The Mobile
Broadband Standard

3GPP TDocs (written contributions) at meeting

Meeting: R5-80 - 2018-08-20 to 2018-08-24, Gothenburg

meeting id: R5-80 (click id for more info on this meeting)

Click on the Tdoc to open its file.

TDoc Title Source Remarks
R5‑184000 Agenda - opening session WG Chairman imported from 3GU
R5‑184001 Agenda - mid week session WG Chairman imported from 3GU
R5‑184002 Agenda - closing session WG Chairman imported from 3GU
R5‑184003 RAN5#80 Session Programme WG Chairman imported from 3GU
R5‑184004 RAN5 Leadership Team WG Chairman imported from 3GU
R5‑184005 RAN5#79 WG Minutes ETSI Secretariat imported from 3GU
R5‑184006 RAN5#79 WG Action Points ETSI Secretariat imported from 3GU
R5‑184007 dummy ETSI Secretariat imported from 3GU
R5‑184008 Latest RAN Plenary notes WG Chairman imported from 3GU
R5‑184009 Latest RAN Plenary draft Report WG Chairman imported from 3GU
R5‑184010 Post Plenary Active Work Item update ETSI Secretariat imported from 3GU
R5‑184011 RAN5 SR to RP#80 WG Chairman imported from 3GU
R5‑184012 TF160 SR to RP#80 WG Chairman imported from 3GU
R5‑184013 RAN Chair Report to SA#80 WG Chairman imported from 3GU
R5‑184014 RAN5#80 LS Template WG Chairman imported from 3GU
R5‑184015 RAN5 5GS Text Proposal / pCR cover sheet template Ericsson imported from 3GU
R5‑184016 Meeting schedule for 2018-19 WG Chairman imported from 3GU
R5‑184017 WI Progress and Target Completion Date Review WG Chairman imported from 3GU
R5‑184018 Review deadlines for next quarter WG Chairman imported from 3GU
R5‑184019 LS on Settings for verifying RF requirements for Coherent UL MIMO TSG WG RAN4 imported from 3GU
R5‑184020 LS on generic 3CC to 5CC RRM test cases TSG WG RAN4 imported from 3GU
R5‑184021 Reply LS on the applicable requirements of the Power Class 2 capable UE TSG WG RAN4 imported from 3GU
R5‑184022 LS on Measurement Grids TSG WG RAN4 imported from 3GU
R5‑184023 LS on Introducing optional channel bandwidth TSG WG RAN4 imported from 3GU
R5‑184024 Definition of and test methods for OTA unwanted emissions of IMT radio equipment ITU-R Working Party 5D imported from 3GU
R5‑184025 LS reply on RAN4-RAN5 5G-NR RF pending issues: RMCs, OCNG patterns and FR2 RSRP accuracy TSG WG RAN4 imported from 3GU
R5‑184026 dummy LS b ETSI Secretariat imported from 3GU
R5‑184027 dummy LS c ETSI Secretariat imported from 3GU
R5‑184028 Addition of missing assistance data for modernized GPS and the GPS L5 signal for LTE minimum performance sub-test 4 Spirent Communications imported from 3GU
R5‑184029 Addition of missing assistance data for the Galileo E5A signal for LTE minimum performance sub-tests 3 and 8 Spirent Communications, European Commission imported from 3GU
R5‑184030 Addition of missing assistance data for modernized GPS and the GPS L5 signal for the LTE signalling tests Spirent Communications imported from 3GU
R5‑184031 Addition of missing assistance data for the Galileo E5A signal for LTE signalling tests Spirent Communications, European Commission imported from 3GU
R5‑184032 Addition of PICS for support of LPP message segmentation in test 7.3.1.1 Spirent Communications imported from 3GU
R5‑184033 Addition of PICS for support of LPP message segmentation Spirent Communications imported from 3GU
R5‑184034 Correction of GNSS information for V2X tests Spirent Communications, European Commission imported from 3GU
R5‑184035 Deletion of Conditions for GNSS Reliability Requirements for V2X from Annex I.6 Spirent Communications, European Commission imported from 3GU
R5‑184036 Addition of missing assistance data for the Galileo E5A signal for LTE signalling tests Spirent Communications, European Commission imported from 3GU
R5‑184037 Addition of PICS for support of LPP message segmentation in test 7.3.1.1 Spirent Communications imported from 3GU
R5‑184038 Addition of PICS for support of LPP message segmentation Spirent Communications imported from 3GU
R5‑184039 Correction of GNSS information for V2X tests Spirent Communications, European Commission imported from 3GU
R5‑184040 Deletion of Conditions for GNSS Reliability Requirements for V2X from Annex I.6 Spirent Communications, European Commission imported from 3GU
R5‑184041 Clarifications and corrections to Bluetooth identification test Spirent Communications imported from 3GU
R5‑184042 Update RRCConnectionReconfiguration message for EN-DC Ericsson imported from 3GU
R5‑184043 Update RRC CONNECTED state Ericsson imported from 3GU
R5‑184044 Update EPS Session Management test case in section 10 of TS 36.523-1. FirstNet imported from 3GU
R5‑184045 Update Reference Table 6.6.2-1A dedicated EPS bearer contexts FirstNet imported from 3GU
R5‑184046 WP – UE Conformance Test Aspects - Uplink capacity enhancements for LTE (UL 256 QAM) Ericsson imported from 3GU
R5‑184047 SR - UE Conformance Test Aspects - Uplink capacity enhancements for LTE (UL 256 QAM) Ericsson imported from 3GU
R5‑184048 Addition of IR.92 to SM-over-IP roles ROHDE & SCHWARZ, Ericsson imported from 3GU
R5‑184049 WP - UE Conformance Test Aspects - LTE bands with UE category M2 and/or NB2 in Rel-15 Ericsson imported from 3GU
R5‑184050 SR - UE Conformance Test Aspects - LTE bands with UE category M2 and/or NB2 in Rel-15 Ericsson imported from 3GU
R5‑184051 Discussion paper on the applicability of the tests in 37.571-1 for all types and categories of UE Spirent Communications, European Commission imported from 3GU
R5‑184052 Labelling more LTE test cases as not applicable for CAT M1 ROHDE & SCHWARZ imported from 3GU
R5‑184053 Correction to EMM test case 9.2.3.1.25 ROHDE & SCHWARZ imported from 3GU
R5‑184054 Add SRB with NR PDCP Ericsson imported from 3GU
R5‑184055 Add SRB1 and SRB2 with NR PDCP Ericsson imported from 3GU
R5‑184056 Corrections to G.15.4 ROHDE & SCHWARZ, Qualcomm Incorporated imported from 3GU
R5‑184057 Investigation on test coverage for IR.92 and IR.94 ROHDE & SCHWARZ imported from 3GU
R5‑184058 Investigation on Supplementary Services ROHDE & SCHWARZ imported from 3GU
R5‑184059 Adding SMS over IP configuration to applicabilities ROHDE & SCHWARZ imported from 3GU
R5‑184060 Adding SMS over SGs configuration to applicabilities ROHDE & SCHWARZ imported from 3GU
R5‑184061 Impact of GSMA IR.92 profile extension for EN-DC ROHDE & SCHWARZ imported from 3GU
R5‑184062 Resubmission of Corrections to IMS test case 19.1.6 ETSI MCC (Rohde & Schwarz) imported from 3GU
R5‑184063 Resubmission of Correction to TC 8.1.5.7 ETSI MCC (MediaTek Inc.) imported from 3GU
R5‑184064 Resubmission of a change of Cleaning up TC 6.5.2.4G.1 for V2V ETSI MCC (Huawei, Hisilicon) imported from 3GU
R5‑184065 Resubmission of Introduction of Maximum Power Reduction (MPR) for CA (3UL CA) ETSI MCC (SGS Wireless) imported from 3GU
R5‑184066 Resubmission of the Annexes of TC 6.5.2.3G.1 for V2V ETSI MCC (Huawei, Hisilicon) imported from 3GU
R5‑184067 Correction to 10.7.4 regarding CE mode ROHDE & SCHWARZ imported from 3GU
R5‑184068 FR1 TT Way Forward update Telecom Italia S.p.A. imported from 3GU
R5‑184069 Correction of the Update to applicability condition of test case 11.2.3 to include CSG PICS ETSI MCC (Qualcomm Incorporated) imported from 3GU
R5‑184070 MCC TF160 Status Report MCC TF160 imported from 3GU
R5‑184071 V2X: Test Model updates MCC TF160 imported from 3GU
R5‑184072 EN-DC: TS 38.508-1 / 36.508 issue list MCC TF160 imported from 3GU
R5‑184073 EN-DC: Test Model updates MCC TF160 imported from 3GU
R5‑184074 eLAA: Test Model MCC TF160 imported from 3GU
R5‑184075 NB-IoT timer tolerances: extension of timer value range MCC TF160, Anritsu Ltd. imported from 3GU
R5‑184076 Corrections to UE Test Loop Mode H MCC TF160 imported from 3GU
R5‑184077 Corrections to UE Test Loop Mode H MCC TF160 imported from 3GU
R5‑184078 Corrections to UE Test Loop Mode H MCC TF160 imported from 3GU
R5‑184079 Clarification for NB-IoT test case 22.3.1.1 MCC TF160, Rohde&Schwarz imported from 3GU
R5‑184080 Routine maintenance for TS 36.523-3 MCC TF160 imported from 3GU
R5‑184081 MCPTT: Test Model updates MCC TF160 imported from 3GU
R5‑184082 Editorial clean up for consistency and better clarity Spirent Communications, European Commission imported from 3GU
R5‑184083 Applicability of tests for types and Categories of UE Spirent Communications, European Commission imported from 3GU
R5‑184084 Update serving cell Ericsson imported from 3GU
R5‑184085 TP to TS38.521-1:Operating bands and channel arrangement China Unicom imported from 3GU
R5‑184086 Applicability and ICS for CA RF and RRM test cases Ericsson imported from 3GU
R5‑184087 Update chapter 3 Ericsson imported from 3GU
R5‑184088 Correction to Rel-99 NAS testcase 9.4.9 ROHDE & SCHWARZ imported from 3GU
R5‑184089 Correction to NB-IoT test case 22.5.8 ROHDE & SCHWARZ imported from 3GU
R5‑184090 Correction to NB-IoT test case 22.5.14 ROHDE & SCHWARZ imported from 3GU
R5‑184091 Correction to NB-IoT test case 22.6.2 ROHDE & SCHWARZ imported from 3GU
R5‑184092 Correction to NB-IoT test case 22.6.3 ROHDE & SCHWARZ imported from 3GU
R5‑184093 Correction to NB-IoT test case 22.1.1 ROHDE & SCHWARZ imported from 3GU
R5‑184094 Correction to ATTACH ACCEPT message for SMS only ROHDE & SCHWARZ imported from 3GU
R5‑184095 Correction to eNB-IoT test case 22.3.2.7 MCC TF160 imported from 3GU
R5‑184096 Editorial corrections to IMS emergency call test cases in clauses 19 and 21 MCC TF160 imported from 3GU
R5‑184097 Introduce SA RRC messages Ericsson imported from 3GU
R5‑184098 Update Clause in 6.2.5EA Configured UE transmitted Power for UE category M1 Qualcomm Incorporated imported from 3GU
R5‑184099 Introduction of band 73 to UE maximum output power in TS36.521-1 China Unicom imported from 3GU
R5‑184100 Applicability correction for event triggered eMTC tests ROHDE & SCHWARZ imported from 3GU
R5‑184101 Applicability correction for HO eMTC tests ROHDE & SCHWARZ imported from 3GU
R5‑184102 Editorial corrections 8.16.73 ROHDE & SCHWARZ imported from 3GU
R5‑184103 Editorial corrections 9.1.46 ROHDE & SCHWARZ imported from 3GU
R5‑184104 Editorial corrections 9.1.50 ROHDE & SCHWARZ imported from 3GU
R5‑184105 Editorial corrections 7.3.49 ROHDE & SCHWARZ imported from 3GU
R5‑184106 RMC correction 8.1.12_1 (core spec alignment) ROHDE & SCHWARZ imported from 3GU
R5‑184107 New generic CA RSRP test cases ROHDE & SCHWARZ imported from 3GU
R5‑184108 New generic CA RSRQ test cases ROHDE & SCHWARZ imported from 3GU
R5‑184109 Applicability correction for eMTC tests ROHDE & SCHWARZ imported from 3GU
R5‑184110 Correction to NB-IOT In-Band Test Frequencies ROHDE & SCHWARZ imported from 3GU
R5‑184111 Addition of NB-IOT Guardband Test Frequencies for 10 MHz ROHDE & SCHWARZ imported from 3GU
R5‑184112 Correction to nrs-CRS-PowerOffset-r13 for NB-IOT OTDOA tests ROHDE & SCHWARZ imported from 3GU
R5‑184113 NB-IOT OTDOA reporting delay test cases not testable ROHDE & SCHWARZ imported from 3GU
R5‑184114 Changes to eMTC OTDOA tests ROHDE & SCHWARZ imported from 3GU
R5‑184115 Draft TS 38.533 v0.0.2 ROHDE & SCHWARZ imported from 3GU
R5‑184116 LS on generic 3CC to 5CC RRM test cases ROHDE & SCHWARZ imported from 3GU
R5‑184117 New CA band combination CA_1A-3A-7A-20A - Update of table 7.3A.5, 7.3A.9 and refsens Vodafone GmbH imported from 3GU
R5‑184118 New CA band combination CA_1A-3A-7A-20A - Update of table A.4.6.3-5 Vodafone GmbH imported from 3GU
R5‑184119 New CA band combination CA_1A-3A-7A-20A - Update of table A.4.3.3.3-5 Vodafone GmbH imported from 3GU
R5‑184120 New CA band combination CA_1A-3A-7A-20A - Update of test point analysis Vodafone GmbH imported from 3GU
R5‑184121 TP for Clause 4.1.1 of TS 38.522 CMCC imported from 3GU
R5‑184122 TP for Clause 4.1.2 of TS 38.522 CMCC imported from 3GU
R5‑184123 TP for Clause 4.1.3 of TS 38.522 CMCC imported from 3GU
R5‑184124 Discussion on the way to write Clause 7.4 Maximum Input Level and Clause 7.5 Adjacent Channel Selectivity in TS 38.521-3 CMCC, HUAWEI imported from 3GU
R5‑184125 Add Clause 7.5 into TS 38.521-3 CMCC imported from 3GU
R5‑184126 Correct IE FrequencyInfoDL Ericsson imported from 3GU
R5‑184127 Introduce SA system information blocks Ericsson imported from 3GU
R5‑184128 Discussion on Test Loop Mode H MCC TF160 imported from 3GU
R5‑184129 Editorial Correction to note 7 in Table E-1 ROHDE & SCHWARZ imported from 3GU
R5‑184130 Introduction of band 73 to Spurious emission in TS36.521-1 China Unicom imported from 3GU
R5‑184131 Addition of Assistance Data for OTDOA eMTC tests ROHDE & SCHWARZ imported from 3GU
R5‑184132 Correction of the applicability for OTDOA IOT tests ROHDE & SCHWARZ imported from 3GU
R5‑184133 Discussion on RRM 5G progress ROHDE & SCHWARZ imported from 3GU
R5‑184134 Introduce SA other information elements Ericsson imported from 3GU
R5‑184135 eNB-IoT: Test Model MCC TF160 imported from 3GU
R5‑184136 Removal of technical content in 34.108 v14.2.0 and substitution with pointer to the next Release ETSI Secretariat imported from 3GU
R5‑184137 Removal of technical content in 34.121-2 v14.1.0 and substitution with pointer to the next Release ETSI Secretariat imported from 3GU
R5‑184138 Removal of technical content in 34.123-1 v14.5.0 and substitution with pointer to the next Release ETSI Secretariat imported from 3GU
R5‑184139 Removal of technical content in 34.123-2 v14.4.0 and substitution with pointer to the next Release ETSI Secretariat imported from 3GU
R5‑184140 Removal of technical content in 36.521-3 v14.4.0 and substitution with pointer to the next Release ETSI Secretariat imported from 3GU
R5‑184141 Removal of technical content in 36.523-3 v14.4.0 and substitution with pointer to the next Release ETSI Secretariat imported from 3GU
R5‑184142 Removal of technical content in 36.903 v13.5.0 and substitution with pointer to the next Release ETSI Secretariat imported from 3GU
R5‑184143 Removal of technical content in 36.905 v14.6.0 and substitution with pointer to the next Release ETSI Secretariat imported from 3GU
R5‑184144 Correction to test case 9.5.7.2 Intel Corporation (UK) Ltd imported from 3GU
R5‑184145 Addition of Test Case:” LWA / T351 Expiry” to WLAN/3GPP Radio Level Integration and Interworking Enhancement Interworking Work Item Intel Corporation (UK) Ltd imported from 3GU
R5‑184146 Addition of Applicability statement for WLAN/3GPP Radio Level Integration and Interworking Enhancement test case: ”LWA / T351 Expiry” Intel Corporation (UK) Ltd imported from 3GU
R5‑184147 Test Tolerance Analysis for RRM TC 9.1.1.1_2 and 9.1.2.1_2 Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑184148 Addition of TT analysis of eHST FDD Intra-frequency event reporting. Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑184149 Addition of TT analysis of V2X uplink timing test case Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑184150 Test tolerance update of V2X uplink timing test cases Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑184151 Test tolerance update of eHST FDD event reporting test case Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑184152 TP to TS8.521-1: Operating bands and Channel arrangement China Unicom imported from 3GU
R5‑184153 Draft TS 38.521-1 v1.0.1 China Unicom imported from 3GU
R5‑184154 Draft TS 38.521-1 v1.0.1 China Unicom imported from 3GU
R5‑184155 Test Tolerance Analysis for RRM TC 9.1.1.2_2 and 9.1.2.2_2 Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑184156 Test Tolerance Analysis for RRM TC 9.1.3.1_2 and 9.1.4.1_2 Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑184157 Test Tolerance Analysis for RRM TC 9.1.3.2_2 and 9.1.4.2_2 Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑184158 Test Tolerance Analysis for RRM TC 9.1.5.1_2 Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑184159 Test Tolerance Analysis for RRM TC 9.1.5.2_2 Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑184160 Test Tolerance Analysis for RRM TC 9.2.1.1_2 and 9.2.2.1_2 Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑184161 Test Tolerance Analysis for RRM TC 9.2.3.1_2 and 9.2.4.1_2 Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑184162 Test Tolerance Analysis for RRM TC 9.2.3.2_2 and 9.2.4.2_2 Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑184163 Test Tolerance Analysis for RRM TC 9.2.4A.1_2 Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑184164 Test Tolerance Analysis for RRM TC 9.2.4A.2_2 Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑184165 Test Tolerance: Updates to Cat1bis inter frequency RSRP accuracy tests and Annex F Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑184166 Test Tolerance: Updates to Cat1bis inter frequency RSRQ accuracy tests and Annex F Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑184167 Test Tolerance: Updates to Cat1bis intra frequency RSRP accuracy tests and Annex F Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑184168 Test Tolerance: Updates to Cat1bis intra frequency RSRQ accuracy tests and Annex F Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑184169 Update of RRM IncMon test cases 8.3.7, 8.3.8, 8.3.9, 8.4.7 including test tolerances Ericsson imported from 3GU
R5‑184170 Requirements for test frequencies for 5G signalling test cases MCC TF160 imported from 3GU
R5‑184171 TC Group definition for RRM IncMon test cases Ericsson imported from 3GU
R5‑184172 Add Test Tolerances analysis for E-UTRAN RRM IncMon TCs 8.3.7 and 8.4.7 Ericsson imported from 3GU
R5‑184173 Add Test Tolerances analysis for E-UTRAN IncMon TC 8.3.8 Ericsson imported from 3GU
R5‑184174 Add Test Tolerances analysis for E-UTRAN IncMon TC 8.3.9 Ericsson imported from 3GU
R5‑184175 Correction to NR MAC test case 7.1.1.3.2 Keysight Technologies UK Ltd imported from 3GU
R5‑184176 Updates to PDCCH and SearchSpace configurations MCC TF160 imported from 3GU
R5‑184177 Updation of V2X TC 6.6.2.1G.2 & 6.6.2.1G.3 Huawei, Hisilicon imported from 3GU
R5‑184178 Introcution of V2X TC 6.5.2.4G.3 Huawei, Hisilicon imported from 3GU
R5‑184179 Updation of V2X TC 6.6.2.2G.2 Huawei, Hisilicon imported from 3GU
R5‑184180 Updation of V2X TCs 6.5.2.3G.2 and 6.5.2.3G.3 Huawei, Hisilicon imported from 3GU
R5‑184181 Update of V2V TCs 6.5.2.3G.1 & 6.5.2.4G & 6.6.2.2G.1& 6.6.3G.1 Huawei, Hisilicon imported from 3GU
R5‑184182 TT statements for V2X TCs Huawei, Hisilicon imported from 3GU
R5‑184183 Update of V2X TCs 6.6.3G.2_1 & 6.6.3G.3_1 Huawei, Hisilicon imported from 3GU
R5‑184184 Update of V2X TCs 6.6.3G.2 & 6.6.3G.3 Huawei, Hisilicon imported from 3GU
R5‑184185 Test Tolerance Analysis for RRM TC 9.2.1.1_2 and 9.2.2.1_2 Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑184186 Proposal for Signalling Test Setup in FR2 ANRITSU LTD imported from 3GU
R5‑184187 Correction to testcase 9.2.2.1.9 for CAT-M1 UEs ROHDE & SCHWARZ, Qualcomm Incorporated imported from 3GU
R5‑184188 Reuse of demodulation setup for signalling tests in FR2 ANRITSU LTD imported from 3GU
R5‑184189 Band groups added to specification PCTEST Engineering Laboratory, Inc. imported from 3GU
R5‑184190 Editorial - Updates for GNSS Signal Capabilities PCTEST Engineering Laboratory, Inc. imported from 3GU
R5‑184191 Editorial - Updates, corrections and clarifications to specification PCTEST Engineering Laboratory, Inc. imported from 3GU
R5‑184192 Correction of Test Cases 8.2.5.4 and 8.2.5.5 Intel Corporation (UK) Ltd imported from 3GU
R5‑184193 Correction to 36521-1-chapter 6_V2V and V2X Tejet imported from 3GU
R5‑184194 eLAA_correction to 6.3.5A.1.2 and 6.3.5A.2.2 Tejet imported from 3GU
R5‑184195 eLAA_Update to 6.6.2.3A.2 Tejet imported from 3GU
R5‑184196 eLAA_Update to 6.6.3.1A.2 Tejet imported from 3GU
R5‑184197 CA band combination CA_2A-46A CA_26A-46A - Updates of test points analysis Tejet imported from 3GU
R5‑184198 WP - UE Conformance Test Aspects - Voice and Video Enhancement for LTE CATT imported from 3GU
R5‑184199 SR - UE Conformance Test Aspects - Voice and Video Enhancement for LTE CATT imported from 3GU
R5‑184200 WP - UE Conformance Test Aspects - UL Data Compression in LTE CATT imported from 3GU
R5‑184201 SR - UE Conformance Test Aspects - UL Data Compression in LTE CATT imported from 3GU
R5‑184202 Completion of Chapter 7 RRM cat 1bis test cases Qualcomm UK Ltd imported from 3GU
R5‑184203 Test Tolerance: Updates to Cat1bis chapter 8 inter-frequency event triggered reporting tests Qualcomm UK Ltd imported from 3GU
R5‑184204 Test Tolerances analysis for E-UTRAN FDD-FDD and TDD-TDD inter-frequency TC 8.3.1_2, 8.3.2_2, 8.4.1_2, 8.4.2_2 and 8.4.6_2 for UE category 1bis Qualcomm UK Ltd imported from 3GU
R5‑184205 Test Tolerance: Updates to Cat1bis Event triggered reporting tests under AWGN propagation conditions in asynchronous cells with DRX when L3 filtering is used Qualcomm UK Ltd imported from 3GU
R5‑184206 Test Tolerances analysis for E-UTRAN FDD-FDD and TDD-TDD inter-frequency TC 8.3.3_2 and 8.4.3_2 for UE category 1bis when L3 filtering is used Qualcomm UK Ltd imported from 3GU
R5‑184207 Test Tolerance: Updates to Cat1bis Event triggered reporting tests with fading, Annex E and Annex F Qualcomm UK Ltd imported from 3GU
R5‑184208 Test Tolerances analysis for E-UTRAN FDD-FDD intra-frequency event triggered reporting under fading propagation conditions in asynchronous cells for UE category 1bis Qualcomm UK Ltd imported from 3GU
R5‑184209 Test Tolerance: Updates to Cat1bis intra-frequency Event triggered reporting tests, Annex E and Annex F Qualcomm UK Ltd imported from 3GU
R5‑184210 Test Tolerances analysis for E-UTRAN FDD-FDD and TDD-TDD intra-frequency TC 8.1.12_2, 8.1.13_2, 8.1.17_2, 8.1.18_2 for UE category 1bis Qualcomm UK Ltd imported from 3GU
R5‑184211 Test Tolerance: Updates to Cat1bis intra-frequency CGI Event triggered reporting tests, Annex E and Annex F Qualcomm UK Ltd imported from 3GU
R5‑184212 Test Tolerances analysis for E-UTRAN FDD and TDD Intra-frequency CGI TC 8.1.19_2, 8.1.20_2, 8.2.7_2, 8.2.8_2 for UE category 1bis Qualcomm UK Ltd imported from 3GU
R5‑184213 Removal of Testcase 8.2.2.6.4 CATT imported from 3GU
R5‑184214 Removal of Testcase 8.2.2.6.5 CATT imported from 3GU
R5‑184215 Update of the title of Testcase 7.1.5.6 CATT imported from 3GU
R5‑184216 Corrections to NBIOT NAS TC 22.5.7b CATT imported from 3GU
R5‑184217 Update of applicability and tests conditions for LTE_VoLTE_ViLTE_enh test cases CATT imported from 3GU
R5‑184218 Addition of Correct HARQ process handling BCCH test case 7.1.1.2.4 Huawei, Hisilicon imported from 3GU
R5‑184219 Addition of Correct HARQ process handling CCCH test case 7.1.1.2.3 Huawei, Hisilicon imported from 3GU
R5‑184220 Addition of Correct Handling of DL HARQ process PDSCH Aggregation test case 7.1.1.2.2 Huawei, Hisilicon imported from 3GU
R5‑184221 Addition of NR CA reconfiguration test case 8.2.4.2.1.1 Huawei, Hisilicon imported from 3GU
R5‑184222 Addition of NR CA reconfiguration test case 8.2.4.2.1.2 Huawei, Hisilicon imported from 3GU
R5‑184223 Addition of NR CA reconfiguration test case 8.2.4.2.1.3 Huawei, Hisilicon imported from 3GU
R5‑184224 Addition of Random access procedure Successful Supplementary Uplink test case 7.1.1.1.5 Huawei, Hisilicon imported from 3GU
R5‑184225 Addition of Random access test case 7.1.1.1.4 Huawei, Hisilicon imported from 3GU
R5‑184226 Addition of Correct handling of Configured UL grant Type 1 test case 7.1.1.6.2 Huawei, Hisilicon imported from 3GU
R5‑184227 Addition of Correct handling of Configured UL grant Type 2 test case 7.1.1.6.3 Huawei, Hisilicon imported from 3GU
R5‑184228 CR of Correct handling of DL assignment Semi persistent test case 7.1.1.6.1 Huawei, Hisilicon imported from 3GU
R5‑184229 CR of UE power headroom reporting test case 7.1.1.3.7 Huawei, Hisilicon imported from 3GU
R5‑184230 CR of BSR report test case 7.1.1.3.4 Huawei, Hisilicon imported from 3GU
R5‑184231 Addition and correction of test applicability of multiple signalling test cases Huawei, Hisilicon imported from 3GU
R5‑184232 Discussion on CQI reporting on highest MCS value case Huawei, Hisilicon imported from 3GU
R5‑184233 CR of CQI reporting test case 9.2.1.1.4.2 Huawei, Hisilicon imported from 3GU
R5‑184234 Correction to message contents for UL64QAM Anritsu imported from 3GU
R5‑184235 Correction to default message for UL CA tests Anritsu imported from 3GU
R5‑184236 Editorial correction to FDD Mode test frequencies Anritsu imported from 3GU
R5‑184237 Correction to Figure A.64 to cater for CC >= 3 Anritsu imported from 3GU
R5‑184238 Correction to LAA CQI reporting tests Anritsu imported from 3GU
R5‑184239 Correction to 4x4 CA demodulation tests Anritsu imported from 3GU
R5‑184240 Correction to cqi-pmi-ConfigurationIndex for 5DL CA CQI Reporting tests Anritsu imported from 3GU
R5‑184241 Correction to message exception for 8.2.1.4.2_A.4 Anritsu imported from 3GU
R5‑184242 Correction to p-Max in configured UE transmitted output power tests for CA Anritsu imported from 3GU
R5‑184243 Removal of the editor’s note regarding the faders in 4x4 CA demod tests Anritsu imported from 3GU
R5‑184244 Editorial correction to inter-band UL CA tests Anritsu imported from 3GU
R5‑184245 Editorial correction to RMC name in PHICH demodulation test Anritsu imported from 3GU
R5‑184246 Editorial correction to test points for 8.7.5.1 Anritsu imported from 3GU
R5‑184247 Correction to 4CA and 5CA PDSCH demodulation tests Anritsu imported from 3GU
R5‑184248 Corrections to CA Test Configuration Table in section 7 Anritsu imported from 3GU
R5‑184249 Editorial correction to Table 6.2.5.3-3 Delta TIB (three bands) Anritsu imported from 3GU
R5‑184250 Correction to Test Tolerance for 4DL and 5DL Reference Sensitivity Test Anritsu imported from 3GU
R5‑184251 Editorial correction to 6.6.3.3 Anritsu imported from 3GU
R5‑184252 Correction of connection diagram for 4Rx 3CC/4CC/5CC Rx tests Anritsu imported from 3GU
R5‑184253 Clarify the definition of active time slot in out of band and spurious emission tests Anritsu imported from 3GU
R5‑184254 Editorial correction to test points for CA_2A-12A-66A in 7.3A.5 Anritsu imported from 3GU
R5‑184255 Editorial correction to Reference NPRACH Configuration Anritsu imported from 3GU
R5‑184256 Correction to 5CA FDD-TDD Chapter 8 Tests Anritsu imported from 3GU
R5‑184257 Correction to LAA CSI-RS measurement test Anritsu imported from 3GU
R5‑184258 Editorial correction to LAA Listen-before-talk model Anritsu imported from 3GU
R5‑184259 Correction to connection figure for 4 DL and 5 DL CA Event Triggered Reporting tests Anritsu imported from 3GU
R5‑184260 Correction to cell configuration mapping table for 8.16.70 and 8.16.78 Anritsu imported from 3GU
R5‑184261 Correction to cell configuration mapping for 8.26.3 Anritsu imported from 3GU
R5‑184262 Correction to test procedure for FS3 event triggered reporting tests Anritsu imported from 3GU
R5‑184263 Correction to test requirement of FS3 event triggered reporting tests Anritsu imported from 3GU
R5‑184264 Correction to minimum conformance requirements for FDD_B1 and FDD_B2 Anritsu imported from 3GU
R5‑184265 Editorial correction to Noc for Cell2 on FDD_B1 or FDD_B2 Anritsu imported from 3GU
R5‑184266 Correction of test case title of 8.2.2.5a.2 Huawei,HiSilicon imported from 3GU
R5‑184267 Cleaning up V2X test cases in TS 36.521-1 Huawei,HiSilicon imported from 3GU
R5‑184268 Cleaning up the default message contents and test states of V2X Huawei,HiSilicon imported from 3GU
R5‑184269 Addition of test applicabilities of multiple V2X test cases Huawei,HiSilicon imported from 3GU
R5‑184270 Addition of TT analysis of V2X TC 12.2.1 Huawei,HiSilicon, Anritsu, Rohde & Schwarz imported from 3GU
R5‑184271 Addition of TT analysis of V2X TC 12.2.2 Huawei,HiSilicon, Anritsu, Rohde & Schwarz imported from 3GU
R5‑184272 Addition of TT analysis of V2X TC 12.4 Huawei,HiSilicon, Anritsu, Rohde & Schwarz imported from 3GU
R5‑184273 Addition of V2X new TC 12.2.1 Huawei,HiSilicon, Rohde & Schwarz imported from 3GU
R5‑184274 Addition of V2X new TC 12.2.2 Huawei,HiSilicon, Rohde & Schwarz imported from 3GU
R5‑184275 Addition of V2X new TC 12.4 Huawei,HiSilicon, Rohde & Schwarz imported from 3GU
R5‑184276 Update of Annex F for TC 12.2.1, 12.2.2 and 12.4 Huawei,HiSilicon, Anritsu, Rohde & Schwarz imported from 3GU
R5‑184277 Update of TP analysis of CA_3A-7A-8A Huawei,HiSilicon imported from 3GU
R5‑184278 Addition of TP analysis of CA_1A-7A-8A in 36.905 Huawei,HiSilicon imported from 3GU
R5‑184279 Addition of TP analysis of CA_1A-3A-7A-8A in 36.905 Huawei,HiSilicon imported from 3GU
R5‑184280 Addition of TP analysis of CA_7A-42A-42A in 36.905 Huawei,HiSilicon imported from 3GU
R5‑184281 Addition of TP analysis of CA_20A-42A-42A in 36.905 Huawei,HiSilicon imported from 3GU
R5‑184282 Update of test frequencies for CA_42A-42A Huawei,HiSilicon imported from 3GU
R5‑184283 Correction of test configuration of CA_20A-42A REFSENS Huawei,HiSilicon imported from 3GU
R5‑184284 Update of 7.3A.5 REFSENS for Rel-13 CA configurations Huawei,HiSilicon imported from 3GU
R5‑184285 Addition of REFSENS test configuration of CA_1A-3A-7A-8A Huawei,HiSilicon imported from 3GU
R5‑184286 Addition of multiple CA configurations to capability tables in TS 36.521-2 Huawei,HiSilicon imported from 3GU
R5‑184287 Addition of multiple CA configurations to capability tables in TS 36.523-2 Huawei,HiSilicon imported from 3GU
R5‑184288 Editorial cleaning up of Rel-14 CA 5DL RSRP measurement TC 9.1.51 Huawei,HiSilicon imported from 3GU
R5‑184289 Addition of Rel-13 B5C new TC 8.16.47 Huawei,HiSilicon, Bureau Veritas imported from 3GU
R5‑184290 Addition of Rel-13 B5C new TC 8.16.48 Huawei,HiSilicon, Bureau Veritas imported from 3GU
R5‑184291 Addition of Rel-13 B5C new TC 8.16.49 Huawei,HiSilicon, Bureau Veritas imported from 3GU
R5‑184292 Addition of Rel-13 B5C new TC 8.16.50 Huawei,HiSilicon, Bureau Veritas imported from 3GU
R5‑184293 Update of Annex E and Annex F to add cell mapping and TT for 8.16.47-50 Huawei,HiSilicon imported from 3GU
R5‑184294 Addition of test applicability for Rel-13 B5C new TC 8.16.47-50 Huawei,HiSilicon imported from 3GU
R5‑184295 Discussion on test frequency definition in FR1 Huawei,HiSilicon imported from 3GU
R5‑184296 Update of test frequencies of Band n41 and n77 Huawei,HiSilicon imported from 3GU
R5‑184297 Addition of Mid channel bandwidth definition for several missing bands Huawei,HiSilicon imported from 3GU
R5‑184298 Update of common uplink configuration in 6.1 Huawei,HiSilicon imported from 3GU
R5‑184299 Update of FR1 test case 6.2.1 Huawei,HiSilicon imported from 3GU
R5‑184300 Addition of FR1 test case 6.2.4 Huawei,HiSilicon imported from 3GU
R5‑184301 Update of FR1 test case 6.3.1 Huawei,HiSilicon imported from 3GU
R5‑184302 Update of FR1 test case 6.3.3.2 Huawei,HiSilicon imported from 3GU
R5‑184303 Test Point analysis for FR1 Configured Output Power Huawei,HiSilicon imported from 3GU
R5‑184304 Draft TR 38.903 v0.3.0 Huawei,HiSilicon imported from 3GU
R5‑184305 WP - Support for V2V services based on LTE sidelink Huawei imported from 3GU
R5‑184306 SR - Support for V2V services based on LTE sidelink Huawei imported from 3GU
R5‑184307 WP - Support for V2X services Huawei imported from 3GU
R5‑184308 SR - Support for V2X services Huawei imported from 3GU
R5‑184309 WP - LTE Carrier Aggregation Enhancement Beyond 5 Carriers: PUCCH on Scell Huawei imported from 3GU
R5‑184310 SR - LTE Carrier Aggregation Enhancement Beyond 5 Carriers: PUCCH on Scell Huawei imported from 3GU
R5‑184311 WP - Rel-14 eNB-IoT Huawei imported from 3GU
R5‑184312 SR - Rel-14 eNB-IoT Huawei imported from 3GU
R5‑184313 Demodulation test case 8.11.1.1.1 and 8.11.1.1.2 updated for category M2 Ericsson imported from 3GU
R5‑184314 Update of Test Tolerance analyses for TDD-FDD CA PDSCH Closed Loop Single Layer Spatial Multiplexing 2x4 with TM4 Interference Model-Enhanced Performance Requirement Type A (2DL CA) LG Electronics imported from 3GU
R5‑184315 Update of Test Tolerance analyses for TDD-FDD CA PDSCH Single-layer Spatial Multiplexing 2x4 on antenna ports 7 or 8 with TM9 Interference Model-Enhanced Performance Requirement Type A (2DL CA) LG Electronics imported from 3GU
R5‑184316 Update of TDD-FDD CA PDSCH Closed Loop Single Layer Spatial Multiplexing 2x4 with TM4 Interference Model-Enhanced Performance Requirement Type A (2DL CA) LG Electronics imported from 3GU
R5‑184317 Update of TDD-FDD CA PDSCH Single-layer Spatial Multiplexing 2x4 on antenna ports 7 or 8 with TM9 Interference Model-Enhanced Performance Requirement Type A (2DL CA) LG Electronics imported from 3GU
R5‑184318 Correct IE GSCN-ValueNR Ericsson imported from 3GU
R5‑184319 WP - UE Conformance Test Aspects - 450 MHz Band for LTE in Region 3(UID-790058) China Unicom imported from 3GU
R5‑184320 SR - UE Conformance Test Aspects - 450 MHz Band for LTE in Region 3 for RAN5#80 China Unicom imported from 3GU
R5‑184321 SR - LTE_QMC_Streaming-UEConTest(UID-790051) for RAN5#80 China Unicom imported from 3GU
R5‑184322 Correction to NB-IoT test cases 22.4.8 and 22.4.9 ANRITSU LTD imported from 3GU
R5‑184323 Correction to SSAC connected mode test cases 13.5.1a and 13.5.3a for IMS Enabled UE Keysight Technologies UK Ltd imported from 3GU
R5‑184324 Addition of 5GS NR SDAP test case 7.1.4.1 ROHDE & SCHWARZ imported from 3GU
R5‑184325 36.521-2 updates for category M2 test cases Ericsson imported from 3GU
R5‑184326 New test case: 6.2.3A.3_2, Maximum Power Reduction (MPR) for CA (intra-band non-contiguous DL CA and UL CA) for UL 256QAM Ericsson imported from 3GU
R5‑184327 Adding condition for CP-OFDM waveform Ericsson imported from 3GU
R5‑184328 WP - UE Conformance Test Aspects - Add UE Power Class 2 to band 41 intra-band contiguous LTE Carrier Aggregation Sprint Corporation imported from 3GU
R5‑184329 SR - UE Conformance Test Aspects - Add UE Power Class 2 to band 41 intra-band contiguous LTE Carrier Aggregation Sprint Corporation imported from 3GU
R5‑184330 Adding support for test SCS definition Ericsson imported from 3GU
R5‑184331 Correction to Idle mode Inter-RAT G<>E test case 6.2.3.21 to allow optional IMS registration on EUTRAN cell Keysight Technologies UK Ltd imported from 3GU
R5‑184332 Test Frequencies Sprint Corporation imported from 3GU
R5‑184333 Updates to Annex B MCC TF160 imported from 3GU
R5‑184334 New Work Item Proposal: UE Conformance Test Aspects - Addition of Power Class 1 UE to bands B31/B72 for LTE Airbus DS SLC imported from 3GU
R5‑184335 Band 41 HPUE Maximum Output Power CMCC imported from 3GU
R5‑184336 Correction of applicability to TS 36.521-2 for HPUE RF test cases CMCC imported from 3GU
R5‑184337 New WID on UE Conformance Test Aspects - ProSe Support for Band 72 in LTE Airbus DS SLC imported from 3GU
R5‑184338 Correction to 5GS MAC Test case 7.1.1.1.2 Random access procedure / Successful / C-RNTI Based / Preamble selected by MAC itself Qualcomm Korea imported from 3GU
R5‑184339 Update of FR1 signal levels ANRITSU LTD imported from 3GU
R5‑184340 Correction to 5GS MAC Test case 7.1.1.5.3 DRX operation / Short cycle configured / Parameters configured by RRC Qualcomm Korea imported from 3GU
R5‑184341 Correction to 5GS RLC Test case 7.1.2.3.10 AM RLC / Re-transmission of RLC PDU with and without re-segmentation Qualcomm Korea imported from 3GU
R5‑184342 Correction to 5GS RLC Test case 7.1.2.3.11 AM RLC / RLC re-establishment procedure Qualcomm Korea imported from 3GU
R5‑184343 Correction to 5GS PDCP Test case 7.1.3.4.1 PDCP handover / Lossless handover / PDCP sequence number maintenance / PDCP status report to convey the information on missing or acknowledged PDCP SDUs at handover / In-order delivery and duplicate eliminat Qualcomm Korea imported from 3GU
R5‑184344 Correction to 5GS PDCP Test case 7.1.3.5.4 PDCP reordering / Maximum re-ordering delay below t-Reordering / t-Reordering timer operations Qualcomm Korea imported from 3GU
R5‑184345 Addition of NR CA / NR SCell addition / modification / release / Success test cases 8.2.4.1.1.1, 8.2.4.1.1.2 and 8.2.4.1.1.3 Qualcomm Korea imported from 3GU
R5‑184346 Modified RRC_Connected procedure for Multi PDN throughout the test case. Qualcomm Korea imported from 3GU
R5‑184347 Modified RRC_IDLE procedure to allow multi PDN configuration throughout the test case Qualcomm Korea imported from 3GU
R5‑184348 Update EN-DC Generic Procedure Parameter for Multi-PDN addition throughout Test Case Qualcomm Korea imported from 3GU
R5‑184349 Modification of EPS & Data Radio Bearer ID mapping for EN-DC Test cases Qualcomm Korea imported from 3GU
R5‑184350 Multi-PDN Handling in EN-DC Qualcomm Korea imported from 3GU
R5‑184351 ASN.1 Version Handling for NSA and SA Qualcomm Korea imported from 3GU
R5‑184352 Addition of Test frequency for EN-DC B1_n78 Qualcomm Korea imported from 3GU
R5‑184353 Corrections to RRC TC - BandwidthPart Configuration / SCG / EN-DC Qualcomm Tech. Netherlands B.V imported from 3GU
R5‑184354 Corrections to RRC TC - PSCell addition, modification and release / SCG DRB / EN-DC Qualcomm Tech. Netherlands B.V imported from 3GU
R5‑184355 Corrections to RRC TC - Bearer Modification / Handling for bearer type change with security key change / EN-DC Qualcomm Tech. Netherlands B.V imported from 3GU
R5‑184356 Corrections to RRC TC - Bearer Modification / Uplink data path / Split DRB Reconfiguration / EN-DC Qualcomm Tech. Netherlands B.V imported from 3GU
R5‑184357 Corrections to RRC TC - Measurement configuration control and reporting / Inter-RAT measurements / Event B1 / Measurement of NR cells / EN-DC Qualcomm Tech. Netherlands B.V imported from 3GU
R5‑184358 Addition of IP Connectivity check procedure Qualcomm Tech. Netherlands B.V imported from 3GU
R5‑184359 Handling of Unified Access Control test cases in SA Qualcomm Tech. Netherlands B.V imported from 3GU
R5‑184360 Test Engineer TEOCO imported from 3GU
R5‑184361 Discussion_38.521-3_ApplicabilityRules Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑184362 FR2_38.521-3_Applicability_SpuriousEmissions Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑184363 FR2_38.522_Applicability_SpuriousEmissions Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑184364 Discussion_FR2_EVM_UBF_usage Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑184365 Discussion_FR2_RefSens_RSRP_vs_EIS Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑184366 Discussion_FR2_RefSens_TestPointAnalysis Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑184367 FR2_RefSens_TestConfig_38.521-2 Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑184368 Discussion_FR2_StoreTxRxBeamPeakCoordinates Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑184369 FR2_StoreTxRxBeamPeakCoordinates_38.521-2 Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑184370 FR2_StoreTxRxBeamPeakCoordinates_38.521-3 Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑184371 FR2_TxSpurious_TestPointAnalysis Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑184372 FR2_TxSpurious_TestConfig_38.521-2 Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑184373 FR2_UE_BeamlockInvoke_38.521-2 Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑184374 Update of TC 8.9.1.2.2_1 TDD PDSCH Closed Loop Single Layer Spatial Multiplexing for UE category 1bis CAICT imported from 3GU
R5‑184375 Introduction of TC 6.1.1_2 E-UTRAN FDD Intra-frequency RRC Re-establishment for UE Category 1bis CAICT imported from 3GU
R5‑184376 Introduction of TC 6.1.2_2 E-UTRAN FDD Inter-frequency RRC Re-establishment for UE Category 1bis CAICT imported from 3GU
R5‑184377 Introduction of TC 6.1.3_2 E-UTRAN TDD Intra-frequency RRC Re-establishment for UE Category 1bis CAICT imported from 3GU
R5‑184378 Introduction of TC 6.1.4_2 E-UTRAN TDD Inter-frequency RRC Re-establishment for UE Category 1bis CAICT imported from 3GU
R5‑184379 Annex E,F RRM Cat1bis 6.1.x tests CAICT imported from 3GU
R5‑184380 New feMTC test case 7.5EC Adjacent Channel Selectivity (ACS) for UE category M2 CAICT imported from 3GU
R5‑184381 New feMTC test case 7.6.1EC In-band blocking for UE category M2 CAICT imported from 3GU
R5‑184382 New feMTC test case 7.6.3EC Narrow band blocking for UE category M2 CAICT imported from 3GU
R5‑184383 New feMTC test case 7.8.1EC Wide band intermodulation for UE category M2 CAICT imported from 3GU
R5‑184384 Update of Annexes F.1.3 and F.3.3 CAICT imported from 3GU
R5‑184385 Update of TC 6.6.2.3A.4 Adjacent Channel Leakage power Ratio for CA (3UL CA) CAICT imported from 3GU
R5‑184386 WP UE Conformance Test Aspects - FDD operating band in the L-band for LTE NTT DOCOMO, INC. imported from 3GU
R5‑184387 SR UE Conformance Test Aspects - FDD operating band in the L-band for LTE NTT DOCOMO, INC. imported from 3GU
R5‑184388 Update of TC 6.6.3.1A.4 Transmitter Spurious emissions for CA ( 3UL CA) CAICT imported from 3GU
R5‑184389 Addition of Band 74 information into TS 34.121-1 NTT DOCOMO, INC. imported from 3GU
R5‑184390 Updates of Band 74 information about Tx test cases in TS 36.521-1 NTT DOCOMO, INC. imported from 3GU
R5‑184391 WP - LTE_QMC_Streaming-UEConTest (UID-790051) China Unicom imported from 3GU
R5‑184392 Updates of FR1 TRx MU in Annex F NTT DOCOMO, INC. imported from 3GU
R5‑184393 Updates of 6.2.3.2 Test Frequency for CA_8A-27A KT Corp. imported from 3GU
R5‑184394 Proposal on Test Tolerance table format in TS 38.521-1 Annex F NTT DOCOMO, INC. imported from 3GU
R5‑184395 Updates of FR1 TRx TT in Annex F NTT DOCOMO, INC. imported from 3GU
R5‑184396 New CA band combination CA_8A-27A - Updates of 7.3A Refsens KT Corp. imported from 3GU
R5‑184397 Proposal on MU and TT table format in TS 38.521-2 NTT DOCOMO, INC. imported from 3GU
R5‑184398 Updates of FR2 TRx MU and TT in Annex NTT DOCOMO, INC. imported from 3GU
R5‑184399 New CA band combination CA_8A-27A - Updates of Table A.4.3.3.3-3 KT Corp. imported from 3GU
R5‑184400 MU and TT of EN-DC test cases in TS 38.521-3 NTT DOCOMO, INC. imported from 3GU
R5‑184401 New CA band combination CA_8A-27A - Updates of Table A.4.6.3-3 KT Corp. imported from 3GU
R5‑184402 Addition of TRx MU and TT in TS 38.521-3 Annex NTT DOCOMO, INC. imported from 3GU
R5‑184403 New test case 6.3.5FA.1 Power Control Absolute power tolerance for category NB1 and NB2/Power Class 6 CAICT imported from 3GU
R5‑184404 Correction of 6.2.3.2 Test Frequency for CA_3A-27A KT Corp. imported from 3GU
R5‑184405 New test case 6.3.5FA.2 Power Control Relative power tolerance for category NB1 and NB2/Power Class 6 CAICT imported from 3GU
R5‑184406 New test case 6.3.5FA.3 Aggregate power control tolerance for category NB1 and NB2/Power Class 6 CAICT imported from 3GU
R5‑184407 Discussion on the structure of Clause 7.3A Reference sensitivity for CA in TS 38.521-1 CMCC, Huawei imported from 3GU
R5‑184408 Discussion on the structure of Clause 7.7A Spurious response for CA in TS 38.521-1 CMCC, Huawei imported from 3GU
R5‑184409 Addition of TT analysis of V2X TC 12.2.1 Huawei,HiSilicon, Anritsu, Rohde & Schwarz imported from 3GU
R5‑184410 Addition of TT analysis of V2X TC 12.2.2 Huawei,HiSilicon, Anritsu, Rohde & Schwarz imported from 3GU
R5‑184411 Addition of TT analysis of V2X TC 12.4 Huawei,HiSilicon, Anritsu, Rohde & Schwarz imported from 3GU
R5‑184412 Update to test case 6.5.2A.1.4 for 3UL CA KTL imported from 3GU
R5‑184413 Update to test case 6.5.2A.2.4 for 3UL CA KTL imported from 3GU
R5‑184414 Update to test case 6.5.2A.3.4 for 3UL CA KTL imported from 3GU
R5‑184415 Update to test case 7.6.3A.8 and 7.8.1A.8 for 5DL CA KTL imported from 3GU
R5‑184416 Cleanning up SDR test cases for 4CC and 5CC using UL RMC KTL imported from 3GU
R5‑184417 Update to Performance test cases for LTE DL CA 4 Rx antenna ports KTL imported from 3GU
R5‑184418 Update to test case 6.3.2G.1 for V2V services based on LTE sidelink KTL imported from 3GU
R5‑184419 Update to test case 6.3.2G.2 for LTE-based V2X Services KTL imported from 3GU
R5‑184420 Update to test case 6.3.2G.3 for LTE-based V2X Services KTL imported from 3GU
R5‑184421 Update to RRM test case 8.16.70 and 8.16.74 for 5DL CA KTL imported from 3GU
R5‑184422 Treatment of power supply cable for FR2 UE tests Anritsu imported from 3GU
R5‑184423 Meeting notes of offline call on FR2 UE common test setup Anritsu imported from 3GU
R5‑184424 Common test setup for FR2 measurement uncertainty estimation Anritsu imported from 3GU
R5‑184425 Testability issue of maximum input level and ACS (case 2) in FR2 Anritsu imported from 3GU
R5‑184426 Estimation of measurement uncertainty for FR2 TRx test cases Anritsu imported from 3GU
R5‑184427 Removing brackets from MU values in FR2 Anritsu imported from 3GU
R5‑184428 TP to remove editor's note on frequency range of Tx Spurious emission Anritsu imported from 3GU
R5‑184429 Offset in quality of quiet zone evaluation Anritsu imported from 3GU
R5‑184430 TP on common test setup in FR2 Anritsu imported from 3GU
R5‑184431 Testability issue of low PSD test cases in FR2 Anritsu imported from 3GU
R5‑184432 New WID for Rel-16 LTE CA Ericsson imported from 3GU
R5‑184433 GCF 3GPP TCL after GCF CAG#55 Ericsson imported from 3GU
R5‑184434 RAN5#80 summary of changes to RAN5 test cases with potential impact on GCF and PTCRB Ericsson, Samsung imported from 3GU
R5‑184435 WP UE Conformance Test Aspects - Increasing the minimum number of carriers for UE monitoring in UTRA and E-UTRA Ericsson imported from 3GU
R5‑184436 SR UE Conformance Test Aspects - Increasing the minimum number of carriers for UE monitoring in UTRA and E-UTRA Ericsson imported from 3GU
R5‑184437 WP UE Conformance Test Aspects - Rel-13 CA configurations Ericsson imported from 3GU
R5‑184438 SR UE Conformance Test Aspects - Rel-13 CA configurations Ericsson imported from 3GU
R5‑184439 WP UE Conformance Test Aspects - Rel-14 CA configurations Ericsson imported from 3GU
R5‑184440 SR UE Conformance Test Aspects - Rel-14 CA configurations Ericsson imported from 3GU
R5‑184441 WP UE Conformance Test Aspects - Rel-15 CA configurations Ericsson imported from 3GU
R5‑184442 SR UE Conformance Test Aspects - Rel-15 CA configurations Ericsson imported from 3GU
R5‑184443 WP UE Conformance Test Aspects - 5G system with NR and LTE Ericsson imported from 3GU
R5‑184444 SR UE Conformance Test Aspects - 5G system with NR and LTE Ericsson imported from 3GU
R5‑184445 Update of RAN5 5G NR phases and target update RAN5#80 Ericsson imported from 3GU
R5‑184446 Revised WID on: UE Conformance Test Aspects - 5G system with NR and LTE Ericsson imported from 3GU
R5‑184447 3GPP RAN5 CA status list (pre-RAN5#80 meeting) Ericsson imported from 3GU
R5‑184448 3GPP RAN5 CA status list (post-RAN5#80 meeting) Ericsson imported from 3GU
R5‑184449 Discussion paper on principles for defining NR test frequencies and selecting associated parameters for SS to signal Ericsson imported from 3GU
R5‑184450 Introduction of test frequencies for NR band n1 Ericsson imported from 3GU
R5‑184451 Introduction of test frequencies for NR band n2 Ericsson imported from 3GU
R5‑184452 Introduction of test frequencies for NR band n3 Ericsson imported from 3GU
R5‑184453 Introduction of test frequencies for NR band n5 Ericsson imported from 3GU
R5‑184454 Introduction of test frequencies for NR band n7 Ericsson imported from 3GU
R5‑184455 Introduction of test frequencies for NR band n8 Ericsson imported from 3GU
R5‑184456 Introduction of test frequencies for NR band n12 Ericsson imported from 3GU
R5‑184457 Introduction of test frequencies for NR band n20 Ericsson imported from 3GU
R5‑184458 Introduction of test frequencies for NR band n25 Ericsson imported from 3GU
R5‑184459 Introduction of test frequencies for NR band n28 Ericsson imported from 3GU
R5‑184460 Introduction of test frequencies for NR band n34 Ericsson imported from 3GU
R5‑184461 Introduction of test frequencies for NR band n38 Ericsson imported from 3GU
R5‑184462 Introduction of test frequencies for NR band n39 Ericsson imported from 3GU
R5‑184463 Introduction of test frequencies for NR band n40 Ericsson imported from 3GU
R5‑184464 Update of test frequencies for NR band n41 Ericsson, Sprint imported from 3GU
R5‑184465 Introduction of test frequencies for NR band n51 Ericsson imported from 3GU
R5‑184466 Introduction of test frequencies for NR band n66 Ericsson, Dish Network imported from 3GU
R5‑184467 Introduction of test frequencies for NR band n70 Ericsson, Dish Network imported from 3GU
R5‑184468 Update of test frequencies for NR band n71 Ericsson, Dish Network imported from 3GU
R5‑184469 Introduction of test frequencies for NR band n75 Ericsson imported from 3GU
R5‑184470 Introduction of test frequencies for NR band n76 Ericsson imported from 3GU
R5‑184471 Introduction of test frequencies for NR band n77 Ericsson imported from 3GU
R5‑184472 Introduction of test frequencies for NR band n78 Ericsson imported from 3GU
R5‑184473 Introduction of test frequencies for NR band n79 Ericsson imported from 3GU
R5‑184474 Introduction of test frequencies for NR band n257 Ericsson imported from 3GU
R5‑184475 Introduction of test frequencies for NR band n258 Ericsson imported from 3GU
R5‑184476 Introduction of test frequencies for NR band n260 Ericsson, Bureau Veritas imported from 3GU
R5‑184477 Introduction of test frequencies for NR band n261 Ericsson imported from 3GU
R5‑184478 Introduction of test frequencies for signalling testing in clause 6 Ericsson imported from 3GU
R5‑184479 Update to FR1 test case 6.5.4 Transmit intermodulation KTL imported from 3GU
R5‑184480 New test case 6.5.2.1FA.1 Error Vector Magnitude (EVM) for category NB1 and NB2/Power Class 6 CAICT imported from 3GU
R5‑184481 New test case 6.5.2.2FA Carrier leakage for category NB1 and NB2/Power Class 6 CAICT imported from 3GU
R5‑184482 New test case 6.5.2.3FA In-band emissions for non allocated RB for category NB1 and NB2/Power Class 6 CAICT imported from 3GU
R5‑184483 Add and use reference to NG.108 ROHDE & SCHWARZ, Qualcomm Incorporated imported from 3GU
R5‑184484 Proposal for remaining Maximum Test System Uncertainty for NR FR1 TRx tests Anritsu, ROHDE & SCHWARZ imported from 3GU
R5‑184485 Test approach of EN-DC Rx tests with multiple LTE/NR CCs Anritsu imported from 3GU
R5‑184486 Correction to power level for FR1 RF tests Anritsu imported from 3GU
R5‑184487 Discussion on FR2 TRx spurious test procedure Anritsu imported from 3GU
R5‑184488 Discussion on UL RMC for FR2 spurious test Anritsu imported from 3GU
R5‑184489 Discussion on test point selection for NR Out-of-band in FR1 CAICT imported from 3GU
R5‑184490 Introduction of TC 7.6.3 Out-of-band blocking CAICT imported from 3GU
R5‑184491 Clean up EN-DC FR1 TRx TCs Anritsu imported from 3GU
R5‑184492 Add Test Tolerance and Annex F for NAICS feature applicable in test case 8.3.1.1.7 and 8.3.2.1.8. TEOCO imported from 3GU
R5‑184493 Correction of NB-IoT test case 22.5.20 CATT, TDIA imported from 3GU
R5‑184494 Correction of NB-IoT test case 22.5.21 CATT, TDIA imported from 3GU
R5‑184495 Addition of new 5GC TC 9.1.2.1 CATT, TDIA imported from 3GU
R5‑184496 Addition of applicability and tests conditions for 5GC test cases 8.2.4.3.1.2, 8.2.4.3.1.3, 9.1.2.1 and 9.1.2.2 CATT, TDIA imported from 3GU
R5‑184497 Discussion on Uplink configuration for NR Transmit Intermodulation in FR1 KTL imported from 3GU
R5‑184498 Correction to 5GS RRC TC 8.2.4.3.1.1 TDIA, CATT imported from 3GU
R5‑184499 Addition of 5GS RRC TC 8.2.4.3.1.2 TDIA, CATT imported from 3GU
R5‑184500 Addition of new 5GS RRC TC 8.2.4.3.1.3 TDIA, CATT imported from 3GU
R5‑184501 Addition to NB-IoT testcase 22.3.1.6a TDIA, CATT, Starpoint imported from 3GU
R5‑184502 Addition of antenna diagrams for IncMon RRM test cases Ericsson imported from 3GU
R5‑184503 Update of number of DL PDCP SDUs in test cases 7.1.7.1.x MediaTek Inc. imported from 3GU
R5‑184504 Update of DL 256QAM TCs for high UE DL Categories MediaTek Inc. imported from 3GU
R5‑184505 Correction to RRC TC 8.5.4.1 MediaTek Inc. imported from 3GU
R5‑184506 Correction to RRC TC 8.5.4.3 MediaTek Inc. imported from 3GU
R5‑184507 Correction to EMM TC 9.2.1.1.24 MediaTek Inc. imported from 3GU
R5‑184508 Correction to ESM TC 10.5.4 MediaTek Inc. imported from 3GU
R5‑184509 Handling on TT defining from MU in FR2 NTT DOCOMO, INC. imported from 3GU
R5‑184510 Correction to CSFB TC 13.1.12 MediaTek Inc. imported from 3GU
R5‑184511 Updates of receiver test cases for CA_XA-YE NTT DOCOMO, INC. imported from 3GU
R5‑184512 Correction to applicability of TC 7.1.7.1.6a MediaTek Inc. imported from 3GU
R5‑184513 Correction to applicability of DL 256QAM TCs MediaTek Inc. imported from 3GU
R5‑184514 Editorial correction of referred table number MediaTek Inc. imported from 3GU
R5‑184515 Addition of message content for RRM IncMon test cases Ericsson imported from 3GU
R5‑184516 Updates of receiver test cases for CA_XA-YD NTT DOCOMO, INC. imported from 3GU
R5‑184517 Correction to NR PDCP test case 7.1.3.4.2 Keysight Technologies UK Ltd, MCC TF160 imported from 3GU
R5‑184518 Correction to NB-IoT test case 22.2.9 ANRITSU LTD imported from 3GU
R5‑184519 Addition of applicability of RRM IncMon test cases Ericsson imported from 3GU
R5‑184520 Corrections to Layer 2 test cases Motorola Mobility imported from 3GU
R5‑184521 Corrections to MAC test case 7.1.2.2.1 Motorola Mobility and MCC TF160 imported from 3GU
R5‑184522 Corrections to MAC test case 7.1.2.3.1 Motorola Mobility and MCC TF160 imported from 3GU
R5‑184523 Corrections to MAC TBS test cases Motorola Mobility imported from 3GU
R5‑184524 Addition of new MAC RACH test case for PDCCH order Motorola Mobility imported from 3GU
R5‑184525 Addition of new MAC test case for Power Headroom report Motorola Mobility imported from 3GU
R5‑184526 Addition of new MAC test case for Scell Activation Deactivation Motorola Mobility imported from 3GU
R5‑184527 Addition of new MAC test case for Reset Motorola Mobility imported from 3GU
R5‑184528 Addition of new MAC UL TBS test case with transform precoding configured Motorola Mobility imported from 3GU
R5‑184529 WP UE Conformance Test Aspects – 5G System Non-3GPP Access Motorola Mobility imported from 3GU
R5‑184530 SR UE Conformance Test Aspects – 5G System Non-3GPP Access Motorola Mobility imported from 3GU
R5‑184531 Addition of missing and new test cases applicabilities Motorola Mobility imported from 3GU
R5‑184532 Correction to testcase 9.2.2.1.9 for CAT-M1 UEs ROHDE & SCHWARZ, Qualcomm Incorporated imported from 3GU
R5‑184533 PRD-17 on Guidance to Work Item Codes version 3.13 (post RAN#81 version) Rapporteur (BlackBerry) imported from 3GU
R5‑184534 TS 36.523-1 Status before RAN5#80 Rapporteur (BlackBerry) imported from 3GU
R5‑184535 TS 36.523-1 Status after RAN5#80 Rapporteur (BlackBerry) imported from 3GU
R5‑184536 Correction to testcases 9.2.1.2.1c and 9.2.1.2.1d applicability conditions for CAT-M1 UEs ROHDE & SCHWARZ, Qualcomm Incorporated imported from 3GU
R5‑184537 Proposal for Work Plans BlackBerry imported from 3GU
R5‑184538 Correction to testcases 6.1.1.1, 6.1.1.1b and applicability conditions for CAT-M1 UEs ROHDE & SCHWARZ, Qualcomm Incorporated imported from 3GU
R5‑184539 Update of DL256QAM RF test cases 7.4A.7_H,7.4A.8_H,8.7.1.1_H.4 and 8.7.1.1_H.5 SRTC imported from 3GU
R5‑184540 Update MU and TT of V2X test case 6.5.1G.2 Frequency error for V2X Communication / Simultaneous E-UTRA V2X sidelink and E-UTRA uplink transmissions CAICT imported from 3GU
R5‑184541 Correction to eMTC tc 6.2.2EA, UE Maximum Output Power for UE category M1 Ericsson imported from 3GU
R5‑184542 Applicability for DL256QAM RF test cases 7.4A.7_H,7.4A.8_H,8.7.1.1_H.4 and 8.7.1.1_H.5 SRTC imported from 3GU
R5‑184543 Correction to CAT-M1 Test case 8.2.4.27 Anritsu Ltd., Nordic Semiconductor ASA imported from 3GU
R5‑184544 Update of V2X test case 6.7G.2 SRTC imported from 3GU
R5‑184545 Addition of new TC 6.6.2.3G.2 SRTC imported from 3GU
R5‑184546 Introduction of new V2X test case 6.5.2.1G.2 Error Vector Magnitude (EVM) for V2X Communication / Simultaneous E-UTRA V2X sidelink and E-UTRA uplink transmissions CAICT imported from 3GU
R5‑184547 TS 36.523-1 Status after RAN5#80 Rapporteur (BlackBerry) imported from 3GU
R5‑184548 Introduction of new V2X test case 6.5.2.1G.3 Error Vector Magnitude (EVM) for V2X Communication / Intra-band contiguous multi-carrier operation CAICT imported from 3GU
R5‑184549 Correction to V2X TC 24.1.2, 24.1.16 & 24.1.19 ROHDE & SCHWARZ, Qualcomm Incorporated imported from 3GU
R5‑184550 Draft TS 38.521-2 v0.6.0 CAICT imported from 3GU
R5‑184551 Correction to MAC test cases with TB Size selection ANRITSU LTD imported from 3GU
R5‑184552 Correction to default pre-test conditions for UM RLC test cases Keysight Technologies UK Ltd imported from 3GU
R5‑184553 Update of (NS_01/NS_17), (NS_03/NS_07), (NS_05/NS_01) and (NS_05/NS_17) TP analysis for A-MPR test case for inter-band UL CA CETECOM GmbH imported from 3GU
R5‑184554 Correction of test points and test requirements for TC 6.2.4A.2 CETECOM GmbH imported from 3GU
R5‑184555 Correction of test points and test requirements for TC 6.2.4A.2_1 CETECOM GmbH imported from 3GU
R5‑184556 Addition of new UL 256QAM test case - A-MPR for 2UL CA intra-band contiguous CETECOM GmbH imported from 3GU
R5‑184557 Addition of new UL 256QAM test case - A-MPR for 2UL CA inter-band CETECOM GmbH imported from 3GU
R5‑184558 Addition of new UL 256QAM test case - Annex F CETECOM GmbH imported from 3GU
R5‑184559 Updates to feMTC tc 6.2.2EC UE Maximum Output Power for UE category M2 Ericsson imported from 3GU
R5‑184560 Introduce SA radio resource control information elements Ericsson imported from 3GU
R5‑184561 WP - UE Conformance Test Aspects - eHST CMCC imported from 3GU
R5‑184562 SR - eHST after RAN5#80 CMCC imported from 3GU
R5‑184563 Add Clause 7.5B.1 into TS 38.521-3 CMCC imported from 3GU
R5‑184564 Add Clause 7.5B.2 into TS 38.521-3 CMCC imported from 3GU
R5‑184565 Add Clause 7.5B.3 into TS 38.521-3 CMCC imported from 3GU
R5‑184566 Draft TS 36.579-7 v0.0.1 Samsung imported from 3GU
R5‑184567 Draft TS 38.522 v1.0.1 CMCC imported from 3GU
R5‑184568 OTA Chamber requirements for 5G NR Signalling test cases Keysight Technologies UK Ltd imported from 3GU
R5‑184569 Add Band 31 Test Frequencies for NB-IoT Inter-frequency Test cases ANRITSU LTD imported from 3GU
R5‑184570 Corrections for 5MHz Channel BW in 4.2.19, 6.x.y and 7.3.x NB-IoT Test cases ANRITSU LTD imported from 3GU
R5‑184571 Draft TS 36.579-6 v0.0.1 Samsung imported from 3GU
R5‑184572 General clauses updated for TS38.521-1 Bureau Veritas imported from 3GU
R5‑184573 DL and UL RMC updated for FR1 tests Bureau Veritas imported from 3GU
R5‑184574 Downlink physical channel updated for FR1 tests Huawei, Bureau Veritas imported from 3GU
R5‑184575 OCNG Patterns updated for FR1 tests Bureau Veritas imported from 3GU
R5‑184576 DL and UL RMC updated for FR2 tests Bureau Veritas imported from 3GU
R5‑184577 Downlink physical channel updated for FR2 tests Bureau Veritas imported from 3GU
R5‑184578 OCNG Patterns updated for FR2 tests Bureau Veritas imported from 3GU
R5‑184579 Updated EN-DC configuration information in clause 5 Bureau Veritas imported from 3GU
R5‑184580 TIB value add for EN-DC band in 38.521-3 Bureau Veritas imported from 3GU
R5‑184581 Applicability C20 updated for intra-band contigous DL CA tests Bureau Veritas imported from 3GU
R5‑184582 Updated to Tested CA Configurations Selection Criteria Bureau Veritas imported from 3GU
R5‑184583 Table format correct and removed redundant line for RF clause 7 test cases Bureau Veritas imported from 3GU
R5‑184584 Table format correct and removed redundant line for RF clause 6 test cases Bureau Veritas imported from 3GU
R5‑184585 Updated test requirement to RF clause 7 test cases for CA band Bureau Veritas imported from 3GU
R5‑184586 Align CA information in clause 5 with TS36.101 v15.3.0 Bureau Veritas imported from 3GU
R5‑184587 Addition of new R15 CA configurations to 36.521-2 Bureau Veritas imported from 3GU
R5‑184588 Addition of new R15 CA configurations to 36.523-2 Bureau Veritas, Ericsson imported from 3GU
R5‑184589 Addition of RRM IncMon new Test Case 8.4.8 Ericsson imported from 3GU
R5‑184590 Addition of RRM IncMon new Test Case 8.4.9 Ericsson imported from 3GU
R5‑184591 New NAS test case 9.1.5.1.12 ROHDE & SCHWARZ imported from 3GU
R5‑184592 WP UE Conformance Test Aspects – enhanced Licensed-Assisted Access using LTE Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑184593 New NAS test case 9.1.6.1.4 ROHDE & SCHWARZ imported from 3GU
R5‑184594 SR UE Conformance Test Aspects – enhanced Licensed-Assisted Access using LTE Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑184595 WID Update UE Conformance Test Aspects – enhanced Licensed-Assisted Access using LTE Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑184596 Correction to NB-IoT test case 22.4.20a execution guideline Anritsu Ltd, Qualcomm imported from 3GU
R5‑184597 Update IE PhysicalCellGroupConfig Ericsson imported from 3GU
R5‑184598 Introduce cell configurations and timer tolerances chapter headers Ericsson imported from 3GU
R5‑184599 Add IE SS-RSSI-Measurement Ericsson imported from 3GU
R5‑184600 Add IE SSB-MTC Ericsson imported from 3GU
R5‑184601 Introduction of new test case TC 6.2.5A.4 Configured UE transmitted Output Power for CA (3UL CA) 7LAYERS GmbH imported from 3GU
R5‑184602 Introduction of new test case TC 6.6.2.1A.4^^Spectrum emission mask for CA (3UL CA) 7LAYERS GmbH imported from 3GU
R5‑184603 Correction to NR PDCP test case 7.1.3.5.1 ANRITSU LTD imported from 3GU
R5‑184604 Introduction of new test case TC 6.6.2.2A.4^^Additional Spectrum Emission Mask for CA (3UL CA) 7LAYERS GmbH imported from 3GU
R5‑184605 Update of test case TC 6.6.1A.4 “Occupied bandwidth for CA (3DL CA and 3UL CA)” 7LAYERS GmbH imported from 3GU
R5‑184606 Update of test case TC 6.7A.4 "Transmit intermodulation for CA (3DL CA and 3UL CA)" 7LAYERS GmbH imported from 3GU
R5‑184607 Draft TS 36.579-6 v0.0.2 NIST imported from 3GU
R5‑184608 Draft TS 36.579-7 v0.0.2 NIST imported from 3GU
R5‑184609 SR - UE Conformance Test Aspects - Mission Critical Improvements (UID - 790052) MCImp-UEConTest NIST imported from 3GU
R5‑184610 WP - UE Conformance Test Aspects - Mission Critical Improvements (UID - 790052) MCImp-UEConTest.doc NIST imported from 3GU
R5‑184611 New Test Case for 36.579-6 - 6.1.1.8 NIST imported from 3GU
R5‑184612 Correction to NR RLC test case 7.1.2.3.3 and 7.1.2.3.4 ANRITSU LTD imported from 3GU
R5‑184613 Addition of RRC Default Pre-test conditions for NSA Qualcomm Korea imported from 3GU
R5‑184614 Updates to EN-DC Conditions for Multi-PDN addition throughout Test Case Qualcomm Korea imported from 3GU
R5‑184615 CR of Correct handling of DL assignment / Semi-persistent test case 7.1.1.6.1 Huawei, Hisilicon imported from 3GU
R5‑184616 Update BWP DOCOMO Communications Lab, Ericsson imported from 3GU
R5‑184617 Update MIB DOCOMO Communications Lab. imported from 3GU
R5‑184618 Update PDSCH-Config DOCOMO Communications Lab. imported from 3GU
R5‑184619 Update PhysicalCellGroupConfig DOCOMO Communications Lab. imported from 3GU
R5‑184620 Update PUCCH and PUSCH configuration DOCOMO Communications Lab. imported from 3GU
R5‑184621 Update RACH configuration DOCOMO Communications Lab. imported from 3GU
R5‑184622 Update SearchSpace DOCOMO Communications Lab. imported from 3GU
R5‑184623 Update CellGroupConfig DOCOMO Communications Lab. imported from 3GU
R5‑184624 Update CSI-MeasConfig DOCOMO Communications Lab. imported from 3GU
R5‑184625 Update MeasConfig DOCOMO Communications Lab. imported from 3GU
R5‑184626 Update other information elements DOCOMO Communications Lab. imported from 3GU
R5‑184627 Update PDCCH-Config DOCOMO Communications Lab. imported from 3GU
R5‑184628 Update RadioBearerConfig DOCOMO Communications Lab. imported from 3GU
R5‑184629 Update ServingCellConfig DOCOMO Communications Lab. imported from 3GU
R5‑184630 Editorial Update in clause 4.6.3 DOCOMO Communications Lab. imported from 3GU
R5‑184631 Adding TC 13.1.21 for emergency call via CS domain DOCOMO Communications Lab. imported from 3GU
R5‑184632 Addition of new V2X test case 24.2.4 CAICT imported from 3GU
R5‑184633 Addition of new applicability of emergency call via CS domain TC for IMS capable UE DOCOMO Communications Lab. imported from 3GU
R5‑184634 Correction to FR2 Spurious TC and inroduction of TRP measurement grid requirement Anritsu imported from 3GU
R5‑184635 Emergency call via CS domain TC in case of IMS voice not available DOCOMO Communications Lab. imported from 3GU
R5‑184636 Correction to V2X test case 24.1.12 CAICT imported from 3GU
R5‑184637 Addition of test applicability for new V2X TC24.2.4 and Specific ICS for V2X TC24.2.1 and TC24.2.2 CAICT imported from 3GU
R5‑184638 CA_1A-3A-26A(1UL) - Updates of test points analysis KDDI Corporation imported from 3GU
R5‑184639 CA_1A-3A-26A(1UL) –Updates of 7.3A.5 REFSENS KDDI Corporation imported from 3GU
R5‑184640 Introduction of Additional spurious emissions for UL 256QAM TTA imported from 3GU
R5‑184641 CA_3A-18A - Updates of test points analysis KDDI Corporation imported from 3GU
R5‑184642 CA_3A-18A - Updates of some Tx test cases KDDI Corporation imported from 3GU
R5‑184643 Addition of applicability for TC6.6.3.3_2 TTA imported from 3GU
R5‑184644 Editorial: Cleaning up the style of Annex B.4.1A in TS 36.521-1 TTA imported from 3GU
R5‑184645 CA_3A-18A and 1A-3A-18A - Updates of A.4.6.3 KDDI Corporation imported from 3GU
R5‑184646 Introduction of FDD PDSCH Single-layer Spatial Multiplexing for FD-MIMO TTA imported from 3GU
R5‑184647 Correction of test requirements in 7.3.5A REFSENSE KDDI Corporation imported from 3GU
R5‑184648 Introduction of TDD PDSCH Single-layer Spatial Multiplexing for FD-MIMO TTA imported from 3GU
R5‑184649 Applicabilities addition of test cases 8.3.1.1.9 and 8.3.2.1.10 TTA imported from 3GU
R5‑184650 Editorial correction of Table 7.6.3A.5.4.1-1 KDDI Corporation imported from 3GU
R5‑184651 Update of TC8.12.1.1.3 TTA imported from 3GU
R5‑184652 Correction to V2X test case 24.1.1, 24.1.3, 24.1.5, 24.1.6, 24.1.10 and 24.1.11 CAICT imported from 3GU
R5‑184653 Update of Additional Maximum Power Reduction (A-MPR) for V2X Communication / Non-concurrent with E-UTRA uplink transmissions LG Electronics imported from 3GU
R5‑184654 Update to applicability V2X communication test cases for simultaneous E-UTRA V2X sidelink and E-UTRA uplink transmissions LG Electronics imported from 3GU
R5‑184655 Update to Additional Maximum Power Reduction (A-MPR) for V2X Communication / Simultaneous E-UTRA V2X sidelink and E-UTRA uplink transmissions LG Electronics imported from 3GU
R5‑184656 Update to Configured UE transmitted Output Power for V2X Communication / Simultaneous E-UTRA V2X sidelink and E-UTRA uplink transmission LG Electronics imported from 3GU
R5‑184657 Update to UE Transmit OFF power for V2X Communication / Simultaneous E-UTRA V2X sidelink and E-UTRA uplink transmissions LG Electronics. imported from 3GU
R5‑184658 Update to General ON/OFF time mask for V2X Communication / Simultaneous E-UTRA V2X sidelink and E-UTRA uplink transmissions LG Electronics. imported from 3GU
R5‑184659 Draft TS 38.521-3 v0.6.0 Qualcomm Wireless GmbH imported from 3GU
R5‑184660 Update to Maximum Power Reduction (MPR) for V2X Communication / Power class 3 / Contiguous allocation of PSCCH and PSSCH / Non-concurrent with E-UTRA uplink transmissions LG Electronics. imported from 3GU
R5‑184661 Corrections to RRC TC - Measurement configuration control and reporting / Inter-RAT measurements / Event B2 / Measurement of NR cells / EN-DC Intertek imported from 3GU
R5‑184662 Update to Annex G for V2V/V2X Demod Perf tests Qualcomm Wireless GmbH imported from 3GU
R5‑184663 Corrections to MCPTT Authorization MCC TF160 imported from 3GU
R5‑184664 Default channel bandwidth of new NR bands for non-CA signaling test cases DOCOMO Communications Lab., KDDI Corporation, KT Corp. imported from 3GU
R5‑184665 Flexible loop nest for FR2 TRx tests Anritsu imported from 3GU
R5‑184666 MCPTT Client test cases: open issues in prose MCC TF160 imported from 3GU
R5‑184667 Correction to LAA inter-frequency event-triggered reporting test cases Qualcomm Wireless GmbH imported from 3GU
R5‑184668 Editorial correction of reference document Intertek imported from 3GU
R5‑184669 Clarification on frame structure in 4Rx performance and CSI test principles sections Qualcomm Wireless GmbH imported from 3GU
R5‑184670 CR of of AM RLC test case 7.1.2.3.10 Huawei, Hisilicon imported from 3GU
R5‑184671 Update of References in Section 2 of 38.521-3 spec Qualcomm Wireless GmbH imported from 3GU
R5‑184672 Updates to Operating Bands in Section 5.2 Qualcomm Wireless GmbH imported from 3GU
R5‑184673 Editorial updates to 38.509 Samsung, MCC TF160 imported from 3GU
R5‑184674 Specifying content for SCGFailureInformationNR Samsung imported from 3GU
R5‑184675 Specifying content for MeasResultSCG-Failure Samsung imported from 3GU
R5‑184676 Update of RRC SCG failure TC 8.2.5.1.1 Samsung, Qualcomm imported from 3GU
R5‑184677 Update of RRC SCG failure TC 8.2.5.2.1 Samsung, Qualcomm imported from 3GU
R5‑184678 Update of RRC SCG failure TC 8.2.5.3.1 Samsung, Qualcomm imported from 3GU
R5‑184679 Update of RRC SCG failure TC 8.2.5.4.1 Samsung, Qualcomm imported from 3GU
R5‑184680 Update of RRC SCG failure TC 8.2.5.5.1 Samsung, Qualcomm imported from 3GU
R5‑184681 Update of RRC SCG failure TC 8.2.5.6.1 Samsung, Qualcomm imported from 3GU
R5‑184682 Update of test case title for TC 8.2.5.1.1 Samsung imported from 3GU
R5‑184683 5G work planning after RAN5#80 Samsung imported from 3GU
R5‑184684 Update of PRD13 Samsung imported from 3GU
R5‑184685 Update of default message contents for new Rel-14 TCs for Private Call Call-Back and Ambient listening call Samsung imported from 3GU
R5‑184686 Adding a new Rel-14 TC on Private Call Call-Back Request / Client Originated (CO) / Private call call-back fulfilment Samsung imported from 3GU
R5‑184687 Adding a new Rel-14 TC on Private Call Call-Back Request / Client Terminated (CT) / Private call call-back fulfilment Samsung imported from 3GU
R5‑184688 Adding a new Rel-14 TC on Private Call / Remotely initiated Ambient listening call Client Originated (CO) Samsung imported from 3GU
R5‑184689 Adding a new Rel-14 TC on Private Call / Remotely initiated Ambient listening call Client Terminated (CT) Samsung imported from 3GU
R5‑184690 Adding a new Rel-14 TC on Private Call / Locally initiated Ambient listening call / Client Originated (CO) Samsung imported from 3GU
R5‑184691 Adding a new Rel-14 TC on Private Call / Locally initiated Ambient listening call / Client Terminated (CT) Samsung imported from 3GU
R5‑184692 Editorial updates to 36.579-2 Rel-13 TCs Samsung imported from 3GU
R5‑184693 Adding applicability for new MCPTT Rel-14 TCs Samsung imported from 3GU
R5‑184694 eLAA: Updates to Adjacent Channel Leakage power Ratio for CA Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑184695 Resubmission of update of TC8.13.3.6.1 and 8.13.3.6.2 ETSI MCC (TTA) imported from 3GU
R5‑184696 EN-DC Test Model: Addition of further aspects MCC TF160 imported from 3GU
R5‑184697 New UL 256QAM test case: 6.6.2.2_2 Additional Spectrum Emission Mask for UL 256QAM Ericsson imported from 3GU
R5‑184698 Applicability for New UL 256QAM test cases: 6.6.2.2_2 and 6.6.2.3A.3_2 Ericsson imported from 3GU
R5‑184699 Addition of PICS Motorola Mobility imported from 3GU
R5‑184700 Addition of Test Loop for SDAP testing Motorola Mobility imported from 3GU
R5‑184701 Addition of RLC Config for UM Motorola Mobility imported from 3GU
R5‑184702 Addition of 5GS NR SDAP test case 7.1.4.2 Motorola Mobility imported from 3GU
R5‑184703 MU budget for EIRP/TRP measurements with Near Field test range at mmWave MVG Industries imported from 3GU
R5‑184704 Update to IMS eCall test cases for eCall category bit usage Qualcomm Incorporated imported from 3GU
R5‑184705 Update to Emergency Call test case 19.1.3 for eCall category bit usage Qualcomm Incorporated imported from 3GU
R5‑184706 Editorial correction to band representation of non-contiguous EN-DC band combination Keysight Technologies UK Ltd imported from 3GU
R5‑184707 Update of EMM test case 9.2.1.1.1b Qualcomm Incorporated imported from 3GU
R5‑184708 Update of EMM test case 9.2.1.1.22 Qualcomm Incorporated, Anritsu imported from 3GU
R5‑184709 Update of EMM test case 9.2.3.2.17 Qualcomm Incorporated imported from 3GU
R5‑184710 Update of eMBMS test cases for UEs supporting AT command for eMBMS service activation Qualcomm Incorporated imported from 3GU
R5‑184711 Update to NB-IOT test case 22.1.1 M2 Qualcomm Incorporated, Anritsu, Rohde & Schwarz imported from 3GU
R5‑184712 Update to NB-IOT test case 22.3.1.2 Qualcomm Incorporated imported from 3GU
R5‑184713 Correction to RLC-Config IE Ericsson imported from 3GU
R5‑184714 Correction to RadioBearerConfig-DRB Ericsson imported from 3GU
R5‑184715 Corrections ard updates to BandCombinationList and Feature Set IEs Ericsson imported from 3GU
R5‑184716 Addition of RRM IncMon new Test Case 8.5.8 Ericsson imported from 3GU
R5‑184717 Addition of RRM IncMon new Test Case 8.6.3 Ericsson imported from 3GU
R5‑184718 Addition of RRM IncMon new Test Case 8.7.5 Ericsson imported from 3GU
R5‑184719 Addition of RRM IncMon new Test Case 8.7A.1 Ericsson imported from 3GU
R5‑184720 Addition of RRM IncMon new Test Cases 4.2.1 and 4.2.11 Ericsson imported from 3GU
R5‑184721 Addition of RRM IncMon new Test Case 4.3.1.5 Ericsson imported from 3GU
R5‑184722 Addition of RRM IncMon new Test Case 4.3.2A Ericsson imported from 3GU
R5‑184723 Addition of RRM IncMon new Test Case 4.3.3A Ericsson imported from 3GU
R5‑184724 Addition of RRM IncMon new Test Case 4.3.4.4 Ericsson imported from 3GU
R5‑184725 Applicability for New UL 256QAM test cases: 6.6.2.2_2 and 6.6.2.3A.3_2 Ericsson imported from 3GU
R5‑184726 Removal of 1xPre-Registation 8.4.7.x test cases Qualcomm Incorporated imported from 3GU
R5‑184727 Removal of Multi-Layer 1xPre-Registation 13.4.4.x and 1xCSFB 13.1.xx test cases Qualcomm Incorporated imported from 3GU
R5‑184728 Update of TC7.6.2G.1 Out-of-band blocking for V2X Communication CAICT imported from 3GU
R5‑184729 Update of TC 7.8.1G.1 Wide band Intermodulation for V2X CAICT imported from 3GU
R5‑184730 Correction to Inter-RAT absolute priority based reselection test cases Qualcomm Incorporated imported from 3GU
R5‑184731 Update to applicability condition of test case 11.2.3 to include CSG PICS Qualcomm Incorporated imported from 3GU
R5‑184732 Update to applicability condition of Intra-frequency measurement reporting test cases for CAT-M1 UEs Qualcomm Incorporated imported from 3GU
R5‑184733 Update of TC7.9G Spurious emissions for V2X CAICT imported from 3GU
R5‑184734 Update to applicability condition of Test case 6.1.1.7a for CAT-M1 UEs Qualcomm Incorporated, Rohde & Schwarz imported from 3GU
R5‑184735 Removal of 1xPre-Registation and 1xCSFB test cases applicability Qualcomm Incorporated imported from 3GU
R5‑184736 Introduce Intra frequency handover for Cat-M2 UEs in CEModeA Bureau Veritas imported from 3GU
R5‑184737 Dual uplink interferer updated to 38.521-3 Bureau Veritas imported from 3GU
R5‑184738 pCR Adding MU values for EIRPTRP measurements with Near Field test range at mmWave MVG Industries imported from 3GU
R5‑184739 Update of UE test loop mode E Huawei,HiSilicon, CATT imported from 3GU
R5‑184740 Update of multiple V2V RF test cases for proper test mode setting Huawei,HiSilicon imported from 3GU
R5‑184741 Discussion on starting point of 200ms in FR1 RF test procedures Huawei,HiSilicon, Keysight imported from 3GU
R5‑184742 Update of FR2 test case 6.3.1 Huawei,HiSilicon imported from 3GU
R5‑184743 Update of FR2 test case 6.3.3.2 Huawei,HiSilicon imported from 3GU
R5‑184744 Addition of 6.2B.4.1.1 Configured OP for Intra-Band Contiguous EN-DC Huawei,HiSilicon imported from 3GU
R5‑184745 Addition of 6.2B.4.1.2 Configured OP for Intra-Band Non-Contiguous EN-DC Huawei,HiSilicon imported from 3GU
R5‑184746 Addition of 6.2B.4.1.3 Configured OP for Intre-Band within FR1 Huawei,HiSilicon imported from 3GU
R5‑184747 Addition of 6.2B.4.1.4 Configured OP for Inter-Band EN-DC including FR2 Huawei,HiSilicon imported from 3GU
R5‑184748 Addition of 6.2B.4.1.5 Configured OP for Inter-Band EN-DC including both FR1 and FR2 Huawei,HiSilicon imported from 3GU
R5‑184749 Revised WID- Support for V2X services Huawei imported from 3GU
R5‑184750 Draft TR 38.905-1 v0.3.0 Ericsson LM imported from 3GU
R5‑184751 TP for updating TR38.905 with FR1 AMPR test point analyses with NS_35 Ericsson LM imported from 3GU
R5‑184752 Discussion on test point selection for NS_35 A-MPR in FR1 Ericsson LM imported from 3GU
R5‑184753 Update of NR test cases title and applicability Qualcomm Incorporated imported from 3GU
R5‑184754 TP for updating test case 6.2.3 UE AMPR Ericsson LM imported from 3GU
R5‑184755 TP for updating test case 6.5.2.3 Additional spectrum emission mask Ericsson LM imported from 3GU
R5‑184756 Correction to RRC TC - Measurement configuration control and reporting / Event A1 / Measurement of NR PSCell / EN-DC Qualcomm Incorporated imported from 3GU
R5‑184757 TP for updating test case 6.2B.3.1 UE AMPR for Intra-band contigous EN-DC Ericsson LM imported from 3GU
R5‑184758 TP for updating test case 6.2B.3.2 UE AMPR for Intra-band non-contigous EN-DC Ericsson LM imported from 3GU
R5‑184759 TP for updating test case 6.5B.2.1.2 Additional spectrum emission mask for intra-band contigous EN-DC Ericsson LM imported from 3GU
R5‑184760 Correction to RRC TC - PSCell addition, modification and release / Split DRB / EN-DC Qualcomm Incorporated imported from 3GU
R5‑184761 Correction to RRC TC - Measurement configuration control and reporting / Inter-RAT measurements / Periodic reporting / Measurement of NR cells / EN-DC Qualcomm Incorporated imported from 3GU
R5‑184762 Aligning CA delta TiB in sub-clause 6.2.5.3 with TS 36.101 v15.3.0 Ericsson LM imported from 3GU
R5‑184763 Correction to RRC TC - Measurement configuration control and reporting / Inter-RAT measurements / Event B1 / Measurement of NR cells / RSRQ based measurements / EN-DC Qualcomm Incorporated imported from 3GU
R5‑184764 Aligning CA delta RiB in sub-clause 7.3.3 with TS 36.101 v15.3.0 Ericsson LM imported from 3GU
R5‑184765 Introduction CA_3A-7A-20A-32A 4DL/1UL to Annex A Ericsson LM imported from 3GU
R5‑184766 Optimization of test configuration table for Rx CA test cases NTT DOCOMO, INC. imported from 3GU
R5‑184767 Updates to NAS test case 10.2.1.2 Ericsson LM imported from 3GU
R5‑184768 Update of 5GS NR RRC test case 8.2.2.6.1 ROHDE & SCHWARZ imported from 3GU
R5‑184769 Update of 5GS NR RRC test case 8.2.2.6.1 ROHDE & SCHWARZ imported from 3GU
R5‑184770 Update of 5GS NR RRC test case 8.2.3.6.1 ROHDE & SCHWARZ imported from 3GU
R5‑184771 Addition of test frequencies for CA_66A-71A, CA_66C-71A, CA_70A-71A, CA_70C-71A to 36.508 WE Certification Oy, DISH Network imported from 3GU
R5‑184772 Addition of new 5GC TC 9.1.2.2 CATT, TDIA imported from 3GU
R5‑184773 RF TP analysis for CA_66A-66A-70C-71A, CA_66A-66A-70A-71A, CA_66A-70C-71A, CA_66A-70A-71A, CA_66A-66A-71A, CA_70A-71A, CA_66A-71A, CA_66C-70C-71A, CA_66C-70A-71A, CA_70C-71A, CA_66C-71A WE Certification Oy, DISH Network imported from 3GU
R5‑184774 Update of 5GS NR RRC test case 8.2.3.8.1 ROHDE & SCHWARZ imported from 3GU
R5‑184775 Reference sensitivity requirements for CA_66A-66A-70C-71A, CA_66A-66A-70A-71A, CA_66A-70C-71A, CA_66A-70A-71A, CA_66A-66A-71A, CA_70A-71A, CA_66A-71A, CA_66C-70C-71A, CA_66C-70A-71A, CA_70C-71A, CA_66C-71A WE Certification Oy, DISH Network imported from 3GU
R5‑184776 Updates to Align Initial Conditions with Other V2X Test Cases PCTEST Engineering Lab imported from 3GU
R5‑184777 Update of 5GS NR RRC test case 8.2.1.1.1 ROHDE & SCHWARZ imported from 3GU
R5‑184778 Updates to Align the GNSS Moving Scenario Details with Other V2X Test Cases PCTEST Engineering Lab imported from 3GU
R5‑184779 Update to A.2.1 for Test eCall Request-URI Qualcomm Incorporated imported from 3GU
R5‑184780 Update of applicability and tests conditions for NB_IOT enhancement test cases CATT, TDIA, Starpoint imported from 3GU
R5‑184781 Update to IMS eCall test case 11.3.2 Qualcomm Incorporated imported from 3GU
R5‑184782 Update to IMS eCall test case 11.3.6 Qualcomm Incorporated imported from 3GU
R5‑184783 Introduce 5GMM messages Ericsson imported from 3GU
R5‑184784 Addition of new NB_IOTenh-UEConTest test case 22.3.1.8 CATT, TDIA, Starpoint imported from 3GU
R5‑184785 Introduce 5GSM messages Ericsson imported from 3GU
R5‑184786 Addition of new NB_IOTenh-UEConTest test case 22.3.1.9 CATT, TDIA, Starpoint imported from 3GU
R5‑184787 Addition of new NB_IOTenh-UEConTest test case 22.3.1.10 CATT, TDIA, Starpoint imported from 3GU
R5‑184788 Addition of new NB_IOTenh-UEConTest test case 22.4.24 CATT, TDIA, Starpoint imported from 3GU
R5‑184789 Addition of new NB_IOTenh-UEConTest test case 22.4.25 CATT, TDIA, Starpoint imported from 3GU
R5‑184790 Addition of new NB_IOTenh-UEConTest test case 22.4.25 CATT, TDIA, Starpoint imported from 3GU
R5‑184791 Addition of NB_IOTenh-UEConTest test case scenarios and default SIB content CATT, TDIA, Starpoint imported from 3GU
R5‑184792 Addition of reference dedicated EPS bearer context #7 for V2X testing CATT imported from 3GU
R5‑184793 Remove test step 0 in test case 24.1.15 CATT imported from 3GU
R5‑184794 Remove test step 0 in test case 24.1.18 CATT imported from 3GU
R5‑184795 Correction on V2X Sidelink test case 24.3.1 CATT imported from 3GU
R5‑184796 Update Table 24.3.3.3.3-1 in test case 24.3.3 CATT imported from 3GU
R5‑184797 Clarification for chapter 8 & 9 general sections Rohde & Schwarz imported from 3GU
R5‑184798 Corrections to 4Rx demodulation TCs Rohde & Schwarz imported from 3GU
R5‑184799 Corrections to A-MPR values for NS_27 Rohde & Schwarz imported from 3GU
R5‑184800 Update to test point analysis for NS_27 Rohde & Schwarz imported from 3GU
R5‑184801 Discussion on UE device size for FR2 Rohde & Schwarz imported from 3GU
R5‑184802 Discussion on treatment of multi-panel UEs Rohde & Schwarz imported from 3GU
R5‑184803 Discussion on Test Tolerance for FR2 Intel Corporation (UK) Ltd, Apple Inc. imported from 3GU
R5‑184804 Discussion on TT for Max Output Power TC Requirements for FR2 Intel Corporation (UK) Ltd, Apple Inc. imported from 3GU
R5‑184805 Discussion on SIG testcase optimization of 5GC CATT imported from 3GU
R5‑184806 Mid test CH BW for n71 Dish Network imported from 3GU
R5‑184807 Correction to NB-IoT testcase 22.3.3.5 ROHDE & SCHWARZ imported from 3GU
R5‑184808 Correction to band selection criteria applicability for HPUE devices that support Power Class 1 & 2 Intel Corporation (UK) Ltd imported from 3GU
R5‑184809 Correction to Applicability Condition of TS 36.521-1 Test Cases 6.6.2.2A.1 and 6.6.3.3A.1 Intel Corporation (UK) Ltd imported from 3GU
R5‑184810 FR2_UE_BeamlockInvoke_38.521-3 Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑184811 Correction to Note 1 of Table 7.3A.0-0bB Reference sensitivity level for CA Intel Corporation (UK) Ltd imported from 3GU
R5‑184812 Correction to Power Control for CA Test Procedure of TCs 6.3.5A.1.1, 6.3.5A.1.2 and 6.3.5A.1.4 Intel Corporation (UK) Ltd imported from 3GU
R5‑184813 New test case for V2X Sidelink using Tx parameters based on measured CBR and PPPP Sporton, TTA imported from 3GU
R5‑184814 Addition of test applicability for new V2X TC 24.1.13 Sporton imported from 3GU
R5‑184815 New test case for NB-IoT UM RLC Sporton, TTA imported from 3GU
R5‑184816 Addition of applicability and tests conditions for new Enhancements NB-IoT TC 24.1.13 Sporton imported from 3GU
R5‑184817 Making Measurement Uncertainty Terms Common between methods in TR 38.90 MVG Industries imported from 3GU
R5‑184818 Correction to Message Content for TC 6.2.4EA^^ A-MPR for UE Category M1 Intel Corporation (UK) Ltd imported from 3GU
R5‑184819 pCR Making Measurement Uncertainty Terms Common between methods in TR 38.90 MVG Industries imported from 3GU
R5‑184820 Addition of default laa-SCellConfiguration setting for eLAA Huawei, MCC TF160 imported from 3GU
R5‑184821 Inter-band con-current V2X configurations- Updates of test points analysis Huawei, Hisilicon imported from 3GU
R5‑184822 Addition of notes for half pi-BPSK test applicability Huawei, Hisilicon imported from 3GU
R5‑184823 Introduction of 6.2C.1 Configured transmitted power for SUL Huawei, Hisilicon imported from 3GU
R5‑184824 Addition of Uplink Physical Channels in Annex Huawei, Hisilicon imported from 3GU
R5‑184825 Addition of downlink physicanl channels in annex Huawei, Hisilicon imported from 3GU
R5‑184826 Update of TC 6.2B.1.1 Huawei, Hisilicon imported from 3GU
R5‑184827 Introduction of TC 6.2B.1.2 Huawei, Hisilicon imported from 3GU
R5‑184828 Update of 6.2B.1.3 Huawei, Hisilicon imported from 3GU
R5‑184829 Introduction of TC 7.4B.1 Huawei, Hisilicon imported from 3GU
R5‑184830 Introduction of 7.4B.2 Huawei, Hisilicon imported from 3GU
R5‑184831 Introduction of 7.4B.3 Huawei, Hisilicon imported from 3GU
R5‑184832 Addition of Test point and test requirements for CA_3A-41A, 41A-42A,3A-42A spurious test cases Huawei, Hisilicon imported from 3GU
R5‑184833 Test point and test requirements analysis for CA_3A-41A, 41A-42A,3A-42A spurious test cases Huawei, Hisilicon imported from 3GU
R5‑184834 Discussion on the test applicability for the modulation of Pi/2-BPSK Huawei, Hisilicon imported from 3GU
R5‑184835 Discussion on test point selection for Configured transmitted power for SUL test case in FR1 Huawei, Hisilicon imported from 3GU
R5‑184836 Correction to Reference sensitivity level for CA UL Allocation in Table 7.3A.1.4.1-1 Intel Corporation (UK) Ltd imported from 3GU
R5‑184837 Test Point analysis for FR1 Configured Output Power for SUL Huawei,HiSilicon imported from 3GU
R5‑184838 Addition of new CA band combination – Updates of test points analysis SGS Wireless imported from 3GU
R5‑184839 Update of TDD PDSCH Closed Loop Multi Layer Multiplexing 4x2 for CA (5DL CA) SGS Wireless imported from 3GU
R5‑184840 Update of TX Minimum Ouput Power for CA (3UL CA) SGS Wireless imported from 3GU
R5‑184841 Introduction of Additional Maximum Power Reduction (A-MPR) for CA (3UL CA) SGS Wireless imported from 3GU
R5‑184842 Introduction of Maximum Power Reduction (MPR) for CA (3UL CA) SGS Wireless imported from 3GU
R5‑184843 Introduction of General ON/OFF time mask for CA (3UL CA) SGS Wireless imported from 3GU
R5‑184844 Addition of new 2CA band combination for CA REFSENS SGS Wireless imported from 3GU
R5‑184845 Addition of new 3CA band combination for CA REFSENS SGS Wireless imported from 3GU
R5‑184846 Additional of test applicability for CA (3UL CA) SGS Wireless imported from 3GU
R5‑184847 Update of V2X RRM SGS Wireless imported from 3GU
R5‑184848 Update of V2X Receiver Test Cases SGS Wireless imported from 3GU
R5‑184849 Correction of condition for Measurement configuration and reporting SGS Wireless, Ericsson imported from 3GU
R5‑184850 Update of Initial condition for FR2 SGS Wireless imported from 3GU
R5‑184851 Introduction of OTA signaling test environment Keysight Technologies UK Ltd imported from 3GU
R5‑184852 Discussion on OBW, SEM and ACLR for EN-DC interband FR1 Keysight Technologies UK Ltd imported from 3GU
R5‑184853 Correction to NR RRC test case 8.2.3.14.1 Keysight Technologies UK Ltd imported from 3GU
R5‑184854 Correction to NB-IoT testcase 22.3.2.2 ROHDE & SCHWARZ imported from 3GU
R5‑184855 Update Occupied Bandwidth for interband EN-DC within FR1 Keysight Technologies UK Ltd imported from 3GU
R5‑184856 General sections updated to 38.521-2 CAICT imported from 3GU
R5‑184857 Update SEM interband EN-DC within FR1 Keysight Technologies UK Ltd imported from 3GU
R5‑184858 Quality of Quiet Zone Results for IFF Keysight Technologies UK Ltd imported from 3GU
R5‑184859 5G_NR FR1_Text_update for_RX_sensitivity Qualcomm Incorporated imported from 3GU
R5‑184860 Update ACLR for interband EN-DC within FR1 Keysight Technologies UK Ltd imported from 3GU
R5‑184861 WP – UE Conformance Test Aspects – Interference Mitigation for Downlink Control Channels of LTE Intel Corporation (UK) Ltd imported from 3GU
R5‑184862 SR- UE Conformance Test Aspects – Interference Mitigation for Downlink Control Channels of LTE Intel Corporation (UK) Ltd imported from 3GU
R5‑184863 Update of FR1 test case 6.2.2 CAICT imported from 3GU
R5‑184864 WP – UE Conformance Test Aspects - Wireless Local Area Network (WLAN) – 3GPP Radio Level Integration and Interworking Enhancements Intel Corporation (UK) Ltd imported from 3GU
R5‑184865 5G NR_FR1_Text_update for TX Spurious Emission Qualcomm Incorporated imported from 3GU
R5‑184866 SR- UE Conformance Test Aspects - Wireless Local Area Network (WLAN) – 3GPP Radio Level Integration and Interworking Enhancements Intel Corporation (UK) Ltd imported from 3GU
R5‑184867 5G NR_FR1_Text_update for TX Spurious Emission UE-Co-exist Qualcomm Incorporated imported from 3GU
R5‑184868 New TC 8.16.83: 3 DL CA Event Triggered Reporting under Deactivated SCells in Non-DRX with generic duplex modes Intel Corporation (UK) Ltd imported from 3GU
R5‑184869 5G NR_EN_DC with FR1_Text update for RX sensitivity Qualcomm Incorporated imported from 3GU
R5‑184870 New TC 8.16.84: 3 DL CA Event Triggered Reporting on Deactivated SCell with PCell and SCell Interruptions in Non-DRX with generic duplex modes Intel Corporation (UK) Ltd imported from 3GU
R5‑184871 New TC 8.16.85: 3 DL CA Activation and Deactivation of Known SCell in Non-DRX with generic duplex modes Intel Corporation (UK) Ltd imported from 3GU
R5‑184872 5G NR_EN_DC with FR1_Text_proposal for_TX_Spurious_emission Qualcomm Incorporated imported from 3GU
R5‑184873 New TC 8.16.86: 3 DL CA Activation and Deactivation of Unknown SCell in Non-DRX with generic duplex modes Intel Corporation (UK) Ltd imported from 3GU
R5‑184874 TS 36.521-1 Annex F update for UE cat 1bis test cases Qualcomm Incorporated imported from 3GU
R5‑184875 Update to Occupied Bandwidth, SEM and ACLR test cases in TS 38.521-1 Keysight Technologies UK Ltd imported from 3GU
R5‑184876 LTE_New test case LTE_New test case 6.3.4EB ONOFF time mask for UE category 1bis Qualcomm Incorporated imported from 3GU
R5‑184877 LTE_New test case 6.3.5EB Power Control for UE category 1bis Qualcomm Incorporated imported from 3GU
R5‑184878 LTE_New test case 6.3.3EB UE Transmit OFF power for UE category 1bis Qualcomm Incorporated imported from 3GU
R5‑184879 LTE_New test case 6.3.2EB Minimum Output Power for UE category 1bis Qualcomm Incorporated imported from 3GU
R5‑184880 LTE_New test case 6.2.5EB Configured UE transmitted Power for UE category 1bis Qualcomm Incorporated imported from 3GU
R5‑184881 LTE_New test case 6.2.4EB Additional Maximum Power Reduction (A-MPR) for UE category 1bis Qualcomm Incorporated imported from 3GU
R5‑184882 Alignment of Annex numbering with core spec Qualcomm Wireless GmbH imported from 3GU
R5‑184883 Proposal for 5G NR EVM Test Tolerance Qualcomm Incorporated imported from 3GU
R5‑184884 Update to NB-IoT test conditions for in-band / guard band ROHDE & SCHWARZ imported from 3GU
R5‑184885 LTE_New test case 6.2.3EB Maximum Power Reduction (MPR) for UE category 1bis Qualcomm Incorporated imported from 3GU
R5‑184886 LTE_New test case 6.2.2EB UE Maximum Output Power for UE category 1bis Qualcomm Incorporated imported from 3GU
R5‑184887 On the relation between MU and TT for RF and RRM conformance testing Ericsson imported from 3GU
R5‑184888 Introduction of maximum output power test cases Ericsson imported from 3GU
R5‑184889 Discussion on testing of fallback CA configurations in Rx CA test cases Ericsson imported from 3GU
R5‑184890 Test optimization for CA fallback cases in 3DL CA and 4DL CA Receiver test cases Ericsson imported from 3GU
R5‑184891 4Rx support in some 4DL CA and 5DL CA Demodulation test cases Ericsson imported from 3GU
R5‑184892 4Rx branches in some 4DL CA and 5DL CA Demodulation test cases Ericsson imported from 3GU
R5‑184893 WP UE Conformance Test Aspects – Rel-14 LTE DL CA 4 Rx antenna ports Ericsson imported from 3GU
R5‑184894 SR UE Conformance Test Aspects – Rel-14 LTE DL CA 4 Rx antenna ports Ericsson imported from 3GU
R5‑184895 WP UE Conformance Test Aspects – Rel13 Full Dimension MIMO for LTE Ericsson imported from 3GU
R5‑184896 SR UE Conformance Test Aspects – Rel13 Full Dimension MIMO for LTE Ericsson imported from 3GU
R5‑184897 Updates to Channel Arrangement section in 38.521-3 Qualcomm Wireless GmbH imported from 3GU
R5‑184898 Proposal for LTE 256QAM EVM Test Tolerance Qualcomm Incorporated imported from 3GU
R5‑184899 WP UE Conformance Test Aspects – Further enhanced MTC for LTE Ericsson imported from 3GU
R5‑184900 SR UE Conformance Test Aspects – Further enhanced MTC for LTE Ericsson imported from 3GU
R5‑184901 Updates to feMTC TC 8.2.2.6.6 Ericsson imported from 3GU
R5‑184902 Corrections and updates to UE Capability IEs Ericsson imported from 3GU
R5‑184903 Update 3UL CA test cases 6.2.2A.4 and 6.5.1A.4 CGC Inc. imported from 3GU
R5‑184904 Update to ACS and in-band blocking test cases in TS 38.521-1 Keysight Technologies UK Ltd imported from 3GU
R5‑184905 Add a new test condition for test case 8.13.3.1.2.5. CGC Inc. imported from 3GU
R5‑184906 Add 3UL CA test cases 6.2.2A.4 and 6.5.1A.4 in 36.521-2 CGC Inc. imported from 3GU
R5‑184907 Update to Occupied Bandwidth, SEM and ACLR test cases in TS 38.521-2 Keysight Technologies UK Ltd imported from 3GU
R5‑184908 FR2_UE_BeamlockMode_IE_38.509 Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑184909 FR2_UE_BeamlockProcedure_38.508-1 Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑184910 Discussion of test frequencies Sprint Corporation imported from 3GU
R5‑184911 Update to test configuration tables and requirement tables for 12A-66A 2ULCA test cases. CGC Inc. imported from 3GU
R5‑184912 Update to ACS and inband blocking test cases in TS 38.521-2 Keysight Technologies UK Ltd imported from 3GU
R5‑184913 Update MU factors for IFF Keysight Technologies UK Ltd imported from 3GU
R5‑184914 Discussion on MU factor for IFF Keysight Technologies UK Ltd imported from 3GU
R5‑184915 Discussion on low-PSD scenarios Keysight Technologies UK Ltd imported from 3GU
R5‑184916 Discussion on Dwell time Keysight Technologies UK Ltd imported from 3GU
R5‑184917 Correction on 4Rx RLM TC in-sync parameters Qualcomm Wireless GmbH imported from 3GU
R5‑184918 Correction to multi-layer test case 13.1.20 Keysight Technologies UK Ltd imported from 3GU
R5‑184919 5G_FR1_Text_update for_RF_sensitivity_for_SUL_operation Qualcomm Incorporated imported from 3GU
R5‑184920 5G NR_Proposal of TS38.521-1 annex C.0_Downlink signal levels Qualcomm Incorporated imported from 3GU
R5‑184921 5G NR_FR1_Text_Update_for_TX_ Additional spurious emissions Qualcomm Incorporated imported from 3GU
R5‑184922 Test Point Analysis for Reference sensitivity level for EN-DC Qualcomm Incorporated imported from 3GU
R5‑184923 Test Point analysis for FR2 RefSense test case Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑184924 Test Point analysis for FR2 TxSpurious test case Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑184925 Test Tolerance: Updates to Cat1bis chapter 8 inter-frequency event triggered reporting tests Qualcomm UK Ltd imported from 3GU
R5‑184926 Test Tolerances analysis for E-UTRAN FDD-FDD and TDD-TDD inter-frequency TC 8.3.1_2, 8.3.2_2, 8.4.1_2, 8.4.2_2 and 8.4.6_2 for UE category 1bis Qualcomm UK Ltd imported from 3GU
R5‑184927 Test Tolerance: Updates to Cat1bis Event triggered reporting tests under AWGN propagation conditions in asynchronous cells with DRX when L3 filtering is used Qualcomm UK Ltd imported from 3GU
R5‑184928 Test Tolerances analysis for E-UTRAN FDD-FDD and TDD-TDD inter-frequency TC 8.3.3_2 and 8.4.3_2 for UE category 1bis when L3 filtering is used Qualcomm UK Ltd imported from 3GU
R5‑184929 Test Tolerance: Updates to Cat1bis Event triggered reporting tests with fading, Annex E and Annex F Qualcomm UK Ltd imported from 3GU
R5‑184930 Test Tolerances analysis for E-UTRAN FDD-FDD intra-frequency event triggered reporting under fading propagation conditions in asynchronous cells for UE category 1bis Qualcomm UK Ltd imported from 3GU
R5‑184931 Test Tolerance: Updates to Cat1bis intra-frequency Event triggered reporting tests, Annex E and Annex F Qualcomm UK Ltd imported from 3GU
R5‑184932 Test Tolerances analysis for E-UTRAN FDD-FDD and TDD-TDD intra-frequency TC 8.1.12_2, 8.1.13_2, 8.1.17_2, 8.1.18_2 for UE category 1bis Qualcomm UK Ltd imported from 3GU
R5‑184933 Test Tolerance: Updates to Cat1bis intra-frequency CGI Event triggered reporting tests, Annex E and Annex F Qualcomm UK Ltd imported from 3GU
R5‑184934 Test Tolerances analysis for E-UTRAN FDD and TDD Intra-frequency CGI TC 8.1.19_2, 8.1.20_2, 8.2.7_2, 8.2.8_2 for UE category 1bis Qualcomm UK Ltd imported from 3GU
R5‑184935 Cat1bis new RF test case: Occupied bandwidth for UE category 1bis Qualcomm Austria imported from 3GU
R5‑184936 Cat1bis new RF test case: Spectrum Emission Mask for UE category 1bis Qualcomm Austria imported from 3GU
R5‑184937 Cat1bis new RF test case: Additional Spectrum Emission Mask for UE category 1bis Qualcomm Austria imported from 3GU
R5‑184938 Cat1bis new RF test case: Adjacent Channel Leakage power Ratio for UE category 1bis Qualcomm Austria imported from 3GU
R5‑184939 Cat1bis new RF test case: Spurious emission for UE category 1bis Qualcomm Austria imported from 3GU
R5‑184940 Cat1bis new RF test case: Transmit intermodulation for UE category 1bis Qualcomm Austria imported from 3GU
R5‑184941 Editorial correction of NS requirements ROHDE & SCHWARZ imported from 3GU
R5‑184942 Update to carrier leakage test case in TS 38.521-1 ROHDE & SCHWARZ imported from 3GU
R5‑184943 TP for updating TR 38.905 with FR1 Carrier Leakage test point analysis ROHDE & SCHWARZ imported from 3GU
R5‑184944 Discussion on test point selection for Carrier Leakage in FR1 ROHDE & SCHWARZ imported from 3GU
R5‑184945 Update to EVM test case in TS 38.521-1 ROHDE & SCHWARZ imported from 3GU
R5‑184946 TP for updating TR 38.905 with EVM test point analysis ROHDE & SCHWARZ imported from 3GU
R5‑184947 Update to EVM equalizer spectrum flatness test case in TS 38.521-1 ROHDE & SCHWARZ imported from 3GU
R5‑184948 TP for updating TR 38.905 with FR1 EVM equalizer spectrum flatness test point analysis ROHDE & SCHWARZ imported from 3GU
R5‑184949 Discussion on test point selection for EVM equalizer spectrum flatness in FR1 ROHDE & SCHWARZ imported from 3GU
R5‑184950 Update to Frequency Error test case in TS 38.521-1 ROHDE & SCHWARZ imported from 3GU
R5‑184951 TP for updating TR 38.905 with FR1 Frequency Error test point analysis ROHDE & SCHWARZ imported from 3GU
R5‑184952 Discussion on test point selection for Frequency Error test case in FR1 ROHDE & SCHWARZ imported from 3GU
R5‑184953 Addition of Annex Global In-Channel TX-Test to 38.521-1 ROHDE & SCHWARZ imported from 3GU
R5‑184954 Addition of Annex Global In-Channel TX-Test to 38.521-2 ROHDE & SCHWARZ imported from 3GU
R5‑184955 Update to In-band Emissions test case in TS 38.521-1 ROHDE & SCHWARZ imported from 3GU
R5‑184956 TP for updating TR 38.905 with FR1 In-band Emissions test point analysis ROHDE & SCHWARZ imported from 3GU
R5‑184957 Discussion on test point selection for In-band Emissions test case in FR1 ROHDE & SCHWARZ imported from 3GU
R5‑184958 TP for updating TR 38.905 with FR2 SEM test point analysis ROHDE & SCHWARZ imported from 3GU
R5‑184959 Update to Test frequencies for SEM in TS 38.521-2 ROHDE & SCHWARZ imported from 3GU
R5‑184960 Addition of Frequency Error test case to TS 38.521-2 ROHDE & SCHWARZ imported from 3GU
R5‑184961 TP for updating TR 38.905 with FR2 Frequency Error test point analysis ROHDE & SCHWARZ imported from 3GU
R5‑184962 Discussion on test point selection for Frequency Error in FR2 ROHDE & SCHWARZ imported from 3GU
R5‑184963 Addition of EVM test case to TS 38.521-2 ROHDE & SCHWARZ imported from 3GU
R5‑184964 TP for updating TR 38.905 with FR2 EVM test point analysis ROHDE & SCHWARZ imported from 3GU
R5‑184965 Discussion on test point selection for EVM in FR2 ROHDE & SCHWARZ imported from 3GU
R5‑184966 Addition of Carrier Leakage test case to TS 38.521-2 ROHDE & SCHWARZ imported from 3GU
R5‑184967 TP for updating TR 38.905 with FR2 Carrier Leakage test point analysis ROHDE & SCHWARZ imported from 3GU
R5‑184968 Discussion on test point selection for Carrier Leakage in FR2 ROHDE & SCHWARZ imported from 3GU
R5‑184969 Addition of In-band Emissions test case to TS 38.521-2 ROHDE & SCHWARZ imported from 3GU
R5‑184970 TP for updating TR 38.905 with FR2 In-band Emissions test point analysis ROHDE & SCHWARZ imported from 3GU
R5‑184971 Discussion on test point selection for In-band Emissions in FR2 ROHDE & SCHWARZ imported from 3GU
R5‑184972 Addition of EVM equalizer spectral flatness test case to TS 38.521-2 ROHDE & SCHWARZ imported from 3GU
R5‑184973 TP for updating TR 38.905 with FR2 EVM equalizer spectral flatness test point analysis ROHDE & SCHWARZ imported from 3GU
R5‑184974 Discussion on test point selection for EVM equalizer spectral flatness in FR2 ROHDE & SCHWARZ imported from 3GU
R5‑184975 Discussion on Measurement Uncertainty in FR2 ROHDE & SCHWARZ imported from 3GU
R5‑184976 TP on Measurement Uncertainty Contributions in FR2 ROHDE & SCHWARZ imported from 3GU
R5‑184977 L2 Preamble Parameter Update for Multi-PDN configuration Qualcomm Korea imported from 3GU
R5‑184978 Discussion on TT for EN-DC test cases Huawei,HiSilicon imported from 3GU
R5‑184979 Discussion on Test configuraion table for EN-DC test cases Huawei,HiSilicon imported from 3GU
R5‑184980 Cat1bis test cases applicability Qualcomm Austria RFFE GmbH imported from 3GU
R5‑184981 Correction to NR RLC test cases 7.1.2.2.3 and 7.1.2.2.4 Keysight Technologies UK Ltd, MCC TF160 imported from 3GU
R5‑184982 Resubmission of Cat1bis applicability CR ETSI MCC (Qualcomm Korea, Bureau Veritas, Rohde & Schwarz, CATR) imported from 3GU
R5‑184983 Introduction of maximum output power test cases Ericsson imported from 3GU
R5‑184984 Correction to NR RRC test case 8.2.3.14.1 Keysight Technologies UK Ltd imported from 3GU
R5‑184985 Correction to V2X TC 24.1.16 & 24.1.19 ROHDE & SCHWARZ, Qualcomm Incorporated imported from 3GU
R5‑184986 Correction to V2V TC 24.1.2 ROHDE & SCHWARZ, Qualcomm Incorporated imported from 3GU
R5‑184987 Addition of reference dedicated EPS bearer context #7 for V2X testing CATT imported from 3GU
R5‑184988 Update 3UL CA test cases 6.2.2A.4 and 6.5.1A.4 CGC Inc. imported from 3GU
R5‑184989 Update to test configuration tables and requirement tables for 12A-66A 2ULCA test cases. CGC Inc. imported from 3GU
R5‑184990 New Test Case for 36.579-6 - 6.1.1.8 NIST imported from 3GU
R5‑184991 Correction to Reference sensitivity level for CA UL Allocation in Table 7.3A.1.4.1-1 Intel Corporation (UK) Ltd imported from 3GU
R5‑184992 CPWG180802-1 LS on Over-the-Air Radiated Performance Testing for 5G mm-Wave (FR2) User Equipment CTIA 5G Millimeter-Wave OTA Sub-Working Group imported from 3GU
R5‑184993 Addition of test points for UL-CA_2A-12A in TC 6.3.2A.2 Dekra imported from 3GU
R5‑184994 Addition of test points for UL-CA_2A-12A in TC 6.3.5A.2.2 Dekra imported from 3GU
R5‑184995 WP UE Conformance Test Aspects - Requirements for a new UE category 1bis with single receiver based on category 1 for LTE Qualcomm Inc. imported from 3GU
R5‑184996 SR UE Conformance Test Aspects - Requirements for a new UE category 1bis with single receiver based on category 1 for LTE Qualcomm Inc. imported from 3GU
R5‑184997 LS from 5GAA for rel-15 2 RX vehicle mounted UE 5GAA WG2 imported from 3GU
R5‑184998 RAN5#79 WG Action Points ETSI Secretariat imported from 3GU
R5‑184999 MCC TF160 Status Report MCC TF160 imported from 3GU
R5‑185000 New WID for Rel-16 LTE CA Ericsson imported from 3GU
R5‑185001 Discussion paper on principles for defining NR test frequencies and selecting associated parameters for SS to signal Ericsson, Sprint, MCC TF160 imported from 3GU
R5‑185002 Correction to ATTACH ACCEPT message for SMS only ROHDE & SCHWARZ imported from 3GU
R5‑185003 Correction of 6.2.3.2 Test Frequency for CA_3A-27A KT Corp. imported from 3GU
R5‑185004 Correction to Idle mode Inter-RAT G<>E test case 6.2.3.21 to allow optional IMS registration on EUTRAN cell Keysight Technologies UK Ltd, Samsung imported from 3GU
R5‑185005 Update of number of DL PDCP SDUs in test cases 7.1.7.1.x MediaTek Inc. imported from 3GU
R5‑185006 Update of DL 256QAM TCs for high UE DL Categories MediaTek Inc. imported from 3GU
R5‑185007 Correction to RRC TC 8.5.4.1 MediaTek Inc. imported from 3GU
R5‑185008 Correction to EMM test case 9.2.3.1.25 ROHDE & SCHWARZ, Qualcomm Incorporated imported from 3GU
R5‑185009 Correction to testcase 9.2.2.1.9 for CAT-M1 UEs ROHDE & SCHWARZ, Qualcomm Incorporated imported from 3GU
R5‑185010 Update of EMM test case 9.2.3.2.17 Qualcomm Incorporated imported from 3GU
R5‑185011 Correction of clause 4.3.3.2.3 Ericsson imported from 3GU
R5‑185012 Clarification for NB-IoT test case 22.3.1.1 MCC TF160, Rohde&Schwarz imported from 3GU
R5‑185013 Correction to NB-IoT test case 22.5.8 ROHDE & SCHWARZ imported from 3GU
R5‑185014 Correction to NB-IoT test case 22.5.14 ROHDE & SCHWARZ, Qualcomm imported from 3GU
R5‑185015 Corrections to NBIOT NAS TC 22.5.7b CATT, TDIA, Starpoint imported from 3GU
R5‑185016 Correction to NB-IoT test cases 22.4.8 and 22.4.9 ANRITSU LTD imported from 3GU
R5‑185017 Correction to NB-IoT test cases 22.4.4, 22.4.8 and 22.4.9 ANRITSU LTD, Qualcomm imported from 3GU
R5‑185018 Correction to NB-IoT test case 22.2.9 ANRITSU LTD imported from 3GU
R5‑185019 Update to NB-IOT test case 22.1.1 M2 Qualcomm Incorporated, Anritsu, Rohde & Schwarz imported from 3GU
R5‑185020 Update to NB-IOT test case 22.3.1.2 Qualcomm Incorporated imported from 3GU
R5‑185021 Correction to NB-IoT testcase 22.3.3.5 ROHDE & SCHWARZ imported from 3GU
R5‑185022 Correction to NB-IoT test case 22.4.20a execution guideline Anritsu Ltd, Qualcomm imported from 3GU
R5‑185023 Updates of 6.2.3.2 Test Frequency for CA_8A-27A KT Corp. imported from 3GU
R5‑185024 Addition of new R15 CA configurations to 36.523-2 Bureau Veritas, Ericsson imported from 3GU
R5‑185025 Multi-PDN Handling in EN-DC Qualcomm Korea imported from 3GU
R5‑185026 ASN.1 Version Handling for NSA and SA Qualcomm Korea imported from 3GU
R5‑185027 Default channel bandwidth of new NR bands for non-CA signaling test cases NTT DOCOMO, INC., CMCC, KDDI Corporation, KT Corp., Orange, Telecom Italia S.p.A. imported from 3GU
R5‑185028 Add SRB1 and SRB2 with NR PDCP Ericsson imported from 3GU
R5‑185029 Update serving cell Ericsson, DOCOMO Communications Lab imported from 3GU
R5‑185030 Introduce SA RRC messages Ericsson imported from 3GU
R5‑185031 Correct IE FrequencyInfoDL Ericsson, DOCOMO Communications Lab imported from 3GU
R5‑185032 Introduce SA system information blocks Ericsson imported from 3GU
R5‑185033 Introduce SA other information elements Ericsson imported from 3GU
R5‑185034 Updates to PDCCH and SearchSpace configurations MCC TF160, NTT DOCOMO, INC. imported from 3GU
R5‑185035 Correct IE GSCN-ValueNR Ericsson, DOCOMO Communications Lab imported from 3GU
R5‑185036 Update of FR1 signal levels ANRITSU LTD imported from 3GU
R5‑185037 Addition of IP Connectivity check procedure Qualcomm Tech. Netherlands B.V, MCC TF160 imported from 3GU
R5‑185038 Introduce SA radio resource control information elements Ericsson imported from 3GU
R5‑185039 Update IE PhysicalCellGroupConfig Ericsson, DOCOMO Communications Lab imported from 3GU
R5‑185040 Introduce cell configurations and timer tolerances chapter headers Ericsson imported from 3GU
R5‑185041 Add IE SSB-MTC Ericsson, DOCOMO Communications Lab imported from 3GU
R5‑185042 Update BWP DOCOMO Communications Lab, Ericsson imported from 3GU
R5‑185043 Update PDSCH-Config DOCOMO Communications Lab. imported from 3GU
R5‑185044 Update PUCCH and PUSCH configuration DOCOMO Communications Lab. imported from 3GU
R5‑185045 Update RACH configuration DOCOMO Communications Lab. imported from 3GU
R5‑185046 Update CellGroupConfig DOCOMO Communications Lab. imported from 3GU
R5‑185047 Update CSI-MeasConfig DOCOMO Communications Lab. imported from 3GU
R5‑185048 Update MeasConfig DOCOMO Communications Lab. imported from 3GU
R5‑185049 Update other information elements DOCOMO Communications Lab. imported from 3GU
R5‑185050 Update RadioBearerConfig DOCOMO Communications Lab. imported from 3GU
R5‑185051 Specifying content for MeasResultSCG-Failure Samsung imported from 3GU
R5‑185052 Editorial correction to band representation of non-contiguous EN-DC band combination Keysight Technologies UK Ltd imported from 3GU
R5‑185053 Correction to RLC-Config IE Ericsson imported from 3GU
R5‑185054 Correction to RadioBearerConfig-DRB Ericsson imported from 3GU
R5‑185055 Corrections ard updates to BandCombinationList and Feature Set IEs Ericsson imported from 3GU
R5‑185056 Corrections and updates to UE Capability IEs Ericsson imported from 3GU
R5‑185057 Editorial updates to 38.509 Samsung, MCC TF160 imported from 3GU
R5‑185058 Addition of Test Loop for SDAP testing Motorola Mobility imported from 3GU
R5‑185059 Correction to NR MAC test case 7.1.1.3.2 Keysight Technologies UK Ltd imported from 3GU
R5‑185060 Addition of Correct Handling of DL HARQ process PDSCH Aggregation test case 7.1.1.2.2 Huawei, Hisilicon imported from 3GU
R5‑185061 Addition of NR CA reconfiguration test case 8.2.4.2.1.1 Huawei, Hisilicon imported from 3GU
R5‑185062 Addition of NR CA reconfiguration test case 8.2.4.2.1.2 Huawei, Hisilicon imported from 3GU
R5‑185063 Addition of Random access test case 7.1.1.1.4 Huawei, Hisilicon imported from 3GU
R5‑185064 Addition of 5GS NR SDAP test case 7.1.4.1 ROHDE & SCHWARZ imported from 3GU
R5‑185065 Correction to 5GS MAC Test case 7.1.1.1.2 Random access procedure / Successful / C-RNTI Based / Preamble selected by MAC itself Qualcomm Korea imported from 3GU
R5‑185066 Correction to 5GS MAC Test case 7.1.1.5.3 DRX operation / Short cycle configured / Parameters configured by RRC Qualcomm Korea imported from 3GU
R5‑185067 Correction to 5GS RLC Test case 7.1.2.3.10 AM RLC / Re-transmission of RLC PDU with and without re-segmentation Qualcomm Korea imported from 3GU
R5‑185068 Correction to 5GS RLC Test case 7.1.2.3.11 AM RLC / RLC re-establishment procedure Qualcomm Korea imported from 3GU
R5‑185069 Addition of NR CA / NR SCell addition / modification / release / Success test cases 8.2.4.1.1.1, 8.2.4.1.1.2 and 8.2.4.1.1.3 Qualcomm Korea imported from 3GU
R5‑185070 Corrections to RRC TC - Measurement configuration control and reporting / Inter-RAT measurements / Event B1 / Measurement of NR cells / EN-DC Qualcomm Tech. Netherlands B.V imported from 3GU
R5‑185071 Correction to 5GS RRC TC 8.2.4.3.1.1 TDIA, CATT imported from 3GU
R5‑185072 Addition of 5GS RRC TC 8.2.4.3.1.2 TDIA, CATT imported from 3GU
R5‑185073 Corrections to Layer 2 test cases Motorola Mobility, Huawei imported from 3GU
R5‑185074 Corrections to MAC test case 7.1.2.2.1 Motorola Mobility, MCC TF160 imported from 3GU
R5‑185075 Corrections to MAC test case 7.1.2.3.1 Motorola Mobility, MCC TF160 imported from 3GU
R5‑185076 Addition of new MAC RACH test case for PDCCH order Motorola Mobility imported from 3GU
R5‑185077 Addition of new MAC test case for Scell Activation Deactivation Motorola Mobility imported from 3GU
R5‑185078 Addition of new MAC UL TBS test case with transform precoding configured Motorola Mobility imported from 3GU
R5‑185079 Correction to default pre-test conditions for UM RLC test cases Keysight Technologies UK Ltd imported from 3GU
R5‑185080 New NAS test case 9.1.5.1.12 ROHDE & SCHWARZ imported from 3GU
R5‑185081 New NAS test case 9.1.6.1.4 ROHDE & SCHWARZ imported from 3GU
R5‑185082 Correction to NR PDCP test case 7.1.3.5.1 ANRITSU LTD imported from 3GU
R5‑185083 Correction to NR RLC test case 7.1.2.3.3 and 7.1.2.3.4 ANRITSU LTD imported from 3GU
R5‑185084 Update to TLS setup MCC TF160, Motorola Solutions UK Ltd. imported from 3GU
R5‑185085 Addition of UM condition to RLC-Bearer-Config IE Ericsson imported from 3GU
R5‑185086 Update to EPS SM Test case for Multi-PDN Qualcomm Inc. imported from 3GU
R5‑185087 Update to Emergency Call test case 19.1.3 for eCall category bit usage Qualcomm Incorporated imported from 3GU
R5‑185088 Adding SMS over IP configuration to applicabilities ROHDE & SCHWARZ imported from 3GU
R5‑185089 Corrections to RRC TC - Measurement configuration control and reporting / Inter-RAT measurements / Event B2 / Measurement of NR cells / EN-DC Intertek imported from 3GU
R5‑185090 CR of AM RLC test case 7.1.2.3.10 Huawei, Hisilicon imported from 3GU
R5‑185091 Update of RRC SCG failure TC 8.2.5.1.1 Samsung, Qualcomm imported from 3GU
R5‑185092 Update of RRC SCG failure TC 8.2.5.2.1 Samsung, Qualcomm imported from 3GU
R5‑185093 Update of RRC SCG failure TC 8.2.5.3.1 Samsung, Qualcomm imported from 3GU
R5‑185094 Update of RRC SCG failure TC 8.2.5.4.1 Samsung, Qualcomm imported from 3GU
R5‑185095 Addition of 5GS NR SDAP test case 7.1.4.2 Motorola Mobility imported from 3GU
R5‑185096 Update of 5GS NR RRC test case 8.2.3.6.1 ROHDE & SCHWARZ imported from 3GU
R5‑185097 Update of 5GS NR RRC test case 8.2.3.8.1 ROHDE & SCHWARZ imported from 3GU
R5‑185098 Update of 5GS NR RRC test case 8.2.1.1.1 ROHDE & SCHWARZ imported from 3GU
R5‑185099 L2 Preamble Parameter Update for Multi-PDN configuration Qualcomm Korea imported from 3GU
R5‑185100 Correction to NR RLC test cases 7.1.2.2.3 and 7.1.2.2.4 Keysight Technologies UK Ltd, MCC TF160 imported from 3GU
R5‑185101 Correction to NR RRC test case 8.2.3.14.1 Keysight Technologies UK Ltd imported from 3GU
R5‑185102 Addition of applicability and tests conditions for 5GC test cases 8.2.4.3.1.2, 8.2.4.3.1.3, 9.1.2.1 and 9.1.2.2 CATT, TDIA imported from 3GU
R5‑185103 Specifying content for SCGFailureInformationNR Samsung imported from 3GU
R5‑185104 Addition of reference dedicated EPS bearer context #7 for V2X testing CATT imported from 3GU
R5‑185105 Addition of Test Case:” LWA / T351 Expiry” to WLAN/3GPP Radio Level Integration and Interworking Enhancement Interworking Work Item Intel Corporation (UK) Ltd imported from 3GU
R5‑185106 Correction of Test Cases 8.2.5.4 and 8.2.5.5 Intel Corporation (UK) Ltd imported from 3GU
R5‑185107 Addition of new V2X test case 24.2.4 CAICT imported from 3GU
R5‑185108 Correction to V2X test case 24.1.12 CAICT imported from 3GU
R5‑185109 Correction to V2X test case 24.1.1, 24.1.3, 24.1.5, 24.1.6, 24.1.10 and 24.1.11 CAICT imported from 3GU
R5‑185110 New test case for V2X Sidelink using Tx parameters based on measured CBR and PPPP Sporton, TTA imported from 3GU
R5‑185111 New test case for V2X Sidelink with SL SPS Transmission Sporton, TTA imported from 3GU
R5‑185112 Correction to V2X TC 24.1.16 & 24.1.19 ROHDE & SCHWARZ, Qualcomm Incorporated imported from 3GU
R5‑185113 Addition of NB_IOTenh-UEConTest test case scenarios and default SIB content CATT, TDIA, Starpoint, Sporton imported from 3GU
R5‑185114 Correction to eNB-IoT test case 22.3.2.7 MCC TF160, TDIA imported from 3GU
R5‑185115 Addition to NB-IoT testcase 22.3.1.6a TDIA, CATT, Starpoint imported from 3GU
R5‑185116 Addition of new NB_IOTenh-UEConTest test case 22.3.1.8 CATT, TDIA, Starpoint imported from 3GU
R5‑185117 Addition of new NB_IOTenh-UEConTest test case 22.3.1.10 CATT, TDIA, Starpoint imported from 3GU
R5‑185118 Addition of new NB_IOTenh-UEConTest test case 22.4.24 CATT, TDIA, Starpoint imported from 3GU
R5‑185119 Addition of new NB_IOTenh-UEConTest test case 22.4.25 CATT, TDIA, Starpoint imported from 3GU
R5‑185120 New test case for NB-IoT UM RLC Sporton, TTA, TDIA imported from 3GU
R5‑185121 Addition of applicability and tests conditions for new Enhancements NB-IoT TC 22.3.2.6 Sporton imported from 3GU
R5‑185122 Corrections to MCPTT Authorization MCC TF160 imported from 3GU
R5‑185123 Adding a new Rel-14 TC on Private Call Call-Back Request / Client Originated (CO) / Private call call-back fulfilment Samsung imported from 3GU
R5‑185124 Adding a new Rel-14 TC on Private Call / Remotely initiated Ambient listening call Client Originated (CO) Samsung imported from 3GU
R5‑185125 Corrections to UE Test Loop Mode H MCC TF160 imported from 3GU
R5‑185126 Correction to SSAC connected mode test cases 13.5.1a and 13.5.3a for IMS Enabled UE Keysight Technologies UK Ltd imported from 3GU
R5‑185127 New Work Item Proposal: UE Conformance Test Aspects - Addition of Power Class 1 UE to bands B31/B72 for LTE Airbus DS SLC imported from 3GU
R5‑185128 New WID on UE Conformance Test Aspects - ProSe Support for Band 72 in LTE Airbus DS SLC imported from 3GU
R5‑185129 Update of UE test loop mode E Huawei,HiSilicon, CATT imported from 3GU
R5‑185130 Update of UE test loop mode E Huawei,HiSilicon, CATT imported from 3GU
R5‑185131 Reuse of demodulation setup for signalling tests in FR2 ANRITSU LTD imported from 3GU
R5‑185132 OTA Chamber requirements for 5G NR Signalling test cases Keysight Technologies UK Ltd imported from 3GU
R5‑185133 Correction of clause 4.3.3.2.3 Ericsson imported from 3GU
R5‑185134 Draft TR 38.905 v1.0.0 Ericsson LM imported from 3GU
R5‑185135 Correction to 10.7.4 regarding CE mode ROHDE & SCHWARZ imported from 3GU
R5‑185136 Update EPS Session Management test case in section 10 of TS 36.523-1. FirstNet, AT&T imported from 3GU
R5‑185137 Update to applicability condition of Intra-frequency measurement reporting test cases for CAT-M1 UEs Qualcomm Incorporated imported from 3GU
R5‑185138 Removal of 1xPre-Registation and 1xCSFB test cases applicability Qualcomm Incorporated imported from 3GU
R5‑185139 Routine maintenance for TS 36.523-3 MCC TF160 imported from 3GU
R5‑185140 New CA band combination CA_1A-3A-7A-20A - Update of table A.4.3.3.3-5 Vodafone GmbH imported from 3GU
R5‑185141 Correction to V2V TC 24.1.2 ROHDE & SCHWARZ, Qualcomm Incorporated imported from 3GU
R5‑185142 Draft TS 36.579-6 v0.0.3 Samsung imported from 3GU
R5‑185143 Draft TS 36.579-7 v0.0.3 Samsung imported from 3GU
R5‑185144 Draft TS 38.521-2 v1.0.0 Rapp imported from 3GU
R5‑185145 Draft TS 38.521-3 v1.0.0 Rapp imported from 3GU
R5‑185146 Draft TR 38.903 v1.0.0 Rapp imported from 3GU
R5‑185147 LS Concerning RAN5 Response to ITU-R Working Party 5D LS on definition of test methods for OTA unwanted emissions of IMT radio equipment TSG WG RAN5 imported from 3GU
R5‑185148 Addition of NR CA reconfiguration test case 8.2.4.2.1.3 Huawei, Hisilicon imported from 3GU
R5‑185149 Corrections to RRC TC - PSCell addition, modification and release / SCG DRB / EN-DC Qualcomm Tech. Netherlands B.V imported from 3GU
R5‑185150 Corrections to RRC TC - Bearer Modification / Handling for bearer type change with security key change / EN-DC Qualcomm Tech. Netherlands B.V imported from 3GU
R5‑185151 Corrections to RRC TC - Bearer Modification / Uplink data path / Split DRB Reconfiguration / EN-DC Qualcomm Tech. Netherlands B.V imported from 3GU
R5‑185152 Addition of new MAC test case for Power Headroom report Motorola Mobility imported from 3GU
R5‑185153 Addition of RRC Default Pre-test conditions for NSA Qualcomm Korea imported from 3GU
R5‑185154 Correction to RRC TC - Measurement configuration control and reporting / Event A1 / Measurement of NR PSCell / EN-DC Qualcomm Incorporated imported from 3GU
R5‑185155 Updates to NAS test case 10.2.1.2 Ericsson LM imported from 3GU
R5‑185156 EN-DC: Test Model updates MCC TF160 imported from 3GU
R5‑185157 Update of NR test cases title and applicability Qualcomm Incorporated imported from 3GU
R5‑185158 Update Reference Table 6.6.2-1A dedicated EPS bearer contexts FirstNet, AT&T imported from 3GU
R5‑185159 Correction to CAT-M1 Test case 8.2.4.27 Anritsu Ltd., Nordic Semiconductor ASA imported from 3GU
R5‑185160 Addition of new V2X test case 24.2.4 CAICT imported from 3GU
R5‑185161 Addition of PICS Motorola Mobility imported from 3GU
R5‑185162 Addition of missing and new test cases applicabilities Motorola Mobility imported from 3GU
R5‑185163 Modified RRC_Connected procedure for Multi PDN throughout the test case. Qualcomm Korea, Ericsson imported from 3GU
R5‑185164 Update RRCConnectionReconfiguration message for EN-DC Ericsson, Qualcomm Inc. imported from 3GU
R5‑185165 Update EN-DC Generic Procedure Parameter for Multi-PDN addition throughout Test Case Qualcomm Korea imported from 3GU
R5‑185166 Modification of EPS & Data Radio Bearer ID mapping for EN-DC Test cases Qualcomm Korea imported from 3GU
R5‑185167 Update to EPS SM Test case for Multi-PDN Qualcomm Inc. imported from 3GU
R5‑185168 Introduction of OTA signaling test environment Keysight Technologies UK Ltd, Anritsu Ltd imported from 3GU
R5‑185169 Update of number of DL PDCP SDUs in test cases 7.1.7.1.x MediaTek Inc. imported from 3GU
R5‑185170 Meeting notes of offline discussion on FR2 UE common test setup Anritsu imported from 3GU
R5‑185171 Updates to PDCCH and SearchSpace configurations MCC TF160, NTT DOCOMO, INC. imported from 3GU
R5‑185172 EN-DC: Test Model updates MCC TF160 imported from 3GU
R5‑185173 Test Frequencies Sprint Corporation, Ericsson imported from 3GU
R5‑185174 Reference sensitivity requirements for CA_66A-66A-70C-71A, CA_66A-66A-70A-71A, CA_66A-70C-71A, CA_66A-70A-71A, CA_66A-66A-71A, CA_70A-71A, CA_66A-71A, CA_66C-70C-71A, CA_66C-70A-71A, CA_70C-71A, CA_66C-71A WE Certification Oy, DISH Network imported from 3GU
R5‑185175 Update 3UL CA test cases 6.2.2A.4 and 6.5.1A.4 CGC Inc. imported from 3GU
R5‑185176 Update to test configuration tables and requirement tables for 12A-66A 2ULCA test cases. CGC Inc. imported from 3GU
R5‑185177 Introduction of test frequencies for signalling testing in clause 6 Ericsson, TF160 imported from 3GU
R5‑185178 Addition of Test frequency for EN-DC B1_n78 Qualcomm Korea imported from 3GU
R5‑185179 Meeting notes of offline discussion on FR2 UE common test setup Anritsu imported from 3GU
R5‑185180 Routine maintenance for TS 36.523-3 MCC TF160 imported from 3GU
R5‑185181 WP - UE Conformance Test Aspects - eHST CMCC imported from 3GU
R5‑185182 SR - eHST after RAN5#80 CMCC imported from 3GU
R5‑185184 Addition of V2X new TC 12.2.2 Huawei,HiSilicon, Rohde & Schwarz imported from 3GU
R5‑185185 Band 41 HPUE Maximum Output Power CMCC imported from 3GU
R5‑185186 4Rx support in some 4DL CA and 5DL CA Demodulation test cases Ericsson imported from 3GU
R5‑185187 FR2_RefSens_TestConfig_38.521-2 Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑185188 DL and UL RMC updated for FR2 tests Bureau Veritas imported from 3GU
R5‑185189 Downlink physical channel updated for FR2 tests Bureau Veritas imported from 3GU
R5‑185190 OCNG Patterns updated for FR2 tests Bureau Veritas imported from 3GU
R5‑185191 Update to Occupied Bandwidth, SEM and ACLR test cases in TS 38.521-2 Keysight Technologies UK Ltd imported from 3GU
R5‑185192 Update to ACS and inband blocking test cases in TS 38.521-2 Keysight Technologies UK Ltd imported from 3GU
R5‑185193 Addition of Annex Global In-Channel TX-Test to 38.521-2 ROHDE & SCHWARZ imported from 3GU
R5‑185194 Update to Test frequencies for SEM in TS 38.521-2 ROHDE & SCHWARZ imported from 3GU
R5‑185195 Addition of EVM test case to TS 38.521-2 ROHDE & SCHWARZ imported from 3GU
R5‑185196 Addition of Carrier Leakage test case to TS 38.521-2 ROHDE & SCHWARZ imported from 3GU
R5‑185197 Introduction of maximum output power test cases Ericsson imported from 3GU
R5‑185198 Addition of 6.2B.4.1.4 Configured OP for Inter-Band EN-DC including FR2 Huawei,HiSilicon imported from 3GU
R5‑185199 Addition of 6.2B.4.1.5 Configured OP for Inter-Band EN-DC including both FR1 and FR2 Huawei,HiSilicon imported from 3GU
R5‑185200 TP for updating test case 6.5B.2.1.2 Additional spectrum emission mask for intra-band contigous EN-DC Ericsson LM imported from 3GU
R5‑185201 Introduction of TC 7.4B.1 Huawei, Hisilicon imported from 3GU
R5‑185202 Introduction of 7.4B.2 Huawei, Hisilicon imported from 3GU
R5‑185203 Introduction of 7.4B.3 Huawei, Hisilicon imported from 3GU
R5‑185204 5G NR_EN_DC with FR1_Text update for RX sensitivity Qualcomm Incorporated imported from 3GU
R5‑185205 5G NR_EN_DC with FR1_Text_proposal for_TX_Spurious_emission Qualcomm Incorporated imported from 3GU
R5‑185206 Addition of TC6.3B.1.1 Minimum Output power for intra-band contiguous EN-DC SGS Wireless imported from 3GU
R5‑185207 Addition of TC6.3B.1.2 Minimum output power for intra-band non-contiguous EN-DC SGS Wireless imported from 3GU
R5‑185208 Addition of TC6.3B.1.3 Minimum output power for inter-band EN-DC within FR1 SGS Wireless imported from 3GU
R5‑185209 TP for Clause 4.1.1 of TS 38.522 CMCC imported from 3GU
R5‑185210 TP for Clause 4.1.2 of TS 38.522 CMCC imported from 3GU
R5‑185211 TP for Clause 4.1.3 of TS 38.522 CMCC imported from 3GU
R5‑185212 pCR Adding MU values for EIRPTRP measurements with Near Field test range at mmWave MVG Industries imported from 3GU
R5‑185213 pCR Making Measurement Uncertainty Terms Common between methods in TR 38.90 MVG Industries imported from 3GU
R5‑185214 TP on Measurement Uncertainty Contributions in FR2 ROHDE & SCHWARZ imported from 3GU
R5‑185215 TP for updating TR 38.905 with FR2 SEM test point analysis ROHDE & SCHWARZ imported from 3GU
R5‑185216 TP for updating TR38.905 with UE AMPR for NS_04 Intra-band contigous EN-DC Ericsson LM imported from 3GU
R5‑185250 Introduction of test frequencies for NR band n1 Ericsson imported from 3GU
R5‑185251 Introduction of test frequencies for NR band n2 Ericsson imported from 3GU
R5‑185252 Introduction of test frequencies for NR band n3 Ericsson imported from 3GU
R5‑185253 Introduction of test frequencies for NR band n5 Ericsson imported from 3GU
R5‑185254 Introduction of test frequencies for NR band n7 Ericsson imported from 3GU
R5‑185255 Introduction of test frequencies for NR band n8 Ericsson imported from 3GU
R5‑185256 Introduction of test frequencies for NR band n12 Ericsson imported from 3GU
R5‑185257 Introduction of test frequencies for NR band n20 Ericsson imported from 3GU
R5‑185258 Introduction of test frequencies for NR band n25 Ericsson imported from 3GU
R5‑185259 Introduction of test frequencies for NR band n28 Ericsson imported from 3GU
R5‑185260 Introduction of test frequencies for NR band n34 Ericsson imported from 3GU
R5‑185261 Introduction of test frequencies for NR band n38 Ericsson imported from 3GU
R5‑185262 Introduction of test frequencies for NR band n39 Ericsson imported from 3GU
R5‑185263 Introduction of test frequencies for NR band n40 Ericsson imported from 3GU
R5‑185264 Update of test frequencies for NR band n41 Ericsson, Sprint imported from 3GU
R5‑185265 Introduction of test frequencies for NR band n51 Ericsson imported from 3GU
R5‑185266 Introduction of test frequencies for NR band n66 Ericsson, Dish Network imported from 3GU
R5‑185267 Introduction of test frequencies for NR band n70 Ericsson, Dish Network imported from 3GU
R5‑185268 Update of test frequencies for NR band n71 Ericsson, Dish Network imported from 3GU
R5‑185269 Introduction of test frequencies for NR band n75 Ericsson imported from 3GU
R5‑185270 Introduction of test frequencies for NR band n76 Ericsson imported from 3GU
R5‑185300 LS on RAN4-RAN5 5G-NR RF pending issues during RAN5#80 TSG WG RAN5 imported from 3GU
R5‑185301 Discussion on test point selection for NR Out-of-band in FR1 CAICT imported from 3GU
R5‑185302 Addition of TC6.3B.1.1 Minimum Output power for intra-band contiguous EN-DC SGS Wireless imported from 3GU
R5‑185303 Addition of TC6.3B.1.2 Minimum output power for intra-band non-contiguous EN-DC SGS Wireless imported from 3GU
R5‑185304 Addition of TC6.3B.1.3 Minimum output power for inter-band EN-DC within FR1 SGS Wireless imported from 3GU
R5‑185305 Update of FR1 test case 6.2.1 Huawei,HiSilicon imported from 3GU
R5‑185306 Discussion on starting point of 200ms in FR1 RF test procedures Huawei,HiSilicon, Keysight imported from 3GU
R5‑185307 TP for updating TR38.905 with FR1 AMPR test point analyses with NS_35 Ericsson LM imported from 3GU
R5‑185308 Discussion on the test applicability for the modulation of Pi/2-BPSK Huawei, Hisilicon imported from 3GU
R5‑185309 Test Point analysis for FR1 Configured Output Power for SUL Huawei,HiSilicon imported from 3GU
R5‑185310 Discussion on test point selection for Carrier Leakage in FR1 ROHDE & SCHWARZ imported from 3GU
R5‑185311 TP for updating TR 38.905 with FR1 Carrier Leakage test point analysis ROHDE & SCHWARZ imported from 3GU
R5‑185312 Update to carrier leakage test case in TS 38.521-1 ROHDE & SCHWARZ imported from 3GU
R5‑185313 Discussion on test point selection for EVM equalizer spectrum flatness in FR1 ROHDE & SCHWARZ imported from 3GU
R5‑185314 TP for updating TR 38.905 with FR1 EVM equalizer spectrum flatness test point analysis ROHDE & SCHWARZ imported from 3GU
R5‑185315 Update to EVM equalizer spectrum flatness test case in TS 38.521-1 ROHDE & SCHWARZ imported from 3GU
R5‑185316 TP for updating TR 38.905 with FR1 Frequency Error test point analysis ROHDE & SCHWARZ imported from 3GU
R5‑185317 Update to Frequency Error test case in TS 38.521-1 ROHDE & SCHWARZ imported from 3GU
R5‑185318 Discussion on test point selection for In-band Emissions test case in FR1 ROHDE & SCHWARZ imported from 3GU
R5‑185319 TP for updating TR 38.905 with FR1 In-band Emissions test point analysis ROHDE & SCHWARZ imported from 3GU
R5‑185320 Update to In-band Emissions test case in TS 38.521-1 ROHDE & SCHWARZ imported from 3GU
R5‑185321 TP to TS38.521-1:Operating bands and channel arrangement China Unicom imported from 3GU
R5‑185322 Addition of FR1 test case 6.2.4 Huawei,HiSilicon imported from 3GU
R5‑185323 Update of FR1 test case 6.3.1 Huawei,HiSilicon imported from 3GU
R5‑185324 Addition of Uplink Physical Channels in Annex Huawei, Hisilicon imported from 3GU
R5‑185325 5G_FR1_Text_update for_RF_sensitivity_for_SUL_operation Qualcomm Incorporated imported from 3GU
R5‑185326 Update to EVM test case in TS 38.521-1 ROHDE & SCHWARZ imported from 3GU
R5‑185327 Addition of Annex Global In-Channel TX-Test to 38.521-1 ROHDE & SCHWARZ imported from 3GU
R5‑185328 Discussion on the way to write Clause 7.4 Maximum Input Level and Clause 7.5 Adjacent Channel Selectivity in TS 38.521-3 CMCC, HUAWEI imported from 3GU
R5‑185329 Add Clause 7.5 into TS 38.521-3 CMCC imported from 3GU
R5‑185330 Addition of test points for UL-CA_4A-12A in TC 6.3.2A.2 DEKRA imported from 3GU
R5‑185331 Addition of test points for UL-CA_4A-12A in TC 6.3.5A.2.2 DEKRA imported from 3GU
R5‑185332 Addition of 6.2B.4.1.1 Configured OP for Intra-Band Contiguous EN-DC Huawei,HiSilicon imported from 3GU
R5‑185333 Addition of 6.2B.4.1.2 Configured OP for Intra-Band Non-Contiguous EN-DC Huawei,HiSilicon imported from 3GU
R5‑185334 Discussion of LTE Test point selection for EN-DC with FR1 Tx Spurious emission Test Qualcomm Inc. imported from 3GU
R5‑185335 Estimation of measurement uncertainty for FR2 TRx test cases Anritsu imported from 3GU
R5‑185336 Removing brackets from MU values in FR2 Anritsu imported from 3GU
R5‑185337 Test Tolerance: Updates to Cat1bis intra-frequency CGI Event triggered reporting tests, Annex E and Annex F Qualcomm UK Ltd imported from 3GU
R5‑185338 Test Tolerances analysis for E-UTRAN FDD-FDD and TDD-TDD inter-frequency TC 8.3.1_2, 8.3.2_2, 8.4.1_2, 8.4.2_2 and 8.4.6_2 for UE category 1bis Qualcomm UK Ltd imported from 3GU
R5‑185339 Test Tolerances analysis for E-UTRAN FDD-FDD and TDD-TDD inter-frequency TC 8.3.3_2 and 8.4.3_2 for UE category 1bis when L3 filtering is used Qualcomm UK Ltd imported from 3GU
R5‑185340 Test Tolerances analysis for E-UTRAN FDD-FDD intra-frequency event triggered reporting under fading propagation conditions in asynchronous cells for UE category 1bis Qualcomm UK Ltd imported from 3GU
R5‑185341 Test Tolerances analysis for E-UTRAN FDD-FDD and TDD-TDD intra-frequency TC 8.1.12_2, 8.1.13_2, 8.1.17_2, 8.1.18_2 for UE category 1bis Qualcomm UK Ltd imported from 3GU
R5‑185342 Editorial cleaning up of Rel-14 CA 5DL RSRP measurement TC 9.1.51 Huawei,HiSilicon imported from 3GU
R5‑185343 New CA band combination CA_1A-3A-7A-20A - Update of table 7.3A.5, 7.3A.9 and refsens Vodafone GmbH imported from 3GU
R5‑185344 New CA band combination CA_1A-3A-7A-20A - Update of table A.4.6.3-5 Vodafone GmbH imported from 3GU
R5‑185345 New CA band combination CA_1A-3A-7A-20A - Update of test point analysis Vodafone GmbH imported from 3GU
R5‑185347 Discussion on FR2 TRx spurious test procedure Anritsu imported from 3GU
R5‑185348 Correction to FR2 Spurious TC and inroduction of TRP measurement grid requirement Anritsu imported from 3GU
R5‑185349 Discussion on test point selection for Frequency Error in FR2 ROHDE & SCHWARZ imported from 3GU
R5‑185350 Addition of Frequency Error test case to TS 38.521-2 ROHDE & SCHWARZ imported from 3GU
R5‑185351 Update across EN-DC RF test cases in TS 38.521-3 Qualcomm Wireless GmbH imported from 3GU
R5‑185352 pCR Adding MU values for EIRPTRP measurements with Near Field test range at mmWave MVG Industries imported from 3GU
R5‑185353 Addition of Annex Global In-Channel TX-Test to 38.521-2 ROHDE & SCHWARZ imported from 3GU
R5‑185354 Update of V2V TCs 6.5.2.3G.1 & 6.5.2.4G & 6.6.2.2G.1& 6.6.3G.1 Huawei, Hisilicon imported from 3GU
R5‑185355 Update to test case 6.3.2G.1 for V2V services based on LTE sidelink KTL imported from 3GU
R5‑185356 Update of Additional Maximum Power Reduction (A-MPR) for V2X Communication / Non-concurrent with E-UTRA uplink transmissions LG Electronics imported from 3GU
R5‑185357 Update to Annex G for V2V/V2X Demod Perf tests Qualcomm Wireless GmbH imported from 3GU
R5‑185358 Update of multiple V2V RF test cases for proper test mode setting Huawei,HiSilicon imported from 3GU
R5‑185359 Correction of the title for OTDOA IOT tests ROHDE & SCHWARZ imported from 3GU
R5‑185360 Update of V2X TCs 6.6.3G.2_1 & 6.6.3G.3_1 Huawei, Hisilicon imported from 3GU
R5‑185361 Update of V2X TCs 6.6.3G.2 & 6.6.3G.3 Huawei, Hisilicon imported from 3GU
R5‑185362 Correction to 36521-1-chapter 6_V2V and V2X Tejet imported from 3GU
R5‑185363 Cleaning up V2X test cases in TS 36.521-1 Huawei,HiSilicon imported from 3GU
R5‑185364 Update to test case 6.3.2G.2 for LTE-based V2X Services KTL imported from 3GU
R5‑185365 Update to test case 6.3.2G.3 for LTE-based V2X Services KTL imported from 3GU
R5‑185366 Update of V2X test case 6.7G.2 SRTC imported from 3GU
R5‑185367 Addition of new TC 6.6.2.3G.2 SRTC imported from 3GU
R5‑185368 Introduction of new V2X test case 6.5.2.1G.2 Error Vector Magnitude (EVM) for V2X Communication / Simultaneous E-UTRA V2X sidelink and E-UTRA uplink transmissions CAICT imported from 3GU
R5‑185369 Introduction of new V2X test case 6.5.2.1G.3 Error Vector Magnitude (EVM) for V2X Communication / Intra-band contiguous multi-carrier operation CAICT imported from 3GU
R5‑185370 Update to Additional Maximum Power Reduction (A-MPR) for V2X Communication / Simultaneous E-UTRA V2X sidelink and E-UTRA uplink transmissions LG Electronics imported from 3GU
R5‑185371 Updates to Align Initial Conditions with Other V2X Test Cases PCTEST Engineering Lab imported from 3GU
R5‑185372 Update of V2X Receiver Test Cases SGS Wireless imported from 3GU
R5‑185373 Update of V2X RRM SGS Wireless, Huawei imported from 3GU
R5‑185374 Addition of test applicabilities of multiple V2X test cases Huawei,HiSilicon imported from 3GU
R5‑185375 Correction to 4x4 CA demodulation tests Anritsu imported from 3GU
R5‑185376 Add a new test condition for test case 8.13.3.1.2.5. CGC Inc. imported from 3GU
R5‑185377 TS 36.521-1 Annex F update for UE cat 1bis test cases Qualcomm Incorporated imported from 3GU
R5‑185378 LTE_New test case LTE_New test case 6.3.4EB ONOFF time mask for UE category 1bis Qualcomm Incorporated imported from 3GU
R5‑185379 LTE_New test case 6.3.5EB Power Control for UE category 1bis Qualcomm Incorporated imported from 3GU
R5‑185380 LTE_New test case 6.3.2EB Minimum Output Power for UE category 1bis Qualcomm Incorporated imported from 3GU
R5‑185381 LTE_New test case 6.2.4EB Additional Maximum Power Reduction (A-MPR) for UE category 1bis Qualcomm Incorporated imported from 3GU
R5‑185382 LTE_New test case 6.3.3EB UE Transmit OFF power for UE category 1bis Qualcomm Incorporated imported from 3GU
R5‑185383 LTE_New test case 6.2.5EB Configured UE transmitted Power for UE category 1bis Qualcomm Incorporated imported from 3GU
R5‑185384 LTE_New test case 6.2.3EB Maximum Power Reduction (MPR) for UE category 1bis Qualcomm Incorporated imported from 3GU
R5‑185385 Cat1bis new RF test case: Transmit intermodulation for UE category 1bis Qualcomm Austria imported from 3GU
R5‑185386 Completion of Chapter 7 RRM cat 1bis test cases Qualcomm UK Ltd imported from 3GU
R5‑185387 Introduction of FDD PDSCH Single-layer Spatial Multiplexing for FD-MIMO TTA imported from 3GU
R5‑185388 Introduction of TDD PDSCH Single-layer Spatial Multiplexing for FD-MIMO TTA imported from 3GU
R5‑185389 Applicabilities addition of test cases 8.3.1.1.9 and 8.3.2.1.10 TTA imported from 3GU
R5‑185390 DL and UL RMC updated for FR1 tests Bureau Veritas imported from 3GU
R5‑185391 Test Tolerance: Updates to Cat1bis inter frequency RSRP accuracy tests and Annex F Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑185392 Test Tolerance: Updates to Cat1bis inter frequency RSRQ accuracy tests and Annex F Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑185393 Test Tolerance: Updates to Cat1bis intra frequency RSRP accuracy tests and Annex F Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑185394 Test Tolerance: Updates to Cat1bis intra frequency RSRQ accuracy tests and Annex F Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑185395 Test Tolerance Analysis for RRM TC 9.1.1.1_2 and 9.1.2.1_2 Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑185396 Test Tolerance Analysis for RRM TC 9.1.1.2_2 and 9.1.2.2_2 Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑185397 Test Tolerance Analysis for RRM TC 9.1.3.1_2 and 9.1.4.1_2 Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑185398 Test Tolerance Analysis for RRM TC 9.1.3.2_2 and 9.1.4.2_2 Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑185399 Test Tolerance Analysis for RRM TC 9.1.5.1_2 Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑185400 Test Tolerance Analysis for RRM TC 9.1.5.2_2 Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑185401 Test Tolerance Analysis for RRM TC 9.2.3.1_2 and 9.2.4.1_2 Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑185402 Test Tolerance Analysis for RRM TC 9.2.3.2_2 and 9.2.4.2_2 Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑185403 Test Tolerance Analysis for RRM TC 9.2.4A.1_2 Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑185404 Test Tolerance Analysis for RRM TC 9.2.4A.2_2 Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑185405 Test Tolerance Analysis for RRM TC 9.2.1.1_2 and 9.2.2.1_2 Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑185406 Introduction of Additional spurious emissions for UL 256QAM TTA imported from 3GU
R5‑185407 Addition of applicability for TC6.6.3.3_2 TTA imported from 3GU
R5‑185408 TP for updating test case 6.2.3 UE AMPR Ericsson LM imported from 3GU
R5‑185409 Addition of NB-IOT Guardband Test Frequencies for 10 MHz ROHDE & SCHWARZ imported from 3GU
R5‑185410 Discussion on approach for defining EN-DC tests in TS 38.521-3 Qualcomm Wireless GmbH imported from 3GU
R5‑185411 Update of FR1 test case 6.2.2 CAICT imported from 3GU
R5‑185412 TP for updating TR 38.905 with EVM test point analysis ROHDE & SCHWARZ imported from 3GU
R5‑185413 5G NR_FR1_Text_update for TX Spurious Emission Qualcomm Incorporated imported from 3GU
R5‑185414 Update to Occupied Bandwidth, SEM and ACLR test cases in TS 38.521-1 Keysight Technologies UK Ltd imported from 3GU
R5‑185415 Update to ACS and in-band blocking test cases in TS 38.521-1 Keysight Technologies UK Ltd imported from 3GU
R5‑185416 Correction to nrs-CRS-PowerOffset-r13 for NB-IOT OTDOA tests ROHDE & SCHWARZ imported from 3GU
R5‑185417 NB-IOT OTDOA reporting delay test cases not testable ROHDE & SCHWARZ imported from 3GU
R5‑185418 Correction of the applicability for OTDOA IOT tests ROHDE & SCHWARZ imported from 3GU
R5‑185419 Changes to eMTC OTDOA tests ROHDE & SCHWARZ imported from 3GU
R5‑185420 Addition of Assistance Data for OTDOA eMTC tests ROHDE & SCHWARZ imported from 3GU
R5‑185421 Addition of missing assistance data for modernized GPS and the GPS L5 signal for LTE minimum performance sub-test 4 Spirent Communications imported from 3GU
R5‑185422 Alignment of Annex numbering with core spec Qualcomm Wireless GmbH imported from 3GU
R5‑185423 Discussion on Uplink configuration for NR Transmit Intermodulation in FR1 KTL imported from 3GU
R5‑185424 Addition of TT analysis of eHST FDD Intra-frequency event reporting. Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑185425 Addition of TT analysis of V2X uplink timing test case Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑185426 New test case: 6.2.3A.3_2, Maximum Power Reduction (MPR) for CA (intra-band non-contiguous DL CA and UL CA) for UL 256QAM Ericsson imported from 3GU
R5‑185427 New UL 256QAM test case: 6.6.2.2_2 Additional Spectrum Emission Mask for UL 256QAM Ericsson imported from 3GU
R5‑185428 Applicability for New UL 256QAM test cases: 6.6.2.2_2 and 6.6.2.3A.3_2 Ericsson imported from 3GU
R5‑185429 Test Point Analysis for Reference sensitivity level for EN-DC Qualcomm Incorporated imported from 3GU
R5‑185430 TP for updating TR38.905 with UE AMPR for NS_04 Intra-band contigous EN-DC Ericsson LM imported from 3GU
R5‑185431 eLAA_correction to 6.3.5A.1.2 and 6.3.5A.2.2 Tejet imported from 3GU
R5‑185432 eLAA_Update to 6.6.3.1A.2 Tejet imported from 3GU
R5‑185433 eLAA: Updates to Adjacent Channel Leakage power Ratio for CA Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑185434 Addition of new UL 256QAM test case - A-MPR for 2UL CA intra-band contiguous CETECOM GmbH imported from 3GU
R5‑185435 Correction of test points and test requirements for TC 6.2.4A.2_1 CETECOM GmbH imported from 3GU
R5‑185436 Correction of test points and test requirements for TC 6.2.4A.2 CETECOM GmbH imported from 3GU
R5‑185437 Test point and test requirements analysis for CA_3A-41A, 41A-42A,3A-42A spurious test cases Huawei, Hisilicon imported from 3GU
R5‑185438 Introcution of V2X TC 6.5.2.4G.3 Huawei, Hisilicon imported from 3GU
R5‑185439 Updation of V2X TC 6.6.2.2G.2 Huawei, Hisilicon imported from 3GU
R5‑185440 Updation of V2X TCs 6.5.2.3G.2 and 6.5.2.3G.3 Huawei, Hisilicon imported from 3GU
R5‑185441 TT statements for V2X TCs Huawei, Hisilicon imported from 3GU
R5‑185442 Applicability and ICS for CA RF and RRM test cases Bureau Veritas, Ericsson LM, KT Corp., Vodafone GmbH, Huawei,HiSilicon, SRTC, KDDI Corporation, SGS Wireless, CGC Inc. imported from 3GU
R5‑185443 Correction to power level for FR1 RF tests Anritsu imported from 3GU
R5‑185444 Updates of FR1 TRx MU in Annex F NTT DOCOMO, INC. imported from 3GU
R5‑185445 Update to FR1 test case 6.5.4 Transmit intermodulation KTL, MTCC imported from 3GU
R5‑185446 Introduction of 6.2C.1 Configured transmitted power for SUL Huawei, Hisilicon imported from 3GU
R5‑185447 5G_NR FR1_Text_update for_RX_sensitivity Qualcomm Incorporated imported from 3GU
R5‑185448 Corrections to A-MPR values for NS_27 Rohde & Schwarz imported from 3GU
R5‑185449 Correction to Figure A.64 to cater for CC >= 3 Anritsu imported from 3GU
R5‑185450 Correction to message exception for 8.2.1.4.2_A.4 Anritsu imported from 3GU
R5‑185451 Editorial correction to RMC name in PHICH demodulation test Anritsu imported from 3GU
R5‑185452 Corrections to CA Test Configuration Table in section 7 Anritsu imported from 3GU
R5‑185453 Addition of applicability of RRM IncMon test cases Ericsson imported from 3GU
R5‑185454 Addition of antenna diagrams for IncMon RRM test cases Ericsson imported from 3GU
R5‑185455 Addition of message content for RRM IncMon test cases Ericsson imported from 3GU
R5‑185456 TC Group definition for RRM IncMon test cases Ericsson imported from 3GU
R5‑185457 Addition of RRM IncMon new Test Case 8.4.8 Ericsson imported from 3GU
R5‑185458 Addition of RRM IncMon new Test Case 8.4.9 Ericsson imported from 3GU
R5‑185459 Addition of RRM IncMon new Test Case 8.5.8 Ericsson imported from 3GU
R5‑185460 Addition of RRM IncMon new Test Case 8.6.3 Ericsson imported from 3GU
R5‑185461 Addition of RRM IncMon new Test Case 8.7.5 Ericsson imported from 3GU
R5‑185462 Addition of RRM IncMon new Test Case 8.7A.1 Ericsson imported from 3GU
R5‑185463 Addition of RRM IncMon new Test Cases 4.2.1 and 4.2.11 Ericsson imported from 3GU
R5‑185464 Addition of RRM IncMon new Test Case 4.3.1.5 Ericsson imported from 3GU
R5‑185465 Addition of RRM IncMon new Test Case 4.3.2A Ericsson imported from 3GU
R5‑185466 Addition of RRM IncMon new Test Case 4.3.3A Ericsson imported from 3GU
R5‑185467 Addition of RRM IncMon new Test Case 4.3.4.4 Ericsson imported from 3GU
R5‑185468 Discussion on approach for defining EN-DC tests in TS 38.521-3 Qualcomm Wireless GmbH imported from 3GU
R5‑185469 TP for updating test case 6.2B.3.1 UE AMPR for Intra-band contigous EN-DC Ericsson LM imported from 3GU
R5‑185470 TP for updating test case 6.2B.3.2 UE AMPR for Intra-band non-contigous EN-DC Ericsson LM imported from 3GU
R5‑185471 TP for updating test case 6.5B.2.1.2 Additional spectrum emission mask for intra-band contigous EN-DC Ericsson LM imported from 3GU
R5‑185472 Update of TC 6.2B.1.1 Huawei, Hisilicon imported from 3GU
R5‑185473 Introduction of TC 6.2B.1.2 Huawei, Hisilicon imported from 3GU
R5‑185474 Update of 6.2B.1.3 Huawei, Hisilicon imported from 3GU
R5‑185475 Introduction of TC 7.4B.1 Huawei, Hisilicon imported from 3GU
R5‑185476 Introduction of 7.4B.2 Huawei, Hisilicon imported from 3GU
R5‑185477 Introduction of 7.4B.3 Huawei, Hisilicon imported from 3GU
R5‑185478 Discussion on OBW, SEM and ACLR for EN-DC interband FR1 Keysight Technologies UK Ltd imported from 3GU
R5‑185479 Update Occupied Bandwidth for interband EN-DC within FR1 Keysight Technologies UK Ltd imported from 3GU
R5‑185480 Update SEM interband EN-DC within FR1 Keysight Technologies UK Ltd imported from 3GU
R5‑185481 Update ACLR for interband EN-DC within FR1 Keysight Technologies UK Ltd imported from 3GU
R5‑185482 5G NR_EN_DC with FR1_Text update for RX sensitivity Qualcomm Incorporated imported from 3GU
R5‑185483 Editorial corrections 9.1.46 ROHDE & SCHWARZ imported from 3GU
R5‑185484 Editorial corrections 9.1.50 ROHDE & SCHWARZ imported from 3GU
R5‑185485 Update of RRM IncMon test cases 8.3.7, 8.3.8, 8.3.9, 8.4.7 including test tolerances Ericsson imported from 3GU
R5‑185486 CA_3A-18A and 1A-3A-18A - Updates of A.4.6.3 KDDI Corporation imported from 3GU
R5‑185487 5G NR_EN_DC with FR1_Text_proposal for_TX_Spurious_emission Qualcomm Incorporated imported from 3GU
R5‑185488 Applicability for DL256QAM RF test cases 7.4A.7_H,7.4A.8_H,8.7.1.1_H.4 and 8.7.1.1_H.5 SRTC imported from 3GU
R5‑185489 FR2_TxSpurious_TestPointAnalysis Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑185490 FR2_TxSpurious_TestConfig_38.521-2 Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑185491 Test Point analysis for FR2 TxSpurious test case Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑185492 Quality of Quiet Zone Results for IFF Keysight Technologies UK Ltd imported from 3GU
R5‑185493 Correction of test configuration of CA_20A-42A REFSENS Huawei,HiSilicon imported from 3GU
R5‑185494 Update of 7.3A.5 REFSENS for Rel-13 CA configurations Huawei,HiSilicon imported from 3GU
R5‑185495 Update of FR1 test case 6.3.3.2 Huawei,HiSilicon imported from 3GU
R5‑185496 5G NR_FR1_Text_update for TX Spurious Emission UE-Co-exist Qualcomm Incorporated imported from 3GU
R5‑185497 New test case 6.3.5FA.1 Power Control Absolute power tolerance for category NB1 and NB2/Power Class 6 CAICT imported from 3GU
R5‑185498 New test case 6.3.5FA.2 Power Control Relative power tolerance for category NB1 and NB2/Power Class 6 CAICT imported from 3GU
R5‑185499 New test case 6.3.5FA.3 Aggregate power control tolerance for category NB1 and NB2/Power Class 6 CAICT imported from 3GU
R5‑185500 5G NR_Proposal of TS38.521-1 annex C.0_Downlink signal levels Qualcomm Incorporated imported from 3GU
R5‑185501 5G NR_FR1_Text_Update_for_TX_ Additional spurious emissions Qualcomm Incorporated imported from 3GU
R5‑185502 Addition of new CA band combination – Updates of test points analysis SGS Wireless imported from 3GU
R5‑185503 Add Clause 7.5B.1 into TS 38.521-3 CMCC imported from 3GU
R5‑185504 Add Clause 7.5B.2 into TS 38.521-3 CMCC imported from 3GU
R5‑185505 Add Clause 7.5B.3 into TS 38.521-3 CMCC imported from 3GU
R5‑185506 Addition of new 3CA band combination for CA REFSENS SGS Wireless imported from 3GU
R5‑185507 Addition of 6.2B.4.1.3 Configured OP for Intre-Band within FR1 Huawei,HiSilicon imported from 3GU
R5‑185508 Introduction of Additional Maximum Power Reduction (A-MPR) for CA (3UL CA) SGS Wireless imported from 3GU
R5‑185509 Introduction of General ON/OFF time mask for CA (3UL CA) SGS Wireless imported from 3GU
R5‑185510 Addition of TC6.3B.1.1 Minimum Output power for intra-band contiguous EN-DC SGS Wireless imported from 3GU
R5‑185511 Addition of TC6.3B.1.2 Minimum output power for intra-band non-contiguous EN-DC SGS Wireless imported from 3GU
R5‑185512 Addition of TC6.3B.1.3 Minimum output power for inter-band EN-DC within FR1 SGS Wireless imported from 3GU
R5‑185513 Optimization of test configuration table for Rx CA test cases NTT DOCOMO, INC. imported from 3GU
R5‑185514 Updates of receiver test cases for CA_XA-YE NTT DOCOMO, INC. imported from 3GU
R5‑185515 Updates of receiver test cases for CA_XA-YD NTT DOCOMO, INC. imported from 3GU
R5‑185516 Addition of Band 74 information into TS 34.121-1 NTT DOCOMO, INC. imported from 3GU
R5‑185517 Updates of Band 74 information about Tx test cases in TS 36.521-1 NTT DOCOMO, INC. imported from 3GU
R5‑185518 Proposal on MU and TT table format in TS 38.521-2 NTT DOCOMO, INC. imported from 3GU
R5‑185519 Updates of FR2 TRx MU and TT in Annex NTT DOCOMO, INC. imported from 3GU
R5‑185520 Addition of TRx MU and TT in TS 38.521-3 Annex NTT DOCOMO, INC. imported from 3GU
R5‑185521 OCNG Patterns updated for FR1 tests Bureau Veritas imported from 3GU
R5‑185522 Update Clause in 6.2.5EA Configured UE transmitted Power for UE category M1 Qualcomm Incorporated imported from 3GU
R5‑185523 FR2_UE_BeamlockMode_IE_38.509 Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑185524 Introduction of TC 7.6.3 Out-of-band blocking CAICT imported from 3GU
R5‑185525 Treatment of power supply cable for FR2 UE tests Anritsu imported from 3GU
R5‑185526 Offset in quality of quiet zone evaluation Anritsu imported from 3GU
R5‑185527 Testability issue of low PSD test cases in FR2 Anritsu imported from 3GU
R5‑185528 Table format correct and removed redundant line for RF clause 7 test cases Bureau Veritas imported from 3GU
R5‑185529 Test approach of EN-DC Rx tests with multiple LTE/NR CCs Anritsu imported from 3GU
R5‑185530 Clarification on frame structure in 4Rx performance and CSI test principles sections Qualcomm Wireless GmbH imported from 3GU
R5‑185531 MU and TT of EN-DC test cases in TS 38.521-3 NTT DOCOMO, INC. imported from 3GU
R5‑185532 Proposal for 5G NR EVM Test Tolerance Qualcomm Incorporated imported from 3GU
R5‑185533 Discussion on UL RMC for FR2 spurious test Anritsu imported from 3GU
R5‑185534 Discussion on Test Tolerance for FR2 Intel Corporation (UK) Ltd, Apple Inc. imported from 3GU
R5‑185535 Update to General ON/OFF time mask for V2X Communication / Simultaneous E-UTRA V2X sidelink and E-UTRA uplink transmissions LG Electronics. imported from 3GU
R5‑185536 Correction of GNSS information for V2X tests Spirent Communications, European Commission imported from 3GU
R5‑185537 CR of CQI reporting test case 9.2.1.1.4.2 Huawei, Hisilicon imported from 3GU
R5‑185538 Introduction of new test case TC 6.2.5A.4 Configured UE transmitted Output Power for CA (3UL CA) 7LAYERS GmbH imported from 3GU
R5‑185539 Introduction of new test case TC 6.6.2.1A.4^^Spectrum emission mask for CA (3UL CA) 7LAYERS GmbH imported from 3GU
R5‑185540 Update of test case TC 6.7A.4 "Transmit intermodulation for CA (3DL CA and 3UL CA)" 7LAYERS GmbH imported from 3GU
R5‑185541 Correction of applicability to TS 36.521-2 for HPUE RF test cases CMCC imported from 3GU
R5‑185542 CA_3A-18A - Updates of some Tx test cases KDDI Corporation imported from 3GU
R5‑185543 CA_3A-18A - Updates of test points analysis KDDI Corporation imported from 3GU
R5‑185544 New TC 8.16.83: 3 DL CA Event Triggered Reporting under Deactivated SCells in Non-DRX with generic duplex modes Intel Corporation (UK) Ltd imported from 3GU
R5‑185545 New TC 8.16.84: 3 DL CA Event Triggered Reporting on Deactivated SCell with PCell and SCell Interruptions in Non-DRX with generic duplex modes Intel Corporation (UK) Ltd imported from 3GU
R5‑185546 New TC 8.16.85: 3 DL CA Activation and Deactivation of Known SCell in Non-DRX with generic duplex modes Intel Corporation (UK) Ltd imported from 3GU
R5‑185547 New TC 8.16.86: 3 DL CA Activation and Deactivation of Unknown SCell in Non-DRX with generic duplex modes Intel Corporation (UK) Ltd imported from 3GU
R5‑185548 Band 41 HPUE Maximum Output Power CMCC imported from 3GU
R5‑185549 Correction to band selection criteria applicability for HPUE devices that support Power Class 1 & 2 Intel Corporation (UK) Ltd imported from 3GU
R5‑185550 Discussion on testing of fallback CA configurations in Rx CA test cases Ericsson imported from 3GU
R5‑185551 Discussion paper on the applicability of the tests in 37.571-1 for all types and categories of UE Spirent Communications, European Commission imported from 3GU
R5‑185552 Applicability of tests for types and Categories of UE Spirent Communications, European Commission imported from 3GU
R5‑185553 Proposal for LTE 256QAM EVM Test Tolerance Qualcomm Incorporated imported from 3GU
R5‑185554 Test tolerance update of V2X uplink timing test cases Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑185555 FR2_UE_BeamlockInvoke_38.521-2 Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑185556 FR2_UE_BeamlockInvoke_38.521-3 Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑185557 FR2_UE_BeamlockProcedure_38.508-1 Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑185558 Discussion_38.521-3_ApplicabilityRules Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑185559 FR2_38.521-3_Applicability_SpuriousEmissions Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑185560 FR2_38.522_Applicability_SpuriousEmissions Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑185561 Discussion_FR2_StoreTxRxBeamPeakCoordinates Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑185562 FR2_StoreTxRxBeamPeakCoordinates_38.521-2 Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑185563 FR2_StoreTxRxBeamPeakCoordinates_38.521-3 Qualcomm Europe Inc. (Spain) imported from 3GU
R5‑185564 FR1 TT Way Forward update Telecom Italia S.p.A. imported from 3GU
R5‑185565 Updates of FR1 TRx TT in Annex F NTT DOCOMO, INC. imported from 3GU
R5‑185566 Discussion on TT for Max Output Power TC Requirements for FR2 Intel Corporation (UK) Ltd, Apple Inc. imported from 3GU

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