3GPP TDocs (written contributions) at meeting
Meeting: R5-80 - 2018-08-20 to 2018-08-24, Gothenburg
meeting id: R5-80 (click id for more info on this meeting)Click on the Tdoc to open its file.
| TDoc | Title | Source | Remarks |
|---|---|---|---|
| R5‑184000 | Agenda - opening session | WG Chairman | imported from 3GU |
| R5‑184001 | Agenda - mid week session | WG Chairman | imported from 3GU |
| R5‑184002 | Agenda - closing session | WG Chairman | imported from 3GU |
| R5‑184003 | RAN5#80 Session Programme | WG Chairman | imported from 3GU |
| R5‑184004 | RAN5 Leadership Team | WG Chairman | imported from 3GU |
| R5‑184005 | RAN5#79 WG Minutes | ETSI Secretariat | imported from 3GU |
| R5‑184006 | RAN5#79 WG Action Points | ETSI Secretariat | imported from 3GU |
| R5‑184007 | dummy | ETSI Secretariat | imported from 3GU |
| R5‑184008 | Latest RAN Plenary notes | WG Chairman | imported from 3GU |
| R5‑184009 | Latest RAN Plenary draft Report | WG Chairman | imported from 3GU |
| R5‑184010 | Post Plenary Active Work Item update | ETSI Secretariat | imported from 3GU |
| R5‑184011 | RAN5 SR to RP#80 | WG Chairman | imported from 3GU |
| R5‑184012 | TF160 SR to RP#80 | WG Chairman | imported from 3GU |
| R5‑184013 | RAN Chair Report to SA#80 | WG Chairman | imported from 3GU |
| R5‑184014 | RAN5#80 LS Template | WG Chairman | imported from 3GU |
| R5‑184015 | RAN5 5GS Text Proposal / pCR cover sheet template | Ericsson | imported from 3GU |
| R5‑184016 | Meeting schedule for 2018-19 | WG Chairman | imported from 3GU |
| R5‑184017 | WI Progress and Target Completion Date Review | WG Chairman | imported from 3GU |
| R5‑184018 | Review deadlines for next quarter | WG Chairman | imported from 3GU |
| R5‑184019 | LS on Settings for verifying RF requirements for Coherent UL MIMO | TSG WG RAN4 | imported from 3GU |
| R5‑184020 | LS on generic 3CC to 5CC RRM test cases | TSG WG RAN4 | imported from 3GU |
| R5‑184021 | Reply LS on the applicable requirements of the Power Class 2 capable UE | TSG WG RAN4 | imported from 3GU |
| R5‑184022 | LS on Measurement Grids | TSG WG RAN4 | imported from 3GU |
| R5‑184023 | LS on Introducing optional channel bandwidth | TSG WG RAN4 | imported from 3GU |
| R5‑184024 | Definition of and test methods for OTA unwanted emissions of IMT radio equipment | ITU-R Working Party 5D | imported from 3GU |
| R5‑184025 | LS reply on RAN4-RAN5 5G-NR RF pending issues: RMCs, OCNG patterns and FR2 RSRP accuracy | TSG WG RAN4 | imported from 3GU |
| R5‑184026 | dummy LS b | ETSI Secretariat | imported from 3GU |
| R5‑184027 | dummy LS c | ETSI Secretariat | imported from 3GU |
| R5‑184028 | Addition of missing assistance data for modernized GPS and the GPS L5 signal for LTE minimum performance sub-test 4 | Spirent Communications | imported from 3GU |
| R5‑184029 | Addition of missing assistance data for the Galileo E5A signal for LTE minimum performance sub-tests 3 and 8 | Spirent Communications, European Commission | imported from 3GU |
| R5‑184030 | Addition of missing assistance data for modernized GPS and the GPS L5 signal for the LTE signalling tests | Spirent Communications | imported from 3GU |
| R5‑184031 | Addition of missing assistance data for the Galileo E5A signal for LTE signalling tests | Spirent Communications, European Commission | imported from 3GU |
| R5‑184032 | Addition of PICS for support of LPP message segmentation in test 7.3.1.1 | Spirent Communications | imported from 3GU |
| R5‑184033 | Addition of PICS for support of LPP message segmentation | Spirent Communications | imported from 3GU |
| R5‑184034 | Correction of GNSS information for V2X tests | Spirent Communications, European Commission | imported from 3GU |
| R5‑184035 | Deletion of Conditions for GNSS Reliability Requirements for V2X from Annex I.6 | Spirent Communications, European Commission | imported from 3GU |
| R5‑184036 | Addition of missing assistance data for the Galileo E5A signal for LTE signalling tests | Spirent Communications, European Commission | imported from 3GU |
| R5‑184037 | Addition of PICS for support of LPP message segmentation in test 7.3.1.1 | Spirent Communications | imported from 3GU |
| R5‑184038 | Addition of PICS for support of LPP message segmentation | Spirent Communications | imported from 3GU |
| R5‑184039 | Correction of GNSS information for V2X tests | Spirent Communications, European Commission | imported from 3GU |
| R5‑184040 | Deletion of Conditions for GNSS Reliability Requirements for V2X from Annex I.6 | Spirent Communications, European Commission | imported from 3GU |
| R5‑184041 | Clarifications and corrections to Bluetooth identification test | Spirent Communications | imported from 3GU |
| R5‑184042 | Update RRCConnectionReconfiguration message for EN-DC | Ericsson | imported from 3GU |
| R5‑184043 | Update RRC CONNECTED state | Ericsson | imported from 3GU |
| R5‑184044 | Update EPS Session Management test case in section 10 of TS 36.523-1. | FirstNet | imported from 3GU |
| R5‑184045 | Update Reference Table 6.6.2-1A dedicated EPS bearer contexts | FirstNet | imported from 3GU |
| R5‑184046 | WP – UE Conformance Test Aspects - Uplink capacity enhancements for LTE (UL 256 QAM) | Ericsson | imported from 3GU |
| R5‑184047 | SR - UE Conformance Test Aspects - Uplink capacity enhancements for LTE (UL 256 QAM) | Ericsson | imported from 3GU |
| R5‑184048 | Addition of IR.92 to SM-over-IP roles | ROHDE & SCHWARZ, Ericsson | imported from 3GU |
| R5‑184049 | WP - UE Conformance Test Aspects - LTE bands with UE category M2 and/or NB2 in Rel-15 | Ericsson | imported from 3GU |
| R5‑184050 | SR - UE Conformance Test Aspects - LTE bands with UE category M2 and/or NB2 in Rel-15 | Ericsson | imported from 3GU |
| R5‑184051 | Discussion paper on the applicability of the tests in 37.571-1 for all types and categories of UE | Spirent Communications, European Commission | imported from 3GU |
| R5‑184052 | Labelling more LTE test cases as not applicable for CAT M1 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184053 | Correction to EMM test case 9.2.3.1.25 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184054 | Add SRB with NR PDCP | Ericsson | imported from 3GU |
| R5‑184055 | Add SRB1 and SRB2 with NR PDCP | Ericsson | imported from 3GU |
| R5‑184056 | Corrections to G.15.4 | ROHDE & SCHWARZ, Qualcomm Incorporated | imported from 3GU |
| R5‑184057 | Investigation on test coverage for IR.92 and IR.94 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184058 | Investigation on Supplementary Services | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184059 | Adding SMS over IP configuration to applicabilities | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184060 | Adding SMS over SGs configuration to applicabilities | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184061 | Impact of GSMA IR.92 profile extension for EN-DC | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184062 | Resubmission of Corrections to IMS test case 19.1.6 | ETSI MCC (Rohde & Schwarz) | imported from 3GU |
| R5‑184063 | Resubmission of Correction to TC 8.1.5.7 | ETSI MCC (MediaTek Inc.) | imported from 3GU |
| R5‑184064 | Resubmission of a change of Cleaning up TC 6.5.2.4G.1 for V2V | ETSI MCC (Huawei, Hisilicon) | imported from 3GU |
| R5‑184065 | Resubmission of Introduction of Maximum Power Reduction (MPR) for CA (3UL CA) | ETSI MCC (SGS Wireless) | imported from 3GU |
| R5‑184066 | Resubmission of the Annexes of TC 6.5.2.3G.1 for V2V | ETSI MCC (Huawei, Hisilicon) | imported from 3GU |
| R5‑184067 | Correction to 10.7.4 regarding CE mode | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184068 | FR1 TT Way Forward update | Telecom Italia S.p.A. | imported from 3GU |
| R5‑184069 | Correction of the Update to applicability condition of test case 11.2.3 to include CSG PICS | ETSI MCC (Qualcomm Incorporated) | imported from 3GU |
| R5‑184070 | MCC TF160 Status Report | MCC TF160 | imported from 3GU |
| R5‑184071 | V2X: Test Model updates | MCC TF160 | imported from 3GU |
| R5‑184072 | EN-DC: TS 38.508-1 / 36.508 issue list | MCC TF160 | imported from 3GU |
| R5‑184073 | EN-DC: Test Model updates | MCC TF160 | imported from 3GU |
| R5‑184074 | eLAA: Test Model | MCC TF160 | imported from 3GU |
| R5‑184075 | NB-IoT timer tolerances: extension of timer value range | MCC TF160, Anritsu Ltd. | imported from 3GU |
| R5‑184076 | Corrections to UE Test Loop Mode H | MCC TF160 | imported from 3GU |
| R5‑184077 | Corrections to UE Test Loop Mode H | MCC TF160 | imported from 3GU |
| R5‑184078 | Corrections to UE Test Loop Mode H | MCC TF160 | imported from 3GU |
| R5‑184079 | Clarification for NB-IoT test case 22.3.1.1 | MCC TF160, Rohde&Schwarz | imported from 3GU |
| R5‑184080 | Routine maintenance for TS 36.523-3 | MCC TF160 | imported from 3GU |
| R5‑184081 | MCPTT: Test Model updates | MCC TF160 | imported from 3GU |
| R5‑184082 | Editorial clean up for consistency and better clarity | Spirent Communications, European Commission | imported from 3GU |
| R5‑184083 | Applicability of tests for types and Categories of UE | Spirent Communications, European Commission | imported from 3GU |
| R5‑184084 | Update serving cell | Ericsson | imported from 3GU |
| R5‑184085 | TP to TS38.521-1:Operating bands and channel arrangement | China Unicom | imported from 3GU |
| R5‑184086 | Applicability and ICS for CA RF and RRM test cases | Ericsson | imported from 3GU |
| R5‑184087 | Update chapter 3 | Ericsson | imported from 3GU |
| R5‑184088 | Correction to Rel-99 NAS testcase 9.4.9 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184089 | Correction to NB-IoT test case 22.5.8 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184090 | Correction to NB-IoT test case 22.5.14 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184091 | Correction to NB-IoT test case 22.6.2 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184092 | Correction to NB-IoT test case 22.6.3 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184093 | Correction to NB-IoT test case 22.1.1 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184094 | Correction to ATTACH ACCEPT message for SMS only | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184095 | Correction to eNB-IoT test case 22.3.2.7 | MCC TF160 | imported from 3GU |
| R5‑184096 | Editorial corrections to IMS emergency call test cases in clauses 19 and 21 | MCC TF160 | imported from 3GU |
| R5‑184097 | Introduce SA RRC messages | Ericsson | imported from 3GU |
| R5‑184098 | Update Clause in 6.2.5EA Configured UE transmitted Power for UE category M1 | Qualcomm Incorporated | imported from 3GU |
| R5‑184099 | Introduction of band 73 to UE maximum output power in TS36.521-1 | China Unicom | imported from 3GU |
| R5‑184100 | Applicability correction for event triggered eMTC tests | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184101 | Applicability correction for HO eMTC tests | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184102 | Editorial corrections 8.16.73 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184103 | Editorial corrections 9.1.46 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184104 | Editorial corrections 9.1.50 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184105 | Editorial corrections 7.3.49 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184106 | RMC correction 8.1.12_1 (core spec alignment) | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184107 | New generic CA RSRP test cases | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184108 | New generic CA RSRQ test cases | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184109 | Applicability correction for eMTC tests | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184110 | Correction to NB-IOT In-Band Test Frequencies | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184111 | Addition of NB-IOT Guardband Test Frequencies for 10 MHz | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184112 | Correction to nrs-CRS-PowerOffset-r13 for NB-IOT OTDOA tests | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184113 | NB-IOT OTDOA reporting delay test cases not testable | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184114 | Changes to eMTC OTDOA tests | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184115 | Draft TS 38.533 v0.0.2 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184116 | LS on generic 3CC to 5CC RRM test cases | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184117 | New CA band combination CA_1A-3A-7A-20A - Update of table 7.3A.5, 7.3A.9 and refsens | Vodafone GmbH | imported from 3GU |
| R5‑184118 | New CA band combination CA_1A-3A-7A-20A - Update of table A.4.6.3-5 | Vodafone GmbH | imported from 3GU |
| R5‑184119 | New CA band combination CA_1A-3A-7A-20A - Update of table A.4.3.3.3-5 | Vodafone GmbH | imported from 3GU |
| R5‑184120 | New CA band combination CA_1A-3A-7A-20A - Update of test point analysis | Vodafone GmbH | imported from 3GU |
| R5‑184121 | TP for Clause 4.1.1 of TS 38.522 | CMCC | imported from 3GU |
| R5‑184122 | TP for Clause 4.1.2 of TS 38.522 | CMCC | imported from 3GU |
| R5‑184123 | TP for Clause 4.1.3 of TS 38.522 | CMCC | imported from 3GU |
| R5‑184124 | Discussion on the way to write Clause 7.4 Maximum Input Level and Clause 7.5 Adjacent Channel Selectivity in TS 38.521-3 | CMCC, HUAWEI | imported from 3GU |
| R5‑184125 | Add Clause 7.5 into TS 38.521-3 | CMCC | imported from 3GU |
| R5‑184126 | Correct IE FrequencyInfoDL | Ericsson | imported from 3GU |
| R5‑184127 | Introduce SA system information blocks | Ericsson | imported from 3GU |
| R5‑184128 | Discussion on Test Loop Mode H | MCC TF160 | imported from 3GU |
| R5‑184129 | Editorial Correction to note 7 in Table E-1 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184130 | Introduction of band 73 to Spurious emission in TS36.521-1 | China Unicom | imported from 3GU |
| R5‑184131 | Addition of Assistance Data for OTDOA eMTC tests | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184132 | Correction of the applicability for OTDOA IOT tests | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184133 | Discussion on RRM 5G progress | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184134 | Introduce SA other information elements | Ericsson | imported from 3GU |
| R5‑184135 | eNB-IoT: Test Model | MCC TF160 | imported from 3GU |
| R5‑184136 | Removal of technical content in 34.108 v14.2.0 and substitution with pointer to the next Release | ETSI Secretariat | imported from 3GU |
| R5‑184137 | Removal of technical content in 34.121-2 v14.1.0 and substitution with pointer to the next Release | ETSI Secretariat | imported from 3GU |
| R5‑184138 | Removal of technical content in 34.123-1 v14.5.0 and substitution with pointer to the next Release | ETSI Secretariat | imported from 3GU |
| R5‑184139 | Removal of technical content in 34.123-2 v14.4.0 and substitution with pointer to the next Release | ETSI Secretariat | imported from 3GU |
| R5‑184140 | Removal of technical content in 36.521-3 v14.4.0 and substitution with pointer to the next Release | ETSI Secretariat | imported from 3GU |
| R5‑184141 | Removal of technical content in 36.523-3 v14.4.0 and substitution with pointer to the next Release | ETSI Secretariat | imported from 3GU |
| R5‑184142 | Removal of technical content in 36.903 v13.5.0 and substitution with pointer to the next Release | ETSI Secretariat | imported from 3GU |
| R5‑184143 | Removal of technical content in 36.905 v14.6.0 and substitution with pointer to the next Release | ETSI Secretariat | imported from 3GU |
| R5‑184144 | Correction to test case 9.5.7.2 | Intel Corporation (UK) Ltd | imported from 3GU |
| R5‑184145 | Addition of Test Case:” LWA / T351 Expiry” to WLAN/3GPP Radio Level Integration and Interworking Enhancement Interworking Work Item | Intel Corporation (UK) Ltd | imported from 3GU |
| R5‑184146 | Addition of Applicability statement for WLAN/3GPP Radio Level Integration and Interworking Enhancement test case: ”LWA / T351 Expiry” | Intel Corporation (UK) Ltd | imported from 3GU |
| R5‑184147 | Test Tolerance Analysis for RRM TC 9.1.1.1_2 and 9.1.2.1_2 | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑184148 | Addition of TT analysis of eHST FDD Intra-frequency event reporting. | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑184149 | Addition of TT analysis of V2X uplink timing test case | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑184150 | Test tolerance update of V2X uplink timing test cases | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑184151 | Test tolerance update of eHST FDD event reporting test case | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑184152 | TP to TS8.521-1: Operating bands and Channel arrangement | China Unicom | imported from 3GU |
| R5‑184153 | Draft TS 38.521-1 v1.0.1 | China Unicom | imported from 3GU |
| R5‑184154 | Draft TS 38.521-1 v1.0.1 | China Unicom | imported from 3GU |
| R5‑184155 | Test Tolerance Analysis for RRM TC 9.1.1.2_2 and 9.1.2.2_2 | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑184156 | Test Tolerance Analysis for RRM TC 9.1.3.1_2 and 9.1.4.1_2 | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑184157 | Test Tolerance Analysis for RRM TC 9.1.3.2_2 and 9.1.4.2_2 | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑184158 | Test Tolerance Analysis for RRM TC 9.1.5.1_2 | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑184159 | Test Tolerance Analysis for RRM TC 9.1.5.2_2 | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑184160 | Test Tolerance Analysis for RRM TC 9.2.1.1_2 and 9.2.2.1_2 | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑184161 | Test Tolerance Analysis for RRM TC 9.2.3.1_2 and 9.2.4.1_2 | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑184162 | Test Tolerance Analysis for RRM TC 9.2.3.2_2 and 9.2.4.2_2 | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑184163 | Test Tolerance Analysis for RRM TC 9.2.4A.1_2 | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑184164 | Test Tolerance Analysis for RRM TC 9.2.4A.2_2 | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑184165 | Test Tolerance: Updates to Cat1bis inter frequency RSRP accuracy tests and Annex F | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑184166 | Test Tolerance: Updates to Cat1bis inter frequency RSRQ accuracy tests and Annex F | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑184167 | Test Tolerance: Updates to Cat1bis intra frequency RSRP accuracy tests and Annex F | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑184168 | Test Tolerance: Updates to Cat1bis intra frequency RSRQ accuracy tests and Annex F | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑184169 | Update of RRM IncMon test cases 8.3.7, 8.3.8, 8.3.9, 8.4.7 including test tolerances | Ericsson | imported from 3GU |
| R5‑184170 | Requirements for test frequencies for 5G signalling test cases | MCC TF160 | imported from 3GU |
| R5‑184171 | TC Group definition for RRM IncMon test cases | Ericsson | imported from 3GU |
| R5‑184172 | Add Test Tolerances analysis for E-UTRAN RRM IncMon TCs 8.3.7 and 8.4.7 | Ericsson | imported from 3GU |
| R5‑184173 | Add Test Tolerances analysis for E-UTRAN IncMon TC 8.3.8 | Ericsson | imported from 3GU |
| R5‑184174 | Add Test Tolerances analysis for E-UTRAN IncMon TC 8.3.9 | Ericsson | imported from 3GU |
| R5‑184175 | Correction to NR MAC test case 7.1.1.3.2 | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑184176 | Updates to PDCCH and SearchSpace configurations | MCC TF160 | imported from 3GU |
| R5‑184177 | Updation of V2X TC 6.6.2.1G.2 & 6.6.2.1G.3 | Huawei, Hisilicon | imported from 3GU |
| R5‑184178 | Introcution of V2X TC 6.5.2.4G.3 | Huawei, Hisilicon | imported from 3GU |
| R5‑184179 | Updation of V2X TC 6.6.2.2G.2 | Huawei, Hisilicon | imported from 3GU |
| R5‑184180 | Updation of V2X TCs 6.5.2.3G.2 and 6.5.2.3G.3 | Huawei, Hisilicon | imported from 3GU |
| R5‑184181 | Update of V2V TCs 6.5.2.3G.1 & 6.5.2.4G & 6.6.2.2G.1& 6.6.3G.1 | Huawei, Hisilicon | imported from 3GU |
| R5‑184182 | TT statements for V2X TCs | Huawei, Hisilicon | imported from 3GU |
| R5‑184183 | Update of V2X TCs 6.6.3G.2_1 & 6.6.3G.3_1 | Huawei, Hisilicon | imported from 3GU |
| R5‑184184 | Update of V2X TCs 6.6.3G.2 & 6.6.3G.3 | Huawei, Hisilicon | imported from 3GU |
| R5‑184185 | Test Tolerance Analysis for RRM TC 9.2.1.1_2 and 9.2.2.1_2 | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑184186 | Proposal for Signalling Test Setup in FR2 | ANRITSU LTD | imported from 3GU |
| R5‑184187 | Correction to testcase 9.2.2.1.9 for CAT-M1 UEs | ROHDE & SCHWARZ, Qualcomm Incorporated | imported from 3GU |
| R5‑184188 | Reuse of demodulation setup for signalling tests in FR2 | ANRITSU LTD | imported from 3GU |
| R5‑184189 | Band groups added to specification | PCTEST Engineering Laboratory, Inc. | imported from 3GU |
| R5‑184190 | Editorial - Updates for GNSS Signal Capabilities | PCTEST Engineering Laboratory, Inc. | imported from 3GU |
| R5‑184191 | Editorial - Updates, corrections and clarifications to specification | PCTEST Engineering Laboratory, Inc. | imported from 3GU |
| R5‑184192 | Correction of Test Cases 8.2.5.4 and 8.2.5.5 | Intel Corporation (UK) Ltd | imported from 3GU |
| R5‑184193 | Correction to 36521-1-chapter 6_V2V and V2X | Tejet | imported from 3GU |
| R5‑184194 | eLAA_correction to 6.3.5A.1.2 and 6.3.5A.2.2 | Tejet | imported from 3GU |
| R5‑184195 | eLAA_Update to 6.6.2.3A.2 | Tejet | imported from 3GU |
| R5‑184196 | eLAA_Update to 6.6.3.1A.2 | Tejet | imported from 3GU |
| R5‑184197 | CA band combination CA_2A-46A CA_26A-46A - Updates of test points analysis | Tejet | imported from 3GU |
| R5‑184198 | WP - UE Conformance Test Aspects - Voice and Video Enhancement for LTE | CATT | imported from 3GU |
| R5‑184199 | SR - UE Conformance Test Aspects - Voice and Video Enhancement for LTE | CATT | imported from 3GU |
| R5‑184200 | WP - UE Conformance Test Aspects - UL Data Compression in LTE | CATT | imported from 3GU |
| R5‑184201 | SR - UE Conformance Test Aspects - UL Data Compression in LTE | CATT | imported from 3GU |
| R5‑184202 | Completion of Chapter 7 RRM cat 1bis test cases | Qualcomm UK Ltd | imported from 3GU |
| R5‑184203 | Test Tolerance: Updates to Cat1bis chapter 8 inter-frequency event triggered reporting tests | Qualcomm UK Ltd | imported from 3GU |
| R5‑184204 | Test Tolerances analysis for E-UTRAN FDD-FDD and TDD-TDD inter-frequency TC 8.3.1_2, 8.3.2_2, 8.4.1_2, 8.4.2_2 and 8.4.6_2 for UE category 1bis | Qualcomm UK Ltd | imported from 3GU |
| R5‑184205 | Test Tolerance: Updates to Cat1bis Event triggered reporting tests under AWGN propagation conditions in asynchronous cells with DRX when L3 filtering is used | Qualcomm UK Ltd | imported from 3GU |
| R5‑184206 | Test Tolerances analysis for E-UTRAN FDD-FDD and TDD-TDD inter-frequency TC 8.3.3_2 and 8.4.3_2 for UE category 1bis when L3 filtering is used | Qualcomm UK Ltd | imported from 3GU |
| R5‑184207 | Test Tolerance: Updates to Cat1bis Event triggered reporting tests with fading, Annex E and Annex F | Qualcomm UK Ltd | imported from 3GU |
| R5‑184208 | Test Tolerances analysis for E-UTRAN FDD-FDD intra-frequency event triggered reporting under fading propagation conditions in asynchronous cells for UE category 1bis | Qualcomm UK Ltd | imported from 3GU |
| R5‑184209 | Test Tolerance: Updates to Cat1bis intra-frequency Event triggered reporting tests, Annex E and Annex F | Qualcomm UK Ltd | imported from 3GU |
| R5‑184210 | Test Tolerances analysis for E-UTRAN FDD-FDD and TDD-TDD intra-frequency TC 8.1.12_2, 8.1.13_2, 8.1.17_2, 8.1.18_2 for UE category 1bis | Qualcomm UK Ltd | imported from 3GU |
| R5‑184211 | Test Tolerance: Updates to Cat1bis intra-frequency CGI Event triggered reporting tests, Annex E and Annex F | Qualcomm UK Ltd | imported from 3GU |
| R5‑184212 | Test Tolerances analysis for E-UTRAN FDD and TDD Intra-frequency CGI TC 8.1.19_2, 8.1.20_2, 8.2.7_2, 8.2.8_2 for UE category 1bis | Qualcomm UK Ltd | imported from 3GU |
| R5‑184213 | Removal of Testcase 8.2.2.6.4 | CATT | imported from 3GU |
| R5‑184214 | Removal of Testcase 8.2.2.6.5 | CATT | imported from 3GU |
| R5‑184215 | Update of the title of Testcase 7.1.5.6 | CATT | imported from 3GU |
| R5‑184216 | Corrections to NBIOT NAS TC 22.5.7b | CATT | imported from 3GU |
| R5‑184217 | Update of applicability and tests conditions for LTE_VoLTE_ViLTE_enh test cases | CATT | imported from 3GU |
| R5‑184218 | Addition of Correct HARQ process handling BCCH test case 7.1.1.2.4 | Huawei, Hisilicon | imported from 3GU |
| R5‑184219 | Addition of Correct HARQ process handling CCCH test case 7.1.1.2.3 | Huawei, Hisilicon | imported from 3GU |
| R5‑184220 | Addition of Correct Handling of DL HARQ process PDSCH Aggregation test case 7.1.1.2.2 | Huawei, Hisilicon | imported from 3GU |
| R5‑184221 | Addition of NR CA reconfiguration test case 8.2.4.2.1.1 | Huawei, Hisilicon | imported from 3GU |
| R5‑184222 | Addition of NR CA reconfiguration test case 8.2.4.2.1.2 | Huawei, Hisilicon | imported from 3GU |
| R5‑184223 | Addition of NR CA reconfiguration test case 8.2.4.2.1.3 | Huawei, Hisilicon | imported from 3GU |
| R5‑184224 | Addition of Random access procedure Successful Supplementary Uplink test case 7.1.1.1.5 | Huawei, Hisilicon | imported from 3GU |
| R5‑184225 | Addition of Random access test case 7.1.1.1.4 | Huawei, Hisilicon | imported from 3GU |
| R5‑184226 | Addition of Correct handling of Configured UL grant Type 1 test case 7.1.1.6.2 | Huawei, Hisilicon | imported from 3GU |
| R5‑184227 | Addition of Correct handling of Configured UL grant Type 2 test case 7.1.1.6.3 | Huawei, Hisilicon | imported from 3GU |
| R5‑184228 | CR of Correct handling of DL assignment Semi persistent test case 7.1.1.6.1 | Huawei, Hisilicon | imported from 3GU |
| R5‑184229 | CR of UE power headroom reporting test case 7.1.1.3.7 | Huawei, Hisilicon | imported from 3GU |
| R5‑184230 | CR of BSR report test case 7.1.1.3.4 | Huawei, Hisilicon | imported from 3GU |
| R5‑184231 | Addition and correction of test applicability of multiple signalling test cases | Huawei, Hisilicon | imported from 3GU |
| R5‑184232 | Discussion on CQI reporting on highest MCS value case | Huawei, Hisilicon | imported from 3GU |
| R5‑184233 | CR of CQI reporting test case 9.2.1.1.4.2 | Huawei, Hisilicon | imported from 3GU |
| R5‑184234 | Correction to message contents for UL64QAM | Anritsu | imported from 3GU |
| R5‑184235 | Correction to default message for UL CA tests | Anritsu | imported from 3GU |
| R5‑184236 | Editorial correction to FDD Mode test frequencies | Anritsu | imported from 3GU |
| R5‑184237 | Correction to Figure A.64 to cater for CC >= 3 | Anritsu | imported from 3GU |
| R5‑184238 | Correction to LAA CQI reporting tests | Anritsu | imported from 3GU |
| R5‑184239 | Correction to 4x4 CA demodulation tests | Anritsu | imported from 3GU |
| R5‑184240 | Correction to cqi-pmi-ConfigurationIndex for 5DL CA CQI Reporting tests | Anritsu | imported from 3GU |
| R5‑184241 | Correction to message exception for 8.2.1.4.2_A.4 | Anritsu | imported from 3GU |
| R5‑184242 | Correction to p-Max in configured UE transmitted output power tests for CA | Anritsu | imported from 3GU |
| R5‑184243 | Removal of the editor’s note regarding the faders in 4x4 CA demod tests | Anritsu | imported from 3GU |
| R5‑184244 | Editorial correction to inter-band UL CA tests | Anritsu | imported from 3GU |
| R5‑184245 | Editorial correction to RMC name in PHICH demodulation test | Anritsu | imported from 3GU |
| R5‑184246 | Editorial correction to test points for 8.7.5.1 | Anritsu | imported from 3GU |
| R5‑184247 | Correction to 4CA and 5CA PDSCH demodulation tests | Anritsu | imported from 3GU |
| R5‑184248 | Corrections to CA Test Configuration Table in section 7 | Anritsu | imported from 3GU |
| R5‑184249 | Editorial correction to Table 6.2.5.3-3 Delta TIB (three bands) | Anritsu | imported from 3GU |
| R5‑184250 | Correction to Test Tolerance for 4DL and 5DL Reference Sensitivity Test | Anritsu | imported from 3GU |
| R5‑184251 | Editorial correction to 6.6.3.3 | Anritsu | imported from 3GU |
| R5‑184252 | Correction of connection diagram for 4Rx 3CC/4CC/5CC Rx tests | Anritsu | imported from 3GU |
| R5‑184253 | Clarify the definition of active time slot in out of band and spurious emission tests | Anritsu | imported from 3GU |
| R5‑184254 | Editorial correction to test points for CA_2A-12A-66A in 7.3A.5 | Anritsu | imported from 3GU |
| R5‑184255 | Editorial correction to Reference NPRACH Configuration | Anritsu | imported from 3GU |
| R5‑184256 | Correction to 5CA FDD-TDD Chapter 8 Tests | Anritsu | imported from 3GU |
| R5‑184257 | Correction to LAA CSI-RS measurement test | Anritsu | imported from 3GU |
| R5‑184258 | Editorial correction to LAA Listen-before-talk model | Anritsu | imported from 3GU |
| R5‑184259 | Correction to connection figure for 4 DL and 5 DL CA Event Triggered Reporting tests | Anritsu | imported from 3GU |
| R5‑184260 | Correction to cell configuration mapping table for 8.16.70 and 8.16.78 | Anritsu | imported from 3GU |
| R5‑184261 | Correction to cell configuration mapping for 8.26.3 | Anritsu | imported from 3GU |
| R5‑184262 | Correction to test procedure for FS3 event triggered reporting tests | Anritsu | imported from 3GU |
| R5‑184263 | Correction to test requirement of FS3 event triggered reporting tests | Anritsu | imported from 3GU |
| R5‑184264 | Correction to minimum conformance requirements for FDD_B1 and FDD_B2 | Anritsu | imported from 3GU |
| R5‑184265 | Editorial correction to Noc for Cell2 on FDD_B1 or FDD_B2 | Anritsu | imported from 3GU |
| R5‑184266 | Correction of test case title of 8.2.2.5a.2 | Huawei,HiSilicon | imported from 3GU |
| R5‑184267 | Cleaning up V2X test cases in TS 36.521-1 | Huawei,HiSilicon | imported from 3GU |
| R5‑184268 | Cleaning up the default message contents and test states of V2X | Huawei,HiSilicon | imported from 3GU |
| R5‑184269 | Addition of test applicabilities of multiple V2X test cases | Huawei,HiSilicon | imported from 3GU |
| R5‑184270 | Addition of TT analysis of V2X TC 12.2.1 | Huawei,HiSilicon, Anritsu, Rohde & Schwarz | imported from 3GU |
| R5‑184271 | Addition of TT analysis of V2X TC 12.2.2 | Huawei,HiSilicon, Anritsu, Rohde & Schwarz | imported from 3GU |
| R5‑184272 | Addition of TT analysis of V2X TC 12.4 | Huawei,HiSilicon, Anritsu, Rohde & Schwarz | imported from 3GU |
| R5‑184273 | Addition of V2X new TC 12.2.1 | Huawei,HiSilicon, Rohde & Schwarz | imported from 3GU |
| R5‑184274 | Addition of V2X new TC 12.2.2 | Huawei,HiSilicon, Rohde & Schwarz | imported from 3GU |
| R5‑184275 | Addition of V2X new TC 12.4 | Huawei,HiSilicon, Rohde & Schwarz | imported from 3GU |
| R5‑184276 | Update of Annex F for TC 12.2.1, 12.2.2 and 12.4 | Huawei,HiSilicon, Anritsu, Rohde & Schwarz | imported from 3GU |
| R5‑184277 | Update of TP analysis of CA_3A-7A-8A | Huawei,HiSilicon | imported from 3GU |
| R5‑184278 | Addition of TP analysis of CA_1A-7A-8A in 36.905 | Huawei,HiSilicon | imported from 3GU |
| R5‑184279 | Addition of TP analysis of CA_1A-3A-7A-8A in 36.905 | Huawei,HiSilicon | imported from 3GU |
| R5‑184280 | Addition of TP analysis of CA_7A-42A-42A in 36.905 | Huawei,HiSilicon | imported from 3GU |
| R5‑184281 | Addition of TP analysis of CA_20A-42A-42A in 36.905 | Huawei,HiSilicon | imported from 3GU |
| R5‑184282 | Update of test frequencies for CA_42A-42A | Huawei,HiSilicon | imported from 3GU |
| R5‑184283 | Correction of test configuration of CA_20A-42A REFSENS | Huawei,HiSilicon | imported from 3GU |
| R5‑184284 | Update of 7.3A.5 REFSENS for Rel-13 CA configurations | Huawei,HiSilicon | imported from 3GU |
| R5‑184285 | Addition of REFSENS test configuration of CA_1A-3A-7A-8A | Huawei,HiSilicon | imported from 3GU |
| R5‑184286 | Addition of multiple CA configurations to capability tables in TS 36.521-2 | Huawei,HiSilicon | imported from 3GU |
| R5‑184287 | Addition of multiple CA configurations to capability tables in TS 36.523-2 | Huawei,HiSilicon | imported from 3GU |
| R5‑184288 | Editorial cleaning up of Rel-14 CA 5DL RSRP measurement TC 9.1.51 | Huawei,HiSilicon | imported from 3GU |
| R5‑184289 | Addition of Rel-13 B5C new TC 8.16.47 | Huawei,HiSilicon, Bureau Veritas | imported from 3GU |
| R5‑184290 | Addition of Rel-13 B5C new TC 8.16.48 | Huawei,HiSilicon, Bureau Veritas | imported from 3GU |
| R5‑184291 | Addition of Rel-13 B5C new TC 8.16.49 | Huawei,HiSilicon, Bureau Veritas | imported from 3GU |
| R5‑184292 | Addition of Rel-13 B5C new TC 8.16.50 | Huawei,HiSilicon, Bureau Veritas | imported from 3GU |
| R5‑184293 | Update of Annex E and Annex F to add cell mapping and TT for 8.16.47-50 | Huawei,HiSilicon | imported from 3GU |
| R5‑184294 | Addition of test applicability for Rel-13 B5C new TC 8.16.47-50 | Huawei,HiSilicon | imported from 3GU |
| R5‑184295 | Discussion on test frequency definition in FR1 | Huawei,HiSilicon | imported from 3GU |
| R5‑184296 | Update of test frequencies of Band n41 and n77 | Huawei,HiSilicon | imported from 3GU |
| R5‑184297 | Addition of Mid channel bandwidth definition for several missing bands | Huawei,HiSilicon | imported from 3GU |
| R5‑184298 | Update of common uplink configuration in 6.1 | Huawei,HiSilicon | imported from 3GU |
| R5‑184299 | Update of FR1 test case 6.2.1 | Huawei,HiSilicon | imported from 3GU |
| R5‑184300 | Addition of FR1 test case 6.2.4 | Huawei,HiSilicon | imported from 3GU |
| R5‑184301 | Update of FR1 test case 6.3.1 | Huawei,HiSilicon | imported from 3GU |
| R5‑184302 | Update of FR1 test case 6.3.3.2 | Huawei,HiSilicon | imported from 3GU |
| R5‑184303 | Test Point analysis for FR1 Configured Output Power | Huawei,HiSilicon | imported from 3GU |
| R5‑184304 | Draft TR 38.903 v0.3.0 | Huawei,HiSilicon | imported from 3GU |
| R5‑184305 | WP - Support for V2V services based on LTE sidelink | Huawei | imported from 3GU |
| R5‑184306 | SR - Support for V2V services based on LTE sidelink | Huawei | imported from 3GU |
| R5‑184307 | WP - Support for V2X services | Huawei | imported from 3GU |
| R5‑184308 | SR - Support for V2X services | Huawei | imported from 3GU |
| R5‑184309 | WP - LTE Carrier Aggregation Enhancement Beyond 5 Carriers: PUCCH on Scell | Huawei | imported from 3GU |
| R5‑184310 | SR - LTE Carrier Aggregation Enhancement Beyond 5 Carriers: PUCCH on Scell | Huawei | imported from 3GU |
| R5‑184311 | WP - Rel-14 eNB-IoT | Huawei | imported from 3GU |
| R5‑184312 | SR - Rel-14 eNB-IoT | Huawei | imported from 3GU |
| R5‑184313 | Demodulation test case 8.11.1.1.1 and 8.11.1.1.2 updated for category M2 | Ericsson | imported from 3GU |
| R5‑184314 | Update of Test Tolerance analyses for TDD-FDD CA PDSCH Closed Loop Single Layer Spatial Multiplexing 2x4 with TM4 Interference Model-Enhanced Performance Requirement Type A (2DL CA) | LG Electronics | imported from 3GU |
| R5‑184315 | Update of Test Tolerance analyses for TDD-FDD CA PDSCH Single-layer Spatial Multiplexing 2x4 on antenna ports 7 or 8 with TM9 Interference Model-Enhanced Performance Requirement Type A (2DL CA) | LG Electronics | imported from 3GU |
| R5‑184316 | Update of TDD-FDD CA PDSCH Closed Loop Single Layer Spatial Multiplexing 2x4 with TM4 Interference Model-Enhanced Performance Requirement Type A (2DL CA) | LG Electronics | imported from 3GU |
| R5‑184317 | Update of TDD-FDD CA PDSCH Single-layer Spatial Multiplexing 2x4 on antenna ports 7 or 8 with TM9 Interference Model-Enhanced Performance Requirement Type A (2DL CA) | LG Electronics | imported from 3GU |
| R5‑184318 | Correct IE GSCN-ValueNR | Ericsson | imported from 3GU |
| R5‑184319 | WP - UE Conformance Test Aspects - 450 MHz Band for LTE in Region 3(UID-790058) | China Unicom | imported from 3GU |
| R5‑184320 | SR - UE Conformance Test Aspects - 450 MHz Band for LTE in Region 3 for RAN5#80 | China Unicom | imported from 3GU |
| R5‑184321 | SR - LTE_QMC_Streaming-UEConTest(UID-790051) for RAN5#80 | China Unicom | imported from 3GU |
| R5‑184322 | Correction to NB-IoT test cases 22.4.8 and 22.4.9 | ANRITSU LTD | imported from 3GU |
| R5‑184323 | Correction to SSAC connected mode test cases 13.5.1a and 13.5.3a for IMS Enabled UE | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑184324 | Addition of 5GS NR SDAP test case 7.1.4.1 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184325 | 36.521-2 updates for category M2 test cases | Ericsson | imported from 3GU |
| R5‑184326 | New test case: 6.2.3A.3_2, Maximum Power Reduction (MPR) for CA (intra-band non-contiguous DL CA and UL CA) for UL 256QAM | Ericsson | imported from 3GU |
| R5‑184327 | Adding condition for CP-OFDM waveform | Ericsson | imported from 3GU |
| R5‑184328 | WP - UE Conformance Test Aspects - Add UE Power Class 2 to band 41 intra-band contiguous LTE Carrier Aggregation | Sprint Corporation | imported from 3GU |
| R5‑184329 | SR - UE Conformance Test Aspects - Add UE Power Class 2 to band 41 intra-band contiguous LTE Carrier Aggregation | Sprint Corporation | imported from 3GU |
| R5‑184330 | Adding support for test SCS definition | Ericsson | imported from 3GU |
| R5‑184331 | Correction to Idle mode Inter-RAT G<>E test case 6.2.3.21 to allow optional IMS registration on EUTRAN cell | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑184332 | Test Frequencies | Sprint Corporation | imported from 3GU |
| R5‑184333 | Updates to Annex B | MCC TF160 | imported from 3GU |
| R5‑184334 | New Work Item Proposal: UE Conformance Test Aspects - Addition of Power Class 1 UE to bands B31/B72 for LTE | Airbus DS SLC | imported from 3GU |
| R5‑184335 | Band 41 HPUE Maximum Output Power | CMCC | imported from 3GU |
| R5‑184336 | Correction of applicability to TS 36.521-2 for HPUE RF test cases | CMCC | imported from 3GU |
| R5‑184337 | New WID on UE Conformance Test Aspects - ProSe Support for Band 72 in LTE | Airbus DS SLC | imported from 3GU |
| R5‑184338 | Correction to 5GS MAC Test case 7.1.1.1.2 Random access procedure / Successful / C-RNTI Based / Preamble selected by MAC itself | Qualcomm Korea | imported from 3GU |
| R5‑184339 | Update of FR1 signal levels | ANRITSU LTD | imported from 3GU |
| R5‑184340 | Correction to 5GS MAC Test case 7.1.1.5.3 DRX operation / Short cycle configured / Parameters configured by RRC | Qualcomm Korea | imported from 3GU |
| R5‑184341 | Correction to 5GS RLC Test case 7.1.2.3.10 AM RLC / Re-transmission of RLC PDU with and without re-segmentation | Qualcomm Korea | imported from 3GU |
| R5‑184342 | Correction to 5GS RLC Test case 7.1.2.3.11 AM RLC / RLC re-establishment procedure | Qualcomm Korea | imported from 3GU |
| R5‑184343 | Correction to 5GS PDCP Test case 7.1.3.4.1 PDCP handover / Lossless handover / PDCP sequence number maintenance / PDCP status report to convey the information on missing or acknowledged PDCP SDUs at handover / In-order delivery and duplicate eliminat | Qualcomm Korea | imported from 3GU |
| R5‑184344 | Correction to 5GS PDCP Test case 7.1.3.5.4 PDCP reordering / Maximum re-ordering delay below t-Reordering / t-Reordering timer operations | Qualcomm Korea | imported from 3GU |
| R5‑184345 | Addition of NR CA / NR SCell addition / modification / release / Success test cases 8.2.4.1.1.1, 8.2.4.1.1.2 and 8.2.4.1.1.3 | Qualcomm Korea | imported from 3GU |
| R5‑184346 | Modified RRC_Connected procedure for Multi PDN throughout the test case. | Qualcomm Korea | imported from 3GU |
| R5‑184347 | Modified RRC_IDLE procedure to allow multi PDN configuration throughout the test case | Qualcomm Korea | imported from 3GU |
| R5‑184348 | Update EN-DC Generic Procedure Parameter for Multi-PDN addition throughout Test Case | Qualcomm Korea | imported from 3GU |
| R5‑184349 | Modification of EPS & Data Radio Bearer ID mapping for EN-DC Test cases | Qualcomm Korea | imported from 3GU |
| R5‑184350 | Multi-PDN Handling in EN-DC | Qualcomm Korea | imported from 3GU |
| R5‑184351 | ASN.1 Version Handling for NSA and SA | Qualcomm Korea | imported from 3GU |
| R5‑184352 | Addition of Test frequency for EN-DC B1_n78 | Qualcomm Korea | imported from 3GU |
| R5‑184353 | Corrections to RRC TC - BandwidthPart Configuration / SCG / EN-DC | Qualcomm Tech. Netherlands B.V | imported from 3GU |
| R5‑184354 | Corrections to RRC TC - PSCell addition, modification and release / SCG DRB / EN-DC | Qualcomm Tech. Netherlands B.V | imported from 3GU |
| R5‑184355 | Corrections to RRC TC - Bearer Modification / Handling for bearer type change with security key change / EN-DC | Qualcomm Tech. Netherlands B.V | imported from 3GU |
| R5‑184356 | Corrections to RRC TC - Bearer Modification / Uplink data path / Split DRB Reconfiguration / EN-DC | Qualcomm Tech. Netherlands B.V | imported from 3GU |
| R5‑184357 | Corrections to RRC TC - Measurement configuration control and reporting / Inter-RAT measurements / Event B1 / Measurement of NR cells / EN-DC | Qualcomm Tech. Netherlands B.V | imported from 3GU |
| R5‑184358 | Addition of IP Connectivity check procedure | Qualcomm Tech. Netherlands B.V | imported from 3GU |
| R5‑184359 | Handling of Unified Access Control test cases in SA | Qualcomm Tech. Netherlands B.V | imported from 3GU |
| R5‑184360 | Test Engineer | TEOCO | imported from 3GU |
| R5‑184361 | Discussion_38.521-3_ApplicabilityRules | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑184362 | FR2_38.521-3_Applicability_SpuriousEmissions | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑184363 | FR2_38.522_Applicability_SpuriousEmissions | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑184364 | Discussion_FR2_EVM_UBF_usage | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑184365 | Discussion_FR2_RefSens_RSRP_vs_EIS | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑184366 | Discussion_FR2_RefSens_TestPointAnalysis | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑184367 | FR2_RefSens_TestConfig_38.521-2 | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑184368 | Discussion_FR2_StoreTxRxBeamPeakCoordinates | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑184369 | FR2_StoreTxRxBeamPeakCoordinates_38.521-2 | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑184370 | FR2_StoreTxRxBeamPeakCoordinates_38.521-3 | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑184371 | FR2_TxSpurious_TestPointAnalysis | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑184372 | FR2_TxSpurious_TestConfig_38.521-2 | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑184373 | FR2_UE_BeamlockInvoke_38.521-2 | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑184374 | Update of TC 8.9.1.2.2_1 TDD PDSCH Closed Loop Single Layer Spatial Multiplexing for UE category 1bis | CAICT | imported from 3GU |
| R5‑184375 | Introduction of TC 6.1.1_2 E-UTRAN FDD Intra-frequency RRC Re-establishment for UE Category 1bis | CAICT | imported from 3GU |
| R5‑184376 | Introduction of TC 6.1.2_2 E-UTRAN FDD Inter-frequency RRC Re-establishment for UE Category 1bis | CAICT | imported from 3GU |
| R5‑184377 | Introduction of TC 6.1.3_2 E-UTRAN TDD Intra-frequency RRC Re-establishment for UE Category 1bis | CAICT | imported from 3GU |
| R5‑184378 | Introduction of TC 6.1.4_2 E-UTRAN TDD Inter-frequency RRC Re-establishment for UE Category 1bis | CAICT | imported from 3GU |
| R5‑184379 | Annex E,F RRM Cat1bis 6.1.x tests | CAICT | imported from 3GU |
| R5‑184380 | New feMTC test case 7.5EC Adjacent Channel Selectivity (ACS) for UE category M2 | CAICT | imported from 3GU |
| R5‑184381 | New feMTC test case 7.6.1EC In-band blocking for UE category M2 | CAICT | imported from 3GU |
| R5‑184382 | New feMTC test case 7.6.3EC Narrow band blocking for UE category M2 | CAICT | imported from 3GU |
| R5‑184383 | New feMTC test case 7.8.1EC Wide band intermodulation for UE category M2 | CAICT | imported from 3GU |
| R5‑184384 | Update of Annexes F.1.3 and F.3.3 | CAICT | imported from 3GU |
| R5‑184385 | Update of TC 6.6.2.3A.4 Adjacent Channel Leakage power Ratio for CA (3UL CA) | CAICT | imported from 3GU |
| R5‑184386 | WP UE Conformance Test Aspects - FDD operating band in the L-band for LTE | NTT DOCOMO, INC. | imported from 3GU |
| R5‑184387 | SR UE Conformance Test Aspects - FDD operating band in the L-band for LTE | NTT DOCOMO, INC. | imported from 3GU |
| R5‑184388 | Update of TC 6.6.3.1A.4 Transmitter Spurious emissions for CA ( 3UL CA) | CAICT | imported from 3GU |
| R5‑184389 | Addition of Band 74 information into TS 34.121-1 | NTT DOCOMO, INC. | imported from 3GU |
| R5‑184390 | Updates of Band 74 information about Tx test cases in TS 36.521-1 | NTT DOCOMO, INC. | imported from 3GU |
| R5‑184391 | WP - LTE_QMC_Streaming-UEConTest (UID-790051) | China Unicom | imported from 3GU |
| R5‑184392 | Updates of FR1 TRx MU in Annex F | NTT DOCOMO, INC. | imported from 3GU |
| R5‑184393 | Updates of 6.2.3.2 Test Frequency for CA_8A-27A | KT Corp. | imported from 3GU |
| R5‑184394 | Proposal on Test Tolerance table format in TS 38.521-1 Annex F | NTT DOCOMO, INC. | imported from 3GU |
| R5‑184395 | Updates of FR1 TRx TT in Annex F | NTT DOCOMO, INC. | imported from 3GU |
| R5‑184396 | New CA band combination CA_8A-27A - Updates of 7.3A Refsens | KT Corp. | imported from 3GU |
| R5‑184397 | Proposal on MU and TT table format in TS 38.521-2 | NTT DOCOMO, INC. | imported from 3GU |
| R5‑184398 | Updates of FR2 TRx MU and TT in Annex | NTT DOCOMO, INC. | imported from 3GU |
| R5‑184399 | New CA band combination CA_8A-27A - Updates of Table A.4.3.3.3-3 | KT Corp. | imported from 3GU |
| R5‑184400 | MU and TT of EN-DC test cases in TS 38.521-3 | NTT DOCOMO, INC. | imported from 3GU |
| R5‑184401 | New CA band combination CA_8A-27A - Updates of Table A.4.6.3-3 | KT Corp. | imported from 3GU |
| R5‑184402 | Addition of TRx MU and TT in TS 38.521-3 Annex | NTT DOCOMO, INC. | imported from 3GU |
| R5‑184403 | New test case 6.3.5FA.1 Power Control Absolute power tolerance for category NB1 and NB2/Power Class 6 | CAICT | imported from 3GU |
| R5‑184404 | Correction of 6.2.3.2 Test Frequency for CA_3A-27A | KT Corp. | imported from 3GU |
| R5‑184405 | New test case 6.3.5FA.2 Power Control Relative power tolerance for category NB1 and NB2/Power Class 6 | CAICT | imported from 3GU |
| R5‑184406 | New test case 6.3.5FA.3 Aggregate power control tolerance for category NB1 and NB2/Power Class 6 | CAICT | imported from 3GU |
| R5‑184407 | Discussion on the structure of Clause 7.3A Reference sensitivity for CA in TS 38.521-1 | CMCC, Huawei | imported from 3GU |
| R5‑184408 | Discussion on the structure of Clause 7.7A Spurious response for CA in TS 38.521-1 | CMCC, Huawei | imported from 3GU |
| R5‑184409 | Addition of TT analysis of V2X TC 12.2.1 | Huawei,HiSilicon, Anritsu, Rohde & Schwarz | imported from 3GU |
| R5‑184410 | Addition of TT analysis of V2X TC 12.2.2 | Huawei,HiSilicon, Anritsu, Rohde & Schwarz | imported from 3GU |
| R5‑184411 | Addition of TT analysis of V2X TC 12.4 | Huawei,HiSilicon, Anritsu, Rohde & Schwarz | imported from 3GU |
| R5‑184412 | Update to test case 6.5.2A.1.4 for 3UL CA | KTL | imported from 3GU |
| R5‑184413 | Update to test case 6.5.2A.2.4 for 3UL CA | KTL | imported from 3GU |
| R5‑184414 | Update to test case 6.5.2A.3.4 for 3UL CA | KTL | imported from 3GU |
| R5‑184415 | Update to test case 7.6.3A.8 and 7.8.1A.8 for 5DL CA | KTL | imported from 3GU |
| R5‑184416 | Cleanning up SDR test cases for 4CC and 5CC using UL RMC | KTL | imported from 3GU |
| R5‑184417 | Update to Performance test cases for LTE DL CA 4 Rx antenna ports | KTL | imported from 3GU |
| R5‑184418 | Update to test case 6.3.2G.1 for V2V services based on LTE sidelink | KTL | imported from 3GU |
| R5‑184419 | Update to test case 6.3.2G.2 for LTE-based V2X Services | KTL | imported from 3GU |
| R5‑184420 | Update to test case 6.3.2G.3 for LTE-based V2X Services | KTL | imported from 3GU |
| R5‑184421 | Update to RRM test case 8.16.70 and 8.16.74 for 5DL CA | KTL | imported from 3GU |
| R5‑184422 | Treatment of power supply cable for FR2 UE tests | Anritsu | imported from 3GU |
| R5‑184423 | Meeting notes of offline call on FR2 UE common test setup | Anritsu | imported from 3GU |
| R5‑184424 | Common test setup for FR2 measurement uncertainty estimation | Anritsu | imported from 3GU |
| R5‑184425 | Testability issue of maximum input level and ACS (case 2) in FR2 | Anritsu | imported from 3GU |
| R5‑184426 | Estimation of measurement uncertainty for FR2 TRx test cases | Anritsu | imported from 3GU |
| R5‑184427 | Removing brackets from MU values in FR2 | Anritsu | imported from 3GU |
| R5‑184428 | TP to remove editor's note on frequency range of Tx Spurious emission | Anritsu | imported from 3GU |
| R5‑184429 | Offset in quality of quiet zone evaluation | Anritsu | imported from 3GU |
| R5‑184430 | TP on common test setup in FR2 | Anritsu | imported from 3GU |
| R5‑184431 | Testability issue of low PSD test cases in FR2 | Anritsu | imported from 3GU |
| R5‑184432 | New WID for Rel-16 LTE CA | Ericsson | imported from 3GU |
| R5‑184433 | GCF 3GPP TCL after GCF CAG#55 | Ericsson | imported from 3GU |
| R5‑184434 | RAN5#80 summary of changes to RAN5 test cases with potential impact on GCF and PTCRB | Ericsson, Samsung | imported from 3GU |
| R5‑184435 | WP UE Conformance Test Aspects - Increasing the minimum number of carriers for UE monitoring in UTRA and E-UTRA | Ericsson | imported from 3GU |
| R5‑184436 | SR UE Conformance Test Aspects - Increasing the minimum number of carriers for UE monitoring in UTRA and E-UTRA | Ericsson | imported from 3GU |
| R5‑184437 | WP UE Conformance Test Aspects - Rel-13 CA configurations | Ericsson | imported from 3GU |
| R5‑184438 | SR UE Conformance Test Aspects - Rel-13 CA configurations | Ericsson | imported from 3GU |
| R5‑184439 | WP UE Conformance Test Aspects - Rel-14 CA configurations | Ericsson | imported from 3GU |
| R5‑184440 | SR UE Conformance Test Aspects - Rel-14 CA configurations | Ericsson | imported from 3GU |
| R5‑184441 | WP UE Conformance Test Aspects - Rel-15 CA configurations | Ericsson | imported from 3GU |
| R5‑184442 | SR UE Conformance Test Aspects - Rel-15 CA configurations | Ericsson | imported from 3GU |
| R5‑184443 | WP UE Conformance Test Aspects - 5G system with NR and LTE | Ericsson | imported from 3GU |
| R5‑184444 | SR UE Conformance Test Aspects - 5G system with NR and LTE | Ericsson | imported from 3GU |
| R5‑184445 | Update of RAN5 5G NR phases and target update RAN5#80 | Ericsson | imported from 3GU |
| R5‑184446 | Revised WID on: UE Conformance Test Aspects - 5G system with NR and LTE | Ericsson | imported from 3GU |
| R5‑184447 | 3GPP RAN5 CA status list (pre-RAN5#80 meeting) | Ericsson | imported from 3GU |
| R5‑184448 | 3GPP RAN5 CA status list (post-RAN5#80 meeting) | Ericsson | imported from 3GU |
| R5‑184449 | Discussion paper on principles for defining NR test frequencies and selecting associated parameters for SS to signal | Ericsson | imported from 3GU |
| R5‑184450 | Introduction of test frequencies for NR band n1 | Ericsson | imported from 3GU |
| R5‑184451 | Introduction of test frequencies for NR band n2 | Ericsson | imported from 3GU |
| R5‑184452 | Introduction of test frequencies for NR band n3 | Ericsson | imported from 3GU |
| R5‑184453 | Introduction of test frequencies for NR band n5 | Ericsson | imported from 3GU |
| R5‑184454 | Introduction of test frequencies for NR band n7 | Ericsson | imported from 3GU |
| R5‑184455 | Introduction of test frequencies for NR band n8 | Ericsson | imported from 3GU |
| R5‑184456 | Introduction of test frequencies for NR band n12 | Ericsson | imported from 3GU |
| R5‑184457 | Introduction of test frequencies for NR band n20 | Ericsson | imported from 3GU |
| R5‑184458 | Introduction of test frequencies for NR band n25 | Ericsson | imported from 3GU |
| R5‑184459 | Introduction of test frequencies for NR band n28 | Ericsson | imported from 3GU |
| R5‑184460 | Introduction of test frequencies for NR band n34 | Ericsson | imported from 3GU |
| R5‑184461 | Introduction of test frequencies for NR band n38 | Ericsson | imported from 3GU |
| R5‑184462 | Introduction of test frequencies for NR band n39 | Ericsson | imported from 3GU |
| R5‑184463 | Introduction of test frequencies for NR band n40 | Ericsson | imported from 3GU |
| R5‑184464 | Update of test frequencies for NR band n41 | Ericsson, Sprint | imported from 3GU |
| R5‑184465 | Introduction of test frequencies for NR band n51 | Ericsson | imported from 3GU |
| R5‑184466 | Introduction of test frequencies for NR band n66 | Ericsson, Dish Network | imported from 3GU |
| R5‑184467 | Introduction of test frequencies for NR band n70 | Ericsson, Dish Network | imported from 3GU |
| R5‑184468 | Update of test frequencies for NR band n71 | Ericsson, Dish Network | imported from 3GU |
| R5‑184469 | Introduction of test frequencies for NR band n75 | Ericsson | imported from 3GU |
| R5‑184470 | Introduction of test frequencies for NR band n76 | Ericsson | imported from 3GU |
| R5‑184471 | Introduction of test frequencies for NR band n77 | Ericsson | imported from 3GU |
| R5‑184472 | Introduction of test frequencies for NR band n78 | Ericsson | imported from 3GU |
| R5‑184473 | Introduction of test frequencies for NR band n79 | Ericsson | imported from 3GU |
| R5‑184474 | Introduction of test frequencies for NR band n257 | Ericsson | imported from 3GU |
| R5‑184475 | Introduction of test frequencies for NR band n258 | Ericsson | imported from 3GU |
| R5‑184476 | Introduction of test frequencies for NR band n260 | Ericsson, Bureau Veritas | imported from 3GU |
| R5‑184477 | Introduction of test frequencies for NR band n261 | Ericsson | imported from 3GU |
| R5‑184478 | Introduction of test frequencies for signalling testing in clause 6 | Ericsson | imported from 3GU |
| R5‑184479 | Update to FR1 test case 6.5.4 Transmit intermodulation | KTL | imported from 3GU |
| R5‑184480 | New test case 6.5.2.1FA.1 Error Vector Magnitude (EVM) for category NB1 and NB2/Power Class 6 | CAICT | imported from 3GU |
| R5‑184481 | New test case 6.5.2.2FA Carrier leakage for category NB1 and NB2/Power Class 6 | CAICT | imported from 3GU |
| R5‑184482 | New test case 6.5.2.3FA In-band emissions for non allocated RB for category NB1 and NB2/Power Class 6 | CAICT | imported from 3GU |
| R5‑184483 | Add and use reference to NG.108 | ROHDE & SCHWARZ, Qualcomm Incorporated | imported from 3GU |
| R5‑184484 | Proposal for remaining Maximum Test System Uncertainty for NR FR1 TRx tests | Anritsu, ROHDE & SCHWARZ | imported from 3GU |
| R5‑184485 | Test approach of EN-DC Rx tests with multiple LTE/NR CCs | Anritsu | imported from 3GU |
| R5‑184486 | Correction to power level for FR1 RF tests | Anritsu | imported from 3GU |
| R5‑184487 | Discussion on FR2 TRx spurious test procedure | Anritsu | imported from 3GU |
| R5‑184488 | Discussion on UL RMC for FR2 spurious test | Anritsu | imported from 3GU |
| R5‑184489 | Discussion on test point selection for NR Out-of-band in FR1 | CAICT | imported from 3GU |
| R5‑184490 | Introduction of TC 7.6.3 Out-of-band blocking | CAICT | imported from 3GU |
| R5‑184491 | Clean up EN-DC FR1 TRx TCs | Anritsu | imported from 3GU |
| R5‑184492 | Add Test Tolerance and Annex F for NAICS feature applicable in test case 8.3.1.1.7 and 8.3.2.1.8. | TEOCO | imported from 3GU |
| R5‑184493 | Correction of NB-IoT test case 22.5.20 | CATT, TDIA | imported from 3GU |
| R5‑184494 | Correction of NB-IoT test case 22.5.21 | CATT, TDIA | imported from 3GU |
| R5‑184495 | Addition of new 5GC TC 9.1.2.1 | CATT, TDIA | imported from 3GU |
| R5‑184496 | Addition of applicability and tests conditions for 5GC test cases 8.2.4.3.1.2, 8.2.4.3.1.3, 9.1.2.1 and 9.1.2.2 | CATT, TDIA | imported from 3GU |
| R5‑184497 | Discussion on Uplink configuration for NR Transmit Intermodulation in FR1 | KTL | imported from 3GU |
| R5‑184498 | Correction to 5GS RRC TC 8.2.4.3.1.1 | TDIA, CATT | imported from 3GU |
| R5‑184499 | Addition of 5GS RRC TC 8.2.4.3.1.2 | TDIA, CATT | imported from 3GU |
| R5‑184500 | Addition of new 5GS RRC TC 8.2.4.3.1.3 | TDIA, CATT | imported from 3GU |
| R5‑184501 | Addition to NB-IoT testcase 22.3.1.6a | TDIA, CATT, Starpoint | imported from 3GU |
| R5‑184502 | Addition of antenna diagrams for IncMon RRM test cases | Ericsson | imported from 3GU |
| R5‑184503 | Update of number of DL PDCP SDUs in test cases 7.1.7.1.x | MediaTek Inc. | imported from 3GU |
| R5‑184504 | Update of DL 256QAM TCs for high UE DL Categories | MediaTek Inc. | imported from 3GU |
| R5‑184505 | Correction to RRC TC 8.5.4.1 | MediaTek Inc. | imported from 3GU |
| R5‑184506 | Correction to RRC TC 8.5.4.3 | MediaTek Inc. | imported from 3GU |
| R5‑184507 | Correction to EMM TC 9.2.1.1.24 | MediaTek Inc. | imported from 3GU |
| R5‑184508 | Correction to ESM TC 10.5.4 | MediaTek Inc. | imported from 3GU |
| R5‑184509 | Handling on TT defining from MU in FR2 | NTT DOCOMO, INC. | imported from 3GU |
| R5‑184510 | Correction to CSFB TC 13.1.12 | MediaTek Inc. | imported from 3GU |
| R5‑184511 | Updates of receiver test cases for CA_XA-YE | NTT DOCOMO, INC. | imported from 3GU |
| R5‑184512 | Correction to applicability of TC 7.1.7.1.6a | MediaTek Inc. | imported from 3GU |
| R5‑184513 | Correction to applicability of DL 256QAM TCs | MediaTek Inc. | imported from 3GU |
| R5‑184514 | Editorial correction of referred table number | MediaTek Inc. | imported from 3GU |
| R5‑184515 | Addition of message content for RRM IncMon test cases | Ericsson | imported from 3GU |
| R5‑184516 | Updates of receiver test cases for CA_XA-YD | NTT DOCOMO, INC. | imported from 3GU |
| R5‑184517 | Correction to NR PDCP test case 7.1.3.4.2 | Keysight Technologies UK Ltd, MCC TF160 | imported from 3GU |
| R5‑184518 | Correction to NB-IoT test case 22.2.9 | ANRITSU LTD | imported from 3GU |
| R5‑184519 | Addition of applicability of RRM IncMon test cases | Ericsson | imported from 3GU |
| R5‑184520 | Corrections to Layer 2 test cases | Motorola Mobility | imported from 3GU |
| R5‑184521 | Corrections to MAC test case 7.1.2.2.1 | Motorola Mobility and MCC TF160 | imported from 3GU |
| R5‑184522 | Corrections to MAC test case 7.1.2.3.1 | Motorola Mobility and MCC TF160 | imported from 3GU |
| R5‑184523 | Corrections to MAC TBS test cases | Motorola Mobility | imported from 3GU |
| R5‑184524 | Addition of new MAC RACH test case for PDCCH order | Motorola Mobility | imported from 3GU |
| R5‑184525 | Addition of new MAC test case for Power Headroom report | Motorola Mobility | imported from 3GU |
| R5‑184526 | Addition of new MAC test case for Scell Activation Deactivation | Motorola Mobility | imported from 3GU |
| R5‑184527 | Addition of new MAC test case for Reset | Motorola Mobility | imported from 3GU |
| R5‑184528 | Addition of new MAC UL TBS test case with transform precoding configured | Motorola Mobility | imported from 3GU |
| R5‑184529 | WP UE Conformance Test Aspects – 5G System Non-3GPP Access | Motorola Mobility | imported from 3GU |
| R5‑184530 | SR UE Conformance Test Aspects – 5G System Non-3GPP Access | Motorola Mobility | imported from 3GU |
| R5‑184531 | Addition of missing and new test cases applicabilities | Motorola Mobility | imported from 3GU |
| R5‑184532 | Correction to testcase 9.2.2.1.9 for CAT-M1 UEs | ROHDE & SCHWARZ, Qualcomm Incorporated | imported from 3GU |
| R5‑184533 | PRD-17 on Guidance to Work Item Codes version 3.13 (post RAN#81 version) | Rapporteur (BlackBerry) | imported from 3GU |
| R5‑184534 | TS 36.523-1 Status before RAN5#80 | Rapporteur (BlackBerry) | imported from 3GU |
| R5‑184535 | TS 36.523-1 Status after RAN5#80 | Rapporteur (BlackBerry) | imported from 3GU |
| R5‑184536 | Correction to testcases 9.2.1.2.1c and 9.2.1.2.1d applicability conditions for CAT-M1 UEs | ROHDE & SCHWARZ, Qualcomm Incorporated | imported from 3GU |
| R5‑184537 | Proposal for Work Plans | BlackBerry | imported from 3GU |
| R5‑184538 | Correction to testcases 6.1.1.1, 6.1.1.1b and applicability conditions for CAT-M1 UEs | ROHDE & SCHWARZ, Qualcomm Incorporated | imported from 3GU |
| R5‑184539 | Update of DL256QAM RF test cases 7.4A.7_H,7.4A.8_H,8.7.1.1_H.4 and 8.7.1.1_H.5 | SRTC | imported from 3GU |
| R5‑184540 | Update MU and TT of V2X test case 6.5.1G.2 Frequency error for V2X Communication / Simultaneous E-UTRA V2X sidelink and E-UTRA uplink transmissions | CAICT | imported from 3GU |
| R5‑184541 | Correction to eMTC tc 6.2.2EA, UE Maximum Output Power for UE category M1 | Ericsson | imported from 3GU |
| R5‑184542 | Applicability for DL256QAM RF test cases 7.4A.7_H,7.4A.8_H,8.7.1.1_H.4 and 8.7.1.1_H.5 | SRTC | imported from 3GU |
| R5‑184543 | Correction to CAT-M1 Test case 8.2.4.27 | Anritsu Ltd., Nordic Semiconductor ASA | imported from 3GU |
| R5‑184544 | Update of V2X test case 6.7G.2 | SRTC | imported from 3GU |
| R5‑184545 | Addition of new TC 6.6.2.3G.2 | SRTC | imported from 3GU |
| R5‑184546 | Introduction of new V2X test case 6.5.2.1G.2 Error Vector Magnitude (EVM) for V2X Communication / Simultaneous E-UTRA V2X sidelink and E-UTRA uplink transmissions | CAICT | imported from 3GU |
| R5‑184547 | TS 36.523-1 Status after RAN5#80 | Rapporteur (BlackBerry) | imported from 3GU |
| R5‑184548 | Introduction of new V2X test case 6.5.2.1G.3 Error Vector Magnitude (EVM) for V2X Communication / Intra-band contiguous multi-carrier operation | CAICT | imported from 3GU |
| R5‑184549 | Correction to V2X TC 24.1.2, 24.1.16 & 24.1.19 | ROHDE & SCHWARZ, Qualcomm Incorporated | imported from 3GU |
| R5‑184550 | Draft TS 38.521-2 v0.6.0 | CAICT | imported from 3GU |
| R5‑184551 | Correction to MAC test cases with TB Size selection | ANRITSU LTD | imported from 3GU |
| R5‑184552 | Correction to default pre-test conditions for UM RLC test cases | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑184553 | Update of (NS_01/NS_17), (NS_03/NS_07), (NS_05/NS_01) and (NS_05/NS_17) TP analysis for A-MPR test case for inter-band UL CA | CETECOM GmbH | imported from 3GU |
| R5‑184554 | Correction of test points and test requirements for TC 6.2.4A.2 | CETECOM GmbH | imported from 3GU |
| R5‑184555 | Correction of test points and test requirements for TC 6.2.4A.2_1 | CETECOM GmbH | imported from 3GU |
| R5‑184556 | Addition of new UL 256QAM test case - A-MPR for 2UL CA intra-band contiguous | CETECOM GmbH | imported from 3GU |
| R5‑184557 | Addition of new UL 256QAM test case - A-MPR for 2UL CA inter-band | CETECOM GmbH | imported from 3GU |
| R5‑184558 | Addition of new UL 256QAM test case - Annex F | CETECOM GmbH | imported from 3GU |
| R5‑184559 | Updates to feMTC tc 6.2.2EC UE Maximum Output Power for UE category M2 | Ericsson | imported from 3GU |
| R5‑184560 | Introduce SA radio resource control information elements | Ericsson | imported from 3GU |
| R5‑184561 | WP - UE Conformance Test Aspects - eHST | CMCC | imported from 3GU |
| R5‑184562 | SR - eHST after RAN5#80 | CMCC | imported from 3GU |
| R5‑184563 | Add Clause 7.5B.1 into TS 38.521-3 | CMCC | imported from 3GU |
| R5‑184564 | Add Clause 7.5B.2 into TS 38.521-3 | CMCC | imported from 3GU |
| R5‑184565 | Add Clause 7.5B.3 into TS 38.521-3 | CMCC | imported from 3GU |
| R5‑184566 | Draft TS 36.579-7 v0.0.1 | Samsung | imported from 3GU |
| R5‑184567 | Draft TS 38.522 v1.0.1 | CMCC | imported from 3GU |
| R5‑184568 | OTA Chamber requirements for 5G NR Signalling test cases | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑184569 | Add Band 31 Test Frequencies for NB-IoT Inter-frequency Test cases | ANRITSU LTD | imported from 3GU |
| R5‑184570 | Corrections for 5MHz Channel BW in 4.2.19, 6.x.y and 7.3.x NB-IoT Test cases | ANRITSU LTD | imported from 3GU |
| R5‑184571 | Draft TS 36.579-6 v0.0.1 | Samsung | imported from 3GU |
| R5‑184572 | General clauses updated for TS38.521-1 | Bureau Veritas | imported from 3GU |
| R5‑184573 | DL and UL RMC updated for FR1 tests | Bureau Veritas | imported from 3GU |
| R5‑184574 | Downlink physical channel updated for FR1 tests | Huawei, Bureau Veritas | imported from 3GU |
| R5‑184575 | OCNG Patterns updated for FR1 tests | Bureau Veritas | imported from 3GU |
| R5‑184576 | DL and UL RMC updated for FR2 tests | Bureau Veritas | imported from 3GU |
| R5‑184577 | Downlink physical channel updated for FR2 tests | Bureau Veritas | imported from 3GU |
| R5‑184578 | OCNG Patterns updated for FR2 tests | Bureau Veritas | imported from 3GU |
| R5‑184579 | Updated EN-DC configuration information in clause 5 | Bureau Veritas | imported from 3GU |
| R5‑184580 | TIB value add for EN-DC band in 38.521-3 | Bureau Veritas | imported from 3GU |
| R5‑184581 | Applicability C20 updated for intra-band contigous DL CA tests | Bureau Veritas | imported from 3GU |
| R5‑184582 | Updated to Tested CA Configurations Selection Criteria | Bureau Veritas | imported from 3GU |
| R5‑184583 | Table format correct and removed redundant line for RF clause 7 test cases | Bureau Veritas | imported from 3GU |
| R5‑184584 | Table format correct and removed redundant line for RF clause 6 test cases | Bureau Veritas | imported from 3GU |
| R5‑184585 | Updated test requirement to RF clause 7 test cases for CA band | Bureau Veritas | imported from 3GU |
| R5‑184586 | Align CA information in clause 5 with TS36.101 v15.3.0 | Bureau Veritas | imported from 3GU |
| R5‑184587 | Addition of new R15 CA configurations to 36.521-2 | Bureau Veritas | imported from 3GU |
| R5‑184588 | Addition of new R15 CA configurations to 36.523-2 | Bureau Veritas, Ericsson | imported from 3GU |
| R5‑184589 | Addition of RRM IncMon new Test Case 8.4.8 | Ericsson | imported from 3GU |
| R5‑184590 | Addition of RRM IncMon new Test Case 8.4.9 | Ericsson | imported from 3GU |
| R5‑184591 | New NAS test case 9.1.5.1.12 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184592 | WP UE Conformance Test Aspects – enhanced Licensed-Assisted Access using LTE | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑184593 | New NAS test case 9.1.6.1.4 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184594 | SR UE Conformance Test Aspects – enhanced Licensed-Assisted Access using LTE | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑184595 | WID Update UE Conformance Test Aspects – enhanced Licensed-Assisted Access using LTE | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑184596 | Correction to NB-IoT test case 22.4.20a execution guideline | Anritsu Ltd, Qualcomm | imported from 3GU |
| R5‑184597 | Update IE PhysicalCellGroupConfig | Ericsson | imported from 3GU |
| R5‑184598 | Introduce cell configurations and timer tolerances chapter headers | Ericsson | imported from 3GU |
| R5‑184599 | Add IE SS-RSSI-Measurement | Ericsson | imported from 3GU |
| R5‑184600 | Add IE SSB-MTC | Ericsson | imported from 3GU |
| R5‑184601 | Introduction of new test case TC 6.2.5A.4 Configured UE transmitted Output Power for CA (3UL CA) | 7LAYERS GmbH | imported from 3GU |
| R5‑184602 | Introduction of new test case TC 6.6.2.1A.4^^Spectrum emission mask for CA (3UL CA) | 7LAYERS GmbH | imported from 3GU |
| R5‑184603 | Correction to NR PDCP test case 7.1.3.5.1 | ANRITSU LTD | imported from 3GU |
| R5‑184604 | Introduction of new test case TC 6.6.2.2A.4^^Additional Spectrum Emission Mask for CA (3UL CA) | 7LAYERS GmbH | imported from 3GU |
| R5‑184605 | Update of test case TC 6.6.1A.4 “Occupied bandwidth for CA (3DL CA and 3UL CA)” | 7LAYERS GmbH | imported from 3GU |
| R5‑184606 | Update of test case TC 6.7A.4 "Transmit intermodulation for CA (3DL CA and 3UL CA)" | 7LAYERS GmbH | imported from 3GU |
| R5‑184607 | Draft TS 36.579-6 v0.0.2 | NIST | imported from 3GU |
| R5‑184608 | Draft TS 36.579-7 v0.0.2 | NIST | imported from 3GU |
| R5‑184609 | SR - UE Conformance Test Aspects - Mission Critical Improvements (UID - 790052) MCImp-UEConTest | NIST | imported from 3GU |
| R5‑184610 | WP - UE Conformance Test Aspects - Mission Critical Improvements (UID - 790052) MCImp-UEConTest.doc | NIST | imported from 3GU |
| R5‑184611 | New Test Case for 36.579-6 - 6.1.1.8 | NIST | imported from 3GU |
| R5‑184612 | Correction to NR RLC test case 7.1.2.3.3 and 7.1.2.3.4 | ANRITSU LTD | imported from 3GU |
| R5‑184613 | Addition of RRC Default Pre-test conditions for NSA | Qualcomm Korea | imported from 3GU |
| R5‑184614 | Updates to EN-DC Conditions for Multi-PDN addition throughout Test Case | Qualcomm Korea | imported from 3GU |
| R5‑184615 | CR of Correct handling of DL assignment / Semi-persistent test case 7.1.1.6.1 | Huawei, Hisilicon | imported from 3GU |
| R5‑184616 | Update BWP | DOCOMO Communications Lab, Ericsson | imported from 3GU |
| R5‑184617 | Update MIB | DOCOMO Communications Lab. | imported from 3GU |
| R5‑184618 | Update PDSCH-Config | DOCOMO Communications Lab. | imported from 3GU |
| R5‑184619 | Update PhysicalCellGroupConfig | DOCOMO Communications Lab. | imported from 3GU |
| R5‑184620 | Update PUCCH and PUSCH configuration | DOCOMO Communications Lab. | imported from 3GU |
| R5‑184621 | Update RACH configuration | DOCOMO Communications Lab. | imported from 3GU |
| R5‑184622 | Update SearchSpace | DOCOMO Communications Lab. | imported from 3GU |
| R5‑184623 | Update CellGroupConfig | DOCOMO Communications Lab. | imported from 3GU |
| R5‑184624 | Update CSI-MeasConfig | DOCOMO Communications Lab. | imported from 3GU |
| R5‑184625 | Update MeasConfig | DOCOMO Communications Lab. | imported from 3GU |
| R5‑184626 | Update other information elements | DOCOMO Communications Lab. | imported from 3GU |
| R5‑184627 | Update PDCCH-Config | DOCOMO Communications Lab. | imported from 3GU |
| R5‑184628 | Update RadioBearerConfig | DOCOMO Communications Lab. | imported from 3GU |
| R5‑184629 | Update ServingCellConfig | DOCOMO Communications Lab. | imported from 3GU |
| R5‑184630 | Editorial Update in clause 4.6.3 | DOCOMO Communications Lab. | imported from 3GU |
| R5‑184631 | Adding TC 13.1.21 for emergency call via CS domain | DOCOMO Communications Lab. | imported from 3GU |
| R5‑184632 | Addition of new V2X test case 24.2.4 | CAICT | imported from 3GU |
| R5‑184633 | Addition of new applicability of emergency call via CS domain TC for IMS capable UE | DOCOMO Communications Lab. | imported from 3GU |
| R5‑184634 | Correction to FR2 Spurious TC and inroduction of TRP measurement grid requirement | Anritsu | imported from 3GU |
| R5‑184635 | Emergency call via CS domain TC in case of IMS voice not available | DOCOMO Communications Lab. | imported from 3GU |
| R5‑184636 | Correction to V2X test case 24.1.12 | CAICT | imported from 3GU |
| R5‑184637 | Addition of test applicability for new V2X TC24.2.4 and Specific ICS for V2X TC24.2.1 and TC24.2.2 | CAICT | imported from 3GU |
| R5‑184638 | CA_1A-3A-26A(1UL) - Updates of test points analysis | KDDI Corporation | imported from 3GU |
| R5‑184639 | CA_1A-3A-26A(1UL) –Updates of 7.3A.5 REFSENS | KDDI Corporation | imported from 3GU |
| R5‑184640 | Introduction of Additional spurious emissions for UL 256QAM | TTA | imported from 3GU |
| R5‑184641 | CA_3A-18A - Updates of test points analysis | KDDI Corporation | imported from 3GU |
| R5‑184642 | CA_3A-18A - Updates of some Tx test cases | KDDI Corporation | imported from 3GU |
| R5‑184643 | Addition of applicability for TC6.6.3.3_2 | TTA | imported from 3GU |
| R5‑184644 | Editorial: Cleaning up the style of Annex B.4.1A in TS 36.521-1 | TTA | imported from 3GU |
| R5‑184645 | CA_3A-18A and 1A-3A-18A - Updates of A.4.6.3 | KDDI Corporation | imported from 3GU |
| R5‑184646 | Introduction of FDD PDSCH Single-layer Spatial Multiplexing for FD-MIMO | TTA | imported from 3GU |
| R5‑184647 | Correction of test requirements in 7.3.5A REFSENSE | KDDI Corporation | imported from 3GU |
| R5‑184648 | Introduction of TDD PDSCH Single-layer Spatial Multiplexing for FD-MIMO | TTA | imported from 3GU |
| R5‑184649 | Applicabilities addition of test cases 8.3.1.1.9 and 8.3.2.1.10 | TTA | imported from 3GU |
| R5‑184650 | Editorial correction of Table 7.6.3A.5.4.1-1 | KDDI Corporation | imported from 3GU |
| R5‑184651 | Update of TC8.12.1.1.3 | TTA | imported from 3GU |
| R5‑184652 | Correction to V2X test case 24.1.1, 24.1.3, 24.1.5, 24.1.6, 24.1.10 and 24.1.11 | CAICT | imported from 3GU |
| R5‑184653 | Update of Additional Maximum Power Reduction (A-MPR) for V2X Communication / Non-concurrent with E-UTRA uplink transmissions | LG Electronics | imported from 3GU |
| R5‑184654 | Update to applicability V2X communication test cases for simultaneous E-UTRA V2X sidelink and E-UTRA uplink transmissions | LG Electronics | imported from 3GU |
| R5‑184655 | Update to Additional Maximum Power Reduction (A-MPR) for V2X Communication / Simultaneous E-UTRA V2X sidelink and E-UTRA uplink transmissions | LG Electronics | imported from 3GU |
| R5‑184656 | Update to Configured UE transmitted Output Power for V2X Communication / Simultaneous E-UTRA V2X sidelink and E-UTRA uplink transmission | LG Electronics | imported from 3GU |
| R5‑184657 | Update to UE Transmit OFF power for V2X Communication / Simultaneous E-UTRA V2X sidelink and E-UTRA uplink transmissions | LG Electronics. | imported from 3GU |
| R5‑184658 | Update to General ON/OFF time mask for V2X Communication / Simultaneous E-UTRA V2X sidelink and E-UTRA uplink transmissions | LG Electronics. | imported from 3GU |
| R5‑184659 | Draft TS 38.521-3 v0.6.0 | Qualcomm Wireless GmbH | imported from 3GU |
| R5‑184660 | Update to Maximum Power Reduction (MPR) for V2X Communication / Power class 3 / Contiguous allocation of PSCCH and PSSCH / Non-concurrent with E-UTRA uplink transmissions | LG Electronics. | imported from 3GU |
| R5‑184661 | Corrections to RRC TC - Measurement configuration control and reporting / Inter-RAT measurements / Event B2 / Measurement of NR cells / EN-DC | Intertek | imported from 3GU |
| R5‑184662 | Update to Annex G for V2V/V2X Demod Perf tests | Qualcomm Wireless GmbH | imported from 3GU |
| R5‑184663 | Corrections to MCPTT Authorization | MCC TF160 | imported from 3GU |
| R5‑184664 | Default channel bandwidth of new NR bands for non-CA signaling test cases | DOCOMO Communications Lab., KDDI Corporation, KT Corp. | imported from 3GU |
| R5‑184665 | Flexible loop nest for FR2 TRx tests | Anritsu | imported from 3GU |
| R5‑184666 | MCPTT Client test cases: open issues in prose | MCC TF160 | imported from 3GU |
| R5‑184667 | Correction to LAA inter-frequency event-triggered reporting test cases | Qualcomm Wireless GmbH | imported from 3GU |
| R5‑184668 | Editorial correction of reference document | Intertek | imported from 3GU |
| R5‑184669 | Clarification on frame structure in 4Rx performance and CSI test principles sections | Qualcomm Wireless GmbH | imported from 3GU |
| R5‑184670 | CR of of AM RLC test case 7.1.2.3.10 | Huawei, Hisilicon | imported from 3GU |
| R5‑184671 | Update of References in Section 2 of 38.521-3 spec | Qualcomm Wireless GmbH | imported from 3GU |
| R5‑184672 | Updates to Operating Bands in Section 5.2 | Qualcomm Wireless GmbH | imported from 3GU |
| R5‑184673 | Editorial updates to 38.509 | Samsung, MCC TF160 | imported from 3GU |
| R5‑184674 | Specifying content for SCGFailureInformationNR | Samsung | imported from 3GU |
| R5‑184675 | Specifying content for MeasResultSCG-Failure | Samsung | imported from 3GU |
| R5‑184676 | Update of RRC SCG failure TC 8.2.5.1.1 | Samsung, Qualcomm | imported from 3GU |
| R5‑184677 | Update of RRC SCG failure TC 8.2.5.2.1 | Samsung, Qualcomm | imported from 3GU |
| R5‑184678 | Update of RRC SCG failure TC 8.2.5.3.1 | Samsung, Qualcomm | imported from 3GU |
| R5‑184679 | Update of RRC SCG failure TC 8.2.5.4.1 | Samsung, Qualcomm | imported from 3GU |
| R5‑184680 | Update of RRC SCG failure TC 8.2.5.5.1 | Samsung, Qualcomm | imported from 3GU |
| R5‑184681 | Update of RRC SCG failure TC 8.2.5.6.1 | Samsung, Qualcomm | imported from 3GU |
| R5‑184682 | Update of test case title for TC 8.2.5.1.1 | Samsung | imported from 3GU |
| R5‑184683 | 5G work planning after RAN5#80 | Samsung | imported from 3GU |
| R5‑184684 | Update of PRD13 | Samsung | imported from 3GU |
| R5‑184685 | Update of default message contents for new Rel-14 TCs for Private Call Call-Back and Ambient listening call | Samsung | imported from 3GU |
| R5‑184686 | Adding a new Rel-14 TC on Private Call Call-Back Request / Client Originated (CO) / Private call call-back fulfilment | Samsung | imported from 3GU |
| R5‑184687 | Adding a new Rel-14 TC on Private Call Call-Back Request / Client Terminated (CT) / Private call call-back fulfilment | Samsung | imported from 3GU |
| R5‑184688 | Adding a new Rel-14 TC on Private Call / Remotely initiated Ambient listening call Client Originated (CO) | Samsung | imported from 3GU |
| R5‑184689 | Adding a new Rel-14 TC on Private Call / Remotely initiated Ambient listening call Client Terminated (CT) | Samsung | imported from 3GU |
| R5‑184690 | Adding a new Rel-14 TC on Private Call / Locally initiated Ambient listening call / Client Originated (CO) | Samsung | imported from 3GU |
| R5‑184691 | Adding a new Rel-14 TC on Private Call / Locally initiated Ambient listening call / Client Terminated (CT) | Samsung | imported from 3GU |
| R5‑184692 | Editorial updates to 36.579-2 Rel-13 TCs | Samsung | imported from 3GU |
| R5‑184693 | Adding applicability for new MCPTT Rel-14 TCs | Samsung | imported from 3GU |
| R5‑184694 | eLAA: Updates to Adjacent Channel Leakage power Ratio for CA | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑184695 | Resubmission of update of TC8.13.3.6.1 and 8.13.3.6.2 | ETSI MCC (TTA) | imported from 3GU |
| R5‑184696 | EN-DC Test Model: Addition of further aspects | MCC TF160 | imported from 3GU |
| R5‑184697 | New UL 256QAM test case: 6.6.2.2_2 Additional Spectrum Emission Mask for UL 256QAM | Ericsson | imported from 3GU |
| R5‑184698 | Applicability for New UL 256QAM test cases: 6.6.2.2_2 and 6.6.2.3A.3_2 | Ericsson | imported from 3GU |
| R5‑184699 | Addition of PICS | Motorola Mobility | imported from 3GU |
| R5‑184700 | Addition of Test Loop for SDAP testing | Motorola Mobility | imported from 3GU |
| R5‑184701 | Addition of RLC Config for UM | Motorola Mobility | imported from 3GU |
| R5‑184702 | Addition of 5GS NR SDAP test case 7.1.4.2 | Motorola Mobility | imported from 3GU |
| R5‑184703 | MU budget for EIRP/TRP measurements with Near Field test range at mmWave | MVG Industries | imported from 3GU |
| R5‑184704 | Update to IMS eCall test cases for eCall category bit usage | Qualcomm Incorporated | imported from 3GU |
| R5‑184705 | Update to Emergency Call test case 19.1.3 for eCall category bit usage | Qualcomm Incorporated | imported from 3GU |
| R5‑184706 | Editorial correction to band representation of non-contiguous EN-DC band combination | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑184707 | Update of EMM test case 9.2.1.1.1b | Qualcomm Incorporated | imported from 3GU |
| R5‑184708 | Update of EMM test case 9.2.1.1.22 | Qualcomm Incorporated, Anritsu | imported from 3GU |
| R5‑184709 | Update of EMM test case 9.2.3.2.17 | Qualcomm Incorporated | imported from 3GU |
| R5‑184710 | Update of eMBMS test cases for UEs supporting AT command for eMBMS service activation | Qualcomm Incorporated | imported from 3GU |
| R5‑184711 | Update to NB-IOT test case 22.1.1 M2 | Qualcomm Incorporated, Anritsu, Rohde & Schwarz | imported from 3GU |
| R5‑184712 | Update to NB-IOT test case 22.3.1.2 | Qualcomm Incorporated | imported from 3GU |
| R5‑184713 | Correction to RLC-Config IE | Ericsson | imported from 3GU |
| R5‑184714 | Correction to RadioBearerConfig-DRB | Ericsson | imported from 3GU |
| R5‑184715 | Corrections ard updates to BandCombinationList and Feature Set IEs | Ericsson | imported from 3GU |
| R5‑184716 | Addition of RRM IncMon new Test Case 8.5.8 | Ericsson | imported from 3GU |
| R5‑184717 | Addition of RRM IncMon new Test Case 8.6.3 | Ericsson | imported from 3GU |
| R5‑184718 | Addition of RRM IncMon new Test Case 8.7.5 | Ericsson | imported from 3GU |
| R5‑184719 | Addition of RRM IncMon new Test Case 8.7A.1 | Ericsson | imported from 3GU |
| R5‑184720 | Addition of RRM IncMon new Test Cases 4.2.1 and 4.2.11 | Ericsson | imported from 3GU |
| R5‑184721 | Addition of RRM IncMon new Test Case 4.3.1.5 | Ericsson | imported from 3GU |
| R5‑184722 | Addition of RRM IncMon new Test Case 4.3.2A | Ericsson | imported from 3GU |
| R5‑184723 | Addition of RRM IncMon new Test Case 4.3.3A | Ericsson | imported from 3GU |
| R5‑184724 | Addition of RRM IncMon new Test Case 4.3.4.4 | Ericsson | imported from 3GU |
| R5‑184725 | Applicability for New UL 256QAM test cases: 6.6.2.2_2 and 6.6.2.3A.3_2 | Ericsson | imported from 3GU |
| R5‑184726 | Removal of 1xPre-Registation 8.4.7.x test cases | Qualcomm Incorporated | imported from 3GU |
| R5‑184727 | Removal of Multi-Layer 1xPre-Registation 13.4.4.x and 1xCSFB 13.1.xx test cases | Qualcomm Incorporated | imported from 3GU |
| R5‑184728 | Update of TC7.6.2G.1 Out-of-band blocking for V2X Communication | CAICT | imported from 3GU |
| R5‑184729 | Update of TC 7.8.1G.1 Wide band Intermodulation for V2X | CAICT | imported from 3GU |
| R5‑184730 | Correction to Inter-RAT absolute priority based reselection test cases | Qualcomm Incorporated | imported from 3GU |
| R5‑184731 | Update to applicability condition of test case 11.2.3 to include CSG PICS | Qualcomm Incorporated | imported from 3GU |
| R5‑184732 | Update to applicability condition of Intra-frequency measurement reporting test cases for CAT-M1 UEs | Qualcomm Incorporated | imported from 3GU |
| R5‑184733 | Update of TC7.9G Spurious emissions for V2X | CAICT | imported from 3GU |
| R5‑184734 | Update to applicability condition of Test case 6.1.1.7a for CAT-M1 UEs | Qualcomm Incorporated, Rohde & Schwarz | imported from 3GU |
| R5‑184735 | Removal of 1xPre-Registation and 1xCSFB test cases applicability | Qualcomm Incorporated | imported from 3GU |
| R5‑184736 | Introduce Intra frequency handover for Cat-M2 UEs in CEModeA | Bureau Veritas | imported from 3GU |
| R5‑184737 | Dual uplink interferer updated to 38.521-3 | Bureau Veritas | imported from 3GU |
| R5‑184738 | pCR Adding MU values for EIRPTRP measurements with Near Field test range at mmWave | MVG Industries | imported from 3GU |
| R5‑184739 | Update of UE test loop mode E | Huawei,HiSilicon, CATT | imported from 3GU |
| R5‑184740 | Update of multiple V2V RF test cases for proper test mode setting | Huawei,HiSilicon | imported from 3GU |
| R5‑184741 | Discussion on starting point of 200ms in FR1 RF test procedures | Huawei,HiSilicon, Keysight | imported from 3GU |
| R5‑184742 | Update of FR2 test case 6.3.1 | Huawei,HiSilicon | imported from 3GU |
| R5‑184743 | Update of FR2 test case 6.3.3.2 | Huawei,HiSilicon | imported from 3GU |
| R5‑184744 | Addition of 6.2B.4.1.1 Configured OP for Intra-Band Contiguous EN-DC | Huawei,HiSilicon | imported from 3GU |
| R5‑184745 | Addition of 6.2B.4.1.2 Configured OP for Intra-Band Non-Contiguous EN-DC | Huawei,HiSilicon | imported from 3GU |
| R5‑184746 | Addition of 6.2B.4.1.3 Configured OP for Intre-Band within FR1 | Huawei,HiSilicon | imported from 3GU |
| R5‑184747 | Addition of 6.2B.4.1.4 Configured OP for Inter-Band EN-DC including FR2 | Huawei,HiSilicon | imported from 3GU |
| R5‑184748 | Addition of 6.2B.4.1.5 Configured OP for Inter-Band EN-DC including both FR1 and FR2 | Huawei,HiSilicon | imported from 3GU |
| R5‑184749 | Revised WID- Support for V2X services | Huawei | imported from 3GU |
| R5‑184750 | Draft TR 38.905-1 v0.3.0 | Ericsson LM | imported from 3GU |
| R5‑184751 | TP for updating TR38.905 with FR1 AMPR test point analyses with NS_35 | Ericsson LM | imported from 3GU |
| R5‑184752 | Discussion on test point selection for NS_35 A-MPR in FR1 | Ericsson LM | imported from 3GU |
| R5‑184753 | Update of NR test cases title and applicability | Qualcomm Incorporated | imported from 3GU |
| R5‑184754 | TP for updating test case 6.2.3 UE AMPR | Ericsson LM | imported from 3GU |
| R5‑184755 | TP for updating test case 6.5.2.3 Additional spectrum emission mask | Ericsson LM | imported from 3GU |
| R5‑184756 | Correction to RRC TC - Measurement configuration control and reporting / Event A1 / Measurement of NR PSCell / EN-DC | Qualcomm Incorporated | imported from 3GU |
| R5‑184757 | TP for updating test case 6.2B.3.1 UE AMPR for Intra-band contigous EN-DC | Ericsson LM | imported from 3GU |
| R5‑184758 | TP for updating test case 6.2B.3.2 UE AMPR for Intra-band non-contigous EN-DC | Ericsson LM | imported from 3GU |
| R5‑184759 | TP for updating test case 6.5B.2.1.2 Additional spectrum emission mask for intra-band contigous EN-DC | Ericsson LM | imported from 3GU |
| R5‑184760 | Correction to RRC TC - PSCell addition, modification and release / Split DRB / EN-DC | Qualcomm Incorporated | imported from 3GU |
| R5‑184761 | Correction to RRC TC - Measurement configuration control and reporting / Inter-RAT measurements / Periodic reporting / Measurement of NR cells / EN-DC | Qualcomm Incorporated | imported from 3GU |
| R5‑184762 | Aligning CA delta TiB in sub-clause 6.2.5.3 with TS 36.101 v15.3.0 | Ericsson LM | imported from 3GU |
| R5‑184763 | Correction to RRC TC - Measurement configuration control and reporting / Inter-RAT measurements / Event B1 / Measurement of NR cells / RSRQ based measurements / EN-DC | Qualcomm Incorporated | imported from 3GU |
| R5‑184764 | Aligning CA delta RiB in sub-clause 7.3.3 with TS 36.101 v15.3.0 | Ericsson LM | imported from 3GU |
| R5‑184765 | Introduction CA_3A-7A-20A-32A 4DL/1UL to Annex A | Ericsson LM | imported from 3GU |
| R5‑184766 | Optimization of test configuration table for Rx CA test cases | NTT DOCOMO, INC. | imported from 3GU |
| R5‑184767 | Updates to NAS test case 10.2.1.2 | Ericsson LM | imported from 3GU |
| R5‑184768 | Update of 5GS NR RRC test case 8.2.2.6.1 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184769 | Update of 5GS NR RRC test case 8.2.2.6.1 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184770 | Update of 5GS NR RRC test case 8.2.3.6.1 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184771 | Addition of test frequencies for CA_66A-71A, CA_66C-71A, CA_70A-71A, CA_70C-71A to 36.508 | WE Certification Oy, DISH Network | imported from 3GU |
| R5‑184772 | Addition of new 5GC TC 9.1.2.2 | CATT, TDIA | imported from 3GU |
| R5‑184773 | RF TP analysis for CA_66A-66A-70C-71A, CA_66A-66A-70A-71A, CA_66A-70C-71A, CA_66A-70A-71A, CA_66A-66A-71A, CA_70A-71A, CA_66A-71A, CA_66C-70C-71A, CA_66C-70A-71A, CA_70C-71A, CA_66C-71A | WE Certification Oy, DISH Network | imported from 3GU |
| R5‑184774 | Update of 5GS NR RRC test case 8.2.3.8.1 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184775 | Reference sensitivity requirements for CA_66A-66A-70C-71A, CA_66A-66A-70A-71A, CA_66A-70C-71A, CA_66A-70A-71A, CA_66A-66A-71A, CA_70A-71A, CA_66A-71A, CA_66C-70C-71A, CA_66C-70A-71A, CA_70C-71A, CA_66C-71A | WE Certification Oy, DISH Network | imported from 3GU |
| R5‑184776 | Updates to Align Initial Conditions with Other V2X Test Cases | PCTEST Engineering Lab | imported from 3GU |
| R5‑184777 | Update of 5GS NR RRC test case 8.2.1.1.1 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184778 | Updates to Align the GNSS Moving Scenario Details with Other V2X Test Cases | PCTEST Engineering Lab | imported from 3GU |
| R5‑184779 | Update to A.2.1 for Test eCall Request-URI | Qualcomm Incorporated | imported from 3GU |
| R5‑184780 | Update of applicability and tests conditions for NB_IOT enhancement test cases | CATT, TDIA, Starpoint | imported from 3GU |
| R5‑184781 | Update to IMS eCall test case 11.3.2 | Qualcomm Incorporated | imported from 3GU |
| R5‑184782 | Update to IMS eCall test case 11.3.6 | Qualcomm Incorporated | imported from 3GU |
| R5‑184783 | Introduce 5GMM messages | Ericsson | imported from 3GU |
| R5‑184784 | Addition of new NB_IOTenh-UEConTest test case 22.3.1.8 | CATT, TDIA, Starpoint | imported from 3GU |
| R5‑184785 | Introduce 5GSM messages | Ericsson | imported from 3GU |
| R5‑184786 | Addition of new NB_IOTenh-UEConTest test case 22.3.1.9 | CATT, TDIA, Starpoint | imported from 3GU |
| R5‑184787 | Addition of new NB_IOTenh-UEConTest test case 22.3.1.10 | CATT, TDIA, Starpoint | imported from 3GU |
| R5‑184788 | Addition of new NB_IOTenh-UEConTest test case 22.4.24 | CATT, TDIA, Starpoint | imported from 3GU |
| R5‑184789 | Addition of new NB_IOTenh-UEConTest test case 22.4.25 | CATT, TDIA, Starpoint | imported from 3GU |
| R5‑184790 | Addition of new NB_IOTenh-UEConTest test case 22.4.25 | CATT, TDIA, Starpoint | imported from 3GU |
| R5‑184791 | Addition of NB_IOTenh-UEConTest test case scenarios and default SIB content | CATT, TDIA, Starpoint | imported from 3GU |
| R5‑184792 | Addition of reference dedicated EPS bearer context #7 for V2X testing | CATT | imported from 3GU |
| R5‑184793 | Remove test step 0 in test case 24.1.15 | CATT | imported from 3GU |
| R5‑184794 | Remove test step 0 in test case 24.1.18 | CATT | imported from 3GU |
| R5‑184795 | Correction on V2X Sidelink test case 24.3.1 | CATT | imported from 3GU |
| R5‑184796 | Update Table 24.3.3.3.3-1 in test case 24.3.3 | CATT | imported from 3GU |
| R5‑184797 | Clarification for chapter 8 & 9 general sections | Rohde & Schwarz | imported from 3GU |
| R5‑184798 | Corrections to 4Rx demodulation TCs | Rohde & Schwarz | imported from 3GU |
| R5‑184799 | Corrections to A-MPR values for NS_27 | Rohde & Schwarz | imported from 3GU |
| R5‑184800 | Update to test point analysis for NS_27 | Rohde & Schwarz | imported from 3GU |
| R5‑184801 | Discussion on UE device size for FR2 | Rohde & Schwarz | imported from 3GU |
| R5‑184802 | Discussion on treatment of multi-panel UEs | Rohde & Schwarz | imported from 3GU |
| R5‑184803 | Discussion on Test Tolerance for FR2 | Intel Corporation (UK) Ltd, Apple Inc. | imported from 3GU |
| R5‑184804 | Discussion on TT for Max Output Power TC Requirements for FR2 | Intel Corporation (UK) Ltd, Apple Inc. | imported from 3GU |
| R5‑184805 | Discussion on SIG testcase optimization of 5GC | CATT | imported from 3GU |
| R5‑184806 | Mid test CH BW for n71 | Dish Network | imported from 3GU |
| R5‑184807 | Correction to NB-IoT testcase 22.3.3.5 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184808 | Correction to band selection criteria applicability for HPUE devices that support Power Class 1 & 2 | Intel Corporation (UK) Ltd | imported from 3GU |
| R5‑184809 | Correction to Applicability Condition of TS 36.521-1 Test Cases 6.6.2.2A.1 and 6.6.3.3A.1 | Intel Corporation (UK) Ltd | imported from 3GU |
| R5‑184810 | FR2_UE_BeamlockInvoke_38.521-3 | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑184811 | Correction to Note 1 of Table 7.3A.0-0bB Reference sensitivity level for CA | Intel Corporation (UK) Ltd | imported from 3GU |
| R5‑184812 | Correction to Power Control for CA Test Procedure of TCs 6.3.5A.1.1, 6.3.5A.1.2 and 6.3.5A.1.4 | Intel Corporation (UK) Ltd | imported from 3GU |
| R5‑184813 | New test case for V2X Sidelink using Tx parameters based on measured CBR and PPPP | Sporton, TTA | imported from 3GU |
| R5‑184814 | Addition of test applicability for new V2X TC 24.1.13 | Sporton | imported from 3GU |
| R5‑184815 | New test case for NB-IoT UM RLC | Sporton, TTA | imported from 3GU |
| R5‑184816 | Addition of applicability and tests conditions for new Enhancements NB-IoT TC 24.1.13 | Sporton | imported from 3GU |
| R5‑184817 | Making Measurement Uncertainty Terms Common between methods in TR 38.90 | MVG Industries | imported from 3GU |
| R5‑184818 | Correction to Message Content for TC 6.2.4EA^^ A-MPR for UE Category M1 | Intel Corporation (UK) Ltd | imported from 3GU |
| R5‑184819 | pCR Making Measurement Uncertainty Terms Common between methods in TR 38.90 | MVG Industries | imported from 3GU |
| R5‑184820 | Addition of default laa-SCellConfiguration setting for eLAA | Huawei, MCC TF160 | imported from 3GU |
| R5‑184821 | Inter-band con-current V2X configurations- Updates of test points analysis | Huawei, Hisilicon | imported from 3GU |
| R5‑184822 | Addition of notes for half pi-BPSK test applicability | Huawei, Hisilicon | imported from 3GU |
| R5‑184823 | Introduction of 6.2C.1 Configured transmitted power for SUL | Huawei, Hisilicon | imported from 3GU |
| R5‑184824 | Addition of Uplink Physical Channels in Annex | Huawei, Hisilicon | imported from 3GU |
| R5‑184825 | Addition of downlink physicanl channels in annex | Huawei, Hisilicon | imported from 3GU |
| R5‑184826 | Update of TC 6.2B.1.1 | Huawei, Hisilicon | imported from 3GU |
| R5‑184827 | Introduction of TC 6.2B.1.2 | Huawei, Hisilicon | imported from 3GU |
| R5‑184828 | Update of 6.2B.1.3 | Huawei, Hisilicon | imported from 3GU |
| R5‑184829 | Introduction of TC 7.4B.1 | Huawei, Hisilicon | imported from 3GU |
| R5‑184830 | Introduction of 7.4B.2 | Huawei, Hisilicon | imported from 3GU |
| R5‑184831 | Introduction of 7.4B.3 | Huawei, Hisilicon | imported from 3GU |
| R5‑184832 | Addition of Test point and test requirements for CA_3A-41A, 41A-42A,3A-42A spurious test cases | Huawei, Hisilicon | imported from 3GU |
| R5‑184833 | Test point and test requirements analysis for CA_3A-41A, 41A-42A,3A-42A spurious test cases | Huawei, Hisilicon | imported from 3GU |
| R5‑184834 | Discussion on the test applicability for the modulation of Pi/2-BPSK | Huawei, Hisilicon | imported from 3GU |
| R5‑184835 | Discussion on test point selection for Configured transmitted power for SUL test case in FR1 | Huawei, Hisilicon | imported from 3GU |
| R5‑184836 | Correction to Reference sensitivity level for CA UL Allocation in Table 7.3A.1.4.1-1 | Intel Corporation (UK) Ltd | imported from 3GU |
| R5‑184837 | Test Point analysis for FR1 Configured Output Power for SUL | Huawei,HiSilicon | imported from 3GU |
| R5‑184838 | Addition of new CA band combination – Updates of test points analysis | SGS Wireless | imported from 3GU |
| R5‑184839 | Update of TDD PDSCH Closed Loop Multi Layer Multiplexing 4x2 for CA (5DL CA) | SGS Wireless | imported from 3GU |
| R5‑184840 | Update of TX Minimum Ouput Power for CA (3UL CA) | SGS Wireless | imported from 3GU |
| R5‑184841 | Introduction of Additional Maximum Power Reduction (A-MPR) for CA (3UL CA) | SGS Wireless | imported from 3GU |
| R5‑184842 | Introduction of Maximum Power Reduction (MPR) for CA (3UL CA) | SGS Wireless | imported from 3GU |
| R5‑184843 | Introduction of General ON/OFF time mask for CA (3UL CA) | SGS Wireless | imported from 3GU |
| R5‑184844 | Addition of new 2CA band combination for CA REFSENS | SGS Wireless | imported from 3GU |
| R5‑184845 | Addition of new 3CA band combination for CA REFSENS | SGS Wireless | imported from 3GU |
| R5‑184846 | Additional of test applicability for CA (3UL CA) | SGS Wireless | imported from 3GU |
| R5‑184847 | Update of V2X RRM | SGS Wireless | imported from 3GU |
| R5‑184848 | Update of V2X Receiver Test Cases | SGS Wireless | imported from 3GU |
| R5‑184849 | Correction of condition for Measurement configuration and reporting | SGS Wireless, Ericsson | imported from 3GU |
| R5‑184850 | Update of Initial condition for FR2 | SGS Wireless | imported from 3GU |
| R5‑184851 | Introduction of OTA signaling test environment | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑184852 | Discussion on OBW, SEM and ACLR for EN-DC interband FR1 | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑184853 | Correction to NR RRC test case 8.2.3.14.1 | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑184854 | Correction to NB-IoT testcase 22.3.2.2 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184855 | Update Occupied Bandwidth for interband EN-DC within FR1 | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑184856 | General sections updated to 38.521-2 | CAICT | imported from 3GU |
| R5‑184857 | Update SEM interband EN-DC within FR1 | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑184858 | Quality of Quiet Zone Results for IFF | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑184859 | 5G_NR FR1_Text_update for_RX_sensitivity | Qualcomm Incorporated | imported from 3GU |
| R5‑184860 | Update ACLR for interband EN-DC within FR1 | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑184861 | WP – UE Conformance Test Aspects – Interference Mitigation for Downlink Control Channels of LTE | Intel Corporation (UK) Ltd | imported from 3GU |
| R5‑184862 | SR- UE Conformance Test Aspects – Interference Mitigation for Downlink Control Channels of LTE | Intel Corporation (UK) Ltd | imported from 3GU |
| R5‑184863 | Update of FR1 test case 6.2.2 | CAICT | imported from 3GU |
| R5‑184864 | WP – UE Conformance Test Aspects - Wireless Local Area Network (WLAN) – 3GPP Radio Level Integration and Interworking Enhancements | Intel Corporation (UK) Ltd | imported from 3GU |
| R5‑184865 | 5G NR_FR1_Text_update for TX Spurious Emission | Qualcomm Incorporated | imported from 3GU |
| R5‑184866 | SR- UE Conformance Test Aspects - Wireless Local Area Network (WLAN) – 3GPP Radio Level Integration and Interworking Enhancements | Intel Corporation (UK) Ltd | imported from 3GU |
| R5‑184867 | 5G NR_FR1_Text_update for TX Spurious Emission UE-Co-exist | Qualcomm Incorporated | imported from 3GU |
| R5‑184868 | New TC 8.16.83: 3 DL CA Event Triggered Reporting under Deactivated SCells in Non-DRX with generic duplex modes | Intel Corporation (UK) Ltd | imported from 3GU |
| R5‑184869 | 5G NR_EN_DC with FR1_Text update for RX sensitivity | Qualcomm Incorporated | imported from 3GU |
| R5‑184870 | New TC 8.16.84: 3 DL CA Event Triggered Reporting on Deactivated SCell with PCell and SCell Interruptions in Non-DRX with generic duplex modes | Intel Corporation (UK) Ltd | imported from 3GU |
| R5‑184871 | New TC 8.16.85: 3 DL CA Activation and Deactivation of Known SCell in Non-DRX with generic duplex modes | Intel Corporation (UK) Ltd | imported from 3GU |
| R5‑184872 | 5G NR_EN_DC with FR1_Text_proposal for_TX_Spurious_emission | Qualcomm Incorporated | imported from 3GU |
| R5‑184873 | New TC 8.16.86: 3 DL CA Activation and Deactivation of Unknown SCell in Non-DRX with generic duplex modes | Intel Corporation (UK) Ltd | imported from 3GU |
| R5‑184874 | TS 36.521-1 Annex F update for UE cat 1bis test cases | Qualcomm Incorporated | imported from 3GU |
| R5‑184875 | Update to Occupied Bandwidth, SEM and ACLR test cases in TS 38.521-1 | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑184876 | LTE_New test case LTE_New test case 6.3.4EB ONOFF time mask for UE category 1bis | Qualcomm Incorporated | imported from 3GU |
| R5‑184877 | LTE_New test case 6.3.5EB Power Control for UE category 1bis | Qualcomm Incorporated | imported from 3GU |
| R5‑184878 | LTE_New test case 6.3.3EB UE Transmit OFF power for UE category 1bis | Qualcomm Incorporated | imported from 3GU |
| R5‑184879 | LTE_New test case 6.3.2EB Minimum Output Power for UE category 1bis | Qualcomm Incorporated | imported from 3GU |
| R5‑184880 | LTE_New test case 6.2.5EB Configured UE transmitted Power for UE category 1bis | Qualcomm Incorporated | imported from 3GU |
| R5‑184881 | LTE_New test case 6.2.4EB Additional Maximum Power Reduction (A-MPR) for UE category 1bis | Qualcomm Incorporated | imported from 3GU |
| R5‑184882 | Alignment of Annex numbering with core spec | Qualcomm Wireless GmbH | imported from 3GU |
| R5‑184883 | Proposal for 5G NR EVM Test Tolerance | Qualcomm Incorporated | imported from 3GU |
| R5‑184884 | Update to NB-IoT test conditions for in-band / guard band | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184885 | LTE_New test case 6.2.3EB Maximum Power Reduction (MPR) for UE category 1bis | Qualcomm Incorporated | imported from 3GU |
| R5‑184886 | LTE_New test case 6.2.2EB UE Maximum Output Power for UE category 1bis | Qualcomm Incorporated | imported from 3GU |
| R5‑184887 | On the relation between MU and TT for RF and RRM conformance testing | Ericsson | imported from 3GU |
| R5‑184888 | Introduction of maximum output power test cases | Ericsson | imported from 3GU |
| R5‑184889 | Discussion on testing of fallback CA configurations in Rx CA test cases | Ericsson | imported from 3GU |
| R5‑184890 | Test optimization for CA fallback cases in 3DL CA and 4DL CA Receiver test cases | Ericsson | imported from 3GU |
| R5‑184891 | 4Rx support in some 4DL CA and 5DL CA Demodulation test cases | Ericsson | imported from 3GU |
| R5‑184892 | 4Rx branches in some 4DL CA and 5DL CA Demodulation test cases | Ericsson | imported from 3GU |
| R5‑184893 | WP UE Conformance Test Aspects – Rel-14 LTE DL CA 4 Rx antenna ports | Ericsson | imported from 3GU |
| R5‑184894 | SR UE Conformance Test Aspects – Rel-14 LTE DL CA 4 Rx antenna ports | Ericsson | imported from 3GU |
| R5‑184895 | WP UE Conformance Test Aspects – Rel13 Full Dimension MIMO for LTE | Ericsson | imported from 3GU |
| R5‑184896 | SR UE Conformance Test Aspects – Rel13 Full Dimension MIMO for LTE | Ericsson | imported from 3GU |
| R5‑184897 | Updates to Channel Arrangement section in 38.521-3 | Qualcomm Wireless GmbH | imported from 3GU |
| R5‑184898 | Proposal for LTE 256QAM EVM Test Tolerance | Qualcomm Incorporated | imported from 3GU |
| R5‑184899 | WP UE Conformance Test Aspects – Further enhanced MTC for LTE | Ericsson | imported from 3GU |
| R5‑184900 | SR UE Conformance Test Aspects – Further enhanced MTC for LTE | Ericsson | imported from 3GU |
| R5‑184901 | Updates to feMTC TC 8.2.2.6.6 | Ericsson | imported from 3GU |
| R5‑184902 | Corrections and updates to UE Capability IEs | Ericsson | imported from 3GU |
| R5‑184903 | Update 3UL CA test cases 6.2.2A.4 and 6.5.1A.4 | CGC Inc. | imported from 3GU |
| R5‑184904 | Update to ACS and in-band blocking test cases in TS 38.521-1 | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑184905 | Add a new test condition for test case 8.13.3.1.2.5. | CGC Inc. | imported from 3GU |
| R5‑184906 | Add 3UL CA test cases 6.2.2A.4 and 6.5.1A.4 in 36.521-2 | CGC Inc. | imported from 3GU |
| R5‑184907 | Update to Occupied Bandwidth, SEM and ACLR test cases in TS 38.521-2 | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑184908 | FR2_UE_BeamlockMode_IE_38.509 | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑184909 | FR2_UE_BeamlockProcedure_38.508-1 | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑184910 | Discussion of test frequencies | Sprint Corporation | imported from 3GU |
| R5‑184911 | Update to test configuration tables and requirement tables for 12A-66A 2ULCA test cases. | CGC Inc. | imported from 3GU |
| R5‑184912 | Update to ACS and inband blocking test cases in TS 38.521-2 | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑184913 | Update MU factors for IFF | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑184914 | Discussion on MU factor for IFF | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑184915 | Discussion on low-PSD scenarios | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑184916 | Discussion on Dwell time | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑184917 | Correction on 4Rx RLM TC in-sync parameters | Qualcomm Wireless GmbH | imported from 3GU |
| R5‑184918 | Correction to multi-layer test case 13.1.20 | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑184919 | 5G_FR1_Text_update for_RF_sensitivity_for_SUL_operation | Qualcomm Incorporated | imported from 3GU |
| R5‑184920 | 5G NR_Proposal of TS38.521-1 annex C.0_Downlink signal levels | Qualcomm Incorporated | imported from 3GU |
| R5‑184921 | 5G NR_FR1_Text_Update_for_TX_ Additional spurious emissions | Qualcomm Incorporated | imported from 3GU |
| R5‑184922 | Test Point Analysis for Reference sensitivity level for EN-DC | Qualcomm Incorporated | imported from 3GU |
| R5‑184923 | Test Point analysis for FR2 RefSense test case | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑184924 | Test Point analysis for FR2 TxSpurious test case | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑184925 | Test Tolerance: Updates to Cat1bis chapter 8 inter-frequency event triggered reporting tests | Qualcomm UK Ltd | imported from 3GU |
| R5‑184926 | Test Tolerances analysis for E-UTRAN FDD-FDD and TDD-TDD inter-frequency TC 8.3.1_2, 8.3.2_2, 8.4.1_2, 8.4.2_2 and 8.4.6_2 for UE category 1bis | Qualcomm UK Ltd | imported from 3GU |
| R5‑184927 | Test Tolerance: Updates to Cat1bis Event triggered reporting tests under AWGN propagation conditions in asynchronous cells with DRX when L3 filtering is used | Qualcomm UK Ltd | imported from 3GU |
| R5‑184928 | Test Tolerances analysis for E-UTRAN FDD-FDD and TDD-TDD inter-frequency TC 8.3.3_2 and 8.4.3_2 for UE category 1bis when L3 filtering is used | Qualcomm UK Ltd | imported from 3GU |
| R5‑184929 | Test Tolerance: Updates to Cat1bis Event triggered reporting tests with fading, Annex E and Annex F | Qualcomm UK Ltd | imported from 3GU |
| R5‑184930 | Test Tolerances analysis for E-UTRAN FDD-FDD intra-frequency event triggered reporting under fading propagation conditions in asynchronous cells for UE category 1bis | Qualcomm UK Ltd | imported from 3GU |
| R5‑184931 | Test Tolerance: Updates to Cat1bis intra-frequency Event triggered reporting tests, Annex E and Annex F | Qualcomm UK Ltd | imported from 3GU |
| R5‑184932 | Test Tolerances analysis for E-UTRAN FDD-FDD and TDD-TDD intra-frequency TC 8.1.12_2, 8.1.13_2, 8.1.17_2, 8.1.18_2 for UE category 1bis | Qualcomm UK Ltd | imported from 3GU |
| R5‑184933 | Test Tolerance: Updates to Cat1bis intra-frequency CGI Event triggered reporting tests, Annex E and Annex F | Qualcomm UK Ltd | imported from 3GU |
| R5‑184934 | Test Tolerances analysis for E-UTRAN FDD and TDD Intra-frequency CGI TC 8.1.19_2, 8.1.20_2, 8.2.7_2, 8.2.8_2 for UE category 1bis | Qualcomm UK Ltd | imported from 3GU |
| R5‑184935 | Cat1bis new RF test case: Occupied bandwidth for UE category 1bis | Qualcomm Austria | imported from 3GU |
| R5‑184936 | Cat1bis new RF test case: Spectrum Emission Mask for UE category 1bis | Qualcomm Austria | imported from 3GU |
| R5‑184937 | Cat1bis new RF test case: Additional Spectrum Emission Mask for UE category 1bis | Qualcomm Austria | imported from 3GU |
| R5‑184938 | Cat1bis new RF test case: Adjacent Channel Leakage power Ratio for UE category 1bis | Qualcomm Austria | imported from 3GU |
| R5‑184939 | Cat1bis new RF test case: Spurious emission for UE category 1bis | Qualcomm Austria | imported from 3GU |
| R5‑184940 | Cat1bis new RF test case: Transmit intermodulation for UE category 1bis | Qualcomm Austria | imported from 3GU |
| R5‑184941 | Editorial correction of NS requirements | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184942 | Update to carrier leakage test case in TS 38.521-1 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184943 | TP for updating TR 38.905 with FR1 Carrier Leakage test point analysis | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184944 | Discussion on test point selection for Carrier Leakage in FR1 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184945 | Update to EVM test case in TS 38.521-1 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184946 | TP for updating TR 38.905 with EVM test point analysis | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184947 | Update to EVM equalizer spectrum flatness test case in TS 38.521-1 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184948 | TP for updating TR 38.905 with FR1 EVM equalizer spectrum flatness test point analysis | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184949 | Discussion on test point selection for EVM equalizer spectrum flatness in FR1 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184950 | Update to Frequency Error test case in TS 38.521-1 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184951 | TP for updating TR 38.905 with FR1 Frequency Error test point analysis | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184952 | Discussion on test point selection for Frequency Error test case in FR1 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184953 | Addition of Annex Global In-Channel TX-Test to 38.521-1 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184954 | Addition of Annex Global In-Channel TX-Test to 38.521-2 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184955 | Update to In-band Emissions test case in TS 38.521-1 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184956 | TP for updating TR 38.905 with FR1 In-band Emissions test point analysis | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184957 | Discussion on test point selection for In-band Emissions test case in FR1 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184958 | TP for updating TR 38.905 with FR2 SEM test point analysis | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184959 | Update to Test frequencies for SEM in TS 38.521-2 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184960 | Addition of Frequency Error test case to TS 38.521-2 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184961 | TP for updating TR 38.905 with FR2 Frequency Error test point analysis | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184962 | Discussion on test point selection for Frequency Error in FR2 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184963 | Addition of EVM test case to TS 38.521-2 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184964 | TP for updating TR 38.905 with FR2 EVM test point analysis | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184965 | Discussion on test point selection for EVM in FR2 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184966 | Addition of Carrier Leakage test case to TS 38.521-2 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184967 | TP for updating TR 38.905 with FR2 Carrier Leakage test point analysis | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184968 | Discussion on test point selection for Carrier Leakage in FR2 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184969 | Addition of In-band Emissions test case to TS 38.521-2 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184970 | TP for updating TR 38.905 with FR2 In-band Emissions test point analysis | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184971 | Discussion on test point selection for In-band Emissions in FR2 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184972 | Addition of EVM equalizer spectral flatness test case to TS 38.521-2 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184973 | TP for updating TR 38.905 with FR2 EVM equalizer spectral flatness test point analysis | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184974 | Discussion on test point selection for EVM equalizer spectral flatness in FR2 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184975 | Discussion on Measurement Uncertainty in FR2 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184976 | TP on Measurement Uncertainty Contributions in FR2 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑184977 | L2 Preamble Parameter Update for Multi-PDN configuration | Qualcomm Korea | imported from 3GU |
| R5‑184978 | Discussion on TT for EN-DC test cases | Huawei,HiSilicon | imported from 3GU |
| R5‑184979 | Discussion on Test configuraion table for EN-DC test cases | Huawei,HiSilicon | imported from 3GU |
| R5‑184980 | Cat1bis test cases applicability | Qualcomm Austria RFFE GmbH | imported from 3GU |
| R5‑184981 | Correction to NR RLC test cases 7.1.2.2.3 and 7.1.2.2.4 | Keysight Technologies UK Ltd, MCC TF160 | imported from 3GU |
| R5‑184982 | Resubmission of Cat1bis applicability CR | ETSI MCC (Qualcomm Korea, Bureau Veritas, Rohde & Schwarz, CATR) | imported from 3GU |
| R5‑184983 | Introduction of maximum output power test cases | Ericsson | imported from 3GU |
| R5‑184984 | Correction to NR RRC test case 8.2.3.14.1 | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑184985 | Correction to V2X TC 24.1.16 & 24.1.19 | ROHDE & SCHWARZ, Qualcomm Incorporated | imported from 3GU |
| R5‑184986 | Correction to V2V TC 24.1.2 | ROHDE & SCHWARZ, Qualcomm Incorporated | imported from 3GU |
| R5‑184987 | Addition of reference dedicated EPS bearer context #7 for V2X testing | CATT | imported from 3GU |
| R5‑184988 | Update 3UL CA test cases 6.2.2A.4 and 6.5.1A.4 | CGC Inc. | imported from 3GU |
| R5‑184989 | Update to test configuration tables and requirement tables for 12A-66A 2ULCA test cases. | CGC Inc. | imported from 3GU |
| R5‑184990 | New Test Case for 36.579-6 - 6.1.1.8 | NIST | imported from 3GU |
| R5‑184991 | Correction to Reference sensitivity level for CA UL Allocation in Table 7.3A.1.4.1-1 | Intel Corporation (UK) Ltd | imported from 3GU |
| R5‑184992 | CPWG180802-1 LS on Over-the-Air Radiated Performance Testing for 5G mm-Wave (FR2) User Equipment | CTIA 5G Millimeter-Wave OTA Sub-Working Group | imported from 3GU |
| R5‑184993 | Addition of test points for UL-CA_2A-12A in TC 6.3.2A.2 | Dekra | imported from 3GU |
| R5‑184994 | Addition of test points for UL-CA_2A-12A in TC 6.3.5A.2.2 | Dekra | imported from 3GU |
| R5‑184995 | WP UE Conformance Test Aspects - Requirements for a new UE category 1bis with single receiver based on category 1 for LTE | Qualcomm Inc. | imported from 3GU |
| R5‑184996 | SR UE Conformance Test Aspects - Requirements for a new UE category 1bis with single receiver based on category 1 for LTE | Qualcomm Inc. | imported from 3GU |
| R5‑184997 | LS from 5GAA for rel-15 2 RX vehicle mounted UE | 5GAA WG2 | imported from 3GU |
| R5‑184998 | RAN5#79 WG Action Points | ETSI Secretariat | imported from 3GU |
| R5‑184999 | MCC TF160 Status Report | MCC TF160 | imported from 3GU |
| R5‑185000 | New WID for Rel-16 LTE CA | Ericsson | imported from 3GU |
| R5‑185001 | Discussion paper on principles for defining NR test frequencies and selecting associated parameters for SS to signal | Ericsson, Sprint, MCC TF160 | imported from 3GU |
| R5‑185002 | Correction to ATTACH ACCEPT message for SMS only | ROHDE & SCHWARZ | imported from 3GU |
| R5‑185003 | Correction of 6.2.3.2 Test Frequency for CA_3A-27A | KT Corp. | imported from 3GU |
| R5‑185004 | Correction to Idle mode Inter-RAT G<>E test case 6.2.3.21 to allow optional IMS registration on EUTRAN cell | Keysight Technologies UK Ltd, Samsung | imported from 3GU |
| R5‑185005 | Update of number of DL PDCP SDUs in test cases 7.1.7.1.x | MediaTek Inc. | imported from 3GU |
| R5‑185006 | Update of DL 256QAM TCs for high UE DL Categories | MediaTek Inc. | imported from 3GU |
| R5‑185007 | Correction to RRC TC 8.5.4.1 | MediaTek Inc. | imported from 3GU |
| R5‑185008 | Correction to EMM test case 9.2.3.1.25 | ROHDE & SCHWARZ, Qualcomm Incorporated | imported from 3GU |
| R5‑185009 | Correction to testcase 9.2.2.1.9 for CAT-M1 UEs | ROHDE & SCHWARZ, Qualcomm Incorporated | imported from 3GU |
| R5‑185010 | Update of EMM test case 9.2.3.2.17 | Qualcomm Incorporated | imported from 3GU |
| R5‑185011 | Correction of clause 4.3.3.2.3 | Ericsson | imported from 3GU |
| R5‑185012 | Clarification for NB-IoT test case 22.3.1.1 | MCC TF160, Rohde&Schwarz | imported from 3GU |
| R5‑185013 | Correction to NB-IoT test case 22.5.8 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑185014 | Correction to NB-IoT test case 22.5.14 | ROHDE & SCHWARZ, Qualcomm | imported from 3GU |
| R5‑185015 | Corrections to NBIOT NAS TC 22.5.7b | CATT, TDIA, Starpoint | imported from 3GU |
| R5‑185016 | Correction to NB-IoT test cases 22.4.8 and 22.4.9 | ANRITSU LTD | imported from 3GU |
| R5‑185017 | Correction to NB-IoT test cases 22.4.4, 22.4.8 and 22.4.9 | ANRITSU LTD, Qualcomm | imported from 3GU |
| R5‑185018 | Correction to NB-IoT test case 22.2.9 | ANRITSU LTD | imported from 3GU |
| R5‑185019 | Update to NB-IOT test case 22.1.1 M2 | Qualcomm Incorporated, Anritsu, Rohde & Schwarz | imported from 3GU |
| R5‑185020 | Update to NB-IOT test case 22.3.1.2 | Qualcomm Incorporated | imported from 3GU |
| R5‑185021 | Correction to NB-IoT testcase 22.3.3.5 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑185022 | Correction to NB-IoT test case 22.4.20a execution guideline | Anritsu Ltd, Qualcomm | imported from 3GU |
| R5‑185023 | Updates of 6.2.3.2 Test Frequency for CA_8A-27A | KT Corp. | imported from 3GU |
| R5‑185024 | Addition of new R15 CA configurations to 36.523-2 | Bureau Veritas, Ericsson | imported from 3GU |
| R5‑185025 | Multi-PDN Handling in EN-DC | Qualcomm Korea | imported from 3GU |
| R5‑185026 | ASN.1 Version Handling for NSA and SA | Qualcomm Korea | imported from 3GU |
| R5‑185027 | Default channel bandwidth of new NR bands for non-CA signaling test cases | NTT DOCOMO, INC., CMCC, KDDI Corporation, KT Corp., Orange, Telecom Italia S.p.A. | imported from 3GU |
| R5‑185028 | Add SRB1 and SRB2 with NR PDCP | Ericsson | imported from 3GU |
| R5‑185029 | Update serving cell | Ericsson, DOCOMO Communications Lab | imported from 3GU |
| R5‑185030 | Introduce SA RRC messages | Ericsson | imported from 3GU |
| R5‑185031 | Correct IE FrequencyInfoDL | Ericsson, DOCOMO Communications Lab | imported from 3GU |
| R5‑185032 | Introduce SA system information blocks | Ericsson | imported from 3GU |
| R5‑185033 | Introduce SA other information elements | Ericsson | imported from 3GU |
| R5‑185034 | Updates to PDCCH and SearchSpace configurations | MCC TF160, NTT DOCOMO, INC. | imported from 3GU |
| R5‑185035 | Correct IE GSCN-ValueNR | Ericsson, DOCOMO Communications Lab | imported from 3GU |
| R5‑185036 | Update of FR1 signal levels | ANRITSU LTD | imported from 3GU |
| R5‑185037 | Addition of IP Connectivity check procedure | Qualcomm Tech. Netherlands B.V, MCC TF160 | imported from 3GU |
| R5‑185038 | Introduce SA radio resource control information elements | Ericsson | imported from 3GU |
| R5‑185039 | Update IE PhysicalCellGroupConfig | Ericsson, DOCOMO Communications Lab | imported from 3GU |
| R5‑185040 | Introduce cell configurations and timer tolerances chapter headers | Ericsson | imported from 3GU |
| R5‑185041 | Add IE SSB-MTC | Ericsson, DOCOMO Communications Lab | imported from 3GU |
| R5‑185042 | Update BWP | DOCOMO Communications Lab, Ericsson | imported from 3GU |
| R5‑185043 | Update PDSCH-Config | DOCOMO Communications Lab. | imported from 3GU |
| R5‑185044 | Update PUCCH and PUSCH configuration | DOCOMO Communications Lab. | imported from 3GU |
| R5‑185045 | Update RACH configuration | DOCOMO Communications Lab. | imported from 3GU |
| R5‑185046 | Update CellGroupConfig | DOCOMO Communications Lab. | imported from 3GU |
| R5‑185047 | Update CSI-MeasConfig | DOCOMO Communications Lab. | imported from 3GU |
| R5‑185048 | Update MeasConfig | DOCOMO Communications Lab. | imported from 3GU |
| R5‑185049 | Update other information elements | DOCOMO Communications Lab. | imported from 3GU |
| R5‑185050 | Update RadioBearerConfig | DOCOMO Communications Lab. | imported from 3GU |
| R5‑185051 | Specifying content for MeasResultSCG-Failure | Samsung | imported from 3GU |
| R5‑185052 | Editorial correction to band representation of non-contiguous EN-DC band combination | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑185053 | Correction to RLC-Config IE | Ericsson | imported from 3GU |
| R5‑185054 | Correction to RadioBearerConfig-DRB | Ericsson | imported from 3GU |
| R5‑185055 | Corrections ard updates to BandCombinationList and Feature Set IEs | Ericsson | imported from 3GU |
| R5‑185056 | Corrections and updates to UE Capability IEs | Ericsson | imported from 3GU |
| R5‑185057 | Editorial updates to 38.509 | Samsung, MCC TF160 | imported from 3GU |
| R5‑185058 | Addition of Test Loop for SDAP testing | Motorola Mobility | imported from 3GU |
| R5‑185059 | Correction to NR MAC test case 7.1.1.3.2 | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑185060 | Addition of Correct Handling of DL HARQ process PDSCH Aggregation test case 7.1.1.2.2 | Huawei, Hisilicon | imported from 3GU |
| R5‑185061 | Addition of NR CA reconfiguration test case 8.2.4.2.1.1 | Huawei, Hisilicon | imported from 3GU |
| R5‑185062 | Addition of NR CA reconfiguration test case 8.2.4.2.1.2 | Huawei, Hisilicon | imported from 3GU |
| R5‑185063 | Addition of Random access test case 7.1.1.1.4 | Huawei, Hisilicon | imported from 3GU |
| R5‑185064 | Addition of 5GS NR SDAP test case 7.1.4.1 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑185065 | Correction to 5GS MAC Test case 7.1.1.1.2 Random access procedure / Successful / C-RNTI Based / Preamble selected by MAC itself | Qualcomm Korea | imported from 3GU |
| R5‑185066 | Correction to 5GS MAC Test case 7.1.1.5.3 DRX operation / Short cycle configured / Parameters configured by RRC | Qualcomm Korea | imported from 3GU |
| R5‑185067 | Correction to 5GS RLC Test case 7.1.2.3.10 AM RLC / Re-transmission of RLC PDU with and without re-segmentation | Qualcomm Korea | imported from 3GU |
| R5‑185068 | Correction to 5GS RLC Test case 7.1.2.3.11 AM RLC / RLC re-establishment procedure | Qualcomm Korea | imported from 3GU |
| R5‑185069 | Addition of NR CA / NR SCell addition / modification / release / Success test cases 8.2.4.1.1.1, 8.2.4.1.1.2 and 8.2.4.1.1.3 | Qualcomm Korea | imported from 3GU |
| R5‑185070 | Corrections to RRC TC - Measurement configuration control and reporting / Inter-RAT measurements / Event B1 / Measurement of NR cells / EN-DC | Qualcomm Tech. Netherlands B.V | imported from 3GU |
| R5‑185071 | Correction to 5GS RRC TC 8.2.4.3.1.1 | TDIA, CATT | imported from 3GU |
| R5‑185072 | Addition of 5GS RRC TC 8.2.4.3.1.2 | TDIA, CATT | imported from 3GU |
| R5‑185073 | Corrections to Layer 2 test cases | Motorola Mobility, Huawei | imported from 3GU |
| R5‑185074 | Corrections to MAC test case 7.1.2.2.1 | Motorola Mobility, MCC TF160 | imported from 3GU |
| R5‑185075 | Corrections to MAC test case 7.1.2.3.1 | Motorola Mobility, MCC TF160 | imported from 3GU |
| R5‑185076 | Addition of new MAC RACH test case for PDCCH order | Motorola Mobility | imported from 3GU |
| R5‑185077 | Addition of new MAC test case for Scell Activation Deactivation | Motorola Mobility | imported from 3GU |
| R5‑185078 | Addition of new MAC UL TBS test case with transform precoding configured | Motorola Mobility | imported from 3GU |
| R5‑185079 | Correction to default pre-test conditions for UM RLC test cases | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑185080 | New NAS test case 9.1.5.1.12 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑185081 | New NAS test case 9.1.6.1.4 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑185082 | Correction to NR PDCP test case 7.1.3.5.1 | ANRITSU LTD | imported from 3GU |
| R5‑185083 | Correction to NR RLC test case 7.1.2.3.3 and 7.1.2.3.4 | ANRITSU LTD | imported from 3GU |
| R5‑185084 | Update to TLS setup | MCC TF160, Motorola Solutions UK Ltd. | imported from 3GU |
| R5‑185085 | Addition of UM condition to RLC-Bearer-Config IE | Ericsson | imported from 3GU |
| R5‑185086 | Update to EPS SM Test case for Multi-PDN | Qualcomm Inc. | imported from 3GU |
| R5‑185087 | Update to Emergency Call test case 19.1.3 for eCall category bit usage | Qualcomm Incorporated | imported from 3GU |
| R5‑185088 | Adding SMS over IP configuration to applicabilities | ROHDE & SCHWARZ | imported from 3GU |
| R5‑185089 | Corrections to RRC TC - Measurement configuration control and reporting / Inter-RAT measurements / Event B2 / Measurement of NR cells / EN-DC | Intertek | imported from 3GU |
| R5‑185090 | CR of AM RLC test case 7.1.2.3.10 | Huawei, Hisilicon | imported from 3GU |
| R5‑185091 | Update of RRC SCG failure TC 8.2.5.1.1 | Samsung, Qualcomm | imported from 3GU |
| R5‑185092 | Update of RRC SCG failure TC 8.2.5.2.1 | Samsung, Qualcomm | imported from 3GU |
| R5‑185093 | Update of RRC SCG failure TC 8.2.5.3.1 | Samsung, Qualcomm | imported from 3GU |
| R5‑185094 | Update of RRC SCG failure TC 8.2.5.4.1 | Samsung, Qualcomm | imported from 3GU |
| R5‑185095 | Addition of 5GS NR SDAP test case 7.1.4.2 | Motorola Mobility | imported from 3GU |
| R5‑185096 | Update of 5GS NR RRC test case 8.2.3.6.1 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑185097 | Update of 5GS NR RRC test case 8.2.3.8.1 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑185098 | Update of 5GS NR RRC test case 8.2.1.1.1 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑185099 | L2 Preamble Parameter Update for Multi-PDN configuration | Qualcomm Korea | imported from 3GU |
| R5‑185100 | Correction to NR RLC test cases 7.1.2.2.3 and 7.1.2.2.4 | Keysight Technologies UK Ltd, MCC TF160 | imported from 3GU |
| R5‑185101 | Correction to NR RRC test case 8.2.3.14.1 | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑185102 | Addition of applicability and tests conditions for 5GC test cases 8.2.4.3.1.2, 8.2.4.3.1.3, 9.1.2.1 and 9.1.2.2 | CATT, TDIA | imported from 3GU |
| R5‑185103 | Specifying content for SCGFailureInformationNR | Samsung | imported from 3GU |
| R5‑185104 | Addition of reference dedicated EPS bearer context #7 for V2X testing | CATT | imported from 3GU |
| R5‑185105 | Addition of Test Case:” LWA / T351 Expiry” to WLAN/3GPP Radio Level Integration and Interworking Enhancement Interworking Work Item | Intel Corporation (UK) Ltd | imported from 3GU |
| R5‑185106 | Correction of Test Cases 8.2.5.4 and 8.2.5.5 | Intel Corporation (UK) Ltd | imported from 3GU |
| R5‑185107 | Addition of new V2X test case 24.2.4 | CAICT | imported from 3GU |
| R5‑185108 | Correction to V2X test case 24.1.12 | CAICT | imported from 3GU |
| R5‑185109 | Correction to V2X test case 24.1.1, 24.1.3, 24.1.5, 24.1.6, 24.1.10 and 24.1.11 | CAICT | imported from 3GU |
| R5‑185110 | New test case for V2X Sidelink using Tx parameters based on measured CBR and PPPP | Sporton, TTA | imported from 3GU |
| R5‑185111 | New test case for V2X Sidelink with SL SPS Transmission | Sporton, TTA | imported from 3GU |
| R5‑185112 | Correction to V2X TC 24.1.16 & 24.1.19 | ROHDE & SCHWARZ, Qualcomm Incorporated | imported from 3GU |
| R5‑185113 | Addition of NB_IOTenh-UEConTest test case scenarios and default SIB content | CATT, TDIA, Starpoint, Sporton | imported from 3GU |
| R5‑185114 | Correction to eNB-IoT test case 22.3.2.7 | MCC TF160, TDIA | imported from 3GU |
| R5‑185115 | Addition to NB-IoT testcase 22.3.1.6a | TDIA, CATT, Starpoint | imported from 3GU |
| R5‑185116 | Addition of new NB_IOTenh-UEConTest test case 22.3.1.8 | CATT, TDIA, Starpoint | imported from 3GU |
| R5‑185117 | Addition of new NB_IOTenh-UEConTest test case 22.3.1.10 | CATT, TDIA, Starpoint | imported from 3GU |
| R5‑185118 | Addition of new NB_IOTenh-UEConTest test case 22.4.24 | CATT, TDIA, Starpoint | imported from 3GU |
| R5‑185119 | Addition of new NB_IOTenh-UEConTest test case 22.4.25 | CATT, TDIA, Starpoint | imported from 3GU |
| R5‑185120 | New test case for NB-IoT UM RLC | Sporton, TTA, TDIA | imported from 3GU |
| R5‑185121 | Addition of applicability and tests conditions for new Enhancements NB-IoT TC 22.3.2.6 | Sporton | imported from 3GU |
| R5‑185122 | Corrections to MCPTT Authorization | MCC TF160 | imported from 3GU |
| R5‑185123 | Adding a new Rel-14 TC on Private Call Call-Back Request / Client Originated (CO) / Private call call-back fulfilment | Samsung | imported from 3GU |
| R5‑185124 | Adding a new Rel-14 TC on Private Call / Remotely initiated Ambient listening call Client Originated (CO) | Samsung | imported from 3GU |
| R5‑185125 | Corrections to UE Test Loop Mode H | MCC TF160 | imported from 3GU |
| R5‑185126 | Correction to SSAC connected mode test cases 13.5.1a and 13.5.3a for IMS Enabled UE | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑185127 | New Work Item Proposal: UE Conformance Test Aspects - Addition of Power Class 1 UE to bands B31/B72 for LTE | Airbus DS SLC | imported from 3GU |
| R5‑185128 | New WID on UE Conformance Test Aspects - ProSe Support for Band 72 in LTE | Airbus DS SLC | imported from 3GU |
| R5‑185129 | Update of UE test loop mode E | Huawei,HiSilicon, CATT | imported from 3GU |
| R5‑185130 | Update of UE test loop mode E | Huawei,HiSilicon, CATT | imported from 3GU |
| R5‑185131 | Reuse of demodulation setup for signalling tests in FR2 | ANRITSU LTD | imported from 3GU |
| R5‑185132 | OTA Chamber requirements for 5G NR Signalling test cases | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑185133 | Correction of clause 4.3.3.2.3 | Ericsson | imported from 3GU |
| R5‑185134 | Draft TR 38.905 v1.0.0 | Ericsson LM | imported from 3GU |
| R5‑185135 | Correction to 10.7.4 regarding CE mode | ROHDE & SCHWARZ | imported from 3GU |
| R5‑185136 | Update EPS Session Management test case in section 10 of TS 36.523-1. | FirstNet, AT&T | imported from 3GU |
| R5‑185137 | Update to applicability condition of Intra-frequency measurement reporting test cases for CAT-M1 UEs | Qualcomm Incorporated | imported from 3GU |
| R5‑185138 | Removal of 1xPre-Registation and 1xCSFB test cases applicability | Qualcomm Incorporated | imported from 3GU |
| R5‑185139 | Routine maintenance for TS 36.523-3 | MCC TF160 | imported from 3GU |
| R5‑185140 | New CA band combination CA_1A-3A-7A-20A - Update of table A.4.3.3.3-5 | Vodafone GmbH | imported from 3GU |
| R5‑185141 | Correction to V2V TC 24.1.2 | ROHDE & SCHWARZ, Qualcomm Incorporated | imported from 3GU |
| R5‑185142 | Draft TS 36.579-6 v0.0.3 | Samsung | imported from 3GU |
| R5‑185143 | Draft TS 36.579-7 v0.0.3 | Samsung | imported from 3GU |
| R5‑185144 | Draft TS 38.521-2 v1.0.0 | Rapp | imported from 3GU |
| R5‑185145 | Draft TS 38.521-3 v1.0.0 | Rapp | imported from 3GU |
| R5‑185146 | Draft TR 38.903 v1.0.0 | Rapp | imported from 3GU |
| R5‑185147 | LS Concerning RAN5 Response to ITU-R Working Party 5D LS on definition of test methods for OTA unwanted emissions of IMT radio equipment | TSG WG RAN5 | imported from 3GU |
| R5‑185148 | Addition of NR CA reconfiguration test case 8.2.4.2.1.3 | Huawei, Hisilicon | imported from 3GU |
| R5‑185149 | Corrections to RRC TC - PSCell addition, modification and release / SCG DRB / EN-DC | Qualcomm Tech. Netherlands B.V | imported from 3GU |
| R5‑185150 | Corrections to RRC TC - Bearer Modification / Handling for bearer type change with security key change / EN-DC | Qualcomm Tech. Netherlands B.V | imported from 3GU |
| R5‑185151 | Corrections to RRC TC - Bearer Modification / Uplink data path / Split DRB Reconfiguration / EN-DC | Qualcomm Tech. Netherlands B.V | imported from 3GU |
| R5‑185152 | Addition of new MAC test case for Power Headroom report | Motorola Mobility | imported from 3GU |
| R5‑185153 | Addition of RRC Default Pre-test conditions for NSA | Qualcomm Korea | imported from 3GU |
| R5‑185154 | Correction to RRC TC - Measurement configuration control and reporting / Event A1 / Measurement of NR PSCell / EN-DC | Qualcomm Incorporated | imported from 3GU |
| R5‑185155 | Updates to NAS test case 10.2.1.2 | Ericsson LM | imported from 3GU |
| R5‑185156 | EN-DC: Test Model updates | MCC TF160 | imported from 3GU |
| R5‑185157 | Update of NR test cases title and applicability | Qualcomm Incorporated | imported from 3GU |
| R5‑185158 | Update Reference Table 6.6.2-1A dedicated EPS bearer contexts | FirstNet, AT&T | imported from 3GU |
| R5‑185159 | Correction to CAT-M1 Test case 8.2.4.27 | Anritsu Ltd., Nordic Semiconductor ASA | imported from 3GU |
| R5‑185160 | Addition of new V2X test case 24.2.4 | CAICT | imported from 3GU |
| R5‑185161 | Addition of PICS | Motorola Mobility | imported from 3GU |
| R5‑185162 | Addition of missing and new test cases applicabilities | Motorola Mobility | imported from 3GU |
| R5‑185163 | Modified RRC_Connected procedure for Multi PDN throughout the test case. | Qualcomm Korea, Ericsson | imported from 3GU |
| R5‑185164 | Update RRCConnectionReconfiguration message for EN-DC | Ericsson, Qualcomm Inc. | imported from 3GU |
| R5‑185165 | Update EN-DC Generic Procedure Parameter for Multi-PDN addition throughout Test Case | Qualcomm Korea | imported from 3GU |
| R5‑185166 | Modification of EPS & Data Radio Bearer ID mapping for EN-DC Test cases | Qualcomm Korea | imported from 3GU |
| R5‑185167 | Update to EPS SM Test case for Multi-PDN | Qualcomm Inc. | imported from 3GU |
| R5‑185168 | Introduction of OTA signaling test environment | Keysight Technologies UK Ltd, Anritsu Ltd | imported from 3GU |
| R5‑185169 | Update of number of DL PDCP SDUs in test cases 7.1.7.1.x | MediaTek Inc. | imported from 3GU |
| R5‑185170 | Meeting notes of offline discussion on FR2 UE common test setup | Anritsu | imported from 3GU |
| R5‑185171 | Updates to PDCCH and SearchSpace configurations | MCC TF160, NTT DOCOMO, INC. | imported from 3GU |
| R5‑185172 | EN-DC: Test Model updates | MCC TF160 | imported from 3GU |
| R5‑185173 | Test Frequencies | Sprint Corporation, Ericsson | imported from 3GU |
| R5‑185174 | Reference sensitivity requirements for CA_66A-66A-70C-71A, CA_66A-66A-70A-71A, CA_66A-70C-71A, CA_66A-70A-71A, CA_66A-66A-71A, CA_70A-71A, CA_66A-71A, CA_66C-70C-71A, CA_66C-70A-71A, CA_70C-71A, CA_66C-71A | WE Certification Oy, DISH Network | imported from 3GU |
| R5‑185175 | Update 3UL CA test cases 6.2.2A.4 and 6.5.1A.4 | CGC Inc. | imported from 3GU |
| R5‑185176 | Update to test configuration tables and requirement tables for 12A-66A 2ULCA test cases. | CGC Inc. | imported from 3GU |
| R5‑185177 | Introduction of test frequencies for signalling testing in clause 6 | Ericsson, TF160 | imported from 3GU |
| R5‑185178 | Addition of Test frequency for EN-DC B1_n78 | Qualcomm Korea | imported from 3GU |
| R5‑185179 | Meeting notes of offline discussion on FR2 UE common test setup | Anritsu | imported from 3GU |
| R5‑185180 | Routine maintenance for TS 36.523-3 | MCC TF160 | imported from 3GU |
| R5‑185181 | WP - UE Conformance Test Aspects - eHST | CMCC | imported from 3GU |
| R5‑185182 | SR - eHST after RAN5#80 | CMCC | imported from 3GU |
| R5‑185184 | Addition of V2X new TC 12.2.2 | Huawei,HiSilicon, Rohde & Schwarz | imported from 3GU |
| R5‑185185 | Band 41 HPUE Maximum Output Power | CMCC | imported from 3GU |
| R5‑185186 | 4Rx support in some 4DL CA and 5DL CA Demodulation test cases | Ericsson | imported from 3GU |
| R5‑185187 | FR2_RefSens_TestConfig_38.521-2 | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑185188 | DL and UL RMC updated for FR2 tests | Bureau Veritas | imported from 3GU |
| R5‑185189 | Downlink physical channel updated for FR2 tests | Bureau Veritas | imported from 3GU |
| R5‑185190 | OCNG Patterns updated for FR2 tests | Bureau Veritas | imported from 3GU |
| R5‑185191 | Update to Occupied Bandwidth, SEM and ACLR test cases in TS 38.521-2 | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑185192 | Update to ACS and inband blocking test cases in TS 38.521-2 | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑185193 | Addition of Annex Global In-Channel TX-Test to 38.521-2 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑185194 | Update to Test frequencies for SEM in TS 38.521-2 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑185195 | Addition of EVM test case to TS 38.521-2 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑185196 | Addition of Carrier Leakage test case to TS 38.521-2 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑185197 | Introduction of maximum output power test cases | Ericsson | imported from 3GU |
| R5‑185198 | Addition of 6.2B.4.1.4 Configured OP for Inter-Band EN-DC including FR2 | Huawei,HiSilicon | imported from 3GU |
| R5‑185199 | Addition of 6.2B.4.1.5 Configured OP for Inter-Band EN-DC including both FR1 and FR2 | Huawei,HiSilicon | imported from 3GU |
| R5‑185200 | TP for updating test case 6.5B.2.1.2 Additional spectrum emission mask for intra-band contigous EN-DC | Ericsson LM | imported from 3GU |
| R5‑185201 | Introduction of TC 7.4B.1 | Huawei, Hisilicon | imported from 3GU |
| R5‑185202 | Introduction of 7.4B.2 | Huawei, Hisilicon | imported from 3GU |
| R5‑185203 | Introduction of 7.4B.3 | Huawei, Hisilicon | imported from 3GU |
| R5‑185204 | 5G NR_EN_DC with FR1_Text update for RX sensitivity | Qualcomm Incorporated | imported from 3GU |
| R5‑185205 | 5G NR_EN_DC with FR1_Text_proposal for_TX_Spurious_emission | Qualcomm Incorporated | imported from 3GU |
| R5‑185206 | Addition of TC6.3B.1.1 Minimum Output power for intra-band contiguous EN-DC | SGS Wireless | imported from 3GU |
| R5‑185207 | Addition of TC6.3B.1.2 Minimum output power for intra-band non-contiguous EN-DC | SGS Wireless | imported from 3GU |
| R5‑185208 | Addition of TC6.3B.1.3 Minimum output power for inter-band EN-DC within FR1 | SGS Wireless | imported from 3GU |
| R5‑185209 | TP for Clause 4.1.1 of TS 38.522 | CMCC | imported from 3GU |
| R5‑185210 | TP for Clause 4.1.2 of TS 38.522 | CMCC | imported from 3GU |
| R5‑185211 | TP for Clause 4.1.3 of TS 38.522 | CMCC | imported from 3GU |
| R5‑185212 | pCR Adding MU values for EIRPTRP measurements with Near Field test range at mmWave | MVG Industries | imported from 3GU |
| R5‑185213 | pCR Making Measurement Uncertainty Terms Common between methods in TR 38.90 | MVG Industries | imported from 3GU |
| R5‑185214 | TP on Measurement Uncertainty Contributions in FR2 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑185215 | TP for updating TR 38.905 with FR2 SEM test point analysis | ROHDE & SCHWARZ | imported from 3GU |
| R5‑185216 | TP for updating TR38.905 with UE AMPR for NS_04 Intra-band contigous EN-DC | Ericsson LM | imported from 3GU |
| R5‑185250 | Introduction of test frequencies for NR band n1 | Ericsson | imported from 3GU |
| R5‑185251 | Introduction of test frequencies for NR band n2 | Ericsson | imported from 3GU |
| R5‑185252 | Introduction of test frequencies for NR band n3 | Ericsson | imported from 3GU |
| R5‑185253 | Introduction of test frequencies for NR band n5 | Ericsson | imported from 3GU |
| R5‑185254 | Introduction of test frequencies for NR band n7 | Ericsson | imported from 3GU |
| R5‑185255 | Introduction of test frequencies for NR band n8 | Ericsson | imported from 3GU |
| R5‑185256 | Introduction of test frequencies for NR band n12 | Ericsson | imported from 3GU |
| R5‑185257 | Introduction of test frequencies for NR band n20 | Ericsson | imported from 3GU |
| R5‑185258 | Introduction of test frequencies for NR band n25 | Ericsson | imported from 3GU |
| R5‑185259 | Introduction of test frequencies for NR band n28 | Ericsson | imported from 3GU |
| R5‑185260 | Introduction of test frequencies for NR band n34 | Ericsson | imported from 3GU |
| R5‑185261 | Introduction of test frequencies for NR band n38 | Ericsson | imported from 3GU |
| R5‑185262 | Introduction of test frequencies for NR band n39 | Ericsson | imported from 3GU |
| R5‑185263 | Introduction of test frequencies for NR band n40 | Ericsson | imported from 3GU |
| R5‑185264 | Update of test frequencies for NR band n41 | Ericsson, Sprint | imported from 3GU |
| R5‑185265 | Introduction of test frequencies for NR band n51 | Ericsson | imported from 3GU |
| R5‑185266 | Introduction of test frequencies for NR band n66 | Ericsson, Dish Network | imported from 3GU |
| R5‑185267 | Introduction of test frequencies for NR band n70 | Ericsson, Dish Network | imported from 3GU |
| R5‑185268 | Update of test frequencies for NR band n71 | Ericsson, Dish Network | imported from 3GU |
| R5‑185269 | Introduction of test frequencies for NR band n75 | Ericsson | imported from 3GU |
| R5‑185270 | Introduction of test frequencies for NR band n76 | Ericsson | imported from 3GU |
| R5‑185300 | LS on RAN4-RAN5 5G-NR RF pending issues during RAN5#80 | TSG WG RAN5 | imported from 3GU |
| R5‑185301 | Discussion on test point selection for NR Out-of-band in FR1 | CAICT | imported from 3GU |
| R5‑185302 | Addition of TC6.3B.1.1 Minimum Output power for intra-band contiguous EN-DC | SGS Wireless | imported from 3GU |
| R5‑185303 | Addition of TC6.3B.1.2 Minimum output power for intra-band non-contiguous EN-DC | SGS Wireless | imported from 3GU |
| R5‑185304 | Addition of TC6.3B.1.3 Minimum output power for inter-band EN-DC within FR1 | SGS Wireless | imported from 3GU |
| R5‑185305 | Update of FR1 test case 6.2.1 | Huawei,HiSilicon | imported from 3GU |
| R5‑185306 | Discussion on starting point of 200ms in FR1 RF test procedures | Huawei,HiSilicon, Keysight | imported from 3GU |
| R5‑185307 | TP for updating TR38.905 with FR1 AMPR test point analyses with NS_35 | Ericsson LM | imported from 3GU |
| R5‑185308 | Discussion on the test applicability for the modulation of Pi/2-BPSK | Huawei, Hisilicon | imported from 3GU |
| R5‑185309 | Test Point analysis for FR1 Configured Output Power for SUL | Huawei,HiSilicon | imported from 3GU |
| R5‑185310 | Discussion on test point selection for Carrier Leakage in FR1 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑185311 | TP for updating TR 38.905 with FR1 Carrier Leakage test point analysis | ROHDE & SCHWARZ | imported from 3GU |
| R5‑185312 | Update to carrier leakage test case in TS 38.521-1 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑185313 | Discussion on test point selection for EVM equalizer spectrum flatness in FR1 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑185314 | TP for updating TR 38.905 with FR1 EVM equalizer spectrum flatness test point analysis | ROHDE & SCHWARZ | imported from 3GU |
| R5‑185315 | Update to EVM equalizer spectrum flatness test case in TS 38.521-1 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑185316 | TP for updating TR 38.905 with FR1 Frequency Error test point analysis | ROHDE & SCHWARZ | imported from 3GU |
| R5‑185317 | Update to Frequency Error test case in TS 38.521-1 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑185318 | Discussion on test point selection for In-band Emissions test case in FR1 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑185319 | TP for updating TR 38.905 with FR1 In-band Emissions test point analysis | ROHDE & SCHWARZ | imported from 3GU |
| R5‑185320 | Update to In-band Emissions test case in TS 38.521-1 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑185321 | TP to TS38.521-1:Operating bands and channel arrangement | China Unicom | imported from 3GU |
| R5‑185322 | Addition of FR1 test case 6.2.4 | Huawei,HiSilicon | imported from 3GU |
| R5‑185323 | Update of FR1 test case 6.3.1 | Huawei,HiSilicon | imported from 3GU |
| R5‑185324 | Addition of Uplink Physical Channels in Annex | Huawei, Hisilicon | imported from 3GU |
| R5‑185325 | 5G_FR1_Text_update for_RF_sensitivity_for_SUL_operation | Qualcomm Incorporated | imported from 3GU |
| R5‑185326 | Update to EVM test case in TS 38.521-1 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑185327 | Addition of Annex Global In-Channel TX-Test to 38.521-1 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑185328 | Discussion on the way to write Clause 7.4 Maximum Input Level and Clause 7.5 Adjacent Channel Selectivity in TS 38.521-3 | CMCC, HUAWEI | imported from 3GU |
| R5‑185329 | Add Clause 7.5 into TS 38.521-3 | CMCC | imported from 3GU |
| R5‑185330 | Addition of test points for UL-CA_4A-12A in TC 6.3.2A.2 | DEKRA | imported from 3GU |
| R5‑185331 | Addition of test points for UL-CA_4A-12A in TC 6.3.5A.2.2 | DEKRA | imported from 3GU |
| R5‑185332 | Addition of 6.2B.4.1.1 Configured OP for Intra-Band Contiguous EN-DC | Huawei,HiSilicon | imported from 3GU |
| R5‑185333 | Addition of 6.2B.4.1.2 Configured OP for Intra-Band Non-Contiguous EN-DC | Huawei,HiSilicon | imported from 3GU |
| R5‑185334 | Discussion of LTE Test point selection for EN-DC with FR1 Tx Spurious emission Test | Qualcomm Inc. | imported from 3GU |
| R5‑185335 | Estimation of measurement uncertainty for FR2 TRx test cases | Anritsu | imported from 3GU |
| R5‑185336 | Removing brackets from MU values in FR2 | Anritsu | imported from 3GU |
| R5‑185337 | Test Tolerance: Updates to Cat1bis intra-frequency CGI Event triggered reporting tests, Annex E and Annex F | Qualcomm UK Ltd | imported from 3GU |
| R5‑185338 | Test Tolerances analysis for E-UTRAN FDD-FDD and TDD-TDD inter-frequency TC 8.3.1_2, 8.3.2_2, 8.4.1_2, 8.4.2_2 and 8.4.6_2 for UE category 1bis | Qualcomm UK Ltd | imported from 3GU |
| R5‑185339 | Test Tolerances analysis for E-UTRAN FDD-FDD and TDD-TDD inter-frequency TC 8.3.3_2 and 8.4.3_2 for UE category 1bis when L3 filtering is used | Qualcomm UK Ltd | imported from 3GU |
| R5‑185340 | Test Tolerances analysis for E-UTRAN FDD-FDD intra-frequency event triggered reporting under fading propagation conditions in asynchronous cells for UE category 1bis | Qualcomm UK Ltd | imported from 3GU |
| R5‑185341 | Test Tolerances analysis for E-UTRAN FDD-FDD and TDD-TDD intra-frequency TC 8.1.12_2, 8.1.13_2, 8.1.17_2, 8.1.18_2 for UE category 1bis | Qualcomm UK Ltd | imported from 3GU |
| R5‑185342 | Editorial cleaning up of Rel-14 CA 5DL RSRP measurement TC 9.1.51 | Huawei,HiSilicon | imported from 3GU |
| R5‑185343 | New CA band combination CA_1A-3A-7A-20A - Update of table 7.3A.5, 7.3A.9 and refsens | Vodafone GmbH | imported from 3GU |
| R5‑185344 | New CA band combination CA_1A-3A-7A-20A - Update of table A.4.6.3-5 | Vodafone GmbH | imported from 3GU |
| R5‑185345 | New CA band combination CA_1A-3A-7A-20A - Update of test point analysis | Vodafone GmbH | imported from 3GU |
| R5‑185347 | Discussion on FR2 TRx spurious test procedure | Anritsu | imported from 3GU |
| R5‑185348 | Correction to FR2 Spurious TC and inroduction of TRP measurement grid requirement | Anritsu | imported from 3GU |
| R5‑185349 | Discussion on test point selection for Frequency Error in FR2 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑185350 | Addition of Frequency Error test case to TS 38.521-2 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑185351 | Update across EN-DC RF test cases in TS 38.521-3 | Qualcomm Wireless GmbH | imported from 3GU |
| R5‑185352 | pCR Adding MU values for EIRPTRP measurements with Near Field test range at mmWave | MVG Industries | imported from 3GU |
| R5‑185353 | Addition of Annex Global In-Channel TX-Test to 38.521-2 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑185354 | Update of V2V TCs 6.5.2.3G.1 & 6.5.2.4G & 6.6.2.2G.1& 6.6.3G.1 | Huawei, Hisilicon | imported from 3GU |
| R5‑185355 | Update to test case 6.3.2G.1 for V2V services based on LTE sidelink | KTL | imported from 3GU |
| R5‑185356 | Update of Additional Maximum Power Reduction (A-MPR) for V2X Communication / Non-concurrent with E-UTRA uplink transmissions | LG Electronics | imported from 3GU |
| R5‑185357 | Update to Annex G for V2V/V2X Demod Perf tests | Qualcomm Wireless GmbH | imported from 3GU |
| R5‑185358 | Update of multiple V2V RF test cases for proper test mode setting | Huawei,HiSilicon | imported from 3GU |
| R5‑185359 | Correction of the title for OTDOA IOT tests | ROHDE & SCHWARZ | imported from 3GU |
| R5‑185360 | Update of V2X TCs 6.6.3G.2_1 & 6.6.3G.3_1 | Huawei, Hisilicon | imported from 3GU |
| R5‑185361 | Update of V2X TCs 6.6.3G.2 & 6.6.3G.3 | Huawei, Hisilicon | imported from 3GU |
| R5‑185362 | Correction to 36521-1-chapter 6_V2V and V2X | Tejet | imported from 3GU |
| R5‑185363 | Cleaning up V2X test cases in TS 36.521-1 | Huawei,HiSilicon | imported from 3GU |
| R5‑185364 | Update to test case 6.3.2G.2 for LTE-based V2X Services | KTL | imported from 3GU |
| R5‑185365 | Update to test case 6.3.2G.3 for LTE-based V2X Services | KTL | imported from 3GU |
| R5‑185366 | Update of V2X test case 6.7G.2 | SRTC | imported from 3GU |
| R5‑185367 | Addition of new TC 6.6.2.3G.2 | SRTC | imported from 3GU |
| R5‑185368 | Introduction of new V2X test case 6.5.2.1G.2 Error Vector Magnitude (EVM) for V2X Communication / Simultaneous E-UTRA V2X sidelink and E-UTRA uplink transmissions | CAICT | imported from 3GU |
| R5‑185369 | Introduction of new V2X test case 6.5.2.1G.3 Error Vector Magnitude (EVM) for V2X Communication / Intra-band contiguous multi-carrier operation | CAICT | imported from 3GU |
| R5‑185370 | Update to Additional Maximum Power Reduction (A-MPR) for V2X Communication / Simultaneous E-UTRA V2X sidelink and E-UTRA uplink transmissions | LG Electronics | imported from 3GU |
| R5‑185371 | Updates to Align Initial Conditions with Other V2X Test Cases | PCTEST Engineering Lab | imported from 3GU |
| R5‑185372 | Update of V2X Receiver Test Cases | SGS Wireless | imported from 3GU |
| R5‑185373 | Update of V2X RRM | SGS Wireless, Huawei | imported from 3GU |
| R5‑185374 | Addition of test applicabilities of multiple V2X test cases | Huawei,HiSilicon | imported from 3GU |
| R5‑185375 | Correction to 4x4 CA demodulation tests | Anritsu | imported from 3GU |
| R5‑185376 | Add a new test condition for test case 8.13.3.1.2.5. | CGC Inc. | imported from 3GU |
| R5‑185377 | TS 36.521-1 Annex F update for UE cat 1bis test cases | Qualcomm Incorporated | imported from 3GU |
| R5‑185378 | LTE_New test case LTE_New test case 6.3.4EB ONOFF time mask for UE category 1bis | Qualcomm Incorporated | imported from 3GU |
| R5‑185379 | LTE_New test case 6.3.5EB Power Control for UE category 1bis | Qualcomm Incorporated | imported from 3GU |
| R5‑185380 | LTE_New test case 6.3.2EB Minimum Output Power for UE category 1bis | Qualcomm Incorporated | imported from 3GU |
| R5‑185381 | LTE_New test case 6.2.4EB Additional Maximum Power Reduction (A-MPR) for UE category 1bis | Qualcomm Incorporated | imported from 3GU |
| R5‑185382 | LTE_New test case 6.3.3EB UE Transmit OFF power for UE category 1bis | Qualcomm Incorporated | imported from 3GU |
| R5‑185383 | LTE_New test case 6.2.5EB Configured UE transmitted Power for UE category 1bis | Qualcomm Incorporated | imported from 3GU |
| R5‑185384 | LTE_New test case 6.2.3EB Maximum Power Reduction (MPR) for UE category 1bis | Qualcomm Incorporated | imported from 3GU |
| R5‑185385 | Cat1bis new RF test case: Transmit intermodulation for UE category 1bis | Qualcomm Austria | imported from 3GU |
| R5‑185386 | Completion of Chapter 7 RRM cat 1bis test cases | Qualcomm UK Ltd | imported from 3GU |
| R5‑185387 | Introduction of FDD PDSCH Single-layer Spatial Multiplexing for FD-MIMO | TTA | imported from 3GU |
| R5‑185388 | Introduction of TDD PDSCH Single-layer Spatial Multiplexing for FD-MIMO | TTA | imported from 3GU |
| R5‑185389 | Applicabilities addition of test cases 8.3.1.1.9 and 8.3.2.1.10 | TTA | imported from 3GU |
| R5‑185390 | DL and UL RMC updated for FR1 tests | Bureau Veritas | imported from 3GU |
| R5‑185391 | Test Tolerance: Updates to Cat1bis inter frequency RSRP accuracy tests and Annex F | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑185392 | Test Tolerance: Updates to Cat1bis inter frequency RSRQ accuracy tests and Annex F | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑185393 | Test Tolerance: Updates to Cat1bis intra frequency RSRP accuracy tests and Annex F | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑185394 | Test Tolerance: Updates to Cat1bis intra frequency RSRQ accuracy tests and Annex F | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑185395 | Test Tolerance Analysis for RRM TC 9.1.1.1_2 and 9.1.2.1_2 | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑185396 | Test Tolerance Analysis for RRM TC 9.1.1.2_2 and 9.1.2.2_2 | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑185397 | Test Tolerance Analysis for RRM TC 9.1.3.1_2 and 9.1.4.1_2 | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑185398 | Test Tolerance Analysis for RRM TC 9.1.3.2_2 and 9.1.4.2_2 | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑185399 | Test Tolerance Analysis for RRM TC 9.1.5.1_2 | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑185400 | Test Tolerance Analysis for RRM TC 9.1.5.2_2 | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑185401 | Test Tolerance Analysis for RRM TC 9.2.3.1_2 and 9.2.4.1_2 | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑185402 | Test Tolerance Analysis for RRM TC 9.2.3.2_2 and 9.2.4.2_2 | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑185403 | Test Tolerance Analysis for RRM TC 9.2.4A.1_2 | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑185404 | Test Tolerance Analysis for RRM TC 9.2.4A.2_2 | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑185405 | Test Tolerance Analysis for RRM TC 9.2.1.1_2 and 9.2.2.1_2 | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑185406 | Introduction of Additional spurious emissions for UL 256QAM | TTA | imported from 3GU |
| R5‑185407 | Addition of applicability for TC6.6.3.3_2 | TTA | imported from 3GU |
| R5‑185408 | TP for updating test case 6.2.3 UE AMPR | Ericsson LM | imported from 3GU |
| R5‑185409 | Addition of NB-IOT Guardband Test Frequencies for 10 MHz | ROHDE & SCHWARZ | imported from 3GU |
| R5‑185410 | Discussion on approach for defining EN-DC tests in TS 38.521-3 | Qualcomm Wireless GmbH | imported from 3GU |
| R5‑185411 | Update of FR1 test case 6.2.2 | CAICT | imported from 3GU |
| R5‑185412 | TP for updating TR 38.905 with EVM test point analysis | ROHDE & SCHWARZ | imported from 3GU |
| R5‑185413 | 5G NR_FR1_Text_update for TX Spurious Emission | Qualcomm Incorporated | imported from 3GU |
| R5‑185414 | Update to Occupied Bandwidth, SEM and ACLR test cases in TS 38.521-1 | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑185415 | Update to ACS and in-band blocking test cases in TS 38.521-1 | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑185416 | Correction to nrs-CRS-PowerOffset-r13 for NB-IOT OTDOA tests | ROHDE & SCHWARZ | imported from 3GU |
| R5‑185417 | NB-IOT OTDOA reporting delay test cases not testable | ROHDE & SCHWARZ | imported from 3GU |
| R5‑185418 | Correction of the applicability for OTDOA IOT tests | ROHDE & SCHWARZ | imported from 3GU |
| R5‑185419 | Changes to eMTC OTDOA tests | ROHDE & SCHWARZ | imported from 3GU |
| R5‑185420 | Addition of Assistance Data for OTDOA eMTC tests | ROHDE & SCHWARZ | imported from 3GU |
| R5‑185421 | Addition of missing assistance data for modernized GPS and the GPS L5 signal for LTE minimum performance sub-test 4 | Spirent Communications | imported from 3GU |
| R5‑185422 | Alignment of Annex numbering with core spec | Qualcomm Wireless GmbH | imported from 3GU |
| R5‑185423 | Discussion on Uplink configuration for NR Transmit Intermodulation in FR1 | KTL | imported from 3GU |
| R5‑185424 | Addition of TT analysis of eHST FDD Intra-frequency event reporting. | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑185425 | Addition of TT analysis of V2X uplink timing test case | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑185426 | New test case: 6.2.3A.3_2, Maximum Power Reduction (MPR) for CA (intra-band non-contiguous DL CA and UL CA) for UL 256QAM | Ericsson | imported from 3GU |
| R5‑185427 | New UL 256QAM test case: 6.6.2.2_2 Additional Spectrum Emission Mask for UL 256QAM | Ericsson | imported from 3GU |
| R5‑185428 | Applicability for New UL 256QAM test cases: 6.6.2.2_2 and 6.6.2.3A.3_2 | Ericsson | imported from 3GU |
| R5‑185429 | Test Point Analysis for Reference sensitivity level for EN-DC | Qualcomm Incorporated | imported from 3GU |
| R5‑185430 | TP for updating TR38.905 with UE AMPR for NS_04 Intra-band contigous EN-DC | Ericsson LM | imported from 3GU |
| R5‑185431 | eLAA_correction to 6.3.5A.1.2 and 6.3.5A.2.2 | Tejet | imported from 3GU |
| R5‑185432 | eLAA_Update to 6.6.3.1A.2 | Tejet | imported from 3GU |
| R5‑185433 | eLAA: Updates to Adjacent Channel Leakage power Ratio for CA | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑185434 | Addition of new UL 256QAM test case - A-MPR for 2UL CA intra-band contiguous | CETECOM GmbH | imported from 3GU |
| R5‑185435 | Correction of test points and test requirements for TC 6.2.4A.2_1 | CETECOM GmbH | imported from 3GU |
| R5‑185436 | Correction of test points and test requirements for TC 6.2.4A.2 | CETECOM GmbH | imported from 3GU |
| R5‑185437 | Test point and test requirements analysis for CA_3A-41A, 41A-42A,3A-42A spurious test cases | Huawei, Hisilicon | imported from 3GU |
| R5‑185438 | Introcution of V2X TC 6.5.2.4G.3 | Huawei, Hisilicon | imported from 3GU |
| R5‑185439 | Updation of V2X TC 6.6.2.2G.2 | Huawei, Hisilicon | imported from 3GU |
| R5‑185440 | Updation of V2X TCs 6.5.2.3G.2 and 6.5.2.3G.3 | Huawei, Hisilicon | imported from 3GU |
| R5‑185441 | TT statements for V2X TCs | Huawei, Hisilicon | imported from 3GU |
| R5‑185442 | Applicability and ICS for CA RF and RRM test cases | Bureau Veritas, Ericsson LM, KT Corp., Vodafone GmbH, Huawei,HiSilicon, SRTC, KDDI Corporation, SGS Wireless, CGC Inc. | imported from 3GU |
| R5‑185443 | Correction to power level for FR1 RF tests | Anritsu | imported from 3GU |
| R5‑185444 | Updates of FR1 TRx MU in Annex F | NTT DOCOMO, INC. | imported from 3GU |
| R5‑185445 | Update to FR1 test case 6.5.4 Transmit intermodulation | KTL, MTCC | imported from 3GU |
| R5‑185446 | Introduction of 6.2C.1 Configured transmitted power for SUL | Huawei, Hisilicon | imported from 3GU |
| R5‑185447 | 5G_NR FR1_Text_update for_RX_sensitivity | Qualcomm Incorporated | imported from 3GU |
| R5‑185448 | Corrections to A-MPR values for NS_27 | Rohde & Schwarz | imported from 3GU |
| R5‑185449 | Correction to Figure A.64 to cater for CC >= 3 | Anritsu | imported from 3GU |
| R5‑185450 | Correction to message exception for 8.2.1.4.2_A.4 | Anritsu | imported from 3GU |
| R5‑185451 | Editorial correction to RMC name in PHICH demodulation test | Anritsu | imported from 3GU |
| R5‑185452 | Corrections to CA Test Configuration Table in section 7 | Anritsu | imported from 3GU |
| R5‑185453 | Addition of applicability of RRM IncMon test cases | Ericsson | imported from 3GU |
| R5‑185454 | Addition of antenna diagrams for IncMon RRM test cases | Ericsson | imported from 3GU |
| R5‑185455 | Addition of message content for RRM IncMon test cases | Ericsson | imported from 3GU |
| R5‑185456 | TC Group definition for RRM IncMon test cases | Ericsson | imported from 3GU |
| R5‑185457 | Addition of RRM IncMon new Test Case 8.4.8 | Ericsson | imported from 3GU |
| R5‑185458 | Addition of RRM IncMon new Test Case 8.4.9 | Ericsson | imported from 3GU |
| R5‑185459 | Addition of RRM IncMon new Test Case 8.5.8 | Ericsson | imported from 3GU |
| R5‑185460 | Addition of RRM IncMon new Test Case 8.6.3 | Ericsson | imported from 3GU |
| R5‑185461 | Addition of RRM IncMon new Test Case 8.7.5 | Ericsson | imported from 3GU |
| R5‑185462 | Addition of RRM IncMon new Test Case 8.7A.1 | Ericsson | imported from 3GU |
| R5‑185463 | Addition of RRM IncMon new Test Cases 4.2.1 and 4.2.11 | Ericsson | imported from 3GU |
| R5‑185464 | Addition of RRM IncMon new Test Case 4.3.1.5 | Ericsson | imported from 3GU |
| R5‑185465 | Addition of RRM IncMon new Test Case 4.3.2A | Ericsson | imported from 3GU |
| R5‑185466 | Addition of RRM IncMon new Test Case 4.3.3A | Ericsson | imported from 3GU |
| R5‑185467 | Addition of RRM IncMon new Test Case 4.3.4.4 | Ericsson | imported from 3GU |
| R5‑185468 | Discussion on approach for defining EN-DC tests in TS 38.521-3 | Qualcomm Wireless GmbH | imported from 3GU |
| R5‑185469 | TP for updating test case 6.2B.3.1 UE AMPR for Intra-band contigous EN-DC | Ericsson LM | imported from 3GU |
| R5‑185470 | TP for updating test case 6.2B.3.2 UE AMPR for Intra-band non-contigous EN-DC | Ericsson LM | imported from 3GU |
| R5‑185471 | TP for updating test case 6.5B.2.1.2 Additional spectrum emission mask for intra-band contigous EN-DC | Ericsson LM | imported from 3GU |
| R5‑185472 | Update of TC 6.2B.1.1 | Huawei, Hisilicon | imported from 3GU |
| R5‑185473 | Introduction of TC 6.2B.1.2 | Huawei, Hisilicon | imported from 3GU |
| R5‑185474 | Update of 6.2B.1.3 | Huawei, Hisilicon | imported from 3GU |
| R5‑185475 | Introduction of TC 7.4B.1 | Huawei, Hisilicon | imported from 3GU |
| R5‑185476 | Introduction of 7.4B.2 | Huawei, Hisilicon | imported from 3GU |
| R5‑185477 | Introduction of 7.4B.3 | Huawei, Hisilicon | imported from 3GU |
| R5‑185478 | Discussion on OBW, SEM and ACLR for EN-DC interband FR1 | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑185479 | Update Occupied Bandwidth for interband EN-DC within FR1 | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑185480 | Update SEM interband EN-DC within FR1 | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑185481 | Update ACLR for interband EN-DC within FR1 | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑185482 | 5G NR_EN_DC with FR1_Text update for RX sensitivity | Qualcomm Incorporated | imported from 3GU |
| R5‑185483 | Editorial corrections 9.1.46 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑185484 | Editorial corrections 9.1.50 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑185485 | Update of RRM IncMon test cases 8.3.7, 8.3.8, 8.3.9, 8.4.7 including test tolerances | Ericsson | imported from 3GU |
| R5‑185486 | CA_3A-18A and 1A-3A-18A - Updates of A.4.6.3 | KDDI Corporation | imported from 3GU |
| R5‑185487 | 5G NR_EN_DC with FR1_Text_proposal for_TX_Spurious_emission | Qualcomm Incorporated | imported from 3GU |
| R5‑185488 | Applicability for DL256QAM RF test cases 7.4A.7_H,7.4A.8_H,8.7.1.1_H.4 and 8.7.1.1_H.5 | SRTC | imported from 3GU |
| R5‑185489 | FR2_TxSpurious_TestPointAnalysis | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑185490 | FR2_TxSpurious_TestConfig_38.521-2 | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑185491 | Test Point analysis for FR2 TxSpurious test case | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑185492 | Quality of Quiet Zone Results for IFF | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑185493 | Correction of test configuration of CA_20A-42A REFSENS | Huawei,HiSilicon | imported from 3GU |
| R5‑185494 | Update of 7.3A.5 REFSENS for Rel-13 CA configurations | Huawei,HiSilicon | imported from 3GU |
| R5‑185495 | Update of FR1 test case 6.3.3.2 | Huawei,HiSilicon | imported from 3GU |
| R5‑185496 | 5G NR_FR1_Text_update for TX Spurious Emission UE-Co-exist | Qualcomm Incorporated | imported from 3GU |
| R5‑185497 | New test case 6.3.5FA.1 Power Control Absolute power tolerance for category NB1 and NB2/Power Class 6 | CAICT | imported from 3GU |
| R5‑185498 | New test case 6.3.5FA.2 Power Control Relative power tolerance for category NB1 and NB2/Power Class 6 | CAICT | imported from 3GU |
| R5‑185499 | New test case 6.3.5FA.3 Aggregate power control tolerance for category NB1 and NB2/Power Class 6 | CAICT | imported from 3GU |
| R5‑185500 | 5G NR_Proposal of TS38.521-1 annex C.0_Downlink signal levels | Qualcomm Incorporated | imported from 3GU |
| R5‑185501 | 5G NR_FR1_Text_Update_for_TX_ Additional spurious emissions | Qualcomm Incorporated | imported from 3GU |
| R5‑185502 | Addition of new CA band combination – Updates of test points analysis | SGS Wireless | imported from 3GU |
| R5‑185503 | Add Clause 7.5B.1 into TS 38.521-3 | CMCC | imported from 3GU |
| R5‑185504 | Add Clause 7.5B.2 into TS 38.521-3 | CMCC | imported from 3GU |
| R5‑185505 | Add Clause 7.5B.3 into TS 38.521-3 | CMCC | imported from 3GU |
| R5‑185506 | Addition of new 3CA band combination for CA REFSENS | SGS Wireless | imported from 3GU |
| R5‑185507 | Addition of 6.2B.4.1.3 Configured OP for Intre-Band within FR1 | Huawei,HiSilicon | imported from 3GU |
| R5‑185508 | Introduction of Additional Maximum Power Reduction (A-MPR) for CA (3UL CA) | SGS Wireless | imported from 3GU |
| R5‑185509 | Introduction of General ON/OFF time mask for CA (3UL CA) | SGS Wireless | imported from 3GU |
| R5‑185510 | Addition of TC6.3B.1.1 Minimum Output power for intra-band contiguous EN-DC | SGS Wireless | imported from 3GU |
| R5‑185511 | Addition of TC6.3B.1.2 Minimum output power for intra-band non-contiguous EN-DC | SGS Wireless | imported from 3GU |
| R5‑185512 | Addition of TC6.3B.1.3 Minimum output power for inter-band EN-DC within FR1 | SGS Wireless | imported from 3GU |
| R5‑185513 | Optimization of test configuration table for Rx CA test cases | NTT DOCOMO, INC. | imported from 3GU |
| R5‑185514 | Updates of receiver test cases for CA_XA-YE | NTT DOCOMO, INC. | imported from 3GU |
| R5‑185515 | Updates of receiver test cases for CA_XA-YD | NTT DOCOMO, INC. | imported from 3GU |
| R5‑185516 | Addition of Band 74 information into TS 34.121-1 | NTT DOCOMO, INC. | imported from 3GU |
| R5‑185517 | Updates of Band 74 information about Tx test cases in TS 36.521-1 | NTT DOCOMO, INC. | imported from 3GU |
| R5‑185518 | Proposal on MU and TT table format in TS 38.521-2 | NTT DOCOMO, INC. | imported from 3GU |
| R5‑185519 | Updates of FR2 TRx MU and TT in Annex | NTT DOCOMO, INC. | imported from 3GU |
| R5‑185520 | Addition of TRx MU and TT in TS 38.521-3 Annex | NTT DOCOMO, INC. | imported from 3GU |
| R5‑185521 | OCNG Patterns updated for FR1 tests | Bureau Veritas | imported from 3GU |
| R5‑185522 | Update Clause in 6.2.5EA Configured UE transmitted Power for UE category M1 | Qualcomm Incorporated | imported from 3GU |
| R5‑185523 | FR2_UE_BeamlockMode_IE_38.509 | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑185524 | Introduction of TC 7.6.3 Out-of-band blocking | CAICT | imported from 3GU |
| R5‑185525 | Treatment of power supply cable for FR2 UE tests | Anritsu | imported from 3GU |
| R5‑185526 | Offset in quality of quiet zone evaluation | Anritsu | imported from 3GU |
| R5‑185527 | Testability issue of low PSD test cases in FR2 | Anritsu | imported from 3GU |
| R5‑185528 | Table format correct and removed redundant line for RF clause 7 test cases | Bureau Veritas | imported from 3GU |
| R5‑185529 | Test approach of EN-DC Rx tests with multiple LTE/NR CCs | Anritsu | imported from 3GU |
| R5‑185530 | Clarification on frame structure in 4Rx performance and CSI test principles sections | Qualcomm Wireless GmbH | imported from 3GU |
| R5‑185531 | MU and TT of EN-DC test cases in TS 38.521-3 | NTT DOCOMO, INC. | imported from 3GU |
| R5‑185532 | Proposal for 5G NR EVM Test Tolerance | Qualcomm Incorporated | imported from 3GU |
| R5‑185533 | Discussion on UL RMC for FR2 spurious test | Anritsu | imported from 3GU |
| R5‑185534 | Discussion on Test Tolerance for FR2 | Intel Corporation (UK) Ltd, Apple Inc. | imported from 3GU |
| R5‑185535 | Update to General ON/OFF time mask for V2X Communication / Simultaneous E-UTRA V2X sidelink and E-UTRA uplink transmissions | LG Electronics. | imported from 3GU |
| R5‑185536 | Correction of GNSS information for V2X tests | Spirent Communications, European Commission | imported from 3GU |
| R5‑185537 | CR of CQI reporting test case 9.2.1.1.4.2 | Huawei, Hisilicon | imported from 3GU |
| R5‑185538 | Introduction of new test case TC 6.2.5A.4 Configured UE transmitted Output Power for CA (3UL CA) | 7LAYERS GmbH | imported from 3GU |
| R5‑185539 | Introduction of new test case TC 6.6.2.1A.4^^Spectrum emission mask for CA (3UL CA) | 7LAYERS GmbH | imported from 3GU |
| R5‑185540 | Update of test case TC 6.7A.4 "Transmit intermodulation for CA (3DL CA and 3UL CA)" | 7LAYERS GmbH | imported from 3GU |
| R5‑185541 | Correction of applicability to TS 36.521-2 for HPUE RF test cases | CMCC | imported from 3GU |
| R5‑185542 | CA_3A-18A - Updates of some Tx test cases | KDDI Corporation | imported from 3GU |
| R5‑185543 | CA_3A-18A - Updates of test points analysis | KDDI Corporation | imported from 3GU |
| R5‑185544 | New TC 8.16.83: 3 DL CA Event Triggered Reporting under Deactivated SCells in Non-DRX with generic duplex modes | Intel Corporation (UK) Ltd | imported from 3GU |
| R5‑185545 | New TC 8.16.84: 3 DL CA Event Triggered Reporting on Deactivated SCell with PCell and SCell Interruptions in Non-DRX with generic duplex modes | Intel Corporation (UK) Ltd | imported from 3GU |
| R5‑185546 | New TC 8.16.85: 3 DL CA Activation and Deactivation of Known SCell in Non-DRX with generic duplex modes | Intel Corporation (UK) Ltd | imported from 3GU |
| R5‑185547 | New TC 8.16.86: 3 DL CA Activation and Deactivation of Unknown SCell in Non-DRX with generic duplex modes | Intel Corporation (UK) Ltd | imported from 3GU |
| R5‑185548 | Band 41 HPUE Maximum Output Power | CMCC | imported from 3GU |
| R5‑185549 | Correction to band selection criteria applicability for HPUE devices that support Power Class 1 & 2 | Intel Corporation (UK) Ltd | imported from 3GU |
| R5‑185550 | Discussion on testing of fallback CA configurations in Rx CA test cases | Ericsson | imported from 3GU |
| R5‑185551 | Discussion paper on the applicability of the tests in 37.571-1 for all types and categories of UE | Spirent Communications, European Commission | imported from 3GU |
| R5‑185552 | Applicability of tests for types and Categories of UE | Spirent Communications, European Commission | imported from 3GU |
| R5‑185553 | Proposal for LTE 256QAM EVM Test Tolerance | Qualcomm Incorporated | imported from 3GU |
| R5‑185554 | Test tolerance update of V2X uplink timing test cases | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑185555 | FR2_UE_BeamlockInvoke_38.521-2 | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑185556 | FR2_UE_BeamlockInvoke_38.521-3 | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑185557 | FR2_UE_BeamlockProcedure_38.508-1 | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑185558 | Discussion_38.521-3_ApplicabilityRules | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑185559 | FR2_38.521-3_Applicability_SpuriousEmissions | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑185560 | FR2_38.522_Applicability_SpuriousEmissions | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑185561 | Discussion_FR2_StoreTxRxBeamPeakCoordinates | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑185562 | FR2_StoreTxRxBeamPeakCoordinates_38.521-2 | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑185563 | FR2_StoreTxRxBeamPeakCoordinates_38.521-3 | Qualcomm Europe Inc. (Spain) | imported from 3GU |
| R5‑185564 | FR1 TT Way Forward update | Telecom Italia S.p.A. | imported from 3GU |
| R5‑185565 | Updates of FR1 TRx TT in Annex F | NTT DOCOMO, INC. | imported from 3GU |
| R5‑185566 | Discussion on TT for Max Output Power TC Requirements for FR2 | Intel Corporation (UK) Ltd, Apple Inc. | imported from 3GU |
page generated from database: 2024-05-06 06:38:32