The Mobile
Broadband Standard

3GPP TDocs (written contributions) at meeting

Meeting: R5-63 - 2014-05-19 to 2014-05-23, Seoul

meeting id: R5-63 (click id for more info on this meeting)

Click on the Tdoc to open its file.

TDoc Title Source Remarks
R5‑142000 Agenda - opening session WG Chairman imported from 3GU
R5‑142001 Agenda - mid week session WG Chairman imported from 3GU
R5‑142002 Agenda - closing session WG Chairman imported from 3GU
R5‑142003 RAN5#63 Session Programme WG Chairman imported from 3GU
R5‑142004 RAN5 Leadership Team WG Chairman imported from 3GU
R5‑142005 Previous RAN5#62 WG Minutes ETSI Secretariat imported from 3GU
R5‑142006 Previous RAN5#62 WG Action Points ETSI Secretariat imported from 3GU
R5‑142007 Latest RAN Plenary notes WG Chairman imported from 3GU
R5‑142008 Latest RAN Plenary draft Report WG Chairman imported from 3GU
R5‑142009 Post Plenary Active Work Item update ETSI Secretariat imported from 3GU
R5‑142010 TF160 TTCN current status report MCC TF 160 imported from 3GU
R5‑142011 RAN5 SR to RP#60 WG Chairman imported from 3GU
R5‑142012 TF160 SR to RP#60 WG Chairman imported from 3GU
R5‑142013 RAN Chair Report to SP#60 WG Chairman imported from 3GU
R5‑142014 GCF CAG Rel-8 LTE Test Case List WG Chairman imported from 3GU
R5‑142015 GCF CAG Rel-9 LTE Test Case List WG Chairman imported from 3GU
R5‑142016 GCF LTE WIASR Rel-8 & Rel-9 WG Chairman imported from 3GU
R5‑142017 LS template for RAN5#63 WG Chairman imported from 3GU
R5‑142018 Meeting schedule for 2014/15 WG Chairman imported from 3GU
R5‑142019 RAN5 PRDs/Templates WG Chairman imported from 3GU
R5‑142020 Reply to LS on Clarification for Sync Failure during initial IMS registration ^^^^(R5-140932/S3-140724) TSG WG SA3 imported from 3GU
R5‑142021 Updated TF 160 report MCC TF 160 imported from 3GU
R5‑142022 iWD/PRD Updates Rohde&Schwarz imported from 3GU
R5‑142023 RAN5 CRs for email agreement ETSI Secretariat imported from 3GU
R5‑142024 Draft minutes of RAN5#63 ETSI Secretariat imported from 3GU
R5‑142025 Summary of RAN5 agreed CRs ETSI Secretariat imported from 3GU
R5‑142026 WG SR to Plenary WG Chairman imported from 3GU
R5‑142027 New WI proposal: UE conformance testing - LTE in the US Wireless Communications Service (WCS) Band AT&T imported from 3GU
R5‑142028 Review deadlines for next quarter WG Chairman imported from 3GU
R5‑142029 Look forward to the next RAN5 meeting WG Chairman imported from 3GU
R5‑142030 Reply LS on Extended BSR size and Extended PHR reporting TSG WG RAN2 imported from 3GU
R5‑142031 Reply LS on the applicability of HPUE for release 8/9/10 devices TSG WG RAN4 imported from 3GU
R5‑142032 Release 10 (Rel-10) FGI bit handling for bit 31 TSG RAN imported from 3GU
R5‑142033 Publication of TS.24 v2.0 Operator Minimum Acceptance Values for Device Antenna Performance GSMA TSG imported from 3GU
R5‑142034 PTCRB Update on IMS / VoLTE Test Cases PTCRB imported from 3GU
R5‑142035 Introduction of test cases for Radio Bearer Reconfiguration for transition between CELL_PCH and CELL_DCH with activation of Multiflow NSN imported from 3GU
R5‑142036 LS on WLAN signal measurements for WLAN/3GPP Radio interworking TSG WG RAN2 imported from 3GU
R5‑142037 Reply LS on UE Transmit Timing Accuracy test cases in DRX mode TSG WG RAN4 imported from 3GU
R5‑142038 Update of GCF UTRA and IMS priority list after CAG#38 Ericsson imported from 3GU
R5‑142039 WP Enhanced ICIC for non-CA based deployments of heterogeneous networks for LTE Qualcomm imported from 3GU
R5‑142040 SR Enhanced ICIC for non-CA based deployments of heterogeneous networks for LTE Qualcomm imported from 3GU
R5‑142041 WP UE OTA (Ant) - Laptop mounted eqpt Free Space test ZTE imported from 3GU
R5‑142042 SR UE OTA (Ant) - Laptop mounted eqpt Free Space test ZTE imported from 3GU
R5‑142043 WP Coordinated Multi-Point Operation for LTE Samsung imported from 3GU
R5‑142044 SR Coordinated Multi-Point Operation for LTE Samsung imported from 3GU
R5‑142045 WP Enhanced downlink control channel(s) for LTE Huawei imported from 3GU
R5‑142046 SR Enhanced downlink control channel(s) for LTE Huawei imported from 3GU
R5‑142047 WP Uplink Transmit Diversity (ULTD) for HSPA Qualcomm imported from 3GU
R5‑142048 SR Uplink Transmit Diversity (ULTD) for HSPA Qualcomm imported from 3GU
R5‑142049 WP Further Enhanced Non CA-based ICIC for LTE ZTE imported from 3GU
R5‑142050 SR Further Enhanced Non CA-based ICIC for LTE ZTE imported from 3GU
R5‑142051 WP Improved Minimum Performance Requirements for E-UTRA: Interference Rejection Broadcom imported from 3GU
R5‑142052 SR Improved Minimum Performance Requirements for E-UTRA: Interference Rejection Broadcom imported from 3GU
R5‑142053 WP LTE Carrier Aggregation Enhancements Microsoft imported from 3GU
R5‑142054 SR LTE Carrier Aggregation Enhancements Microsoft imported from 3GU
R5‑142055 WP Further Enhancements to CELL_FACH Ericsson imported from 3GU
R5‑142056 SR Further Enhancements to CELL_FACH Ericsson imported from 3GU
R5‑142057 WP Further REL-12 Configurations for LTE Advanced Carrier Aggregation Microsoft imported from 3GU
R5‑142058 SR Further REL-12 Configurations for LTE Advanced Carrier Aggregation Microsoft imported from 3GU
R5‑142059 WP Split TTCN Test Models for IMS testing in TS 34.229-3 Spirent imported from 3GU
R5‑142060 SR Split TTCN Test Models for IMS testing in TS 34.229-3 Spirent imported from 3GU
R5‑142061 WP Test part: HSDPA Multiflow Data Transmission Qualcomm imported from 3GU
R5‑142062 SR Test part: HSDPA Multiflow Data Transmission Qualcomm imported from 3GU
R5‑142063 WP UE Conformance Test Aspects - LTE UE TRP and TRS and UTRA Hand Phantom ZTE imported from 3GU
R5‑142064 SR UE Conformance Test Aspects - LTE UE TRP and TRS and UTRA Hand Phantom ZTE imported from 3GU
R5‑142065 TR 36.904 v0.0.1 Rapporteur imported from 3GU
R5‑142066 TR 36.904 v0.0.2 Rapporteur (Broadcom) imported from 3GU
R5‑142067 Test Tolerance analyses for TS 36.521-1 TC 8.2.1.4.3 Broadcom Corporation imported from 3GU
R5‑142068 LTE Type A performance requirements - Adding test case 8.2.1.4.3 Broadcom Corporation imported from 3GU
R5‑142069 LTE Type A performance requirements - adding TC 8.2.1.4.3 into annex F and G Broadcom Corporation imported from 3GU
R5‑142070 LTE Type A performance requirements - Introduction of the new test case 8.2.1.4.3 Broadcom Corporation imported from 3GU
R5‑142071 Addition of connection diagram references to LTE Type A performance tests Broadcom Corporation imported from 3GU
R5‑142072 Addition of connection diagram references to LTE Type A CSI tests Broadcom Corporation imported from 3GU
R5‑142073 Correction for CA_4A-12A uplink configuration in inter-band CA reference sensitivity Broadcom Corporation imported from 3GU
R5‑142074 Changes to 16.2, 16.3, and 16.4 Rohde & Schwarz imported from 3GU
R5‑142075 Addition of new SS and NITZ test case 15.7.22 CATR imported from 3GU
R5‑142076 Addition of new SS and NITZ test case 15.7.23 CATR imported from 3GU
R5‑142077 Addition of new SS and NITZ test case 15.7.24 CATR imported from 3GU
R5‑142078 Addition of new SS and NITZ test case 15.7.25 CATR imported from 3GU
R5‑142079 Addition of new SS and NITZ test case 15.7.26 CATR imported from 3GU
R5‑142080 Addition of new SS and NITZ test case 15.7.27 CATR imported from 3GU
R5‑142081 Correction to SS test case 15.3.3 and 15.3.4 CATR imported from 3GU
R5‑142082 Correction to SS test case 15.9.1 and 15.9.3 CATR imported from 3GU
R5‑142083 Correction to SS test case 15.6.3 CATR imported from 3GU
R5‑142084 Correction to SS test case 15.7.7, 15.7.8 and 15.7.9 CATR imported from 3GU
R5‑142085 Correction to SS test case 15.7.17 and 15.7.19 CATR imported from 3GU
R5‑142086 Update of SS test case 15.8.4 CATR imported from 3GU
R5‑142087 Correction to SS test case 15.10.4 CATR imported from 3GU
R5‑142088 Addition of Applicability for new MultiParty test cases CATR,Cetecom imported from 3GU
R5‑142089 Correction to the Applicability condition of test case 15.8.4 CATR imported from 3GU
R5‑142090 Update of SS test case Applicability conditions CATR imported from 3GU
R5‑142091 Correction to the Applicability condition of test case 12.4.3.2a CATR imported from 3GU
R5‑142092 Update of RRC test case 8.1.3.7 CATR imported from 3GU
R5‑142093 Update of EMM test case 9.2.3.1.6 CATR imported from 3GU
R5‑142094 Update of ESM test case 10.5.1b CATR imported from 3GU
R5‑142095 Correction to the Applicability of LAP and EAB test cases CATR, Cetecom, Broadcom Corporation, TTA imported from 3GU
R5‑142096 Correction to the Applicability comments of some test cases CATR imported from 3GU
R5‑142097 Corrections to prs-MutingInfo PCTEST Engineering Laboratory imported from 3GU
R5‑142098 Corrections for OCNG patterns defined in RSTD Tables PCTEST Engineering Laboratory imported from 3GU
R5‑142099 Corrections to Symbol and Abbreviation references PCTEST Engineering Laboratory imported from 3GU
R5‑142100 Correction to test case 7.5.1, Table 7.5.1.3.2-1: Main behaviour Intel Corporation imported from 3GU
R5‑142101 Correction to test case 10.5.4, Table 10.5.4.3.2-1: Main behaviour Intel Corporation imported from 3GU
R5‑142102 Correction to test case title in the Applicability Table 4-1 and Table 4-3 Intel Corporation imported from 3GU
R5‑142103 Correction of MDT testcase 8.6.2.3 Intel Corporation imported from 3GU
R5‑142104 Addition of SIMTC Test Case 11.1.1.4 Intel Corporation imported from 3GU
R5‑142105 Correction to test case 17.4.2 Intel Corporation imported from 3GU
R5‑142106 Correction to test case 17.4.2 Intel Corporation imported from 3GU
R5‑142107 Correction to test case 9.1.5.1, Table 9.1.5.1.3.3-1: EMM INFORMATION (step 1, Table 9.1.5.1.3.2-1) Intel Corporation imported from 3GU
R5‑142108 Split of TDD special subframe MAC test cases 7.1.3.12 and 7.1.3.13 into separate test cases for ssp7 and ssp9. Ericsson, Huawei, CMCC imported from 3GU
R5‑142109 Update applicability for TDD additional special subframe configuration test cases Ericsson, Huawei, CMCC imported from 3GU
R5‑142110 Addition of CA 3A-28A to 36.521-1 Chapter 5 SoftBank Mobile imported from 3GU
R5‑142111 Addition of CA 3A-28A to 36.521-1 Chapter 6 SoftBank Mobile imported from 3GU
R5‑142112 Addition of CA 3A-28A to 36.521-1 Chapter 7 SoftBank Mobile imported from 3GU
R5‑142113 Addition of CA 3A-28A to 36.521-2 SoftBank Mobile imported from 3GU
R5‑142114 Addition of CA 3A-28A to 36.508 SoftBank Mobile imported from 3GU
R5‑142115 Addition of CA 3A-28A to 36.523-2 SoftBank Mobile imported from 3GU
R5‑142116 Update Radio Bearer Setup message for Multiflow HSDPA tests Qualcomm Incorporated imported from 3GU
R5‑142117 Update to 16 QAM UL Test Case 7.1.6.3.2a Qualcomm Incorporated, Rohde & Schwarz, TF 160 imported from 3GU
R5‑142118 Update to clause 6.10.2.4.6.1. Qualcomm Incorporated, TF 160 imported from 3GU
R5‑142119 Addition of new Multiflow HSDPA test case 8.2.1.45.1 Qualcomm Incorporated imported from 3GU
R5‑142120 Addition of new Multiflow HSDPA test case 8.2.1.45.2 Qualcomm Incorporated imported from 3GU
R5‑142121 Addition of new Multiflow HSDPA test case 8.2.1.45.3 Qualcomm Incorporated imported from 3GU
R5‑142122 Adding new ICS and applicability of newly added Multiflow HSDPA Test Cases 8.2.1.45 and 8.2.2.88 Qualcomm Incorporated, NSN imported from 3GU
R5‑142123 Update title of Test Case 6.3.3.1 Qualcomm Incorporated, TF 160 imported from 3GU
R5‑142124 Correction to Tables A.3.2.7.3-1 and A.3.3.7.3-1 Anite imported from 3GU
R5‑142125 Correction to Tables A.3.8.3.3-1 and A.3.8.4.3-1 Anite imported from 3GU
R5‑142126 Update to MEASUREMENT CONTROL Anite, Motorola Mobility imported from 3GU
R5‑142127 Update to default non-MBSFNregionLength in SystemInformationBlockType13 Anite, Samsung imported from 3GU
R5‑142128 Editorial Update to Table 4.6.1-4A: MBSFNAreaConfiguration Anite imported from 3GU
R5‑142129 Correction to EUTRA Idle Mode Test case 6.1.1.1b Anite, Broadcom imported from 3GU
R5‑142130 Correction to E-UTRA Inter-RAT test case 6.2.3.5a Anite, Broadcom, Intel imported from 3GU
R5‑142131 Correction to EUTRA Idle Mode Test case 6.2.3.31 Anite imported from 3GU
R5‑142132 Correction to C19, C20 and C21 in Table 4.1-1a SRTC, Cetecom imported from 3GU
R5‑142133 Correction to EUTRA Idle Mode CSG test case 6.3.5 Anite, Qualcomm, Anritsu, BlackBerry, Samsung, Ericsson, Telecom Italia, Huawei imported from 3GU
R5‑142134 Correction to C43 in Table 4.1-1a SRTC, Cetecom imported from 3GU
R5‑142135 Correction to eMBMS test case 17.1.2 Anite, Samsung imported from 3GU
R5‑142136 Correction to MPTY call setup procedure Cetecom imported from 3GU
R5‑142137 Correction to eMBMS test case 17.1.3 Anite, Samsung, TF160 imported from 3GU
R5‑142138 Correction to eMBMS test case 17.1.4 Anite, Samsung, TF160 imported from 3GU
R5‑142139 Correction to eMBMS test case 17.1.5 Anite, Samsung imported from 3GU
R5‑142140 Correction to eMBMS test case 17.3.1 Anite, Samsung imported from 3GU
R5‑142141 Correction to eMBMS test case 17.3.2 Anite, Samsung imported from 3GU
R5‑142142 Correction to LTE-A CA MAC test case 7.1.4.19.x Anite, LG Electronics, Samsung imported from 3GU
R5‑142143 Correction to LTE MDT test case 8.6.4.4 Anite, LG Electronics imported from 3GU
R5‑142144 Correction for SRVCC and aSRVCC test cases Anite, Broadcom imported from 3GU
R5‑142145 Update conditions in Table4-1a for CS fall back test cases Anite imported from 3GU
R5‑142146 Correction to Multilayer Test Case 13.4.1.5 Anite, ZTE, NVIDIA imported from 3GU
R5‑142147 Correction of LTE IRAT EMM test case 9.2.1.2.1b and 9.2.1.2.1c Anite, CATT, Motorola Mobility imported from 3GU
R5‑142148 Update conditions in Table4-1a for 9.2.1.2.4 ans 9.2.3.2.4 Anite imported from 3GU
R5‑142149 Addition of operating restrictions for EUTRA MFBI test cases Anite, TF160 imported from 3GU
R5‑142150 Correction to CNAP test case 15.3.1 Anite imported from 3GU
R5‑142151 Correction to CNAP test case 15.3.2 Anite imported from 3GU
R5‑142152 Correction to CNAP test case 15.3.3 Anite imported from 3GU
R5‑142153 Correction to CNAP test case 15.3.4 Anite imported from 3GU
R5‑142154 Corrections to contents of SIP re-INVITE message Anite imported from 3GU
R5‑142155 Update applicability for MFBI test cases KDDI imported from 3GU
R5‑142156 Proposal for introducing IMS test cases of SIP error handling KDDI imported from 3GU
R5‑142157 Clarification for EFpsismsc on ISIM Anite, TF160 imported from 3GU
R5‑142158 Correction to C6, C19, C20, C21 and C43 in Table 4.1-1a 36.521-2. SRTC imported from 3GU
R5‑142159 Fulfil AP#62.02 on TC 15.12 and C.9 Rohde & Schwarz, STF160 imported from 3GU
R5‑142160 Restrict reason-text for unsuccessful SRVCC handover Rohde & Schwarz, Qualcomm, Anritsu imported from 3GU
R5‑142161 Update of applicability for 4C-HSDPA in the Table 1. TTA imported from 3GU
R5‑142162 Correction to C195 and C196 in Table 4.1-1a. TTA imported from 3GU
R5‑142163 Update of applicability for 4C-HSDPA in the Table 1. TTA imported from 3GU
R5‑142164 Correction to the applicability of the test case 7.6.2A.3 and 7.7A.3. TTA imported from 3GU
R5‑142165 Addition of RF test cases applicability for eICIC SRTC imported from 3GU
R5‑142166 Addition of RRM test cases applicability for eICIC SRTC imported from 3GU
R5‑142167 Correction of clause 9.2.7.1 in 36.521-3 SRTC imported from 3GU
R5‑142168 Correction of clause 9.2.8.1 in 36.521-3 SRTC imported from 3GU
R5‑142169 Correction to C6 in Table 4.1-1a 36.521-2. SRTC imported from 3GU
R5‑142170 Update to operating bands for CA CATR, CMCC, SoftBank Mobile, Intel Corporation, kt imported from 3GU
R5‑142171 Update to channel bandwidths for CA CATR, CMCC, SoftBank Mobile, Huawei, NII Holdings, kt, TTA imported from 3GU
R5‑142172 Addition of TC 6.2.2A.1 for CA_39C CATR imported from 3GU
R5‑142173 Addition of TC 6.2.4A.1 for CA_39C CATR imported from 3GU
R5‑142174 Update to TC 6.3.2A.1 for CA_39C CATR imported from 3GU
R5‑142175 Corrections to SNR test for TM9 minimum requirements ZTE imported from 3GU
R5‑142176 Corrections to configured transmitted power for CA ZTE imported from 3GU
R5‑142177 Corrections to OCNG pattern ZTE imported from 3GU
R5‑142178 Additions to FDD interruption requirements for SCell ZTE imported from 3GU
R5‑142179 Additions to TDD interruption requirements for SCell ZTE imported from 3GU
R5‑142180 Correction on PDSCH allocation in PRS subframe ZTE imported from 3GU
R5‑142181 Corrections to per slot requirements in MPR and AMPR test cases ZTE imported from 3GU
R5‑142182 Introduction of TC 8.2.2.1.1_A.3 TDD PDSCH Signle Antenna Port Performance for CA ZTE imported from 3GU
R5‑142183 Introduction of TC 8.2.2.4.2_A.3 TDD PDSCH Closed Loop Multi Layer Spatial Multiplexing 4 x 2 for CA ZTE imported from 3GU
R5‑142184 Additions to TC 9.5.5.1_F.1 FDD RI Reporting with Single CSI process ZTE imported from 3GU
R5‑142185 Additions to TC 9.5.5.2_F.1 TDD RI Reporting with Single CSI process ZTE imported from 3GU
R5‑142186 Corrections applicability statement including UE cateogry for feICIC ZTE imported from 3GU
R5‑142187 Additions to TC 8.2.1.2.3_E.1 FDD PDSCH Transmit diversity 2x2 for feICIC (non-MBFSN ABS) ZTE imported from 3GU
R5‑142188 Additions to TC 8.2.2.2.3_E.1 TDD PDSCH Transmit diversity 2x2 for feICIC (non-MBSFN ABS) ZTE imported from 3GU
R5‑142189 Additions to TC 8.2.1.4.1_E.1 FDD PDSCH Closed Loop Single Layer Spatial Multiplexing 2x2 for feICIC (non-MBSFN ABS) ZTE imported from 3GU
R5‑142190 Additions to TC 8.2.2.4.1_E.1 TDD PDSCH Closed Loop Single Layer Spatial Multiplexing 2x2 for feICIC (non-MBSFN ABS) ZTE imported from 3GU
R5‑142191 Additions to TC 8.4.1.2.3_E.1 FDD PCFICH/PDCCH Transmit Diversity 2x2 for feICIC (non-MBSFN ABS) ZTE imported from 3GU
R5‑142192 Additions to TC 8.4.2.2.3_E.1 TDD PCFICH/PDCCH Transmit Diversity 2x2 for feICIC (non-MBSFN ABS) ZTE imported from 3GU
R5‑142193 Additions to TC 8.4.1.2.3_E.2 FDD PCFICH/PDCCH Transmit Diversity 2x2 for feICIC (MBSFN ABS) ZTE imported from 3GU
R5‑142194 Additions to TC 8.4.2.2.3_E.2 TDD PCFICH/PDCCH Transmit Diversity 2x2 for feICIC (MBSFN ABS) ZTE imported from 3GU
R5‑142195 Additions to Demodulation feICIC Test Cases to Annex F ZTE imported from 3GU
R5‑142196 Introduction of feICIC applicability statement for Performance test cases ZTE imported from 3GU
R5‑142197 Additions to TC 9.2.1.5_E.1 FDD CQI Reporting under AWGN conditions - PUCCH 1-0 for feICIC (non-MBSFN ABS) ZTE imported from 3GU
R5‑142198 Additions to TC 9.2.1.6_E.1 TDD CQI Reporting under AWGN conditions - PUCCH 1-0 for feICIC (non-MBSFN ABS) ZTE imported from 3GU
R5‑142199 Additions to TC 9.3.1.3.1_E.1 FDD CQI Reporting under fading conditions - PUSCH 3-0 for feICIC (non-MBSFN ABS) ZTE imported from 3GU
R5‑142200 Additions to TC 9.3.1.3.2_E.1 TDD CQI Reporting under fading conditions - PUSCH 3-0 for feICIC (non-MBSFN ABS) ZTE imported from 3GU
R5‑142201 Additions to TC 9.5.4.1_E.1 FDD RI Reporting - PUCCH 1-0 for feICIC (non-MBSFN ABS) ZTE imported from 3GU
R5‑142202 Additions to TC 9.5.4.2_E.1 TDD RI Reporting - PUCCH 1-0 for feICIC (non-MBSFN ABS) ZTE imported from 3GU
R5‑142203 Additions to Reporting of Channel State Information feICIC Test Cases to Annex F ZTE imported from 3GU
R5‑142204 Introduction of feICIC applicability statement for CSI test cases ZTE imported from 3GU
R5‑142205 Additions to TC 8.1.8 E-UTRAN FDD-FDD Intra-Frequency Event-Triggered Reporting (feICIC) ZTE imported from 3GU
R5‑142206 Additions to TC 8.2.6 E-UTRAN TDD-TDD Intra-Frequency Event-Triggered Reporting (feICIC) ZTE imported from 3GU
R5‑142207 Additions to TC 9.2.13 FDD RSRQ under Time Domain Measurement Resource Restriction (feICIC) ZTE imported from 3GU
R5‑142208 Additions to TC 9.2.14 TDD RSRQ under Time Domain Measurement Resource Restriction (feICIC) ZTE imported from 3GU
R5‑142209 Additions to TC 8.1.5 E-UTRAN FDD UE Rx-Tx time difference (feICIC) ZTE imported from 3GU
R5‑142210 Additions to TC 8.1.6 E-UTRAN TDD UE Rx-Tx time difference (feICIC) ZTE imported from 3GU
R5‑142211 Additions to feICIC UE Rx-Tx test cases in Annex C ZTE imported from 3GU
R5‑142212 Additions to feICIC RRM test cases in Annex F ZTE imported from 3GU
R5‑142213 Additions to feICIC to Annex H ZTE imported from 3GU
R5‑142214 Introduction of feICIC applicability statement for RRM test cases ZTE imported from 3GU
R5‑142215 Void Test Case 6.3.3.2 Qualcomm Incorporated imported from 3GU
R5‑142216 Update Applicability Table for test Cases 6.3.3.1 and 6.3.3.2 Qualcomm Incorporated imported from 3GU
R5‑142217 Update of TC 8.8.1.2 TDD distributed EPDCCH performance SGS Wireless imported from 3GU
R5‑142218 No P-Preferred-Identity and Accept-Contact in re-INVITE requests Rohde & Schwarz imported from 3GU
R5‑142219 Introduction of new EVM test cases for uplink CLTD Broadcom Corporation imported from 3GU
R5‑142220 Introduction of new EVM test cases for uplink CLTD in Annex F Broadcom Corporation imported from 3GU
R5‑142221 Introduction of new EVM test cases for uplink CLTD in TS 34.121-2 Broadcom Corporation imported from 3GU
R5‑142222 Cleanup of operating band groups in TS36.521-3 Ericsson imported from 3GU
R5‑142223 PANI header in 200 OK Rohde & Schwarz imported from 3GU
R5‑142224 Adding TC 8.3.1.17.3 to TS 36.523-1 Ericsson imported from 3GU
R5‑142225 Adding TC 8.5.1.7.3 to TS 36.523-1 Ericsson imported from 3GU
R5‑142226 TCs update for 34.121-1_5.3C & D Uplink Transmit Diversity for HSPA Rel-11 Orange SA imported from 3GU
R5‑142227 New RF TC for 34.121-1_5.3B_Uplink Transmit Diversity for HSPA Rel-11 Orange SA imported from 3GU
R5‑142228 Update for 34.121-2 UL-OLTD and CLTD Orange SA imported from 3GU
R5‑142229 Adding TC 8.2.2.5.3 to TS 36.523-1 Ericsson imported from 3GU
R5‑142230 Editorial correction to "Supported CA configurations for Intra-band contiguous CA" table Ericsson imported from 3GU
R5‑142231 New TCs for verifying support of GSM A5/4 ciphering algorithm Ericsson, Samsung, TF160 imported from 3GU
R5‑142232 New TCs for verifying support of GSM GEA/4 ciphering algorithm Ericsson, Samsung, TF160 imported from 3GU
R5‑142233 Adding applicability for new TCs A5/4 and GEA/4 Ericsson, Samsung, TF160 imported from 3GU
R5‑142234 Update in regard to adding testing for A5/4 and GEA/4 Ericsson, Samsung, TF160 imported from 3GU
R5‑142235 Addition of test case “CA / RRC connection reconfiguration / Handover / Success / PCell change and SCell addition / Intra-Band non-contiguius CA” and CA / RRC connection reconfiguration / Handover / Success / PCell Change / SCell no Change / IbnCCA Sporton International imported from 3GU
R5‑142236 Adding applicability for new test cases 8.2.4.17.3 and 8.2.4.19.3 Sporton International imported from 3GU
R5‑142237 Discussion paper on adding new eMBMS test case variant of 17.4.1 for bands with limited bandwidth Ericsson imported from 3GU
R5‑142238 New eMBMS test case 17.4.1a Ericsson imported from 3GU
R5‑142239 Applicability of new eMBMS test case 17.4.1a Ericsson imported from 3GU
R5‑142240 Correction to applicability table for eMBMS test cases Ericsson imported from 3GU
R5‑142241 Correction to C.24 on SRVCC media removal Rohde & Schwarz, Intel imported from 3GU
R5‑142242 Routine maintenance and updates MCC TF160 imported from 3GU
R5‑142243 Routine maintenance and updates for LCR TDD MCC TF160, CATT imported from 3GU
R5‑142244 Routine maintenance and updates MCC TF160 imported from 3GU
R5‑142245 Routine maintenance and updates MCC TF160 imported from 3GU
R5‑142246 Add missing mnemonic for SS/NITZ MCC TF160 imported from 3GU
R5‑142247 Corrections regarding URL encoding MCC TF160 imported from 3GU
R5‑142248 Proposal for correction and common specification of SDP session and time description in TS 34.229-1 MCC TF160 imported from 3GU
R5‑142249 Correction to T_lamda_n_A values for scenario #1 Spirent Communications imported from 3GU
R5‑142250 Correction to T_lamda_n_A values Spirent Communications imported from 3GU
R5‑142251 Clarification of use of satellite simulator Spirent Communications imported from 3GU
R5‑142252 Clarification of use of satellite simulator Spirent Communications imported from 3GU
R5‑142253 Correction to system information combination 16 and 19 for eMBMS testing Ericsson, MCC TF160 imported from 3GU
R5‑142254 Correction to default SystemInformationBlockType15 message for eMBMS testing Ericsson imported from 3GU
R5‑142255 Correction to eMBMS test case 17.4.1 Ericsson, MCC TF160, Motorola Mobility imported from 3GU
R5‑142256 Correction to eMBMS test cases 17.4.2 and 17.4.2a Ericsson, MCC TF160, Motorola Mobility imported from 3GU
R5‑142257 Correction to eMBMS test cases 17.4.3 and 17.4.3a Ericsson, MCC TF160, Motorola Mobility imported from 3GU
R5‑142258 Correction to eMBMS test case 17.4.4 Ericsson, MCC TF160, Motorola Mobility imported from 3GU
R5‑142259 Correction to eMBMS test case 17.4.5 Ericsson, MCC TF160 imported from 3GU
R5‑142260 Correction to eMBMS test case 17.4.6 Ericsson, MCC TF160 imported from 3GU
R5‑142261 Correction to eMBMS test case 17.4.7 Ericsson, MCC TF160 imported from 3GU
R5‑142262 Correction to eMBMS test case 17.4.8 Ericsson, MCC TF160 imported from 3GU
R5‑142263 Correction to eMBMS test cases 17.4.9.1 and 17.4.9.2 Ericsson imported from 3GU
R5‑142264 Correction to eMBMS test cases 17.4.10.1 and 17.4.10.2 Ericsson imported from 3GU
R5‑142265 Correction to eMBMS test case 17.4.11.1 and 17.4.11.2 Ericsson imported from 3GU
R5‑142266 Correction to test case 16.4 Ericsson imported from 3GU
R5‑142267 Correcting applicability of 9.2.3.2.12 MCC TF160 imported from 3GU
R5‑142268 Introduction of a new supplementary service call restriction test case 15.8.5: "Rejection after invoke of ActivateSS operation" 7Layers imported from 3GU
R5‑142269 New connection diagram for Signalling tests with phase rotator MCC TF160, Qualcomm imported from 3GU
R5‑142270 Introduction of a new supplementary service test case 15.8.7: "Rejection after invoke of DeactivateSS operation" 7Layers imported from 3GU
R5‑142271 Introduction of a new supplementary service test case 15.8.8: "Rejection after use of password procedure" 7Layers imported from 3GU
R5‑142272 feICIC: Test Method MCC TF160 imported from 3GU
R5‑142273 Adding test case applicability for new supplementary service test case 15.8.5 7Layers imported from 3GU
R5‑142274 Adding test case applicability for new supplementary service test case 15.8.7. 7Layers imported from 3GU
R5‑142275 Correction to EUTRA CSG Testcases 8.3.4.1, 8.3.4.3, 8.3.4.4, 8.3.4.5 Anritsu Ltd,Qualcomm Incorporated imported from 3GU
R5‑142276 Correction to WI-081 EUTRA RRC Testcase 6.3.5 Anritsu Ltd,Qualcomm Incorporated imported from 3GU
R5‑142277 Adding test case applicability for new supplementary service test case 15.8.8. 7Layers imported from 3GU
R5‑142278 Correction to Re-INVITE for Annex Procedure C.31 Anritsu Ltd imported from 3GU
R5‑142279 Correction to CC disconnect procedure Anritsu Ltd,Intel Corporation imported from 3GU
R5‑142280 Correction to EUTRA CSG Test Case 8.3.4.4 Anritsu Ltd, Qualcomm Incorporated imported from 3GU
R5‑142281 Correction to GCF WI-086 EUTRA EMM Test Case 9.2.3.3.5a Anritsu Ltd imported from 3GU
R5‑142282 Correction to GCF WI-172 EUTRA<>UTRA aSRVCC Testcasse 13.4.3.11 Anritsu Ltd, Intel Corporation imported from 3GU
R5‑142283 Correction to GCF WI-159 Pre-registration at 1xRTT testcase 13.4.4.5 Anritsu Ltd,Qualcomm Incorporated imported from 3GU
R5‑142284 Correction to Applicability of GCF WI-172 aSRVCC Testcases Anritsu Ltd, Intel Corporation imported from 3GU
R5‑142285 Correction to GCF WI-159 Enhanced CSFB test case 8.4.7.10 Anritsu Ltd imported from 3GU
R5‑142286 Correction to EUTRA CSG test case 8.3.4.5 Anritsu Ltd, Qualcomm Incorporated imported from 3GU
R5‑142287 Correction of Invite Message for aSRVCC Testcases Anritsu Ltd, Intel Corporation imported from 3GU
R5‑142288 Correction of GCF WI-154 IMS Emergency Call Testcase 19.5.7 Anritsu Ltd, Intel Corporation imported from 3GU
R5‑142289 Correction to GCF WI-181 Rel-10 EPS Enhancements EPS FDD <>UTRAN Test Case 8.6.5.1 Anritsu Ltd, Qualcomm Incorporated imported from 3GU
R5‑142290 Draft WID for MIMO OTA antenna test function Agilent Technologies imported from 3GU
R5‑142291 Correction of Midamble Configuration of FPACH for LCR TDD CATT imported from 3GU
R5‑142292 Test frequencies for RF/RRM CA testing Rohde & Schwarz imported from 3GU
R5‑142293 Updates of 5.2A Operating bands for CA_3A-26A and CA_3A-27A kt imported from 3GU
R5‑142294 Updates of 5.4.2A Channel bandwidth for CA_3A-26A and CA_3A-27A kt imported from 3GU
R5‑142295 Updates of 6.2.5 Delta TIB for CA_3A-26A and CA_3A-27A kt imported from 3GU
R5‑142296 Updates of 7.3.3 Delta RIB for CA_3A-26A and CA_3A-27A kt imported from 3GU
R5‑142297 Updates of 7.3A.3 Refsens for CA_3A-26A and CA_3A-27A kt imported from 3GU
R5‑142298 Updates of Table A.4.6.3-3 for CA_3A-26A and CA_3A-27A kt imported from 3GU
R5‑142299 Updates of 6.2.3.2 Test frequency for CA_3A-26A and CA_3A-27A kt imported from 3GU
R5‑142300 Updates of Table A.4.3.3.3-3 for CA_3A-26A and CA_3A-27A kt imported from 3GU
R5‑142301 Correction to test case 8.6.3.1. TTA imported from 3GU
R5‑142302 LBS RF: Aperiodic CQI configuration for 1.4 MHz bandwidth tests Rohde & Schwarz imported from 3GU
R5‑142303 LBS Perf: Correction of FT values in GLONASS scenarios Rohde & Schwarz imported from 3GU
R5‑142304 LBS Sig: Correction of FT values in GLONASS scenarios Rohde & Schwarz imported from 3GU
R5‑142305 CA RF: Clarification of test parameters and requirements for Inter-band CA Rx tests Rohde & Schwarz imported from 3GU
R5‑142306 eICIC RF: Minor corrections to CQI performance tests Rohde & Schwarz imported from 3GU
R5‑142307 RF: Corrections to spurious emission requirements with NS different than NS_01 Rohde & Schwarz imported from 3GU
R5‑142308 feICIC RF: Corrections to PDCCH performance tests Rohde & Schwarz imported from 3GU
R5‑142309 RF: Editorial corrections to the annexes Rohde & Schwarz imported from 3GU
R5‑142310 RF: Corrections to CSI RMCs Rohde & Schwarz imported from 3GU
R5‑142311 RF: Missing minimum test time Rohde & Schwarz imported from 3GU
R5‑142312 CA RF: Several corrections to some Tx tests Rohde & Schwarz imported from 3GU
R5‑142313 Update of reference list and list of abbreviations for eMBMS testing purposes Ericsson imported from 3GU
R5‑142314 CA RF: Corrections to CQI performance tests Rohde & Schwarz imported from 3GU
R5‑142315 CA RF: Corrections to performance test with power imbalance (Class C) Rohde & Schwarz imported from 3GU
R5‑142316 LBS RF: Update of RSTD tests Rohde & Schwarz imported from 3GU
R5‑142317 eICIC RF: Corrections to RI performance tests Rohde & Schwarz imported from 3GU
R5‑142318 Adding connection diagramms for RF/RRM Rel-11 WI-s tests Rohde & Schwarz imported from 3GU
R5‑142319 Fixes to A.2.7 ACK Rohde & Schwarz imported from 3GU
R5‑142320 Record-Route header in MT re-INVITE requests Rohde & Schwarz imported from 3GU
R5‑142321 Multi-PDN support Rohde & Schwarz imported from 3GU
R5‑142322 Correction to MDT Test Case 8.6.3.1 Anite, Qualcomm imported from 3GU
R5‑142323 Correction in Applicability of tests Conditions (C81) for Multi-layer test case 13.1.4 and 13.1.5 Anite, Huawei imported from 3GU
R5‑142324 Corrections to UTRA NAS test cases 12.2.1.2,12.6.1.1,12.6.1.2,12.7.1 CATR imported from 3GU
R5‑142325 Correction to NISPC test case 11.3.2a Anite imported from 3GU
R5‑142326 Correction to E-UTRA Inter-RAT test case 6.2.3.1a Anite, Qualcomm, Ericsson imported from 3GU
R5‑142327 Fixes to o-lines in SDP bodies Rohde & Schwarz imported from 3GU
R5‑142328 Correction to USSD test case 15.9.1 Anritsu Ltd imported from 3GU
R5‑142329 New Supplementary Services Test Case : Addition of USSD Test Case 15.9.2 Anritsu Ltd imported from 3GU
R5‑142330 New Supplementary Services Test Case : Addition of USSD Test Case 15.9.4 Anritsu Ltd imported from 3GU
R5‑142331 New Supplementary Services Test Case : Addition of USSD Test Case 15.9.5 Anritsu Ltd imported from 3GU
R5‑142332 Applicability for Supplementary service test cases 15.9.2, 15.9.4, 15.9.5 Anritsu Ltd imported from 3GU
R5‑142333 Addition of CA band Combo CA_2A-13A Qualcomm Inc imported from 3GU
R5‑142334 Correction to ACK NAK Reporting mode for TDD CA test cases Qualcomm Inc imported from 3GU
R5‑142335 Addition of RLM test cases with non-MBSFN for fEICIC Qualcomm Inc imported from 3GU
R5‑142336 Addition of exceptions for feICIC RRM test cases Qualcomm Inc imported from 3GU
R5‑142337 Applicability update for CA band Combo CA_2A-13A Qualcomm Inc imported from 3GU
R5‑142338 Correction to test case 8.6.3.4. TTA imported from 3GU
R5‑142339 Correction to test case 8.2.2.6.2. TTA imported from 3GU
R5‑142340 Correction to test case 8.6.4.1, 8.6.4.2 and 8.6.4.4. TTA imported from 3GU
R5‑142341 Addition of test frequencies of CA_39A-41A for CA signalling testing in TS 36.508 Huawei, CMCC imported from 3GU
R5‑142342 Addition of LTE CA_39A-41A to chap.5 Huawei, CMCC imported from 3GU
R5‑142343 Addition of LTE CA_39A-41A into Table 6.2.5.3-2 Huawei, CMCC imported from 3GU
R5‑142344 Addition of CA_39A-41A to Refsens in chap.7 Huawei, CMCC imported from 3GU
R5‑142345 Addition of CA band combination CA_39A-41A to Table A.4.6.3-3 in TS 36.521-2 Huawei, CMCC imported from 3GU
R5‑142346 Addition of CA band combination CA_39A-41A to Table A.4.3.3.3-3 in TS 36.523-2 Huawei, CMCC imported from 3GU
R5‑142347 Updates of Table A.4.6.3-3 for CA_3A-26A and CA_3A-27A kt imported from 3GU
R5‑142348 Addition of new TC 8.16.9 E-UTRAN FDD event triggered reporting under deactivated SCell in non-DRX for 10MHz+5MHz Huawei imported from 3GU
R5‑142349 Addition of new TC 8.16.10 E-UTRAN TDD event triggered reporting under deactivated SCell in non-DRX for 10MHz+5MHz Huawei imported from 3GU
R5‑142350 Addition of new TC 9.1.18 FDD RSRP Accuracy for E-UTRAN Carrier Aggregation for 10MHz + 5MHz Huawei imported from 3GU
R5‑142351 Addition of new TC 9.1.19 TDD RSRP Accuracy for E-UTRAN Carrier Aggregation for 10MHz + 5MHz Huawei imported from 3GU
R5‑142352 Addition of new TC 9.2.21 FDD RSRQ Accuracy for E-UTRA Carrier Aggregation for 10MHz+5MHz Huawei imported from 3GU
R5‑142353 Addition of new TC 9.2.22 TDD RSRQ Accuracy for E-UTRA Carrier Aggregation for 10MHz+5MHz Huawei imported from 3GU
R5‑142354 Addition of new TC 8.16.13 E-UTRAN FDD event triggered reporting under deactivated SCell in non-DRX for 5MHz+5MHz Huawei, NII Holdings imported from 3GU
R5‑142355 Addition of new TC 8.16.14 E-UTRAN TDD event triggered reporting under deactivated SCell in non-DRX for 5MHz+5MHz Huawei, NII Holdings imported from 3GU
R5‑142356 Addition of new TC 9.1.20 FDD RSRP Accuracy for E-UTRAN Carrier Aggregation for 5MHz + 5MHz Huawei, NII Holdings imported from 3GU
R5‑142357 Addition of new TC 9.1.21 TDD RSRP Accuracy for E-UTRAN Carrier Aggregation for 5MHz + 5MHz Huawei, NII Holdings imported from 3GU
R5‑142358 Addition of new TC 9.2.23 FDD RSRQ Accuracy for E-UTRAN Carrier Aggregation for 5MHz + 5MHz Huawei, NII Holdings imported from 3GU
R5‑142359 Addition of new TC 9.2.24 TDD RSRQ Accuracy for E-UTRAN Carrier Aggregation for 5MHz + 5MHz Huawei, NII Holdings imported from 3GU
R5‑142360 Addition of applicability for newly added RRM test cases Huawei, NII Holdings imported from 3GU
R5‑142361 Addition of new TC 8.16.7 E-UTRA FDD event triggered reporting on deactivated SCell with PCell interruption in non-DRX for 20 MHz bandwidth Huawei imported from 3GU
R5‑142362 Updates to CA RRM 8.16.x test cases Huawei imported from 3GU
R5‑142363 Editorial CR aligning titles in TS 36.523-2 with TS 36.523-1 Ericsson imported from 3GU
R5‑142364 Editorial CR removing white spaces from title of test case 6.2.4.6 Ericsson imported from 3GU
R5‑142365 Upate of TC 8.7.3.1 FDD sustained data rate performance for EPDCCH scheduling Huawei imported from 3GU
R5‑142366 Upate of TC 8.7.4.1 TDD sustained data rate performance for EPDCCH scheduling Huawei imported from 3GU
R5‑142367 New Intra-band non-Contiguous CA MAC test case 7.1.9.1.3 Ericsson imported from 3GU
R5‑142368 Upate of TC 8.8.1.1 FDD distributed EPDCCH performance Huawei imported from 3GU
R5‑142369 Applicability of new Intra-band non-Contiguous CA test cases Ericsson, Sporton International imported from 3GU
R5‑142370 Upate of TC 8.8.2.1 FDD localized transmission with TM9 Huawei imported from 3GU
R5‑142371 Correction of TC 8.2.1.4.2_A.1 FDD PDSCH Closed Loop Multi Layer Spatial Multiplexing 4x2 for CA (intra-band contiguous DL CA) LG Electronics imported from 3GU
R5‑142372 Upate of TC 8.8.2.1.2 FDD EPDCCH localized transmission with TM10 quasi co-location Type-B Huawei imported from 3GU
R5‑142373 Update Test Tolerance analyses for TS 36.521-3 Test cases 9.1.8.1+9.1.9.1 Anritsu imported from 3GU
R5‑142374 Upate of TC 8.8.2.2 TDD localized transmission with TM9 Huawei imported from 3GU
R5‑142375 Update eICIC Absolute RSRP Test cases 9.1.8.1+9.1.9.1 Anritsu imported from 3GU
R5‑142376 Upate of TC 8.8.2.2.2 TDD EPDCCH localized transmission with TM10 quasi co-location Type-B Huawei imported from 3GU
R5‑142377 Update Test Tolerance analyses for TS 36.521-3 Test cases 9.1.8.2+9.1.9.2 Anritsu imported from 3GU
R5‑142378 Addition of TC 8.8.3.1 FDD Localized transmission with TM10 Type B quasi co-location type Huawei imported from 3GU
R5‑142379 Proposal for addition of phablet OTA and creation of new specification Sporton International Inc. imported from 3GU
R5‑142380 Update eICIC Absolute RSRP Test cases 9.1.8.2+9.1.9.2. Anritsu imported from 3GU
R5‑142381 Update Test Tolerance analyses for TS 36.521-3 Test cases 9.2.7.1+9.2.8.1 Anritsu imported from 3GU
R5‑142382 Addition of TC 8.8.3.2 TDD Localized transmission with TM10 Type B quasi co-location type Huawei imported from 3GU
R5‑142383 Update eICIC Absolute RSRQ Test cases 9.2.7.1+9.2.8.1 Anritsu imported from 3GU
R5‑142384 Update of TC 9.3.6.1_F FDD CQI Reporting under fading conditions multiple CSI processes for CoMP Huawei imported from 3GU
R5‑142385 Update of TC 9.3.6.2_F TDD CQI Reporting under fading conditions multiple CSI processes for CoMP Huawei imported from 3GU
R5‑142386 Test Tolerance analysis update for TS 36.521-1 TC 8.2.1.2.4 Anritsu imported from 3GU
R5‑142387 Upate overview of DL reference measurement channels for EPDCCH Huawei imported from 3GU
R5‑142388 Upate sections of A.3.9 and A.3.10 reference channel for EPDCCH test Huawei imported from 3GU
R5‑142389 Update of applicability for EPDCCH test cases Huawei imported from 3GU
R5‑142390 Test Tolerance analyses for TS 36.521-1 TCs 9.5.3.1.1, 9.5.3.1.2 Anritsu imported from 3GU
R5‑142391 Uncertainties and Test Tolerances for Enhanced Performance Requirement Type A 9.3.5.1.1 and 9.3.5.1.2 CQI Test cases Anritsu imported from 3GU
R5‑142392 Test Tolerance analyses for TS 36.521-1 eICIC CQI Test cases Anritsu imported from 3GU
R5‑142393 Test Tolerances for eICIC 9.2.x CQI Test cases Anritsu imported from 3GU
R5‑142394 Correction of the test cases 8.2.1.2.2 and 8.2.1.2.2_1 CGC imported from 3GU
R5‑142395 Test Tolerance analyses for TS 36.521-1 eICIC RI Test cases Anritsu imported from 3GU
R5‑142396 Correction to NAS UTRA Routing Area Update Accept message Ericsson, TF160 imported from 3GU
R5‑142397 Correction to NAS UTRA Routing Area Update Accept message Ericsson, TF160 imported from 3GU
R5‑142398 Test Tolerances for eICIC 9.5.x RI Test cases Anritsu imported from 3GU
R5‑142399 Correction of test case 8.2.1.1.1_1 CGC imported from 3GU
R5‑142400 Uncerainties and Test Tolerances for EPDCCH 8.8.1.x demodulation Test cases Anritsu imported from 3GU
R5‑142401 Uncertainties and Test Tolerances for CoMP Test case 8.3.1.3.2_F Anritsu imported from 3GU
R5‑142402 GCF Priority 1 - Update to EUTRA RRC test case 8.5.4.1 Ericsson imported from 3GU
R5‑142403 GCF Priority 1 - Update to EUTRA RRC test case 8.5.4.1 Ericsson imported from 3GU
R5‑142404 Correction of the applicability for the test case 8.7.1.1 CGC imported from 3GU
R5‑142405 Adding new test case 6.2.4.5 Sporton International Inc. imported from 3GU
R5‑142406 Correction of conditions of C26es and C27es. CGC imported from 3GU
R5‑142407 Adding new test case 6.2.4.7 Sporton International Inc. imported from 3GU
R5‑142408 Correction of the condition of test case 8.7.1.1 CGC imported from 3GU
R5‑142409 Update of test case 8.2.2.8 ZTE imported from 3GU
R5‑142410 Addition of test case ' Attach / Rejected / IMEI not accepted' ZTE, CMCC imported from 3GU
R5‑142411 Addition of test case ' Attach / Abnormal case / ESM failure' ZTE, CMCC imported from 3GU
R5‑142412 Correction of the test applicability for test cases 8.2.1.1.1_A.2, 8.2.1.3.1_A.1, 8.2.1.3.1_A.2 and 8.2.1.4.2_A.2 CGC imported from 3GU
R5‑142413 Throughput calculation for eICIC demodulation requirements Anritsu imported from 3GU
R5‑142414 Applicability of new EPS test cases ZTE, CMCC imported from 3GU
R5‑142415 Adding new test cases for further Enhancements to CELL-FACH Sporton International Inc. imported from 3GU
R5‑142416 Addition of test case ' Authentication not accepted by the UE/ non-EPS authentication unacceptable' ZTE, CMCC imported from 3GU
R5‑142417 Addition of SIB schedule for EAB test cases ZTE imported from 3GU
R5‑142418 Addition of default message content for SIB21 ZTE imported from 3GU
R5‑142419 Update of Applicability of SIMTC test cases ZTE imported from 3GU
R5‑142420 Corrections to Annex G.5.4 LG Electronics Inc. imported from 3GU
R5‑142421 Update of Applicability of SIMTC test cases ZTE imported from 3GU
R5‑142422 Addition of default message content for SIB21 ZTE imported from 3GU
R5‑142423 Correction to NIMTC test case 10.5.4 Rohde & Schwarz imported from 3GU
R5‑142424 Correction to supplementary service test case 15.10.1 Rohde & Schwarz imported from 3GU
R5‑142425 Correction of the test applicability of the test cases 8.2.1.1.1_A.1, 8.2.1.4.2_A.1, 8.2.2.1.1_A.1 and 8.2.2.4.2_A.1 CGC imported from 3GU
R5‑142426 Correction to CSG Rel-8 testcase 6.3.2.3 Rohde & Schwarz imported from 3GU
R5‑142427 Correction to RRC Rel-8 Mac-i/is testcase 8.2.2.61 Rohde & Schwarz imported from 3GU
R5‑142428 Correction to UL 16QAM testcase 8.3.4.12 Rohde & Schwarz imported from 3GU
R5‑142429 Discussion on inter-band CA tests for the UE supporting inter-band CA with separate antennas for each band NTT DOCOMO, INC. imported from 3GU
R5‑142430 Update to Applicability of bSRVCC Test Cases 13.4.3.18, 13.4.3.19 and 13.4.3.20 Broadcom Corporation imported from 3GU
R5‑142431 Correction to Radio Bearer Setup Message for TD-SCDMA Ericsson, CATT, Anritsu imported from 3GU
R5‑142432 Updates to Refsens for Intra-band non-contiguous CA NTT DOCOMO, INC. imported from 3GU
R5‑142433 Correction to Radio Bearer Setup Message for TD-SCDMA Ericsson, CATT, Anritsu imported from 3GU
R5‑142434 Correction to Applicability of SIMTC 10.5.1b Broadcom Corporation imported from 3GU
R5‑142435 Updates to CELL_FACH test cases 8.3.5.1a, 8.3.5.1b and 8.3.5.2b Ericsson imported from 3GU
R5‑142436 New Supplementary Services Call Waiting test case 15.5.5 Broadcom Corporation imported from 3GU
R5‑142437 Update to ri-ConfigIndex in Table 4.6.3-2AC CQI-ReportPeriodic-r10-DEFAULT Broadcom Corporation imported from 3GU
R5‑142438 New Supplementary Services Call Waiting test case 15.5.6 Broadcom Corporation imported from 3GU
R5‑142439 Adding new enh CELL_FACH test cases 8.3.5.2c and 8.3.5.2d Ericsson imported from 3GU
R5‑142440 Correction of measObjectId in Several SRVCC Test Cases Broadcom Corporation imported from 3GU
R5‑142441 Correction to Idle Mode Test Cases 6.2.2.2a and 6.2.2.3a Ericsson, Anritsu, CATT imported from 3GU
R5‑142442 New Supplementary Services Call Waiting test case 15.5.7 Broadcom Corporation imported from 3GU
R5‑142443 New Supplementary Services Call Waiting test case 15.5.8 Broadcom Corporation imported from 3GU
R5‑142444 Introduction of transmission mode 10 in precoder update granularity in FDD and TDD common test parameters Samsung imported from 3GU
R5‑142445 Addition of Close Down Procedure for bSRVCC Test Cases Broadcom Corporation imported from 3GU
R5‑142446 Introduction of new TC 8.3.2.4.2_F TDD PDSCH Performance with DCI format 2D, non Quasi Co-located Antenna Ports, Same Cell ID and multiple NZP CSI-RS resources for CoMP Samsung imported from 3GU
R5‑142447 Correction to Applicability of CA Test Cases 7.1.2.10.2 and 7.1.2.11.2 Broadcom Corporation imported from 3GU
R5‑142448 Correction to Note 1 in Inter-band CA table A.4.3.3.3-3 Broadcom Corporation imported from 3GU
R5‑142449 Introduction of TC 8.3.2.4.3_F TDD PDSCH Performance with DCI format 2D, non Quasi Co-located Antenna Ports, Different Cell ID, Colliding CRS and single NZP CSI-RS for CoMP Samsung imported from 3GU
R5‑142450 Applicability for new CoMP TDD TCs Samsung imported from 3GU
R5‑142451 Correction to Applicability of MDT Test Case 8.6.2.9 and Update to pc_standaloneGNSS-Location Applicability Comment Broadcom Corporation imported from 3GU
R5‑142452 Correction to Applicability of EUTRA eMDT Test Case 8.6.5.1a and Addition of New PICS Broadcom Corporation imported from 3GU
R5‑142453 Adding Applicability statements to several enh CELL_FACH test cases Ericsson imported from 3GU
R5‑142454 Correction to eMDT Test Case 8.6.7.4 and Update to 8.6.5.1, 8.6.5.1a and 8.6.5.4 Broadcom Corporation imported from 3GU
R5‑142455 Update to EUTRA MDT Test Case 8.6.2.8 Broadcom Corporation imported from 3GU
R5‑142456 Correction to EUTRA Idle Mode Test Cases 6.2.2.6 and 6.2.3.6 Broadcom Corporation imported from 3GU
R5‑142457 Correction to LTE-A Carrier Aggregation Test Case 8.2.4.21.1 and 8.2.4.21.2 Broadcom Corporation imported from 3GU
R5‑142458 Corrections to TC 8.2.2.5.2, 8.3.1.17.2, 8.5.1.7.2 in TS36.523-1 Ericsson imported from 3GU
R5‑142459 Updates to PRD12 MCC TF160 imported from 3GU
R5‑142460 Correction of Test case 6.2.2.5 LG Electronics Inc. imported from 3GU
R5‑142461 Correction to EUTRA Idle mode Test case 6.1.2.12 Broadcom Corporation imported from 3GU
R5‑142462 Adding general information for the eMBMS service continuity test cases Ericsson imported from 3GU
R5‑142463 Update to EUTRA Idle Mode Test Case 6.1.1.3 Broadcom Corporation imported from 3GU
R5‑142464 Update to EUTRA Idle Mode Test Case 6.1.1.3a Broadcom Corporation imported from 3GU
R5‑142465 Update initial condition and test requirement in test case 8.7.1.1_A.2_1 for two 15MHz CCs LG Electronics Inc. imported from 3GU
R5‑142466 Clarification the minimum conformance requirement and test parameter for 8.2.1.3.3_C1 and 8.2.1.3.3_C2 test cases LG Electronics Inc. imported from 3GU
R5‑142467 Update to EUTRA Idle Mode Test Case 6.1.1.3a Broadcom Corporation imported from 3GU
R5‑142468 Correction to DC-HSUPA MAC TC 7.1.9.1 Ericsson, MCC TF160 imported from 3GU
R5‑142469 Correction to GCF WI-154 IMS emergency Testcase 11.2.4 Anritsu Ltd, Broadcom imported from 3GU
R5‑142470 Correction to DC-HSUPA MAC TC 7.1.9.2 Ericsson, MCC TF160 imported from 3GU
R5‑142471 Correction to DC-HSUPA MAC TC 7.1.9.5 Ericsson, MCC TF160 imported from 3GU
R5‑142472 Discussion paper for capability reporting in TC 8.5.4.1 Ericsson, TF160 imported from 3GU
R5‑142473 Update to Call Forwarding test case 15.4.1 Ericsson, TF160 imported from 3GU
R5‑142474 Adding new test case 15.4.2 Call forwarding supplementary services, Registration rejected Ericsson imported from 3GU
R5‑142475 Correction to UL timing accuracy Tx test cases Qualcomm Inc imported from 3GU
R5‑142476 Adding new test case 15.4.4 Call forwarding supplementary services, Erasure rejected Ericsson imported from 3GU
R5‑142477 Update to Call Forwarding test case 15.4.3 Ericsson, TF160 imported from 3GU
R5‑142478 Update to Call Forwarding test case 15.4.5 Ericsson, TF160 imported from 3GU
R5‑142479 Update to Call Forwarding test case 15.4.6 Ericsson, TF160 imported from 3GU
R5‑142480 Update to Call Forwarding test case 15.4.7 Ericsson, TF160 imported from 3GU
R5‑142481 Adding new test case 15.4.8 Call forwarding supplementary services, Interrogation rejected Ericsson imported from 3GU
R5‑142482 Addition and updates of applicability statements for Call Forwarding test cases Ericsson, TF160 imported from 3GU
R5‑142483 New MTC test case 6.1.1.7a PLMN selection / Periodic reselection / ExtendedWaitTimer / Single Frequency operation Ericsson imported from 3GU
R5‑142484 Correct applicabilities for test cases 6.2.4.1, 6.2.4.3-4 and 6.2.4.6 Ericsson imported from 3GU
R5‑142485 Add applicability for test case 6.2.4.9 Ericsson imported from 3GU
R5‑142486 Clarification to test case 15.14a MCC TF160 imported from 3GU
R5‑142487 Add test case 6.2.4.9 for inter-RAT cell reselection Ericsson imported from 3GU
R5‑142488 Corrections for Annex C.21 Anite, Qualcomm imported from 3GU
R5‑142489 Correction to GCF WI-087 EUTRA<>GERAN SRVCC Testcase 13.4.3.5 Anritsu Ltd, Intel Corporation imported from 3GU
R5‑142490 Correction to Annex procedure C.32 and C.33 Anritsu Ltd, Intel Corporation imported from 3GU
R5‑142491 Correction parameter and reference table number in test case 8.3.2.4.1_F LG Electronics Inc. imported from 3GU
R5‑142492 Addition of TC 8.2.2.7 TDD Carrier Aggregation with power imbalance LG Electronics Inc. imported from 3GU
R5‑142493 Addition of TC 8.2.1.1.1_2 and 8.2.2.1.1_2 LG Electronics Inc. imported from 3GU
R5‑142494 Corrections to test case 8.2.1.4.2_1, 8.2.2.4.1_1, and 8.2.2.4.2_1 LG Electronics Inc. imported from 3GU
R5‑142495 Addition of interference rejection test cases TC 8.2.1.4.3 LG Electronics imported from 3GU
R5‑142496 Clarification of test parameters for eICIC PDCCH performance tests LG Electronics Inc., Rohde & Schwarz imported from 3GU
R5‑142497 Addition of message content exception in eICIC performance tests with MBSFN ABS LG Electronics Inc. imported from 3GU
R5‑142498 Addition of new TC 8.2.2.4.2_A.2 TDD PDSCH Closed Loop Multi Layer Spatial Multiplexing 4x2 for CA (inter-band DL CA) LG Electronics Inc. imported from 3GU
R5‑142499 Update of test case 8.3.3.3 applicability test condition Qualcomm Inc. imported from 3GU
R5‑142500 Correction of interference rejection test cases TC 8.2.2.4.3 LG Electronics Inc. imported from 3GU
R5‑142501 Update of MFBI test cases with MFBI IXIT Qualcomm Inc., Anritsu Ltd. imported from 3GU
R5‑142502 Correction of FDD PDSCH Open Loop Spatial Multiplexing 2x2 for CA test cases of TCs 8.2.1.3.1_A.2 and 8.2.1.3.1_A.2_1 LG Electronics Inc. imported from 3GU
R5‑142503 AP#61.01: Update cell configuration in eICIC test cases to synchronous cells in line with equivalent tests in TS 36.521-3 Qualcomm Inc. imported from 3GU
R5‑142504 Addition of MFBI Band IXIT Qualcomm Inc., Anritsu Ltd. imported from 3GU
R5‑142505 Update of MFBI test case 6.1.2.19 Qualcomm Inc., Anritsu Ltd. imported from 3GU
R5‑142506 Update of MFBI test case 6.1.2.20 Qualcomm Inc., Anritsu Ltd. imported from 3GU
R5‑142507 Update of MFBI test case 6.1.2.21 Qualcomm Inc., Anritsu Ltd. imported from 3GU
R5‑142508 Update of MFBI test case 8.2.4.22 Qualcomm Inc., Anritsu Ltd. imported from 3GU
R5‑142509 Clarification of RRC message definitions LG Electronics Inc. imported from 3GU
R5‑142510 Update of IDLE mode test case 6.1.2.12 and 6.1.2.14 Qualcomm Inc. imported from 3GU
R5‑142511 Update of RRC Test Case 8.3.1.13a Qualcomm Inc. imported from 3GU
R5‑142512 Corrections to MBMS information elements in SIB2 and SIB13 LG Electronics Inc. imported from 3GU
R5‑142513 Update of CGI reporting test case 8.3.3.2 Qualcomm Inc., Anritsu Ltd. imported from 3GU
R5‑142514 Correction of the condition of the test cases 8.2.1.1.1_A.2, 8.2.1.3.1_A.1, 8.2.1.3.1_A.2 and 8.2.1.4.2_A.2 CGC imported from 3GU
R5‑142515 Corrections to MBMS performance test cases LG Electronics Inc. imported from 3GU
R5‑142516 Correction of the condition for the test cases 8.2.1.1.1_A.1, 8.2.1.4.2_A.1 and 8.2.2.1.1_A.1 CGC imported from 3GU
R5‑142517 Corrections of minimum test times in Annex G.3.5 for eICIC performance test LG Electronics Inc.,Rohde & Schwarz imported from 3GU
R5‑142518 Update of IMS Emergency Call over EPS test case 11.2.4 Qualcomm Inc., Samsung, Anite imported from 3GU
R5‑142519 Correct to delete semicolon (":") in the ecn media line format CGC imported from 3GU
R5‑142520 Correction to test configuration parameter of DL RMC LG Electronics Inc. imported from 3GU
R5‑142521 Editorial correction to the reference document information on TC15.24.5 CGC imported from 3GU
R5‑142522 Add a reference to Release 10 UE in the "Reference" part CGC imported from 3GU
R5‑142523 Correct to the test step contents of the test cases 7.2 & 7.3 CGC imported from 3GU
R5‑142524 Correction to the typoes in test cases from 7.2 to 7.6 CGC imported from 3GU
R5‑142525 Update of test case 8.2.4.14 ZTE imported from 3GU
R5‑142526 Update of test case 8.2.4.14a ZTE imported from 3GU
R5‑142527 Updates to 8.2.1.3 FDD PDSCH Open Loop Spatial Multiplexing 2x2 related test cases Huawei imported from 3GU
R5‑142528 Updates to 8.2.2.3 TDD PDSCH Open Loop Spatial Multiplexing 2x2 related test cases Huawei imported from 3GU
R5‑142529 Updates to 8.7.1.1 FDD sustained data rate performance related test cases Huawei imported from 3GU
R5‑142530 Updates to 8.7.2.1 TDD sustained data rate performance related test cases Huawei imported from 3GU
R5‑142531 Correct and clarify the contradictory parameters defined in high speed train scenario CATT imported from 3GU
R5‑142532 Splitting of FDD CA TM3 and soft buffer management tests Huawei imported from 3GU
R5‑142533 Splitting of TDD CA TM3 and soft buffer management tests Huawei imported from 3GU
R5‑142534 Updates to 8.7.1.1_A FDD sustained data rate performance for CA related test cases Huawei imported from 3GU
R5‑142535 Updates to 8.7.2.1_A TDD sustained data rate performance for CA related test cases Huawei imported from 3GU
R5‑142536 Addition of applicability for new TM3, soft buffer management and SDR test cases Huawei imported from 3GU
R5‑142537 Updates to Chap.5 for CA_27B Huawei, NII Holdings imported from 3GU
R5‑142538 Updates to TC 7.3A.2 Reference sensitivity level for CA_27B Huawei, NII Holdings imported from 3GU
R5‑142539 Updates to TC 7.4A.2 maximum input level for intra-band contiguous CA for CA_27B Huawei, NII Holdings imported from 3GU
R5‑142540 Updates to TC 7.5A.2 ACS for CA_27B Huawei, NII Holdings imported from 3GU
R5‑142541 Updates to 7.6.1A.2 IBB for CA of CA_27B Huawei, NII Holdings imported from 3GU
R5‑142542 Updates to TC 7.6.2A.2 OOB for CA of CA_27B Huawei, NII Holdings imported from 3GU
R5‑142543 Updates to TC 7.6.3A.2 Narrow band blocking for CA_27B Huawei, NII Holdings imported from 3GU
R5‑142544 Updates to TC 7.7A.2 Spurious response for CA_27B Huawei, NII Holdings imported from 3GU
R5‑142545 Add Test Tolerance analyses for TS 36.521-3 Test cases 8.1.7 and 8.2.5 Rohde & Schwarz imported from 3GU
R5‑142546 Updates to TC 7.8.1A.2 Wideband intermodulation for CA_27B Huawei, NII Holdings imported from 3GU
R5‑142547 Uncertainties and Test Tolerances for eICIC Intra-Freqency Event-Triggered Reporting test cases 8.1.7 and 8.2.5 Rohde & Schwarz imported from 3GU
R5‑142548 Updates to TS 36.508 for CA_27B test frequencies defined in section 4.3.1.1 Huawei, NII Holdings imported from 3GU
R5‑142549 Add Test Tolerance analyses for TS 36.521-3 Test cases 7.3.9,7.3.10,7.3.13 and 7.3.14 Rohde & Schwarz imported from 3GU
R5‑142550 Uncertainties and Test Tolerances for eICIC RLM out-of-sync Test cases 7.3.9,7.3.10,7.3.13 and 7.3.14 Rohde & Schwarz imported from 3GU
R5‑142551 Updates to TS 36.508 for CA_27B sianlling test frequencies defined in section 6.2.3.2 Huawei, NII Holdings imported from 3GU
R5‑142552 Add Test Tolerance analyses for TS 36.521-3 Test cases 7.3.11,7.3.12,7.3.15 and 7.3.16 Rohde & Schwarz imported from 3GU
R5‑142553 Uncertainties and Test Tolerances for eICIC RLM In-sync Test cases 7.3.11,7.3.12,7.3.15 and 7.3.16 Rohde & Schwarz imported from 3GU
R5‑142554 Addition of applicability statements for new Supplementary Services Call Waiting tests Broadcom Corporation imported from 3GU
R5‑142555 Corrections to Call Waiting test cases Broadcom Corporation imported from 3GU
R5‑142556 Correction to EUTRA EMM Test case 9.2.3.1.6 Broadcom Corporation imported from 3GU
R5‑142557 Addition of UE radio bearer test mode procedure to the Inter-frequency CSG proximity indication test case 8.3.12.14 Broadcom Corporation imported from 3GU
R5‑142558 New WI proposal: Conformance Test Aspects - BDS Positioning Support for LTE and UMTS CATT imported from 3GU
R5‑142559 Correction to Test Case 6.2.2.2 CATT imported from 3GU
R5‑142560 Correction to Test Case 9.2.3.2.8 CATT imported from 3GU
R5‑142561 Correction of TC 9.2.1.2.1b CATT imported from 3GU
R5‑142562 Summary of the CRs for LCR TDD in RAN5#63 Signaling Group CATT imported from 3GU
R5‑142563 Correction to SRVCC and bSRVCC Test Cases to Avoid Unexpected Cell Reselection from GERAN to EUTRAN Broadcom Corporation imported from 3GU
R5‑142564 Addition of new test frequency for CA_39C CMCC imported from 3GU
R5‑142565 Update additional spurious emissions for CA_38C (intra-band contiguous DL CA and UL CA) CMCC imported from 3GU
R5‑142566 Correction of SSAC in Connected mode TCs about RAB establishment NTT DOCOMO, INC. imported from 3GU
R5‑142567 Addition of new TC for the UE behavior receiving SIP_380 NTT DOCOMO, INC. imported from 3GU
R5‑142568 Applicability of new test cases for the UE receiving SIP_380 NTT DOCOMO, INC. imported from 3GU
R5‑142569 Update additional spurious emissions for CA_39C (intra-band contiguous DL CA and UL CA) CMCC imported from 3GU
R5‑142570 Update In-band blocking for CA_39C (intra-band contiguous DL CA and UL CA) CMCC imported from 3GU
R5‑142571 Correction to EUTRA to UTRA SRVCC and aSRVCC Test Cases to Avoid Unexpected Cell Reselection Broadcom Corporation imported from 3GU
R5‑142572 Update Out-of-band blocking for CA_39C (intra-band contiguous DL CA and UL CA) CMCC imported from 3GU
R5‑142573 Update Reference sensitivity level for CA_39C (intra-band contiguous DL CA and UL CA) CMCC imported from 3GU
R5‑142574 TC 15.27 disambiguation Rohde & Schwarz imported from 3GU
R5‑142575 Update Spurious emission band UE co-existence for CA_39C (intra-band contiguous DL CA and UL CA) CMCC imported from 3GU
R5‑142576 Update UE Transmit OFF power for CA _39C (intra-band contiguous DL CA and UL CA) CMCC imported from 3GU
R5‑142577 Update description of extending applicability test cases CMCC imported from 3GU
R5‑142578 Correction to Test2 of UE Transmit Timing Accuracy test cases 7.1.1 and 7.1.2 Agilent Technologies, Sporton International Inc., Ericsson imported from 3GU
R5‑142579 Preliminary details for November RAN 5 meeting in Venice Spirent Communications, Telecom Italia imported from 3GU
R5‑142580 Resubmission: Removal of TC 6.3.10, 6.3.11, 6.3.12 from TS 36.523-1 ETSI Secretariat, Intel Corporation imported from 3GU
R5‑142581 Updates to SDP content representation MCC TF160, CGC, Anritsu Ltd, Rohde&Schwarz, Anite, Ericsson, Qualcomm, Microsoft imported from 3GU
R5‑142582 Apply C.30 to TC 8.13 Rohde & Schwarz imported from 3GU
R5‑142583 Update of FGI definitions in TS 36.521-2 Ericsson imported from 3GU
R5‑142584 Update of FGI definitions in TS 36.523-2 Ericsson imported from 3GU
R5‑142585 Reinsertion of accidentally deleted applicabilities 5.9C and 5.9D ETSI Secretariat imported from 3GU
R5‑142586 Editorial correction for test case 6.2.4.1 Ericsson imported from 3GU
R5‑142587 Addition of new ICS item for CSG proximity test Broadcom Corporation imported from 3GU
R5‑142588 Remove the square bracket in TC 8.3.1.3.2_F and TC 8.3.1.3.3_F Samsung imported from 3GU
R5‑142589 Correction to eICIC PDSCH demodulation tests Anritsu imported from 3GU
R5‑142590 Uncertainties and Test Tolerances for eICIC PDCCH/PCFICH and PHICH demodulation tests Anritsu imported from 3GU
R5‑142591 Correction to eICIC TDD RI requirements Anritsu imported from 3GU
R5‑142592 Correction to eICIC PCFICH/PDCCH tests Anritsu imported from 3GU
R5‑142593 Correction to minimum test time for eICIC tests Anritsu imported from 3GU
R5‑142594 Addition of test mode procedure to the E-UTRAN Inter-frequency CSG proximity indication test case 8.3.4.5 Telecom Italia imported from 3GU
R5‑142595 Correction to minimum test time for eICIC tests Anritsu imported from 3GU
R5‑142596 Addition of message exception for PHICH duration Anritsu imported from 3GU
R5‑142597 Correction to eICIC CSI tests Anritsu imported from 3GU
R5‑142598 Alignment of Related ICS/IXIT Statements for Supplementary Services & NITZ Cetecom, BlackBerry imported from 3GU
R5‑142599 Correction to periodicity of ABS pattern in eICIC RRM Anritsu imported from 3GU
R5‑142600 Clean-up of eICIC RRM tests Anritsu imported from 3GU
R5‑142601 Correction to title in feICIC PDSCH demodulation tests Anritsu imported from 3GU
R5‑142602 Correction to the exception of SIB2 Anritsu imported from 3GU
R5‑142603 Addition of 4Tx for RF demodulation test cases Anritsu imported from 3GU
R5‑142604 LBS Perf: Moving some .rnx files to the right .zip file Rohde & Schwarz imported from 3GU
R5‑142605 Correction to measurement bandwidth in 6.6.2.1A.1 Anritsu imported from 3GU
R5‑142606 Correction to test configuration tables in 6.2.3A and 6.2.4A Anritsu imported from 3GU
R5‑142607 Correction to Postambles for E-UTRA to UTRA test for IMS de-registration procedures Rohde & Schwarz, Qualcomm imported from 3GU
R5‑142608 Correction to Intra-band CA uplink configuration for reference sensitivity Anritsu imported from 3GU
R5‑142609 Correction to CA Rx test cases Anritsu imported from 3GU
R5‑142610 Update of bandwidth combination set for CA_4A-13A Anritsu imported from 3GU
R5‑142611 Correction to TDD CA Performance test case 8.2.2.3.1_A.1 Anritsu imported from 3GU
R5‑142612 Update of sustained downlink data rate tests Anritsu imported from 3GU
R5‑142613 Correction to call setup in 8.7.1 and 8.7.2 Anritsu imported from 3GU
R5‑142614 Correction to test channel bandwidth in 9.6.1.2_A.1 Anritsu imported from 3GU
R5‑142615 Correction to CQI reference measurement channels Anritsu imported from 3GU
R5‑142616 Correction to MBMS performance Anritsu imported from 3GU
R5‑142617 Correction to event triggered reporting tests for CA Anritsu imported from 3GU
R5‑142618 Clarification of tracking area updating procedure Anritsu imported from 3GU
R5‑142619 Correction to 9.6.2 GSM RSSI accuracy for E-UTRAN TDD Anritsu imported from 3GU
R5‑142620 LBS Sig: Moving some .rnx files to the right .zip file Rohde & Schwarz imported from 3GU
R5‑142621 Clean-up for E-UTRAN RRM test cases Anritsu imported from 3GU
R5‑142622 Correction to Intra CA test cases Anritsu imported from 3GU
R5‑142623 Update of Annex E for CA RRM Inter frequency tests for Intra-band Anritsu imported from 3GU
R5‑142624 Update of Annex E for InterRAT with TDD-TD-SCDMA Anritsu imported from 3GU
R5‑142625 Introduction of new EVM and phase discontinuity with HS-DPCCH test case for uplink OLTD Motorola Mobility imported from 3GU
R5‑142626 Introduction of new Power setting in uplink compressed mode test case for uplink OLTD Motorola Mobility imported from 3GU
R5‑142627 Introduction of new Spurious Emissions test case for uplink OLTD Motorola Mobility imported from 3GU
R5‑142628 Introduction of new Transmit intermodulation test case for uplink OLTD Motorola Mobility imported from 3GU
R5‑142629 Introduction of new OLTD test cases in Annex F Motorola Mobility imported from 3GU
R5‑142630 Introduction of new test cases for uplink OLTD in TS 34.121-2 Motorola Mobility imported from 3GU
R5‑142631 Correction to CA Enhancements test case 7.1.2.10 Motorola Mobility, MCC TF 160 & Huawei imported from 3GU
R5‑142632 Correction to CA Enhancements test case 7.1.2.11 Motorola Mobility, MCC TF 160 & Huawei imported from 3GU
R5‑142633 Editorial correction for test case 6.2.4.3 Ericsson imported from 3GU
R5‑142634 Addition of release applicable in Release column for CA enh test cases Motorola Mobility, MCC TF 160 & Huawei imported from 3GU
R5‑142635 Correction to LTE-GERAN SRVCC test case 13.4.3.3 Rohde & Schwarz, Broadcom Corp. imported from 3GU
R5‑142636 Investigations on extension of test model to support phase rotation in TDD Signaling test cases and trial implementation on SS Platforms CATT imported from 3GU
R5‑142637 Clarification on scheduling of user data in special subframe for TDD LTE Downlink Performance test cases Ericsson imported from 3GU
R5‑142638 Clarification on scheduling of user data in special subframe for TDD LTE Downlink Performance test cases Ericsson imported from 3GU
R5‑142639 Clarification on scheduling of user data in special subframe for TDD LTE Downlink Performance test cases Ericsson imported from 3GU
R5‑142640 Clarification on system simulator usage of UE reported CQI and RI in LTE Downlink Performance test cases Ericsson imported from 3GU
R5‑142641 Correction to CSG Rel-8 testcase 12.3.1.10 Rohde & Schwarz imported from 3GU
R5‑142642 Editorial update of TC 12.12 Ericsson imported from 3GU
R5‑142643 Addition of Occupied Bandwidth test case for UL CLTD Ericsson imported from 3GU
R5‑142644 Correction to cs-FallbackIndicator in LTE SRVCC test cases 13.4.3.x Rohde & Schwarz, Intel Corp imported from 3GU
R5‑142645 Removal of soft buffer test points from FDD TM3 test cases in 8.2.1.3.1 and move to new soft buffer test cases in section 8.2.1.3.1A Ericsson imported from 3GU
R5‑142646 Correction to Band Indicator in LTE-GERAN SRVCC test cases 13.4.3.3 and 13.4.3.5 Rohde & Schwarz imported from 3GU
R5‑142647 Update call hold applicability for IR.92 versions Ericsson imported from 3GU
R5‑142648 Addition of new ICS item for E-UTRAN CSG proximity test Telecom Italia imported from 3GU
R5‑142649 Update to EUTRA RRC Idle Mode Test Case 6.1.2.3 Broadcom Corporation imported from 3GU
R5‑142650 Discussion paper on adding new NIMTC test case variant of 6.1.1.7 for bands with limited bandwidth Ericsson imported from 3GU
R5‑142651 Addition of new chapter 5 test cases for UL CLTD Qualcomm Inc imported from 3GU
R5‑142652 Discussion paper on adding new NIMTC test case variant of 6.1.1.7 for bands with limited bandwidth Ericsson imported from 3GU
R5‑142653 Updates to RRM test cases 8.3.5.5.1 and 8.3.5.5.4 - Reselection to E-UTRA FDD and TDD when HS-DSCH DRX is configured (E-UTRA has higher priority) Ericsson imported from 3GU
R5‑142654 Applicability update to newly added chapter-5 test cases with UL-CLTD Qualcomm Inc imported from 3GU
R5‑142655 Discussion paper on adding new NIMTC test case variant of 6.1.1.7 for bands with limited bandwidth Ericsson imported from 3GU
R5‑142656 Applicability update to newly added chapter-5 test cases with UL-CLTD Qualcomm Inc imported from 3GU
R5‑142657 Annexure update to test tolerances of newly added ch.5 test cases Qualcomm inc imported from 3GU
R5‑142658 Work plan for Supplementary Services and NITZ, start of RAN5-63 BlackBerry imported from 3GU
R5‑142659 Addition of new chapter 5 test cases for UL CLTD Qualcomm Inc imported from 3GU
R5‑142660 Remove annex C.7 Ericsson imported from 3GU
R5‑142661 Annexure update to test tolerances of newly added ch.5 test cases Qualcomm inc imported from 3GU
R5‑142662 Revised WID: UE Conformance Test Aspects - LTE Carrier Aggregation Enhancements Microsoft Corporation imported from 3GU
R5‑142663 Applicability update to newly added chapter-5 test cases with UL-CLTD Qualcomm Inc imported from 3GU
R5‑142664 Revised WID: UE Conformance Test Aspects - Further REL-12 Configurations for LTE Advanced Carrier Aggregation Microsoft Corporation imported from 3GU
R5‑142665 Discussion paper on adding new NIMTC test case variant of 6.1.1.7 for bands with limited bandwidth Ericsson imported from 3GU
R5‑142666 Work plan for Supplementary Services and NITZ, end of RAN5-63 BlackBerry imported from 3GU
R5‑142667 Addition of new chapter 5 test cases for UL CLTD Qualcomm Inc imported from 3GU
R5‑142668 Addition of 5+5 and 10+5 RRM TC Coverage for Rel-12 CA Configurations WI Microsoft Corporation, Huawei imported from 3GU
R5‑142669 Update of E-UTRA DL-SCH one layer transport block size selection test cases 7.1.7.1.1, 7.1.7.1.2, 7.1.7.1.3 and 7.1.7.1.4 for higher UE categories Ericsson imported from 3GU
R5‑142670 Correction to EUTRA UE Positioning test cases 7.3.4.x Rohde & Schwarz imported from 3GU
R5‑142671 Addition of CA_27B related information into A.4.6 in TS 36.521-2 Huawei, NII Holdings imported from 3GU
R5‑142672 Correction to in-band blocking requirements Microsoft Corporation imported from 3GU
R5‑142673 Addition of CA_27B related information into A.4.3.3 in TS 36.523-2 Huawei, NII Holdings imported from 3GU
R5‑142674 Definition correction to UL and DL category tables Microsoft Corporation imported from 3GU
R5‑142675 36.521-1: Editorial correction on 8.2.1.4.2_A.2 message contents Agilent Technologies imported from 3GU
R5‑142676 Correction to 6.6.2.1A test environment Microsoft Corporation imported from 3GU
R5‑142677 Update to OOS handling test case for UL CLTD Qualcomm Inc imported from 3GU
R5‑142678 Discussion paper on adding new NIMTC test case variant of 6.1.1.7 for bands with limited bandwidth Ericsson imported from 3GU
R5‑142679 Correction to applicability conditions of 7.6.3A.3 and 7.7A.3 Microsoft Corporation imported from 3GU
R5‑142680 Addition of new TC 8.2.4.23 CA / RRC connection reconfiguration / Handover / Failure / Re-establishment successful Huawei imported from 3GU
R5‑142681 Update of E-UTRA DL-SCH two layer transport block size selection test cases 7.1.7.1.5 and 7.1.7.1.6 for higher UE categories Ericsson imported from 3GU
R5‑142682 Applicability for new TC 8.2.4.23 Handover failure and RRC re-establishment on PCell or SCell successfully Huawei imported from 3GU
R5‑142683 Removal of soft buffer test points from TDD TM3 test cases in 8.2.2.3.1 and move to new soft buffer test case in section 8.2.2.3.1A Ericsson imported from 3GU
R5‑142684 Part 2 for new CA test case Huawei imported from 3GU
R5‑142685 Correction to test case 15.8.1 (SS: Call restriction, registration accepted). BlackBerry imported from 3GU
R5‑142686 Addition of test procedure for R-99 UL CLTD Qualcomm Inc imported from 3GU
R5‑142687 Addition of test procedure for R-99 UL CLTD Qualcomm Inc imported from 3GU
R5‑142688 Correction to test cases 15.8.2 and 15.8.3 (SS: Call restriction, registrations rejected). BlackBerry imported from 3GU
R5‑142689 Introduction of NC CA TC 7.6.1A.4 Microsoft Corporation imported from 3GU
R5‑142690 Update of E-UTRA UL-SCH transport block size selection test case 7.1.7.2.1 for higher UE categories Ericsson imported from 3GU
R5‑142691 Correction to EMM test cases 9.2.1.1.1a and 9.2.1.1.1b Rohde & Schwarz imported from 3GU
R5‑142692 Correction to 8.2.2.1.1_1 and 8.2.2.2.1_1 applicability Microsoft Corporation imported from 3GU
R5‑142693 Correction to new supplementary service call restriction test case 15.8.4: Activation accepted BlackBerry imported from 3GU
R5‑142694 Updates to TCs 6.1.2.12, 6.1.2.14, 8.3.1.13a and 9.2.1.1.1b Huawei, CATT, CMCC imported from 3GU
R5‑142695 Applicability for new soft buffer test cases Ericsson imported from 3GU
R5‑142696 Addition of TRP test requirements for LEE Tablet Devices Intel Corp. imported from 3GU
R5‑142697 36.521-1: Corrections to section 7.3A Agilent Technologies, Sporton International Inc. imported from 3GU
R5‑142698 Introduction of NC CA TC 7.6.2A.4 Microsoft Corporation imported from 3GU
R5‑142699 Addition of TRS test requirements for LEE Tablet Devices Intel Corp. imported from 3GU
R5‑142700 Correction to ESM test case 10.4.2 Rohde & Schwarz imported from 3GU
R5‑142701 Introduction of NC CA TC 7.7A.4 Microsoft Corporation imported from 3GU
R5‑142702 Introduction of NC CA TC 7.6.3A.4 Microsoft Corporation imported from 3GU
R5‑142703 Uncertainties and Derivation of Test Requirements for TCs 7.6.xA.4 and 7.7A.4 Microsoft Corporation imported from 3GU
R5‑142704 Correction for ATTACH REQUEST contents in aSRVCC and bSRVCC test cases Anite, NVIDIA imported from 3GU
R5‑142705 Update of applicability of E-UTRA DL-SCH two layer transport block size selection test cases 7.1.7.1.5 and 7.1.7.1.6 for higher UE categories Ericsson imported from 3GU
R5‑142706 Removal of GCF WI-172 EUTRA<>UTRA aSRVCC Testcase 13.4.3.12 Anritsu Ltd, Intel Corporation imported from 3GU
R5‑142707 APN and IR.92 Ericsson imported from 3GU
R5‑142708 Correction to ESM test case 10.8.8 Rohde & Schwarz imported from 3GU
R5‑142709 Applicability of GCF WI-172 EUTRA<>UTRA aSRVCC Testcase 13.4.3.12 Anritsu Ltd, Intel Corporation imported from 3GU
R5‑142710 36-521-1: Clarification on Averaged EVM for PRACH Agilent Technologies, Sporton International Inc. imported from 3GU
R5‑142711 Correction to Emergency Call over IMS test cases 11.2.4 and 11.2.5 Rohde & Schwarz imported from 3GU
R5‑142712 Test Tolerance analysis for eICIC RRM TC 9.1.10.1, 9.1.11.1 Qualcomm Incorporated imported from 3GU
R5‑142713 Correction to new supplementary service call restriction test case 15.8.6: Deactivation accepted BlackBerry imported from 3GU
R5‑142714 Correction to 6.3.4.1 for SIB19 configuration Anite, Intel imported from 3GU
R5‑142715 Addition of new RRM test cases for UTRAN to E-UTRA Cell Reselection when HS-DSCH DRX or 2nd DRX is configured Ericsson imported from 3GU
R5‑142716 36.521-1: Editorial correction on 6.6.2.2B test requirements for NS_06 or NS_07 Agilent Technologies imported from 3GU
R5‑142717 Correction to new supplementary service call restriction test case 15.8.9: Normal operation. BlackBerry imported from 3GU
R5‑142718 Corrections to clause 19 and Annex A.2.1 Rohde & Schwarz imported from 3GU
R5‑142719 Uncertainties and test tolerance for RRM Test case 9.1.10.1, 9.1.11.1 Qualcomm Incorporated imported from 3GU
R5‑142720 Correction to applicability for TCs 15.8.2 and 15.8.3 BlackBerry imported from 3GU
R5‑142721 Correction to test case 6.3.5 BlackBerry, Samsung imported from 3GU
R5‑142722 Fixes to TC 12.2a Rohde & Schwarz imported from 3GU
R5‑142723 Addition of TC 9.5.5.1_F.2 FDD RI Reporting with Multiple CSI processes for CoMP Qualcomm Incorporated imported from 3GU
R5‑142724 Correction to RRC test case 8.5.4.1 Rohde & Schwarz, MCC-TF160 imported from 3GU
R5‑142725 Misc fixes to TC 12.2a Rohde & Schwarz imported from 3GU
R5‑142726 APN configuration for IR.92 devices Ericsson imported from 3GU
R5‑142727 Correction to GCF WI-172 EUTRA<>UTRA aSRVCC Testcases 13.4.3.x Anritsu Ltd, Intel Corporation imported from 3GU
R5‑142728 TC 8.2.1.3.3_E.1 FDD PDSCH Open Loop Spatial Multiplexing 2x2 for feICIC (non-MBSFN ABS) BlackBerry imported from 3GU
R5‑142729 Correction to GCF WI-159 Pre-registration at 1xRTT test case 13.4.4.2 Anritsu Ltd, Qualcomm imported from 3GU
R5‑142730 Correction of NITZ capabilities Rohde & Schwarz, MCC-TF160 imported from 3GU
R5‑142731 TC 8.2.2.3.3_E.1 TDD PDSCH Open Loop Spatial Multiplexing 2x2 for feICIC (non-MBSFN ABS) BlackBerry imported from 3GU
R5‑142732 Correction of applicability conditions for UTRA NITZ test cases Rohde & Schwarz, MCC-TF160 imported from 3GU
R5‑142733 Update to incomplete sections of spectrum emission mask & ACLR test cases for UL CLTD Qualcomm Inc imported from 3GU
R5‑142734 Update to Chapter 5 test cases for max power, CDP, ILPC, change of TFC, power setting in UL compressed mode with UL CLTD Qualcomm Inc imported from 3GU
R5‑142735 Correction to A.3.4.1 and A.3.5.1 Anite, PCTEST Engineering Laboratory, Spirent Communications imported from 3GU
R5‑142736 Correction to LTE InterRAT (UTRA CELL_FACH) test cases 6.2.4.1 and 6.2.4.6 Rohde & Schwarz imported from 3GU
R5‑142737 TC 7.3.19 FDD Radio Link Monitoring for In-sync under Time Domain Measurement Resource Restriction with CRS assistance information and Non-MBSFN ABS (feICIC) BlackBerry imported from 3GU
R5‑142738 Annexure update to include beta values for S-DPCCH to support UL-CLTD Qualcomm Inc imported from 3GU
R5‑142739 Editorial update of annex C Ericsson imported from 3GU
R5‑142740 TC 7.3.20 TDD Radio Link Monitoring for In-sync under Time Domain Measurement Resource Restriction with CRS assistance information and Non-MBSFN ABS (feICIC) BlackBerry imported from 3GU
R5‑142741 Editorial update of annex C Ericsson imported from 3GU
R5‑142742 TC 7.3.20 TDD Radio Link Monitoring for In-sync under Time Domain Measurement Resource Restriction with CRS assistance information and Non-MBSFN ABS (feICIC) BlackBerry imported from 3GU
R5‑142743 Addition of HSDPA Performance cases for Multiflow HSDPA Qualcomm Inc imported from 3GU
R5‑142744 36.521-1: Editorial correction on 6.6.3.3 Initial conditions for NS_19 Agilent Technologies imported from 3GU
R5‑142745 Addition of HSDPA Performance cases for Multiflow HSDPA Qualcomm Inc imported from 3GU
R5‑142746 TC 7.3.21 FDD Radio Link Monitoring Test for In-sync under Time Domain Measurement Resource Restriction with CRS assistance information and MBSFN ABS (feICIC) BlackBerry imported from 3GU
R5‑142747 TC 7.3.22 TDD Radio Link Monitoring Test for In-sync under Time Domain Measurement Resource Restriction with CRS assistance information and MBSFN ABS (feICIC) BlackBerry imported from 3GU
R5‑142748 Test Cases 9.1.14.1, 9.1.14.2, 9.1.15.1, 9.1.15.2 for feICIC BlackBerry imported from 3GU
R5‑142749 Correction to CA band combo CA_3A-5A Qualcomm Inc imported from 3GU
R5‑142750 Verification of exceptions of REFSENS requirements for carrier aggregation BlackBerry, Anritsu, Ericsson, Microsoft imported from 3GU
R5‑142751 Update Test Tolerance analyses for TS 36.521-3 Test cases 9.2.9.1+9.2.10.1 Qualcomm Inc imported from 3GU
R5‑142752 Addition of TC 9.5.5.2_F.2 TDD RI Reporting with Multiple CSI processes for CoMP Qualcomm Incorporated imported from 3GU
R5‑142753 Update to eICIC Absolute RSRQ with MBSFN ABS for chapter 9 RRM test cases Qualcomm Inc imported from 3GU
R5‑142754 Correction to testcase 8.3.1.50 Broadcom Corporation imported from 3GU
R5‑142755 Conditions C19, C20, C21 BlackBerry, Cetecom and SRTC imported from 3GU
R5‑142756 Condition C43 BlackBerry, Cetecom and SRTC imported from 3GU
R5‑142757 Correction to testcase 8.3.1.50 Broadcom Corporation imported from 3GU
R5‑142758 Uncertainties and test tolerance for RRM Test case 9.1.10.2, 9.1.11.2 Qualcomm Incorporated imported from 3GU
R5‑142759 Condition on no UL CA in C20 and C21 BlackBerry imported from 3GU
R5‑142760 Correction to testcase 8.3.1.50 Broadcom Corporation imported from 3GU
R5‑142761 Condition on no UL CA in C43 BlackBerry imported from 3GU
R5‑142762 Correction to testcase 8.3.1.50 Broadcom Corporation imported from 3GU
R5‑142763 Addition of test tolerance analysis for 36.521-3 test case 9.1.10.2, 9.1.11.2 Qualcomm Incorporated imported from 3GU
R5‑142764 Addition of test tolerance analysis for 36.521-3 test case 9.4.1 Qualcomm Incorporated imported from 3GU
R5‑142765 Correction to RRC test case 8.5.1.6 Rohde & Schwarz, ZTE imported from 3GU
R5‑142766 Addition of FDD CQI Reporting under AWGN conditions - PUCCH 1-0 for CA (intra band non-contiguous DL CA) TC 9.6.1.1_A.3 Intel Corp. imported from 3GU
R5‑142767 Addition of TDD CQI Reporting under AWGN conditions - PUCCH 1-0 for CA (intra band non-contiguous DL CA) TC 9.6.1.2_A.3 Intel Corp. imported from 3GU
R5‑142768 Addtion of test frequencies for CA_2A-4A and CA_5A-7A Intel Corp. imported from 3GU
R5‑142769 Addtion of CA_2A-4A and CA_5A-7A to 36.521-1 Clause 5 Intel Corp. imported from 3GU
R5‑142770 Addtion of CA_2A-4A and CA_5A-7A to 36.521-1 Clause 6 Intel Corp. imported from 3GU
R5‑142771 Addtion of CA_2A-4A and CA_5A-7A to 36.521-1 Chapter 7 Intel Corp. imported from 3GU
R5‑142772 Addtion of CA_2A-4A and CA_5A-7A to 36.521-2 Annex A4 Intel Corp. imported from 3GU
R5‑142773 Addtion of CA_2A-4A and CA_5A-7A to 36.523-2 Annex A4 Intel Corp. imported from 3GU
R5‑142774 Addition of new Intra-band non-Contiguous CA test case 7.1.3.11.3 Microsoft Corporation imported from 3GU
R5‑142775 Addition of new Intra-band non-Contiguous CA test case 7.1.4.19.3 Microsoft Corporation imported from 3GU
R5‑142776 Correction to SRVCC Test Case 13.4.3.2 Broadcom Corporation imported from 3GU
R5‑142777 Addition of new Intra-band non-Contiguous CA test case 7.1.4.20.3 Microsoft Corporation imported from 3GU
R5‑142778 Addition of applicability for new Intra-band non-Contiguous CA test cases Microsoft Corporation imported from 3GU
R5‑142779 Applicability of new NIMTC test case 6.1.1.7a Ericsson imported from 3GU
R5‑142780 Discussion paper on adding new test cases for supplementary services for IMS Video Ericsson imported from 3GU
R5‑142781 Addition of HSDPA Performance cases for Multiflow HSDPA Qualcomm Inc imported from 3GU
R5‑142782 Introduction of TC 7.6.xA.4 and 7.7A.4 applicabilities Microsoft Corporation imported from 3GU
R5‑142783 Update to NIMTC test case 9.4.5.4.7 Ericsson imported from 3GU
R5‑142784 UEs with Multi CA Band Capability for RF Microsoft Corporation imported from 3GU
R5‑142785 UEs with Multi CA Band Capability for RRM Microsoft Corporation imported from 3GU
R5‑142786 Discussion on the number of required target RAT bands in Inter-RAT TCs Microsoft Corporation imported from 3GU
R5‑142787 New Work Item Proposal: UE Conformance Test Aspects - single radio voice call continuity from UTRAN/GERAN to E-UTRAN/HSPA Ericsson imported from 3GU
R5‑142788 Addition of PICS for IPv4 and IPv6 Microsoft Corporation imported from 3GU
R5‑142789 Correction to Emergency Call over IMS test case 11.2.3 Rohde & Schwarz imported from 3GU
R5‑142790 Update to SIMTC test case 10.5.1b Ericsson imported from 3GU
R5‑142791 Update to SIMTC test case 10.5.1a Ericsson imported from 3GU
R5‑142792 Radio Bearer Reconfiguration for transition between CELL_PCH & CELL_DCH with SRBs mapped on DCH: Successful Activation and Deactivation of Multiflow HSDPA NSN, Qualcomm imported from 3GU
R5‑142793 Radio Bearer Reconfiguration for transition between CELL_PCH & CELL_DCH with SRBs mapped on DCH: Successful Activation and Deactivation of Multiflow HSDPA NSN, Qualcomm imported from 3GU
R5‑142794 Radio Bearer Reconfiguration for transition between CELL_PCH & CELL_DCH with SRBs mapped on DCH: Successful Activation and Deactivation of Multiflow HSDPA NSN, Qualcomm imported from 3GU
R5‑142795 Correction to RRC Measurememt test case 8.3.4.3 Rohde & Schwarz imported from 3GU
R5‑142796 Correction to GCF WI-159 Pre-registration at 1xRTT test case 13.4.4.2 Anritsu Ltd imported from 3GU
R5‑142797 Correction to GCF WI-159 Enhanced CSFB test case 8.4.7.8 Anritsu Ltd imported from 3GU
R5‑142798 Correction to MFBI Frequencies in 36.508 Anritsu Ltd, Qualcomm Incorporated imported from 3GU
R5‑142799 Addition of applicability for TC 6.6.3B.2 Cetecom imported from 3GU
R5‑142800 Update of MDT test case 8.6.11.1 Qualcomm Inc. imported from 3GU
R5‑142801 Update of MDT test case 8.6.11.1 applicability Qualcomm Inc. imported from 3GU
R5‑142802 Addition of new Multiflow HSDPA test case 8.2.1.85.1 test Sporton International imported from 3GU
R5‑142803 Correction to LTE GERAN Idle mode Test cases Anite imported from 3GU
R5‑142804 New WI proposal: Conformance Test Aspects - BDS Positioning Support for LTE and UMTS CATT new WID
R5‑142805 Addition of Multiflow HSDPA into TS 34.108 Qualcomm Inc CR
R5‑142806 Previous RAN5#62 WG Action Points ETSI Secretariat meeting report / action list
R5‑142807 Addition of SIB schedule for EAB test cases ZTE CR
R5‑142808 Addition of new SS and NITZ test case 15.7.22 CATR CR
R5‑142809 Addition of new SS and NITZ test case 15.7.23 CATR CR
R5‑142810 Addition of new SS and NITZ test case 15.7.24 CATR CR
R5‑142811 Addition of new SS and NITZ test case 15.7.25 CATR CR
R5‑142812 Addition of new SS and NITZ test case 15.7.26 CATR CR
R5‑142813 Addition of new SS and NITZ test case 15.7.27 CATR CR
R5‑142814 Addition of SIMTC Test Case 11.1.1.4 Intel Corporation CR
R5‑142815 Update to the of 7.1.4.18 and 7.1.4.21 to non-CA test cases Anite, Qualcomm CR
R5‑142816 Update 7.1.4.18 and 7.1.4.21 to non-CA test cases Anite, Qualcomm CR
R5‑142817 Introduction of a new supplementary service test case 15.8.7: "Rejection after invoke of DeactivateSS operation" 7Layers CR
R5‑142818 Corrections to UTRA NAS test cases 12.2.1.2,12.5, 12.6.1.1,12.6.1.2,12.7.1 CATR CR
R5‑142819 New Supplementary Services Test Case : Addition of USSD Test Case 15.9.2 Anritsu Ltd CR
R5‑142820 New Supplementary Services Test Case : Addition of USSD Test Case 15.9.4 Anritsu Ltd CR
R5‑142821 New Supplementary Services Test Case : Addition of USSD Test Case 15.9.5 Anritsu Ltd CR
R5‑142822 Correction to UL 16QAM testcase 8.3.4.12 Rohde & Schwarz CR
R5‑142823 New Supplementary Services Call Waiting test case 15.5.5 Broadcom Corporation CR
R5‑142824 New Supplementary Services Call Waiting test case 15.5.6 Broadcom Corporation CR
R5‑142825 New Supplementary Services Call Waiting test case 15.5.7 Broadcom Corporation CR
R5‑142826 New Supplementary Services Call Waiting test case 15.5.8 Broadcom Corporation CR
R5‑142827 Update to Call Forwarding test case 15.4.1 Ericsson, TF160 CR
R5‑142828 Adding new test case 15.4.2 Call forwarding supplementary services, Registration rejected Ericsson CR
R5‑142829 Adding new test case 15.4.4 Call forwarding supplementary services, Erasure rejected Ericsson CR
R5‑142830 Update to Call Forwarding test case 15.4.3 Ericsson, TF160 CR
R5‑142831 Update to Call Forwarding test case 15.4.5 Ericsson, TF160 CR
R5‑142832 Update to Call Forwarding test case 15.4.6 Ericsson, TF160 CR
R5‑142833 Update to Call Forwarding test case 15.4.7 Ericsson, TF160 CR
R5‑142834 Adding new test case 15.4.8 Call forwarding supplementary services, Interrogation rejected Ericsson CR
R5‑142835 Update to NIMTC test case 9.4.5.4.7 Ericsson CR
R5‑142836 New TCs for verifying support of GSM GEA/4 ciphering algorithm Ericsson, Samsung, TF160 CR
R5‑142837 Adding applicability for new TCs A5/4 and GEA/4 Ericsson, Samsung, TF160 CR
R5‑142838 Applicability for Supplementary service test cases 15.9.2, 15.9.4, 15.9.5 Anritsu Ltd CR
R5‑142839 Update of Applicability of SIMTC test cases ZTE CR
R5‑142840 Correction to 6.3.4.1 for SIB19 configuration Anite, Intel CR
R5‑142841 Reply Liaison on WLAN signal measurements for WLAN/3GPP Radio interworking IEEE 802.11 WG i/c LS
R5‑142842 TS 36.523-1 status after RAN5#62 NEC meeting report / action list
R5‑142843 TS 36.523-1 status after RAN5#63 NEC meeting report / action list
R5‑142844 Correction to system information combination 16 and 19 for eMBMS testing Ericsson, MCC TF160 CR
R5‑142845 Update to ri-ConfigIndex in Table 4.6.3-2AC CQI-ReportPeriodic-r10-DEFAULT Broadcom Corporation CR
R5‑142846 Correction to MFBI Frequencies in 36.508 Anritsu Ltd, Qualcomm Incorporated CR
R5‑142847 Correction to EUTRA Idle Mode Test case 6.1.1.1b Anite, Broadcom CR
R5‑142848 Correction to E-UTRA Inter-RAT test case 6.2.3.5a Anite, Broadcom, Intel CR
R5‑142849 Correction to EUTRA Idle Mode CSG test case 6.3.5 Anite, Qualcomm, Anritsu, BlackBerry, Samsung, Ericsson, Telecom Italia, Huawei CR
R5‑142850 Update to EUTRA Idle Mode Test Case 6.1.1.3a Broadcom Corporation CR
R5‑142851 Update of MFBI test case 6.1.2.19 Qualcomm Inc., Anritsu Ltd. CR
R5‑142852 Correction to Test Case 6.2.2.2 CATT CR
R5‑142853 Split of TDD special subframe MAC test cases 7.1.3.12 and 7.1.3.13 into separate test cases for ssp7 and ssp9. Ericsson, Huawei, CMCC CR
R5‑142854 Correction to LTE-A CA MAC test case 7.1.4.19.x Anite, LG Electronics, Samsung CR
R5‑142855 Update of RRC test case 8.1.3.7 CATR CR
R5‑142856 Update of MFBI test case 8.2.4.22 Qualcomm Inc., Anritsu Ltd. CR
R5‑142857 Update of test case 8.2.4.14a ZTE CR
R5‑142858 Addition of new TC 8.2.4.23 CA / RRC connection reconfiguration / Handover / Failure / Re-establishment successful Huawei CR
R5‑142859 Correction to EUTRA CSG Testcases 8.3.4.1, 8.3.4.3, 8.3.4.4, 8.3.4.5 Anritsu Ltd,Qualcomm Incorporated CR
R5‑142860 Correction to EUTRA CSG test case 8.3.4.5 Anritsu Ltd, Qualcomm Incorporated CR
R5‑142861 Addition of test mode procedure to the E-UTRAN Inter-frequency CSG proximity indication test case 8.3.4.5 Telecom Italia CR
R5‑142862 LS on CSG Cell Reselection Performance Requirements TSG WG RAN5 o/g LS
R5‑142863 Correction to LTE MDT test case 8.6.4.4 Anite, LG Electronics CR
R5‑142864 Correction to GCF WI-181 Rel-10 EPS Enhancements EPS FDD <>UTRAN Test Case 8.6.5.1 Anritsu Ltd, Qualcomm Incorporated CR
R5‑142865 Correction to MDT Test Case 8.6.3.1 Anite, Qualcomm CR
R5‑142866 Correction to test case 8.6.4.1, 8.6.4.2 and 8.6.4.4. TTA CR
R5‑142867 Correction to test case 8.2.2.6.2. TTA CR
R5‑142868 Update of EMM test case 9.2.3.1.6 CATR CR
R5‑142869 Correction to test case 9.1.5.1, Table 9.1.5.1.3.3-1: EMM INFORMATION (step 1, Table 9.1.5.1.3.2-1) Intel Corporation CR
R5‑142870 Addition of test case ' Attach / Rejected / IMEI not accepted' ZTE, CMCC CR
R5‑142871 Addition of test case ' Attach / Abnormal case / ESM failure' ZTE, CMCC CR
R5‑142872 Correction to test case 8.6.3.1. TTA CR
R5‑142873 Correction to Test Case 9.2.3.2.8 CATT CR
R5‑142874 Update of ESM test case 10.5.1b CATR CR
R5‑142875 Correction to ESM test case 10.8.8 Rohde & Schwarz CR
R5‑142876 Removal of GCF WI-172 EUTRA<>UTRA aSRVCC Testcase 13.4.3.12 Anritsu Ltd, Intel Corporation CR
R5‑142877 Correction to GCF WI-172 EUTRA<>UTRA aSRVCC Testcases 13.4.3.x Anritsu Ltd, Intel Corporation CR
R5‑142878 Correction to Multilayer Test Case 13.4.1.5 Anite, ZTE, NVIDIA CR
R5‑142879 Correction to EUTRA to UTRA SRVCC and aSRVCC Test Cases to Avoid Unexpected Cell Reselection Broadcom Corporation CR
R5‑142880 Correction to cs-FallbackIndicator in LTE SRVCC test cases 13.4.3.x Rohde & Schwarz, Intel Corp CR
R5‑142881 Correction to Band Indicator in LTE-GERAN SRVCC test cases 13.4.3.3 and 13.4.3.5 Rohde & Schwarz CR
R5‑142882 Correction for ATTACH REQUEST contents in aSRVCC and bSRVCC test cases Anite, NVIDIA CR
R5‑142883 Correction to GCF WI-159 Pre-registration at 1xRTT test case 13.4.4.2 Anritsu Ltd, Qualcomm CR
R5‑142884 LBS Sig: Correction of FT values in GLONASS scenarios and RINEX file update Rohde & Schwarz CR
R5‑142885 LBS Sig: Moving some .rnx files to the right .zip file Rohde & Schwarz CR
R5‑142886 Correction to EUTRA UE Positioning test cases 7.3.4.x Rohde & Schwarz CR
R5‑142887 Correction to eMBMS test case 17.1.2 Anite, Samsung CR
R5‑142888 New MTC test case 6.1.1.7a PLMN selection / Periodic reselection / ExtendedWaitTimer / Single Frequency operation Ericsson CR
R5‑142889 Update to SIMTC test case 10.5.1b Ericsson CR
R5‑142890 Update to SIMTC test case 10.5.1a Ericsson CR
R5‑142891 Correction to the Applicability of LAP and EAB test cases CATR, Cetecom, Broadcom Corporation, TTA CR
R5‑142892 Correction to the Applicability comments of some test cases CATR CR
R5‑142893 Update applicability for TDD additional special subframe configuration test cases Ericsson, Huawei, CMCC CR
R5‑142894 Update conditions in Table4-1a for CS fall back test cases Anite CR
R5‑142895 Correction to Applicability of EUTRA eMDT Test Case 8.6.5.1a and Addition of New PICS Broadcom Corporation CR
R5‑142896 Update of test case 8.3.3.3 applicability test condition Qualcomm Inc. CR
R5‑142897 Update description of extending applicability test cases CMCC CR
R5‑142898 Update of applicability of E-UTRA DL-SCH two layer transport block size selection test cases 7.1.7.1.5 and 7.1.7.1.6 for higher UE categories Ericsson CR
R5‑142899 Applicability of GCF WI-172 EUTRA<>UTRA aSRVCC Testcase 13.4.3.12 Anritsu Ltd, Intel Corporation CR
R5‑142900 Addition of PICS for IPv4 and IPv6 Microsoft Corporation CR
R5‑142901 Multi-PDN support Rohde & Schwarz other
R5‑142902 Correction to eMBMS test case 17.1.3 Anite, Samsung, TF160 CR
R5‑142903 Correction to eMBMS test case 17.1.4 Anite, Samsung, TF160 CR
R5‑142904 Correction to eMBMS test case 17.1.5 Anite, Samsung CR
R5‑142905 Correction to eMBMS test case 17.3.2 Anite, Samsung CR
R5‑142906 Correction to eMBMS test case 17.4.1 Ericsson, MCC TF160, Motorola Mobility CR
R5‑142907 Correction to eMBMS test cases 17.4.2 and 17.4.2a Ericsson, MCC TF160, Motorola Mobility CR
R5‑142908 Correction to eMBMS test cases 17.4.3 and 17.4.3a Ericsson, MCC TF160, Motorola Mobility CR
R5‑142909 Correction to eMBMS test case 17.4.4 Ericsson, MCC TF160, Motorola Mobility CR
R5‑142910 Correction to eMBMS test case 17.4.8 Ericsson, MCC TF160 CR
R5‑142911 Correction to eMBMS test cases 17.4.9.1 and 17.4.9.2 Ericsson CR
R5‑142912 Correction to eMBMS test cases 17.4.10.1 and 17.4.10.2 Ericsson CR
R5‑142913 Correction to eMBMS test case 17.4.11.1 and 17.4.11.2 Ericsson CR
R5‑142914 Adding general information for the eMBMS service continuity test cases Ericsson CR
R5‑142915 Applicability of new eMBMS test case 17.4.1a Ericsson CR
R5‑142916 Correction to applicability table for eMBMS test cases Ericsson CR
R5‑142917 Addition of operating restrictions for EUTRA MFBI test cases Anite, TF160 CR
R5‑142918 Correction to CC disconnect procedure Anritsu Ltd,Intel Corporation CR
R5‑142919 Correction to Postambles for E-UTRA to UTRA test for IMS de-registration procedures Rohde & Schwarz, Qualcomm CR
R5‑142920 Correction to Emergency Call over IMS test case 11.2.5 Rohde&Schwarz CR
R5‑142921 Addition of test case “CA / RRC connection reconfiguration / Handover / Success / PCell change and SCell addition / Intra-Band non-contiguius CA” and CA / RRC connection reconfiguration / Handover / Success / PCell Change / SCell no Change / IbnCCA Sporton International CR
R5‑142922 New Intra-band non-Contiguous CA MAC test case 7.1.9.1.3 Ericsson CR
R5‑142923 Correction to CA Enhancements test case 7.1.2.10 Motorola Mobility, MCC TF 160 & Huawei CR
R5‑142924 Correction to CA Enhancements test case 7.1.2.11 Motorola Mobility, MCC TF 160 & Huawei CR
R5‑142925 Addition of new Intra-band non-Contiguous CA test case 7.1.3.11.3 Microsoft Corporation CR
R5‑142926 Addition of new Intra-band non-Contiguous CA test case 7.1.4.19.3 Microsoft Corporation CR
R5‑142927 Applicability of new Intra-band non-Contiguous CA test cases Ericsson, Sporton International CR
R5‑142928 Addition of test frequencies of CA_39A-41A for CA signalling testing in TS 36.508 Huawei, CMCC CR
R5‑142929 Test case 9.2: Clarification on meaning of “new Security-Client header” MCC TF160 CR
R5‑142930 Updates to TS 36.508 for CA_27B sianlling test frequencies defined in section 6.2.3.2 Huawei, NII Holdings CR
R5‑142931 Adding TC 8.3.1.17.3 to TS 36.523-1 Ericsson CR
R5‑142932 Update Applicability Table for test case 6.3.3.1 Qualcomm Incorporated CR
R5‑142933 Adding new test case 6.2.4.5 Sporton International Inc. CR
R5‑142934 Adding new test case 6.2.4.7 Sporton International Inc. CR
R5‑142935 Adding new test cases for further Enhancements to CELL-FACH Sporton International Inc. CR
R5‑142936 Corrections to C.28 TF160 CR
R5‑142937 Addition of applicability for SIMTC Test Case 11.1.1.4 Ericsson CR
R5‑142938 Correction to Test Case 9.1.2.6 CATT CR
R5‑142939 Correction to Applicability of CA Test Cases 7.1.4.19.2 and 7.1.4.20.2 Broadcom Corporation, Motorola Mobility CR
R5‑142940 Introduction of test cases for Radio Bearer Reconfiguration for transition between CELL_PCH and CELL_DCH with activation of Multiflow NSN CR
R5‑142941 Addition of new Multiflow HSDPA test case 8.2.1.45.1 Qualcomm Incorporated CR
R5‑142942 Addition of new Multiflow HSDPA test case 8.2.1.45.2 Qualcomm Incorporated CR
R5‑142943 Addition of new Multiflow HSDPA test case 8.2.1.45.3 Qualcomm Incorporated CR
R5‑142944 Addition of new Multiflow HSDPA test case 8.2.1.85.1 test Sporton International CR
R5‑142945 Addition of new Multiflow HSDPA test case 8.2.2.85.1 test Sporton International CR
R5‑142946 Adding new ICS and applicability of newly added Multiflow HSDPA Test Cases 8.2.1.45 and 8.2.2.88 Qualcomm Incorporated, NSN CR
R5‑142947 Adding new ICS and applicability of newly added Multiflow HSDPA Test Cases 8.2.1.45, 8.2.2.85 and 8.2.2.88 Qualcomm Incorporated, NSN CR
R5‑142948 Restrict reason-text for unsuccessful SRVCC handover Rohde & Schwarz, Qualcomm, Anritsu CR
R5‑142949 No P-Preferred-Identity and Accept-Contact in re-INVITE requests Rohde & Schwarz CR
R5‑142950 Correction of GCF WI-154 IMS Emergency Call Testcase 19.5.7 Anritsu Ltd, Intel Corporation CR
R5‑142951 Corrections for Annex C.21 Anite, Qualcomm CR
R5‑142952 Correction to Annex procedure C.32 and C.33 Anritsu Ltd, Intel Corporation CR
R5‑142953 Correction of SSAC in Connected mode TCs about RAB establishment NTT DOCOMO, INC. CR
R5‑142954 Addition of new TC for the UE behavior receiving SIP_380 NTT DOCOMO, INC. CR
R5‑142955 TC 15.27 disambiguation Rohde & Schwarz CR
R5‑142956 Apply C.30 to TC 8.13 Rohde & Schwarz CR
R5‑142957 Remove annex C.7 Ericsson CR
R5‑142958 Misc fixes to TC 12.2a Rohde & Schwarz CR
R5‑142959 Applicability of new test cases for the UE receiving SIP_380 NTT DOCOMO, INC. CR
R5‑142960 Update call hold applicability for IR.92 versions Ericsson CR
R5‑142961 Routine maintenance and updates MCC TF160 CR
R5‑142962 Proposal for correction and common specification of SDP session and time description in TS 34.229-1 MCC TF160 other
R5‑142963 Updates to SDP content representation MCC TF160, CGC, Anritsu Ltd, Rohde&Schwarz, Anite, Ericsson, Qualcomm, Microsoft CR
R5‑142964 Correction to 3G CSG TCs 12.2.1.5e, 12.2.2.7e and 12.4.2.5e Ericsson CR
R5‑142965 GCF Priority 2 - Update to EMM test cases 9.2.3.3.2, 9.2.3.3.3 and 9.2.3.3.5 Ericsson CR
R5‑142966 GCF Priority 3 - Update to EMM test case 9.2.3.3.4 Ericsson CR
R5‑142967 Reply LS on FGI bit handling for bits 31 TSG WG RAN5 o/g LS
R5‑142968 Correction of MDT testcase 8.6.2.3 Intel Corporation CR
R5‑142969 Correction to CNAP test case 15.3.3 Anite CR
R5‑142970 Addition of UE radio bearer test mode procedure to the Inter-frequency CSG proximity indication test case 8.3.12.14 Broadcom Corporation CR
R5‑142971 Update Applicability Table for test case 6.3.3.1 Qualcomm Incorporated CR
R5‑142972 Addition of applicability for SIMTC Test Case 11.1.1.4 Ericsson CR
R5‑142973 Routine maintenance and updates MCC TF160 CR
R5‑142974 Update of MFBI test case 6.1.2.20 Qualcomm Inc., Anritsu Ltd. CR
R5‑142975 Update of MFBI test case 6.1.2.21 Qualcomm Inc., Anritsu Ltd. CR
R5‑142976 Update to the of 7.1.4.18 and 7.1.4.21 to non-CA test cases Anite, Qualcomm CR
R5‑142977 Update to EUTRA MDT Test Case 8.6.2.8 Broadcom Corporation CR
R5‑142978 Correction of LTE IRAT EMM test case 9.2.1.2.1b and 9.2.1.2.1c Anite, CATT, Motorola Mobility CR
R5‑142979 Correction to GCF WI-154 IMS emergency Testcase 11.2.4 Anritsu Ltd, Broadcom CR
R5‑142980 Addition of release applicable in Release column for CA enh test cases Motorola Mobility, MCC TF 160 & Huawei CR
R5‑142981 Addition of applicability for new Intra-band non-Contiguous CA test cases Microsoft Corporation CR
R5‑142982 Add applicability for test case 6.2.4.9 Ericsson CR
R5‑142983 Correction to 3G CSG TCs 12.2.1.5e, 12.2.2.7e and 12.4.2.5e Ericsson CR
R5‑142984 GCF Priority 3 - Update to EMM test case 9.2.3.3.4 Ericsson CR
R5‑142985 Routine maintenance and updates MCC TF160 CR
R5‑142986 Update of MDT test case 8.6.11.1 applicability Qualcomm Inc. CR
R5‑142987 Addition of MFBI Band IXIT Qualcomm Inc., Anritsu Ltd. CR
R5‑142988 GCF Priority 1 - Update to EUTRA RRC test case 8.5.4.1 Ericsson CR
R5‑142989 Updates to TCs 6.1.2.12, 6.1.2.14, 8.3.1.13a and 9.2.1.1.1b Huawei, CATT, CMCC CR
R5‑142990 Applicability for new TC 8.2.4.23 Handover failure and RRC re-establishment on PCell or SCell successfully Huawei CR
R5‑142991 Updates to PRD12 MCC TF160 other
R5‑142992 Fixes to o-lines in SDP bodies Rohde & Schwarz CR
R5‑142993 Fulfil AP#62.02 on TC 15.12 and C.9 Rohde & Schwarz, STF160 CR
R5‑142994 Changes to 16.2, 16.3, and 16.4 Rohde & Schwarz CR
R5‑142995 Corrections to contents of SIP re-INVITE message Anite CR
R5‑142996 Reply LS on Clarification for Sync Failure during initial IMS registration TSG WG RAN5 o/g LS
R5‑142997 Motivation and proposal for extending TTCN test models to support multiple PDNs Rohde & Schwarz, Samsung other
R5‑142998 GCF Priority 3 - Update to EMM test case 9.2.3.3.4 Ericsson CR
R5‑143000 Conditions C19, C20, C21 BlackBerry, Cetecom and SRTC CR
R5‑143001 Clarification of RRC message definitions LG Electronics Inc. CR
R5‑143002 Corrections to MBMS information elements in SIB2 and SIB13 LG Electronics Inc. CR
R5‑143003 36.521-1: Editorial correction on 6.6.3.3 Initial conditions for NS_19 Agilent Technologies CR
R5‑143004 36.521-1: Editorial correction on 6.6.2.2B test requirements for NS_06 or NS_07 Agilent Technologies CR
R5‑143005 Correction for CA_4A-12A uplink configuration in inter-band CA reference sensitivity Broadcom Corporation CR
R5‑143006 CA RF: Clarification of test parameters and requirements for Inter-band CA Rx tests Rohde & Schwarz CR
R5‑143007 Corrections to SNR test for TM9 minimum requirements ZTE CR
R5‑143008 Correction to ACK NAK Reporting mode for TDD CA test cases Qualcomm Inc CR
R5‑143009 Addition of TC 8.2.1.1.1_2 and 8.2.2.1.1_2 LG Electronics Inc. CR
R5‑143010 Correction of FDD PDSCH Open Loop Spatial Multiplexing 2x2 for CA test cases of TCs 8.2.1.3.1_A.2 and 8.2.1.3.1_A.2_1 LG Electronics Inc. CR
R5‑143011 Updates to 8.2.1.3 FDD PDSCH Open Loop Spatial Multiplexing 2x2 related test cases Huawei CR
R5‑143012 Updates to 8.2.2.3 TDD PDSCH Open Loop Spatial Multiplexing 2x2 related test cases Huawei CR
R5‑143013 36.521-1: Editorial correction on 8.2.1.4.2_A.2 message contents Agilent Technologies CR
R5‑143014 Clarification the minimum conformance requirement and test parameter for 8.2.1.3.3_C1 and 8.2.1.3.3_C2 test cases LG Electronics Inc. CR
R5‑143015 Correction to minimum test time for eICIC tests Anritsu CR
R5‑143016 Addition of RF test cases applicability for eICIC SRTC CR
R5‑143017 Addition of RRM test cases applicability for eICIC SRTC CR
R5‑143018 Correction of clause 9.2.8.1 in 36.521-3 SRTC CR
R5‑143019 Update eICIC Absolute RSRP Test cases 9.1.8.1+9.1.9.1 Anritsu CR
R5‑143020 Update eICIC Absolute RSRQ Test cases 9.2.7.1+9.2.8.1 Anritsu CR
R5‑143021 Add Test Tolerance analyses for TS 36.521-3 Test cases 7.3.9,7.3.10,7.3.13 and 7.3.14 Rohde & Schwarz CR
R5‑143022 Uncertainties and test tolerance for RRM Test case 9.1.10.1, 9.1.11.1 Qualcomm Incorporated CR
R5‑143023 Uncertainties and test tolerance for RRM Test case 9.1.10.2, 9.1.11.2 Qualcomm Incorporated CR
R5‑143024 Update to eICIC Absolute RSRQ with MBSFN ABS for chapter 9 RRM test cases Qualcomm Inc CR
R5‑143025 LTE Type A performance requirements - Introduction of the new test case 8.2.1.4.3 Broadcom Corporation CR
R5‑143026 Test Tolerances for eICIC 9.5.x RI Test cases Anritsu CR
R5‑143027 Uncerainties and Test Tolerances for EPDCCH 8.8.1.x demodulation Test cases Anritsu CR
R5‑143028 LTE Type A performance requirements - Adding test case 8.2.1.4.3 Broadcom Corporation CR
R5‑143029 Addition of HSDPA Performance cases for Multiflow HSDPA Qualcomm Inc CR
R5‑143030 Condition C43 BlackBerry, Cetecom and SRTC CR
R5‑143031 Update to operating bands for CA CATR, CMCC, SoftBank Mobile, Intel Corporation, kt CR
R5‑143032 Update to channel bandwidths for CA CATR, CMCC, SoftBank Mobile, Huawei, NII Holdings, kt, TTA CR
R5‑143033 Update to TC 6.3.2A.1 for CA_39C CATR CR
R5‑143034 Updates of 7.3A.3 Refsens for CA_3A-26A and CA_3A-27A kt CR
R5‑143035 Addition of CA band Combo CA_2A-13A Qualcomm Inc CR
R5‑143036 Addition of CA_39A-41A to Refsens in chap.7 Huawei, CMCC CR
R5‑143037 Updates to Chap.5 for CA_27B Huawei, NII Holdings CR
R5‑143038 Addtion of CA_2A-4A and CA_5A-7A to 36.521-1 Clause 6 Intel Corp. CR
R5‑143039 TC 8.2.1.3.3_E.1 FDD PDSCH Open Loop Spatial Multiplexing 2x2 for feICIC (non-MBSFN ABS) BlackBerry CR
R5‑143040 TC 8.2.2.3.3_E.1 TDD PDSCH Open Loop Spatial Multiplexing 2x2 for feICIC (non-MBSFN ABS) BlackBerry CR
R5‑143041 Corrections applicability statement including UE cateogry for feICIC ZTE CR
R5‑143042 Additions to TC 8.2.1.2.3_E.1 FDD PDSCH Transmit diversity 2x2 for feICIC (non-MBFSN ABS) ZTE CR
R5‑143043 Additions to TC 8.2.2.2.3_E.1 TDD PDSCH Transmit diversity 2x2 for feICIC (non-MBSFN ABS) ZTE CR
R5‑143044 Additions to TC 8.2.1.4.1_E.1 FDD PDSCH Closed Loop Single Layer Spatial Multiplexing 2x2 for feICIC (non-MBSFN ABS) ZTE CR
R5‑143045 Additions to TC 8.2.2.4.1_E.1 TDD PDSCH Closed Loop Single Layer Spatial Multiplexing 2x2 for feICIC (non-MBSFN ABS) ZTE CR
R5‑143046 Additions to TC 9.2.1.5_E.1 FDD CQI Reporting under AWGN conditions - PUCCH 1-0 for feICIC (non-MBSFN ABS) ZTE CR
R5‑143047 Additions to TC 9.2.1.6_E.1 TDD CQI Reporting under AWGN conditions - PUCCH 1-0 for feICIC (non-MBSFN ABS) ZTE CR
R5‑143048 Additions to TC 9.3.1.3.1_E.1 FDD CQI Reporting under fading conditions - PUSCH 3-0 for feICIC (non-MBSFN ABS) ZTE CR
R5‑143049 Additions to TC 9.3.1.3.2_E.1 TDD CQI Reporting under fading conditions - PUSCH 3-0 for feICIC (non-MBSFN ABS) ZTE CR
R5‑143050 Additions to TC 9.5.4.1_E.1 FDD RI Reporting - PUCCH 1-0 for feICIC (non-MBSFN ABS) ZTE CR
R5‑143051 Additions to TC 9.5.4.2_E.1 TDD RI Reporting - PUCCH 1-0 for feICIC (non-MBSFN ABS) ZTE CR
R5‑143052 Additions to Reporting of Channel State Information feICIC Test Cases to Annex F ZTE CR
R5‑143053 Correction to the applicability of the test case 7.6.2A.3 and 7.7A.3. TTA CR
R5‑143054 Correction of the condition of test case 8.7.1.1 CGC CR
R5‑143055 Correction of the condition of the test cases 8.2.1.1.1_A.2, 8.2.1.3.1_A.1, 8.2.1.3.1_A.2 and 8.2.1.4.2_A.2 CGC CR
R5‑143056 Correction of the condition for the test cases 8.2.1.1.1_A.1, 8.2.1.4.2_A.1 and 8.2.2.1.1_A.1 CGC CR
R5‑143057 Updates to CA RRM 8.16.x test cases Huawei CR
R5‑143058 Correction to UL timing accuracy Tx test cases Qualcomm Inc CR
R5‑143059 Update of Annex E for InterRAT with TDD-TD-SCDMA Anritsu CR
R5‑143060 Introduction of feICIC applicability statement for CSI test cases ZTE CR
R5‑143061 Introduction of feICIC applicability statement for RRM test cases ZTE CR
R5‑143062 Additions to TC 8.2.6 E-UTRAN TDD-TDD Intra-Frequency Event-Triggered Reporting (feICIC) ZTE CR
R5‑143063 Update eICIC Relative RSRP Test cases 9.1.8.2+9.1.9.2 Anritsu CR
R5‑143064 Additions to TC 9.2.13 FDD RSRQ under Time Domain Measurement Resource Restriction (feICIC) ZTE CR
R5‑143065 Additions to TC 9.2.14 TDD RSRQ under Time Domain Measurement Resource Restriction (feICIC) ZTE CR
R5‑143066 Addition of RLM test cases with non-MBSFN for fEICIC Qualcomm Inc CR
R5‑143067 Test Cases 9.1.14.1, 9.1.14.2, 9.1.15.1, 9.1.15.2 for feICIC BlackBerry CR
R5‑143068 New RF TC for 34.121-1_5.3B_Uplink Transmit Diversity for HSPA Rel-11 Orange SA CR
R5‑143069 Addition of Occupied Bandwidth test case for UL CLTD Ericsson CR
R5‑143070 Update to incomplete sections of spectrum emission mask & ACLR test cases for UL CLTD Qualcomm Inc CR
R5‑143071 Update to Chapter 5 test cases for max power, CDP, ILPC, change of TFC, power setting in UL compressed mode with UL CLTD Qualcomm Inc CR
R5‑143072 Updates to CELL_FACH test cases 8.3.5.1a, 8.3.5.1b and 8.3.5.2b Ericsson CR
R5‑143073 Adding new enh CELL_FACH test cases 8.3.5.2c and 8.3.5.2d Ericsson CR
R5‑143074 Addition of new RRM test cases for UTRAN to E-UTRA Cell Reselection when HS-DSCH DRX or 2nd DRX is configured Ericsson CR
R5‑143075 - - -
R5‑143076 Update of TC 9.3.6.2_F TDD CQI Reporting under fading conditions multiple CSI processes for CoMP Huawei CR
R5‑143077 Correction parameter and reference table number in test case 8.3.2.4.1_F LG Electronics Inc. CR
R5‑143078 Applicability for new CoMP TDD TCs Samsung CR
R5‑143079 Upate of TC 8.7.3.1 FDD sustained data rate performance for EPDCCH scheduling Huawei CR
R5‑143080 Addition of TC 8.8.3.1 FDD Localized transmission with TM10 Type B quasi co-location type Huawei CR
R5‑143081 Addition of TC 8.8.3.2 TDD Localized transmission with TM10 Type B quasi co-location type Huawei CR
R5‑143082 Update initial condition and test requirement in test case 8.7.1.1_A.2_1 for two 15MHz CCs LG Electronics Inc. CR
R5‑143083 Addition of applicability for newly added RRM test cases Huawei, NII Holdings CR
R5‑143084 Addition of CA_27B related information into A.4.6 in TS 36.521-2 Huawei, NII Holdings CR
R5‑143085 Addition of new TC 8.16.10 E-UTRAN TDD event triggered reporting under deactivated SCell in non-DRX for 10MHz+5MHz Huawei CR
R5‑143086 Addition of new TC 9.1.18 FDD RSRP Accuracy for E-UTRAN Carrier Aggregation for 10MHz + 5MHz Huawei CR
R5‑143087 Addition of new TC 9.1.19 TDD RSRP Accuracy for E-UTRAN Carrier Aggregation for 10MHz + 5MHz Huawei CR
R5‑143088 Addition of new TC 9.2.21 FDD RSRQ Accuracy for E-UTRA Carrier Aggregation for 10MHz+5MHz Huawei CR
R5‑143089 Addition of new TC 9.2.22 TDD RSRQ Accuracy for E-UTRA Carrier Aggregation for 10MHz+5MHz Huawei CR
R5‑143090 Addition of new TC 8.16.14 E-UTRAN TDD event triggered reporting under deactivated SCell in non-DRX for 5MHz+5MHz Huawei, NII Holdings CR
R5‑143091 Addition of new TC 9.1.20 FDD RSRP Accuracy for E-UTRAN Carrier Aggregation for 5MHz + 5MHz Huawei, NII Holdings CR
R5‑143092 Addition of new TC 9.1.21 TDD RSRP Accuracy for E-UTRAN Carrier Aggregation for 5MHz + 5MHz Huawei, NII Holdings CR
R5‑143093 Addition of new TC 9.2.23 FDD RSRQ Accuracy for E-UTRAN Carrier Aggregation for 5MHz + 5MHz Huawei, NII Holdings CR
R5‑143094 Addition of new TC 9.2.24 TDD RSRQ Accuracy for E-UTRAN Carrier Aggregation for 5MHz + 5MHz Huawei, NII Holdings CR
R5‑143095 Addition of TRP test requirements for LEE Tablet Devices Intel Corp. CR
R5‑143096 Addition of TRS test requirements for LEE Tablet Devices Intel Corp. CR
R5‑143097 Addition of message content exception in eICIC performance tests with MBSFN ABS LG Electronics Inc. CR
R5‑143098 Additions to TC 8.4.1.2.3_E.1 FDD PCFICH/PDCCH Transmit Diversity 2x2 for feICIC (non-MBSFN ABS) ZTE CR
R5‑143099 Additions to TC 8.4.2.2.3_E.1 TDD PCFICH/PDCCH Transmit Diversity 2x2 for feICIC (non-MBSFN ABS) ZTE CR
R5‑143100 Additions to TC 8.4.2.2.3_E.2 TDD PCFICH/PDCCH Transmit Diversity 2x2 for feICIC (MBSFN ABS) ZTE CR
R5‑143101 Additions to Demodulation feICIC Test Cases to Annex F ZTE CR
R5‑143102 Additions to TC 8.1.8 E-UTRAN FDD-FDD Intra-Frequency Event-Triggered Reporting (feICIC) ZTE CR
R5‑143103 Additions to feICIC to Annex H ZTE CR
R5‑143104 Introduction of TC 8.2.2.4.2_A.3 TDD PDSCH Closed Loop Multi Layer Spatial Multiplexing 4 x 2 for CA ZTE CR
R5‑143105 Updates to Refsens for Intra-band non-contiguous CA NTT DOCOMO, INC. CR
R5‑143106 Correction of interference rejection test cases TC 8.2.2.4.3 LG Electronics Inc. CR
R5‑143107 Correction to eICIC PDSCH demodulation tests Anritsu CR
R5‑143108 Correction to periodicity of ABS pattern in eICIC RRM Anritsu CR
R5‑143109 Additions to TC 8.1.6 E-UTRAN TDD UE Rx-Tx time difference (feICIC) ZTE CR
R5‑143110 LBS Perf: Moving some .rnx files to the right .zip file Rohde & Schwarz CR
R5‑143111 Additions to FDD interruption requirements for SCell ZTE CR
R5‑143112 Additions to TDD interruption requirements for SCell ZTE CR
R5‑143113 Introduction of TC 8.2.2.1.1_A.3 TDD PDSCH Signle Antenna Port Performance for CA ZTE CR
R5‑143114 Additions to TC 8.4.1.2.3_E.2 FDD PCFICH/PDCCH Transmit Diversity 2x2 for feICIC (MBSFN ABS) ZTE CR
R5‑143115 Upate of TC 8.8.1.1 FDD distributed EPDCCH performance Huawei CR
R5‑143116 Upate of TC 8.8.2.1 FDD localized transmission with TM9 Huawei CR
R5‑143117 Upate of TC 8.8.2.2 TDD localized transmission with TM9 Huawei CR
R5‑143118 Upate sections of A.3.9 and A.3.10 reference channel for EPDCCH test Huawei CR
R5‑143119 Update of applicability for EPDCCH test cases Huawei CR
R5‑143120 Update to OOS handling test case for UL CLTD Qualcomm Inc CR
R5‑143121 Addition of new chapter 5 test cases for UL CLTD Qualcomm Inc CR
R5‑143122 Annexure update to test tolerances of newly added ch.5 test cases Qualcomm inc CR
R5‑143123 Introduction of new Spurious Emissions test case for uplink OLTD Motorola Mobility CR
R5‑143124 Introduction of new OLTD test cases in Annex F Motorola Mobility CR
R5‑143125 Introduction of new test cases for uplink OLTD in TS 34.121-2 Motorola Mobility CR
R5‑143126 Applicability update to newly added chapter-5 test cases with UL-CLTD Qualcomm Inc CR
R5‑143127 Update for 34.121-2 UL-OLTD and CLTD Orange SA CR
R5‑143128 LBS Perf: Correction of FT values in GLONASS scenarios and RINEX file update Rohde & Schwarz CR
R5‑143129 Addition of FDD CQI Reporting under AWGN conditions - PUCCH 1-0 for CA (intra band non-contiguous DL CA) TC 9.6.1.1_A.3 Intel Corp. CR
R5‑143130 Addition of TDD CQI Reporting under AWGN conditions - PUCCH 1-0 for CA (intra band non-contiguous DL CA) TC 9.6.1.2_A.3 Intel Corp. CR
R5‑143131 Addition of TC 6.2.4A.1 for CA_39C CATR CR
R5‑143132 Addition of new test frequency for CA_39C CMCC CR
R5‑143133 Update additional spurious emissions for CA_38C (intra-band contiguous DL CA and UL CA) CMCC CR
R5‑143134 Update In-band blocking for CA_39C (intra-band contiguous DL CA and UL CA) CMCC CR
R5‑143135 Update Out-of-band blocking for CA_39C (intra-band contiguous DL CA and UL CA) CMCC CR
R5‑143136 Update Reference sensitivity level for CA_39C (intra-band contiguous DL CA and UL CA) CMCC CR
R5‑143137 RF: Corrections to CSI RMCs Rohde & Schwarz CR
R5‑143138 CA RF: Corrections to CQI performance tests Rohde & Schwarz CR
R5‑143139 Correction to test channel bandwidth in 9.6.1.2_A.1 Anritsu CR
R5‑143140 CA RF: Corrections to performance test with power imbalance (Class C) Rohde & Schwarz CR
R5‑143141 Correction of test case 8.2.1.1.1_1 CGC CR
R5‑143142 Correction of the test applicability for test cases 8.2.1.1.1_A.2, 8.2.1.3.1_A.1, 8.2.1.3.1_A.2 and 8.2.1.4.2_A.2 CGC CR
R5‑143143 Correction of the test applicability of the test cases 8.2.1.1.1_A.1, 8.2.1.4.2_A.1, 8.2.2.1.1_A.1 and 8.2.2.4.2_A.1 CGC CR
R5‑143144 Correction of the applicability for the test case 8.7.1.1 CGC CR
R5‑143145 Condition on no UL CA in C20 and C21 BlackBerry CR
R5‑143146 Addition of TC 9.5.5.1_F.2 FDD RI Reporting with Multiple CSI processes for CoMP Qualcomm Incorporated CR
R5‑143147 Addition of TC 9.5.5.2_F.2 TDD RI Reporting with Multiple CSI processes for CoMP Qualcomm Incorporated CR
R5‑143148 Clarification of test parameters for eICIC PDCCH performance tests LG Electronics Inc., Rohde & Schwarz CR
R5‑143149 Correction to Intra-band CA uplink configuration for reference sensitivity Anritsu CR
R5‑143150 Update of sustained downlink data rate tests Anritsu CR
R5‑143151 Correction to CQI reference measurement channels Anritsu CR
R5‑143152 Correction to event triggered reporting tests for CA Anritsu CR
R5‑143153 Correction to Intra CA test cases Anritsu CR
R5‑143154 Introduction of NC CA TC 7.6.1A.4 Microsoft Corporation CR
R5‑143155 Introduction of NC CA TC 7.6.2A.4 Microsoft Corporation CR
R5‑143156 Introduction of NC CA TC 7.6.3A.4 Microsoft Corporation CR
R5‑143157 TC 7.3.19 FDD Radio Link Monitoring for In-sync under Time Domain Measurement Resource Restriction with CRS assistance information and Non-MBSFN ABS (feICIC) BlackBerry CR
R5‑143158 TC 7.3.20 TDD Radio Link Monitoring for In-sync under Time Domain Measurement Resource Restriction with CRS assistance information and Non-MBSFN ABS (feICIC) BlackBerry CR
R5‑143159 TC 7.3.21 FDD Radio Link Monitoring Test for In-sync under Time Domain Measurement Resource Restriction with CRS assistance information and MBSFN ABS (feICIC) BlackBerry CR
R5‑143160 TC 7.3.22 TDD Radio Link Monitoring Test for In-sync under Time Domain Measurement Resource Restriction with CRS assistance information and MBSFN ABS (feICIC) BlackBerry CR
R5‑143161 Update Spurious emission band UE co-existence for CA_39C (intra-band contiguous DL CA and UL CA) CMCC CR
R5‑143162 Update additional spurious emissions for CA_39C (intra-band contiguous DL CA and UL CA) CMCC CR
R5‑143163 Updates to TC 7.3A.2 Reference sensitivity level for CA_27B Huawei, NII Holdings CR
R5‑143164 Updates to TC 7.4A.2 maximum input level for intra-band contiguous CA for CA_27B Huawei, NII Holdings CR
R5‑143165 Updates to TC 7.5A.2 ACS for CA_27B Huawei, NII Holdings CR
R5‑143166 Updates to 7.6.1A.2 IBB for CA of CA_27B Huawei, NII Holdings CR
R5‑143167 Updates to TC 7.6.2A.2 OOB for CA of CA_27B Huawei, NII Holdings CR
R5‑143168 Updates to TC 7.6.3A.2 Narrow band blocking for CA_27B Huawei, NII Holdings CR
R5‑143169 Updates to TC 7.7A.2 Spurious response for CA_27B Huawei, NII Holdings CR
R5‑143170 Updates to TC 7.8.1A.2 Wideband intermodulation for CA_27B Huawei, NII Holdings CR
R5‑143171 Updates to TS 36.508 for CA_27B test frequencies defined in section 4.3.1.1 Huawei, NII Holdings CR
R5‑143172 Addition of new TC 8.16.9 E-UTRAN FDD event triggered reporting under deactivated SCell in non-DRX for 10MHz+5MHz Huawei CR
R5‑143173 Addition of new TC 8.16.13 E-UTRAN FDD event triggered reporting under deactivated SCell in non-DRX for 5MHz+5MHz Huawei, NII Holdings CR
R5‑143174 Updates to 8.7.1.1 FDD sustained data rate performance related test cases Huawei CR
R5‑143175 Updates to 8.7.2.1 TDD sustained data rate performance related test cases Huawei CR
R5‑143176 Addition of new TC 8.16.7 E-UTRA FDD event triggered reporting on deactivated SCell with PCell interruption in non-DRX for 20 MHz bandwidth Huawei CR
R5‑143177 Correction to eICIC TDD RI requirements Anritsu CR
R5‑143178 Additions to TC 9.5.5.1_F.1 FDD RI Reporting with Single CSI process ZTE CR
R5‑143179 Additions to TC 9.5.5.2_F.1 TDD RI Reporting with Single CSI process ZTE CR
R5‑143180 Additions to TC 8.1.5 E-UTRAN FDD UE Rx-Tx time difference (feICIC) ZTE CR
R5‑143181 Splitting of FDD CA TM3 and soft buffer management tests Huawei CR
R5‑143182 Removal of soft buffer test points from FDD TM3 test cases in 8.2.1.3.1 and move to new soft buffer test cases in section 8.2.1.3.1A Ericsson CR
R5‑143183 Splitting of TDD CA TM3 and soft buffer management tests Huawei CR
R5‑143184 Removal of soft buffer test points from TDD TM3 test cases in 8.2.2.3.1 and move to new soft buffer test case in section 8.2.2.3.1A Ericsson CR
R5‑143185 Updates to 8.7.1.1_A FDD sustained data rate performance for CA related test cases Huawei CR
R5‑143186 Updates to 8.7.2.1_A TDD sustained data rate performance for CA related test cases Huawei CR
R5‑143187 Addition of applicability for new TM3, soft buffer management and SDR test cases Huawei CR
R5‑143188 Addition of TC 8.2.2.7 TDD Carrier Aggregation with power imbalance LG Electronics Inc. CR
R5‑143189 Corrections to test case 8.2.1.4.2_1, 8.2.2.4.1_1, and 8.2.2.4.2_1 LG Electronics Inc. CR
R5‑143190 Uncertainties and Test Tolerances for CoMP Test case 8.3.1.3.2_F Anritsu CR
R5‑143191 Clarification of tracking area updating procedure Anritsu CR
R5‑143192 Test frequencies for RF/RRM CA testing Rohde & Schwarz other
R5‑143193 LBS RF: Update of RSTD tests Rohde & Schwarz CR
R5‑143194 Corrections to Symbol and Abbreviation references PCTEST Engineering Laboratory CR
R5‑143195 Correction to Tables A.3.8.3.3-1 and A.3.8.4.3-1 Anite CR
R5‑143196 Clarification on scheduling of user data in special subframe for TDD LTE Downlink Performance test cases Ericsson CR
R5‑143197 Clarification on system simulator usage of UE reported CQI and RI in LTE Downlink Performance test cases Ericsson CR
R5‑143198 New WI proposal: UE conformance testing - LTE in the US Wireless Communications Service (WCS) Band AT&T new WID
R5‑143199 Draft WID for MIMO OTA antenna test function Agilent Technologies new SI
R5‑143200 New Work Item Proposal: UE Conformance Test Aspects - single radio voice call continuity from UTRAN/GERAN to E-UTRAN/HSPA Ericsson new WID
R5‑143201 Fixes to o-lines in SDP bodies Rohde & Schwarz CR
R5‑143202 WP Uplink Transmit Diversity (ULTD) for HSPA Qualcomm WP
R5‑143203 Throughput calculation for eICIC demodulation requirements Anritsu CR
R5‑143204 Correction to eICIC TDD RI requirements Anritsu CR
R5‑143205 Updates to 8.7.1.1_A FDD sustained data rate performance for CA related test cases Huawei CR
R5‑143206 Updates to 8.7.2.1_A TDD sustained data rate performance for CA related test cases Huawei CR
R5‑143207 Correction to CA Rx test cases Anritsu CR
R5‑143208 Correction to call setup in 8.7.1 and 8.7.2 Anritsu CR
R5‑143209 Correction to 9.6.2 GSM RSSI accuracy for E-UTRAN TDD Anritsu CR
R5‑143210 Correction to A.3.4.1 and A.3.5.1 Anite, PCTEST Engineering Laboratory, Spirent Communications CR
R5‑143211 LBS RF: Update of RSTD tests Rohde & Schwarz CR
R5‑143212 Correction to Test Case 6.2.2.2 CATT CR
R5‑143213 Correction to test case 10.5.4, Table 10.5.4.3.2-1: Main behaviour Intel Corporation CR
R5‑143214 Update description of extending applicability test cases CMCC CR
R5‑143215 Addition of applicability for new TM3, soft buffer management and SDR test cases Huawei CR
R5‑143216 Updates to 8.7.1.1 FDD sustained data rate performance related test cases Huawei CR
R5‑143217 Reply LS on Clarification for Sync Failure during initial IMS registration R5 -
R5s130983 Correction of test case TC_9_2_1_2_1c CATT imported from 3GU
R5s140020 Addition of Rel-9 MultiLayer SRVCC test case 13.4.3.6 Anite imported from 3GU
R5s140022 Addition of MultiLayer SRVCC test case 13.4.3.4 Anite imported from 3GU
R5s140027 Addition of GCF WI-154 IMS Emergency Call over EPS test case 11.2.5 Anritsu Ltd,Anite imported from 3GU
R5s140037 Addition of GCF WI-154 IMS Emergency Call over EPS test case 19.5.6 ^^(... with TS 36.523-3 test model) Rohde & Schwarz, Anritsu Ltd. imported from 3GU
R5s140039 Addition of GCF WI-154 IMS Emergency Call over EPS test case 19.5.10 ^^(... with TS 36.523-3 test model) Rohde & Schwarz, Anritsu Ltd. imported from 3GU
R5s140043 Addition of Rel-9 MultiLayer SRVCC test case 13.4.3.5 Anite imported from 3GU
R5s140049 LTE_TDD: Addition of Rel-10 MDT test case 8.6.2.1 Rohde & Schwarz imported from 3GU
R5s140051 LTE_TDD: Addition of Rel-10 MDT test case 8.6.2.2 Rohde & Schwarz imported from 3GU
R5s140053 LTE_TDD: Addition of Rel-10 MDT test case 8.6.2.4 Rohde & Schwarz imported from 3GU
R5s140055 LTE_TDD: Addition of Rel-10 MDT test case 8.6.2.5 Rohde & Schwarz imported from 3GU
R5s140057 LTE_TDD: Addition of Rel-10 MDT test case 8.6.2.7 Rohde & Schwarz imported from 3GU
R5s140059 LTE_TDD: Addition of Rel-10 MDT test case 8.6.4.1 Anite , Rohde & Schwarz imported from 3GU
R5s140061 LTE_TDD: Addition of Rel-10 MDT test case 8.6.4.2 Anite , Rohde & Schwarz imported from 3GU
R5s140063 LTE_TDD: Addition of Rel-10 MDT test case 8.6.4.6 Anite imported from 3GU
R5s140065 LTE_TDD: Addition of Rel-10 MDT test case 8.6.2.8 Anite imported from 3GU
R5s140067 Addition of LTE-A Minimization of Drive Tests (MDT) Testcase 8.6.4.5 Anritsu Ltd imported from 3GU
R5s140069 LTE_TDD: Addition of LTE-A Minimization of Drive Tests (MDT) Testcase 8.6.4.5 Anritsu Ltd imported from 3GU
R5s140073 Correction Correction to GCF WI-150 multilayer test case 13.4.1.5 Anite imported from 3GU
R5s140080 Correction for Rel-7 or later UE supporting higher HSDPA categories, 13 or above for TC 11.1.1.1a Anite imported from 3GU
R5s140083 Corrections of GCF WI-162 LTE-A CA inter-band test cases for band combination with Band 29A Anritsu Ltd imported from 3GU
R5s140085 Correction to Rel-8 Mac-I\Is test case 8.2.2.61 to HSPA8_ENH ATS Anite imported from 3GU
R5s140086 Addition of EUTRA UE Positioning test case 7.2.1.1 Rohde & Schwarz imported from 3GU
R5s140088 Addition of EUTRA UE Positioning test case 7.2.1.2 Rohde & Schwarz imported from 3GU
R5s140090 Addition of EUTRA UE Positioning test case 7.2.1.3 Rohde & Schwarz imported from 3GU
R5s140092 Addition of GCF WI-103 IMS MTSI Testcase 15.28 with 36.523-3 Test Model Anritsu Ltd imported from 3GU
R5s140094 Addition of GCF WI-086 EUTRA<>UTRA CSG test case 6.3.4 Anite imported from 3GU
R5s140096 Addition of GCF WI-086 MultiLayer SRVCC test case 13.4.3.2 Anite imported from 3GU
R5s140098 Correction to TC 8.1.5.7 (TTCN-3) Anite imported from 3GU
R5s140101 LTE_TDD: Addition of GCF WI-097 EUTRA<>GERAN test case 8.3.3.3 Anite imported from 3GU
R5s140102 LTE_TDD: Addition of GCF WI-097 Multi-layer test case 13.4.2.5 Anite imported from 3GU
R5s140104 Correction to EMM test case 9.3.1.18 Rohde & Schwarz imported from 3GU
R5s140107 Correction to GCF WI-081 RLC test case 7.2.2.4 Anite imported from 3GU
R5s140108 Correction to LTE-GERAN Multi-layer test case 13.3.2.2 Rohde & Schwarz imported from 3GU
R5s140109 Correction to EMM test case 9.2.3.1.12 Anite imported from 3GU
R5s140110 Addition of LTE-A Minimization of Drive Tests (MDT) Test case 8.6.2.3 Anite, Anritsu imported from 3GU
R5s140112 LTE_TDD: Addition of LTE-A Minimization of Drive Tests (MDT) Test case 8.6.2.3 Anite, Anritsu imported from 3GU
R5s140118 Correction to EUTRA EMM Test Case 9.2.1.2.1b/ 9.2.1.2.1c TDIA, CATT imported from 3GU
R5s140119 Correction of Test Case 9.2.3.4.1 CATT imported from 3GU
R5s140120 LTE_TDD: Correction of Test Case 8.1.3.7 CATT imported from 3GU
R5s140121 Re-verification of GCF WI-103 IMS MTSI Testcase 15.11 over 36.523-3 Test Model Anritsu Ltd imported from 3GU
R5s140123 Addition of GCF WI-154 IMS Emergency Testcase 19.4.5 with 36.523-3 Test Model Anritsu Ltd imported from 3GU
R5s140125 Correction to Rel-8 CSG testcases Rohde & Schwarz imported from 3GU
R5s140129 Addition of Rel-9 Home eNB test case 8.3.4.2 Rohde & Schwarz imported from 3GU
R5s140131 Addition of Rel-9 Home eNB test case 8.3.4.3 Rohde & Schwarz imported from 3GU
R5s140134 Correction for Rel-7 or later UE supporting higher HSDPA categories, 13 or above for test case 11.1.1.1a Anite imported from 3GU
R5s140135 Correction to UTRA TTCN-3 test case 8.1.5.7 Anite imported from 3GU
R5s140136 Correction of GCF WI-103 IMS MTSI Testcase 9.1 Anritsu Ltd imported from 3GU
R5s140137 Correction to GCF WI-171 IMS SSAC testcase 12.20 Anritsu Ltd imported from 3GU
R5s140138 Correction to WI-151 RRC FDD<>TDD Test Case 8.2.4.15a Anite imported from 3GU
R5s140139 Addition of GCF WI-164 LTE eMBMS Test case 17.1.1 Anite imported from 3GU
R5s140141 Correction of P-Preferred-Service and P-Asserted-Service usage over LTE with 34.229-3 test model Rohde & Schwarz imported from 3GU
R5s140142 Addition of GCF WI-103 IMS MO Call test case 12.2a ^^(... with both TS 36.523-3 and TS 34.229-3 test model) Rohde & Schwarz imported from 3GU
R5s140144 Correction to GCF WI-086 EMM Test Case 9.2.3.3.1 Anite imported from 3GU
R5s140145 Correction to GCF WI-087 Idle Mode test case 6.2.3.16 Anite imported from 3GU
R5s140146 Correction to Selection Expressions C130 and C63 Anite imported from 3GU
R5s140147 Addition of LTE-A Minimization of Drive Tests (MDT) Test case 8.6.4.4 Anite imported from 3GU
R5s140149 Correction to GCF WI-086 EUTRA RRC Inter-RAT Handover Test Case 8.4.2.2 and 8.4.2.4 Anite imported from 3GU
R5s140150 Addition of GCF WI-177 EUTRA Rel10 Inter-RAT test Case 8.6.7.1 Anritsu Ltd imported from 3GU
R5s140152 LTE_TDD: Addition of Synchronisation Parameters of SYNC_UL CATT imported from 3GU
R5s140153 Addition of LTE-A NIMTC test case 10.5.4 Rohde & Schwarz imported from 3GU
R5s140155 Correction to EMM test cases 9.2.1.1.18 and 9.2.1.2.14 Rohde & Schwarz imported from 3GU
R5s140158 Addition of Multi-Layer SRVCC test case 13.4.3.3 Rohde & Schwarz imported from 3GU
R5s140160 Correction for IMS emergency call test cases Anite imported from 3GU
R5s140161 Corrections to Multi-Layer SRVCC test cases 13.4.3.x Rohde & Schwarz imported from 3GU
R5s140162 Correction to GCF WI-082 EMM test case 9.2.1.1.7a Anite imported from 3GU
R5s140163 Addition of Rel-9 CSG test case 6.3.1.4 to HSPA9_ENH ATS Anite imported from 3GU
R5s140167 Correction to EUTRA MDT test Case 8.6.6.2 Anritsu Ltd imported from 3GU
R5s140168 Correction to GCF WI-171 SSAC testcase 12.20 Anritsu Ltd imported from 3GU
R5s140169 Correction to GCF WI-154 IMS Emergency Call over EPS test case 11.2.1 Anritsu Ltd imported from 3GU
R5s140170 Correction to GCF WI-154 IMS Emergency Call over EPS test case 11.2.2 Anritsu Ltd imported from 3GU
R5s140171 Correction to GCF WI-154 IMS Emergency Call testcase 19.1.2 Anritsu Ltd imported from 3GU
R5s140172 Correction to GCF WI-154 IMS Emergency Call testcase 19.5.6 Anritsu Ltd imported from 3GU
R5s140173 Correction to IMS function f_IMS_Dialog_SetRemoteTag Anritsu Ltd imported from 3GU
R5s140174 Correction of IMS function f_IMS_PTC_ImsInfo_DialogInit Anritsu Ltd imported from 3GU
R5s140175 Correction to Postamble Procedure for IMS Testcases Anritsu Ltd imported from 3GU
R5s140176 Correction to GCF WI-103 IMS MTSI Testcases 9.1 and 9.2 Anritsu Ltd imported from 3GU
R5s140178 Correction of GCF WI-103 IMS MTSI Testcase 15.28 Anritsu Ltd imported from 3GU
R5s140179 TTCN Correction for EUTRA EMM Test case 9.2.3.1.6 Broadcom Corporation imported from 3GU
R5s140180 Correction of UTRA HS9 Test Case 8.2.2.77 Anite imported from 3GU
R5s140181 Correction to GCF WI-082 EMM Test Case 9.2.3.3.4 Anite imported from 3GU
R5s140182 Correction to GCF WI-167 EUTRA Inter-RAT test case 6.2.3.3a Anritsu Ltd imported from 3GU
R5s140183 Correction to EUTRA Test Case 6.1.1.4a Broadcom Corporation imported from 3GU
R5s140184 Correction to QuantityConfig in Measurement Configuration of EUTRA Testcases Anite imported from 3GU
R5s140186 Correction of UTRA HS9 Test Case 8.2.2.74 Anite imported from 3GU
R5s140188 Correction to GCF WI-086 Multilyer SRVCC test Case 13.4.3.2 Anritsu Ltd imported from 3GU
R5s140189 Correction to EUTRA Testcases Anritsu Ltd imported from 3GU
R5s140190 Addition of GCF WI-164 LTE eMBMS Test case 17.1.2 Anite imported from 3GU
R5s140192 Addition of GCF WI-164 LTE eMBMS Test case 17.1.3 Anite imported from 3GU
R5s140194 Correction to IMS Route header in ACK sent by SS Rohde & Schwarz imported from 3GU
R5s140195 Addition of LTE-A NIMTC test case 6.1.1.7 Rohde & Schwarz imported from 3GU
R5s140197 Correction of UTRA HS9 Test Case 8.2.2.76 Anite imported from 3GU
R5s140198 Addition of GCF WI-162 LTE-A Carrier Aggregation test case 8.4.2.7.1 Anite imported from 3GU
R5s140200 Addition of GCF WI-164 LTE eMBMS Test case 17.1.4 Anite imported from 3GU
R5s140202 Correction to test frequencies for LTE FDD band 28 Rohde & Schwarz imported from 3GU
R5s140203 Correction to Rel-8 Mac-i/is testcase 8.2.2.61 Rohde & Schwarz imported from 3GU
R5s140204 Correction to 183 Session Progress Message Anritsu Ltd imported from 3GU
R5s140205 Correction to GCF WI-162 LTE-A CA Testcase 8.2.2.3.2 Anritsu Ltd imported from 3GU
R5s140206 Addition of GCF WI-164 LTE eMBMS Test case 17.2.1 Anite imported from 3GU
R5s140208 Addition of GCF WI-164 LTE eMBMS Test case 17.2.2 Anite imported from 3GU
R5s140210 Addition of GCF WI-164 LTE eMBMS Test case 17.2.3 Anite imported from 3GU
R5s140212 LTE_TDD: Addition of Rel-9 EUTRA RRC Interband test case 8.1.3.12b Rohde & Schwarz imported from 3GU
R5s140214 Correction of GCF WI-151 EUTRA FDD-TDD Inter-mode test case 8.2.4.15a Anritsu Ltd imported from 3GU
R5s140215 Correction to GCF WI-082 EMM test case 9.3.1.18 Anite imported from 3GU
R5s140216 Correction to GCF WI-177 EUTRA testcase 8.6.4.4 Anritsu Ltd imported from 3GU
R5s140217 Correction to GCF WI-88 EUTRA<>C2K testcase 8.3.2.8 Anritsu Ltd imported from 3GU
R5s140218 Correction to GCF WI-88 EUTRA<>C2K testcase 8.3.2.10 Anritsu Ltd imported from 3GU
R5s140219 Correction to TCP Connection Close procedure for IMS Testcases Anritsu Ltd imported from 3GU
R5s140220 Corrections to UTRA TTCN-3 test case 8.1.5.7 Anite imported from 3GU
R5s140222 Correction to GCF WI-082 EMM Test Case 9.2.3.1.16 Anite imported from 3GU
R5s140223 LTE_TDD : Addition of GCF WI-087 EUTRAN RRC test case 8.4.3.3 Anite imported from 3GU
R5s140225 Correction to GCF WI-150 Multi-layer Test Case 13.4.1.5 Anite imported from 3GU
R5s140226 Correction to GCF WI-086 EUTRA EMM Test Case 9.2.3.3.5a Anritsu Ltd imported from 3GU
R5s140227 Correction to Rel-8 CSG testcase 9.4.2.6 Rohde & Schwarz imported from 3GU
R5s140228 Correction to Rel-9 RRC DB-DC-HSDPA testcase 8.2.2.75 Rohde & Schwarz imported from 3GU
R5s140229 Correction to Rel-9 RRC DB-DC-HSDPA testcase 8.2.2.74 Rohde & Schwarz imported from 3GU
R5s140230 LTE_TDD: Addition of LTE-A Minimization of Drive Tests (MDT) Testcase 8.6.4.4 Anritsu Ltd imported from 3GU
R5s140232 Correction to Rel-9 DC-HSU testcase 8.2.2.76 and 8.2.2.77 Rohde & Schwarz imported from 3GU
R5s140233 Correction to RACH TFS CCCH Configuration (LTE-TDSCDMA) Rohde-Schwarz imported from 3GU
R5s140234 Correction to implementation of 34.229-1 Annex C.31 procedure for SRVCC test case 13.4.3.6 Rohde & Schwarz imported from 3GU
R5s140235 Correction to GCF WI-167 EUTRA Rel9 SRVCC test Case 13.4.3.6 Anritsu Ltd imported from 3GU
R5s140237 Correction to UTRAN test case 8.1.2.21a Anite imported from 3GU
R5s140238 Correction to UTRAN test case 12.4.1.4a Anite imported from 3GU
R5s140240 Correction to GCF WI-086 EUTRA EMM Test Case 9.2.1.2.1c and 9.2.1.2.1b Anite imported from 3GU
R5s140241 Correction to add CA band combination CA_1A-26A Anritsu Ltd imported from 3GU
R5s140242 Correction to LTE UE Positioning test case 7.3.5.1 Rohde & Schwarz imported from 3GU
R5s140243 Correction to IMS Main PTC Function Anritsu Ltd imported from 3GU
R5s140244 LTE_TDD: Addition of LTE-A Minimization of Drive Tests (MDT) Testcase 8.6.2.6 Anritsu Ltd imported from 3GU
R5s140246 LTE_TDD: Addition of LTE-A Minimization of Drive Tests (MDT) Testcase 8.6.6.1 Anritsu Ltd imported from 3GU
R5s140248 LTE_TDD: Addition of LTE-A Minimization of Drive Tests (MDT) Testcase 8.6.6.2 Anritsu Ltd imported from 3GU
R5s140250 LTE_TDD: Addition of LTE-A Minimization of Drive Tests (MDT) Testcase 8.6.6.3 Anritsu Ltd imported from 3GU
R5s140252 Correction to EMM test case 9.2.1.2.14 Rohde & Schwarz imported from 3GU
R5s140253 Addition of EUTRA UE Positioning test case 7.3.4.4.1s Rohde & Schwarz imported from 3GU
R5s140255 Addition of EUTRA UE Positioning test case 7.3.4.2.1s Rohde & Schwarz imported from 3GU
R5s140257 Correction to LTE UE Positioning test case 7.3.4.3.1s Rohde & Schwarz imported from 3GU
R5s140258 Correction to LTE-A Carrier Aggregation test case 8.2.4.20.x Rohde & Schwarz imported from 3GU
R5s140259 Correction to GCF WI-086 Multi-Layer SRVCC test case 13.4.3.2 Rohde & Schwarz imported from 3GU
R5s140260 Correction to GCF WI-087 EMM test case 9.2.3.3.5 Rohde & Schwarz imported from 3GU
R5s140263 Corrections for multilayer SRVCC test cases Anite imported from 3GU
R5s140264 Correction of f_IMS_AckRequest_MessageHeaderRX() Rohde & Schwarz imported from 3GU
R5s140265 Correction of f_IPCAN_StartProcedure Rohde & Schwarz imported from 3GU
R5s140266 spi and port values Rohde & Schwarz imported from 3GU
R5s140267 Correction to GCF WI-86 EUTRA RRC test case 8.3.3.2 Anritsu Ltd imported from 3GU
R5s140268 Correction of GCF WI-082 EUTRA EMM test case 9.1.5.1 Anritsu Ltd imported from 3GU
R5s140270 Addidtion of Rel-8 CSG testcase 6.3.2.3 to HSPA8_ENH ATS Rohde & Schwarz imported from 3GU
R5s140272 Correction to Rel-7 WI-112 UL 16 QAM testcase 8.2.6.64 Rohde & Schwarz imported from 3GU
R5s140273 Correction to f_UTRAN_RB_SetUp_PS_RAB Rohde-Schwarz imported from 3GU
R5s140274 Correction to f_GetTestcaseAttrib_DlCcchMsgInSeparateMacPdu Rohde-Schwarz imported from 3GU
R5s140275 Correction of UTRA HS9 Test Step ts_CheckR9_Capabilities Anite imported from 3GU
R5s140277 Addition of GCF WI-165 LTE eMBMS Test case 17.3.2 Anite imported from 3GU
R5s140279 Correction to CSG related EMM test cases Rohde & Schwarz imported from 3GU
R5s140280 Addition of GCF WI-164 LTE eMBMS Test case 17.1.5 Anite imported from 3GU
R5s140282 Addition of GCF WI-165 LTE eMBMS Test case 17.3.1 Anite imported from 3GU
R5s140286 Corrections for LTE<>GERAN test cases 6.2.3.1, 6.2.3.1a and 9.2.3.4.1 Anite imported from 3GU
R5s140287 Corrections for emergency call test cases 11.2.2 and 11.2.4 Anite imported from 3GU
R5s140289 LTE_TDD: Addition of Rel-9 Home eNB test case 8.3.4.1 Anritsu Ltd imported from 3GU
R5s140291 LTE_TDD: Addition of Rel-9 Home eNB test case 8.3.4.2 Anritsu Ltd imported from 3GU
R5s140298 Addition of Rel-9 EUTRA Home eNB test case 8.3.4.5 Anritsu Ltd imported from 3GU
R5s140300 Correction of GCF WI-87 Testcase 6.2.3.21 for Ipv6 Over GERAN Anritsu Ltd imported from 3GU
R5s140301 Addition of GCF WI-87 LTE GERAN Test case 6.2.3.28 Anite imported from 3GU
R5s140303 Correction to GCF WI-103 IMS Call Control Test Case 11.2 Anite imported from 3GU
R5s140304 Correction to SMS over IMS Test Case 18.1 Anite imported from 3GU
R5s140305 Addition of Rel-10 EPS Enhancements EPS FDD <>UTRAN test Case 8.6.5.1 Anritsu Ltd imported from 3GU
R5s140307 Re-verification of IMS test case 15.27 over LTE with 34.229-3 test model Rohde & Schwarz imported from 3GU
R5s140309 Correction to GCF WI-086 EUTRA RRC test cases 8.4.1.2 and 8.4.1.4 Anritsu Ltd imported from 3GU
R5s140310 LTE_TDD : Addition of GCF WI-164 LTE eMBMS test case 17.1.1 Anite imported from 3GU
R5s140312 LTE_TDD : Addition of GCF WI-164 LTE eMBMS test case 17.1.2 Anite imported from 3GU
R5s140314 LTE_TDD : Addition of GCF WI-164 LTE eMBMS test case 17.1.3 Anite imported from 3GU
R5s140316 Addition of UTRAN UE Positioning test case 6.2.3.3 Rohde & Schwarz imported from 3GU
R5s140318 Addition of UTRAN UE Positioning test case 6.2.3.4 Rohde & Schwarz imported from 3GU
R5s140320 Addition of UTRAN UE Positioning test case 6.2.3.5 Rohde & Schwarz imported from 3GU
R5s140322 Addition of GCF WI-177 Rel-10 LTE Enhancements test case 9.2.3.1.20a Anritsu Ltd, Rohde & Schwarz imported from 3GU
R5s140324 Re-verification of IMS test case 15.12 over LTE with 34.229-3 test model Rohde & Schwarz imported from 3GU
R5s140326 Correction for GCF WI-086 E-UTRA EMM testcase 9.2.3.2.14 Anritsu Ltd imported from 3GU
R5s140327 Correction to fl_UTRAN34_RRC_ConnRel_DCH Rohde-Schwarz imported from 3GU
R5s140328 Correction to Rel-7 WI-112 UL 16 QAM testcase 7.1.6.3.2a Rohde & Schwarz imported from 3GU
R5s140329 Addition of GCF WI-154 IMS Emergency Call over EPS test case 19.5.9 with 36.523-3 test model Anritsu Ltd. imported from 3GU
R5s140332 Correction to GCF WI-159 Pre-registration at 1xRTT testcase 13.4.4.1 Anritsu Ltd imported from 3GU
R5s140334 Correction to GCF WI-171 IMS SSAC Testcase 12.18 Anritsu Ltd. imported from 3GU
R5s140335 Correction to function f_UTRAN_ConfigureIntegrityAfterHO() Anite imported from 3GU
R5s140336 Addition of Rel-9 EUTRA Home eNB test case 8.3.4.4 Anritsu Ltd imported from 3GU
R5s140340 Correction to GCF WI-096 EUTRA TDD<>TDSDMA test case 8.1.3.7 Anritsu Ltd imported from 3GU
R5s140341 Correction to GCF WI-087 EUTRA EMM testcase 9.2.3.3.5 Anritsu Ltd imported from 3GU
R5s140342 Correction to WI-103 IMS MTSI Testcase 11.1 Anritsu Ltd imported from 3GU
R5s140344 Correction of GCF WI-086 EUTRA RRC test case 8.3.3.2 Anritsu Ltd imported from 3GU
R5s140346 Correction to WI-103 IMS MTSI Testcase 9.2.1.1.28 Anritsu Ltd imported from 3GU
R5s140348 Corrections to GCF WI-150 rel-9 multilayer test case 13.4.1.5 Anite imported from 3GU
R5s140349 Correction to GCF WI-87 E-UTRA RRC test case 8.4.3.3 Anritsu Ltd imported from 3GU
R5s140350 Correction for checking of via Header in IMS response messages Anite imported from 3GU
R5s140352 LTE_TDD: Addition of LTE-WCDMA RRC Measurement test case 8.3.3.2 Rohde & Schwarz imported from 3GU
R5s140354 LTE_TDD: Addition of LTE-HSPA RRC Handover test case 8.4.1.5 Rohde & Schwarz imported from 3GU
R5s140356 Verification of IMS test case 8.11 over LTE with 34.229-3 test model Rohde & Schwarz imported from 3GU
R5s140359 Corrections for IMS MO call setup sequence with preconditions Anite imported from 3GU
R5s140361 Correction to LTE-A NIMTC test case 6.1.1.7 Rohde & Schwarz imported from 3GU
R5s140362 Addition of GCF WI-182 LTE-A Rel10 Enhancement EUTRA FDD<>GERAN test case 8.6.7.2 Anritsu Ltd imported from 3GU
R5s140364 LTE_TDD: Addition of GCF WI-184 LTE-A Rel10 Enhancement EUTRA TDD<>GERAN test case 8.6.7.2 Anritsu Ltd imported from 3GU
R5s140366 Correction to GCF WI-181 Rel-10 EPS Enhancements EPS FDD <>UTRAN test Case 8.6.5.1 Anritsu Ltd imported from 3GU
R5s140367 Correction of 8.3.1.13a CATT imported from 3GU
R5s140369 Correction to test case 9.1.5.1, Table 9.1.5.1.3.3-1: EMM INFORMATION (step 1, Table 9.1.5.1.3.2-1) Intel Corporation imported from 3GU
R5s140370 Addition of GCF WI-172 EUTRA<>UTRA aSRVCC Testcase 13.4.3.9 Anritsu Ltd imported from 3GU
R5s140372 Addition of GCF WI-086 EUTRA-UTRAN CSG test case 6.3.7 Rohde & Schwarz, Anite imported from 3GU
R5s140374 Addition of EUTRA-UTRAN Rel-9 Home eNB test case 6.4.3 Rohde & Schwarz, Anite imported from 3GU
R5s140376 Corrections to function f_EUTRA_508RRC_AddModRel_Scell_Common Anite imported from 3GU
R5s140377 Addition of WI-162 LTE-A Carrier Aggregation test case 8.2.2.3.1 Anite imported from 3GU
R5s140379 Addition of WI-162 LTE-A Carrier Aggregation test case 8.2.4.20.1 Anite imported from 3GU
R5s140381 Addition of WI-162 LTE-A Carrier Aggregation test case 8.3.1.17.1 Anite imported from 3GU
R5s140383 Addition of WI-162 LTE-A Carrier Aggregation test case 8.3.1.18.1 Anite imported from 3GU
R5s140385 Addition of GCF WI-172 EUTRA<>UTRA aSRVCC Testcase 13.4.3.11 Anritsu Ltd imported from 3GU
R5s140389 Addition of Rel-9 CSG test case 6.3.4.1 to HSPA9_ENH ATS Anite imported from 3GU
R5s140392 LTE_TDD : Addition of WI-162 LTE-A Carrier Aggregation test case 8.4.2.7.1 Anite imported from 3GU
R5s140394 Correction to GCF WI-081 EUTRA Idle mode test case 6.3.1 Anritsu Ltd imported from 3GU
R5s140396 Correction to GCF WI-087 EMM test case 9.2.3.3.5 Anite imported from 3GU
R5s140397 Addition of LTE-A Inter-RAT MDT test case 8.6.3.1 Anite imported from 3GU
R5s140400 Addition of Rel-7 NISPC testcase 11.3.2a to UTRAN testsuite Anite imported from 3GU
R5s140402 Correction to GCF WI-156 EUTRA RRC test case 8.2.4.14 Anite imported from 3GU
R5s140403 Correction of EUTRA MDT test Cases 8.6.2.3, 8.6.2.6, 8.6.2.7 and 8.6.2.8. Anritsu Ltd imported from 3GU
R5s140404 Addition of GCF WI-172 EUTRA<>UTRA aSRVCC Testcase 13.4.3.10 Anritsu Ltd imported from 3GU
R5s140406 Addition of GCF WI-172 EUTRA<>UTRA aSRVCC Testcase 13.4.3.7 Anritsu Ltd imported from 3GU
R5s140411 Correction to applicability condition C81 for Multi-layer test case 13.1.4 & 13.1.5 Anite imported from 3GU
R5s140414 Correction to GCF WI-082 EMM Test Case 9.2.3.1.12 Anite imported from 3GU
R5s140417 Correction to UTRA test case 8.2.2.35 Anite imported from 3GU
R5s140418 Correction in Rel-8 UTRA CSG test case 12.2.2.7e Anite imported from 3GU
R5s140419 Addition of WI-112 UL 16 QAM test case 8.3.4.12 to HSPA7_ENH ATS Rohde & Schwarz imported from 3GU
R5s140421 Addition of GCF WI-172 EUTRA<>UTRA aSRVCC Testcase 13.4.3.14 Anritsu Ltd imported from 3GU
R5s140423 Correction to GCF WI-156 EUTRA RRC test case 8.2.4.15a Anite imported from 3GU
R5s140424 Addition of Rel-10 MDT test case 8.6.2.9 Rohde & Schwarz imported from 3GU
R5s140428 Corrections to de-registration procedure Rohde & Schwarz imported from 3GU
R5s140431 Addition of GCF WI-172 EUTRA<>UTRA aSRVCC Testcase 13.4.3.16 Anritsu Ltd imported from 3GU
R5s140433 Addition of GCF WI-166 EUTRA UE Positioning test case 7.3.4.3.4s Rohde & Schwarz imported from 3GU
R5s140435 Addition of GCF WI-166 EUTRA UE Positioning test case 7.3.4.4.4s Rohde & Schwarz imported from 3GU
R5s140437 Correction to Rel-6 WI-025 HSUPA testcase 7.1.6.3.2 Rohde & Schwarz imported from 3GU
R5s140438 Correction to Rel-9 DB-DC-HSDPA testcases. Rohde & Schwarz imported from 3GU
R5s140439 Correction to of Rel-8 CSG testcase 6.3.2.3. Rohde & Schwarz imported from 3GU
R5s140440 LTE_TDD: Addition of LTE eMBMS Testcase 17.1.4 Anritsu Ltd imported from 3GU
R5s140442 LTE_TDD: Addition of LTE eMBMS Testcase 17.2.1 Anritsu Ltd imported from 3GU

page generated from database: 2019-08-20 08:43:13