187326 Addition of new TC 9.1.8.15 Starpoint,TDIA,CATT imported from 3GU
R5‑187327 Update of test case 9.6.1.1_A.4 TTA imported from 3GU
R5‑187328 Update the applicability of 5G NR TC 8.2.3.12.1 Intertek, Qualcomm imported from 3GU
R5‑187329 Introduction of Additional spurious emissions for UL 256QAM TTA imported from 3GU
R5‑187330 Applicability addition of test case 6.6.3.3A.1_2 TTA imported from 3GU
R5‑187331 Addition of new UL 256QAM test case - Annex F CETECOM GmbH imported from 3GU
R5‑187332 Correction of applicability statement in TC 6.2.4A.2_2 CETECOM GmbH imported from 3GU
R5‑187333 TP analyses for new Rel-15 CA configurations CETECOM GmbH imported from 3GU
R5‑187334 Changing the cell configuration mapping tables to cater for RRM generic duplex mode tests Anritsu, Intel, ROHDE & SCHWARZ imported from 3GU
R5‑187335 Test points and test requirements in TC 7.3A.9 for CA_2A-66C-71A and CA_2C-66A-66A CETECOM GmbH imported from 3GU
R5‑187336 Mismatch (40 - 60 GHz) Anritsu imported from 3GU
R5‑187337 Addition of descriptions on new MU contributions Anritsu imported from 3GU
R5‑187338 Temporary Anritsu imported from 3GU
R5‑187339 Addition of new UL 256QAM test cases - applicability CETECOM GmbH imported from 3GU
R5‑187340 Introduction of CA_2A-66C-71A in Rx test cases CETECOM GmbH imported from 3GU
R5‑187341 Introduction of CA configurations CA_2A-66C-71A and CA_2C-66A-66A CETECOM GmbH imported from 3GU
R5‑187342 Introduction of CA configurations CA_2A-66C-71A and CA_2C-66A-66A CETECOM GmbH imported from 3GU
R5‑187343 Correction of applicability statement in TC 6.2.4A.1 CETECOM GmbH imported from 3GU
R5‑187344 Addition of new Rel-14 CA configurations into REFSENS test NTT DOCOMO, INC. imported from 3GU
R5‑187345 Addition of new Rel-15 CA configurations into REFSENS test NTT DOCOMO, INC. imported from 3GU
R5‑187346 Correction of applicability in TC 6.6.2.2A.2 and TC.6.6.3.3A.2 CETECOM GmbH imported from 3GU
R5‑187347 Correction for test procedure step 4 in TC 6.6.3.3A.1 CETECOM GmbH imported from 3GU
R5‑187348 Correction for test procedure in TC 6.6.3.3A.2 CETECOM GmbH imported from 3GU
R5‑187349 Correction for test procedure in TC 6.6.3.3A.1_1 CETECOM GmbH imported from 3GU
R5‑187350 Correction for test procedure in TC 6.6.3.3A.2_1 CETECOM GmbH imported from 3GU
R5‑187351 Addition of new 5GC TC 9.1.8.13 CAICT imported from 3GU
R5‑187352 Update for reference sensitivity TP analysis for CA_2A-66A-71A CA configuration CETECOM GmbH imported from 3GU
R5‑187353 Correction in TC 7.3A.3 for CA configuration CA_2A-71A CETECOM GmbH imported from 3GU
R5‑187354 Correction in TC 7.3A.5 for CA configuration CA_2A-66A-71A CETECOM GmbH imported from 3GU
R5‑187355 Addition of new 5GC TC 9.1.8.17 CAICT imported from 3GU
R5‑187356 Addition of 5GC test case 10.1.2.1 CATT, TDIA imported from 3GU
R5‑187357 Addition of 5GC test case 10.1.3.1 CATT, TDIA imported from 3GU
R5‑187358 Addition of applicability of feMTC test cases Ericsson imported from 3GU
R5‑187359 Addition of 5GC Test case 10.1.5.1 TDIA, CATT imported from 3GU
R5‑187360 Update RRC TC 8.2.3.12.1 Intertek imported from 3GU
R5‑187361 Introduction of Error Vector Magnitude for intra-band contiguous EN-DC LG Electronics imported from 3GU
R5‑187362 Introduction of Carrier Leakage for intra-band contiguous EN-DC LG Electronics imported from 3GU
R5‑187363 Corrections to TC 7.3A.5 Rohde & Schwarz imported from 3GU
R5‑187364 Correction to general clause 7.1 Rohde & Schwarz imported from 3GU
R5‑187365 Corrections to eMTC CQI Test Cases Rohde & Schwarz imported from 3GU
R5‑187366 Introduction of In-band Emissions for intra-band contiguous EN-DC LG Electronics imported from 3GU
R5‑187367 Update of V2X RF Receiver Test Cases for Intra-band contiguous SGS Wireless imported from 3GU
R5‑187368 Addition of TC6.3B.3.1 Tx ON/OFF time mask for intra-band contiguous EN-DC SGS Wireless imported from 3GU
R5‑187369 Addition of TC6.3B.3.2 Tx ON/OFF time mask for intra-band non-contiguous EN-DC SGS Wireless imported from 3GU
R5‑187370 Addition of TC6.3B.3.3 Tx ON/OFF time mask for inter-band EN-DC within FR1 SGS Wireless imported from 3GU
R5‑187371 Addition of TC6.3B.2.1 Transmit OFF Power for intra-band contiguous EN-DC SGS Wireless imported from 3GU
R5‑187372 Addition of TC6.3B.2.3 Transmit OFF Power for inter-band EN-DC within FR1 SGS Wireless imported from 3GU
R5‑187373 Addition of TC6.3B.2.2 Transmit OFF Power for intra-band non-contiguous EN-DC SGS Wireless imported from 3GU
R5‑187374 Correction to Contact header in MT INVITE ROHDE & SCHWARZ, Qualcomm Incorporated imported from 3GU
R5‑187375 Discussion on LS on FGI bit 103 and 104 Huawei, HiSilicon, CMCC, CATT imported from 3GU
R5‑187376 Update of 6.2.1 MOP Huawei, HiSilicon imported from 3GU
R5‑187377 Update of 6.2.4 Configured Output Power Huawei, HiSilicon imported from 3GU
R5‑187378 Update of 6.3.1 Minimum Output Power Huawei, HiSilicon imported from 3GU
R5‑187379 Update of 6.3.3.2 General ON/OFF time mask Huawei, HiSilicon imported from 3GU
R5‑187380 Addition of 6.2D.1 MOP for MIMO Huawei, HiSilicon imported from 3GU
R5‑187381 Addition of 6.2D.2 MPR for MIMO Huawei, HiSilicon imported from 3GU
R5‑187382 Addition of 6.2D.4 Configured Output Power for MIMO Huawei, HiSilicon imported from 3GU
R5‑187383 Addition of 6.4D.1 Frequency error for MIMO Huawei, HiSilicon imported from 3GU
R5‑187384 Addition of 6.4D.2.1 EVM for MIMO Huawei, HiSilicon imported from 3GU
R5‑187385 Addition of 6.4D.2.2 Carrier Leakage for MIMO Huawei, HiSilicon imported from 3GU
R5‑187386 Addition of 6.4D.2.3 In-band emissions for MIMO Huawei, HiSilicon imported from 3GU
R5‑187387 Addition of 6.4D.2.4 EVM equalizer spectrum flatness for MIMO Huawei, HiSilicon imported from 3GU
R5‑187388 Adding test frequencies for EN-DC DC_(n)71AA and DC_(n)41AA Huawei, HiSilicon imported from 3GU
R5‑187389 Removing editor’s note in FDD 5DL CA test cases Huawei, HiSilicon, Bureau Veritas, SGS imported from 3GU
R5‑187390 Update CSI related information elements NTT DOCOMO INC. imported from 3GU
R5‑187391 On RRM test frequency selection for FR1 and FR2 ROHDE & SCHWARZ imported from 3GU
R5‑187392 Applicability for NR NSA Option 3 protocol tests ROHDE & SCHWARZ imported from 3GU
R5‑187393 Addition of Cat. M2 Support to RRM CE tests - Chapter 8 ROHDE & SCHWARZ imported from 3GU
R5‑187394 Addition of Cat. M2 Support to RRM CE tests - Chapter 9 ROHDE & SCHWARZ imported from 3GU
R5‑187395 Update of test case 6.2.3 UE A-MPR, general Ericsson-LG Co., LTD imported from 3GU
R5‑187396 Update of TR 38.905 with SA FR1 A-MPR test point analyses, NS_04 Ericsson-LG Co., LTD imported from 3GU
R5‑187397 Update of test case 6.2.3 UE A-MPR, NS_04 Ericsson-LG Co., LTD imported from 3GU
R5‑187398 Update of TR 38.905 with SA FR1 Additional spectrum emission mask NS_04 test point analyses Ericsson-LG Co., LTD imported from 3GU
R5‑187399 Update of test case test case 6.5.2.3 Additional spectrum emission mask, NS_04 Ericsson-LG Co., LTD imported from 3GU
R5‑187400 Update of TR 38.905 with EN-DC A-MPR test point analyses, NS_04 Ericsson-LG Co., LTD imported from 3GU
R5‑187401 Update of test case 6.2B.3.1 UE A-MPR for Intra-band contiguous EN-DC for NS_04 Ericsson-LG Co., LTD imported from 3GU
R5‑187402 Update of TR 38.905 with EN-DC A-MPR test point analyses, NS_04 non-contigous Ericsson-LG Co., LTD imported from 3GU
R5‑187403 New RRM 5G Test Cases 4.6.2.1 – 4.6.2.8 Ericsson imported from 3GU
R5‑187404 New RRM 5G Test Cases 5.6.2.1 – 5.6.2.4 Ericsson imported from 3GU
R5‑187405 New RRM 5G Test Cases 6.6.2.1 – 6.6.2.8 Ericsson imported from 3GU
R5‑187406 New RRM 5G Test Cases 7.6.2.1 – 7.6.2.4 Ericsson imported from 3GU
R5‑187407 Update of test case 6.2B.3.2 UE A-MPR for Intra-band non-contigous EN-DC for NS_04 Ericsson-LG Co., LTD imported from 3GU
R5‑187408 Update of test case 6.5B.2.1.2 Additional spectrum emission mask for intra-band contigous EN-DC for NS_04 Ericsson-LG Co., LTD imported from 3GU
R5‑187409 Update of test case 6.2B.3.1 UE A-MPR for Intra-band contiguous EN-DC for NS_04 Ericsson-LG Co., LTD imported from 3GU
R5‑187410 Update of 5GS NR RRC test case 8.2.2.6.1 ROHDE & SCHWARZ imported from 3GU
R5‑187411 Addition of 5GS NR MAC test case 7.1.1.3.9 ROHDE & SCHWARZ imported from 3GU
R5‑187412 Addition of 5GS related new EFs to Test UICC definition ROHDE & SCHWARZ imported from 3GU
R5‑187413 Uplink RNTI to valid value in TS 38.508-1 Keysight Technologies UK Ltd imported from 3GU
R5‑187414 Addition of 5GS NR RRC test case 8.1.1.3.2 ROHDE & SCHWARZ imported from 3GU
R5‑187415 Update maxPayloadMinus1 in PUCCH config in TS 38.508-1 Keysight Technologies UK Ltd imported from 3GU
R5‑187416 Addition of PICS Mnemonic for ECT ROHDE & SCHWARZ, Qualcomm Incorporated, Intel imported from 3GU
R5‑187417 Addition of ReportConfigInterRAT for NR Intertek imported from 3GU
R5‑187418 Addition of 2TX_UL_MIMO condition Huawei, Hisilicon imported from 3GU
R5‑187419 Addition of SUL condition Huawei, Hisilicon imported from 3GU
R5‑187420 Addition of connection diagram for 2 TX UL MIMO Huawei, Hisilicon imported from 3GU
R5‑187421 Introduction of TC 6.5D.1 Occupied bandwidth for UL MIMO Huawei, Hisilicon imported from 3GU
R5‑187422 Introduction of TC 6.5D.2.2 Spectrum Emission Mask for UL MIMO Huawei, Hisilicon imported from 3GU
R5‑187423 Introduction of TC 6.5D.2.3 Additional Spectrum Emission Mask for UL MIMO Huawei, Hisilicon imported from 3GU
R5‑187424 Introduction of TC 6.5D.2.4.1 NR ACLR for UL MIMO Huawei, Hisilicon imported from 3GU
R5‑187425 Introduction of TC 6.5D.2.4.2 UTRA ACLR for UL MIMO Huawei, Hisilicon imported from 3GU
R5‑187426 Introduction of TC 6.5D.3.2 General spurious emissions for UL MIMO Huawei, Hisilicon imported from 3GU
R5‑187427 Introduction of TC 6.5D.3.3 Spurious Emission for UE co-existence for UL MIMO Huawei, Hisilicon imported from 3GU
R5‑187428 Introduction of TC 6.5D.3.4 Additional Spurious Emission for UL MIMO Huawei, Hisilicon imported from 3GU
R5‑187429 Introduction of TC 6.5D.4 Transmit intermodulation for UL MIMO Huawei, Hisilicon imported from 3GU
R5‑187430 Introduction of TC 7.3D Reference sensitivity for UL-MIMO Huawei, Hisilicon imported from 3GU
R5‑187431 Introduction of TC 7.4D Maximum input level for UL-MIMO Huawei, Hisilicon imported from 3GU
R5‑187432 Updation of 6.2C.1 Configured transmitted power for SUL Huawei, Hisilicon imported from 3GU
R5‑187433 Introduction of TC 6.5C.1 Occupied bandwidth for SUL Huawei, Hisilicon imported from 3GU
R5‑187434 Introduction of TC 6.5C.2.2 Spectrum Emission Mask for SUL Huawei, Hisilicon imported from 3GU
R5‑187435 Introduction of TC 6.5C.2.3 Additional Spectrum Emission Mask for SUL Huawei, Hisilicon imported from 3GU
R5‑187436 Introduction of TC 6.5C.2.4.1 NR ACLR for SUL Huawei, Hisilicon imported from 3GU
R5‑187437 Introduction of TC 6.5C.2.4.2 UTRA ACLR for SUL Huawei, Hisilicon imported from 3GU
R5‑187438 Introduction of TC 6.5C.3.2 General spurious emissions for SUL Huawei, Hisilicon imported from 3GU
R5‑187439 Introduction of TC 6.5C.3.3 Spurious Emission for UE co-existence for SUL Huawei, Hisilicon imported from 3GU
R5‑187440 Introduction of TC 6.5C.3.4 Additional Spurious Emission for SUL Huawei, Hisilicon imported from 3GU
R5‑187441 Introduction of TC 6.5C.4 Transmit intermodulation for SUL Huawei, Hisilicon imported from 3GU
R5‑187442 Updation of Uplink channel for SUL in Annex A Huawei, Hisilicon imported from 3GU
R5‑187443 Update TC 7.4B.3 Huawei, Hisilicon imported from 3GU
R5‑187444 Introduction of RRM TC 4.2.25 Bureau Veritas imported from 3GU
R5‑187445 Introduction of RRM TC 4.2.26 Bureau Veritas imported from 3GU
R5‑187446 Introduction of RRM TC 4.2.27 Bureau Veritas imported from 3GU
R5‑187447 Addition of Rel-13 CA configurations Ericsson imported from 3GU
R5‑187448 Addition of Rel-13 CA configurations Ericsson imported from 3GU
R5‑187449 Addition of Rel-13 CA configurations Ericsson imported from 3GU
R5‑187450 Inter-band con-current V2X configurations- Add 5A_47A Spurious Emission Test points analysis Huawei, HiSilicon imported from 3GU
R5‑187451 Inter-band con-current V2X configurations- Add 8A_47A Spurious Emission Test points analysis Huawei, HiSilicon imported from 3GU
R5‑187452 Inter-band con-current V2X configurations- Add 71A_47A Spurious Emission Test points analysis Huawei, HiSilicon imported from 3GU
R5‑187453 Addition of default QoS configurations Ericsson imported from 3GU
R5‑187454 On Quality of Quiet Zone Evaluation for Spurious Emissions Test Cases Keysight Technologies UK Ltd imported from 3GU
R5‑187455 Updating test case 6.3.4.2 Absolute Power Tolerance Intel Corporation (UK) Ltd imported from 3GU
R5‑187456 Updating test case 6.3.4.4 Aggregate Power Tolerance Intel Corporation (UK) Ltd imported from 3GU
R5‑187457 Adding TT to Aggregate Power Tolerance TC Intel Corporation (UK) Ltd imported from 3GU
R5‑187458 MCPTT: Updates to common type definitions MCC TF160 imported from 3GU
R5‑187459 Discussion on MU and TT for SA FR1 UL MIMO test cases Huawei, Hisilicon imported from 3GU
R5‑187460 Discussion on effects on MOP test imposed by power sharing mechanism Huawei, Hisilicon imported from 3GU
R5‑187461 Editorial Changes for TS 37.571-1 PCTEST Engineering Lab imported from 3GU
R5‑187462 On RRM FR2 open points ROHDE & SCHWARZ imported from 3GU
R5‑187463 Applicability for RRM NR tests ROHDE & SCHWARZ imported from 3GU
R5‑187464 New ICS for RRM NR tests ROHDE & SCHWARZ imported from 3GU
R5‑187465 Editorial Changes for TS 37.571-3 PCTEST Engineering Lab imported from 3GU
R5‑187466 Clarification to RRM TCs with “No requirement applies” Intel Corporation (UK) Ltd imported from 3GU
R5‑187467 New WID: Conformance test for Shortened TTI and processing time for LTE huawei, hisilicon imported from 3GU
R5‑187468 Editorial Changes for TS 37.571-5 PCTEST Engineering Lab imported from 3GU
R5‑187469 Discussion on LTE/NR power sharing in EN-DC for none anchor agnostic approach Ericsson imported from 3GU
R5‑187470 Correction of TC 8.16.83, 8.16.84, 8.16.85 and 8.16.86 Intel Corporation (UK) Ltd imported from 3GU
R5‑187471 Update IE CellGroupConfig Ericsson imported from 3GU
R5‑187472 RRM Generic 3DL CA tests – Annex F Intel Corporation (UK) Ltd imported from 3GU
R5‑187473 MU for UL 256QAM EVM test cases updated Ericsson imported from 3GU
R5‑187474 5GS S-NSSAI Ericsson imported from 3GU
R5‑187475 Update of test applicability condition for TC8.2.1.4.2_A.4 SGS Wireless imported from 3GU
R5‑187476 Introduction of FD-MIMO test case: FDD PMI Reporting with 12Tx Class A codebook – PUSCH 3-1 (Single PMI) for FD-MIMO Ericsson imported from 3GU
R5‑187477 Introduction of FD-MIMO test cases in Annexes Ericsson imported from 3GU
R5‑187478 Introduction of FD-MIMO test cases in 36.521-2 Ericsson imported from 3GU
R5‑187479 Testing of fallback CA configurations in Rx CA test cases other than REFSENS Ericsson imported from 3GU
R5‑187480 Discussion on improved measurement uncertainty for ON/OFF time mask test case Ericsson imported from 3GU
R5‑187481 Updates to maximum output power test cases Ericsson imported from 3GU
R5‑187482 Discussion on system critical requirements Ericsson imported from 3GU
R5‑187483 Test Point analysis for FR2 Maximum Output Power Ericsson imported from 3GU
R5‑187484 WP UE Conformance Test Aspects – Rel-14 LTE DL CA 4 Rx antenna ports Ericsson imported from 3GU
R5‑187485 SR UE Conformance Test Aspects – Rel-14 LTE DL CA 4 Rx antenna ports Ericsson imported from 3GU
R5‑187486 WP UE Conformance Test Aspects – Rel13 Full Dimension MIMO for LTE Ericsson imported from 3GU
R5‑187487 SR UE Conformance Test Aspects – Rel13 Full Dimension MIMO for LTE Ericsson imported from 3GU
R5‑187488 Updating test case 6.6.2.2 Additional spectrum emission mask and test case 6.6.3.3 Additional spurious emission Intel Corporation (UK) Ltd imported from 3GU
R5‑187489 TP analysis for FR1 test case 6.3.4.3, relative power tolerance Ericsson France imported from 3GU
R5‑187490 Update of 5GS NR RRC test case 8.2.3.6.1 ROHDE & SCHWARZ imported from 3GU
R5‑187491 Update of 5GS NR RRC test case 8.2.3.8.1 ROHDE & SCHWARZ imported from 3GU
R5‑187492 Correction to test case 8.2.2.1.1 MediaTek Inc., TDIA, CATT imported from 3GU
R5‑187493 Updating test case 6.2.4A.2 Additional Maximum Power Reduction (A-MPR) for CA (inter-band DL CA and UL CA) Intel Corporation (UK) Ltd imported from 3GU
R5‑187494 Update of test case 6.3.4.3, Power Control Relative power tolerance in 38.521-1 Ericsson imported from 3GU
R5‑187495 Correction to Reference Sensitivity Level "Tested Bands / CA-Configurations Selection" Intel Corporation (UK) Ltd imported from 3GU
R5‑187496 WP – UE Conformance Test Aspects – Interference Mitigation for Downlink Control Channels of LTE Intel Corporation (UK) Ltd imported from 3GU
R5‑187497 Correction to test case 8.2.2.3.1 MediaTek Inc., TDIA, CATT imported from 3GU
R5‑187498 SR- UE Conformance Test Aspects – Interference Mitigation for Downlink Control Channels of LTE Intel Corporation (UK) Ltd imported from 3GU
R5‑187499 Adding applicability of test cases 8.2.2.1.1 and 8.2.2.3.1 MediaTek Inc. imported from 3GU
R5‑187500 WP – UE Conformance Test Aspects - Wireless Local Area Network (WLAN) – 3GPP Radio Level Integration and Interworking Intel Corporation (UK) Ltd imported from 3GU
R5‑187501 SR- UE Conformance Test Aspects - Wireless Local Area Network (WLAN) – 3GPP Radio Level Integration and Interworking Enhancements Intel Corporation (UK) Ltd imported from 3GU
R5‑187502 SR UE Conformance Test Aspects - LTE bands with UE category M2 and/or NB2 in Rel-15 Ericsson imported from 3GU
R5‑187503 WP UE Conformance Test Aspects - LTE bands with UE category M2 and/or NB2 in Rel-15 Ericsson imported from 3GU
R5‑187504 SR UE Conformance Test Aspects - Uplink capacity enhancements for LTE (UL 256 QAM) Ericsson imported from 3GU
R5‑187505 Correction to test case 7.1.2.12 MediaTek Inc. imported from 3GU
R5‑187506 WP UE Conformance Test Aspects - Uplink capacity enhancements for LTE (UL 256 QAM) Ericsson imported from 3GU
R5‑187507 Corrections to Test frequencies for CA contiguous Intra-band operation Intel Corporation (UK) Ltd imported from 3GU
R5‑187508 Correction to Table 5.5.4.2-1 in 36.579-1 NIST imported from 3GU
R5‑187509 Update of 5GS NR RRC test case 8.2.1.1.1 ROHDE & SCHWARZ imported from 3GU
R5‑187510 Correction to NR MAC test case 7.1.1.3.2 Keysight Technologies UK Ltd imported from 3GU
R5‑187511 Addition of NR MAC test case 7.1.1.3.2b Keysight Technologies UK Ltd imported from 3GU
R5‑187512 Adding test case 6.1.1.7 MediaTek Inc. imported from 3GU
R5‑187513 Update IFF MU budget in TR 38.903 Keysight Technologies UK Ltd imported from 3GU
R5‑187514 Adding test case 6.1.1.8 MediaTek Inc. imported from 3GU
R5‑187515 On Quality of Quiet Zone Evaluation for OBW Test Case Keysight Technologies UK Ltd imported from 3GU
R5‑187516 On Quality of Quiet Zone Evaluation for SEM Test Case Keysight Technologies UK Ltd imported from 3GU
R5‑187517 On Quality of Quiet Zone Evaluation for ACLR Test Case Keysight Technologies UK Ltd imported from 3GU
R5‑187518 Beam peak measurement uncertainties Keysight Technologies UK Ltd imported from 3GU
R5‑187519 Adding new test case applicability MediaTek Inc. imported from 3GU
R5‑187520 Spherical coverage uncertainties Keysight Technologies UK Ltd imported from 3GU
R5‑187521 TRP uncertainties correction Keysight Technologies UK Ltd imported from 3GU
R5‑187522 On measurement grids Keysight Technologies UK Ltd imported from 3GU
R5‑187523 Correction to the conditions of test cases 8.3.7, 8.3.8 and 8.3.9 CGC Inc. imported from 3GU
R5‑187524 Correction to SIP NOTIFY message in 36.579-1 NIST imported from 3GU
R5‑187525 On conducted measurements uncertainties Keysight Technologies UK Ltd imported from 3GU
R5‑187526 Correction to SIP SUBSCRIBE message in 36.579-1 NIST imported from 3GU
R5‑187527 Update to test configuration table in test case 6.6.2.3A.2_1 for UL 12A-66A CGC Inc. imported from 3GU
R5‑187528 Update to RRC TC - PSCell addition, modification and release / Split DRB / EN-DC Qualcomm Incorporated imported from 3GU
R5‑187529 Update of Generic Test 5.3.2 in 36.579-1 NIST imported from 3GU
R5‑187530 Update to RRC TC - Measurement configuration control and reporting / Inter-RAT measurements / Event B1 / Measurement of NR cells / RSRQ based measurements / EN-DC Qualcomm Incorporated imported from 3GU
R5‑187531 New Test Case in section 10.2 of TS 36.523-1 NIST imported from 3GU
R5‑187532 Update of applicability for QCI 66 in 36.523-2 NIST imported from 3GU
R5‑187533 Correction to Table 6.6.2-1 in 36.508 NIST imported from 3GU
R5‑187534 Update to RRC TC - Measurement configuration control and reporting / Inter-RAT measurements / Periodic reporting / Measurement of NR cells / EN-DC Qualcomm Incorporated imported from 3GU
R5‑187535 Update the parameters to test cases 7.6.1A.1, 7.6.1A.2, 7.6.1A.3 and 7.6.1A.4 CGC Inc. imported from 3GU
R5‑187536 Update to RRC TC - Measurement configuration control and reporting / Event A1 / Measurement of NR PSCell / EN-DC Qualcomm Incorporated imported from 3GU
R5‑187537 Update test case to cover band 46 for test cases 7.6.1A.7 and 7.6.1A.8 CGC Inc. imported from 3GU
R5‑187538 Update to test cases 7.6.1A.5 CGC Inc. imported from 3GU
R5‑187539 Update to 5G-NR RRC measurement report TCs for FR1/FR2 cell power level Qualcomm Incorporated, Tech Mahindra imported from 3GU
R5‑187540 Update to 5G-NR RRC TCs for Multi-PDN support and specific message content IEs Qualcomm Incorporated imported from 3GU
R5‑187541 Update test case to cover band 46 for test cases 7.5A.7 and 7.5A.8 CGC Inc. imported from 3GU
R5‑187542 Correction to test case applicability for CAT-M1 UEs ROHDE & SCHWARZ, Qualcomm Incorporated imported from 3GU
R5‑187543 Update of 5G-NR test cases applicability Qualcomm Incorporated, Motorola Mobility, MCC TF160, Huawei, HiSilicon, Rohde & Schwarz imported from 3GU
R5‑187544 Correction to test case 8.2.4.27 for CAT-M1 UEs ROHDE & SCHWARZ, Qualcomm Incorporated imported from 3GU
R5‑187545 Correction to test case 7.1.7.1.9 and 7.1.7.1.10 ROHDE & SCHWARZ imported from 3GU
R5‑187546 Addition of 5GS NR MAC test case 7.1.1.8.1 ROHDE & SCHWARZ imported from 3GU
R5‑187547 Addition of new 5G-NR Idle Mode TC 6.1.1.6 - PLMN selection / Periodic reselection / MinimumPeriodicSearchTimer Qualcomm Incorporated imported from 3GU
R5‑187548 Addition of new 5G-NR Idle Mode TC 6.1.2.15 - Speed-dependent cell reselection Qualcomm Incorporated imported from 3GU
R5‑187549 Update of 5G-NR SA test cases applicability Qualcomm Incorporated imported from 3GU
R5‑187550 Correction to 8.3.1.x measurement TCs with Cat-M1 device. ANRITSU LTD imported from 3GU
R5‑187551 FR2_UE_RSRPB_Function_38.509 Qualcomm CDMA Technologies imported from 3GU
R5‑187552 Updates to TS 38.521-3 common sections 1-4 to align with core spec Qualcomm Japan Inc imported from 3GU
R5‑187553 Update eLAA test case 7.1.4.31 Qualcomm Incorporated imported from 3GU
R5‑187554 Removal of Multi-Layer eHRPD test cases 13.4.4.2 and 13.4.4.3 Qualcomm Incorporated imported from 3GU
R5‑187555 Removal of eHRPD test cases applicability Qualcomm Incorporated imported from 3GU
R5‑187556 Update of TC 5.1 in 36.579-2 NIST imported from 3GU
R5‑187557 Addition of low and high test channel bandwidth in 38.508 Qualcomm Japan Inc imported from 3GU
R5‑187558 Update of test case 6.2.1.4 applicability Qualcomm Incorporated imported from 3GU
R5‑187559 Updates to TS 38.521-3 Section 5 to align with core spec Qualcomm Japan Inc imported from 3GU
R5‑187560 Update to Table 5.3.5-1 in TS 38.521-1 Qualcomm Japan Inc imported from 3GU
R5‑187561 Update to Table 5.3.5-1 in TS 38.521-2 Qualcomm Japan Inc imported from 3GU
R5‑187562 Update to TC6.5B.3.2.1 - General Spurious Emissions for intra-band non-contiguous EN-DC Qualcomm Japan Inc imported from 3GU
R5‑187563 Update to 7.3B.2.2 - REFSENS for Intra-band Non-Contiguous EN-DC Qualcomm Japan Inc imported from 3GU
R5‑187564 Update to applicability condition of measurement reporting test cases for CAT-M1 UEs Qualcomm Incorporated imported from 3GU
R5‑187565 Updates to TS 38.521-3 Section 4 with LTE anchor details Qualcomm Japan Inc imported from 3GU
R5‑187566 Update note in section 4.1 to include CBW and SCS in RF test applicability Qualcomm Japan Inc imported from 3GU
R5‑187567 Corrections to IMS WLAN test case G.17.2 Qualcomm Incorporated imported from 3GU
R5‑187568 Discussion on FR2 Test Tolerance values Qualcomm Inc, Verizon Wireless imported from 3GU
R5‑187569 Discussion on TS38.521-2 Annex K restructuring Qualcomm Austria RFFE GmbH imported from 3GU
R5‑187570 new TC for PDSCH FR2 demod Qualcomm Finland RFFE Oy imported from 3GU
R5‑187571 Update to Annex K Qualcomm Austria RFFE GmbH imported from 3GU
R5‑187572 FR2 General Spurious Emission test case update Qualcomm Austria RFFE GmbH imported from 3GU
R5‑187573 section 3 of 38.521-4 spec Qualcomm Finland RFFE Oy imported from 3GU
R5‑187574 FR2 Reference Sensitivity test case update Qualcomm Austria RFFE GmbH imported from 3GU
R5‑187575 Updates to Annex B to add Permitted OTA Test Methods PCTEST Engineering Lab imported from 3GU
R5‑187576 Proposal on Test Tolerance in FR2 RF NTT DOCOMO, INC. imported from 3GU
R5‑187577 Review on test point analysis in NR RF tests NTT DOCOMO, INC. imported from 3GU
R5‑187578 TP for addition of NR RRM TC 4.4.1.1 EN-DC FR1 UE transmit timing accuracy Qualcomm Japan Inc imported from 3GU
R5‑187579 Quality of quiet zone ROHDE & SCHWARZ imported from 3GU
R5‑187580 Update of Global In-channel Tx Test Annex in 38.521-1 ROHDE & SCHWARZ imported from 3GU
R5‑187581 Update of Global In-channel Tx Test Annex in 38.521-2 ROHDE & SCHWARZ imported from 3GU
R5‑187582 Discussion on test point selection for EVM in FR2 ROHDE & SCHWARZ imported from 3GU
R5‑187583 Discussion on test point selection for Carrier Leakage in FR2 ROHDE & SCHWARZ imported from 3GU
R5‑187584 Update of test point selection for EVM equalizer spectrum flatness in FR1 ROHDE & SCHWARZ imported from 3GU
R5‑187585 Update of transmit signal quality test cases in 38.521-1 ROHDE & SCHWARZ imported from 3GU
R5‑187586 Update of transmit signal quality test cases in 38.521-2 ROHDE & SCHWARZ imported from 3GU
R5‑187587 Discussion on test point selection for In-band Emissions in FR2 ROHDE & SCHWARZ imported from 3GU
R5‑187588 Addition of In-band Emissions test case to TS 38.521-2 ROHDE & SCHWARZ imported from 3GU
R5‑187589 Discussion on test point selection for EVM equalizer spectrum flatness in FR2 ROHDE & SCHWARZ imported from 3GU
R5‑187590 Addition of EVM equalizer spectral flatness test cases 6.4.2.4 and 6.4.2.5 to TS 38.521-2 ROHDE & SCHWARZ imported from 3GU
R5‑187591 Discussion on Measurement Uncertainty in FR2 ROHDE & SCHWARZ imported from 3GU
R5‑187592 Addition of EVM equalizer spectral flatness test case 6.4.2.5 to TS 38.521-1 ROHDE & SCHWARZ imported from 3GU
R5‑187593 Discussion on test point selection for EVM equalizer spectrum flatness for Pi/2 BPSK in FR1 ROHDE & SCHWARZ imported from 3GU
R5‑187594 Update of Common Uplink Configuration for FR2 ROHDE & SCHWARZ imported from 3GU
R5‑187595 Update of MU budget and contributor description to TR 38.903 ROHDE & SCHWARZ imported from 3GU
R5‑187596 Discussion on Applicability and Test selection criteria for RRM CA test cases Qualcomm Japan Inc imported from 3GU
R5‑187597 Addition of Test Case selection criteria for RRM CA Qualcomm Japan Inc imported from 3GU
R5‑187598 Update on Applicability and Procedure for generic duplex mode RRM test case 8.16.86 Qualcomm Japan Inc imported from 3GU
R5‑187599 Udpates to sections 1-4 in TS 38.521-3 to align with core spec Qualcomm Japan Inc imported from 3GU
R5‑187600 section 4 of 38.521-4 spec Qualcomm Finland RFFE Oy imported from 3GU
R5‑187601 Discussion summarizing several guidelines for TC definitions in TS38.521-3 Qualcomm Japan Inc imported from 3GU
R5‑187602 pCR-FDD-PDSCH-FR1-Test 5.2.2.1 Qualcomm CDMA Technologies imported from 3GU
R5‑187603 discussion on demod spec structure Qualcomm Finland RFFE Oy imported from 3GU
R5‑187604 Updates to Clause 5 in TS 38.521-3 Qualcomm Japan Inc imported from 3GU
R5‑187605 Update of FR2 MU values Anritsu imported from 3GU
R5‑187606 new TC for PDSCH FR1 FDD demod Qualcomm Finland RFFE Oy imported from 3GU
R5‑187607 Updates to clause 7.3B.3.4 in TS 38.521-3 Qualcomm Japan Inc imported from 3GU
R5‑187608 pCR for PDCCH Demod in FR1 5.3.2.2 Qualcomm CDMA Technologies imported from 3GU
R5‑187609 draft TS 38.521-4 v0.2.0 Qualcomm Finland RFFE Oy imported from 3GU
R5‑187610 Corrections to IEs part of PDSCH-ServingCellConfig, ServingCellConfig and ServingCellConfigCommon Qualcomm Korea imported from 3GU
R5‑187611 Correcton to MAC TBS test cases Motorola Mobility, MCC TF160 imported from 3GU
R5‑187612 Addition of the message content of PDCP-config for UDC CATT imported from 3GU
R5‑187613 LTE Anchor Link configuration for FR2 Anritsu imported from 3GU
R5‑187614 Updates to EN-DC test case 6.2B.2.2, UE Maximum Output Power reduction for Intra-Band Non-Contiguous EN-DC Ericsson imported from 3GU
R5‑187615 Introduction of TC 6.5D.3.1 General spurious emissions for UL MIMO Huawei, Hisilicon imported from 3GU
R5‑187616 Introduction of TC 6.5D.3.2 Spurious Emission for UE co-existence for UL MIMO Huawei, Hisilicon imported from 3GU
R5‑187617 Introduction of TC 6.5D.3.3 Additional Spurious Emission for UL MIMO Huawei, Hisilicon imported from 3GU
R5‑187618 Updation of Uplink channel for SUL in Annex G Huawei, Hisilicon imported from 3GU
R5‑187619 Update of Section 6.3.3.1 General SGS wireless imported from 3GU
R5‑187620 LS on Study on evaluation for 2 RX exception in Rel-15 vehicle mounted UE for NR 5GAA Working Group meeting imported from 3GU
R5‑187621 RAN5#80 WG Minutes ETSI Secretariat imported from 3GU
R5‑187622 MCC TF160 Status Report MCC TF160 imported from 3GU
R5‑187623 Discussion on LS on FGI bit 103 and 104 Huawei, HiSilicon, CMCC, CATT imported from 3GU
R5‑187624 Proposed Word Template for RAN5 WI Work Plan BlackBerry UK Limited imported from 3GU
R5‑187625 Uncover the Veil of 5G S-Module CMCC, Sprint imported from 3GU
R5‑187626 Response LS to RAN4 on method to distinguish vehicle UE from handheld UE GCF CAG imported from 3GU
R5‑187627 New WID on UE Conformance Test Aspects - Bluetooth/WLAN measurement collection in LTE Minimization of Drive Tests (MDT) CMCC imported from 3GU
R5‑187628 New Work Item Proposal: UE Conformance Test Aspects – Enhanced LTE Support for Aerial Vehicles NTT DOCOMO INC. imported from 3GU
R5‑187629 New WID proposal: UE Conformance Test Aspects – Enhancing LTE CA Utilization Nokia, Nokia Shanghai Bell imported from 3GU
R5‑187630 New WID: Conformance test for Shortened TTI and processing time for LTE Huawei, Hisilicon imported from 3GU
R5‑187631 Calculation of test frequencies for FDD NR bands with asymmetric channel bandwidths Ericsson, Dish Network imported from 3GU
R5‑187632 UE Capability in EN-DC Qualcomm Europe Inc.(Spain) imported from 3GU
R5‑187633 Meeting schedule for 2019-20 WG Chairman imported from 3GU
R5‑187634 Correction to test case 7.1.2.12 MediaTek Inc. imported from 3GU
R5‑187635 Update eLAA test case 7.1.4.31 Qualcomm Incorporated imported from 3GU
R5‑187636 Correction to test cases 8.3.1.10, 8.3.1.11a, 8.3.1.15 and 8.3.1.16 for CAT-M1 UEs ROHDE & SCHWARZ, Qualcomm Incorporated imported from 3GU
R5‑187637 Correction to test case 8.3.1.9 for CAT-M1 UEs ROHDE & SCHWARZ, Qualcomm Incorporated imported from 3GU
R5‑187638 Update of test case 6.2.1.4 applicability Qualcomm Incorporated imported from 3GU
R5‑187639 Update NB-IoT Rel-14 DCI format N0/N1 with HARQ process number TDIA, MCC TF160, CATT imported from 3GU
R5‑187640 Clarification to inband testing for signalling test cases ROHDE & SCHWARZ, MCC TF160 imported from 3GU
R5‑187641 Addition of specific RDS message contents for NB-IoT test case 22.5.19 TDIA, CATT imported from 3GU
R5‑187642 Correction to NB-IoT test case 22.3.2.6 TDIA, CATT imported from 3GU
R5‑187643 New feMTC IEs Ericsson imported from 3GU
R5‑187644 New feMTC test case 21.2.2 Ericsson imported from 3GU
R5‑187645 Updates to feMTC test case applicabilities Ericsson imported from 3GU
R5‑187646 Addition of support for LWA/LWIP Test Cases in generic procedures Intel Corporation (UK) Ltd imported from 3GU
R5‑187647 Correction of LWA Test Case 8.2.5.8 Intel Corporation (UK) Ltd imported from 3GU
R5‑187648 Corrections to LWA TC 8.2.5.7 Intel Corporation (UK) Ltd imported from 3GU
R5‑187649 Correction of LWA Test Case 8.2.5.4 and LWIP 8.2.5.5 Intel Corporation (UK) Ltd imported from 3GU
R5‑187650 Corrections to LWA/LWIP Test Cases 8.2.5.1, 8.2.5.2, 8.2.5.6 Intel Corporation (UK) Ltd imported from 3GU
R5‑187652 Updates to test loop modes for NB-IoT enhancement MCC TF160, TDIA imported from 3GU
R5‑187653 Updates to test loop modes for NB-IoT enhancement MCC TF160, TDIA imported from 3GU
R5‑187654 Correction to eNB-IoT test case 22.3.2.7 MCC TF160, TDIA imported from 3GU
R5‑187655 Correction to V2X test case 24.1.13 MCC TF160, Sporton, CATT imported from 3GU
R5‑187656 Updates to V2X test case 24.3.3 MCC TF160 imported from 3GU
R5‑187657 Reply LS on TM9 FGI bits 103 and 104 TSG WG RAN5 imported from 3GU
R5‑187658 Handling of SoR TC Between CT6 and RAN5 Qualcomm Incorporated imported from 3GU
R5‑187659 Wordings for Uplink NAS messages ROHDE & SCHWARZ, MCC TF160 imported from 3GU
R5‑187660 Default cell configurations for NAS ROHDE & SCHWARZ, HiSilicon imported from 3GU
R5‑187661 Update IE SI-SchedulingInfo Ericsson, Huawei, HiSilicon imported from 3GU
R5‑187662 Addition of Combinations of system information blocks in 4.4.3.1.2 Huawei, HiSilicon imported from 3GU
R5‑187663 Update chapter 4.5.2 RRC_IDLE Ericsson imported from 3GU
R5‑187664 Correction to various Radio resource control IEs ANRITSU LTD imported from 3GU
R5‑187665 Correction to DCI formats 0_0 and 0_1 Ericsson, MCC TF160, Huawei, HiSilicon, Keysight Technologies imported from 3GU
R5‑187666 Introduction of SDL and SUL cells in simulated cells in clause 4.4.2 Ericsson imported from 3GU
R5‑187667 Correction to RRC_IDLE procedure Ericsson imported from 3GU
R5‑187668 Update CSI related information elements NTT DOCOMO INC. imported from 3GU
R5‑187669 Update ServingCellConfigCommon and TDD-UL-DL-Config NTT DOCOMO INC. imported from 3GU
R5‑187670 Update SRS-Config NTT DOCOMO INC. imported from 3GU
R5‑187671 Update some information elements for measurements NTT DOCOMO INC. imported from 3GU
R5‑187672 Update CellGroupConfig and related information elements NTT DOCOMO INC., Huawei, Anritsu Ltd. imported from 3GU
R5‑187673 CR of NR 508-1 clause 4.6.2_SIB2, SIB4 Huawei, Hisilicon, Ericssion, TF160 imported from 3GU
R5‑187674 CR of NR 508-1 Table 4.4.2-2_Default NR Cells parameters Huawei, Hisilicon, Ericsson, TF160 imported from 3GU
R5‑187675 Update RLC-Config NTT DOCOMO INC. imported from 3GU
R5‑187676 Specifying Test procedure to check that UE is camped on a new NR cell belonging to a new TA Samsung imported from 3GU
R5‑187677 Updates to Authentication 5GMM messages Ericsson imported from 3GU
R5‑187678 Updates to PDU session release 5GSM messages Ericsson imported from 3GU
R5‑187679 Updates to Security mode 5GMM messages Ericsson imported from 3GU
R5‑187680 Addition of new Information Elements in section 4.6.3 Ericsson imported from 3GU
R5‑187681 Updates to SIG OTA Calibration for FR2 Qualcomm Europe Inc.(Spain) imported from 3GU
R5‑187682 Addition of default QoS configurations Ericsson imported from 3GU
R5‑187683 Corrections to C.32 and C.32a ROHDE & SCHWARZ, Qualcomm Incorporated imported from 3GU
R5‑187684 Addition of Test Loop for SDAP testing Ericsson, Motorola Mobility, Samsung imported from 3GU
R5‑187685 LS on the testability of FR2 transmitter and reception tests TSG WG RAN5 imported from 3GU
R5‑187686 Adding test case 6.1.1.7 MediaTek Inc. imported from 3GU
R5‑187687 Split of 5G Steering of Roaming test coverage between RAN5 and CT6 TSG WG RAN5 imported from 3GU
R5‑187688 Addition of NR test case 7.1.1.1.3_SI Request Huawei, Hisilicon imported from 3GU
R5‑187689 Addition of NR test case 7.1.1.1.6_Random access Huawei, Hisilicon imported from 3GU
R5‑187690 Addition of NR test case 7.1.1.2.3_CCCH HARQ Huawei, Hisilicon imported from 3GU
R5‑187691 CR of NR test case 7.1.2.3.9_RLC Reassembling Huawei, Hisilicon imported from 3GU
R5‑187692 Correction to PDCP Test case 7.1.3.5.4 PDCP reordering / Maximum re-ordering delay below t-Reordering / t-Reordering timer operations Qualcomm Europe Inc.(Spain) imported from 3GU
R5‑187693 Correcton to SDAP test cases Motorola Mobility imported from 3GU
R5‑187694 Updating UE registration procedure to handle UE capability in 2 steps Qualcomm imported from 3GU
R5‑187695 Addition of 5GS SA RRC TC 8.1.1.1.1 Qualcomm Korea (TTA) imported from 3GU
R5‑187696 Addition of 5GS SA RRC TC 8.1.5.2.1 Qualcomm Korea (TTA) imported from 3GU
R5‑187697 Update RRC TC 8.2.1.1.1 - UE capability transfer / Success / EN-DC Qualcomm Korea (TTA) imported from 3GU
R5‑187698 Correction to NR RRC test case 8.2.3.5.1 ANRITSU LTD imported from 3GU
R5‑187699 Correction to NR RRC test case 8.2.3.9.1 and 8.2.3.10.1 ANRITSU LTD imported from 3GU
R5‑187700 Update RRC TC 8.2.3.1.1 - Measurement configuration control and reporting / Inter-RAT measurements / Event B1 / Measurement of NR cells / EN-DC Qualcomm Korea (TTA) imported from 3GU
R5‑187701 Update RRC TC 8.2.3.12.1 Intertek imported from 3GU
R5‑187702 Update of 5GS NR RRC test case 8.2.3.6.1 ROHDE & SCHWARZ imported from 3GU
R5‑187703 Update of 5GS NR RRC test case 8.2.3.8.1 ROHDE & SCHWARZ imported from 3GU
R5‑187704 Update to RRC TC - Measurement configuration control and reporting / Event A1 / Measurement of NR PSCell / EN-DC Qualcomm Incorporated imported from 3GU
R5‑187705 Update to 5G-NR RRC measurement report TCs for FR1/FR2 cell power level Qualcomm Incorporated, Tech Mahindra, Intertek, Anritsu, Rohde & Schwarz imported from 3GU
R5‑187706 Updates to EN-DC TC 8.2.5.3.1 MCC TF160, Qualcomm imported from 3GU
R5‑187707 Corrections to NAS test case 9.1.5.1.14 ROHDE & SCHWARZ imported from 3GU
R5‑187708 New NAS test case 9.1.3.1 ROHDE & SCHWARZ imported from 3GU
R5‑187709 Corrections to clause 5.5.9 of 36.579-1 NIST, Samsung imported from 3GU
R5‑187710 Corrections to clause 5.5.7.1 of 36.579-1 NIST, Samsung imported from 3GU
R5‑187711 Update for Resource-lists in 36.579-1 NIST, Samsung imported from 3GU
R5‑187712 Correction to Table 5.5.1-1 in 36.579-1 NIST, Samsung imported from 3GU
R5‑187713 Correction to Table 5.5.4.10.1-1 in 36.579-1 NIST, Samsung imported from 3GU
R5‑187714 Correction to Table 5.5.4.2-1 in 36.579-1 NIST, Samsung imported from 3GU
R5‑187715 Correction to SIP NOTIFY message in 36.579-1 NIST, Samsung imported from 3GU
R5‑187716 Correction to SIP SUBSCRIBE message in 36.579-1 NIST, Samsung imported from 3GU
R5‑187717 Update of Generic Test 5.3.2 in 36.579-1 NIST, Samsung imported from 3GU
R5‑187718 Update of TC 5.1 in 36.579-2 NIST, Samsung imported from 3GU
R5‑187719 Correction to Table 6.6.2-1 in 36.508 NIST, Samsung imported from 3GU
R5‑187720 Uplink PTRS disable for RF testing Keysight Technologies UK Ltd imported from 3GU
R5‑187721 Handling of power on / power off cycles and UE Automation in RRM and SIG testing for FR2 ROHDE & SCHWARZ imported from 3GU
R5‑187722 Addition to E-UTRA test frequencies for intra-band contiguous configuration for band 41 Ericsson imported from 3GU
R5‑187723 Correction of test frequencies for NR band n257 Ericsson imported from 3GU
R5‑187724 New annex for NR test frequency calculations MCC TF160, Ericsson imported from 3GU
R5‑187725 Correction of test frequencies for NR band n71 Ericsson imported from 3GU
R5‑187726 Positioning NSA Protocol tests - LPP Procedures ROHDE & SCHWARZ imported from 3GU
R5‑187727 Applicability for NR NSA Option 3 protocol tests ROHDE & SCHWARZ imported from 3GU
R5‑187728 5GC testcase optimisation CATT imported from 3GU
R5‑187729 Addition of ReportConfigInterRAT for NR Intertek imported from 3GU
R5‑187730 Updating UE registration procedure to handle UE capability in 2 steps Qualcomm imported from 3GU
R5‑187731 Removal of Testcase 7.1.4.36 CATT imported from 3GU
R5‑187732 Removal of the test applicability for testcase 7.1.4.36 CATT imported from 3GU
R5‑187733 Correction on V2X testcase 24.3.2 CATT, TF160 imported from 3GU
R5‑187734 Correction to V2X test case 24.1.13 MCC TF160, Sporton, CATT imported from 3GU
R5‑187735 Addition of new LTE_UDC-UEConTest test case 7.3.10.1 CATT imported from 3GU
R5‑187736 Addition of new LTE_UDC-UEConTest test case 7.3.10.2 CATT imported from 3GU
R5‑187737 Addition of new LTE_UDC-UEConTest test case 7.3.10.3 CATT imported from 3GU
R5‑187738 Addition of new LTE_UDC-UEConTest test case 8.5.1.9 CATT imported from 3GU
R5‑187739 Addition of SRB4 configuration to RRC connection Huawei, HiSilicon imported from 3GU
R5‑187740 Addition of Condition QMC for LTE QMC test Huawei, HiSilicon imported from 3GU
R5‑187741 Introduction of RRC TC QoE Measurement Collection in 8.3.5.1 Huawei, HiSilicon imported from 3GU
R5‑187742 Introduction of RRC TC Qoemtsi Measurement Collection in 8.3.5.2 Huawei, HiSilicon imported from 3GU
R5‑187743 Addition of applicability statements for LTE QMC test cases China Unicom imported from 3GU
R5‑187744 Addition of NR test case 9.1.5.1.1_Registration Request Huawei, Hisilicon, CAICT, CATT, Samsung, TF160, R&S, Motorola, Ericsson, Qualcomm imported from 3GU
R5‑187745 Update SIB1 Ericsson, Huawei, HiSilicon imported from 3GU
R5‑187746 Revised WID on UE Conformance Test Aspects- Voice and Video Enhancement for LTE CATT imported from 3GU
R5‑187747 Correction to Signal levels for conducted testing ANRITSU LTD imported from 3GU
R5‑187748 Updates to E-UTRA RRC_CONNECTED generic procedure MCC TF160, Ericsson, Qualcomm imported from 3GU
R5‑187749 Correcton to Layer 2 Pre Test conditions Motorola Mobility imported from 3GU
R5‑187750 Add RRCResumeComplete Ericsson imported from 3GU
R5‑187751 Update chapter 4.5.3 RRC_INACTIVE Ericsson imported from 3GU
R5‑187752 Correction of test frequencies for signalling testing in clause 6 Ericsson imported from 3GU
R5‑187753 Specifying Test procedure to check that UE is in RRC_IDLE state on a certain NR cell Samsung imported from 3GU
R5‑187754 Update IE RLF-TimersAndConstants Ericsson imported from 3GU
R5‑187755 Add RRCSetup Ericsson imported from 3GU
R5‑187756 Update RRCReconfiguration Ericsson imported from 3GU
R5‑187757 Update IE RadioBearerConfig Ericsson imported from 3GU
R5‑187758 Updates to PDU session establishment 5GSM messages Ericsson imported from 3GU
R5‑187759 Updates to Registration 5GMM messages Ericsson, Rohde & Schwarz imported from 3GU
R5‑187760 Updates to Security protected 5GS NAS and 5GMM status messages Ericsson imported from 3GU
R5‑187761 Updates to Service Request 5GMM messages Ericsson imported from 3GU
R5‑187762 Addition and updates to Information Elements in section 4.6.4 Ericsson imported from 3GU
R5‑187763 Addition of 5GS related new EFs to Test UICC definition ROHDE & SCHWARZ imported from 3GU
R5‑187764 Update IE CellGroupConfig Ericsson imported from 3GU
R5‑187765 New Test Case in section 10.2 of TS 36.523-1 NIST, FirstNet imported from 3GU
R5‑187766 Update of applicability for QCI 66 in 36.523-2 NIST, FirstNet imported from 3GU
R5‑187767 LS concerning RAN5 Response to ITU-R Working Party 5D Reply Liaison Statement to 3GPP RAN4/RAN5 on definition of test methods for OTA unwanted emissions of IMT radio equipment TSG WG RAN5 imported from 3GU
R5‑187768 Update of Test case 8.5.4.1 with UE DL and UL Cat 22,23,24,25,26 capability check Intel Corporation (UK) Ltd imported from 3GU
R5‑187769 Correction to test case 8.2.4.7 for CAT-M1 UEs ROHDE & SCHWARZ, Qualcomm Incorporated imported from 3GU
R5‑187770 Correction to test case 8.2.4.8 for CAT-M1 UEs ROHDE & SCHWARZ, Qualcomm Incorporated imported from 3GU
R5‑187771 Correction to 8.3.1.x measurement TCs with Cat-M1 device. ANRITSU LTD imported from 3GU
R5‑187772 Correction to SRVCC test cases for IMS Reregistration over UTRAN Keysight Technologies UK Ltd imported from 3GU
R5‑187773 Correction to NB-IoT test case 22.4.22 ROHDE & SCHWARZ imported from 3GU
R5‑187774 Addition of DL and UL Category 22,23,24,25,26 to Table A.4.3.2-2 and A.4.3.2-3 Intel Corporation (UK) Ltd imported from 3GU
R5‑187775 Discussion paper on Session Timer coverage ROHDE & SCHWARZ, Intel imported from 3GU
R5‑187776 Removal of the test applicability for testcase 7.1.4.36 CATT imported from 3GU
R5‑187777 Addition of PICS Motorola Mobility, CMCC imported from 3GU
R5‑187778 Adding test case 6.1.1.8 MediaTek Inc. imported from 3GU
R5‑187779 Addition of NR test case 7.1.1.1.4_Beam Failure Huawei, Hisilicon imported from 3GU
R5‑187780 Addition of NR test case 7.1.1.1.5 SUL Huawei, Hisilicon imported from 3GU
R5‑187781 Correction to NR MAC test case 7.1.1.3.2 Keysight Technologies UK Ltd imported from 3GU
R5‑187782 Addition of 5GS NR MAC test case 7.1.1.8.1 ROHDE & SCHWARZ imported from 3GU
R5‑187783 Correcton to Layer 2 Pre Test conditions Motorola Mobility imported from 3GU
R5‑187784 Correction to the default Pre-Test Conditions for AM and UM RLC test cases Keysight Technologies UK Ltd imported from 3GU
R5‑187785 Correction to PDCP Ciphering test cases Motorola Mobility, MCC TF160 imported from 3GU
R5‑187786 Correcton to PDCP Integrity test cases Motorola Mobility and MCC TF160 imported from 3GU
R5‑187787 Addition of NR test case 8.1.1.2.3_T300 expiry Huawei, Hisilicon imported from 3GU
R5‑187788 Addition of NR test case 8.1.1.3.1_Redirection to NR Huawei, Hisilicon imported from 3GU
R5‑187789 Addition of 5GS SA RRC TC 8.1.1.2.5 Qualcomm Korea (TTA) imported from 3GU
R5‑187790 Addition of 5GS NR RRC test case 8.1.1.3.2 ROHDE & SCHWARZ imported from 3GU
R5‑187791 Update of 5GS NR RRC test case 8.2.1.1.1 ROHDE & SCHWARZ, Qualcomm imported from 3GU
R5‑187792 Addition of NR test case 8.2.3.11.1_gapFR1 Huawei, Hisilicon imported from 3GU
R5‑187793 Addition of NR test case 8.2.3.11.2_gapFR2 Huawei, Hisilicon imported from 3GU
R5‑187794 Addition of NR test case 8.1.5.3.1_PWS notification Huawei, Hisilicon imported from 3GU
R5‑187795 Update RRC SCG failure TC 8.2.5.1.1 Qualcomm Korea (TTA) imported from 3GU
R5‑187796 Update to 5G TC TA registration update Samsung imported from 3GU
R5‑187797 Addition of new 5GC TC 9.1.6.1.1 CATT, TDIA imported from 3GU
R5‑187798 Addition of 5GC test case 10.1.3.1 CATT, TDIA, CAICT imported from 3GU
R5‑187799 Adding applicability for 5G TC TA registration update Samsung imported from 3GU
R5‑187800 Response LS to RAN4 on method to distinguish vehicle UE from handheld UE TSG WG RAN5 imported from 3GU
R5‑187801 Uplink PTRS disable for RF testing Keysight Technologies UK Ltd imported from 3GU
R5‑187802 Updating power levels for LTE Anchor Link Anritsu imported from 3GU
R5‑187803 FR2 UE RSRPB Function 38.509 Qualcomm CDMA Technologies imported from 3GU
R5‑187804 Editorial_Cleaning up for description of test requirement in clause 6 NTT DOCOMO, INC. imported from 3GU
R5‑187805 Introduction of TC 7.7D Spurious response for UL-MIMO CMCC, Huawei imported from 3GU
R5‑187806 Test Point analysis for FR1 7.4 Maximum input level CAICT, Huawei imported from 3GU
R5‑187807 Introduction of receiver spurious emission tests for FR1 SA Anritsu imported from 3GU
R5‑187808 TP analysis for receiver spurious emission tests for FR1 SA Anritsu imported from 3GU
R5‑187809 TP analysis for wideband intermodulation tests for FR1 SA Anritsu imported from 3GU
R5‑187810 Introduction of wideband intermodulation tests for FR1 SA Anritsu imported from 3GU
R5‑187811 Introduction of TC 7.3D Reference sensitivity for UL-MIMO Huawei, Hisilicon imported from 3GU
R5‑187812 Update of operating bands and channel arrangement to TS 38.521-1 China Unicom imported from 3GU
R5‑187813 NR FR1 TT Way Forward update Telecom Italia, Orange, AT&T, CMCC imported from 3GU
R5‑187814 Discussion of MU for occupied BW for FR1 Anritsu imported from 3GU
R5‑187815 Discussion summarizing several guidelines for TC definitions in TS38.521-3 Qualcomm Japan Inc imported from 3GU
R5‑187816 Adding test case 6.2B.2.4, UE Maximum Output Power reduction for Inter-Band EN-DC including FR2 Ericsson imported from 3GU
R5‑187817 TP analysis for receiver spurious emission tests for FR1 inter-band EN-DC Anritsu imported from 3GU
R5‑187818 TP analysis for wideband intermodulation tests for FR1 inter-band EN-DC Anritsu imported from 3GU
R5‑187819 Update general parameter Connection without release in initial conditions in TS 38.521-3 Keysight Technologies UK Ltd imported from 3GU
R5‑187820 Updates to test case 6.5B.2.1.3, Adjacent channel leakage ratio for intra-band contiguous EN-DC Ericsson imported from 3GU
R5‑187821 Addition OBW intraband non contiguous EN-DC Keysight Technologies UK Ltd imported from 3GU
R5‑187822 Introduction of New test case 6.4B.2.2.1 Error Vector Magnitude for intra-band non-contiguous EN-DC KTL imported from 3GU
R5‑187823 Introduction of New test case 6.4B.2.2.2 Carrier Leakage for intra-band non-contiguous EN-DC KTL imported from 3GU
R5‑187824 pCR for new TC addition for FR1 FDD PDSCH Demod Qualcomm CDMA Technologies imported from 3GU
R5‑187825 Introduction of New test case 6.4B.2.3.1 Error Vector Magnitude for inter-band EN-DC within FR1 KTL imported from 3GU
R5‑187826 Introduction of New test case 6.4B.2.3.2 Carrier Leakage for inter-band EN-DC within FR1 KTL, MTCC imported from 3GU
R5‑187827 Introduction of New test case 6.4B.2.3.3 In-band Emissions for inter-band EN-DC within FR1 KTL, MTCC imported from 3GU
R5‑187828 Introduction of Error Vector Magnitude for intra-band contiguous EN-DC LG Electronics imported from 3GU
R5‑187829 Introduction of Carrier Leakage for intra-band contiguous EN-DC LG Electronics imported from 3GU
R5‑187830 pCR for new TC addition for FR1 FDD PDCCH Demod Qualcomm CDMA Technologies imported from 3GU
R5‑187831 FR2 General Spurious Emission test case update Qualcomm Austria RFFE GmbH imported from 3GU
R5‑187832 FR2 Reference Sensitivity test case update Qualcomm Austria RFFE GmbH imported from 3GU
R5‑187833 Updates to clause 7.3B.3.4 in TS 38.521-3 Qualcomm Japan Inc imported from 3GU
R5‑187834 Udpates to sections 1-4 in TS 38.521-3 to align with core spec Qualcomm Japan Inc imported from 3GU
R5‑187835 Updates to Clause 5 in TS 38.521-3 Qualcomm Japan Inc imported from 3GU
R5‑187836 Test Point analysis for FR2 7.4 Maximum input level CAICT, Huawei imported from 3GU
R5‑187837 Updates to maximum output power test cases Ericsson imported from 3GU
R5‑187838 Update of transmit signal quality test cases in 38.521-2 ROHDE & SCHWARZ imported from 3GU
R5‑187839 Addition of In-band Emissions test case to TS 38.521-2 ROHDE & SCHWARZ imported from 3GU
R5‑187840 Addition of EVM equalizer spectral flatness test cases 6.4.2.4 and 6.4.2.5 to TS 38.521-2 ROHDE & SCHWARZ imported from 3GU
R5‑187841 Update of Common Uplink Configuration for FR2 ROHDE & SCHWARZ imported from 3GU
R5‑187842 General sections updated to 38.521-2 CAICT, Huawei imported from 3GU
R5‑187843 Update of Global In-channel Tx Test Annex in 38.521-2 ROHDE & SCHWARZ imported from 3GU
R5‑187844 pCR for PDCCH Demod in FR1 5.3.2.2 Qualcomm CDMA Technologies imported from 3GU
R5‑187845 section 4 of 38.521-4 spec Qualcomm Finland RFFE Oy imported from 3GU
R5‑187846 pCR-FDD-PDSCH-FR1-Test 5.2.2.1 Qualcomm CDMA Technologies imported from 3GU
R5‑187847 Resubmission of R5-186252 with modifications ROHDE & SCHWARZ imported from 3GU
R5‑187848 FR2 Spurious Emission measurement grids and offset values Qualcomm Inc, Anritsu. imported from 3GU
R5‑187849 Adding applicability for new 38.521-1 CA TCs Samsung imported from 3GU
R5‑187850 Completion of TC 9.1.69 and 9.1.70 ROHDE & SCHWARZ imported from 3GU
R5‑187851 Completion of TC 9.2.56 and 9.2.57 ROHDE & SCHWARZ imported from 3GU
R5‑187852 Discussion on Applicability and Test selection criteria for RRM CA test cases Qualcomm Japan Inc imported from 3GU
R5‑187853 Addition of Test Case selection criteria for RRM CA Qualcomm Japan Inc imported from 3GU
R5‑187854 Update on Applicability and Procedure for generic duplex mode RRM test case 8.16.86 Qualcomm Japan Inc imported from 3GU
R5‑187855 Chapter 9 RRM Generic CA tests - Annexes ROHDE & SCHWARZ imported from 3GU
R5‑187856 Correction to 3DL CA clause 8 generic duplex mode tests Anritsu imported from 3GU
R5‑187857 Introduction of 4 DL CA Activation and Deactivation of Known SCell in Non-DRX with generic duplex modes LG Electronics imported from 3GU
R5‑187858 Introduction of 4 DL CA Activation and Deactivation of Unknown SCell in Non-DRX with generic duplex modes LG Electronics imported from 3GU
R5‑187859 Introduction of 5 DL CA Activation and Deactivation of Known SCell in Non-DRX with generic duplex modes LG Electronics imported from 3GU
R5‑187860 Introduction of 5 DL CA Activation and Deactivation of Unknown SCell in Non-DRX with generic duplex modes LG Electronics imported from 3GU
R5‑187861 Update of V2X RF Receiver Test Cases for Intra-band contiguous SGS Wireless imported from 3GU
R5‑187862 Editorial: 6.2.2EC, UE Maximum Output Power for UE category M2 Ericsson imported from 3GU
R5‑187863 Updated RRM clause 4 tests to cover Cat-M2 requirement Bureau Veritas imported from 3GU
R5‑187864 Testing of fallback CA configurations in Rx CA test cases other than REFSENS Ericsson, CETECOM imported from 3GU
R5‑187865 TP analyses for new Rel-15 CA configurations CETECOM GmbH imported from 3GU
R5‑187866 Update TC 6.6.3G.2_1 Huawei, HiSilicon imported from 3GU
R5‑187867 Inter-band con-current V2X configurations- Add 3A_47A Spurious Emission Test points analysis Huawei, HiSilicon imported from 3GU
R5‑187868 Inter-band con-current V2X configurations- Add 5A_47A Spurious Emission Test points analysis Huawei, HiSilicon imported from 3GU
R5‑187869 Add band group FDD B1 and B2 to RSRQ tests - Rel11 ROHDE & SCHWARZ imported from 3GU
R5‑187870 Add band group FDD B1 and B2 to RSRQ tests - Rel12 ROHDE & SCHWARZ imported from 3GU
R5‑187871 Update test case to cover band 46 for test cases 7.6.1A.7 and 7.6.1A.8 CGC Inc. imported from 3GU
R5‑187872 Update to test cases 7.6.1A.5 CGC Inc. imported from 3GU
R5‑187873 Introduction of tc 6.2.3EC, Maximum Power Reduction (MPR) for UE category M2 Ericsson imported from 3GU
R5‑187874 Introduction of tc 6.2.5EC Configured UE transmitted Power for UE category M2 Ericsson imported from 3GU
R5‑187875 Introduction of tc 6.3.2EC, Minimum Output Power for UE category M2 Ericsson imported from 3GU
R5‑187876 Introduction of tc 6.3.3EC, UE Transmit OFF power for UE category M2 Ericsson imported from 3GU
R5‑187877 Introduction of 6.3.4EC.1, General ON/OFF time mask for UE category M2 Ericsson imported from 3GU
R5‑187878 Introduction of 6.3.5EC.1, Power Control Absolute power tolerance for UE category M2 Ericsson imported from 3GU
R5‑187879 Introduction of 6.3.5EC.2, Power Control Relative power tolerance for UE category M2 Ericsson imported from 3GU
R5‑187880 Introduction of 6.3.5EC.3, Aggregate power control tolerance for UE category M2 Ericsson imported from 3GU
R5‑187881 Update Clause 1 Scope of TS 38.522 CMCC imported from 3GU
R5‑187882 Update Clause 3 of TS 38.522 CMCC imported from 3GU
R5‑187883 TP for Clause 4.1.1 of TS 38.522 CMCC imported from 3GU
R5‑187884 TP for Clause 4.1.2 of TS 38.522 CMCC imported from 3GU
R5‑187885 TP for Clause 4.1.3 of TS 38.522 CMCC imported from 3GU
R5‑187886 FR2 Spurious Emission test case updates Qualcomm Finland RFFE Oy imported from 3GU
R5‑187887 Addition of test frequencies for SUL band n81 Huawei, HiSilicon imported from 3GU
R5‑187888 Update of 6.2.4 Configured Output Power Huawei, HiSilicon imported from 3GU
R5‑187889 Addition of SUL condition Huawei, Hisilicon imported from 3GU
R5‑187890 Introduction of TC 6.5C.4 Transmit intermodulation for SUL Huawei, Hisilicon imported from 3GU
R5‑187891 FR2 UE RSRPB Function 38.509 Qualcomm CDMA Technologies imported from 3GU
R5‑187892 Removing the Editor's notes of SA messages and procedures for all FR1 test cases Huawei, HiSilicon imported from 3GU
R5‑187893 Update of FR1 6.2.2 MPR CAICT, Huawei, CMCC imported from 3GU
R5‑187894 Addition of Time alignment error for UL-MIMO to TS38.521-1 China Unicom imported from 3GU
R5‑187895 Introduction of New FR1 test case 6.3.3.6 SRS time mask MTCC, KTL imported from 3GU
R5‑187896 5G_FR1 Text update for 6.5.3.3 Additonal Spurious emission Qualcomm Incorporated imported from 3GU
R5‑187897 Update of test case 6.3.4.3, Power Control Relative power tolerance in 38.521-1 Ericsson imported from 3GU
R5‑187898 Addition of EVM equalizer spectral flatness test case 6.4.2.5 to TS 38.521-1 ROHDE & SCHWARZ imported from 3GU
R5‑187899 Introduction of test case for Frequency error for CA Samsung,CMCC imported from 3GU
R5‑187900 Introduction of test cases for Transmit modulation quality for CA Samsung,CMCC imported from 3GU
R5‑187901 Introduction of test case for Spectrum emission mask for Inter-band CA Samsung,CMCC imported from 3GU
R5‑187902 Introduction of test case for NR ACLR for Inter-band CA Samsung,CMCC imported from 3GU
R5‑187903 Introduction of test case for UTRA ACLR for Inter-band CA Samsung,CMCC imported from 3GU
R5‑187904 Introduction of test case for General spurious emissions for Inter-band CA Samsung,CMCC imported from 3GU
R5‑187905 Introduction of test case for Spurious emission for UE co-existence for CA Samsung,CMCC imported from 3GU
R5‑187906 Introduction of test case for Transmit intermodulation for Inter-band CA Samsung,CMCC imported from 3GU
R5‑187907 Test Point analysis for FR1 MPR test case CAICT, Huawei imported from 3GU
R5‑187908 Updates of MU in TS 38.521-1 Annex F during RAN5#81 NTT DOCOMO, INC. imported from 3GU
R5‑187909 Updates of TT in TS 38.521-1 Annex F during RAN5#81 NTT DOCOMO, INC. imported from 3GU
R5‑187910 Clarification of test channel BW and SCS selection NTT DOCOMO, INC. imported from 3GU
R5‑187911 Addition of notes to clarify test point selection into general section of TS 38.521-1 NTT DOCOMO, INC. imported from 3GU
R5‑187912 Addition of notes to clarify test point selection into general section of TS 38.521-2 NTT DOCOMO, INC. imported from 3GU
R5‑187913 Addition of notes to clarify test point selection into general section of TS 38.521-3 NTT DOCOMO, INC. imported from 3GU
R5‑187914 Update of Global In-channel Tx Test Annex in 38.521-1 ROHDE & SCHWARZ imported from 3GU
R5‑187915 Introduction of FR1 7.4 Maximum input level CAICT, Huawei imported from 3GU
R5‑187916 Editorial correction to 6.5.1A.2 Frequency error for CA Anritsu, Dekra imported from 3GU
R5‑187917 Correction to 6.2.4A.2_1 and 6.6.2.2A.2_1 Anritsu, CETECOM, DEKRA imported from 3GU
R5‑187918 Correction to the test configuration table of 7.3A.6 Anritsu imported from 3GU
R5‑187919 Correction to frequency of CA_4A-7A for MSD with inter-band 2UL Anritsu imported from 3GU
R5‑187920 Discussion on LTE/NR power sharing in EN-DC for none anchor agnostic approach Ericsson imported from 3GU
R5‑187921 On measurement grids Keysight Technologies UK Ltd imported from 3GU
R5‑187922 Removing FR2 test case 7.4 from TS 38.522 due to testability issue Huawei, HiSilicon, CAICT imported from 3GU
R5‑187923 Definition of additional cells for IncMon RRM Test Cases Ericsson imported from 3GU
R5‑187924 Message content for IncMon RRM Test Cases Ericsson imported from 3GU
R5‑187925 Applicability for IncMon RRM Test Cases Ericsson, CGC Inc. imported from 3GU
R5‑187926 Correction of RRM IncMon TC 4.2.10 Ericsson imported from 3GU
R5‑187927 Correction of RRM IncMon TC 4.2.11 Ericsson imported from 3GU
R5‑187928 Correction of RRM IncMon TC 4.3.1.5 Ericsson imported from 3GU
R5‑187929 Correction of RRM IncMon TC 4.3.2A Ericsson imported from 3GU
R5‑187930 Correction of RRM IncMon TC 4.3.3A Ericsson imported from 3GU
R5‑187931 Correction of RRM IncMon TC 4.3.4.4 Ericsson imported from 3GU
R5‑187932 Correction of RRM IncMon TC 8.4.8 Ericsson imported from 3GU
R5‑187933 Correction of RRM IncMon TC 8.4.9 Ericsson imported from 3GU
R5‑187934 Correction of RRM IncMon TC 8.5.8 Ericsson imported from 3GU
R5‑187935 Correction of RRM IncMon TC 8.6.3 Ericsson imported from 3GU
R5‑187936 Correction of RRM IncMon TC 8.7.5 Ericsson imported from 3GU
R5‑187937 Correction of RRM IncMon TC 8.7A.1 Ericsson imported from 3GU
R5‑187938 Cell Configuration for IncMon RRM Test Cases Ericsson imported from 3GU
R5‑187939 New rows in Annex F tables for IncMon RRM Test Cases Ericsson imported from 3GU
R5‑187940 Addition of new Test Configuration on TC 6.2.2A.2 DEKRA imported from 3GU
R5‑187941 Addition of new Test Configuration on TC 6.2.3A.2 DEKRA imported from 3GU
R5‑187942 Addition of new Test Configuration on TC 6.2.3A.2_1 DEKRA imported from 3GU
R5‑187943 Addition of new Test Configuration on TC 6.2.4A.2 DEKRA imported from 3GU
R5‑187944 Addition of new Test Configuration on TC 6.2.5A.3 DEKRA imported from 3GU
R5‑187945 Addition of new Test Configuration on TC 6.3.4A.1.2 DEKRA imported from 3GU
R5‑187946 Addition of new Test Configuration on TC 6.3.5A.1.2 DEKRA imported from 3GU
R5‑187947 Addition of new Test Configuration on TC 6.3.5A.3.2 DEKRA imported from 3GU
R5‑187948 Addition of new Test Configuration on TC 6.5.2A.1.2 DEKRA imported from 3GU
R5‑187949 Addition of new Test Configuration on TC 6.5.2A.1.2_1 DEKRA imported from 3GU
R5‑187950 Addition of new Test Configuration on TC 6.5.2A.2.2 DEKRA imported from 3GU
R5‑187951 Addition of new Test Configuration on TC 6.5.2A.3.2 DEKRA imported from 3GU
R5‑187952 Addition of new Test Configuration on TC 6.6.1A.2 DEKRA imported from 3GU
R5‑187953 Addition of new Test Configuration on TC 6.6.2.1A.2 DEKRA imported from 3GU
R5‑187954 Addition of new Test Configuration on TC 6.6.2.2A.2_1 DEKRA imported from 3GU
R5‑187955 Addition of new Test Configuration on TC 6.6.2.3A.2 DEKRA imported from 3GU
R5‑187956 Addition of new Test Configuration on TC 6.6.2.3A.2_1 DEKRA, CGC Inc. imported from 3GU
R5‑187957 Addition of new Test Configuration on TC 6.6.3.1A.2 DEKRA imported from 3GU
R5‑187958 Addition of new Test Configuration on TC 6.7A.2 DEKRA imported from 3GU
R5‑187960 CA_3A-41A-42C(1UL) - Updates of test points analysis KDDI Corporation imported from 3GU
R5‑187961 CA_3A-41C-42A(1UL) - Updates of test points analysis KDDI Corporation imported from 3GU
R5‑187962 CA_3A-41C-42C(1UL) - Updates of test points analysis KDDI Corporation imported from 3GU
R5‑187963 Update the general sections for Rel-14 NB-IOT (Editorial) CMCC, Huawei, HiSilicon imported from 3GU
R5‑187964 Update Rel-14 NB-IOT RRM test cases to support category NB2 CMCC, Huawei, HiSilicon imported from 3GU
R5‑187965 Aligning CA delta TiB in sub-clause 6.2.5.3 with TS 36.101 v15.4.0 Ericsson, Bureau Veritas, Anritsu imported from 3GU
R5‑187966 Aligning CA delta RiB in sub-clause 7.3.3 with TS 36.101 v15.4.0 Ericsson, Bureau Veritas, Anritsu imported from 3GU
R5‑187967 Correction in TC 7.3A.3 for CA configuration CA_2A-71A CETECOM GmbH imported from 3GU
R5‑187968 Correction in TC 7.3A.5 for CA configuration CA_2A-66A-71A CETECOM GmbH imported from 3GU
R5‑187969 Update for reference sensitivity TP analysis for CA_2A-66A-71A CA configuration CETECOM GmbH imported from 3GU
R5‑187970 Change of applicability in UL 64QAM MPR and A-MPR tests due to UL 256QAM support CETECOM GmbH imported from 3GU
R5‑187971 Change of applicability in UL 64QAM A-SEM and ACLR and Additional spurious tests due to UL 256QAM support CETECOM GmbH imported from 3GU
R5‑187972 Addition of new UL 256QAM test case - MPR for inter-band CETECOM GmbH imported from 3GU
R5‑187973 Addition of new UL 256QAM test case - Annex F CETECOM GmbH imported from 3GU
R5‑187974 Introduction of Power Class 1 for B31 and B72 Airbus DS SLC imported from 3GU
R5‑187975 Introduction of Power Class 1 for B31 and B72 Airbus DS SLC imported from 3GU
R5‑187976 Introduction of the support of ProSe for B72 Airbus DS SLC imported from 3GU
R5‑187977 Introduction of the support of ProSe for B72 Airbus DS SLC imported from 3GU
R5‑187978 Introduction of B68 in ProSe test frequencies table Airbus DS SLC imported from 3GU
R5‑187979 Correction to TC 7.7B Spurious response for UL-MIMO CMCC imported from 3GU
R5‑187980 Updating test case 6.2.4A.2 Additional Maximum Power Reduction (A-MPR) for CA (inter-band DL CA and UL CA) Intel Corporation (UK) Ltd imported from 3GU
R5‑187981 Addition of B72 for test cases with 5MHz channel bandwidth Airbus DS SLC imported from 3GU
R5‑187982 Addition of B72 for test cases with 5MHz channel bandwidth Airbus DS SLC imported from 3GU
R5‑187983 Editorial Changes for TS 37.571-1 PCTEST Engineering Lab imported from 3GU
R5‑187984 Updated RF clause 9.8 to cover Cat-M2 requirement Bureau Veritas imported from 3GU
R5‑187985 Updated RRM clause 5 tests to cover Cat-M2 requirement Bureau Veritas imported from 3GU
R5‑187986 Updated RRM clause 6 tests to cover Cat-M2 requirement Bureau Veritas imported from 3GU
R5‑187987 Updated RRM clause 7 tests to cover Cat-M2 requirement Bureau Veritas imported from 3GU
R5‑187988 Align CA information in clause 7.3A.0 with TS36.101 v15.4.0 Bureau Veritas imported from 3GU
R5‑187989 Added ICS item for missing Category DL and UL Bureau Veritas imported from 3GU
R5‑187990 Update of test case 9.6.1.1_A.4 TTA, Bureau Veritas imported from 3GU
R5‑187991 Alignment of 256QAM EVM Test Tolerance between LTE and NR Intel Deutschland GmbH imported from 3GU
R5‑187992 Updating test case 6.6.2.2 Additional spectrum emission mask and test case 6.6.3.3 Additional spurious emission Intel Corporation (UK) Ltd imported from 3GU
R5‑187993 Update NB-IOT Random Access test cases 6.2.16, 6.2.17 and 6.2.18 Huawei, HiSilicon imported from 3GU
R5‑187994 Update 8.16.78 to add TT information Huawei, HiSilicon imported from 3GU
R5‑187995 On RRM test case numbering ROHDE & SCHWARZ imported from 3GU
R5‑187996 TP on new RRM 5G Test Cases 6.7.1.1 and 6.7.1.2 ROHDE & SCHWARZ imported from 3GU
R5‑187997 New RRM 5G Test Cases 4.6.2.1 – 4.6.2.8 Ericsson imported from 3GU
R5‑187998 New RRM 5G Test Cases 5.6.2.1 – 5.6.2.4 Ericsson imported from 3GU
R5‑187999 New RRM 5G Test Cases 6.6.2.1 – 6.6.2.8 Ericsson imported from 3GU
R5‑188000 New RRM 5G Test Cases 7.6.2.1 – 7.6.2.4 Ericsson imported from 3GU
R5‑188001 TP for addition of NR RRM TC 4.4.1.1 EN-DC FR1 UE transmit timing accuracy Qualcomm Japan Inc imported from 3GU
R5‑188002 TP on new RRM 5G Test Cases 4.7.1.1 and 4.7.1.2 ROHDE & SCHWARZ imported from 3GU
R5‑188003 On RRM FR1 MU and TT analysis ROHDE & SCHWARZ imported from 3GU
R5‑188004 On RRM test frequency selection for FR1 and FR2 ROHDE & SCHWARZ imported from 3GU
R5‑188005 TP on Annexes for TS 38.533 ROHDE & SCHWARZ imported from 3GU
R5‑188006 new TC for PDSCH FR1 demod Qualcomm Finland RFFE Oy imported from 3GU
R5‑188007 discussion on demod spec structure Qualcomm Finland RFFE Oy imported from 3GU
R5‑188008 new TC for PDSCH FR2 demod Qualcomm Finland RFFE Oy imported from 3GU
R5‑188009 pCR for new TC addition for FR1 FDD PDSCH Demod Qualcomm CDMA Technologies imported from 3GU
R5‑188010 pCR for new TC addition for FR1 FDD PDCCH Demod Qualcomm CDMA Technologies imported from 3GU
R5‑188011 pCR for Addition of Test Case 4.4.3.1 EN-DC FR1 timing advance adjustment accuracy Qualcomm CDMA Technologies imported from 3GU
R5‑188012 Introduction of New test case 6.4B.2.2.3 In-band Emissions for intra-band non-contiguous EN-DC KTL imported from 3GU
R5‑188013 Addition OBW intra-band contiguous EN-DC Keysight Technologies UK Ltd imported from 3GU
R5‑188014 Addition SEM intra-band contiguous EN-DC Keysight Technologies UK Ltd imported from 3GU
R5‑188015 Additonal Spurious Emissions for Intra-band contiguous EN-DC Qualcomm Incorporated imported from 3GU
R5‑188016 Additonal Spurious Emissions for Intra-band non-contiguous EN-DC Qualcomm Incorporated imported from 3GU
R5‑188017 Additonal Spurious emission for inter-band EN-DC Qualcomm Incorporated imported from 3GU
R5‑188018 Spurious emission band UE co-existence for intra-band non-contiguous EN-DC Qualcomm Incorporated imported from 3GU
R5‑188019 Introduction of In-band Emissions for intra-band contiguous EN-DC LG Electronics imported from 3GU
R5‑188020 Addition of TC6.3B.3.1 Tx ON/OFF time mask for intra-band contiguous EN-DC SGS Wireless imported from 3GU
R5‑188021 Addition of TC6.3B.3.2 Tx ON/OFF time mask for intra-band non-contiguous EN-DC SGS Wireless imported from 3GU
R5‑188022 Addition of TC6.3B.3.3 Tx ON/OFF time mask for inter-band EN-DC within FR1 SGS Wireless imported from 3GU
R5‑188023 Update of test case 6.5B.2.1.2 Additional spectrum emission mask for intra-band contigous EN-DC for NS_04 Ericsson-LG Co., LTD imported from 3GU
R5‑188024 Update of test case 6.2B.3.1 UE A-MPR for Intra-band contiguous EN-DC for NS_04 Ericsson-LG Co., LTD imported from 3GU
R5‑188025 Update Clause 7.5B.3 in TS 38.521-3 CMCC imported from 3GU
R5‑188026 5G NR_EN_DC with FR1_Text update for Inter-Band RX sensitivity Qualcomm Inc imported from 3GU
R5‑188027 Update TC 7.4B.3 Huawei, Hisilicon imported from 3GU
R5‑188028 Updates of MU in TS 38.521-3 Annex F during RAN5#81 NTT DOCOMO, INC. imported from 3GU
R5‑188029 Updates of TT in TS 38.521-3 Annex F during RAN5#81 NTT DOCOMO, INC. imported from 3GU
R5‑188030 Necessity for functional testing in RAN5 NTT DOCOMO, INC. imported from 3GU
R5‑188031 Addition of 2TX_UL_MIMO condition Huawei, Hisilicon imported from 3GU
R5‑188032 Addition of 6.3D.4.1 Absolute Power tolerance for UL-MIMO China Telecommunications imported from 3GU
R5‑188033 Addition of 6.3D.4.2 Relative Power Tolerance for UL-MIMO China Telecommunications imported from 3GU
R5‑188034 Addition of 6.3D.4.3 Aggregate Power tolerance for UL-MIMO China Telecommunications imported from 3GU
R5‑188035 Update to FR1 test case 6.3.3.4 PRACH time mask KTL imported from 3GU
R5‑188036 Adding TT to Aggregate Power Tolerance TC Intel Corporation (UK) Ltd imported from 3GU
R5‑188037 Removing the Editor's notes of SA messages and procedures for all FR2 test cases Huawei, HiSilicon imported from 3GU
R5‑188038 FR2 downlink signal level(38.521-2) Anritsu imported from 3GU
R5‑188039 LTE Anchor Link configuration for FR2 Anritsu imported from 3GU
R5‑188040 Correction of RB allocation for 3DL_CA_1A-3A-41A Qualcomm Incorporated imported from 3GU
R5‑188041 Addition CA 2A2A29A and CA 2A2A29A30A 36.521-2 ECIT, CAICT, Tejet imported from 3GU
R5‑188042 Addition CA 2A29A66A 36.521-2 ECIT, CAICT, Tejet imported from 3GU
R5‑188043 Addition CA 2A30A66A66A 36.521-2 ECIT, CAICT, Tejet imported from 3GU
R5‑188044 Addition CA 7A66A and CA 2A7A66A 36.521-2 ECIT, CAICT, Tejet imported from 3GU
R5‑188045 Addition CA 2A2A7A and CA 2A2A7A66A 36.521-2 ECIT, CAICT, Tejet imported from 3GU
R5‑188046 Addition CA 2A2A14A and CA 2A2A14A30A and CA 2A2A14A66A and CA 2A2A14A30A66A 36.521-2 ECIT, CAICT, Tejet imported from 3GU
R5‑188047 Addition CA 2A12A30A66A66A 36.521-2 ECIT, CAICT imported from 3GU
R5‑188048 CA 2A14A30A66A66A 36.521-2 ECIT, CAICT, Tejet imported from 3GU
R5‑188049 Addition CA 2A14A66A66A and CA 2A2A14A66A66A 36.521-2 ECIT, CAICT, Tejet imported from 3GU
R5‑188050 Addition CA 2A29A30A66A 36.521-2 ECIT, CAICT imported from 3GU
R5‑188051 Correction to the MU for UL CA Anritsu imported from 3GU
R5‑188052 Editorial correction to FS3 RRM clause 8 Tests Anritsu imported from 3GU
R5‑188053 MPR for CA (intra-band contiguous DL CA and UL CA) Sprint Corporation imported from 3GU
R5‑188054 Further LS on Carrier Aggregation RF Receiver test cases optimization TSG WG RAN5 imported from 3GU
R5‑188055 Discussion on Mid test channel bandwidth in Band n257 NTT DOCOMO, INC. imported from 3GU
R5‑188056 NR FR2 TT Proposal Telecom Italia, AT&T, China Mobile, China Telecom, China Unicom, DISH Network, Orange, Sprint, Vodafone imported from 3GU
R5‑188057 Consideration of TT values in different frequency ranges for FR2 Apple Inc., Intel Corporation, vivo, Huawei, Hisilicon imported from 3GU
R5‑188058 NR FR2 TT Way Forward Telecom Italia, Orange, Vodafone, CMCC, China Unicom, Qualcomm, AT&T, Ericsson, NTT DoCoMo, Verizon, Dish, Intel, Apple imported from 3GU
R5‑188059 Addition of descriptions on new MU contributions Anritsu imported from 3GU
R5‑188060 Update of MU budget and contributor description to TR 38.903 ROHDE & SCHWARZ imported from 3GU
R5‑188061 Discussion on Measurement Uncertainty in FR2 ROHDE & SCHWARZ imported from 3GU
R5‑188062 TRP uncertainties correction Keysight Technologies UK Ltd imported from 3GU
R5‑188063 Update of FR2 6.3.2 Transmit OFF power CAICT, Huawei imported from 3GU
R5‑188065 Meeting notes of offline discussion on FR2 MU contributors Anritsu imported from 3GU
R5‑188066 Update TC 6.6.3G.2_1 Huawei, HiSilicon imported from 3GU
R5‑188100 Update of 5G-NR test cases applicability Qualcomm Incorporated, Motorola Mobility, MCC TF160, Huawei, HiSilicon, Rohde & Schwarz, Intertek imported from 3GU
R5‑188101 CR of 5G_NR_NAS_Applicability Huawei, Hisilicon imported from 3GU
R5‑188102 Correction to Selection Expressions Motorola Mobility, MCC TF160 imported from 3GU
R5‑188103 Update of applicability and selection expressions Motorola Mobility, MCC TF160 imported from 3GU
R5‑188104 Adding new test case applicability MediaTek Inc. imported from 3GU
R5‑188105 EN-DC test model handling of different types of bearers MCC TF160 imported from 3GU
R5‑188106 SA Option2: Initial Test Model aspects MCC TF160 imported from 3GU
R5‑188107 Updates to PDU session establishment 5GSM messages Ericsson imported from 3GU
R5‑188108 Addition CA 2A2A29A and CA 2A2A29A30A 36.523-2 ECIT imported from 3GU
R5‑188109 Addition CA 2A29A66A 36.523-2 ECIT imported from 3GU
R5‑188110 Addition CA 2A30A66A66A 36.523-2 ECIT imported from 3GU
R5‑188111 Addition CA 7A66A and CA 2A7A66A 36.523-2 ECIT imported from 3GU
R5‑188112 Addition CA 2A2A7A and CA 2A2A7A66A 36.523-2 ECIT, CAICT, Tejet imported from 3GU
R5‑188113 Addition CA 2A2A14A and CA 2A2A14A30A and CA 2A2A14A66A and CA 2A2A14A30A66A 36.523-2 ECIT, CAICT, Tejet imported from 3GU
R5‑188114 Addition CA 2A12A30A66A66A 36.523-2 ECIT, CAICT, Tejet imported from 3GU
R5‑188115 Addition CA 2A14A30A66A66A 36.523-2 ECIT, CAICT, Tejet imported from 3GU
R5‑188116 Addition CA 2A14A66A66A and CA 2A2A14A66A66A 36.523-2 ECIT, CAICT, Tejet imported from 3GU
R5‑188117 Addition CA 2A29A30A66A 36.523-2 ECIT, CAICT, Tejet imported from 3GU
R5‑188118 Alignments of UE Test Loop Mode H description MCC TF160 imported from 3GU
R5‑188119 Alignments of UE Test Loop Mode H description MCC TF160 imported from 3GU
R5‑188120 Alignments of UE Test Loop Mode H description MCC TF160 imported from 3GU
R5‑188121 Correction to eMDT2 test case 8.6.1.3 Intel Corporation (UK) Ltd, Keysight Technologies UK Ltd., Keysight imported from 3GU
R5‑188122 Update chapter 4.5.2 RRC_IDLE Ericsson imported from 3GU
R5‑188123 Update chapter 4.5.4 RRC_CONNECTED Ericsson imported from 3GU
R5‑188124 Addition of general test procedures for 5GC testing CATT, TDIA imported from 3GU
R5‑188125 Add PICS for 5GMM implementation cabilities MediaTek Inc. imported from 3GU
R5‑188126 Addition of NR test case 6.1.1.2_PLMN selection of Other PLMN Huawei, Hisilicon imported from 3GU
R5‑188127 Addition of NR test case 6.1.1.3_Cell reselection of ePLMN Huawei, Hisilicon imported from 3GU
R5‑188128 Addition of NR test case 6.1.1.4_PLMN selection in shared network environment Huawei, Hisilicon imported from 3GU
R5‑188129 Addition of NR test case 6.1.1.5_PLMN selection Huawei, Hisilicon imported from 3GU
R5‑188130 Addition of NR test case 6.1.2.1_Cell selection_Qrxlevmin Huawei, Hisilicon imported from 3GU
R5‑188131 Addition of NR test case 6.1.2.2_Cell selection_Qqualmin Huawei, Hisilicon imported from 3GU
R5‑188132 Addition of NR test case 6.1.2.3_Cell selection_Serving cell bar Huawei, Hisilicon imported from 3GU
R5‑188133 Addition of NR test case 6.1.2.4_Cell selection_Serving cell Squal below Zero Huawei, Hisilicon imported from 3GU
R5‑188134 Addition of NR test case 6.1.2.5_Cell Reselection Huawei, Hisilicon imported from 3GU
R5‑188135 Addition of NR test case 6.1.2.6_Cell Reselection for interband operation Huawei, Hisilicon imported from 3GU
R5‑188136 Addition of NR test case 6.1.2.9_Cell Reselection using Qhyst, Qoffset and Treselection Huawei, Hisilicon imported from 3GU
R5‑188137 Addition of NR test case 6.1.2.20_Inter-frequency cell reselection according to priority Huawei, Hisilicon imported from 3GU
R5‑188138 Addition of NR test case 6.1.2.21_Cell reselection,SIntra SearchQ and SnonIntraSeqrchQ Huawei, Hisilicon imported from 3GU
R5‑188139 Addition of NR test case 6.1.2.22_Inter-frequency cell reselection with parameters ThreshX, HighQ, ThreshX, LowQ and ThreshServing, LowQ Huawei, Hisilicon imported from 3GU
R5‑188140 Addition of NR test case 7.1.1.2.4_BCCH HARQ Huawei, Hisilicon imported from 3GU
R5‑188141 CR of NR test case 7.1.1.1.4_Beam Failure Huawei, Hisilicon imported from 3GU
R5‑188142 CR of NR test case 7.1.1.3.7_Power Headroom Reporting Huawei, Hisilicon imported from 3GU
R5‑188143 CR of NR test case 7.1.1.5.4_DRX Huawei, Hisilicon imported from 3GU
R5‑188144 CR of NR test case 7.1.1.6.1_Correct handling of DL assignmentSemi persistent Huawei, Hisilicon imported from 3GU
R5‑188145 CR of NR test case 7.1.1.6.2_configured grant Type 1 Huawei, Hisilicon imported from 3GU
R5‑188146 CR of NR test case 7.1.1.6.3_configured grant Type 2 Huawei, Hisilicon imported from 3GU
R5‑188147 Addition of NR test case 8.1.1.1.2_Paging Huawei, Hisilicon imported from 3GU
R5‑188148 Addition of NR test case 8.1.1.2.1_RRC connection establishment Huawei, Hisilicon imported from 3GU
R5‑188149 Addition of NR test case 8.1.3.1.1_Event A1 Huawei, Hisilicon imported from 3GU
R5‑188150 New NAS test case 9.1.5.1.2 ROHDE & SCHWARZ imported from 3GU
R5‑188151 New NAS test case 9.1.6.1.4 ROHDE & SCHWARZ imported from 3GU
R5‑188152 Addition of new 5GC TC 9.1.5.1.10 CAICT imported from 3GU
R5‑188153 Addition of new 5GC TC 9.1.5.1.11 CAICT imported from 3GU
R5‑188154 Addition of new 5GC TC 9.1.6.1.6 MediaTek Inc. imported from 3GU
R5‑188155 Addition of new 5GC TC 9.1.6.2.8 MediaTek Inc. imported from 3GU
R5‑188156 Addition of new 5GC TC 9.1.6.2.10 MediaTek Inc. imported from 3GU
R5‑188157 Addition of new 5GS mobility management TC 9.1.7.1 Tejet,ZTE,SRTC imported from 3GU
R5‑188158 Addition of new 5GS mobility management TC 9.1.7.2 Tejet,ZTE,SRTC imported from 3GU
R5‑188159 Addition of NR test case 9.1.5.1.1_Registration Request Huawei, Hisilicon, CAICT, CATT, Samsung, TF160, R&S, Motorola, Ericsson, Qualcomm imported from 3GU
R5‑188160 Addition of new TC 9.1.8.4 Starpoint, TDIA, CATT imported from 3GU
R5‑188161 Addition of new TC 9.1.8.6 Starpoint, TDIA, CATT imported from 3GU
R5‑188162 Addition of new 5GC TC 9.1.5.2.2 CATT, TDIA imported from 3GU
R5‑188163 Addition of new TC 9.1.8.7 Starpoint, TDIA, CATT imported from 3GU
R5‑188164 Addition of new TC 9.1.8.11 Starpoint, TDIA, CATT imported from 3GU
R5‑188165 Addition of new 5GC TC 9.1.2.1 TDIA, CATT imported from 3GU
R5‑188166 Addition of new 5GC TC 9.1.8.13 CAICT imported from 3GU
R5‑188167 Addition of new 5GC TC 9.1.8.17 CAICT imported from 3GU
R5‑188168 Addition of new 5GC TC 10.1.3.4 CAICT imported from 3GU
R5‑188169 Addition of new 5GC TC 10.1.3.5 CAICT imported from 3GU
R5‑188170 Addition of new 5GC TC 10.1.3.6 CAICT imported from 3GU
R5‑188171 Addition of new 5GC TC 10.1.3.7 CAICT imported from 3GU
R5‑188172 Addition of new 5GC TC 10.1.3.8 CAICT imported from 3GU
R5‑188173 Addition of new 5GC TC 10.1.6.1 CAICT imported from 3GU
R5‑188174 Addition of new 5GC TC 10.1.6.2 CAICT imported from 3GU
R5‑188175 Addition of new 5GC TC 10.1.6.3 CAICT imported from 3GU
R5‑188176 Addition of 5GC Test case 10.1.4.1 ANRITSU LTD imported from 3GU
R5‑188177 Addition of 5GC test case 10.1.2.1 CATT, TDIA imported from 3GU
R5‑188178 Addition of 5GC Test case 10.1.5.1 TDIA, CATT imported from 3GU
R5‑188179 CR of 5G_NR_Applicability Huawei, Hisilicon imported from 3GU
R5‑188180 Update of 5G-NR test cases applicability Qualcomm Incorporated, Motorola Mobility, MCC TF160, Huawei, HiSilicon, Rohde & Schwarz, Intertek imported from 3GU
R5‑188181 Golden SIG test cases for SA option 2 MCC TF160 imported from 3GU
R5‑188182 Review deadlines for next quarter WG Chairman imported from 3GU
R5‑188183 Draft TS 38.533 v0.1.0 ROHDE & SCHWARZ imported from 3GU
R5‑188184 LS on the testability of FR2 transmitter and reception tests TSG WG RAN5 imported from 3GU
R5‑188185 Reply LS to 5G/NR UE Conformance Test applicability for 5G S-Modules TSG WG RAN5 imported from 3GU
R5‑188186 draft RAN5#81 meeting report ETSI Secretariat imported from 3GU
R5‑188187 Correction to NR MAC DRX test cases 7.1.1.5.1 and 7.1.1.5.2 ANRITSU LTD imported from 3GU
R5‑188188 Addition of NR test case 8.1.1.3.1_Redirection to NR Huawei, Hisilicon imported from 3GU
R5‑188189 On the FR2 MU for occupied BW and ACLR Anritsu imported from 3GU
R5‑188190 Addition of NR test case 8.2.3.11.2_gapFR2 Huawei, Hisilicon imported from 3GU
R5‑188191 Addition of 5GC test case 10.1.3.1 CATT, TDIA, CAICT imported from 3GU
R5‑188192 Addition of NR test case 7.1.1.2.4_BCCH HARQ Huawei, Hisilicon imported from 3GU
R5‑188193 Correcton to Layer 2 Pre Test conditions Motorola Mobility imported from 3GU
R5‑188194 Addition of NR test case 8.1.3.1.1_Event A1 Huawei, Hisilicon imported from 3GU
R5‑188195 Update to 5G TC TA registration update Samsung imported from 3GU
R5‑188196 Addition of test applicabilities for 5GC testcases CATT imported from 3GU
R5‑188197 Update of 5G-NR test cases applicability Qualcomm Incorporated, Motorola Mobility, MCC TF160, Huawei, HiSilicon, Rohde & Schwarz, Intertek imported from 3GU
R5‑188198 Applicability for NR NSA Option 3 protocol tests ROHDE & SCHWARZ imported from 3GU
R5‑188199 Removal of the test applicability for testcase 7.1.4.36 CATT imported from 3GU
R5‑188200 Correction to NB-IoT Test case 22.3.1.9 TDIA, MCC TF160, CATT imported from 3GU
R5‑188201 Correction to eMDT2 test case 8.6.1.3 Intel Corporation (UK) Ltd, Keysight Technologies UK Ltd., Keysight imported from 3GU
R5‑188202 Update of 5GS NR RRC test case 8.2.1.1.1 ROHDE & SCHWARZ, Qualcomm imported from 3GU
R5‑188203 Addition of 5GC test case 10.1.3.1 CATT, TDIA, CAICT imported from 3GU
R5‑188204 Applicability and ICS for CA RF and RRM test cases Ericsson, Rohde & Schwarz, Huawei, HiSilicon, KTL, SGS Wireless imported from 3GU
R5‑188205 Updates to Annex B to add Permitted OTA Test Methods PCTEST Engineering Lab imported from 3GU
R5‑188206 Introduction of New FR1 test case 6.3.3.7 PUSCH-PUCCH and PUSCH-SRS time masks MTCC, KTL imported from 3GU
R5‑188207 5G_FR1 Text update for 7.3A Reference sensitivity for CA Qualcomm Inc. imported from 3GU
R5‑188208 Updates of MU in TS 38.521-1 Annex F during RAN5#81 NTT DOCOMO, INC. imported from 3GU
R5‑188209 Updates of TT in TS 38.521-1 Annex F during RAN5#81 NTT DOCOMO, INC. imported from 3GU
R5‑188210 TDD configuration for UE Tx test in FR1 Ericsson imported from 3GU
R5‑188211 Core alignment CR to capture TS 38.101-1 updates during RAN4#89 NTT DOCOMO, INC. imported from 3GU
R5‑188212 Updates to maximum output power test cases Ericsson imported from 3GU
R5‑188213 Update of FR2 test case 7.4 CAICT, Anritsu, Huawei imported from 3GU
R5‑188214 Updates of TT in TS 38.521-2 Annex F during RAN5#81 NTT DOCOMO, INC. imported from 3GU
R5‑188215 TDD configuration for UE Tx test in FR2 Ericsson imported from 3GU
R5‑188216 Core alignment CR to capture TS 38.101-2 updates during RAN4#89 NTT DOCOMO, INC. imported from 3GU
R5‑188217 On measurement grids Keysight Technologies UK Ltd imported from 3GU
R5‑188218 Update to Annex K Qualcomm Austria RFFE GmbH imported from 3GU
R5‑188219 Introduction of receiver spurious emission tests for FR1 inter-band EN-DC Anritsu imported from 3GU
R5‑188220 Introduction of wideband intermodulation tests for FR1 inter-band EN-DC Anritsu imported from 3GU
R5‑188221 LTE TDD configuration for UE Tx test in EN-DC Ericsson imported from 3GU
R5‑188222 Core alignment CR to capture TS 38.101-3 updates during RAN4#89 NTT DOCOMO, INC. imported from 3GU
R5‑188223 Applicability for RRM NR tests ROHDE & SCHWARZ imported from 3GU
R5‑188224 Update MU budget in TR 38.903 Keysight Technologies UK Ltd imported from 3GU
R5‑188225 Update of MU budget tables in TR 38.903 Anritsu imported from 3GU
R5‑188226 Addition of descriptions on new MU contributions Anritsu imported from 3GU
R5‑188227 Test Point analysis for FR2 Maximum Output Power Ericsson imported from 3GU
R5‑188228 Consideration on MU contribution caused by antenna switching Anritsu imported from 3GU
R5‑188229 SNR estimation for low PSD tests Anritsu imported from 3GU
R5‑188230 On Quality of Quiet Zone Evaluation for Spurious Emissions Test Cases Keysight Technologies UK Ltd imported from 3GU
R5‑188231 TRP uncertainties correction Keysight Technologies UK Ltd imported from 3GU
R5‑188232 Discussion on TS38.521-2 Annex K restructuring Qualcomm Austria RFFE GmbH imported from 3GU
R5‑188233 Introduction of FD-MIMO test cases in Annexes Ericsson imported from 3GU
R5‑188234 Maximum Output Power for CA Sprint Corporaton imported from 3GU
R5‑188235 MPR for CA (intra-band contiguous DL CA and UL CA) Sprint Corporation imported from 3GU
R5‑188236 Correction to tested CA configuration selection criteria for Rx tests Bureau Veritas, Ericsson imported from 3GU
R5‑188237 Correction to 8.26.7 FS3 Intra-frequency event triggered reporting Anritsu imported from 3GU
R5‑188238 Addition to E-UTRA test frequencies for intra-band contiguous configuration for band 41 Ericsson, Sprint imported from 3GU
R5‑188239 Updates of MU in TS 38.521-2 Annex F during RAN5#81 NTT DOCOMO, INC. imported from 3GU
R5‑188240 Update of TR 38.905 with EN-DC A-MPR test point analyses, NS_04 Ericsson-LG Co., LTD imported from 3GU

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