3GPP TDocs (written contributions) at meeting
Meeting: R5-81 - 2018-11-12 to 2018-11-16, Spokane
meeting id: R5-81 (click id for more info on this meeting)Click on the Tdoc to open its file.
| TDoc | Title | Source | Remarks |
|---|---|---|---|
| R5‑186400 | Agenda - opening session | WG Chairman | imported from 3GU |
| R5‑186401 | Agenda - mid week session | WG Chairman | imported from 3GU |
| R5‑186402 | Agenda - closing session | WG Chairman | imported from 3GU |
| R5‑186403 | RAN5#81 Session Programme | WG Chairman | imported from 3GU |
| R5‑186404 | RAN5 Leadership Team | WG Chairman | imported from 3GU |
| R5‑186405 | RAN5#80 WG Minutes | ETSI Secretariat | imported from 3GU |
| R5‑186406 | RAN5#80 WG Action Points | ETSI Secretariat | imported from 3GU |
| R5‑186407 | RAN5#3 5G-NR Adhoc Minutes | ETSI Secretariat | imported from 3GU |
| R5‑186408 | Latest RAN Plenary notes | WG Chairman | imported from 3GU |
| R5‑186409 | Latest RAN Plenary draft Report | WG Chairman | imported from 3GU |
| R5‑186410 | Post Plenary Active Work Item update | ETSI Secretariat | imported from 3GU |
| R5‑186411 | RAN5 SR to RP#81 | WG Chairman | imported from 3GU |
| R5‑186412 | TF160 SR to RP#81 | WG Chairman | imported from 3GU |
| R5‑186413 | RAN Chair Report to SA#81 | WG Chairman | imported from 3GU |
| R5‑186414 | RAN5#81 LS Template | WG Chairman | imported from 3GU |
| R5‑186415 | RAN5 5GS Text Proposal / pCR cover sheet template | Ericsson | imported from 3GU |
| R5‑186416 | Meeting schedule for 2018-19 | WG Chairman | imported from 3GU |
| R5‑186417 | WI Progress and Target Completion Date Review | WG Chairman | imported from 3GU |
| R5‑186418 | Review deadlines for next quarter | WG Chairman | imported from 3GU |
| R5‑186419 | Input to TF160 and RAN5 Regarding TTCN Development | PTCRB | imported from 3GU |
| R5‑186420 | LS on Joint ETSI - OSA Workshop: Open Implementations & Standardization | ETSI | imported from 3GU |
| R5‑186421 | Carrier Aggregation Optimization | PTCRB PVG | imported from 3GU |
| R5‑186422 | LS on Definition of test methods for OTA unwanted emissions of IMT radio equipment | TSG RAN | imported from 3GU |
| R5‑186423 | Reply LS on LTE OTA TRP and TRS requirements definition in 3GPP | TSG RAN | imported from 3GU |
| R5‑186424 | LS to RAN5 on TM9 FGI bits 103 and 104 | TSG RAN | imported from 3GU |
| R5‑186425 | dummy LS a | ETSI Secretariat | imported from 3GU |
| R5‑186426 | dummy LS b | ETSI Secretariat | imported from 3GU |
| R5‑186427 | Update SIB1 | Ericsson, Huawei, HiSilicon | imported from 3GU |
| R5‑186428 | Addition of new Test Configuration on TC 6.2.2A.2 | DEKRA | imported from 3GU |
| R5‑186429 | Addition of new Test Configuration on TC 6.2.3A.2 | DEKRA | imported from 3GU |
| R5‑186430 | Addition of new Test Configuration on TC 6.2.3A.2_1 | DEKRA | imported from 3GU |
| R5‑186431 | Addition of new Test Configuration on TC 6.2.4A.2 | DEKRA | imported from 3GU |
| R5‑186432 | Addition of new Test Configuration on TC 6.2.4A.2_1 | DEKRA | imported from 3GU |
| R5‑186433 | Addition of new Test Configuration on TC 6.2.5A.3 | DEKRA | imported from 3GU |
| R5‑186434 | Addition of new Test Configuration on TC 6.3.4A.1.2 | DEKRA | imported from 3GU |
| R5‑186435 | Addition of new Test Configuration on TC 6.3.5A.1.2 | DEKRA | imported from 3GU |
| R5‑186436 | Addition of new Test Configuration on TC 6.3.5A.3.2 | DEKRA | imported from 3GU |
| R5‑186437 | Addition of new Test Configuration on TC 6.5.1A.2 | DEKRA | imported from 3GU |
| R5‑186438 | Addition of new Test Configuration on TC 6.5.2A.1.2 | DEKRA | imported from 3GU |
| R5‑186439 | Addition of new Test Configuration on TC 6.5.2A.1.2_1 | DEKRA | imported from 3GU |
| R5‑186440 | Addition of new Test Configuration on TC 6.5.2A.2.2 | DEKRA | imported from 3GU |
| R5‑186441 | Addition of new Test Configuration on TC 6.5.2A.3.2 | DEKRA | imported from 3GU |
| R5‑186442 | Addition of new Test Configuration on TC 6.6.1A.2 | DEKRA | imported from 3GU |
| R5‑186443 | Addition of new Test Configuration on TC 6.6.2.1A.2 | DEKRA | imported from 3GU |
| R5‑186444 | Addition of new Test Configuration on TC 6.6.2.2A.2_1 | DEKRA | imported from 3GU |
| R5‑186445 | Addition of new Test Configuration on TC 6.6.2.2A.2_1 | DEKRA | imported from 3GU |
| R5‑186446 | Addition of new Test Configuration on TC 6.6.2.3A.2 | DEKRA | imported from 3GU |
| R5‑186447 | Addition of new Test Configuration on TC 6.6.2.3A.2_1 | DEKRA | imported from 3GU |
| R5‑186448 | Addition of new Test Configuration on TC 6.6.3.1A.2 | DEKRA | imported from 3GU |
| R5‑186449 | Addition of new Test Configuration on TC 6.7A.2 | DEKRA | imported from 3GU |
| R5‑186450 | Addition of test point calculation for BW combination 75-25 in TC 6.2.4A.2 | DEKRA | imported from 3GU |
| R5‑186451 | Discussion paper on Session Timer coverage | ROHDE & SCHWARZ, Intel | imported from 3GU |
| R5‑186452 | Corrections to IMS test case G.17.2 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑186453 | Updates to clause 4.3.3,^^physical channel allocations | Ericsson | imported from 3GU |
| R5‑186454 | TP analysis for test case 6.5.2.4.2 | Ericsson | imported from 3GU |
| R5‑186455 | TP analysis for EN-DC test case 6.2B.2.3 | Ericsson | imported from 3GU |
| R5‑186456 | Corrections to C.32 and C.32a | ROHDE & SCHWARZ | imported from 3GU |
| R5‑186457 | Correction to E-UTRA test frequency for intra-band contiguous configuration for band 41 | Ericsson | imported from 3GU |
| R5‑186458 | Corrections to EMM test case 9.2.3.1.8b | ROHDE & SCHWARZ, INTEL | imported from 3GU |
| R5‑186459 | Corrections to IMS test case 15.25 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑186460 | Update Clause 1 Scope of TS 38.522 | CMCC | imported from 3GU |
| R5‑186461 | Update Clause 3 of TS 38.522 | CMCC | imported from 3GU |
| R5‑186462 | TP for Clause 4.1.1 of TS 38.522 | CMCC | imported from 3GU |
| R5‑186463 | TP for Clause 4.1.2 of TS 38.522 | CMCC | imported from 3GU |
| R5‑186464 | TP for Clause 4.1.3 of TS 38.522 | CMCC | imported from 3GU |
| R5‑186465 | Introduction of TC 7.7D Spurious response for UL-MIMO | CMCC, Huawei | imported from 3GU |
| R5‑186466 | Correction to TC 7.7B Spurious response for UL-MIMO | CMCC | imported from 3GU |
| R5‑186467 | Clarifications on applicability of OIR and TIR | ROHDE & SCHWARZ | imported from 3GU |
| R5‑186468 | E-UTRA test frequencies for EN-DC intra-band contiguous configurations for band 71 | Ericsson | imported from 3GU |
| R5‑186469 | Addition to E-UTRA test frequencies for intra-band contiguous configuration for band 41 | Ericsson | imported from 3GU |
| R5‑186470 | Wordings for Uplink NAS messages | ROHDE & SCHWARZ | imported from 3GU |
| R5‑186471 | Impacted 5G NR TSs and clauses by agreed CRs at RAN5#3-5G-NR ad-hoc | Ericsson | imported from 3GU |
| R5‑186472 | NB-IoT Band70 In-band frequency for 10Mhz Mid range | ROHDE & SCHWARZ | imported from 3GU |
| R5‑186473 | New NCell for NB-IOT RRM Intra-Freq Cell reselection | ROHDE & SCHWARZ | imported from 3GU |
| R5‑186474 | Chapter 9 RRM Generic CA tests - Anpplicability | ROHDE & SCHWARZ | imported from 3GU |
| R5‑186475 | Completion of TC 9.1.69 and 9.1.70 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑186476 | Completion of TC 9.2.56 and 9.2.57 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑186477 | Chapter 9 RRM Generic CA tests - Annexes | ROHDE & SCHWARZ | imported from 3GU |
| R5‑186478 | Alignment NPRACH configuration (Editorial) | ROHDE & SCHWARZ | imported from 3GU |
| R5‑186479 | Correction for 4.2.19 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑186480 | Correction for 4.2.24 Cell ID selection procedure | ROHDE & SCHWARZ | imported from 3GU |
| R5‑186481 | Core spec alignment 4.2.24 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑186482 | Corrections for 7.2.6 and 7.2.7 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑186483 | Correction for 7.3.50 and 7.3.51 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑186484 | Correction for 8.1.28 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑186485 | Removal of reference to H.7.1-2 for RRM 7.3.5x series | ROHDE & SCHWARZ | imported from 3GU |
| R5‑186486 | Add band group FDD B1 and B2 to RSRQ tests - Rel8 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑186487 | Add band group FDD B1 and B2 to RSRQ tests - Rel11 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑186488 | Add band group FDD B1 and B2 to RSRQ tests - Rel12 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑186489 | Resubmission of CR 0269 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑186490 | Update chapter 4.5 for RF connected procedure | Ericsson | imported from 3GU |
| R5‑186491 | Update chapter 4.5 for RF connected procedure | Ericsson, Keysight Technologies | imported from 3GU |
| R5‑186492 | Update chapter 4.5.4 RRC_CONNECTED | Ericsson | imported from 3GU |
| R5‑186493 | Introduction of TC 7.6.4 Narrow-band blocking | CAICT | imported from 3GU |
| R5‑186494 | Introduction of TC 7.7 Spurious response | CAICT | imported from 3GU |
| R5‑186495 | Discussion on test point selection for NR Narrow-band in FR1 | CAICT | imported from 3GU |
| R5‑186496 | Discussion on test point selection for NR Spurious response in FR1 | CAICT | imported from 3GU |
| R5‑186497 | CR to TS 38.521-1: pi/2 BPSK on n41 | CMCC, Huawei | imported from 3GU |
| R5‑186498 | Corrections to NAS test case 9.1.5.1.14 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑186499 | Default cell configurations for NAS | ROHDE & SCHWARZ | imported from 3GU |
| R5‑186500 | Update IE SI-SchedulingInfo | Ericsson, Huawei, HiSilicon | imported from 3GU |
| R5‑186501 | Applicability rules implementation in 38.522 | Qualcomm Finland RFFE Oy | imported from 3GU |
| R5‑186502 | FR2 Spurious Emission test case updates | Qualcomm Finland RFFE Oy | imported from 3GU |
| R5‑186503 | FR2 Spurious Emission test case updates | Qualcomm Finland RFFE Oy | imported from 3GU |
| R5‑186504 | FR2 RefSens test case updates | Qualcomm Finland RFFE Oy | imported from 3GU |
| R5‑186505 | Update Text on Store Beam Peak Coordinate | Qualcomm Finland RFFE Oy | imported from 3GU |
| R5‑186506 | Update Text on Store Beam Peak Coordinate | Qualcomm Finland RFFE Oy | imported from 3GU |
| R5‑186507 | 38.521-3 Applicability Rules | Qualcomm Finland RFFE Oy | imported from 3GU |
| R5‑186508 | FR2 UE and TE radiated connection diagram | Qualcomm Finland RFFE Oy | imported from 3GU |
| R5‑186509 | FR2 Spurious Emission measurement grids and offset values | Qualcomm Inc, Anritsu. | imported from 3GU |
| R5‑186510 | Structure updates to Annex C and G | Qualcomm Finland RFFE Oy | imported from 3GU |
| R5‑186511 | Addition CA 2A2A29A and CA 2A2A29A30A 36.521-2 | ECIT | imported from 3GU |
| R5‑186512 | Addition CA 2A2A29A and CA 2A2A29A30A 36.523-2 | ECIT | imported from 3GU |
| R5‑186513 | Addition CA 2A29A66A 36.521-2 | ECIT | imported from 3GU |
| R5‑186514 | Addition CA 2A29A66A 36.523-2 | ECIT | imported from 3GU |
| R5‑186515 | Addition CA 2A30A66A66A 36.521-2 | ECIT | imported from 3GU |
| R5‑186516 | Addition CA 2A30A66A66A 36.523-2 | ECIT | imported from 3GU |
| R5‑186517 | Addition CA 7A66A and CA 2A7A66A 36.521-2 | ECIT | imported from 3GU |
| R5‑186518 | Addition CA 7A66A and CA 2A7A66A 36.523-2 | ECIT | imported from 3GU |
| R5‑186519 | Addition CA combination 36.521-1_CA_2A-2A-29A and CA_2A-2A-29A-30A | ECIT | imported from 3GU |
| R5‑186520 | Addition CA combination 36.521-1_CA_2A-29A-66A | ECIT | imported from 3GU |
| R5‑186521 | Addition CA 2A2A7A and CA 2A2A7A66A 36.521-2 | ECIT | imported from 3GU |
| R5‑186522 | Addition CA 2A2A7A and CA 2A2A7A66A 36.523-2 | ECIT | imported from 3GU |
| R5‑186523 | Addition CA 2A2A14A and CA 2A2A14A30A and CA 2A2A14A66A and CA 2A2A14A30A66A 36.521-2 | ECIT | imported from 3GU |
| R5‑186524 | Addition CA 2A2A14A and CA 2A2A14A30A and CA 2A2A14A66A and CA 2A2A14A30A66A 36.523-2 | ECIT | imported from 3GU |
| R5‑186525 | Addition CA 2A12A30A66A66A 36.521-2 | ECIT | imported from 3GU |
| R5‑186526 | Addition CA 2A12A30A66A66A 36.523-2 | ECIT | imported from 3GU |
| R5‑186527 | CA 2A14A30A66A66A 36.521-2 | ECIT | imported from 3GU |
| R5‑186528 | Addition CA 2A14A30A66A66A 36.523-2 | ECIT | imported from 3GU |
| R5‑186529 | Addition CA 2A14A66A66A and CA 2A2A14A66A66A 36.521-2 | ECIT | imported from 3GU |
| R5‑186530 | Addition CA 2A14A66A66A and CA 2A2A14A66A66A 36.523-2 | ECIT | imported from 3GU |
| R5‑186531 | Addition CA 2A29A30A66A 36.521-2 | ECIT | imported from 3GU |
| R5‑186532 | Addition CA 2A29A30A66A 36.523-2 | ECIT | imported from 3GU |
| R5‑186533 | Addition CA combination 36.521-1_CA_2A-12A-30A-66A-66A | ECIT | imported from 3GU |
| R5‑186534 | Addition CA combination 36.521-1_CA_2A-29A-30A-66A | ECIT | imported from 3GU |
| R5‑186535 | Addition CA 2A2A29A and CA 2A2A29A30A 36.521-2 | ECIT | imported from 3GU |
| R5‑186536 | Addition CA 2A2A29A and CA 2A2A29A30A 36.523-2 | ECIT | imported from 3GU |
| R5‑186537 | Addition CA 2A29A66A 36.521-2 | ECIT | imported from 3GU |
| R5‑186538 | Addition CA 2A29A66A 36.523-2 | ECIT | imported from 3GU |
| R5‑186539 | Addition CA 2A30A66A66A 36.521-2 | ECIT | imported from 3GU |
| R5‑186540 | Addition CA 2A30A66A66A 36.523-2 | ECIT | imported from 3GU |
| R5‑186541 | Addition CA 7A66A and CA 2A7A66A 36.521-2 | ECIT | imported from 3GU |
| R5‑186542 | Addition CA 7A66A and CA 2A7A66A 36.523-2 | ECIT | imported from 3GU |
| R5‑186543 | Addition CA combination 36.521-1_CA_2A-2A-29A and CA_2A-2A-29A-30A | ECIT | imported from 3GU |
| R5‑186544 | Addition CA combination 36.521-1_CA_2A-29A-66A | ECIT | imported from 3GU |
| R5‑186545 | Update chapter 4.5.4 RRC_CONNECTED | Ericsson | imported from 3GU |
| R5‑186546 | Correction of RRM IncMon TC 4.2.10 | Ericsson | imported from 3GU |
| R5‑186547 | Correction of RRM IncMon TC 4.2.11 | Ericsson | imported from 3GU |
| R5‑186548 | Correction of RRM IncMon TC 4.3.1.5 | Ericsson | imported from 3GU |
| R5‑186549 | Correction of RRM IncMon TC 4.3.2A | Ericsson | imported from 3GU |
| R5‑186550 | Correction of RRM IncMon TC 4.3.3A | Ericsson | imported from 3GU |
| R5‑186551 | Correction of RRM IncMon TC 4.3.4.4 | Ericsson | imported from 3GU |
| R5‑186552 | Correction of RRM IncMon TC 8.4.8 | Ericsson | imported from 3GU |
| R5‑186553 | Correction of RRM IncMon TC 8.4.9 | Ericsson | imported from 3GU |
| R5‑186554 | Correction of RRM IncMon TC 8.5.8 | Ericsson | imported from 3GU |
| R5‑186555 | Correction of RRM IncMon TC 8.6.3 | Ericsson | imported from 3GU |
| R5‑186556 | Correction of RRM IncMon TC 8.7.5 | Ericsson | imported from 3GU |
| R5‑186557 | Correction of RRM IncMon TC 8.7A.1 | Ericsson | imported from 3GU |
| R5‑186558 | Definition of additional cells for IncMon RRM Test Cases | Ericsson | imported from 3GU |
| R5‑186559 | Message content for IncMon RRM Test Cases | Ericsson | imported from 3GU |
| R5‑186560 | Applicability for IncMon RRM Test Cases | Ericsson | imported from 3GU |
| R5‑186561 | Cell Configuration for IncMon RRM Test Cases | Ericsson | imported from 3GU |
| R5‑186562 | New rows in Annex F tables for IncMon RRM Test Cases | Ericsson | imported from 3GU |
| R5‑186563 | Updates of MU in TS 38.521-1 Annex F during RAN5#81 | NTT DOCOMO, INC. | imported from 3GU |
| R5‑186564 | Updates of TT in TS 38.521-1 Annex F during RAN5#81 | NTT DOCOMO, INC. | imported from 3GU |
| R5‑186565 | Updates of MU in TS 38.521-2 Annex F during RAN5#81 | NTT DOCOMO, INC. | imported from 3GU |
| R5‑186566 | Updates of TT in TS 38.521-2 Annex F during RAN5#81 | NTT DOCOMO, INC. | imported from 3GU |
| R5‑186567 | Updates of MU in TS 38.521-3 Annex F during RAN5#81 | NTT DOCOMO, INC. | imported from 3GU |
| R5‑186568 | Updates of TT in TS 38.521-3 Annex F during RAN5#81 | NTT DOCOMO, INC. | imported from 3GU |
| R5‑186569 | Editorial_Cleaning up for description of test requirement in clause 6 | NTT DOCOMO, INC. | imported from 3GU |
| R5‑186570 | Editorial_Cleaning up for description of test requirement in clause 7 | NTT DOCOMO, INC. | imported from 3GU |
| R5‑186571 | Update Clause 7.5B.3 in TS 38.521-3 | CMCC | imported from 3GU |
| R5‑186572 | New NAS test case 9.1.3.1 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑186573 | New NAS test case 9.1.5.1.2 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑186574 | New NAS test case 9.1.6.1.4 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑186575 | Update IE ServingCellConfig | Ericsson | imported from 3GU |
| R5‑186576 | Addition of applicability for NAS test case 9.1.5.1.14 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑186577 | Addition of applicability for new NAS test case 9.1.3.1 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑186578 | Addition of applicability for new NAS test case 9.1.5.1.2 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑186579 | Addition of applicability for new NAS test case 9.1.6.1.4 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑186580 | Update NB-IOT Spurious Emission UE co-existence | Huawei, HiSilicon | imported from 3GU |
| R5‑186581 | Update the general sections for Rel-14 NB-IOT (Editorial) | Huawei, HiSilicon, CMCC | imported from 3GU |
| R5‑186582 | Update the 6.2.3FA to reduce test points | Huawei, HiSilicon, CMCC | imported from 3GU |
| R5‑186583 | Update Rel-14 NB-IOT Tx test cases to support category NB2 | Huawei, HiSilicon, CAICT, CMCC | imported from 3GU |
| R5‑186584 | Update Rel-14 NB-IOT Rx test cases to support category NB2 | Huawei, HiSilicon, CMCC | imported from 3GU |
| R5‑186585 | Update the test applicability for Rel-14 NB-IOT RF test cases | Huawei, HiSilicon, CAICT, CMCC | imported from 3GU |
| R5‑186586 | Update the test applicability for Rel-14 NB-IOT RRM test cases | Huawei, HiSilicon, CMCC | imported from 3GU |
| R5‑186587 | Update Rel-14 NB-IOT RRM test cases to support category NB2 | Huawei, HiSilicon, CMCC | imported from 3GU |
| R5‑186588 | Update 8.1.2.2 Definition of CA capability for 4DL and 5DL CA | Huawei, HiSilicon | imported from 3GU |
| R5‑186589 | Update 4DL and 5DL performance test cases (Editorial) | Huawei, HiSilicon | imported from 3GU |
| R5‑186590 | Addition of Statistic information for 4DL and 5DL test cases | Huawei, HiSilicon | imported from 3GU |
| R5‑186591 | Addition of new CA configurations into 36.521-2 | Huawei, HiSilicon | imported from 3GU |
| R5‑186592 | Update the test applicability of TDD 4DL and 5DL CA performance test cases | Huawei, HiSilicon | imported from 3GU |
| R5‑186593 | Update 8.16.78 to add TT information | Huawei, HiSilicon | imported from 3GU |
| R5‑186594 | Addition of new CA configurations into 36.523-2 | Huawei, HiSilicon | imported from 3GU |
| R5‑186595 | WP - Support for V2X services | Huawei | imported from 3GU |
| R5‑186596 | SR - Support for V2X services | Huawei | imported from 3GU |
| R5‑186597 | WP - LTE Carrier Aggregation Enhancement Beyond 5 Carriers: PUCCH on Scell | Huawei | imported from 3GU |
| R5‑186598 | SR - LTE Carrier Aggregation Enhancement Beyond 5 Carriers: PUCCH on Scell | Huawei | imported from 3GU |
| R5‑186599 | WP - Rel-14 eNB-IoT | Huawei | imported from 3GU |
| R5‑186600 | SR - Rel-14 eNB-IoT | Huawei | imported from 3GU |
| R5‑186601 | 5G NR_EN_DC with FR1_Text update for Intra-Band Contiguous RX sensitivity | Qualcomm inc. | imported from 3GU |
| R5‑186602 | 5G NR_Text update for TX spurious emission intra-band contiguous EN-DC | Qualcomm Inc. | imported from 3GU |
| R5‑186603 | 5G_FR1 Text update for 7.3A Reference sensitivity for CA | Qualcomm Inc. | imported from 3GU |
| R5‑186604 | 5G_FR1 Text update for 7.3 Reference sensitivity | Qualcomm Inc. | imported from 3GU |
| R5‑186605 | 5R_FR1 Text Update for 6.5.3.1_General spurious emissions | Qualcomm Inc | imported from 3GU |
| R5‑186606 | 5R FR1 Text Update for 6.5.3.2 Spurious emission for UE co-existence | Qualcomm Inc | imported from 3GU |
| R5‑186607 | 5G NR_EN_DC with FR1_Text update for Inter-Band RX sensitivity | Qualcomm Inc | imported from 3GU |
| R5‑186608 | Spurious emission band UE co-existence for Inter-band EN-DC within FR1 | Qualcomm Inc | imported from 3GU |
| R5‑186609 | TP_analysis for TX spurious emission UE co-existence for intra-band contiguous EN-DC with FR1 | Qualcomm Inc | imported from 3GU |
| R5‑186610 | TP analysis for Reference sensitivity for Intra-band Contiguous EN-DC with FR1 | Qualcomm Inc | imported from 3GU |
| R5‑186611 | TP analysis for Reference sensitivity for Inter-band EN-DC with FR1 | Qualcomm Inc | imported from 3GU |
| R5‑186612 | Add CounterCheck | Ericsson | imported from 3GU |
| R5‑186613 | Update DLInformationTransfer | Ericsson | imported from 3GU |
| R5‑186614 | Correction to applicability of A-GNSS tests for Category M1 and M2 UEs | Spirent Communications, European Commission | imported from 3GU |
| R5‑186615 | Clarification of the meaning of A-GPS | Spirent Communications | imported from 3GU |
| R5‑186616 | Addition of two missing triple-GNSS test cases | Spirent Communications, European Commission | imported from 3GU |
| R5‑186617 | Updates to Table 4B.2-1 | Spirent Communications, European Commission | imported from 3GU |
| R5‑186618 | Addition of NR background information | Spirent Communications, European Commission | imported from 3GU |
| R5‑186619 | Addition of applicabilities for two missing Minimum Performance triple-GNSS test cases | Spirent Communications, European Commission | imported from 3GU |
| R5‑186620 | Correction to applicabilities of Modernized GPS for Minimum Performance test cases | Spirent Communications | imported from 3GU |
| R5‑186621 | Addition of Category NB2 information | Spirent Communications | imported from 3GU |
| R5‑186622 | Addition of PICs for support of Acquisition Assistance for Galileo E5A and GPS L5 signals | Spirent Communications, European Commission | imported from 3GU |
| R5‑186623 | Addition of NR signalling background information | Spirent Communications, European Commission | imported from 3GU |
| R5‑186624 | Correction of implementation errors from R5-184028 | Spirent Communications | imported from 3GU |
| R5‑186625 | Correction of GNSS-IonosphericModel sub-tests list | Spirent Communications, European Commission | imported from 3GU |
| R5‑186626 | Clarification of notes for Galileo signal information | Spirent Communications, European Commission | imported from 3GU |
| R5‑186627 | Clarification of use of Modernized GPS for Minimum Performance test cases | Spirent Communications | imported from 3GU |
| R5‑186628 | Clarification of use of Assistance Data for Galileo and Modernized GPS signalling test cases | Spirent Communications, European Commission | imported from 3GU |
| R5‑186629 | Addition of information for two missing Minimum Performance triple-GNSS test cases | Spirent Communications, European Commission | imported from 3GU |
| R5‑186630 | Addition of NR signalling background information | Spirent Communications, European Commission | imported from 3GU |
| R5‑186631 | Correction to GNSS scenario #3 for V2X test cases | Spirent Communications, European Commission | imported from 3GU |
| R5‑186632 | Correction to values for GNSS scenario #3 for V2X test cases | Spirent Communications, European Commission | imported from 3GU |
| R5‑186633 | Update IE SchedulingRequestResourceConfig | Ericsson, MCC TF160 | imported from 3GU |
| R5‑186634 | Addition of new 5GC TC 9.1.5.1.10 | CAICT | imported from 3GU |
| R5‑186635 | Addition of new 5GC TC 9.1.5.1.11 | CAICT | imported from 3GU |
| R5‑186636 | Addition of new 5GC TC 9.1.8.14 | CAICT | imported from 3GU |
| R5‑186637 | Addition of new 5GC TC 9.1.8.18 | CAICT | imported from 3GU |
| R5‑186638 | Addition of new 5GC TC 10.1.3.4 | CAICT | imported from 3GU |
| R5‑186639 | Addition of new 5GC TC 10.1.3.5 | CAICT | imported from 3GU |
| R5‑186640 | Addition of new 5GC TC 10.1.3.6 | CAICT | imported from 3GU |
| R5‑186641 | Update IE SchedulingRequestResourceConfig | Ericsson, MCC TF160 | imported from 3GU |
| R5‑186642 | Addition of new 5GC TC 10.1.3.7 | CAICT | imported from 3GU |
| R5‑186643 | Update IE RadioBearerConfig | Ericsson | imported from 3GU |
| R5‑186644 | Addition of new 5GC TC 10.1.3.8 | CAICT | imported from 3GU |
| R5‑186645 | Addition of new 5GC TC 10.1.6.1 | CAICT | imported from 3GU |
| R5‑186646 | Addition of new 5GC TC 10.1.6.2 | CAICT | imported from 3GU |
| R5‑186647 | Addition of new 5GC TC 10.1.6.3 | CAICT | imported from 3GU |
| R5‑186648 | Correction to NR RLC test case 7.1.2.3.3 and 7.1.2.3.4 | ANRITSU LTD | imported from 3GU |
| R5‑186649 | Correction to NR PDCP test case 7.1.3.5.1 | ANRITSU LTD | imported from 3GU |
| R5‑186650 | Correction to NR PDCP test case 7.1.3.5.2 | ANRITSU LTD | imported from 3GU |
| R5‑186651 | Correction to Signal levels for conducted testing | ANRITSU LTD | imported from 3GU |
| R5‑186652 | Correction to NR RRC test case 8.2.3.5.1 | ANRITSU LTD | imported from 3GU |
| R5‑186653 | Correction to NR RRC test case 8.2.3.9.1 and 8.2.3.10.1 | ANRITSU LTD | imported from 3GU |
| R5‑186654 | Addition of 6.3D.4.1 Absolute Power tolerance for UL-MIMO | China Telecommunications | imported from 3GU |
| R5‑186655 | Addition of 6.3D.4.2 Relative Power Tolerance for UL-MIMO | China Telecommunications | imported from 3GU |
| R5‑186656 | Addition of 6.3D.4.3 Aggregate Power tolerance for UL-MIMO | China Telecommunications | imported from 3GU |
| R5‑186657 | New WID on UE Conformance Test Aspects - Bluetooth/WLAN measurement collection in LTE Minimization of Drive Tests (MDT) | CMCC | imported from 3GU |
| R5‑186658 | Addition of 5GC Test case 10.1.4.1 | ANRITSU LTD | imported from 3GU |
| R5‑186659 | Add applicability for 5GC test case 10.1.4.1 | ANRITSU LTD | imported from 3GU |
| R5‑186660 | Introduction of the support of ProSe for B72 | Airbus DS SLC | imported from 3GU |
| R5‑186661 | Introduction of the support of ProSe for B72 | Airbus DS SLC | imported from 3GU |
| R5‑186662 | Revised WID on UE Conformance Test Aspects - ProSe Support for Band 72 in LTE | Airbus DS SLC | imported from 3GU |
| R5‑186663 | Updates to test case 6.5B.2.1.3, Adjacent channel leakage ratio for intra-band contiguous EN-DC | Ericsson | imported from 3GU |
| R5‑186664 | Introduction of B68 in ProSe test frequencies table | Airbus DS SLC | imported from 3GU |
| R5‑186665 | Update LocationMeasurementIndication | Ericsson | imported from 3GU |
| R5‑186666 | Update MeasurementReport | Ericsson | imported from 3GU |
| R5‑186667 | Introduction of Power Class 1 for B31 and B72 | Airbus DS SLC | imported from 3GU |
| R5‑186668 | Update chapter 4.5.2 RRC_IDLE | Ericsson | imported from 3GU |
| R5‑186669 | Introduction of Power Class 1 for B31 and B72 | Airbus DS SLC | imported from 3GU |
| R5‑186670 | Updating test case 6.2.3 UE additional maximum output power reduction | Ericsson-LG Co., LTD | imported from 3GU |
| R5‑186671 | Updating test case 6.5.2.3 Additional spectrum emission mask | Ericsson-LG Co., LTD | imported from 3GU |
| R5‑186672 | Updating test case 6.2B.3.1 Additional Maximum Output Power reduction for Intra-band contiguous EN-DC | Ericsson-LG Co., LTD | imported from 3GU |
| R5‑186673 | Updating test case 6.5B.2.1.2 Additional spectrum emissions mask for intra-band contiguous EN-DC | Ericsson-LG Co., LTD | imported from 3GU |
| R5‑186674 | Test point analysis for AMPR Intra-band contiguous EN-DC in FR1 for NS_35 | Ericsson-LG Co., LTD | imported from 3GU |
| R5‑186675 | Updating test case 6.2.3 maximum output power with additional requirements | Ericsson-LG Co., LTD | imported from 3GU |
| R5‑186676 | Correction to NR MAC DRX test cases 7.1.5.1.1 and 7.1.5.1.2 | ANRITSU LTD | imported from 3GU |
| R5‑186677 | Resubmission of update to 38.508 for mid channel bandwidth | Qualcomm Finland RFFE Oy | imported from 3GU |
| R5‑186678 | new TC for PDSCH FR1 demod | Qualcomm Finland RFFE Oy | imported from 3GU |
| R5‑186679 | Corrections to PDCP test case 7.1.3.5.3 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑186680 | Update of test case 6.5.2.4.2, UTRA ACLR in 38.521-1 | Ericsson | imported from 3GU |
| R5‑186681 | Updates to EN-DC test case 6.2B.2.1, UE Maximum Output Power reduction for Intra-Band Contiguous EN-DC | Ericsson | imported from 3GU |
| R5‑186682 | Update MobilityFromNRCommand | Ericsson | imported from 3GU |
| R5‑186683 | Updates to EN-DC test case 6.2B.2.2, UE Maximum Output Power reduction for Intra-Band Non-Contiguous EN-DC | Ericsson | imported from 3GU |
| R5‑186684 | Updates to test case 6.2B.2.3, UE Maximum Output Power reduction for Inter-Band EN-DC within FR1 | Ericsson | imported from 3GU |
| R5‑186685 | Addition of new 5GC TC 9.1.6.1.6 | MediaTek Inc. | imported from 3GU |
| R5‑186686 | Addition of new 5GC TC 9.1.6.1.7 | MediaTek Inc. | imported from 3GU |
| R5‑186687 | Addition of new 5GC TC 9.1.6.2.8 | MediaTek Inc. | imported from 3GU |
| R5‑186688 | Add applicability of 5GC TC 9.1.6.1.6, 9.1.6.1.7, 9.1.6.2.8 and 9.1.6.2.10 | MediaTek Inc. | imported from 3GU |
| R5‑186689 | Correction to various Radio resource control IEs | ANRITSU LTD | imported from 3GU |
| R5‑186690 | Addition of B72 for test cases with 5MHz channel bandwidth | Airbus DS SLC | imported from 3GU |
| R5‑186691 | Update Paging | Ericsson | imported from 3GU |
| R5‑186692 | Update RRCReestablishment | Ericsson | imported from 3GU |
| R5‑186693 | Update of V2X EVM TCs | CAICT | imported from 3GU |
| R5‑186694 | Update RRCReconfiguration | Ericsson | imported from 3GU |
| R5‑186695 | Addition of Rel-12 missing IEs to LPP message contents | ROHDE & SCHWARZ | imported from 3GU |
| R5‑186696 | Addition of Rel-15 missing IEs to LPP message contents | ROHDE & SCHWARZ | imported from 3GU |
| R5‑186697 | Positioning NSA Protocol tests - LPP Procedures | ROHDE & SCHWARZ | imported from 3GU |
| R5‑186698 | Handling of power on / power off cycles and UE Automation in RRM and SIG testing for FR2 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑186699 | On RRM test case numbering | ROHDE & SCHWARZ | imported from 3GU |
| R5‑186700 | On RRM FR1 MU and TT analysis | ROHDE & SCHWARZ | imported from 3GU |
| R5‑186701 | On TS 38.533 Annex Structure | ROHDE & SCHWARZ | imported from 3GU |
| R5‑186702 | Resubmission of R5-185614 with modifications | ROHDE & SCHWARZ | imported from 3GU |
| R5‑186703 | TP on new RRM 5G Test Cases 4.7.1.1 and 4.7.1.2 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑186704 | TP on new RRM 5G Test Cases 6.7.1.1 and 6.7.1.2 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑186705 | TP on Annexes for TS 38.533 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑186706 | TP on references and common sections for TS 38.533 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑186707 | Draft TS 38.533 v0.0.3 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑186708 | Adding test case 6.2B.2.4, UE Maximum Output Power reduction for Inter-Band EN-DC including FR2 | Ericsson | imported from 3GU |
| R5‑186709 | Introduction of FR1 7.4 Maximum input level | CAICT | imported from 3GU |
| R5‑186710 | TP analysis for test case 6.2B.2.4, UE Maximum Output Power reduction for Inter-Band EN-DC including FR2 | Ericsson | imported from 3GU |
| R5‑186711 | 5GS conditions | Ericsson | imported from 3GU |
| R5‑186712 | Test Point analysis for FR1 7.4 Maximum input level | CAICT, Huawei | imported from 3GU |
| R5‑186713 | Test Point analysis for FR1 MPR test case | CAICT, Huawei | imported from 3GU |
| R5‑186714 | Update RRCReject | Ericsson | imported from 3GU |
| R5‑186715 | MCC TF160 Status Report | MCC TF160 | imported from 3GU |
| R5‑186716 | MCC TF160 ToR 2019 | MCC TF160 | imported from 3GU |
| R5‑186717 | eNB-IoT: Test Model updates | MCC TF160 | imported from 3GU |
| R5‑186718 | V2X: Test Model updates | MCC TF160 | imported from 3GU |
| R5‑186719 | Updates related to introduction of test frequencies | MCC TF160, Ericsson | imported from 3GU |
| R5‑186720 | New annex for NR test frequency calculations | MCC TF160, Ericsson | imported from 3GU |
| R5‑186721 | Updates to E-UTRA RRC_CONNECTED generic procedure | MCC TF160, Ericsson, Qualcomm | imported from 3GU |
| R5‑186722 | Update SecurityAlgorithmConfig | MCC TF160 | imported from 3GU |
| R5‑186723 | Updates to MeasResults | MCC TF160 | imported from 3GU |
| R5‑186724 | EN-DC test model handling of different types of bearers | MCC TF160 | imported from 3GU |
| R5‑186725 | Correction to 5GS test case 7.1.2.2.5 | MCC TF160, Mediatek Inc. | imported from 3GU |
| R5‑186726 | Updates to EN-DC TC 8.2.5.3.1 | MCC TF160, Qualcomm | imported from 3GU |
| R5‑186727 | Default NR TBS Tables for SIG test cases | MCC TF160, Motorola Mobility | imported from 3GU |
| R5‑186728 | SA Option2: Initial Test Model aspects | MCC TF160 | imported from 3GU |
| R5‑186729 | EN-DC: Misc. Test Model updates | MCC TF160 | imported from 3GU |
| R5‑186730 | Alignments of UE Test Loop Mode H description | MCC TF160 | imported from 3GU |
| R5‑186731 | Alignments of UE Test Loop Mode H description | MCC TF160 | imported from 3GU |
| R5‑186732 | Alignments of UE Test Loop Mode H description | MCC TF160 | imported from 3GU |
| R5‑186733 | Routine maintenance for TS 36.523-3 | MCC TF160 | imported from 3GU |
| R5‑186734 | Update RRCRelease | Ericsson | imported from 3GU |
| R5‑186735 | Update of FR1 6.2.2 MPR | CAICT, Huawei, CMCC | imported from 3GU |
| R5‑186736 | Update of FR1 Transmit OFF power | CAICT, Huawei | imported from 3GU |
| R5‑186737 | Test Point analysis for FR2 7.4 Maximum input level | CAICT, Huawei | imported from 3GU |
| R5‑186738 | Update of FR2 6.3.2 Transmit OFF power | CAICT, Huawei | imported from 3GU |
| R5‑186739 | Update of FR2 test case 7.4 | CAICT, Anritsu, Huawei | imported from 3GU |
| R5‑186740 | General sections updated to 38.521-2 | CAICT, Huawei | imported from 3GU |
| R5‑186741 | Addition of B72 for test cases with 5MHz channel bandwidth | Airbus DS SLC | imported from 3GU |
| R5‑186742 | SR UE Conformance Test Aspects - ProSe Support for Band 72 in LTE | Airbus DS SLC | imported from 3GU |
| R5‑186743 | SR UE Conformance Test Aspects - Addition of Power Class 1 UE to bands B31/B72 for LTE | Airbus DS SLC | imported from 3GU |
| R5‑186744 | Update RRCResume | Ericsson | imported from 3GU |
| R5‑186745 | Add RRCResumeComplete | Ericsson | imported from 3GU |
| R5‑186746 | Addition of new_TC_9_1_8_5 | Starpoint, TDIA | imported from 3GU |
| R5‑186747 | Addition of new 5GC TC 9.1.6.2.10 | MediaTek Inc. | imported from 3GU |
| R5‑186748 | Addition of new 5GC TC 9.1.6.2.5 | MediaTek Inc. | imported from 3GU |
| R5‑186749 | Test Point analysis for NR Narrow band in FR1 | CAICT | imported from 3GU |
| R5‑186750 | Test Point analysis for NR spurious response in FR1 | CAICT | imported from 3GU |
| R5‑186751 | Addition of new TC 9.1.8.7 | Starpoint,TDIA,CATT | imported from 3GU |
| R5‑186752 | WP - UE Conformance Test Aspects - Voice and Video Enhancement for LTE | CATT | imported from 3GU |
| R5‑186753 | SR - UE Conformance Test Aspects - Voice and Video Enhancement for LTE | CATT | imported from 3GU |
| R5‑186754 | WP - UE Conformance Test Aspects - UL Data Compression in LTE | CATT | imported from 3GU |
| R5‑186755 | Addition of new 5GS mobility management TC 9.1.7.1 | Tejet,ZTE,SRTC | imported from 3GU |
| R5‑186756 | SR - UE Conformance Test Aspects - UL Data Compression in LTE | CATT | imported from 3GU |
| R5‑186757 | Addition of new 5GS mobility management TC 9.1.7.2 | Tejet,ZTE,SRTC | imported from 3GU |
| R5‑186758 | Add applicability of new 5GS mobility management TC 9.1.7.1 and TC 9.1.7.2 | Tejet, ZTE, SRTC | imported from 3GU |
| R5‑186759 | Correction on V2X testcase 24.3.1 | CATT | imported from 3GU |
| R5‑186760 | Correction on V2X testcase 24.3.2 | CATT | imported from 3GU |
| R5‑186761 | Introduction of RRC TC QoE Measurement Collection in 8.3.5.1 | Huawei, HiSilicon | imported from 3GU |
| R5‑186762 | Introduction of RRC TC Qoemtsi Measurement Collection in 8.3.5.2 | Huawei, HiSilicon | imported from 3GU |
| R5‑186763 | Addition of SRB4 configuration to RRC connection | Huawei, HiSilicon | imported from 3GU |
| R5‑186764 | Addition of Condition QMC for LTE QMC test | Huawei, HiSilicon | imported from 3GU |
| R5‑186765 | Update of operating bands and channel arrangement to TS 38.521-1 | China Unicom | imported from 3GU |
| R5‑186766 | Correction on V2X testcase 24.3.1 | CATT | imported from 3GU |
| R5‑186767 | Modify the values of IEs in sps-AssistanceInformation-r14 | CATT | imported from 3GU |
| R5‑186768 | Modify the values of IEs in sps-AssistanceInformation-r14 | CATT | imported from 3GU |
| R5‑186769 | Addition of Time alignment error for UL-MIMO to TS38.521-1 | China Unicom | imported from 3GU |
| R5‑186770 | Addition of new LTE_UDC-UEConTest test case 7.3.10.1 | CATT | imported from 3GU |
| R5‑186771 | Addition of new LTE_UDC-UEConTest test case 7.3.10.2 | CATT | imported from 3GU |
| R5‑186772 | Addition of new LTE_UDC-UEConTest test case 7.3.10.3 | CATT | imported from 3GU |
| R5‑186773 | Addition of 6.3D.1 Minimum output power for UL-MIMO | China Telecommunications | imported from 3GU |
| R5‑186774 | Addition of 6.3D.1 Minimum output power for UL-MIMO | China Telecommunications | imported from 3GU |
| R5‑186775 | Addition of new LTE_UDC-UEConTest test case 8.4.2.29 | CATT | imported from 3GU |
| R5‑186776 | Addition of 6.3D.2 Transmit OFF power for UL-MIMO | China Telecommunications | imported from 3GU |
| R5‑186777 | Addition of new LTE_UDC-UEConTest test case 8.5.1.9 | CATT | imported from 3GU |
| R5‑186778 | Addition of new TC 9.1.8.8 | Starpoint,TDIA,CATT | imported from 3GU |
| R5‑186779 | Addition of the message content of PDCP-config for UDC | CATT | imported from 3GU |
| R5‑186780 | Addition of applicability and tests conditions for UDC test cases | CATT | imported from 3GU |
| R5‑186781 | Addition of 6.3D.3 Transmit ONOFF time mask for UL-MIMO | China Telecommunications | imported from 3GU |
| R5‑186782 | Update RRCResumeRequest | Ericsson | imported from 3GU |
| R5‑186783 | Addition of new TC 9.1.8.12 | Starpoint,TDIA,CATT | imported from 3GU |
| R5‑186784 | WP - LTE_QMC_Streaming-UEConTest for RAN5#81 | China Unicom | imported from 3GU |
| R5‑186785 | Add RRCSetup | Ericsson | imported from 3GU |
| R5‑186786 | SR - LTE_QMC_Streaming-UEConTest for RAN5#81 | China Unicom | imported from 3GU |
| R5‑186787 | Add UE capability data centric | Ericsson | imported from 3GU |
| R5‑186788 | Minor update OBW, SEM and ACLR inter-band FR1 test cases | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑186789 | WP - UE Conformance Test Aspects - 450 MHz Band for LTE in Region 3 | China Unicom | imported from 3GU |
| R5‑186790 | SR - UE Conformance Test Aspects - 450 MHz Band for LTE in Region 3 for RAN5#81 | China Unicom | imported from 3GU |
| R5‑186791 | TP analysis OBW intraband contiguous EN-DC | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑186792 | TP analysis SEM intraband contiguous EN-DC | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑186793 | New Work Item Proposal: UE Conformance Test Aspects – Enhanced LTE Support for Aerial Vehicles | NTT DOCOMO INC. | imported from 3GU |
| R5‑186794 | Addition of new TC 9.1.8.16 | Starpoint,TDIA,CATT | imported from 3GU |
| R5‑186795 | Addition of applicability statements for LTE QMC test cases | China Unicom | imported from 3GU |
| R5‑186796 | Correction to NB-IoT test case 22.4.19a | ROHDE & SCHWARZ | imported from 3GU |
| R5‑186797 | Adding test cases for new features in the latest IR.92 | NTT DOCOMO INC. | imported from 3GU |
| R5‑186798 | Update specific messages to simplify TS 38.523-1 | NTT DOCOMO INC. | imported from 3GU |
| R5‑186799 | Correction to NB-IoT test case 22.4.22 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑186800 | Correction to NB-IoT test case 22.3.3.5 | ROHDE & SCHWARZ, Qualcomm Incorporated | imported from 3GU |
| R5‑186801 | Update RRC TC 8.2.2.2.1 - Split SRB Establishment and Release / EN-DC | Tech Mahindra Limited and Qualcomm | imported from 3GU |
| R5‑186802 | Update RRC TC 8.2.2.7.1 - Bearer Modification / Handling for bearer type change without security key change / EN-DC | Tech Mahindra Limited and Qualcomm | imported from 3GU |
| R5‑186803 | Update RRC TC8.2.3.7.1 - Measurement configuration control and reporting / Event A4 (intra-frequency, inter-frequency and inter-band measurements) / Measurement of Neighbour NR cell / EN-DC | Tech Mahindra Limited and Qualcomm | imported from 3GU |
| R5‑186804 | Update chapter 4.5.3 RRC_INACTIVE | Ericsson | imported from 3GU |
| R5‑186805 | TP analysis for time alignment error for MIMO FR1 | China Unicom | imported from 3GU |
| R5‑186806 | Alignment of 256QAM EVM Test Tolerance between LTE and NR | Intel Deutschland GmbH | imported from 3GU |
| R5‑186807 | GCF 3GPP TCL after GCF CAG#56 | Ericsson | imported from 3GU |
| R5‑186808 | RAN5#81 summary of changes to RAN5 test cases with potential impact on GCF and PTCRB | Ericsson, Samsung | imported from 3GU |
| R5‑186809 | WP UE Conformance Test Aspects - Increasing the minimum number of carriers for UE monitoring in UTRA and E-UTRA | Ericsson | imported from 3GU |
| R5‑186810 | SR UE Conformance Test Aspects - Increasing the minimum number of carriers for UE monitoring in UTRA and E-UTRA | Ericsson | imported from 3GU |
| R5‑186811 | WP UE Conformance Test Aspects - Rel-13 LTE CA configurations | Ericsson | imported from 3GU |
| R5‑186812 | SR UE Conformance Test Aspects - Rel-13 LTE CA configurations | Ericsson | imported from 3GU |
| R5‑186813 | WP UE Conformance Test Aspects - Rel-14 LTE CA configurations | Ericsson | imported from 3GU |
| R5‑186814 | SR UE Conformance Test Aspects - Rel-14 LTE CA configurations | Ericsson | imported from 3GU |
| R5‑186815 | WP UE Conformance Test Aspects - Rel-15 LTE CA configurations | Ericsson | imported from 3GU |
| R5‑186816 | SR UE Conformance Test Aspects - Rel-15 LTE CA configurations | Ericsson | imported from 3GU |
| R5‑186817 | WP UE Conformance Test Aspects - Rel-16 LTE CA configurations | Ericsson | imported from 3GU |
| R5‑186818 | SR UE Conformance Test Aspects - Rel-16 LTE CA configurations | Ericsson | imported from 3GU |
| R5‑186819 | Revised WID on: UE Conformance Test Aspects - Rel-16 LTE CA configurations | Ericsson | imported from 3GU |
| R5‑186820 | WP UE Conformance Test Aspects - 5G system with NR and LTE | Ericsson | imported from 3GU |
| R5‑186821 | SR UE Conformance Test Aspects - 5G system with NR and LTE | Ericsson | imported from 3GU |
| R5‑186822 | Update of RAN5 5G NR phases and target update RAN5#81 | Ericsson | imported from 3GU |
| R5‑186823 | 3GPP RAN5 CA status list (pre-RAN5#81 meeting) | Ericsson | imported from 3GU |
| R5‑186824 | 3GPP RAN5 CA status list (post-RAN5#81 meeting) | Ericsson | imported from 3GU |
| R5‑186825 | Correction of test frequencies for NR band n1 | Ericsson | imported from 3GU |
| R5‑186826 | Correction of test frequencies for NR band n2 | Ericsson | imported from 3GU |
| R5‑186827 | Correction of test frequencies for NR band n3 | Ericsson | imported from 3GU |
| R5‑186828 | Correction of test frequencies for NR band n5 | Ericsson | imported from 3GU |
| R5‑186829 | Correction of test frequencies for NR band n7 | Ericsson | imported from 3GU |
| R5‑186830 | Correction of test frequencies for NR band n8 | Ericsson | imported from 3GU |
| R5‑186831 | Correction of test frequencies for NR band n12 | Ericsson | imported from 3GU |
| R5‑186832 | Correction of test frequencies for NR band n20 | Ericsson | imported from 3GU |
| R5‑186833 | Correction of test frequencies for NR band n25 | Ericsson | imported from 3GU |
| R5‑186834 | Correction of test frequencies for NR band n28 | Ericsson | imported from 3GU |
| R5‑186835 | Correction of test frequencies for NR band n34 | Ericsson | imported from 3GU |
| R5‑186836 | Correction of test frequencies for NR band n38 | Ericsson | imported from 3GU |
| R5‑186837 | Correction of test frequencies for NR band n39 | Ericsson | imported from 3GU |
| R5‑186838 | Correction of test frequencies for NR band n40 | Ericsson | imported from 3GU |
| R5‑186839 | Correction of test frequencies for NR band n41 | Ericsson | imported from 3GU |
| R5‑186840 | Correction of test frequencies for NR band n51 | Ericsson | imported from 3GU |
| R5‑186841 | Introduction of test frequencies for NR band n66 | Ericsson | imported from 3GU |
| R5‑186842 | Introduction of test frequencies for NR band n70 | Ericsson | imported from 3GU |
| R5‑186843 | Correction of test frequencies for NR band n71 | Ericsson | imported from 3GU |
| R5‑186844 | Correction of test frequencies for NR band n75 | Ericsson | imported from 3GU |
| R5‑186845 | Correction of test frequencies for NR band n76 | Ericsson | imported from 3GU |
| R5‑186846 | Correction of test frequencies for NR band n77 | Ericsson | imported from 3GU |
| R5‑186847 | Correction of test frequencies for NR band n78 | Ericsson | imported from 3GU |
| R5‑186848 | Correction of test frequencies for NR band n79 | Ericsson | imported from 3GU |
| R5‑186849 | Correction of test frequencies for NR band n257 | Ericsson | imported from 3GU |
| R5‑186850 | Correction of test frequencies for NR band n258 | Ericsson | imported from 3GU |
| R5‑186851 | Correction of test frequencies for NR band n260 | Ericsson | imported from 3GU |
| R5‑186852 | Correction of test frequencies for NR band n261 | Ericsson | imported from 3GU |
| R5‑186853 | Correction of test frequencies for signalling testing in clause 6 | Ericsson | imported from 3GU |
| R5‑186854 | Correction to DCI formats 0_0 and 0_1 | Ericsson, MCC TF160, Huawei, HiSilicon | imported from 3GU |
| R5‑186855 | Introduction of preamble test states | Ericsson | imported from 3GU |
| R5‑186856 | Introduction of SDL and SUL cells in simulated cells in clause 4.4.2 | Ericsson | imported from 3GU |
| R5‑186857 | Introduction DCI format 1_0 for paging, SI and random access | Ericsson, MCC TF160 | imported from 3GU |
| R5‑186858 | Correction to DCI format 1_1 | Ericsson, MCC TF160 | imported from 3GU |
| R5‑186859 | Update IE RateMatchPattern | Ericsson | imported from 3GU |
| R5‑186860 | Correction to RRC_IDLE procedure | Ericsson | imported from 3GU |
| R5‑186861 | Correction of generic procedure parameter naming for test loop function | Ericsson | imported from 3GU |
| R5‑186862 | Correction of test procedures to activate and deactivate UE Beamlock Function | Ericsson | imported from 3GU |
| R5‑186863 | Update of Test Control UE Beamlock Function messages | Ericsson | imported from 3GU |
| R5‑186864 | New test case for UL-SCH transport block size selection for DCI format 0 and 256QAM UL | Ericsson | imported from 3GU |
| R5‑186865 | New test case for PUSCH transmission in UpPTS in frame structure 2 | Ericsson | imported from 3GU |
| R5‑186866 | Applicability of new uplink capacity enhancement test cases for LTE | Ericsson | imported from 3GU |
| R5‑186867 | Applicability and ICS for CA RF and RRM test cases | Ericsson | imported from 3GU |
| R5‑186868 | LS on NR Test Methods applicability for different UE power classes | TSG RAN4 | imported from 3GU |
| R5‑186869 | LS on Vehicle mounted UE antenna performance | TSG RAN4 | imported from 3GU |
| R5‑186870 | LS to RAN5 and GCF on method to distinguish vehicle UE from handheld UE | TSG RAN4 | imported from 3GU |
| R5‑186871 | Specifying Test procedure to check that UE is in RRC_IDLE state on a certain NR cell | Samsung | imported from 3GU |
| R5‑186872 | Removal of RRC SCG failure TC 8.2.5.5.1 | Samsung | imported from 3GU |
| R5‑186873 | Removal of RRC SCG failure TC 8.2.5.6.1 | Samsung | imported from 3GU |
| R5‑186874 | Update to 5G TC TA registration update | Samsung | imported from 3GU |
| R5‑186875 | Removal of applicability for RRC SCG failure tests | Samsung | imported from 3GU |
| R5‑186876 | Adding applicability for 5G TC TA registration update | Samsung | imported from 3GU |
| R5‑186877 | Adding applicability for new 38.521-1 CA TCs | Samsung | imported from 3GU |
| R5‑186878 | Correction to Generic Test Procedure for MCPTT pre-established session establishment CO | Samsung | imported from 3GU |
| R5‑186879 | Editorial update of the default SDP and Resource-list Messages | Samsung | imported from 3GU |
| R5‑186880 | Update of default MCPTT media plane control messages and other information elements to reflect latest Rel-13 core specs | Samsung | imported from 3GU |
| R5‑186881 | Update of XML schema for MCPTT location information to reflect latest Rel-13 core specs | Samsung | imported from 3GU |
| R5‑186882 | Update of MCPTT Client off-network operation TCs Core requirements to reflect latest Rel-13 core specs | Samsung | imported from 3GU |
| R5‑186883 | Update of MCPTT Private Calls with Floor Control TCs Core requirements to reflect latest Rel-13 core specs | Samsung | imported from 3GU |
| R5‑186884 | Update of MCPTT Private Calls without Floor Control TCs Core requirements to reflect latest Rel-13 core specs | Samsung | imported from 3GU |
| R5‑186885 | Update of MCPTT Private Calls within a pre-established session TCs Core requirements to reflect latest Rel-13 core specs | Samsung | imported from 3GU |
| R5‑186886 | Update of PRD13 | Samsung | imported from 3GU |
| R5‑186887 | NR FR1 TT Way Forward update | Telecom Italia, Orange, AT&T | imported from 3GU |
| R5‑186888 | NR FR2 TT Proposal | Telecom Italia, China Mobile, China Telecom, China Unicom, DISH Network, Orange, Sprint | imported from 3GU |
| R5‑186889 | Correction to the default Pre-Test Conditions for AM and UM RLC test cases | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑186890 | Correction to NR RRC test case 8.2.3.14.1 | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑186891 | Correction to NR RRC test case 8.2.3.13.1 | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑186892 | Correction to NR PDCP test case 7.1.3.4.2 | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑186893 | Corrections to the notes in the OTA signal level tables | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑186894 | Update on RTS Linearization | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑186895 | Correction to eMDT2 test case 8.6.1.3 | Intel Corporation (UK) Ltd | imported from 3GU |
| R5‑186896 | 5GS inactive state | Ericsson | imported from 3GU |
| R5‑186897 | Correction to eMDT2 test case 8.6.1.3 | Intel Corporation (UK) Ltd, Keysight Technologies UK Ltd. | imported from 3GU |
| R5‑186898 | 5GS AKA/EAP default | Ericsson | imported from 3GU |
| R5‑186899 | Addition OBW intra-band contiguous EN-DC | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑186900 | Addition SEM intra-band contiguous EN-DC | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑186901 | Update SEM requirements to TS 38.101-1 v15.3.0 | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑186902 | Update ACS and inband blocking test cases in TS 38.521-1 | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑186903 | Update MU budget in TR 38.903 | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑186904 | 5GS S-NSSAI | Ericsson | imported from 3GU |
| R5‑186905 | Uplink PTRS disable for RF testing | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑186906 | Addition OBW intraband non contiguous EN-DC | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑186907 | Update general parameter Connection without release in initial conditions in TS 38.521-3 | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑186908 | Correction to LTE<>GERAN idle mode test case 6.2.3.30 | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑186909 | 5GS follow-on | Ericsson | imported from 3GU |
| R5‑186910 | 5GS IMS | Ericsson | imported from 3GU |
| R5‑186911 | Add RRCSetupComplete | Ericsson | imported from 3GU |
| R5‑186912 | Add RRCSetupRequest | Ericsson | imported from 3GU |
| R5‑186913 | Add RRCSystemInfoRequest | Ericsson | imported from 3GU |
| R5‑186914 | Update of Test case 8.5.4.1 with UE DL and UL Cat 22,23,24,25,26 capability check | Intel Corporation (UK) Ltd | imported from 3GU |
| R5‑186915 | Correction to SRVCC test cases for IMS Reregistration over UTRAN | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑186916 | Add SecurityModeCommand | Ericsson | imported from 3GU |
| R5‑186917 | Addition of DL and UL Category 22,23,24,25,26 to Table A.4.3.2-2 and A.4.3.2-3 | Intel Corporation (UK) Ltd | imported from 3GU |
| R5‑186918 | Update SystemInformation | Ericsson | imported from 3GU |
| R5‑186919 | Correction to SRVCC test cases for IMS Reregistration over UTRAN | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑186920 | Add UEAssistanceInformation | Ericsson | imported from 3GU |
| R5‑186921 | Update UECapabilityEnquiry | Ericsson | imported from 3GU |
| R5‑186922 | Update ULInformationTransfer | Ericsson | imported from 3GU |
| R5‑186923 | Update IE PTRS-UplinkConfig | Ericsson | imported from 3GU |
| R5‑186924 | Update IE RLF-TimersAndConstants | Ericsson | imported from 3GU |
| R5‑186925 | Update RRCResumeRequest | Ericsson | imported from 3GU |
| R5‑186926 | Add UE implementation capabilities | Ericsson | imported from 3GU |
| R5‑186927 | Introduction of FR1 TC 7.6D.2 Inband blocking for UL MIMO | CAICT | imported from 3GU |
| R5‑186928 | Introduction of FR1 TC 7.6D.3 Out-of-band blocking for UL MIMO | CAICT | imported from 3GU |
| R5‑186929 | Update PTRS-DownlinkConfig | NTT DOCOMO INC. | imported from 3GU |
| R5‑186930 | Introduction of FR1 TC 7.6D.4 Narrow-band blocking for UL MIMO | CAICT | imported from 3GU |
| R5‑186931 | Update CSI related information elements | NTT DOCOMO INC. | imported from 3GU |
| R5‑186932 | Introduction of FR1 TC 7.8D Intermodulation characteristics for UL-MIMO | CAICT | imported from 3GU |
| R5‑186933 | Introduction of FR2 TC 6.2.2 UE maximum output power reduction | CAICT | imported from 3GU |
| R5‑186934 | Update ServingCellConfigCommon and TDD-UL-DL-Config | NTT DOCOMO INC. | imported from 3GU |
| R5‑186935 | Update SRS-Config | NTT DOCOMO INC. | imported from 3GU |
| R5‑186936 | Update PUCCH-SpatialRelationInfo | NTT DOCOMO INC. | imported from 3GU |
| R5‑186937 | Update some information elements for measurements | NTT DOCOMO INC. | imported from 3GU |
| R5‑186938 | Update CellGroupConfig and related information elements | NTT DOCOMO INC. | imported from 3GU |
| R5‑186939 | Add PICS for 5GMM implementation cabilities | MediaTek Inc. | imported from 3GU |
| R5‑186940 | Addition of specific RDS message contents for NB-IoT test case 22.5.19 | TDIA, CATT | imported from 3GU |
| R5‑186941 | CR of NR 508-1 clause 4.6.2_SIB2, SIB4 | Huawei, Hisilicon, Ericssion, TF160 | imported from 3GU |
| R5‑186942 | CR of NR 508-1 Table 4.4.2-2_Default NR Cells parameters | Huawei, Hisilicon, Hisilicon, Ericssion, TF160 | imported from 3GU |
| R5‑186943 | CR of NR 508-1 Table 4.6.3-107_ReportConfigNR | Huawei, Hisilicon | imported from 3GU |
| R5‑186944 | Addition of NR test case 6.1.1.2_PLMN selection of Other PLMN | Huawei, Hisilicon | imported from 3GU |
| R5‑186945 | Addition of NR test case 6.1.1.3_Cell reselection of ePLMN | Huawei, Hisilicon | imported from 3GU |
| R5‑186946 | Addition of NR test case 6.1.1.4_PLMN selection in shared network environment | Huawei, Hisilicon | imported from 3GU |
| R5‑186947 | Addition of NR test case 6.1.1.5_PLMN selection | Huawei, Hisilicon | imported from 3GU |
| R5‑186948 | Addition of NR test case 6.1.2.1_Cell selection_Qrxlevmin | Huawei, Hisilicon | imported from 3GU |
| R5‑186949 | Addition of NR test case 6.1.2.2_Cell selection_Qqualmin | Huawei, Hisilicon | imported from 3GU |
| R5‑186950 | Addition of NR test case 6.1.2.3_Cell selection_Serving cell bar | Huawei, Hisilicon | imported from 3GU |
| R5‑186951 | Addition of NR test case 6.1.2.4_Cell selection_Serving cell Squal below Zero | Huawei, Hisilicon | imported from 3GU |
| R5‑186952 | Addition of NR test case 6.1.2.5_Cell Reselection | Huawei, Hisilicon | imported from 3GU |
| R5‑186953 | Addition of NR test case 6.1.2.6_Cell Reselection for interband operation | Huawei, Hisilicon | imported from 3GU |
| R5‑186954 | Addition of NR test case 6.1.2.9_Cell Reselection using Qhyst, Qoffset and Treselection | Huawei, Hisilicon | imported from 3GU |
| R5‑186955 | Addition of NR test case 6.1.2.20_Inter-frequency cell reselection according to priority | Huawei, Hisilicon | imported from 3GU |
| R5‑186956 | Addition of NR test case 6.1.2.21_Cell reselection,SIntra SearchQ and SnonIntraSeqrchQ | Huawei, Hisilicon | imported from 3GU |
| R5‑186957 | Addition of NR test case 6.1.2.22_Inter-frequency cell reselection with parameters ThreshX, HighQ, ThreshX, LowQ and ThreshServing, LowQ | Huawei, Hisilicon | imported from 3GU |
| R5‑186958 | Addition of NR test case 7.1.1.1.3_SI Request | Huawei, Hisilicon | imported from 3GU |
| R5‑186959 | Addition of NR test case 7.1.1.1.6_Random access | Huawei, Hisilicon | imported from 3GU |
| R5‑186960 | Addition of NR test case 7.1.1.2.3_CCCH HARQ | Huawei, Hisilicon | imported from 3GU |
| R5‑186961 | Addition of NR test case 7.1.1.2.4_BCCH HARQ | Huawei, Hisilicon | imported from 3GU |
| R5‑186962 | CR of NR test case 7.1.1.1.4_Beam Failure | Huawei, Hisilicon | imported from 3GU |
| R5‑186963 | CR of NR test case 7.1.1.1.5_SUL | Huawei, Hisilicon | imported from 3GU |
| R5‑186964 | CR of NR test case 7.1.1.3.7_Power Headroom Reporting | Huawei, Hisilicon | imported from 3GU |
| R5‑186965 | CR of NR test case 7.1.1.5.4_DRX | Huawei, Hisilicon | imported from 3GU |
| R5‑186966 | CR of NR test case 7.1.1.6.1_Correct handling of DL assignmentSemi persistent | Huawei, Hisilicon | imported from 3GU |
| R5‑186967 | CR of NR test case 7.1.1.6.2_configured grant Type 1 | Huawei, Hisilicon | imported from 3GU |
| R5‑186968 | CR of NR test case 7.1.1.6.3_configured grant Type 2 | Huawei, Hisilicon | imported from 3GU |
| R5‑186969 | CR of NR test case 7.1.2.3.9_RLC Reassembling | Huawei, Hisilicon | imported from 3GU |
| R5‑186970 | Addition of NR test case 8.1.1.1.2_Paging | Huawei, Hisilicon | imported from 3GU |
| R5‑186971 | Addition of NR test case 8.1.1.2.1_RRC connection establishment | Huawei, Hisilicon | imported from 3GU |
| R5‑186972 | Addition of NR test case 8.1.1.2.3_T300 expiry | Huawei, Hisilicon | imported from 3GU |
| R5‑186973 | Addition of NR test case 8.1.1.3.1_Redirection to NR | Huawei, Hisilicon | imported from 3GU |
| R5‑186974 | Addition of NR test case 8.1.3.1.1_Event A1 | Huawei, Hisilicon | imported from 3GU |
| R5‑186975 | Addition of NR test case 8.1.3.1.2_ Measurement Event A2 | Huawei, Hisilicon | imported from 3GU |
| R5‑186976 | Addition of NR test case 8.1.3.1.12.1_Measurement Event A6 | Huawei, Hisilicon | imported from 3GU |
| R5‑186977 | Addition of NR test case 8.1.5.3.1_PWS notification | Huawei, Hisilicon | imported from 3GU |
| R5‑186978 | Addition of NR test case 9.1.5.1.1_Registration Request | Huawei, Hisilicon, Caict, CATT, Samsung, TF160, R&S, Motorola, Ericssion, Qualcomm | imported from 3GU |
| R5‑186979 | Addition of NR test case 9.1.6.1.2_T3521 timeout | Huawei, Hisilicon | imported from 3GU |
| R5‑186980 | CR of 5G_NR_Applicability | Huawei, Hisilicon | imported from 3GU |
| R5‑186981 | CR of 5G_NR_NAS_Applicability | Huawei, Hisilicon | imported from 3GU |
| R5‑186982 | Update RLC-Config | NTT DOCOMO INC. | imported from 3GU |
| R5‑186983 | CR of 5G_NR_Capabilities | Huawei, Hisilicon | imported from 3GU |
| R5‑186984 | CR of applicability for NR test case 7.1.1.1.5_SUL | Huawei, Hisilicon | imported from 3GU |
| R5‑186985 | Correction to SSAC connected mode test case 13.5.2a | Keysight Technologies UK Ltd, Qualcomm Incorporated | imported from 3GU |
| R5‑186986 | Correction to NB-IoT test case 22.3.1.8 and 22.4.24 | TDIA, CATT | imported from 3GU |
| R5‑186987 | Addition of SIB3 message_Resubmission of 185792 | Huawei, Hisilicon | imported from 3GU |
| R5‑186988 | Addition of SIB5 message_Resubmission of 186054 | Huawei, Hisilicon | imported from 3GU |
| R5‑186989 | Addition of SIB6 - SIB8 message_Resubmission of 186055 | Huawei, Hisilicon | imported from 3GU |
| R5‑186990 | Addition of SIB9 message_Resubmission of 186056 | Huawei, Hisilicon | imported from 3GU |
| R5‑186991 | Addition of NR test case 8.2.3.11.1_gapFR1_Resubmission of 186152 | Huawei, Hisilicon | imported from 3GU |
| R5‑186992 | Addition of NR test case 8.2.3.11.2_gapFR2_Resubmission of 186153 | Huawei, Hisilicon | imported from 3GU |
| R5‑186993 | Addition of NR test case 7.1.1.1.4_Beam Failure_Resubmission of 186078 | Huawei, Hisilicon | imported from 3GU |
| R5‑186994 | Addition of NR test case 7.1.1.1.5_SUL_Resubmission of 186079 | Huawei, Hisilicon | imported from 3GU |
| R5‑186995 | CR of test case 8.2.4.2_NR CA release_Resubmission of 186101 | Huawei, Hisilicon | imported from 3GU |
| R5‑186996 | Correction to NB-IoT Test case 22.3.1.9 | TDIA, MCC TF160, CATT | imported from 3GU |
| R5‑186997 | New WID proposal: UE Conformance Test Aspects – Enhancing LTE CA Utilization | Nokia, Nokia Shanghai Bell | imported from 3GU |
| R5‑186998 | Correction to NB-IoT test case 22.3.2.6 | TDIA, CATT | imported from 3GU |
| R5‑186999 | Correction to applicability for NB-IoT testcase 22.3.2.7 | TDIA, MCC TF160, CATT | imported from 3GU |
| R5‑187000 | Correction to NB-IoT Test case 22.4.25 | TDIA, CATT | imported from 3GU |
| R5‑187001 | Update NB-IoT Rel-14 DCI format N0/N1 with HARQ process number | TDIA, MCC TF160, CATT | imported from 3GU |
| R5‑187002 | Correction to Table 8.1.6.1-15a SCPTMConfiguration-NB | TDIA, CATT | imported from 3GU |
| R5‑187003 | Update NB-IOT Random Access test cases 6.2.16, 6.2.17 and 6.2.18 | Huawei, HiSilicon | imported from 3GU |
| R5‑187004 | Update 6.2.4G.1 the V2V AMPR test case to remove brackets and add Power Class 2 | Huawei, HiSilicon | imported from 3GU |
| R5‑187005 | Adding connection diagram for eNB-IoT RRM test case 6.2.18 | Huawei, HiSilicon, CMCC | imported from 3GU |
| R5‑187006 | Add RRCSetup | Ericsson | imported from 3GU |
| R5‑187007 | TDD configuration for UE Tx test in FR1 | Ericsson | imported from 3GU |
| R5‑187008 | Introduction of Annex on Characteristics of the Interfering Signal | Samsung,CMCC | imported from 3GU |
| R5‑187009 | Introduction of test case for Frequency error for CA | Samsung,CMCC | imported from 3GU |
| R5‑187010 | Introduction of test cases for Transmit modulation quality for CA | Samsung,CMCC | imported from 3GU |
| R5‑187011 | Introduction of test case for Spectrum emission mask for Inter-band CA | Samsung,CMCC | imported from 3GU |
| R5‑187012 | Introduction of test case for NR ACLR for Inter-band CA | Samsung,CMCC | imported from 3GU |
| R5‑187013 | Introduction of test case for UTRA ACLR for Inter-band CA | Samsung,CMCC | imported from 3GU |
| R5‑187014 | Introduction of test case for General spurious emissions for Inter-band CA | Samsung,CMCC | imported from 3GU |
| R5‑187015 | Introduction of test case for Spurious emission for UE co-existence for CA | Samsung,CMCC | imported from 3GU |
| R5‑187016 | Introduction of test case for Transmit intermodulation for Inter-band CA | Samsung,CMCC | imported from 3GU |
| R5‑187017 | Discussion on test configuration for some inter-band UL CA test cases | Samsung | imported from 3GU |
| R5‑187018 | Calculation and specification of default values for SIB1 IE offsetToPointA | Ericsson | imported from 3GU |
| R5‑187019 | TDD configuration for UE Tx test in FR2 | Ericsson | imported from 3GU |
| R5‑187020 | Clarification of test channel BW and SCS selection | NTT DOCOMO, INC. | imported from 3GU |
| R5‑187021 | Update RRCReconfiguration | Ericsson | imported from 3GU |
| R5‑187022 | Necessity for functional testing in RAN5 | NTT DOCOMO, INC. | imported from 3GU |
| R5‑187023 | Editorial update of Annex B | Huawei, HiSilicon | imported from 3GU |
| R5‑187024 | Addition of MU contribution for demodulation test cases | Huawei, HiSilicon | imported from 3GU |
| R5‑187025 | Addition of MU contribution for RRM test cases | Huawei, HiSilicon | imported from 3GU |
| R5‑187026 | Addition of P-Max in Test environment for RF test | Huawei, HiSilicon | imported from 3GU |
| R5‑187027 | Addition of Combinations of system information blocks in 4.4.3.1.2 | Huawei, HiSilicon | imported from 3GU |
| R5‑187028 | Addition of test frequencies for SUL band n80 | Huawei, HiSilicon | imported from 3GU |
| R5‑187029 | Addition of test frequencies for SUL band n81 | Huawei, HiSilicon | imported from 3GU |
| R5‑187030 | Addition of test frequencies for SUL band n82 | Huawei, HiSilicon | imported from 3GU |
| R5‑187031 | Addition of test frequencies for SUL band n83 | Huawei, HiSilicon | imported from 3GU |
| R5‑187032 | Addition of test frequencies for SUL band n84 | Huawei, HiSilicon | imported from 3GU |
| R5‑187033 | Addition of test frequencies for SUL band n86 | Huawei, HiSilicon | imported from 3GU |
| R5‑187034 | Adding edge allcation into common uplink configuration in 6.1 | Huawei, HiSilicon,CAICT | imported from 3GU |
| R5‑187035 | Update test points analysis for multiple FR1 test cases | Huawei, HiSilicon, Keysight, CAICT | imported from 3GU |
| R5‑187036 | Removing the Editor's notes of SA messages and procedures for all FR1 test cases | Huawei, HiSilicon | imported from 3GU |
| R5‑187037 | Removing the Editor's notes of SA messages and procedures for all FR2 test cases | Huawei, HiSilicon | imported from 3GU |
| R5‑187038 | Update test points for multiple FR1 test cases | Huawei, HiSilicon, Keysight, CAICT | imported from 3GU |
| R5‑187039 | Update MU and TT in Annex F of 38.521-2 | Huawei, HiSilicon | imported from 3GU |
| R5‑187040 | Addition of new band into RF baseline implementation capabilities | NTT DOCOMO, INC. | imported from 3GU |
| R5‑187041 | LTE TDD configuration for UE Tx test in EN-DC | Ericsson | imported from 3GU |
| R5‑187042 | Update IE RadioBearerConfig | Ericsson | imported from 3GU |
| R5‑187043 | Editorial correction to LAA Event Trigger Reporting Test 8.26.7 | Anritsu | imported from 3GU |
| R5‑187044 | Editorial correction to the E-UTRA operating band group for Cat-M1 Clause 9 Tests | Anritsu | imported from 3GU |
| R5‑187045 | Editorial correction to 9.1.10.1 | Anritsu | imported from 3GU |
| R5‑187046 | Correction to Cat-M1 intra-frequency event triggered reporting tests | Anritsu | imported from 3GU |
| R5‑187047 | Changing the cell configuration mapping tables to cater for generic duplex mode tests | Anritsu | imported from 3GU |
| R5‑187048 | Correction to 3DL CA clause 8 generic duplex mode tests | Anritsu | imported from 3GU |
| R5‑187049 | Editorial correction to 4CA and 5CA ACS test cases | Anritsu | imported from 3GU |
| R5‑187050 | Editorial correction to 5DL CA blocking tests | Anritsu | imported from 3GU |
| R5‑187051 | Correction to the test configuration table of 7.3A.6 | Anritsu | imported from 3GU |
| R5‑187052 | Correction to frequency of CA_4A-7A for MSD with inter-band 2UL | Anritsu | imported from 3GU |
| R5‑187053 | Core alignment of Delta RIB table | Anritsu | imported from 3GU |
| R5‑187054 | Editorial correction to 6.6.3.1A.2 Transmitter Spurious emissions for CA | Anritsu | imported from 3GU |
| R5‑187055 | Editorial correction to 6.5.1A.2 Frequency error for CA | Anritsu | imported from 3GU |
| R5‑187056 | Correction to 6.2.5A.3 Configured UE transmitted Output Power for CA | Anritsu | imported from 3GU |
| R5‑187057 | Core alignment of Delta TIB table | Anritsu | imported from 3GU |
| R5‑187058 | Addition of test frequency for CA_48C and CA_48A-48A | Anritsu | imported from 3GU |
| R5‑187059 | Addition of test frequency for CA_40A-40A and CA_40A-40C | Anritsu | imported from 3GU |
| R5‑187060 | Correction to 4x4 CA demodulation tests | Anritsu | imported from 3GU |
| R5‑187061 | Correction to 6.1.9 FDD Intra-frequency RRC Re-establishment for Cat-M1 UE in CEModeA | Anritsu | imported from 3GU |
| R5‑187062 | Correction to Minimum Test time for 8.12.1.1.2 Demodulation of NPDSCH | Anritsu | imported from 3GU |
| R5‑187063 | Correction to 8.26.7 FS3 Intra-frequency event triggered reporting | Anritsu | imported from 3GU |
| R5‑187064 | Editorial correction to FR3 RRM clause 8 Tests | Anritsu | imported from 3GU |
| R5‑187065 | Removal of TC 7.3F.2 Reference sensitivity level with repetition for Category NB1 | Anritsu | imported from 3GU |
| R5‑187066 | Correction to LAA CQI tests | Anritsu | imported from 3GU |
| R5‑187067 | Correction to FS3 CSI-RSRP accuracy tests | Anritsu | imported from 3GU |
| R5‑187068 | Correction to 6.6.3.3A.2 Additional spurious emissions for CA | Anritsu | imported from 3GU |
| R5‑187069 | Correction to 6.2.4A.2 Additional Maximum Power Reduction (A-MPR) for CA | Anritsu | imported from 3GU |
| R5‑187070 | Correction to 6.2.4A.2_1 and 6.6.2.2A.2_1 | Anritsu | imported from 3GU |
| R5‑187071 | Editorial correction to 6.6.2.2A.2 Additional Spectrum Emission Mask for CA | Anritsu | imported from 3GU |
| R5‑187072 | Correction to 2x4 CA demodulation tests | Anritsu | imported from 3GU |
| R5‑187073 | Correction to the MU for UL CA | Anritsu | imported from 3GU |
| R5‑187074 | Editorial: 6.2.2EC, UE Maximum Output Power for UE category M2 | Ericsson | imported from 3GU |
| R5‑187075 | Introduction of tc 6.2.3EC, Maximum Power Reduction (MPR) for UE category M2 | Ericsson | imported from 3GU |
| R5‑187076 | Introduction of tc 6.2.5EC Configured UE transmitted Power for UE category M2 | Ericsson | imported from 3GU |
| R5‑187077 | Introduction of tc 6.3.2EC, Minimum Output Power for UE category M2 | Ericsson | imported from 3GU |
| R5‑187078 | Introduction of tc 6.3.3EC, UE Transmit OFF power for UE category M2 | Ericsson | imported from 3GU |
| R5‑187079 | Introduction of 6.3.4EC.1, General ON/OFF time mask for UE category M2 | Ericsson | imported from 3GU |
| R5‑187080 | Introduction of 6.3.5EC.1, Power Control Absolute power tolerance for UE category M2 | Ericsson | imported from 3GU |
| R5‑187081 | Introduction of 6.3.5EC.2, Power Control Relative power tolerance for UE category M2 | Ericsson | imported from 3GU |
| R5‑187082 | Introduction of 6.3.5EC.3, Aggregate power control tolerance for UE category M2 | Ericsson | imported from 3GU |
| R5‑187083 | Test Point analysis for FR1 PRACH test case | KTL | imported from 3GU |
| R5‑187084 | Introduction of New test case 6.4B.2.2.1 Error Vector Magnitude for intra-band non-contiguous EN-DC | KTL | imported from 3GU |
| R5‑187085 | Introduction of New test case 6.4B.2.2.2 Carrier Leakage for intra-band non-contiguous EN-DC | KTL | imported from 3GU |
| R5‑187086 | Specifying Test procedure to check that UE is camped on a new NR cell belonging to a new TA | Samsung | imported from 3GU |
| R5‑187087 | Introduction of New test case 6.4B.2.2.3 In-band Emissions for intra-band non-contiguous EN-DC | KTL | imported from 3GU |
| R5‑187088 | Introduction of New test case 6.4B.2.3.1 Error Vector Magnitude for inter-band EN-DC within FR1 | KTL | imported from 3GU |
| R5‑187089 | Introduction of New test case 6.4B.2.3.2 Carrier Leakage for inter-band EN-DC within FR1 | KTL, MTCC | imported from 3GU |
| R5‑187090 | Introduction of New test case 6.4B.2.3.3 In-band Emissions for inter-band EN-DC within FR1 | KTL, MTCC | imported from 3GU |
| R5‑187091 | Update to FR1 test case 6.3.3.4 PRACH time mask | KTL | imported from 3GU |
| R5‑187092 | Introduction of New test case 6.6.2.2A.1_2 Additional Spectrum Emission Mask for CA (intra-band contiguous DL CA and UL CA) for UL 256QAM | KTL | imported from 3GU |
| R5‑187093 | Introduction of New test case 6.6.2.2A.2_2 Additional Spectrum Emission Mask for CA (inter-band DL CA and UL CA) for UL 256QAM | KTL | imported from 3GU |
| R5‑187094 | Update to Tx test cases for UL 256QAM | KTL | imported from 3GU |
| R5‑187095 | Addition of applicability and ICS for Tx test cases for UL 256QAM CA | KTL | imported from 3GU |
| R5‑187096 | Update to 3 Tx test case for 3UL CA | KTL | imported from 3GU |
| R5‑187097 | Addition of applicability and ICS for Tx test cases for 3UL CA | KTL | imported from 3GU |
| R5‑187098 | Update TC 6.6.3G.2_1 | Huawei, HiSilicon | imported from 3GU |
| R5‑187099 | Inter-band con-current V2X configurations- Add 3A_47A Spurious Emission Test points analysis | Huawei, HiSilicon | imported from 3GU |
| R5‑187100 | PRD-17 on Guidance to Work Item Codes version 3.14 (post RAN#82 version) | Rapporteur (BlackBerry) | imported from 3GU |
| R5‑187101 | TS 36.523-1 Status before RAN5#81 | Rapporteur (BlackBerry) | imported from 3GU |
| R5‑187102 | TS 36.523-1 Status after RAN5#81 | Rapporteur (BlackBerry) | imported from 3GU |
| R5‑187103 | Proposed Word Template for RAN5 WI Work Plan | BlackBerry UK Limited | imported from 3GU |
| R5‑187104 | Correcton to MAC test cases | Motorola Mobility and MCC TF160 | imported from 3GU |
| R5‑187105 | Correcton to RLC UM test cases | Motorola Mobility and MCC TF160 | imported from 3GU |
| R5‑187106 | Correcton to RLC AM test cases | Motorola Mobility and MCC TF160 | imported from 3GU |
| R5‑187107 | Correcton to PDCP Ciphering test cases | Motorola Mobility and MCC TF160 | imported from 3GU |
| R5‑187108 | Correcton to PDCP Integrity test cases | Motorola Mobility and MCC TF160 | imported from 3GU |
| R5‑187109 | Correcton to SDAP test cases | Motorola Mobility | imported from 3GU |
| R5‑187110 | Correcton to default message contents for SRB3 configuration | Motorola Mobility and MCC TF160 | imported from 3GU |
| R5‑187111 | Correcton to MAC TBS test cases | Motorola Mobility and MCC TF160 | imported from 3GU |
| R5‑187112 | Addition of Test Loop for SDAP testing | Ericsson, Motorola Mobility and Samsung | imported from 3GU |
| R5‑187113 | Correction of 5GC terminology | Motorola Mobility and MCC TF160 | imported from 3GU |
| R5‑187114 | Correction to RRCConnectionReconfiguration | Motorola Mobility, Qualcomm, Huawei, MCC TF160 | imported from 3GU |
| R5‑187115 | Addition of PICS | Motorola Mobility, CMCC | imported from 3GU |
| R5‑187116 | Correcton to Selection Expressions | Motorola Mobility and MCC TF160 | imported from 3GU |
| R5‑187117 | WP UE Conformance Test Aspects – 5G System Non-3GPP Access | Motorola Mobility | imported from 3GU |
| R5‑187118 | SR UE Conformance Test Aspects – 5G System Non-3GPP Access | Motorola Mobility | imported from 3GU |
| R5‑187119 | Correction to test case 8.2.4.1 for CAT-M1 UEs | ROHDE & SCHWARZ,Qualcomm Incorporated | imported from 3GU |
| R5‑187120 | Correction to test case 8.2.4.2 for CAT-M1 UEs | ROHDE & SCHWARZ, Qualcomm Incorporated | imported from 3GU |
| R5‑187121 | Correction to test case 8.2.4.5 for CAT-M1 UEs | ROHDE & SCHWARZ, Qualcomm Incorporated | imported from 3GU |
| R5‑187122 | Correction to test case 8.2.4.7 for CAT-M1 UEs | ROHDE & SCHWARZ, Qualcomm Incorporated | imported from 3GU |
| R5‑187123 | Correction to test case 8.2.4.8 for CAT-M1 UEs | ROHDE & SCHWARZ, Qualcomm Incorporated | imported from 3GU |
| R5‑187124 | Correction to test cases 8.3.1.10, 8.3.1.11a, 8.3.1.15 and 8.3.1.16 for CAT-M1 UEs | ROHDE & SCHWARZ, Qualcomm Incorporated | imported from 3GU |
| R5‑187125 | Correction to test case 8.3.1.8 for CAT-M1 UEs | ROHDE & SCHWARZ | imported from 3GU |
| R5‑187126 | Correction to test case 8.3.1.9 for CAT-M1 UEs | ROHDE & SCHWARZ, Qualcomm Incorporated | imported from 3GU |
| R5‑187127 | Correction to test case 8.3.1.11 for CAT-M1 UEs | ROHDE & SCHWARZ, Qualcomm Incorporated | imported from 3GU |
| R5‑187128 | Correction to test case 9.2.2.1.9 for CAT-M UEs | ROHDE & SCHWARZ, Qualcomm Incorporated | imported from 3GU |
| R5‑187129 | Maximum Output Power for CA | Sprint Corporaton | imported from 3GU |
| R5‑187130 | MOP for CA (intra-band contiguous DL CA and UL CA) | Sprint Corporaton | imported from 3GU |
| R5‑187131 | A-MPR for CA (intra-band contiguous DL CA and UL CA) | Sprint Corporaton | imported from 3GU |
| R5‑187132 | Configured UE transmitted output power for CA (intra-band contiguous DL CA and UL CA) | Sprint Corporaton | imported from 3GU |
| R5‑187133 | ACLR for CA (intra-band contiguous DL CA and UL CA) | Sprint Corporaton | imported from 3GU |
| R5‑187134 | Test point selection in A-MPR test cases | Sprint Corporaton | imported from 3GU |
| R5‑187135 | Applicability | Sprint Corporaton | imported from 3GU |
| R5‑187136 | UE Conformance Test Aspects - Add UE Power Class 2 to band 41 intra-band contiguous LTE Carrier Aggregation | Sprint Corporaton | imported from 3GU |
| R5‑187137 | UE Conformance Test Aspects - Add UE Power Class 2 to band 41 intra-band contiguous LTE Carrier Aggregation | Sprint Corporaton | imported from 3GU |
| R5‑187138 | Updated RF clause 9.8 to cover Cat-M2 requirement | Bureau Veritas | imported from 3GU |
| R5‑187139 | Updated RRM clause 4 tests to cover Cat-M2 requirement | Bureau Veritas | imported from 3GU |
| R5‑187140 | Updated RRM clause 5 tests to cover Cat-M2 requirement | Bureau Veritas | imported from 3GU |
| R5‑187141 | Updated RRM clause 6 tests to cover Cat-M2 requirement | Bureau Veritas | imported from 3GU |
| R5‑187142 | Updated RRM clause 7 tests to cover Cat-M2 requirement | Bureau Veritas | imported from 3GU |
| R5‑187143 | Align CA information in clause 5 with TS36.101 v15.4.0 | Bureau Veritas | imported from 3GU |
| R5‑187144 | Align CA information in clause 7.3A.0 with TS36.101 v15.4.0 | Bureau Veritas | imported from 3GU |
| R5‑187145 | Updated test requirement to RF clause 7 test cases for CA band | Bureau Veritas | imported from 3GU |
| R5‑187146 | Updated to TC9.6.1.1_A.4 for 5DL CA requirement | Bureau Veritas | imported from 3GU |
| R5‑187147 | Correction to test configuration table for CA band combination | Bureau Veritas, Anritsu, SGS Wireless | imported from 3GU |
| R5‑187148 | General clauses updated for TR38.903 | Bureau Veritas, Huawei, HiSilicon | imported from 3GU |
| R5‑187149 | Updated to Annexes for FR1 tests | Bureau Veritas | imported from 3GU |
| R5‑187150 | General clauses updated for TS38.521-1 | Bureau Veritas | imported from 3GU |
| R5‑187151 | Updated to Annexes for FR2 tests | Bureau Veritas | imported from 3GU |
| R5‑187152 | General Information updated for TS38.521-2 | Bureau Veritas | imported from 3GU |
| R5‑187153 | Updated EN-DC configuration information in clause 5 | Bureau Veritas | imported from 3GU |
| R5‑187154 | Added applicability of requirements for UEs supporting coverage enhancement | Bureau Veritas | imported from 3GU |
| R5‑187155 | Added ICS item for missing Category DL and UL | Bureau Veritas | imported from 3GU |
| R5‑187156 | Correction to tested CA configuration selection criteria for Rx tests | Bureau Veritas | imported from 3GU |
| R5‑187157 | Correction to RLC test case 7.2.3.13 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑187158 | Updates to Authentication 5GMM messages | Ericsson | imported from 3GU |
| R5‑187159 | Updates to Configuration Update 5GMM messages | Ericsson | imported from 3GU |
| R5‑187160 | Updates to De-registration 5GMM messages | Ericsson | imported from 3GU |
| R5‑187161 | Updates to Identity 5GMM messages | Ericsson | imported from 3GU |
| R5‑187162 | Updates to NAS Transport 5GMM messages | Ericsson | imported from 3GU |
| R5‑187163 | Updates to Notification 5GMM messages | Ericsson | imported from 3GU |
| R5‑187164 | Updates to PDU session authentication 5GSM messages | Ericsson | imported from 3GU |
| R5‑187165 | Updates to PDU session establishment 5GSM messages | Ericsson | imported from 3GU |
| R5‑187166 | Updates to PDU session modification 5GSM messages | Ericsson | imported from 3GU |
| R5‑187167 | Updates to PDU session release 5GSM messages | Ericsson | imported from 3GU |
| R5‑187168 | Updates to Registration 5GMM messages | Ericsson | imported from 3GU |
| R5‑187169 | Updates to Security mode 5GMM messages | Ericsson | imported from 3GU |
| R5‑187170 | Updates to Security protected 5GS NAS and 5GMM status messages | Ericsson | imported from 3GU |
| R5‑187171 | Updates to Service Request 5GMM messages | Ericsson | imported from 3GU |
| R5‑187172 | Removal of Editor’s Notes in section 4.6.3 | Ericsson | imported from 3GU |
| R5‑187173 | Addition of new Information Elements in section 4.6.3 | Ericsson | imported from 3GU |
| R5‑187174 | Addition and updates to Information Elements in section 4.6.4 | Ericsson | imported from 3GU |
| R5‑187175 | Addition and updates to Information Elements in section 4.6.5 | Ericsson | imported from 3GU |
| R5‑187176 | New feMTC IEs | Ericsson | imported from 3GU |
| R5‑187177 | New feMTC test case 21.2.2 | Ericsson | imported from 3GU |
| R5‑187178 | Removal of feMTC test case 8.2.2.6.6 | Ericsson | imported from 3GU |
| R5‑187179 | Updates to feMTC test case applicabilities | Ericsson | imported from 3GU |
| R5‑187180 | WP UE Conformance Test Aspects – Further enhanced MTC for LTE | Ericsson | imported from 3GU |
| R5‑187181 | SR UE Conformance Test Aspects – Further enhanced MTC for LTE | Ericsson | imported from 3GU |
| R5‑187182 | Clarification for Cat-M1 Reference Sensitivity Test Requirement | PCTEST Engineering Lab, Verizon, AT&T | imported from 3GU |
| R5‑187183 | Correction to number of almanac elements for Galileo | ROHDE & SCHWARZ, Spirent Communications | imported from 3GU |
| R5‑187184 | Correction to V2V TC 24.1.4 | ROHDE & SCHWARZ, Qualcomm Incorporated | imported from 3GU |
| R5‑187185 | Discussion on duplicated testing of UL 64QAM and UL 256QAM in Tx test cases | CETECOM GmbH | imported from 3GU |
| R5‑187186 | Corrections to clause 5.5.9 of 36.579-1 | NIST | imported from 3GU |
| R5‑187187 | Change of applicability in UL 64QAM MPR and A-MPR tests due to UL 256QAM support | CETECOM GmbH | imported from 3GU |
| R5‑187188 | Change of applicability in UL 64QAM A-SEM and ACLR and Additional spurious tests due to UL 256QAM support | CETECOM GmbH | imported from 3GU |
| R5‑187189 | Corrections to clause 5.5.7.1 of 36.579-1 | NIST | imported from 3GU |
| R5‑187190 | Correction of LWA Test Case 8.2.5.8 | Intel Corporation (UK) Ltd | imported from 3GU |
| R5‑187191 | Change of test point applicability in TC 6.2.3_4 due to 256QAM support | CETECOM GmbH | imported from 3GU |
| R5‑187192 | Change of test point applicability in TC 6.2.4_2 due to 256QAM support | CETECOM GmbH | imported from 3GU |
| R5‑187193 | Change of test point applicability in TC 6.6.2.2_1 due to 256QAM support | CETECOM GmbH | imported from 3GU |
| R5‑187194 | Corrections to LWA TC 8.2.5.7 | Intel Corporation (UK) Ltd | imported from 3GU |
| R5‑187195 | Change of test point applicability in TC 6.6.2.3_4 due to 256QAM support | CETECOM GmbH | imported from 3GU |
| R5‑187196 | Aligning CA delta TiB in sub-clause 6.2.5.3 with TS 36.101 v15.4.0 | Ericsson | imported from 3GU |
| R5‑187197 | Change of test point applicability in TC 6.6.3.3_1 due to 256QAM support | CETECOM GmbH | imported from 3GU |
| R5‑187198 | Correction to GCF WI-086 EUTRA EPC Testcases 9.2.1.2.1b and 9.2.1.2.1c | ANRITSU LTD | imported from 3GU |
| R5‑187199 | Correction of LWA Test Case 8.2.5.4 and LWIP 8.2.5.5 | Intel Corporation (UK) Ltd | imported from 3GU |
| R5‑187200 | Aligning CA delta RiB in sub-clause 7.3.3 with TS 36.101 v15.4.0 | Ericsson | imported from 3GU |
| R5‑187201 | Addition of support for LWA/LWIP Test Cases in generic procedures | Intel Corporation (UK) Ltd | imported from 3GU |
| R5‑187202 | Addition of new UL 256QAM test case - MPR for intra-band contiguous | CETECOM GmbH | imported from 3GU |
| R5‑187203 | Update for Resource-lists in 36.579-1 | NIST | imported from 3GU |
| R5‑187204 | Addition of new UL 256QAM test case - MPR for inter-band | CETECOM GmbH | imported from 3GU |
| R5‑187205 | Addition of new UL 256QAM test case - ACLR for multi cluster | CETECOM GmbH | imported from 3GU |
| R5‑187206 | SR - UE Conformance Test Aspects - Mission Critical Improvements (UID - 790052) MCImp-UEConTest | NIST | imported from 3GU |
| R5‑187207 | WP - UE Conformance Test Aspects - Mission Critical Improvements (UID - 790052) MCImp-UEConTest | NIST | imported from 3GU |
| R5‑187208 | Addition of new UL 256QAM test case - MPR for intra-band contiguous | CETECOM GmbH | imported from 3GU |
| R5‑187209 | Correction to Table 5.5.1-1 in 36.579-1 | NIST | imported from 3GU |
| R5‑187210 | Addition of new UL 256QAM test case - ALCR for intra-band contiguous | CETECOM GmbH | imported from 3GU |
| R5‑187211 | Addition of new UL 256QAM test case - MPR for inter-band | CETECOM GmbH | imported from 3GU |
| R5‑187212 | Addition of new UL 256QAM test case - ACLR for inter-band | CETECOM GmbH | imported from 3GU |
| R5‑187213 | Correction to Table 5.5.4.10.1-1 in 36.579-1 | NIST | imported from 3GU |
| R5‑187214 | Discussion on Mid test channel bandwidth in Band n257 | NTT DOCOMO, INC. | imported from 3GU |
| R5‑187215 | Update of Mid test channel bandwidth in Band n257 | NTT DOCOMO, INC. | imported from 3GU |
| R5‑187216 | Corrections to LWA/LWIP Test Cases 8.2.5.1, 8.2.5.2, 8.2.5.6 | Intel Corporation (UK) Ltd | imported from 3GU |
| R5‑187217 | Corrections to Test Case 8.2.5.2 | Intel Corporation (UK) Ltd | imported from 3GU |
| R5‑187218 | Corrections to Test Case 8.2.5.6 | Intel Corporation (UK) Ltd | imported from 3GU |
| R5‑187219 | Characterization of the quality of quiet zone for 30 cm DUT size IFF | Anritsu | imported from 3GU |
| R5‑187220 | MU contribution of “Mismatch” | Anritsu | imported from 3GU |
| R5‑187221 | MU contribution of “Uncertainty of the RF power measurement" | Anritsu | imported from 3GU |
| R5‑187222 | MU contribution of "Amplifier Uncertainties" | Anritsu | imported from 3GU |
| R5‑187223 | MU contribution of “Influence of the XPD“ | Anritsu | imported from 3GU |
| R5‑187224 | Correction to measurement error contribution descriptions of XPD | Anritsu | imported from 3GU |
| R5‑187225 | MU contribution of "Insertion loss variation" | Anritsu | imported from 3GU |
| R5‑187226 | MU contribution of “RF leakage” | Anritsu | imported from 3GU |
| R5‑187227 | Correction to measurement error contribution descriptions of RF leakage | Anritsu | imported from 3GU |
| R5‑187228 | Consideration on MU contribution caused by antenna switching | Anritsu | imported from 3GU |
| R5‑187229 | MU contribution of “gNB uncertainty on absolute level” | Anritsu | imported from 3GU |
| R5‑187230 | MU contribution of “Uncertainty of network analyzer” | Anritsu | imported from 3GU |
| R5‑187231 | MU contribution of “Mean signal level shift due to Meas.Ant directivity and AUT-position uncertainty” | Anritsu | imported from 3GU |
| R5‑187232 | MU contribution of “Influence of noise due to low SNR” | Anritsu | imported from 3GU |
| R5‑187233 | Update of MU budget tables in TR 38.903 | Anritsu | imported from 3GU |
| R5‑187234 | Simplification of QoQZ characterization at out-of-band region | Anritsu | imported from 3GU |
| R5‑187235 | Consideration of TT values in different frequency ranges for FR2 | Apple Inc. | imported from 3GU |
| R5‑187236 | Update RRC TC 8.2.1.2.1 - BandwidthPart Configuration / SCG / EN-DC | Qualcomm Korea (TTA) | imported from 3GU |
| R5‑187237 | Update RRC TC 8.2.2.4.1 - PSCell addition, modification and release / SCG DRB / EN-DC | Qualcomm Korea (TTA) | imported from 3GU |
| R5‑187238 | Update RRC TC 8.2.2.8.1 - Bearer Modification / Handling for bearer type change with security key change / EN-DC | Qualcomm Korea (TTA) | imported from 3GU |
| R5‑187239 | Update RRC TC 8.2.2.9.1 - Bearer Modification / Uplink data path / Split DRB Reconfiguration / EN-DC | Qualcomm Korea (TTA) | imported from 3GU |
| R5‑187240 | Update RRC TC 8.2.3.1.1 - Measurement configuration control and reporting / Inter-RAT measurements / Event B1 / Measurement of NR cells / EN-DC | Qualcomm Korea (TTA) | imported from 3GU |
| R5‑187241 | Update RRC SCG failure TC 8.2.5.1.1 | Qualcomm Korea (TTA) | imported from 3GU |
| R5‑187242 | Update RRC SCG failure TC 8.2.5.3.1 | Qualcomm Korea (TTA) | imported from 3GU |
| R5‑187243 | Update RRC TC 8.2.1.1.1 - UE capability transfer / Success / EN-DC | Qualcomm Korea (TTA) | imported from 3GU |
| R5‑187244 | Addition of 5GS SA RRC TC 8.1.1.1.1 | Qualcomm Korea (TTA) | imported from 3GU |
| R5‑187245 | Addition of 5GS SA RRC TC 8.1.1.1.3 | Qualcomm Korea (TTA) | imported from 3GU |
| R5‑187246 | Addition of 5GS SA RRC TC 8.1.1.2.5 | Qualcomm Korea (TTA) | imported from 3GU |
| R5‑187247 | Addition of 5GS SA RRC TC 8.1.5.2.1 | Qualcomm Korea (TTA) | imported from 3GU |
| R5‑187248 | Correction to MAC Test case 7.1.1.1.2 Random access procedure / Successful / C-RNTI Based / Preamble selected by MAC itself | Qualcomm Europe Inc.(Spain) | imported from 3GU |
| R5‑187249 | Correction to MAC Test case 7.1.1.5.3 DRX operation / Short cycle configured / Parameters configured by RRC | Qualcomm Europe Inc.(Spain) | imported from 3GU |
| R5‑187250 | Correction to RLC Test case 7.1.2.3.10 AM RLC / Re-transmission of RLC PDU with and without re-segmentation | Qualcomm Europe Inc.(Spain) | imported from 3GU |
| R5‑187251 | Correction to RLC Test case 7.1.2.3.11 AM RLC / RLC re-establishment procedure | Qualcomm Europe Inc.(Spain) | imported from 3GU |
| R5‑187252 | Correction to PDCP Test case 7.1.3.4.1 PDCP handover / Lossless handover / PDCP sequence number maintenance / PDCP status report to convey the information on missing or acknowledged PDCP SDUs at handover / In-order delivery and duplicate elimination | Qualcomm Europe Inc.(Spain) | imported from 3GU |
| R5‑187253 | Correction to PDCP Test case 7.1.3.5.4 PDCP reordering / Maximum re-ordering delay below t-Reordering / t-Reordering timer operations | Qualcomm Europe Inc.(Spain) | imported from 3GU |
| R5‑187254 | Update RRC TCs 8.2.4.1.1.1, 8.2.4.1.1.2 and 8.2.4.1.1.3 NR CA / NR SCell addition / modification / release / Success | Qualcomm Europe Inc.(Spain) | imported from 3GU |
| R5‑187255 | Correction to EN-DC NAS test case 10.2.1.1 - Default EPS bearer context activation | Qualcomm Europe Inc.(Spain) | imported from 3GU |
| R5‑187256 | Addition of 5GC TC - Initial registration / 5GS services / NSSAI handling | Qualcomm Europe Inc.(Spain) | imported from 3GU |
| R5‑187257 | Addition of Idle Mode TC - Steering of UE in roaming during registration/security check successful using List Type | Qualcomm Europe Inc.(Spain) | imported from 3GU |
| R5‑187258 | UE Capability in EN-DC | Qualcomm Europe Inc.(Spain) | imported from 3GU |
| R5‑187259 | Updates to SIG OTA Calibration for FR2 | Qualcomm Europe Inc.(Spain) | imported from 3GU |
| R5‑187260 | Addition of 5GC TC - Initial registration / SMS over NAS service | Qualcomm Europe Inc.(Spain) | imported from 3GU |
| R5‑187261 | EN-DC B41_n41 update for Signaling | Qualcomm Europe Inc.(Spain) | imported from 3GU |
| R5‑187262 | Introduction of 4 DL CA Activation and Deactivation of Known SCell in Non-DRX with generic duplex modes | LG Electronics | imported from 3GU |
| R5‑187263 | pCR for Addition of Test Case 4.4.3.1 EN-DC FR1 timing advance adjustment accuracy | Qualcomm CDMA Technologies | imported from 3GU |
| R5‑187264 | Introduction of 4 DL CA Activation and Deactivation of Unknown SCell in Non-DRX with generic duplex modes | LG Electronics | imported from 3GU |
| R5‑187265 | Introduction of 5 DL CA Activation and Deactivation of Known SCell in Non-DRX with generic duplex modes | LG Electronics | imported from 3GU |
| R5‑187266 | Introduction of 5 DL CA Activation and Deactivation of Unknown SCell in Non-DRX with generic duplex modes | LG Electronics | imported from 3GU |
| R5‑187267 | Editorial correction to FS3 RRM clause 8 Tests | Anritsu | imported from 3GU |
| R5‑187268 | CA_3A-28A - Updates of test points analysis | KDDI Corporation | imported from 3GU |
| R5‑187269 | Addition of new TC 9.1.8.4 | Starpoint,TDIA,CATT | imported from 3GU |
| R5‑187270 | Updating 4.2.1^^ General functional requirements | Anritsu | imported from 3GU |
| R5‑187271 | Update the section for test equipment requirements for TRx | Anritsu | imported from 3GU |
| R5‑187272 | FR2 downlink signal level(38.508-1) | Anritsu | imported from 3GU |
| R5‑187273 | Consideration on MU and TT for FR2 Tx test cases with low SNR | Anritsu | imported from 3GU |
| R5‑187274 | SNR estimation for priority 1 and 2 FR2 Tx test cases | Anritsu | imported from 3GU |
| R5‑187275 | Discussion of MU for occupied BW for FR1 | Anritsu | imported from 3GU |
| R5‑187276 | On the FR2 MU for occupied BW and ACLR | Anritsu | imported from 3GU |
| R5‑187277 | Introduction of receiver spurious emission tests for FR1 inter-band EN-DC | Anritsu | imported from 3GU |
| R5‑187278 | TP analysis for receiver spurious emission tests for FR1 inter-band EN-DC | Anritsu | imported from 3GU |
| R5‑187279 | Introduction of wideband intermodulation tests for FR1 inter-band EN-DC | Anritsu | imported from 3GU |
| R5‑187280 | TP analysis for wideband intermodulation tests for FR1 inter-band EN-DC | Anritsu | imported from 3GU |
| R5‑187281 | Introduction of receiver spurious emission tests for FR1 SA | Anritsu | imported from 3GU |
| R5‑187282 | TP analysis for receiver spurious emission tests for FR1 SA | Anritsu | imported from 3GU |
| R5‑187283 | Introduction of wideband intermodulation tests for FR1 SA | Anritsu | imported from 3GU |
| R5‑187284 | TP analysis for wideband intermodulation tests for FR1 SA | Anritsu | imported from 3GU |
| R5‑187285 | Updating power levels for LTE Anchor Link | Anritsu | imported from 3GU |
| R5‑187286 | FR2 downlink signal level(38.521-2) | Anritsu | imported from 3GU |
| R5‑187287 | LTE Anchor Link configuration for FR2 | Anritsu | imported from 3GU |
| R5‑187288 | Correction to RB numbers for DFT-s-OFDM | Anritsu | imported from 3GU |
| R5‑187289 | On the test procedure for FR2 maximum input level test | Anritsu | imported from 3GU |
| R5‑187290 | On the testability issue for the FR2 TRx tests | Anritsu | imported from 3GU |
| R5‑187291 | CA_3A-28A - Updates of some Tx test cases | KDDI Corporation | imported from 3GU |
| R5‑187292 | CA_11A-18A - Updates of test points analysis | KDDI Corporation | imported from 3GU |
| R5‑187293 | CA_11A-18A - Updates of some Tx test cases | KDDI Corporation | imported from 3GU |
| R5‑187294 | CA_3A-41A-42C(1UL) - Updates of test points analysis | KDDI Corporation | imported from 3GU |
| R5‑187295 | CA_3A-41A-42C(1UL) - Updates of 7.3A.9 REFSENS | KDDI Corporation | imported from 3GU |
| R5‑187296 | Ambiguity on procedure of selecting CA configuration in SDR CA (4layer) tests | NTT DOCOMO, INC. | imported from 3GU |
| R5‑187297 | CA_3A-41C-42A(1UL) - Updates of test points analysis | KDDI Corporation | imported from 3GU |
| R5‑187298 | CA_3A-41C-42A(1UL) - Updates of 7.3A.9 REFSENS | KDDI Corporation | imported from 3GU |
| R5‑187299 | CA_3A-41C-42C(1UL) - Updates of test points analysis | KDDI Corporation | imported from 3GU |
| R5‑187300 | CA_3A-41C-42C(1UL) - Updates of 7.3A.10 REFSENS | KDDI Corporation | imported from 3GU |
| R5‑187301 | Addition of new TC 9.1.8.6 | Starpoint,TDIA,CATT | imported from 3GU |
| R5‑187302 | Correction to test case 8.2.4.3.1.1 | TDIA, CATT | imported from 3GU |
| R5‑187303 | Addition of new 5GC TC 9.1.5.2.2 | CATT, TDIA | imported from 3GU |
| R5‑187304 | Correction of RB allocation for 3DL_CA_1A-3A-41A | Qualcomm Incorporated | imported from 3GU |
| R5‑187305 | Addition of new TC 9.1.8.7 | Starpoint,TDIA,CATT | imported from 3GU |
| R5‑187306 | Addition of new 5GC TC 9.1.6.1.1 | CATT,TDIA | imported from 3GU |
| R5‑187307 | Introduction of New FR1 test case 6.3.3.6 SRS time mask | MTCC, KTL | imported from 3GU |
| R5‑187308 | 5G_FR1 Text update for 6.5.3.3 Additonal Spurious emission | Qualcomm Incorporated | imported from 3GU |
| R5‑187309 | Introduction of New FR1 test case 6.3.3.7 PUSCH-PUCCH and PUSCH-SRS time masks | MTCC, KTL | imported from 3GU |
| R5‑187310 | Editorial change to applicability condition for TC8.2.1.3.1_A.1 | TTA | imported from 3GU |
| R5‑187311 | Addition of general test procedures for 5GC testing | CATT | imported from 3GU |
| R5‑187312 | Additonal Spurious Emissions for Intra-band contiguous EN-DC | Qualcomm Incorporated | imported from 3GU |
| R5‑187313 | Additonal Spurious Emissions for Intra-band non-contiguous EN-DC | Qualcomm Incorporated | imported from 3GU |
| R5‑187314 | Addition of test applicabilities for 5GC testcases | CATT | imported from 3GU |
| R5‑187315 | Addition of notes to clarify test point selection into general section of TS 38.521-1 | NTT DOCOMO, INC. | imported from 3GU |
| R5‑187316 | Addition of new TC 9.1.8.11 | Starpoint,TDIA,CATT | imported from 3GU |
| R5‑187317 | Additonal Spurious emission for inter-band EN-DC | Qualcomm Incorporated | imported from 3GU |
| R5‑187318 | Addition of notes to clarify test point selection into general section of TS 38.521-2 | NTT DOCOMO, INC. | imported from 3GU |
| R5‑187319 | Addition of notes to clarify test point selection into general section of TS 38.521-3 | NTT DOCOMO, INC. | imported from 3GU |
| R5‑187320 | Spurious emission band UE co-existence for intra-band non-contiguous EN-DC | Qualcomm Incorporated | imported from 3GU |
| R5‑187321 | Core alignment CR to capture TS 38.101-1 updates during RAN4#89 | NTT DOCOMO, INC. | imported from 3GU |
| R5‑187322 | Correction to clause 9.1.1.4.2 | TTA | imported from 3GU |
| R5‑187323 | Core alignment CR to capture TS 38.101-2 updates during RAN4#89 | NTT DOCOMO, INC. | imported from 3GU |
| R5‑187324 | Core alignment CR to capture TS 38.101-3 updates during RAN4#89 | NTT DOCOMO, INC. | imported from 3GU |
| R5‑187325 | Addition of new 5GC TC 9.1.2.1 | TDIA, CATT | imported from 3GU |
| R5‑187326 | Addition of new TC 9.1.8.15 | Starpoint,TDIA,CATT | imported from 3GU |
| R5‑187327 | Update of test case 9.6.1.1_A.4 | TTA | imported from 3GU |
| R5‑187328 | Update the applicability of 5G NR TC 8.2.3.12.1 | Intertek, Qualcomm | imported from 3GU |
| R5‑187329 | Introduction of Additional spurious emissions for UL 256QAM | TTA | imported from 3GU |
| R5‑187330 | Applicability addition of test case 6.6.3.3A.1_2 | TTA | imported from 3GU |
| R5‑187331 | Addition of new UL 256QAM test case - Annex F | CETECOM GmbH | imported from 3GU |
| R5‑187332 | Correction of applicability statement in TC 6.2.4A.2_2 | CETECOM GmbH | imported from 3GU |
| R5‑187333 | TP analyses for new Rel-15 CA configurations | CETECOM GmbH | imported from 3GU |
| R5‑187334 | Changing the cell configuration mapping tables to cater for RRM generic duplex mode tests | Anritsu, Intel, ROHDE & SCHWARZ | imported from 3GU |
| R5‑187335 | Test points and test requirements in TC 7.3A.9 for CA_2A-66C-71A and CA_2C-66A-66A | CETECOM GmbH | imported from 3GU |
| R5‑187336 | Mismatch (40 - 60 GHz) | Anritsu | imported from 3GU |
| R5‑187337 | Addition of descriptions on new MU contributions | Anritsu | imported from 3GU |
| R5‑187338 | Temporary | Anritsu | imported from 3GU |
| R5‑187339 | Addition of new UL 256QAM test cases - applicability | CETECOM GmbH | imported from 3GU |
| R5‑187340 | Introduction of CA_2A-66C-71A in Rx test cases | CETECOM GmbH | imported from 3GU |
| R5‑187341 | Introduction of CA configurations CA_2A-66C-71A and CA_2C-66A-66A | CETECOM GmbH | imported from 3GU |
| R5‑187342 | Introduction of CA configurations CA_2A-66C-71A and CA_2C-66A-66A | CETECOM GmbH | imported from 3GU |
| R5‑187343 | Correction of applicability statement in TC 6.2.4A.1 | CETECOM GmbH | imported from 3GU |
| R5‑187344 | Addition of new Rel-14 CA configurations into REFSENS test | NTT DOCOMO, INC. | imported from 3GU |
| R5‑187345 | Addition of new Rel-15 CA configurations into REFSENS test | NTT DOCOMO, INC. | imported from 3GU |
| R5‑187346 | Correction of applicability in TC 6.6.2.2A.2 and TC.6.6.3.3A.2 | CETECOM GmbH | imported from 3GU |
| R5‑187347 | Correction for test procedure step 4 in TC 6.6.3.3A.1 | CETECOM GmbH | imported from 3GU |
| R5‑187348 | Correction for test procedure in TC 6.6.3.3A.2 | CETECOM GmbH | imported from 3GU |
| R5‑187349 | Correction for test procedure in TC 6.6.3.3A.1_1 | CETECOM GmbH | imported from 3GU |
| R5‑187350 | Correction for test procedure in TC 6.6.3.3A.2_1 | CETECOM GmbH | imported from 3GU |
| R5‑187351 | Addition of new 5GC TC 9.1.8.13 | CAICT | imported from 3GU |
| R5‑187352 | Update for reference sensitivity TP analysis for CA_2A-66A-71A CA configuration | CETECOM GmbH | imported from 3GU |
| R5‑187353 | Correction in TC 7.3A.3 for CA configuration CA_2A-71A | CETECOM GmbH | imported from 3GU |
| R5‑187354 | Correction in TC 7.3A.5 for CA configuration CA_2A-66A-71A | CETECOM GmbH | imported from 3GU |
| R5‑187355 | Addition of new 5GC TC 9.1.8.17 | CAICT | imported from 3GU |
| R5‑187356 | Addition of 5GC test case 10.1.2.1 | CATT, TDIA | imported from 3GU |
| R5‑187357 | Addition of 5GC test case 10.1.3.1 | CATT, TDIA | imported from 3GU |
| R5‑187358 | Addition of applicability of feMTC test cases | Ericsson | imported from 3GU |
| R5‑187359 | Addition of 5GC Test case 10.1.5.1 | TDIA, CATT | imported from 3GU |
| R5‑187360 | Update RRC TC 8.2.3.12.1 | Intertek | imported from 3GU |
| R5‑187361 | Introduction of Error Vector Magnitude for intra-band contiguous EN-DC | LG Electronics | imported from 3GU |
| R5‑187362 | Introduction of Carrier Leakage for intra-band contiguous EN-DC | LG Electronics | imported from 3GU |
| R5‑187363 | Corrections to TC 7.3A.5 | Rohde & Schwarz | imported from 3GU |
| R5‑187364 | Correction to general clause 7.1 | Rohde & Schwarz | imported from 3GU |
| R5‑187365 | Corrections to eMTC CQI Test Cases | Rohde & Schwarz | imported from 3GU |
| R5‑187366 | Introduction of In-band Emissions for intra-band contiguous EN-DC | LG Electronics | imported from 3GU |
| R5‑187367 | Update of V2X RF Receiver Test Cases for Intra-band contiguous | SGS Wireless | imported from 3GU |
| R5‑187368 | Addition of TC6.3B.3.1 Tx ON/OFF time mask for intra-band contiguous EN-DC | SGS Wireless | imported from 3GU |
| R5‑187369 | Addition of TC6.3B.3.2 Tx ON/OFF time mask for intra-band non-contiguous EN-DC | SGS Wireless | imported from 3GU |
| R5‑187370 | Addition of TC6.3B.3.3 Tx ON/OFF time mask for inter-band EN-DC within FR1 | SGS Wireless | imported from 3GU |
| R5‑187371 | Addition of TC6.3B.2.1 Transmit OFF Power for intra-band contiguous EN-DC | SGS Wireless | imported from 3GU |
| R5‑187372 | Addition of TC6.3B.2.3 Transmit OFF Power for inter-band EN-DC within FR1 | SGS Wireless | imported from 3GU |
| R5‑187373 | Addition of TC6.3B.2.2 Transmit OFF Power for intra-band non-contiguous EN-DC | SGS Wireless | imported from 3GU |
| R5‑187374 | Correction to Contact header in MT INVITE | ROHDE & SCHWARZ, Qualcomm Incorporated | imported from 3GU |
| R5‑187375 | Discussion on LS on FGI bit 103 and 104 | Huawei, HiSilicon, CMCC, CATT | imported from 3GU |
| R5‑187376 | Update of 6.2.1 MOP | Huawei, HiSilicon | imported from 3GU |
| R5‑187377 | Update of 6.2.4 Configured Output Power | Huawei, HiSilicon | imported from 3GU |
| R5‑187378 | Update of 6.3.1 Minimum Output Power | Huawei, HiSilicon | imported from 3GU |
| R5‑187379 | Update of 6.3.3.2 General ON/OFF time mask | Huawei, HiSilicon | imported from 3GU |
| R5‑187380 | Addition of 6.2D.1 MOP for MIMO | Huawei, HiSilicon | imported from 3GU |
| R5‑187381 | Addition of 6.2D.2 MPR for MIMO | Huawei, HiSilicon | imported from 3GU |
| R5‑187382 | Addition of 6.2D.4 Configured Output Power for MIMO | Huawei, HiSilicon | imported from 3GU |
| R5‑187383 | Addition of 6.4D.1 Frequency error for MIMO | Huawei, HiSilicon | imported from 3GU |
| R5‑187384 | Addition of 6.4D.2.1 EVM for MIMO | Huawei, HiSilicon | imported from 3GU |
| R5‑187385 | Addition of 6.4D.2.2 Carrier Leakage for MIMO | Huawei, HiSilicon | imported from 3GU |
| R5‑187386 | Addition of 6.4D.2.3 In-band emissions for MIMO | Huawei, HiSilicon | imported from 3GU |
| R5‑187387 | Addition of 6.4D.2.4 EVM equalizer spectrum flatness for MIMO | Huawei, HiSilicon | imported from 3GU |
| R5‑187388 | Adding test frequencies for EN-DC DC_(n)71AA and DC_(n)41AA | Huawei, HiSilicon | imported from 3GU |
| R5‑187389 | Removing editor’s note in FDD 5DL CA test cases | Huawei, HiSilicon, Bureau Veritas, SGS | imported from 3GU |
| R5‑187390 | Update CSI related information elements | NTT DOCOMO INC. | imported from 3GU |
| R5‑187391 | On RRM test frequency selection for FR1 and FR2 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑187392 | Applicability for NR NSA Option 3 protocol tests | ROHDE & SCHWARZ | imported from 3GU |
| R5‑187393 | Addition of Cat. M2 Support to RRM CE tests - Chapter 8 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑187394 | Addition of Cat. M2 Support to RRM CE tests - Chapter 9 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑187395 | Update of test case 6.2.3 UE A-MPR, general | Ericsson-LG Co., LTD | imported from 3GU |
| R5‑187396 | Update of TR 38.905 with SA FR1 A-MPR test point analyses, NS_04 | Ericsson-LG Co., LTD | imported from 3GU |
| R5‑187397 | Update of test case 6.2.3 UE A-MPR, NS_04 | Ericsson-LG Co., LTD | imported from 3GU |
| R5‑187398 | Update of TR 38.905 with SA FR1 Additional spectrum emission mask NS_04 test point analyses | Ericsson-LG Co., LTD | imported from 3GU |
| R5‑187399 | Update of test case test case 6.5.2.3 Additional spectrum emission mask, NS_04 | Ericsson-LG Co., LTD | imported from 3GU |
| R5‑187400 | Update of TR 38.905 with EN-DC A-MPR test point analyses, NS_04 | Ericsson-LG Co., LTD | imported from 3GU |
| R5‑187401 | Update of test case 6.2B.3.1 UE A-MPR for Intra-band contiguous EN-DC for NS_04 | Ericsson-LG Co., LTD | imported from 3GU |
| R5‑187402 | Update of TR 38.905 with EN-DC A-MPR test point analyses, NS_04 non-contigous | Ericsson-LG Co., LTD | imported from 3GU |
| R5‑187403 | New RRM 5G Test Cases 4.6.2.1 – 4.6.2.8 | Ericsson | imported from 3GU |
| R5‑187404 | New RRM 5G Test Cases 5.6.2.1 – 5.6.2.4 | Ericsson | imported from 3GU |
| R5‑187405 | New RRM 5G Test Cases 6.6.2.1 – 6.6.2.8 | Ericsson | imported from 3GU |
| R5‑187406 | New RRM 5G Test Cases 7.6.2.1 – 7.6.2.4 | Ericsson | imported from 3GU |
| R5‑187407 | Update of test case 6.2B.3.2 UE A-MPR for Intra-band non-contigous EN-DC for NS_04 | Ericsson-LG Co., LTD | imported from 3GU |
| R5‑187408 | Update of test case 6.5B.2.1.2 Additional spectrum emission mask for intra-band contigous EN-DC for NS_04 | Ericsson-LG Co., LTD | imported from 3GU |
| R5‑187409 | Update of test case 6.2B.3.1 UE A-MPR for Intra-band contiguous EN-DC for NS_04 | Ericsson-LG Co., LTD | imported from 3GU |
| R5‑187410 | Update of 5GS NR RRC test case 8.2.2.6.1 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑187411 | Addition of 5GS NR MAC test case 7.1.1.3.9 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑187412 | Addition of 5GS related new EFs to Test UICC definition | ROHDE & SCHWARZ | imported from 3GU |
| R5‑187413 | Uplink RNTI to valid value in TS 38.508-1 | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑187414 | Addition of 5GS NR RRC test case 8.1.1.3.2 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑187415 | Update maxPayloadMinus1 in PUCCH config in TS 38.508-1 | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑187416 | Addition of PICS Mnemonic for ECT | ROHDE & SCHWARZ, Qualcomm Incorporated, Intel | imported from 3GU |
| R5‑187417 | Addition of ReportConfigInterRAT for NR | Intertek | imported from 3GU |
| R5‑187418 | Addition of 2TX_UL_MIMO condition | Huawei, Hisilicon | imported from 3GU |
| R5‑187419 | Addition of SUL condition | Huawei, Hisilicon | imported from 3GU |
| R5‑187420 | Addition of connection diagram for 2 TX UL MIMO | Huawei, Hisilicon | imported from 3GU |
| R5‑187421 | Introduction of TC 6.5D.1 Occupied bandwidth for UL MIMO | Huawei, Hisilicon | imported from 3GU |
| R5‑187422 | Introduction of TC 6.5D.2.2 Spectrum Emission Mask for UL MIMO | Huawei, Hisilicon | imported from 3GU |
| R5‑187423 | Introduction of TC 6.5D.2.3 Additional Spectrum Emission Mask for UL MIMO | Huawei, Hisilicon | imported from 3GU |
| R5‑187424 | Introduction of TC 6.5D.2.4.1 NR ACLR for UL MIMO | Huawei, Hisilicon | imported from 3GU |
| R5‑187425 | Introduction of TC 6.5D.2.4.2 UTRA ACLR for UL MIMO | Huawei, Hisilicon | imported from 3GU |
| R5‑187426 | Introduction of TC 6.5D.3.2 General spurious emissions for UL MIMO | Huawei, Hisilicon | imported from 3GU |
| R5‑187427 | Introduction of TC 6.5D.3.3 Spurious Emission for UE co-existence for UL MIMO | Huawei, Hisilicon | imported from 3GU |
| R5‑187428 | Introduction of TC 6.5D.3.4 Additional Spurious Emission for UL MIMO | Huawei, Hisilicon | imported from 3GU |
| R5‑187429 | Introduction of TC 6.5D.4 Transmit intermodulation for UL MIMO | Huawei, Hisilicon | imported from 3GU |
| R5‑187430 | Introduction of TC 7.3D Reference sensitivity for UL-MIMO | Huawei, Hisilicon | imported from 3GU |
| R5‑187431 | Introduction of TC 7.4D Maximum input level for UL-MIMO | Huawei, Hisilicon | imported from 3GU |
| R5‑187432 | Updation of 6.2C.1 Configured transmitted power for SUL | Huawei, Hisilicon | imported from 3GU |
| R5‑187433 | Introduction of TC 6.5C.1 Occupied bandwidth for SUL | Huawei, Hisilicon | imported from 3GU |
| R5‑187434 | Introduction of TC 6.5C.2.2 Spectrum Emission Mask for SUL | Huawei, Hisilicon | imported from 3GU |
| R5‑187435 | Introduction of TC 6.5C.2.3 Additional Spectrum Emission Mask for SUL | Huawei, Hisilicon | imported from 3GU |
| R5‑187436 | Introduction of TC 6.5C.2.4.1 NR ACLR for SUL | Huawei, Hisilicon | imported from 3GU |
| R5‑187437 | Introduction of TC 6.5C.2.4.2 UTRA ACLR for SUL | Huawei, Hisilicon | imported from 3GU |
| R5‑187438 | Introduction of TC 6.5C.3.2 General spurious emissions for SUL | Huawei, Hisilicon | imported from 3GU |
| R5‑187439 | Introduction of TC 6.5C.3.3 Spurious Emission for UE co-existence for SUL | Huawei, Hisilicon | imported from 3GU |
| R5‑187440 | Introduction of TC 6.5C.3.4 Additional Spurious Emission for SUL | Huawei, Hisilicon | imported from 3GU |
| R5‑187441 | Introduction of TC 6.5C.4 Transmit intermodulation for SUL | Huawei, Hisilicon | imported from 3GU |
| R5‑187442 | Updation of Uplink channel for SUL in Annex A | Huawei, Hisilicon | imported from 3GU |
| R5‑187443 | Update TC 7.4B.3 | Huawei, Hisilicon | imported from 3GU |
| R5‑187444 | Introduction of RRM TC 4.2.25 | Bureau Veritas | imported from 3GU |
| R5‑187445 | Introduction of RRM TC 4.2.26 | Bureau Veritas | imported from 3GU |
| R5‑187446 | Introduction of RRM TC 4.2.27 | Bureau Veritas | imported from 3GU |
| R5‑187447 | Addition of Rel-13 CA configurations | Ericsson | imported from 3GU |
| R5‑187448 | Addition of Rel-13 CA configurations | Ericsson | imported from 3GU |
| R5‑187449 | Addition of Rel-13 CA configurations | Ericsson | imported from 3GU |
| R5‑187450 | Inter-band con-current V2X configurations- Add 5A_47A Spurious Emission Test points analysis | Huawei, HiSilicon | imported from 3GU |
| R5‑187451 | Inter-band con-current V2X configurations- Add 8A_47A Spurious Emission Test points analysis | Huawei, HiSilicon | imported from 3GU |
| R5‑187452 | Inter-band con-current V2X configurations- Add 71A_47A Spurious Emission Test points analysis | Huawei, HiSilicon | imported from 3GU |
| R5‑187453 | Addition of default QoS configurations | Ericsson | imported from 3GU |
| R5‑187454 | On Quality of Quiet Zone Evaluation for Spurious Emissions Test Cases | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑187455 | Updating test case 6.3.4.2 Absolute Power Tolerance | Intel Corporation (UK) Ltd | imported from 3GU |
| R5‑187456 | Updating test case 6.3.4.4 Aggregate Power Tolerance | Intel Corporation (UK) Ltd | imported from 3GU |
| R5‑187457 | Adding TT to Aggregate Power Tolerance TC | Intel Corporation (UK) Ltd | imported from 3GU |
| R5‑187458 | MCPTT: Updates to common type definitions | MCC TF160 | imported from 3GU |
| R5‑187459 | Discussion on MU and TT for SA FR1 UL MIMO test cases | Huawei, Hisilicon | imported from 3GU |
| R5‑187460 | Discussion on effects on MOP test imposed by power sharing mechanism | Huawei, Hisilicon | imported from 3GU |
| R5‑187461 | Editorial Changes for TS 37.571-1 | PCTEST Engineering Lab | imported from 3GU |
| R5‑187462 | On RRM FR2 open points | ROHDE & SCHWARZ | imported from 3GU |
| R5‑187463 | Applicability for RRM NR tests | ROHDE & SCHWARZ | imported from 3GU |
| R5‑187464 | New ICS for RRM NR tests | ROHDE & SCHWARZ | imported from 3GU |
| R5‑187465 | Editorial Changes for TS 37.571-3 | PCTEST Engineering Lab | imported from 3GU |
| R5‑187466 | Clarification to RRM TCs with “No requirement applies” | Intel Corporation (UK) Ltd | imported from 3GU |
| R5‑187467 | New WID: Conformance test for Shortened TTI and processing time for LTE | huawei, hisilicon | imported from 3GU |
| R5‑187468 | Editorial Changes for TS 37.571-5 | PCTEST Engineering Lab | imported from 3GU |
| R5‑187469 | Discussion on LTE/NR power sharing in EN-DC for none anchor agnostic approach | Ericsson | imported from 3GU |
| R5‑187470 | Correction of TC 8.16.83, 8.16.84, 8.16.85 and 8.16.86 | Intel Corporation (UK) Ltd | imported from 3GU |
| R5‑187471 | Update IE CellGroupConfig | Ericsson | imported from 3GU |
| R5‑187472 | RRM Generic 3DL CA tests – Annex F | Intel Corporation (UK) Ltd | imported from 3GU |
| R5‑187473 | MU for UL 256QAM EVM test cases updated | Ericsson | imported from 3GU |
| R5‑187474 | 5GS S-NSSAI | Ericsson | imported from 3GU |
| R5‑187475 | Update of test applicability condition for TC8.2.1.4.2_A.4 | SGS Wireless | imported from 3GU |
| R5‑187476 | Introduction of FD-MIMO test case: FDD PMI Reporting with 12Tx Class A codebook – PUSCH 3-1 (Single PMI) for FD-MIMO | Ericsson | imported from 3GU |
| R5‑187477 | Introduction of FD-MIMO test cases in Annexes | Ericsson | imported from 3GU |
| R5‑187478 | Introduction of FD-MIMO test cases in 36.521-2 | Ericsson | imported from 3GU |
| R5‑187479 | Testing of fallback CA configurations in Rx CA test cases other than REFSENS | Ericsson | imported from 3GU |
| R5‑187480 | Discussion on improved measurement uncertainty for ON/OFF time mask test case | Ericsson | imported from 3GU |
| R5‑187481 | Updates to maximum output power test cases | Ericsson | imported from 3GU |
| R5‑187482 | Discussion on system critical requirements | Ericsson | imported from 3GU |
| R5‑187483 | Test Point analysis for FR2 Maximum Output Power | Ericsson | imported from 3GU |
| R5‑187484 | WP UE Conformance Test Aspects – Rel-14 LTE DL CA 4 Rx antenna ports | Ericsson | imported from 3GU |
| R5‑187485 | SR UE Conformance Test Aspects – Rel-14 LTE DL CA 4 Rx antenna ports | Ericsson | imported from 3GU |
| R5‑187486 | WP UE Conformance Test Aspects – Rel13 Full Dimension MIMO for LTE | Ericsson | imported from 3GU |
| R5‑187487 | SR UE Conformance Test Aspects – Rel13 Full Dimension MIMO for LTE | Ericsson | imported from 3GU |
| R5‑187488 | Updating test case 6.6.2.2 Additional spectrum emission mask and test case 6.6.3.3 Additional spurious emission | Intel Corporation (UK) Ltd | imported from 3GU |
| R5‑187489 | TP analysis for FR1 test case 6.3.4.3, relative power tolerance | Ericsson France | imported from 3GU |
| R5‑187490 | Update of 5GS NR RRC test case 8.2.3.6.1 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑187491 | Update of 5GS NR RRC test case 8.2.3.8.1 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑187492 | Correction to test case 8.2.2.1.1 | MediaTek Inc., TDIA, CATT | imported from 3GU |
| R5‑187493 | Updating test case 6.2.4A.2 Additional Maximum Power Reduction (A-MPR) for CA (inter-band DL CA and UL CA) | Intel Corporation (UK) Ltd | imported from 3GU |
| R5‑187494 | Update of test case 6.3.4.3, Power Control Relative power tolerance in 38.521-1 | Ericsson | imported from 3GU |
| R5‑187495 | Correction to Reference Sensitivity Level "Tested Bands / CA-Configurations Selection" | Intel Corporation (UK) Ltd | imported from 3GU |
| R5‑187496 | WP – UE Conformance Test Aspects – Interference Mitigation for Downlink Control Channels of LTE | Intel Corporation (UK) Ltd | imported from 3GU |
| R5‑187497 | Correction to test case 8.2.2.3.1 | MediaTek Inc., TDIA, CATT | imported from 3GU |
| R5‑187498 | SR- UE Conformance Test Aspects – Interference Mitigation for Downlink Control Channels of LTE | Intel Corporation (UK) Ltd | imported from 3GU |
| R5‑187499 | Adding applicability of test cases 8.2.2.1.1 and 8.2.2.3.1 | MediaTek Inc. | imported from 3GU |
| R5‑187500 | WP – UE Conformance Test Aspects - Wireless Local Area Network (WLAN) – 3GPP Radio Level Integration and Interworking | Intel Corporation (UK) Ltd | imported from 3GU |
| R5‑187501 | SR- UE Conformance Test Aspects - Wireless Local Area Network (WLAN) – 3GPP Radio Level Integration and Interworking Enhancements | Intel Corporation (UK) Ltd | imported from 3GU |
| R5‑187502 | SR UE Conformance Test Aspects - LTE bands with UE category M2 and/or NB2 in Rel-15 | Ericsson | imported from 3GU |
| R5‑187503 | WP UE Conformance Test Aspects - LTE bands with UE category M2 and/or NB2 in Rel-15 | Ericsson | imported from 3GU |
| R5‑187504 | SR UE Conformance Test Aspects - Uplink capacity enhancements for LTE (UL 256 QAM) | Ericsson | imported from 3GU |
| R5‑187505 | Correction to test case 7.1.2.12 | MediaTek Inc. | imported from 3GU |
| R5‑187506 | WP UE Conformance Test Aspects - Uplink capacity enhancements for LTE (UL 256 QAM) | Ericsson | imported from 3GU |
| R5‑187507 | Corrections to Test frequencies for CA contiguous Intra-band operation | Intel Corporation (UK) Ltd | imported from 3GU |
| R5‑187508 | Correction to Table 5.5.4.2-1 in 36.579-1 | NIST | imported from 3GU |
| R5‑187509 | Update of 5GS NR RRC test case 8.2.1.1.1 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑187510 | Correction to NR MAC test case 7.1.1.3.2 | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑187511 | Addition of NR MAC test case 7.1.1.3.2b | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑187512 | Adding test case 6.1.1.7 | MediaTek Inc. | imported from 3GU |
| R5‑187513 | Update IFF MU budget in TR 38.903 | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑187514 | Adding test case 6.1.1.8 | MediaTek Inc. | imported from 3GU |
| R5‑187515 | On Quality of Quiet Zone Evaluation for OBW Test Case | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑187516 | On Quality of Quiet Zone Evaluation for SEM Test Case | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑187517 | On Quality of Quiet Zone Evaluation for ACLR Test Case | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑187518 | Beam peak measurement uncertainties | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑187519 | Adding new test case applicability | MediaTek Inc. | imported from 3GU |
| R5‑187520 | Spherical coverage uncertainties | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑187521 | TRP uncertainties correction | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑187522 | On measurement grids | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑187523 | Correction to the conditions of test cases 8.3.7, 8.3.8 and 8.3.9 | CGC Inc. | imported from 3GU |
| R5‑187524 | Correction to SIP NOTIFY message in 36.579-1 | NIST | imported from 3GU |
| R5‑187525 | On conducted measurements uncertainties | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑187526 | Correction to SIP SUBSCRIBE message in 36.579-1 | NIST | imported from 3GU |
| R5‑187527 | Update to test configuration table in test case 6.6.2.3A.2_1 for UL 12A-66A | CGC Inc. | imported from 3GU |
| R5‑187528 | Update to RRC TC - PSCell addition, modification and release / Split DRB / EN-DC | Qualcomm Incorporated | imported from 3GU |
| R5‑187529 | Update of Generic Test 5.3.2 in 36.579-1 | NIST | imported from 3GU |
| R5‑187530 | Update to RRC TC - Measurement configuration control and reporting / Inter-RAT measurements / Event B1 / Measurement of NR cells / RSRQ based measurements / EN-DC | Qualcomm Incorporated | imported from 3GU |
| R5‑187531 | New Test Case in section 10.2 of TS 36.523-1 | NIST | imported from 3GU |
| R5‑187532 | Update of applicability for QCI 66 in 36.523-2 | NIST | imported from 3GU |
| R5‑187533 | Correction to Table 6.6.2-1 in 36.508 | NIST | imported from 3GU |
| R5‑187534 | Update to RRC TC - Measurement configuration control and reporting / Inter-RAT measurements / Periodic reporting / Measurement of NR cells / EN-DC | Qualcomm Incorporated | imported from 3GU |
| R5‑187535 | Update the parameters to test cases 7.6.1A.1, 7.6.1A.2, 7.6.1A.3 and 7.6.1A.4 | CGC Inc. | imported from 3GU |
| R5‑187536 | Update to RRC TC - Measurement configuration control and reporting / Event A1 / Measurement of NR PSCell / EN-DC | Qualcomm Incorporated | imported from 3GU |
| R5‑187537 | Update test case to cover band 46 for test cases 7.6.1A.7 and 7.6.1A.8 | CGC Inc. | imported from 3GU |
| R5‑187538 | Update to test cases 7.6.1A.5 | CGC Inc. | imported from 3GU |
| R5‑187539 | Update to 5G-NR RRC measurement report TCs for FR1/FR2 cell power level | Qualcomm Incorporated, Tech Mahindra | imported from 3GU |
| R5‑187540 | Update to 5G-NR RRC TCs for Multi-PDN support and specific message content IEs | Qualcomm Incorporated | imported from 3GU |
| R5‑187541 | Update test case to cover band 46 for test cases 7.5A.7 and 7.5A.8 | CGC Inc. | imported from 3GU |
| R5‑187542 | Correction to test case applicability for CAT-M1 UEs | ROHDE & SCHWARZ, Qualcomm Incorporated | imported from 3GU |
| R5‑187543 | Update of 5G-NR test cases applicability | Qualcomm Incorporated, Motorola Mobility, MCC TF160, Huawei, HiSilicon, Rohde & Schwarz | imported from 3GU |
| R5‑187544 | Correction to test case 8.2.4.27 for CAT-M1 UEs | ROHDE & SCHWARZ, Qualcomm Incorporated | imported from 3GU |
| R5‑187545 | Correction to test case 7.1.7.1.9 and 7.1.7.1.10 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑187546 | Addition of 5GS NR MAC test case 7.1.1.8.1 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑187547 | Addition of new 5G-NR Idle Mode TC 6.1.1.6 - PLMN selection / Periodic reselection / MinimumPeriodicSearchTimer | Qualcomm Incorporated | imported from 3GU |
| R5‑187548 | Addition of new 5G-NR Idle Mode TC 6.1.2.15 - Speed-dependent cell reselection | Qualcomm Incorporated | imported from 3GU |
| R5‑187549 | Update of 5G-NR SA test cases applicability | Qualcomm Incorporated | imported from 3GU |
| R5‑187550 | Correction to 8.3.1.x measurement TCs with Cat-M1 device. | ANRITSU LTD | imported from 3GU |
| R5‑187551 | FR2_UE_RSRPB_Function_38.509 | Qualcomm CDMA Technologies | imported from 3GU |
| R5‑187552 | Updates to TS 38.521-3 common sections 1-4 to align with core spec | Qualcomm Japan Inc | imported from 3GU |
| R5‑187553 | Update eLAA test case 7.1.4.31 | Qualcomm Incorporated | imported from 3GU |
| R5‑187554 | Removal of Multi-Layer eHRPD test cases 13.4.4.2 and 13.4.4.3 | Qualcomm Incorporated | imported from 3GU |
| R5‑187555 | Removal of eHRPD test cases applicability | Qualcomm Incorporated | imported from 3GU |
| R5‑187556 | Update of TC 5.1 in 36.579-2 | NIST | imported from 3GU |
| R5‑187557 | Addition of low and high test channel bandwidth in 38.508 | Qualcomm Japan Inc | imported from 3GU |
| R5‑187558 | Update of test case 6.2.1.4 applicability | Qualcomm Incorporated | imported from 3GU |
| R5‑187559 | Updates to TS 38.521-3 Section 5 to align with core spec | Qualcomm Japan Inc | imported from 3GU |
| R5‑187560 | Update to Table 5.3.5-1 in TS 38.521-1 | Qualcomm Japan Inc | imported from 3GU |
| R5‑187561 | Update to Table 5.3.5-1 in TS 38.521-2 | Qualcomm Japan Inc | imported from 3GU |
| R5‑187562 | Update to TC6.5B.3.2.1 - General Spurious Emissions for intra-band non-contiguous EN-DC | Qualcomm Japan Inc | imported from 3GU |
| R5‑187563 | Update to 7.3B.2.2 - REFSENS for Intra-band Non-Contiguous EN-DC | Qualcomm Japan Inc | imported from 3GU |
| R5‑187564 | Update to applicability condition of measurement reporting test cases for CAT-M1 UEs | Qualcomm Incorporated | imported from 3GU |
| R5‑187565 | Updates to TS 38.521-3 Section 4 with LTE anchor details | Qualcomm Japan Inc | imported from 3GU |
| R5‑187566 | Update note in section 4.1 to include CBW and SCS in RF test applicability | Qualcomm Japan Inc | imported from 3GU |
| R5‑187567 | Corrections to IMS WLAN test case G.17.2 | Qualcomm Incorporated | imported from 3GU |
| R5‑187568 | Discussion on FR2 Test Tolerance values | Qualcomm Inc, Verizon Wireless | imported from 3GU |
| R5‑187569 | Discussion on TS38.521-2 Annex K restructuring | Qualcomm Austria RFFE GmbH | imported from 3GU |
| R5‑187570 | new TC for PDSCH FR2 demod | Qualcomm Finland RFFE Oy | imported from 3GU |
| R5‑187571 | Update to Annex K | Qualcomm Austria RFFE GmbH | imported from 3GU |
| R5‑187572 | FR2 General Spurious Emission test case update | Qualcomm Austria RFFE GmbH | imported from 3GU |
| R5‑187573 | section 3 of 38.521-4 spec | Qualcomm Finland RFFE Oy | imported from 3GU |
| R5‑187574 | FR2 Reference Sensitivity test case update | Qualcomm Austria RFFE GmbH | imported from 3GU |
| R5‑187575 | Updates to Annex B to add Permitted OTA Test Methods | PCTEST Engineering Lab | imported from 3GU |
| R5‑187576 | Proposal on Test Tolerance in FR2 RF | NTT DOCOMO, INC. | imported from 3GU |
| R5‑187577 | Review on test point analysis in NR RF tests | NTT DOCOMO, INC. | imported from 3GU |
| R5‑187578 | TP for addition of NR RRM TC 4.4.1.1 EN-DC FR1 UE transmit timing accuracy | Qualcomm Japan Inc | imported from 3GU |
| R5‑187579 | Quality of quiet zone | ROHDE & SCHWARZ | imported from 3GU |
| R5‑187580 | Update of Global In-channel Tx Test Annex in 38.521-1 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑187581 | Update of Global In-channel Tx Test Annex in 38.521-2 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑187582 | Discussion on test point selection for EVM in FR2 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑187583 | Discussion on test point selection for Carrier Leakage in FR2 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑187584 | Update of test point selection for EVM equalizer spectrum flatness in FR1 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑187585 | Update of transmit signal quality test cases in 38.521-1 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑187586 | Update of transmit signal quality test cases in 38.521-2 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑187587 | Discussion on test point selection for In-band Emissions in FR2 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑187588 | Addition of In-band Emissions test case to TS 38.521-2 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑187589 | Discussion on test point selection for EVM equalizer spectrum flatness in FR2 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑187590 | Addition of EVM equalizer spectral flatness test cases 6.4.2.4 and 6.4.2.5 to TS 38.521-2 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑187591 | Discussion on Measurement Uncertainty in FR2 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑187592 | Addition of EVM equalizer spectral flatness test case 6.4.2.5 to TS 38.521-1 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑187593 | Discussion on test point selection for EVM equalizer spectrum flatness for Pi/2 BPSK in FR1 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑187594 | Update of Common Uplink Configuration for FR2 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑187595 | Update of MU budget and contributor description to TR 38.903 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑187596 | Discussion on Applicability and Test selection criteria for RRM CA test cases | Qualcomm Japan Inc | imported from 3GU |
| R5‑187597 | Addition of Test Case selection criteria for RRM CA | Qualcomm Japan Inc | imported from 3GU |
| R5‑187598 | Update on Applicability and Procedure for generic duplex mode RRM test case 8.16.86 | Qualcomm Japan Inc | imported from 3GU |
| R5‑187599 | Udpates to sections 1-4 in TS 38.521-3 to align with core spec | Qualcomm Japan Inc | imported from 3GU |
| R5‑187600 | section 4 of 38.521-4 spec | Qualcomm Finland RFFE Oy | imported from 3GU |
| R5‑187601 | Discussion summarizing several guidelines for TC definitions in TS38.521-3 | Qualcomm Japan Inc | imported from 3GU |
| R5‑187602 | pCR-FDD-PDSCH-FR1-Test 5.2.2.1 | Qualcomm CDMA Technologies | imported from 3GU |
| R5‑187603 | discussion on demod spec structure | Qualcomm Finland RFFE Oy | imported from 3GU |
| R5‑187604 | Updates to Clause 5 in TS 38.521-3 | Qualcomm Japan Inc | imported from 3GU |
| R5‑187605 | Update of FR2 MU values | Anritsu | imported from 3GU |
| R5‑187606 | new TC for PDSCH FR1 FDD demod | Qualcomm Finland RFFE Oy | imported from 3GU |
| R5‑187607 | Updates to clause 7.3B.3.4 in TS 38.521-3 | Qualcomm Japan Inc | imported from 3GU |
| R5‑187608 | pCR for PDCCH Demod in FR1 5.3.2.2 | Qualcomm CDMA Technologies | imported from 3GU |
| R5‑187609 | draft TS 38.521-4 v0.2.0 | Qualcomm Finland RFFE Oy | imported from 3GU |
| R5‑187610 | Corrections to IEs part of PDSCH-ServingCellConfig, ServingCellConfig and ServingCellConfigCommon | Qualcomm Korea | imported from 3GU |
| R5‑187611 | Correcton to MAC TBS test cases | Motorola Mobility, MCC TF160 | imported from 3GU |
| R5‑187612 | Addition of the message content of PDCP-config for UDC | CATT | imported from 3GU |
| R5‑187613 | LTE Anchor Link configuration for FR2 | Anritsu | imported from 3GU |
| R5‑187614 | Updates to EN-DC test case 6.2B.2.2, UE Maximum Output Power reduction for Intra-Band Non-Contiguous EN-DC | Ericsson | imported from 3GU |
| R5‑187615 | Introduction of TC 6.5D.3.1 General spurious emissions for UL MIMO | Huawei, Hisilicon | imported from 3GU |
| R5‑187616 | Introduction of TC 6.5D.3.2 Spurious Emission for UE co-existence for UL MIMO | Huawei, Hisilicon | imported from 3GU |
| R5‑187617 | Introduction of TC 6.5D.3.3 Additional Spurious Emission for UL MIMO | Huawei, Hisilicon | imported from 3GU |
| R5‑187618 | Updation of Uplink channel for SUL in Annex G | Huawei, Hisilicon | imported from 3GU |
| R5‑187619 | Update of Section 6.3.3.1 General | SGS wireless | imported from 3GU |
| R5‑187620 | LS on Study on evaluation for 2 RX exception in Rel-15 vehicle mounted UE for NR | 5GAA Working Group meeting | imported from 3GU |
| R5‑187621 | RAN5#80 WG Minutes | ETSI Secretariat | imported from 3GU |
| R5‑187622 | MCC TF160 Status Report | MCC TF160 | imported from 3GU |
| R5‑187623 | Discussion on LS on FGI bit 103 and 104 | Huawei, HiSilicon, CMCC, CATT | imported from 3GU |
| R5‑187624 | Proposed Word Template for RAN5 WI Work Plan | BlackBerry UK Limited | imported from 3GU |
| R5‑187625 | Uncover the Veil of 5G S-Module | CMCC, Sprint | imported from 3GU |
| R5‑187626 | Response LS to RAN4 on method to distinguish vehicle UE from handheld UE | GCF CAG | imported from 3GU |
| R5‑187627 | New WID on UE Conformance Test Aspects - Bluetooth/WLAN measurement collection in LTE Minimization of Drive Tests (MDT) | CMCC | imported from 3GU |
| R5‑187628 | New Work Item Proposal: UE Conformance Test Aspects – Enhanced LTE Support for Aerial Vehicles | NTT DOCOMO INC. | imported from 3GU |
| R5‑187629 | New WID proposal: UE Conformance Test Aspects – Enhancing LTE CA Utilization | Nokia, Nokia Shanghai Bell | imported from 3GU |
| R5‑187630 | New WID: Conformance test for Shortened TTI and processing time for LTE | Huawei, Hisilicon | imported from 3GU |
| R5‑187631 | Calculation of test frequencies for FDD NR bands with asymmetric channel bandwidths | Ericsson, Dish Network | imported from 3GU |
| R5‑187632 | UE Capability in EN-DC | Qualcomm Europe Inc.(Spain) | imported from 3GU |
| R5‑187633 | Meeting schedule for 2019-20 | WG Chairman | imported from 3GU |
| R5‑187634 | Correction to test case 7.1.2.12 | MediaTek Inc. | imported from 3GU |
| R5‑187635 | Update eLAA test case 7.1.4.31 | Qualcomm Incorporated | imported from 3GU |
| R5‑187636 | Correction to test cases 8.3.1.10, 8.3.1.11a, 8.3.1.15 and 8.3.1.16 for CAT-M1 UEs | ROHDE & SCHWARZ, Qualcomm Incorporated | imported from 3GU |
| R5‑187637 | Correction to test case 8.3.1.9 for CAT-M1 UEs | ROHDE & SCHWARZ, Qualcomm Incorporated | imported from 3GU |
| R5‑187638 | Update of test case 6.2.1.4 applicability | Qualcomm Incorporated | imported from 3GU |
| R5‑187639 | Update NB-IoT Rel-14 DCI format N0/N1 with HARQ process number | TDIA, MCC TF160, CATT | imported from 3GU |
| R5‑187640 | Clarification to inband testing for signalling test cases | ROHDE & SCHWARZ, MCC TF160 | imported from 3GU |
| R5‑187641 | Addition of specific RDS message contents for NB-IoT test case 22.5.19 | TDIA, CATT | imported from 3GU |
| R5‑187642 | Correction to NB-IoT test case 22.3.2.6 | TDIA, CATT | imported from 3GU |
| R5‑187643 | New feMTC IEs | Ericsson | imported from 3GU |
| R5‑187644 | New feMTC test case 21.2.2 | Ericsson | imported from 3GU |
| R5‑187645 | Updates to feMTC test case applicabilities | Ericsson | imported from 3GU |
| R5‑187646 | Addition of support for LWA/LWIP Test Cases in generic procedures | Intel Corporation (UK) Ltd | imported from 3GU |
| R5‑187647 | Correction of LWA Test Case 8.2.5.8 | Intel Corporation (UK) Ltd | imported from 3GU |
| R5‑187648 | Corrections to LWA TC 8.2.5.7 | Intel Corporation (UK) Ltd | imported from 3GU |
| R5‑187649 | Correction of LWA Test Case 8.2.5.4 and LWIP 8.2.5.5 | Intel Corporation (UK) Ltd | imported from 3GU |
| R5‑187650 | Corrections to LWA/LWIP Test Cases 8.2.5.1, 8.2.5.2, 8.2.5.6 | Intel Corporation (UK) Ltd | imported from 3GU |
| R5‑187652 | Updates to test loop modes for NB-IoT enhancement | MCC TF160, TDIA | imported from 3GU |
| R5‑187653 | Updates to test loop modes for NB-IoT enhancement | MCC TF160, TDIA | imported from 3GU |
| R5‑187654 | Correction to eNB-IoT test case 22.3.2.7 | MCC TF160, TDIA | imported from 3GU |
| R5‑187655 | Correction to V2X test case 24.1.13 | MCC TF160, Sporton, CATT | imported from 3GU |
| R5‑187656 | Updates to V2X test case 24.3.3 | MCC TF160 | imported from 3GU |
| R5‑187657 | Reply LS on TM9 FGI bits 103 and 104 | TSG WG RAN5 | imported from 3GU |
| R5‑187658 | Handling of SoR TC Between CT6 and RAN5 | Qualcomm Incorporated | imported from 3GU |
| R5‑187659 | Wordings for Uplink NAS messages | ROHDE & SCHWARZ, MCC TF160 | imported from 3GU |
| R5‑187660 | Default cell configurations for NAS | ROHDE & SCHWARZ, HiSilicon | imported from 3GU |
| R5‑187661 | Update IE SI-SchedulingInfo | Ericsson, Huawei, HiSilicon | imported from 3GU |
| R5‑187662 | Addition of Combinations of system information blocks in 4.4.3.1.2 | Huawei, HiSilicon | imported from 3GU |
| R5‑187663 | Update chapter 4.5.2 RRC_IDLE | Ericsson | imported from 3GU |
| R5‑187664 | Correction to various Radio resource control IEs | ANRITSU LTD | imported from 3GU |
| R5‑187665 | Correction to DCI formats 0_0 and 0_1 | Ericsson, MCC TF160, Huawei, HiSilicon, Keysight Technologies | imported from 3GU |
| R5‑187666 | Introduction of SDL and SUL cells in simulated cells in clause 4.4.2 | Ericsson | imported from 3GU |
| R5‑187667 | Correction to RRC_IDLE procedure | Ericsson | imported from 3GU |
| R5‑187668 | Update CSI related information elements | NTT DOCOMO INC. | imported from 3GU |
| R5‑187669 | Update ServingCellConfigCommon and TDD-UL-DL-Config | NTT DOCOMO INC. | imported from 3GU |
| R5‑187670 | Update SRS-Config | NTT DOCOMO INC. | imported from 3GU |
| R5‑187671 | Update some information elements for measurements | NTT DOCOMO INC. | imported from 3GU |
| R5‑187672 | Update CellGroupConfig and related information elements | NTT DOCOMO INC., Huawei, Anritsu Ltd. | imported from 3GU |
| R5‑187673 | CR of NR 508-1 clause 4.6.2_SIB2, SIB4 | Huawei, Hisilicon, Ericssion, TF160 | imported from 3GU |
| R5‑187674 | CR of NR 508-1 Table 4.4.2-2_Default NR Cells parameters | Huawei, Hisilicon, Ericsson, TF160 | imported from 3GU |
| R5‑187675 | Update RLC-Config | NTT DOCOMO INC. | imported from 3GU |
| R5‑187676 | Specifying Test procedure to check that UE is camped on a new NR cell belonging to a new TA | Samsung | imported from 3GU |
| R5‑187677 | Updates to Authentication 5GMM messages | Ericsson | imported from 3GU |
| R5‑187678 | Updates to PDU session release 5GSM messages | Ericsson | imported from 3GU |
| R5‑187679 | Updates to Security mode 5GMM messages | Ericsson | imported from 3GU |
| R5‑187680 | Addition of new Information Elements in section 4.6.3 | Ericsson | imported from 3GU |
| R5‑187681 | Updates to SIG OTA Calibration for FR2 | Qualcomm Europe Inc.(Spain) | imported from 3GU |
| R5‑187682 | Addition of default QoS configurations | Ericsson | imported from 3GU |
| R5‑187683 | Corrections to C.32 and C.32a | ROHDE & SCHWARZ, Qualcomm Incorporated | imported from 3GU |
| R5‑187684 | Addition of Test Loop for SDAP testing | Ericsson, Motorola Mobility, Samsung | imported from 3GU |
| R5‑187685 | LS on the testability of FR2 transmitter and reception tests | TSG WG RAN5 | imported from 3GU |
| R5‑187686 | Adding test case 6.1.1.7 | MediaTek Inc. | imported from 3GU |
| R5‑187687 | Split of 5G Steering of Roaming test coverage between RAN5 and CT6 | TSG WG RAN5 | imported from 3GU |
| R5‑187688 | Addition of NR test case 7.1.1.1.3_SI Request | Huawei, Hisilicon | imported from 3GU |
| R5‑187689 | Addition of NR test case 7.1.1.1.6_Random access | Huawei, Hisilicon | imported from 3GU |
| R5‑187690 | Addition of NR test case 7.1.1.2.3_CCCH HARQ | Huawei, Hisilicon | imported from 3GU |
| R5‑187691 | CR of NR test case 7.1.2.3.9_RLC Reassembling | Huawei, Hisilicon | imported from 3GU |
| R5‑187692 | Correction to PDCP Test case 7.1.3.5.4 PDCP reordering / Maximum re-ordering delay below t-Reordering / t-Reordering timer operations | Qualcomm Europe Inc.(Spain) | imported from 3GU |
| R5‑187693 | Correcton to SDAP test cases | Motorola Mobility | imported from 3GU |
| R5‑187694 | Updating UE registration procedure to handle UE capability in 2 steps | Qualcomm | imported from 3GU |
| R5‑187695 | Addition of 5GS SA RRC TC 8.1.1.1.1 | Qualcomm Korea (TTA) | imported from 3GU |
| R5‑187696 | Addition of 5GS SA RRC TC 8.1.5.2.1 | Qualcomm Korea (TTA) | imported from 3GU |
| R5‑187697 | Update RRC TC 8.2.1.1.1 - UE capability transfer / Success / EN-DC | Qualcomm Korea (TTA) | imported from 3GU |
| R5‑187698 | Correction to NR RRC test case 8.2.3.5.1 | ANRITSU LTD | imported from 3GU |
| R5‑187699 | Correction to NR RRC test case 8.2.3.9.1 and 8.2.3.10.1 | ANRITSU LTD | imported from 3GU |
| R5‑187700 | Update RRC TC 8.2.3.1.1 - Measurement configuration control and reporting / Inter-RAT measurements / Event B1 / Measurement of NR cells / EN-DC | Qualcomm Korea (TTA) | imported from 3GU |
| R5‑187701 | Update RRC TC 8.2.3.12.1 | Intertek | imported from 3GU |
| R5‑187702 | Update of 5GS NR RRC test case 8.2.3.6.1 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑187703 | Update of 5GS NR RRC test case 8.2.3.8.1 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑187704 | Update to RRC TC - Measurement configuration control and reporting / Event A1 / Measurement of NR PSCell / EN-DC | Qualcomm Incorporated | imported from 3GU |
| R5‑187705 | Update to 5G-NR RRC measurement report TCs for FR1/FR2 cell power level | Qualcomm Incorporated, Tech Mahindra, Intertek, Anritsu, Rohde & Schwarz | imported from 3GU |
| R5‑187706 | Updates to EN-DC TC 8.2.5.3.1 | MCC TF160, Qualcomm | imported from 3GU |
| R5‑187707 | Corrections to NAS test case 9.1.5.1.14 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑187708 | New NAS test case 9.1.3.1 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑187709 | Corrections to clause 5.5.9 of 36.579-1 | NIST, Samsung | imported from 3GU |
| R5‑187710 | Corrections to clause 5.5.7.1 of 36.579-1 | NIST, Samsung | imported from 3GU |
| R5‑187711 | Update for Resource-lists in 36.579-1 | NIST, Samsung | imported from 3GU |
| R5‑187712 | Correction to Table 5.5.1-1 in 36.579-1 | NIST, Samsung | imported from 3GU |
| R5‑187713 | Correction to Table 5.5.4.10.1-1 in 36.579-1 | NIST, Samsung | imported from 3GU |
| R5‑187714 | Correction to Table 5.5.4.2-1 in 36.579-1 | NIST, Samsung | imported from 3GU |
| R5‑187715 | Correction to SIP NOTIFY message in 36.579-1 | NIST, Samsung | imported from 3GU |
| R5‑187716 | Correction to SIP SUBSCRIBE message in 36.579-1 | NIST, Samsung | imported from 3GU |
| R5‑187717 | Update of Generic Test 5.3.2 in 36.579-1 | NIST, Samsung | imported from 3GU |
| R5‑187718 | Update of TC 5.1 in 36.579-2 | NIST, Samsung | imported from 3GU |
| R5‑187719 | Correction to Table 6.6.2-1 in 36.508 | NIST, Samsung | imported from 3GU |
| R5‑187720 | Uplink PTRS disable for RF testing | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑187721 | Handling of power on / power off cycles and UE Automation in RRM and SIG testing for FR2 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑187722 | Addition to E-UTRA test frequencies for intra-band contiguous configuration for band 41 | Ericsson | imported from 3GU |
| R5‑187723 | Correction of test frequencies for NR band n257 | Ericsson | imported from 3GU |
| R5‑187724 | New annex for NR test frequency calculations | MCC TF160, Ericsson | imported from 3GU |
| R5‑187725 | Correction of test frequencies for NR band n71 | Ericsson | imported from 3GU |
| R5‑187726 | Positioning NSA Protocol tests - LPP Procedures | ROHDE & SCHWARZ | imported from 3GU |
| R5‑187727 | Applicability for NR NSA Option 3 protocol tests | ROHDE & SCHWARZ | imported from 3GU |
| R5‑187728 | 5GC testcase optimisation | CATT | imported from 3GU |
| R5‑187729 | Addition of ReportConfigInterRAT for NR | Intertek | imported from 3GU |
| R5‑187730 | Updating UE registration procedure to handle UE capability in 2 steps | Qualcomm | imported from 3GU |
| R5‑187731 | Removal of Testcase 7.1.4.36 | CATT | imported from 3GU |
| R5‑187732 | Removal of the test applicability for testcase 7.1.4.36 | CATT | imported from 3GU |
| R5‑187733 | Correction on V2X testcase 24.3.2 | CATT, TF160 | imported from 3GU |
| R5‑187734 | Correction to V2X test case 24.1.13 | MCC TF160, Sporton, CATT | imported from 3GU |
| R5‑187735 | Addition of new LTE_UDC-UEConTest test case 7.3.10.1 | CATT | imported from 3GU |
| R5‑187736 | Addition of new LTE_UDC-UEConTest test case 7.3.10.2 | CATT | imported from 3GU |
| R5‑187737 | Addition of new LTE_UDC-UEConTest test case 7.3.10.3 | CATT | imported from 3GU |
| R5‑187738 | Addition of new LTE_UDC-UEConTest test case 8.5.1.9 | CATT | imported from 3GU |
| R5‑187739 | Addition of SRB4 configuration to RRC connection | Huawei, HiSilicon | imported from 3GU |
| R5‑187740 | Addition of Condition QMC for LTE QMC test | Huawei, HiSilicon | imported from 3GU |
| R5‑187741 | Introduction of RRC TC QoE Measurement Collection in 8.3.5.1 | Huawei, HiSilicon | imported from 3GU |
| R5‑187742 | Introduction of RRC TC Qoemtsi Measurement Collection in 8.3.5.2 | Huawei, HiSilicon | imported from 3GU |
| R5‑187743 | Addition of applicability statements for LTE QMC test cases | China Unicom | imported from 3GU |
| R5‑187744 | Addition of NR test case 9.1.5.1.1_Registration Request | Huawei, Hisilicon, CAICT, CATT, Samsung, TF160, R&S, Motorola, Ericsson, Qualcomm | imported from 3GU |
| R5‑187745 | Update SIB1 | Ericsson, Huawei, HiSilicon | imported from 3GU |
| R5‑187746 | Revised WID on UE Conformance Test Aspects- Voice and Video Enhancement for LTE | CATT | imported from 3GU |
| R5‑187747 | Correction to Signal levels for conducted testing | ANRITSU LTD | imported from 3GU |
| R5‑187748 | Updates to E-UTRA RRC_CONNECTED generic procedure | MCC TF160, Ericsson, Qualcomm | imported from 3GU |
| R5‑187749 | Correcton to Layer 2 Pre Test conditions | Motorola Mobility | imported from 3GU |
| R5‑187750 | Add RRCResumeComplete | Ericsson | imported from 3GU |
| R5‑187751 | Update chapter 4.5.3 RRC_INACTIVE | Ericsson | imported from 3GU |
| R5‑187752 | Correction of test frequencies for signalling testing in clause 6 | Ericsson | imported from 3GU |
| R5‑187753 | Specifying Test procedure to check that UE is in RRC_IDLE state on a certain NR cell | Samsung | imported from 3GU |
| R5‑187754 | Update IE RLF-TimersAndConstants | Ericsson | imported from 3GU |
| R5‑187755 | Add RRCSetup | Ericsson | imported from 3GU |
| R5‑187756 | Update RRCReconfiguration | Ericsson | imported from 3GU |
| R5‑187757 | Update IE RadioBearerConfig | Ericsson | imported from 3GU |
| R5‑187758 | Updates to PDU session establishment 5GSM messages | Ericsson | imported from 3GU |
| R5‑187759 | Updates to Registration 5GMM messages | Ericsson, Rohde & Schwarz | imported from 3GU |
| R5‑187760 | Updates to Security protected 5GS NAS and 5GMM status messages | Ericsson | imported from 3GU |
| R5‑187761 | Updates to Service Request 5GMM messages | Ericsson | imported from 3GU |
| R5‑187762 | Addition and updates to Information Elements in section 4.6.4 | Ericsson | imported from 3GU |
| R5‑187763 | Addition of 5GS related new EFs to Test UICC definition | ROHDE & SCHWARZ | imported from 3GU |
| R5‑187764 | Update IE CellGroupConfig | Ericsson | imported from 3GU |
| R5‑187765 | New Test Case in section 10.2 of TS 36.523-1 | NIST, FirstNet | imported from 3GU |
| R5‑187766 | Update of applicability for QCI 66 in 36.523-2 | NIST, FirstNet | imported from 3GU |
| R5‑187767 | LS concerning RAN5 Response to ITU-R Working Party 5D Reply Liaison Statement to 3GPP RAN4/RAN5 on definition of test methods for OTA unwanted emissions of IMT radio equipment | TSG WG RAN5 | imported from 3GU |
| R5‑187768 | Update of Test case 8.5.4.1 with UE DL and UL Cat 22,23,24,25,26 capability check | Intel Corporation (UK) Ltd | imported from 3GU |
| R5‑187769 | Correction to test case 8.2.4.7 for CAT-M1 UEs | ROHDE & SCHWARZ, Qualcomm Incorporated | imported from 3GU |
| R5‑187770 | Correction to test case 8.2.4.8 for CAT-M1 UEs | ROHDE & SCHWARZ, Qualcomm Incorporated | imported from 3GU |
| R5‑187771 | Correction to 8.3.1.x measurement TCs with Cat-M1 device. | ANRITSU LTD | imported from 3GU |
| R5‑187772 | Correction to SRVCC test cases for IMS Reregistration over UTRAN | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑187773 | Correction to NB-IoT test case 22.4.22 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑187774 | Addition of DL and UL Category 22,23,24,25,26 to Table A.4.3.2-2 and A.4.3.2-3 | Intel Corporation (UK) Ltd | imported from 3GU |
| R5‑187775 | Discussion paper on Session Timer coverage | ROHDE & SCHWARZ, Intel | imported from 3GU |
| R5‑187776 | Removal of the test applicability for testcase 7.1.4.36 | CATT | imported from 3GU |
| R5‑187777 | Addition of PICS | Motorola Mobility, CMCC | imported from 3GU |
| R5‑187778 | Adding test case 6.1.1.8 | MediaTek Inc. | imported from 3GU |
| R5‑187779 | Addition of NR test case 7.1.1.1.4_Beam Failure | Huawei, Hisilicon | imported from 3GU |
| R5‑187780 | Addition of NR test case 7.1.1.1.5 SUL | Huawei, Hisilicon | imported from 3GU |
| R5‑187781 | Correction to NR MAC test case 7.1.1.3.2 | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑187782 | Addition of 5GS NR MAC test case 7.1.1.8.1 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑187783 | Correcton to Layer 2 Pre Test conditions | Motorola Mobility | imported from 3GU |
| R5‑187784 | Correction to the default Pre-Test Conditions for AM and UM RLC test cases | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑187785 | Correction to PDCP Ciphering test cases | Motorola Mobility, MCC TF160 | imported from 3GU |
| R5‑187786 | Correcton to PDCP Integrity test cases | Motorola Mobility and MCC TF160 | imported from 3GU |
| R5‑187787 | Addition of NR test case 8.1.1.2.3_T300 expiry | Huawei, Hisilicon | imported from 3GU |
| R5‑187788 | Addition of NR test case 8.1.1.3.1_Redirection to NR | Huawei, Hisilicon | imported from 3GU |
| R5‑187789 | Addition of 5GS SA RRC TC 8.1.1.2.5 | Qualcomm Korea (TTA) | imported from 3GU |
| R5‑187790 | Addition of 5GS NR RRC test case 8.1.1.3.2 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑187791 | Update of 5GS NR RRC test case 8.2.1.1.1 | ROHDE & SCHWARZ, Qualcomm | imported from 3GU |
| R5‑187792 | Addition of NR test case 8.2.3.11.1_gapFR1 | Huawei, Hisilicon | imported from 3GU |
| R5‑187793 | Addition of NR test case 8.2.3.11.2_gapFR2 | Huawei, Hisilicon | imported from 3GU |
| R5‑187794 | Addition of NR test case 8.1.5.3.1_PWS notification | Huawei, Hisilicon | imported from 3GU |
| R5‑187795 | Update RRC SCG failure TC 8.2.5.1.1 | Qualcomm Korea (TTA) | imported from 3GU |
| R5‑187796 | Update to 5G TC TA registration update | Samsung | imported from 3GU |
| R5‑187797 | Addition of new 5GC TC 9.1.6.1.1 | CATT, TDIA | imported from 3GU |
| R5‑187798 | Addition of 5GC test case 10.1.3.1 | CATT, TDIA, CAICT | imported from 3GU |
| R5‑187799 | Adding applicability for 5G TC TA registration update | Samsung | imported from 3GU |
| R5‑187800 | Response LS to RAN4 on method to distinguish vehicle UE from handheld UE | TSG WG RAN5 | imported from 3GU |
| R5‑187801 | Uplink PTRS disable for RF testing | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑187802 | Updating power levels for LTE Anchor Link | Anritsu | imported from 3GU |
| R5‑187803 | FR2 UE RSRPB Function 38.509 | Qualcomm CDMA Technologies | imported from 3GU |
| R5‑187804 | Editorial_Cleaning up for description of test requirement in clause 6 | NTT DOCOMO, INC. | imported from 3GU |
| R5‑187805 | Introduction of TC 7.7D Spurious response for UL-MIMO | CMCC, Huawei | imported from 3GU |
| R5‑187806 | Test Point analysis for FR1 7.4 Maximum input level | CAICT, Huawei | imported from 3GU |
| R5‑187807 | Introduction of receiver spurious emission tests for FR1 SA | Anritsu | imported from 3GU |
| R5‑187808 | TP analysis for receiver spurious emission tests for FR1 SA | Anritsu | imported from 3GU |
| R5‑187809 | TP analysis for wideband intermodulation tests for FR1 SA | Anritsu | imported from 3GU |
| R5‑187810 | Introduction of wideband intermodulation tests for FR1 SA | Anritsu | imported from 3GU |
| R5‑187811 | Introduction of TC 7.3D Reference sensitivity for UL-MIMO | Huawei, Hisilicon | imported from 3GU |
| R5‑187812 | Update of operating bands and channel arrangement to TS 38.521-1 | China Unicom | imported from 3GU |
| R5‑187813 | NR FR1 TT Way Forward update | Telecom Italia, Orange, AT&T, CMCC | imported from 3GU |
| R5‑187814 | Discussion of MU for occupied BW for FR1 | Anritsu | imported from 3GU |
| R5‑187815 | Discussion summarizing several guidelines for TC definitions in TS38.521-3 | Qualcomm Japan Inc | imported from 3GU |
| R5‑187816 | Adding test case 6.2B.2.4, UE Maximum Output Power reduction for Inter-Band EN-DC including FR2 | Ericsson | imported from 3GU |
| R5‑187817 | TP analysis for receiver spurious emission tests for FR1 inter-band EN-DC | Anritsu | imported from 3GU |
| R5‑187818 | TP analysis for wideband intermodulation tests for FR1 inter-band EN-DC | Anritsu | imported from 3GU |
| R5‑187819 | Update general parameter Connection without release in initial conditions in TS 38.521-3 | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑187820 | Updates to test case 6.5B.2.1.3, Adjacent channel leakage ratio for intra-band contiguous EN-DC | Ericsson | imported from 3GU |
| R5‑187821 | Addition OBW intraband non contiguous EN-DC | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑187822 | Introduction of New test case 6.4B.2.2.1 Error Vector Magnitude for intra-band non-contiguous EN-DC | KTL | imported from 3GU |
| R5‑187823 | Introduction of New test case 6.4B.2.2.2 Carrier Leakage for intra-band non-contiguous EN-DC | KTL | imported from 3GU |
| R5‑187824 | pCR for new TC addition for FR1 FDD PDSCH Demod | Qualcomm CDMA Technologies | imported from 3GU |
| R5‑187825 | Introduction of New test case 6.4B.2.3.1 Error Vector Magnitude for inter-band EN-DC within FR1 | KTL | imported from 3GU |
| R5‑187826 | Introduction of New test case 6.4B.2.3.2 Carrier Leakage for inter-band EN-DC within FR1 | KTL, MTCC | imported from 3GU |
| R5‑187827 | Introduction of New test case 6.4B.2.3.3 In-band Emissions for inter-band EN-DC within FR1 | KTL, MTCC | imported from 3GU |
| R5‑187828 | Introduction of Error Vector Magnitude for intra-band contiguous EN-DC | LG Electronics | imported from 3GU |
| R5‑187829 | Introduction of Carrier Leakage for intra-band contiguous EN-DC | LG Electronics | imported from 3GU |
| R5‑187830 | pCR for new TC addition for FR1 FDD PDCCH Demod | Qualcomm CDMA Technologies | imported from 3GU |
| R5‑187831 | FR2 General Spurious Emission test case update | Qualcomm Austria RFFE GmbH | imported from 3GU |
| R5‑187832 | FR2 Reference Sensitivity test case update | Qualcomm Austria RFFE GmbH | imported from 3GU |
| R5‑187833 | Updates to clause 7.3B.3.4 in TS 38.521-3 | Qualcomm Japan Inc | imported from 3GU |
| R5‑187834 | Udpates to sections 1-4 in TS 38.521-3 to align with core spec | Qualcomm Japan Inc | imported from 3GU |
| R5‑187835 | Updates to Clause 5 in TS 38.521-3 | Qualcomm Japan Inc | imported from 3GU |
| R5‑187836 | Test Point analysis for FR2 7.4 Maximum input level | CAICT, Huawei | imported from 3GU |
| R5‑187837 | Updates to maximum output power test cases | Ericsson | imported from 3GU |
| R5‑187838 | Update of transmit signal quality test cases in 38.521-2 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑187839 | Addition of In-band Emissions test case to TS 38.521-2 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑187840 | Addition of EVM equalizer spectral flatness test cases 6.4.2.4 and 6.4.2.5 to TS 38.521-2 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑187841 | Update of Common Uplink Configuration for FR2 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑187842 | General sections updated to 38.521-2 | CAICT, Huawei | imported from 3GU |
| R5‑187843 | Update of Global In-channel Tx Test Annex in 38.521-2 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑187844 | pCR for PDCCH Demod in FR1 5.3.2.2 | Qualcomm CDMA Technologies | imported from 3GU |
| R5‑187845 | section 4 of 38.521-4 spec | Qualcomm Finland RFFE Oy | imported from 3GU |
| R5‑187846 | pCR-FDD-PDSCH-FR1-Test 5.2.2.1 | Qualcomm CDMA Technologies | imported from 3GU |
| R5‑187847 | Resubmission of R5-186252 with modifications | ROHDE & SCHWARZ | imported from 3GU |
| R5‑187848 | FR2 Spurious Emission measurement grids and offset values | Qualcomm Inc, Anritsu. | imported from 3GU |
| R5‑187849 | Adding applicability for new 38.521-1 CA TCs | Samsung | imported from 3GU |
| R5‑187850 | Completion of TC 9.1.69 and 9.1.70 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑187851 | Completion of TC 9.2.56 and 9.2.57 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑187852 | Discussion on Applicability and Test selection criteria for RRM CA test cases | Qualcomm Japan Inc | imported from 3GU |
| R5‑187853 | Addition of Test Case selection criteria for RRM CA | Qualcomm Japan Inc | imported from 3GU |
| R5‑187854 | Update on Applicability and Procedure for generic duplex mode RRM test case 8.16.86 | Qualcomm Japan Inc | imported from 3GU |
| R5‑187855 | Chapter 9 RRM Generic CA tests - Annexes | ROHDE & SCHWARZ | imported from 3GU |
| R5‑187856 | Correction to 3DL CA clause 8 generic duplex mode tests | Anritsu | imported from 3GU |
| R5‑187857 | Introduction of 4 DL CA Activation and Deactivation of Known SCell in Non-DRX with generic duplex modes | LG Electronics | imported from 3GU |
| R5‑187858 | Introduction of 4 DL CA Activation and Deactivation of Unknown SCell in Non-DRX with generic duplex modes | LG Electronics | imported from 3GU |
| R5‑187859 | Introduction of 5 DL CA Activation and Deactivation of Known SCell in Non-DRX with generic duplex modes | LG Electronics | imported from 3GU |
| R5‑187860 | Introduction of 5 DL CA Activation and Deactivation of Unknown SCell in Non-DRX with generic duplex modes | LG Electronics | imported from 3GU |
| R5‑187861 | Update of V2X RF Receiver Test Cases for Intra-band contiguous | SGS Wireless | imported from 3GU |
| R5‑187862 | Editorial: 6.2.2EC, UE Maximum Output Power for UE category M2 | Ericsson | imported from 3GU |
| R5‑187863 | Updated RRM clause 4 tests to cover Cat-M2 requirement | Bureau Veritas | imported from 3GU |
| R5‑187864 | Testing of fallback CA configurations in Rx CA test cases other than REFSENS | Ericsson, CETECOM | imported from 3GU |
| R5‑187865 | TP analyses for new Rel-15 CA configurations | CETECOM GmbH | imported from 3GU |
| R5‑187866 | Update TC 6.6.3G.2_1 | Huawei, HiSilicon | imported from 3GU |
| R5‑187867 | Inter-band con-current V2X configurations- Add 3A_47A Spurious Emission Test points analysis | Huawei, HiSilicon | imported from 3GU |
| R5‑187868 | Inter-band con-current V2X configurations- Add 5A_47A Spurious Emission Test points analysis | Huawei, HiSilicon | imported from 3GU |
| R5‑187869 | Add band group FDD B1 and B2 to RSRQ tests - Rel11 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑187870 | Add band group FDD B1 and B2 to RSRQ tests - Rel12 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑187871 | Update test case to cover band 46 for test cases 7.6.1A.7 and 7.6.1A.8 | CGC Inc. | imported from 3GU |
| R5‑187872 | Update to test cases 7.6.1A.5 | CGC Inc. | imported from 3GU |
| R5‑187873 | Introduction of tc 6.2.3EC, Maximum Power Reduction (MPR) for UE category M2 | Ericsson | imported from 3GU |
| R5‑187874 | Introduction of tc 6.2.5EC Configured UE transmitted Power for UE category M2 | Ericsson | imported from 3GU |
| R5‑187875 | Introduction of tc 6.3.2EC, Minimum Output Power for UE category M2 | Ericsson | imported from 3GU |
| R5‑187876 | Introduction of tc 6.3.3EC, UE Transmit OFF power for UE category M2 | Ericsson | imported from 3GU |
| R5‑187877 | Introduction of 6.3.4EC.1, General ON/OFF time mask for UE category M2 | Ericsson | imported from 3GU |
| R5‑187878 | Introduction of 6.3.5EC.1, Power Control Absolute power tolerance for UE category M2 | Ericsson | imported from 3GU |
| R5‑187879 | Introduction of 6.3.5EC.2, Power Control Relative power tolerance for UE category M2 | Ericsson | imported from 3GU |
| R5‑187880 | Introduction of 6.3.5EC.3, Aggregate power control tolerance for UE category M2 | Ericsson | imported from 3GU |
| R5‑187881 | Update Clause 1 Scope of TS 38.522 | CMCC | imported from 3GU |
| R5‑187882 | Update Clause 3 of TS 38.522 | CMCC | imported from 3GU |
| R5‑187883 | TP for Clause 4.1.1 of TS 38.522 | CMCC | imported from 3GU |
| R5‑187884 | TP for Clause 4.1.2 of TS 38.522 | CMCC | imported from 3GU |
| R5‑187885 | TP for Clause 4.1.3 of TS 38.522 | CMCC | imported from 3GU |
| R5‑187886 | FR2 Spurious Emission test case updates | Qualcomm Finland RFFE Oy | imported from 3GU |
| R5‑187887 | Addition of test frequencies for SUL band n81 | Huawei, HiSilicon | imported from 3GU |
| R5‑187888 | Update of 6.2.4 Configured Output Power | Huawei, HiSilicon | imported from 3GU |
| R5‑187889 | Addition of SUL condition | Huawei, Hisilicon | imported from 3GU |
| R5‑187890 | Introduction of TC 6.5C.4 Transmit intermodulation for SUL | Huawei, Hisilicon | imported from 3GU |
| R5‑187891 | FR2 UE RSRPB Function 38.509 | Qualcomm CDMA Technologies | imported from 3GU |
| R5‑187892 | Removing the Editor's notes of SA messages and procedures for all FR1 test cases | Huawei, HiSilicon | imported from 3GU |
| R5‑187893 | Update of FR1 6.2.2 MPR | CAICT, Huawei, CMCC | imported from 3GU |
| R5‑187894 | Addition of Time alignment error for UL-MIMO to TS38.521-1 | China Unicom | imported from 3GU |
| R5‑187895 | Introduction of New FR1 test case 6.3.3.6 SRS time mask | MTCC, KTL | imported from 3GU |
| R5‑187896 | 5G_FR1 Text update for 6.5.3.3 Additonal Spurious emission | Qualcomm Incorporated | imported from 3GU |
| R5‑187897 | Update of test case 6.3.4.3, Power Control Relative power tolerance in 38.521-1 | Ericsson | imported from 3GU |
| R5‑187898 | Addition of EVM equalizer spectral flatness test case 6.4.2.5 to TS 38.521-1 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑187899 | Introduction of test case for Frequency error for CA | Samsung,CMCC | imported from 3GU |
| R5‑187900 | Introduction of test cases for Transmit modulation quality for CA | Samsung,CMCC | imported from 3GU |
| R5‑187901 | Introduction of test case for Spectrum emission mask for Inter-band CA | Samsung,CMCC | imported from 3GU |
| R5‑187902 | Introduction of test case for NR ACLR for Inter-band CA | Samsung,CMCC | imported from 3GU |
| R5‑187903 | Introduction of test case for UTRA ACLR for Inter-band CA | Samsung,CMCC | imported from 3GU |
| R5‑187904 | Introduction of test case for General spurious emissions for Inter-band CA | Samsung,CMCC | imported from 3GU |
| R5‑187905 | Introduction of test case for Spurious emission for UE co-existence for CA | Samsung,CMCC | imported from 3GU |
| R5‑187906 | Introduction of test case for Transmit intermodulation for Inter-band CA | Samsung,CMCC | imported from 3GU |
| R5‑187907 | Test Point analysis for FR1 MPR test case | CAICT, Huawei | imported from 3GU |
| R5‑187908 | Updates of MU in TS 38.521-1 Annex F during RAN5#81 | NTT DOCOMO, INC. | imported from 3GU |
| R5‑187909 | Updates of TT in TS 38.521-1 Annex F during RAN5#81 | NTT DOCOMO, INC. | imported from 3GU |
| R5‑187910 | Clarification of test channel BW and SCS selection | NTT DOCOMO, INC. | imported from 3GU |
| R5‑187911 | Addition of notes to clarify test point selection into general section of TS 38.521-1 | NTT DOCOMO, INC. | imported from 3GU |
| R5‑187912 | Addition of notes to clarify test point selection into general section of TS 38.521-2 | NTT DOCOMO, INC. | imported from 3GU |
| R5‑187913 | Addition of notes to clarify test point selection into general section of TS 38.521-3 | NTT DOCOMO, INC. | imported from 3GU |
| R5‑187914 | Update of Global In-channel Tx Test Annex in 38.521-1 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑187915 | Introduction of FR1 7.4 Maximum input level | CAICT, Huawei | imported from 3GU |
| R5‑187916 | Editorial correction to 6.5.1A.2 Frequency error for CA | Anritsu, Dekra | imported from 3GU |
| R5‑187917 | Correction to 6.2.4A.2_1 and 6.6.2.2A.2_1 | Anritsu, CETECOM, DEKRA | imported from 3GU |
| R5‑187918 | Correction to the test configuration table of 7.3A.6 | Anritsu | imported from 3GU |
| R5‑187919 | Correction to frequency of CA_4A-7A for MSD with inter-band 2UL | Anritsu | imported from 3GU |
| R5‑187920 | Discussion on LTE/NR power sharing in EN-DC for none anchor agnostic approach | Ericsson | imported from 3GU |
| R5‑187921 | On measurement grids | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑187922 | Removing FR2 test case 7.4 from TS 38.522 due to testability issue | Huawei, HiSilicon, CAICT | imported from 3GU |
| R5‑187923 | Definition of additional cells for IncMon RRM Test Cases | Ericsson | imported from 3GU |
| R5‑187924 | Message content for IncMon RRM Test Cases | Ericsson | imported from 3GU |
| R5‑187925 | Applicability for IncMon RRM Test Cases | Ericsson, CGC Inc. | imported from 3GU |
| R5‑187926 | Correction of RRM IncMon TC 4.2.10 | Ericsson | imported from 3GU |
| R5‑187927 | Correction of RRM IncMon TC 4.2.11 | Ericsson | imported from 3GU |
| R5‑187928 | Correction of RRM IncMon TC 4.3.1.5 | Ericsson | imported from 3GU |
| R5‑187929 | Correction of RRM IncMon TC 4.3.2A | Ericsson | imported from 3GU |
| R5‑187930 | Correction of RRM IncMon TC 4.3.3A | Ericsson | imported from 3GU |
| R5‑187931 | Correction of RRM IncMon TC 4.3.4.4 | Ericsson | imported from 3GU |
| R5‑187932 | Correction of RRM IncMon TC 8.4.8 | Ericsson | imported from 3GU |
| R5‑187933 | Correction of RRM IncMon TC 8.4.9 | Ericsson | imported from 3GU |
| R5‑187934 | Correction of RRM IncMon TC 8.5.8 | Ericsson | imported from 3GU |
| R5‑187935 | Correction of RRM IncMon TC 8.6.3 | Ericsson | imported from 3GU |
| R5‑187936 | Correction of RRM IncMon TC 8.7.5 | Ericsson | imported from 3GU |
| R5‑187937 | Correction of RRM IncMon TC 8.7A.1 | Ericsson | imported from 3GU |
| R5‑187938 | Cell Configuration for IncMon RRM Test Cases | Ericsson | imported from 3GU |
| R5‑187939 | New rows in Annex F tables for IncMon RRM Test Cases | Ericsson | imported from 3GU |
| R5‑187940 | Addition of new Test Configuration on TC 6.2.2A.2 | DEKRA | imported from 3GU |
| R5‑187941 | Addition of new Test Configuration on TC 6.2.3A.2 | DEKRA | imported from 3GU |
| R5‑187942 | Addition of new Test Configuration on TC 6.2.3A.2_1 | DEKRA | imported from 3GU |
| R5‑187943 | Addition of new Test Configuration on TC 6.2.4A.2 | DEKRA | imported from 3GU |
| R5‑187944 | Addition of new Test Configuration on TC 6.2.5A.3 | DEKRA | imported from 3GU |
| R5‑187945 | Addition of new Test Configuration on TC 6.3.4A.1.2 | DEKRA | imported from 3GU |
| R5‑187946 | Addition of new Test Configuration on TC 6.3.5A.1.2 | DEKRA | imported from 3GU |
| R5‑187947 | Addition of new Test Configuration on TC 6.3.5A.3.2 | DEKRA | imported from 3GU |
| R5‑187948 | Addition of new Test Configuration on TC 6.5.2A.1.2 | DEKRA | imported from 3GU |
| R5‑187949 | Addition of new Test Configuration on TC 6.5.2A.1.2_1 | DEKRA | imported from 3GU |
| R5‑187950 | Addition of new Test Configuration on TC 6.5.2A.2.2 | DEKRA | imported from 3GU |
| R5‑187951 | Addition of new Test Configuration on TC 6.5.2A.3.2 | DEKRA | imported from 3GU |
| R5‑187952 | Addition of new Test Configuration on TC 6.6.1A.2 | DEKRA | imported from 3GU |
| R5‑187953 | Addition of new Test Configuration on TC 6.6.2.1A.2 | DEKRA | imported from 3GU |
| R5‑187954 | Addition of new Test Configuration on TC 6.6.2.2A.2_1 | DEKRA | imported from 3GU |
| R5‑187955 | Addition of new Test Configuration on TC 6.6.2.3A.2 | DEKRA | imported from 3GU |
| R5‑187956 | Addition of new Test Configuration on TC 6.6.2.3A.2_1 | DEKRA, CGC Inc. | imported from 3GU |
| R5‑187957 | Addition of new Test Configuration on TC 6.6.3.1A.2 | DEKRA | imported from 3GU |
| R5‑187958 | Addition of new Test Configuration on TC 6.7A.2 | DEKRA | imported from 3GU |
| R5‑187960 | CA_3A-41A-42C(1UL) - Updates of test points analysis | KDDI Corporation | imported from 3GU |
| R5‑187961 | CA_3A-41C-42A(1UL) - Updates of test points analysis | KDDI Corporation | imported from 3GU |
| R5‑187962 | CA_3A-41C-42C(1UL) - Updates of test points analysis | KDDI Corporation | imported from 3GU |
| R5‑187963 | Update the general sections for Rel-14 NB-IOT (Editorial) | CMCC, Huawei, HiSilicon | imported from 3GU |
| R5‑187964 | Update Rel-14 NB-IOT RRM test cases to support category NB2 | CMCC, Huawei, HiSilicon | imported from 3GU |
| R5‑187965 | Aligning CA delta TiB in sub-clause 6.2.5.3 with TS 36.101 v15.4.0 | Ericsson, Bureau Veritas, Anritsu | imported from 3GU |
| R5‑187966 | Aligning CA delta RiB in sub-clause 7.3.3 with TS 36.101 v15.4.0 | Ericsson, Bureau Veritas, Anritsu | imported from 3GU |
| R5‑187967 | Correction in TC 7.3A.3 for CA configuration CA_2A-71A | CETECOM GmbH | imported from 3GU |
| R5‑187968 | Correction in TC 7.3A.5 for CA configuration CA_2A-66A-71A | CETECOM GmbH | imported from 3GU |
| R5‑187969 | Update for reference sensitivity TP analysis for CA_2A-66A-71A CA configuration | CETECOM GmbH | imported from 3GU |
| R5‑187970 | Change of applicability in UL 64QAM MPR and A-MPR tests due to UL 256QAM support | CETECOM GmbH | imported from 3GU |
| R5‑187971 | Change of applicability in UL 64QAM A-SEM and ACLR and Additional spurious tests due to UL 256QAM support | CETECOM GmbH | imported from 3GU |
| R5‑187972 | Addition of new UL 256QAM test case - MPR for inter-band | CETECOM GmbH | imported from 3GU |
| R5‑187973 | Addition of new UL 256QAM test case - Annex F | CETECOM GmbH | imported from 3GU |
| R5‑187974 | Introduction of Power Class 1 for B31 and B72 | Airbus DS SLC | imported from 3GU |
| R5‑187975 | Introduction of Power Class 1 for B31 and B72 | Airbus DS SLC | imported from 3GU |
| R5‑187976 | Introduction of the support of ProSe for B72 | Airbus DS SLC | imported from 3GU |
| R5‑187977 | Introduction of the support of ProSe for B72 | Airbus DS SLC | imported from 3GU |
| R5‑187978 | Introduction of B68 in ProSe test frequencies table | Airbus DS SLC | imported from 3GU |
| R5‑187979 | Correction to TC 7.7B Spurious response for UL-MIMO | CMCC | imported from 3GU |
| R5‑187980 | Updating test case 6.2.4A.2 Additional Maximum Power Reduction (A-MPR) for CA (inter-band DL CA and UL CA) | Intel Corporation (UK) Ltd | imported from 3GU |
| R5‑187981 | Addition of B72 for test cases with 5MHz channel bandwidth | Airbus DS SLC | imported from 3GU |
| R5‑187982 | Addition of B72 for test cases with 5MHz channel bandwidth | Airbus DS SLC | imported from 3GU |
| R5‑187983 | Editorial Changes for TS 37.571-1 | PCTEST Engineering Lab | imported from 3GU |
| R5‑187984 | Updated RF clause 9.8 to cover Cat-M2 requirement | Bureau Veritas | imported from 3GU |
| R5‑187985 | Updated RRM clause 5 tests to cover Cat-M2 requirement | Bureau Veritas | imported from 3GU |
| R5‑187986 | Updated RRM clause 6 tests to cover Cat-M2 requirement | Bureau Veritas | imported from 3GU |
| R5‑187987 | Updated RRM clause 7 tests to cover Cat-M2 requirement | Bureau Veritas | imported from 3GU |
| R5‑187988 | Align CA information in clause 7.3A.0 with TS36.101 v15.4.0 | Bureau Veritas | imported from 3GU |
| R5‑187989 | Added ICS item for missing Category DL and UL | Bureau Veritas | imported from 3GU |
| R5‑187990 | Update of test case 9.6.1.1_A.4 | TTA, Bureau Veritas | imported from 3GU |
| R5‑187991 | Alignment of 256QAM EVM Test Tolerance between LTE and NR | Intel Deutschland GmbH | imported from 3GU |
| R5‑187992 | Updating test case 6.6.2.2 Additional spectrum emission mask and test case 6.6.3.3 Additional spurious emission | Intel Corporation (UK) Ltd | imported from 3GU |
| R5‑187993 | Update NB-IOT Random Access test cases 6.2.16, 6.2.17 and 6.2.18 | Huawei, HiSilicon | imported from 3GU |
| R5‑187994 | Update 8.16.78 to add TT information | Huawei, HiSilicon | imported from 3GU |
| R5‑187995 | On RRM test case numbering | ROHDE & SCHWARZ | imported from 3GU |
| R5‑187996 | TP on new RRM 5G Test Cases 6.7.1.1 and 6.7.1.2 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑187997 | New RRM 5G Test Cases 4.6.2.1 – 4.6.2.8 | Ericsson | imported from 3GU |
| R5‑187998 | New RRM 5G Test Cases 5.6.2.1 – 5.6.2.4 | Ericsson | imported from 3GU |
| R5‑187999 | New RRM 5G Test Cases 6.6.2.1 – 6.6.2.8 | Ericsson | imported from 3GU |
| R5‑188000 | New RRM 5G Test Cases 7.6.2.1 – 7.6.2.4 | Ericsson | imported from 3GU |
| R5‑188001 | TP for addition of NR RRM TC 4.4.1.1 EN-DC FR1 UE transmit timing accuracy | Qualcomm Japan Inc | imported from 3GU |
| R5‑188002 | TP on new RRM 5G Test Cases 4.7.1.1 and 4.7.1.2 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑188003 | On RRM FR1 MU and TT analysis | ROHDE & SCHWARZ | imported from 3GU |
| R5‑188004 | On RRM test frequency selection for FR1 and FR2 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑188005 | TP on Annexes for TS 38.533 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑188006 | new TC for PDSCH FR1 demod | Qualcomm Finland RFFE Oy | imported from 3GU |
| R5‑188007 | discussion on demod spec structure | Qualcomm Finland RFFE Oy | imported from 3GU |
| R5‑188008 | new TC for PDSCH FR2 demod | Qualcomm Finland RFFE Oy | imported from 3GU |
| R5‑188009 | pCR for new TC addition for FR1 FDD PDSCH Demod | Qualcomm CDMA Technologies | imported from 3GU |
| R5‑188010 | pCR for new TC addition for FR1 FDD PDCCH Demod | Qualcomm CDMA Technologies | imported from 3GU |
| R5‑188011 | pCR for Addition of Test Case 4.4.3.1 EN-DC FR1 timing advance adjustment accuracy | Qualcomm CDMA Technologies | imported from 3GU |
| R5‑188012 | Introduction of New test case 6.4B.2.2.3 In-band Emissions for intra-band non-contiguous EN-DC | KTL | imported from 3GU |
| R5‑188013 | Addition OBW intra-band contiguous EN-DC | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑188014 | Addition SEM intra-band contiguous EN-DC | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑188015 | Additonal Spurious Emissions for Intra-band contiguous EN-DC | Qualcomm Incorporated | imported from 3GU |
| R5‑188016 | Additonal Spurious Emissions for Intra-band non-contiguous EN-DC | Qualcomm Incorporated | imported from 3GU |
| R5‑188017 | Additonal Spurious emission for inter-band EN-DC | Qualcomm Incorporated | imported from 3GU |
| R5‑188018 | Spurious emission band UE co-existence for intra-band non-contiguous EN-DC | Qualcomm Incorporated | imported from 3GU |
| R5‑188019 | Introduction of In-band Emissions for intra-band contiguous EN-DC | LG Electronics | imported from 3GU |
| R5‑188020 | Addition of TC6.3B.3.1 Tx ON/OFF time mask for intra-band contiguous EN-DC | SGS Wireless | imported from 3GU |
| R5‑188021 | Addition of TC6.3B.3.2 Tx ON/OFF time mask for intra-band non-contiguous EN-DC | SGS Wireless | imported from 3GU |
| R5‑188022 | Addition of TC6.3B.3.3 Tx ON/OFF time mask for inter-band EN-DC within FR1 | SGS Wireless | imported from 3GU |
| R5‑188023 | Update of test case 6.5B.2.1.2 Additional spectrum emission mask for intra-band contigous EN-DC for NS_04 | Ericsson-LG Co., LTD | imported from 3GU |
| R5‑188024 | Update of test case 6.2B.3.1 UE A-MPR for Intra-band contiguous EN-DC for NS_04 | Ericsson-LG Co., LTD | imported from 3GU |
| R5‑188025 | Update Clause 7.5B.3 in TS 38.521-3 | CMCC | imported from 3GU |
| R5‑188026 | 5G NR_EN_DC with FR1_Text update for Inter-Band RX sensitivity | Qualcomm Inc | imported from 3GU |
| R5‑188027 | Update TC 7.4B.3 | Huawei, Hisilicon | imported from 3GU |
| R5‑188028 | Updates of MU in TS 38.521-3 Annex F during RAN5#81 | NTT DOCOMO, INC. | imported from 3GU |
| R5‑188029 | Updates of TT in TS 38.521-3 Annex F during RAN5#81 | NTT DOCOMO, INC. | imported from 3GU |
| R5‑188030 | Necessity for functional testing in RAN5 | NTT DOCOMO, INC. | imported from 3GU |
| R5‑188031 | Addition of 2TX_UL_MIMO condition | Huawei, Hisilicon | imported from 3GU |
| R5‑188032 | Addition of 6.3D.4.1 Absolute Power tolerance for UL-MIMO | China Telecommunications | imported from 3GU |
| R5‑188033 | Addition of 6.3D.4.2 Relative Power Tolerance for UL-MIMO | China Telecommunications | imported from 3GU |
| R5‑188034 | Addition of 6.3D.4.3 Aggregate Power tolerance for UL-MIMO | China Telecommunications | imported from 3GU |
| R5‑188035 | Update to FR1 test case 6.3.3.4 PRACH time mask | KTL | imported from 3GU |
| R5‑188036 | Adding TT to Aggregate Power Tolerance TC | Intel Corporation (UK) Ltd | imported from 3GU |
| R5‑188037 | Removing the Editor's notes of SA messages and procedures for all FR2 test cases | Huawei, HiSilicon | imported from 3GU |
| R5‑188038 | FR2 downlink signal level(38.521-2) | Anritsu | imported from 3GU |
| R5‑188039 | LTE Anchor Link configuration for FR2 | Anritsu | imported from 3GU |
| R5‑188040 | Correction of RB allocation for 3DL_CA_1A-3A-41A | Qualcomm Incorporated | imported from 3GU |
| R5‑188041 | Addition CA 2A2A29A and CA 2A2A29A30A 36.521-2 | ECIT, CAICT, Tejet | imported from 3GU |
| R5‑188042 | Addition CA 2A29A66A 36.521-2 | ECIT, CAICT, Tejet | imported from 3GU |
| R5‑188043 | Addition CA 2A30A66A66A 36.521-2 | ECIT, CAICT, Tejet | imported from 3GU |
| R5‑188044 | Addition CA 7A66A and CA 2A7A66A 36.521-2 | ECIT, CAICT, Tejet | imported from 3GU |
| R5‑188045 | Addition CA 2A2A7A and CA 2A2A7A66A 36.521-2 | ECIT, CAICT, Tejet | imported from 3GU |
| R5‑188046 | Addition CA 2A2A14A and CA 2A2A14A30A and CA 2A2A14A66A and CA 2A2A14A30A66A 36.521-2 | ECIT, CAICT, Tejet | imported from 3GU |
| R5‑188047 | Addition CA 2A12A30A66A66A 36.521-2 | ECIT, CAICT | imported from 3GU |
| R5‑188048 | CA 2A14A30A66A66A 36.521-2 | ECIT, CAICT, Tejet | imported from 3GU |
| R5‑188049 | Addition CA 2A14A66A66A and CA 2A2A14A66A66A 36.521-2 | ECIT, CAICT, Tejet | imported from 3GU |
| R5‑188050 | Addition CA 2A29A30A66A 36.521-2 | ECIT, CAICT | imported from 3GU |
| R5‑188051 | Correction to the MU for UL CA | Anritsu | imported from 3GU |
| R5‑188052 | Editorial correction to FS3 RRM clause 8 Tests | Anritsu | imported from 3GU |
| R5‑188053 | MPR for CA (intra-band contiguous DL CA and UL CA) | Sprint Corporation | imported from 3GU |
| R5‑188054 | Further LS on Carrier Aggregation RF Receiver test cases optimization | TSG WG RAN5 | imported from 3GU |
| R5‑188055 | Discussion on Mid test channel bandwidth in Band n257 | NTT DOCOMO, INC. | imported from 3GU |
| R5‑188056 | NR FR2 TT Proposal | Telecom Italia, AT&T, China Mobile, China Telecom, China Unicom, DISH Network, Orange, Sprint, Vodafone | imported from 3GU |
| R5‑188057 | Consideration of TT values in different frequency ranges for FR2 | Apple Inc., Intel Corporation, vivo, Huawei, Hisilicon | imported from 3GU |
| R5‑188058 | NR FR2 TT Way Forward | Telecom Italia, Orange, Vodafone, CMCC, China Unicom, Qualcomm, AT&T, Ericsson, NTT DoCoMo, Verizon, Dish, Intel, Apple | imported from 3GU |
| R5‑188059 | Addition of descriptions on new MU contributions | Anritsu | imported from 3GU |
| R5‑188060 | Update of MU budget and contributor description to TR 38.903 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑188061 | Discussion on Measurement Uncertainty in FR2 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑188062 | TRP uncertainties correction | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑188063 | Update of FR2 6.3.2 Transmit OFF power | CAICT, Huawei | imported from 3GU |
| R5‑188065 | Meeting notes of offline discussion on FR2 MU contributors | Anritsu | imported from 3GU |
| R5‑188066 | Update TC 6.6.3G.2_1 | Huawei, HiSilicon | imported from 3GU |
| R5‑188100 | Update of 5G-NR test cases applicability | Qualcomm Incorporated, Motorola Mobility, MCC TF160, Huawei, HiSilicon, Rohde & Schwarz, Intertek | imported from 3GU |
| R5‑188101 | CR of 5G_NR_NAS_Applicability | Huawei, Hisilicon | imported from 3GU |
| R5‑188102 | Correction to Selection Expressions | Motorola Mobility, MCC TF160 | imported from 3GU |
| R5‑188103 | Update of applicability and selection expressions | Motorola Mobility, MCC TF160 | imported from 3GU |
| R5‑188104 | Adding new test case applicability | MediaTek Inc. | imported from 3GU |
| R5‑188105 | EN-DC test model handling of different types of bearers | MCC TF160 | imported from 3GU |
| R5‑188106 | SA Option2: Initial Test Model aspects | MCC TF160 | imported from 3GU |
| R5‑188107 | Updates to PDU session establishment 5GSM messages | Ericsson | imported from 3GU |
| R5‑188108 | Addition CA 2A2A29A and CA 2A2A29A30A 36.523-2 | ECIT | imported from 3GU |
| R5‑188109 | Addition CA 2A29A66A 36.523-2 | ECIT | imported from 3GU |
| R5‑188110 | Addition CA 2A30A66A66A 36.523-2 | ECIT | imported from 3GU |
| R5‑188111 | Addition CA 7A66A and CA 2A7A66A 36.523-2 | ECIT | imported from 3GU |
| R5‑188112 | Addition CA 2A2A7A and CA 2A2A7A66A 36.523-2 | ECIT, CAICT, Tejet | imported from 3GU |
| R5‑188113 | Addition CA 2A2A14A and CA 2A2A14A30A and CA 2A2A14A66A and CA 2A2A14A30A66A 36.523-2 | ECIT, CAICT, Tejet | imported from 3GU |
| R5‑188114 | Addition CA 2A12A30A66A66A 36.523-2 | ECIT, CAICT, Tejet | imported from 3GU |
| R5‑188115 | Addition CA 2A14A30A66A66A 36.523-2 | ECIT, CAICT, Tejet | imported from 3GU |
| R5‑188116 | Addition CA 2A14A66A66A and CA 2A2A14A66A66A 36.523-2 | ECIT, CAICT, Tejet | imported from 3GU |
| R5‑188117 | Addition CA 2A29A30A66A 36.523-2 | ECIT, CAICT, Tejet | imported from 3GU |
| R5‑188118 | Alignments of UE Test Loop Mode H description | MCC TF160 | imported from 3GU |
| R5‑188119 | Alignments of UE Test Loop Mode H description | MCC TF160 | imported from 3GU |
| R5‑188120 | Alignments of UE Test Loop Mode H description | MCC TF160 | imported from 3GU |
| R5‑188121 | Correction to eMDT2 test case 8.6.1.3 | Intel Corporation (UK) Ltd, Keysight Technologies UK Ltd., Keysight | imported from 3GU |
| R5‑188122 | Update chapter 4.5.2 RRC_IDLE | Ericsson | imported from 3GU |
| R5‑188123 | Update chapter 4.5.4 RRC_CONNECTED | Ericsson | imported from 3GU |
| R5‑188124 | Addition of general test procedures for 5GC testing | CATT, TDIA | imported from 3GU |
| R5‑188125 | Add PICS for 5GMM implementation cabilities | MediaTek Inc. | imported from 3GU |
| R5‑188126 | Addition of NR test case 6.1.1.2_PLMN selection of Other PLMN | Huawei, Hisilicon | imported from 3GU |
| R5‑188127 | Addition of NR test case 6.1.1.3_Cell reselection of ePLMN | Huawei, Hisilicon | imported from 3GU |
| R5‑188128 | Addition of NR test case 6.1.1.4_PLMN selection in shared network environment | Huawei, Hisilicon | imported from 3GU |
| R5‑188129 | Addition of NR test case 6.1.1.5_PLMN selection | Huawei, Hisilicon | imported from 3GU |
| R5‑188130 | Addition of NR test case 6.1.2.1_Cell selection_Qrxlevmin | Huawei, Hisilicon | imported from 3GU |
| R5‑188131 | Addition of NR test case 6.1.2.2_Cell selection_Qqualmin | Huawei, Hisilicon | imported from 3GU |
| R5‑188132 | Addition of NR test case 6.1.2.3_Cell selection_Serving cell bar | Huawei, Hisilicon | imported from 3GU |
| R5‑188133 | Addition of NR test case 6.1.2.4_Cell selection_Serving cell Squal below Zero | Huawei, Hisilicon | imported from 3GU |
| R5‑188134 | Addition of NR test case 6.1.2.5_Cell Reselection | Huawei, Hisilicon | imported from 3GU |
| R5‑188135 | Addition of NR test case 6.1.2.6_Cell Reselection for interband operation | Huawei, Hisilicon | imported from 3GU |
| R5‑188136 | Addition of NR test case 6.1.2.9_Cell Reselection using Qhyst, Qoffset and Treselection | Huawei, Hisilicon | imported from 3GU |
| R5‑188137 | Addition of NR test case 6.1.2.20_Inter-frequency cell reselection according to priority | Huawei, Hisilicon | imported from 3GU |
| R5‑188138 | Addition of NR test case 6.1.2.21_Cell reselection,SIntra SearchQ and SnonIntraSeqrchQ | Huawei, Hisilicon | imported from 3GU |
| R5‑188139 | Addition of NR test case 6.1.2.22_Inter-frequency cell reselection with parameters ThreshX, HighQ, ThreshX, LowQ and ThreshServing, LowQ | Huawei, Hisilicon | imported from 3GU |
| R5‑188140 | Addition of NR test case 7.1.1.2.4_BCCH HARQ | Huawei, Hisilicon | imported from 3GU |
| R5‑188141 | CR of NR test case 7.1.1.1.4_Beam Failure | Huawei, Hisilicon | imported from 3GU |
| R5‑188142 | CR of NR test case 7.1.1.3.7_Power Headroom Reporting | Huawei, Hisilicon | imported from 3GU |
| R5‑188143 | CR of NR test case 7.1.1.5.4_DRX | Huawei, Hisilicon | imported from 3GU |
| R5‑188144 | CR of NR test case 7.1.1.6.1_Correct handling of DL assignmentSemi persistent | Huawei, Hisilicon | imported from 3GU |
| R5‑188145 | CR of NR test case 7.1.1.6.2_configured grant Type 1 | Huawei, Hisilicon | imported from 3GU |
| R5‑188146 | CR of NR test case 7.1.1.6.3_configured grant Type 2 | Huawei, Hisilicon | imported from 3GU |
| R5‑188147 | Addition of NR test case 8.1.1.1.2_Paging | Huawei, Hisilicon | imported from 3GU |
| R5‑188148 | Addition of NR test case 8.1.1.2.1_RRC connection establishment | Huawei, Hisilicon | imported from 3GU |
| R5‑188149 | Addition of NR test case 8.1.3.1.1_Event A1 | Huawei, Hisilicon | imported from 3GU |
| R5‑188150 | New NAS test case 9.1.5.1.2 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑188151 | New NAS test case 9.1.6.1.4 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑188152 | Addition of new 5GC TC 9.1.5.1.10 | CAICT | imported from 3GU |
| R5‑188153 | Addition of new 5GC TC 9.1.5.1.11 | CAICT | imported from 3GU |
| R5‑188154 | Addition of new 5GC TC 9.1.6.1.6 | MediaTek Inc. | imported from 3GU |
| R5‑188155 | Addition of new 5GC TC 9.1.6.2.8 | MediaTek Inc. | imported from 3GU |
| R5‑188156 | Addition of new 5GC TC 9.1.6.2.10 | MediaTek Inc. | imported from 3GU |
| R5‑188157 | Addition of new 5GS mobility management TC 9.1.7.1 | Tejet,ZTE,SRTC | imported from 3GU |
| R5‑188158 | Addition of new 5GS mobility management TC 9.1.7.2 | Tejet,ZTE,SRTC | imported from 3GU |
| R5‑188159 | Addition of NR test case 9.1.5.1.1_Registration Request | Huawei, Hisilicon, CAICT, CATT, Samsung, TF160, R&S, Motorola, Ericsson, Qualcomm | imported from 3GU |
| R5‑188160 | Addition of new TC 9.1.8.4 | Starpoint, TDIA, CATT | imported from 3GU |
| R5‑188161 | Addition of new TC 9.1.8.6 | Starpoint, TDIA, CATT | imported from 3GU |
| R5‑188162 | Addition of new 5GC TC 9.1.5.2.2 | CATT, TDIA | imported from 3GU |
| R5‑188163 | Addition of new TC 9.1.8.7 | Starpoint, TDIA, CATT | imported from 3GU |
| R5‑188164 | Addition of new TC 9.1.8.11 | Starpoint, TDIA, CATT | imported from 3GU |
| R5‑188165 | Addition of new 5GC TC 9.1.2.1 | TDIA, CATT | imported from 3GU |
| R5‑188166 | Addition of new 5GC TC 9.1.8.13 | CAICT | imported from 3GU |
| R5‑188167 | Addition of new 5GC TC 9.1.8.17 | CAICT | imported from 3GU |
| R5‑188168 | Addition of new 5GC TC 10.1.3.4 | CAICT | imported from 3GU |
| R5‑188169 | Addition of new 5GC TC 10.1.3.5 | CAICT | imported from 3GU |
| R5‑188170 | Addition of new 5GC TC 10.1.3.6 | CAICT | imported from 3GU |
| R5‑188171 | Addition of new 5GC TC 10.1.3.7 | CAICT | imported from 3GU |
| R5‑188172 | Addition of new 5GC TC 10.1.3.8 | CAICT | imported from 3GU |
| R5‑188173 | Addition of new 5GC TC 10.1.6.1 | CAICT | imported from 3GU |
| R5‑188174 | Addition of new 5GC TC 10.1.6.2 | CAICT | imported from 3GU |
| R5‑188175 | Addition of new 5GC TC 10.1.6.3 | CAICT | imported from 3GU |
| R5‑188176 | Addition of 5GC Test case 10.1.4.1 | ANRITSU LTD | imported from 3GU |
| R5‑188177 | Addition of 5GC test case 10.1.2.1 | CATT, TDIA | imported from 3GU |
| R5‑188178 | Addition of 5GC Test case 10.1.5.1 | TDIA, CATT | imported from 3GU |
| R5‑188179 | CR of 5G_NR_Applicability | Huawei, Hisilicon | imported from 3GU |
| R5‑188180 | Update of 5G-NR test cases applicability | Qualcomm Incorporated, Motorola Mobility, MCC TF160, Huawei, HiSilicon, Rohde & Schwarz, Intertek | imported from 3GU |
| R5‑188181 | Golden SIG test cases for SA option 2 | MCC TF160 | imported from 3GU |
| R5‑188182 | Review deadlines for next quarter | WG Chairman | imported from 3GU |
| R5‑188183 | Draft TS 38.533 v0.1.0 | ROHDE & SCHWARZ | imported from 3GU |
| R5‑188184 | LS on the testability of FR2 transmitter and reception tests | TSG WG RAN5 | imported from 3GU |
| R5‑188185 | Reply LS to 5G/NR UE Conformance Test applicability for 5G S-Modules | TSG WG RAN5 | imported from 3GU |
| R5‑188186 | draft RAN5#81 meeting report | ETSI Secretariat | imported from 3GU |
| R5‑188187 | Correction to NR MAC DRX test cases 7.1.1.5.1 and 7.1.1.5.2 | ANRITSU LTD | imported from 3GU |
| R5‑188188 | Addition of NR test case 8.1.1.3.1_Redirection to NR | Huawei, Hisilicon | imported from 3GU |
| R5‑188189 | On the FR2 MU for occupied BW and ACLR | Anritsu | imported from 3GU |
| R5‑188190 | Addition of NR test case 8.2.3.11.2_gapFR2 | Huawei, Hisilicon | imported from 3GU |
| R5‑188191 | Addition of 5GC test case 10.1.3.1 | CATT, TDIA, CAICT | imported from 3GU |
| R5‑188192 | Addition of NR test case 7.1.1.2.4_BCCH HARQ | Huawei, Hisilicon | imported from 3GU |
| R5‑188193 | Correcton to Layer 2 Pre Test conditions | Motorola Mobility | imported from 3GU |
| R5‑188194 | Addition of NR test case 8.1.3.1.1_Event A1 | Huawei, Hisilicon | imported from 3GU |
| R5‑188195 | Update to 5G TC TA registration update | Samsung | imported from 3GU |
| R5‑188196 | Addition of test applicabilities for 5GC testcases | CATT | imported from 3GU |
| R5‑188197 | Update of 5G-NR test cases applicability | Qualcomm Incorporated, Motorola Mobility, MCC TF160, Huawei, HiSilicon, Rohde & Schwarz, Intertek | imported from 3GU |
| R5‑188198 | Applicability for NR NSA Option 3 protocol tests | ROHDE & SCHWARZ | imported from 3GU |
| R5‑188199 | Removal of the test applicability for testcase 7.1.4.36 | CATT | imported from 3GU |
| R5‑188200 | Correction to NB-IoT Test case 22.3.1.9 | TDIA, MCC TF160, CATT | imported from 3GU |
| R5‑188201 | Correction to eMDT2 test case 8.6.1.3 | Intel Corporation (UK) Ltd, Keysight Technologies UK Ltd., Keysight | imported from 3GU |
| R5‑188202 | Update of 5GS NR RRC test case 8.2.1.1.1 | ROHDE & SCHWARZ, Qualcomm | imported from 3GU |
| R5‑188203 | Addition of 5GC test case 10.1.3.1 | CATT, TDIA, CAICT | imported from 3GU |
| R5‑188204 | Applicability and ICS for CA RF and RRM test cases | Ericsson, Rohde & Schwarz, Huawei, HiSilicon, KTL, SGS Wireless | imported from 3GU |
| R5‑188205 | Updates to Annex B to add Permitted OTA Test Methods | PCTEST Engineering Lab | imported from 3GU |
| R5‑188206 | Introduction of New FR1 test case 6.3.3.7 PUSCH-PUCCH and PUSCH-SRS time masks | MTCC, KTL | imported from 3GU |
| R5‑188207 | 5G_FR1 Text update for 7.3A Reference sensitivity for CA | Qualcomm Inc. | imported from 3GU |
| R5‑188208 | Updates of MU in TS 38.521-1 Annex F during RAN5#81 | NTT DOCOMO, INC. | imported from 3GU |
| R5‑188209 | Updates of TT in TS 38.521-1 Annex F during RAN5#81 | NTT DOCOMO, INC. | imported from 3GU |
| R5‑188210 | TDD configuration for UE Tx test in FR1 | Ericsson | imported from 3GU |
| R5‑188211 | Core alignment CR to capture TS 38.101-1 updates during RAN4#89 | NTT DOCOMO, INC. | imported from 3GU |
| R5‑188212 | Updates to maximum output power test cases | Ericsson | imported from 3GU |
| R5‑188213 | Update of FR2 test case 7.4 | CAICT, Anritsu, Huawei | imported from 3GU |
| R5‑188214 | Updates of TT in TS 38.521-2 Annex F during RAN5#81 | NTT DOCOMO, INC. | imported from 3GU |
| R5‑188215 | TDD configuration for UE Tx test in FR2 | Ericsson | imported from 3GU |
| R5‑188216 | Core alignment CR to capture TS 38.101-2 updates during RAN4#89 | NTT DOCOMO, INC. | imported from 3GU |
| R5‑188217 | On measurement grids | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑188218 | Update to Annex K | Qualcomm Austria RFFE GmbH | imported from 3GU |
| R5‑188219 | Introduction of receiver spurious emission tests for FR1 inter-band EN-DC | Anritsu | imported from 3GU |
| R5‑188220 | Introduction of wideband intermodulation tests for FR1 inter-band EN-DC | Anritsu | imported from 3GU |
| R5‑188221 | LTE TDD configuration for UE Tx test in EN-DC | Ericsson | imported from 3GU |
| R5‑188222 | Core alignment CR to capture TS 38.101-3 updates during RAN4#89 | NTT DOCOMO, INC. | imported from 3GU |
| R5‑188223 | Applicability for RRM NR tests | ROHDE & SCHWARZ | imported from 3GU |
| R5‑188224 | Update MU budget in TR 38.903 | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑188225 | Update of MU budget tables in TR 38.903 | Anritsu | imported from 3GU |
| R5‑188226 | Addition of descriptions on new MU contributions | Anritsu | imported from 3GU |
| R5‑188227 | Test Point analysis for FR2 Maximum Output Power | Ericsson | imported from 3GU |
| R5‑188228 | Consideration on MU contribution caused by antenna switching | Anritsu | imported from 3GU |
| R5‑188229 | SNR estimation for low PSD tests | Anritsu | imported from 3GU |
| R5‑188230 | On Quality of Quiet Zone Evaluation for Spurious Emissions Test Cases | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑188231 | TRP uncertainties correction | Keysight Technologies UK Ltd | imported from 3GU |
| R5‑188232 | Discussion on TS38.521-2 Annex K restructuring | Qualcomm Austria RFFE GmbH | imported from 3GU |
| R5‑188233 | Introduction of FD-MIMO test cases in Annexes | Ericsson | imported from 3GU |
| R5‑188234 | Maximum Output Power for CA | Sprint Corporaton | imported from 3GU |
| R5‑188235 | MPR for CA (intra-band contiguous DL CA and UL CA) | Sprint Corporation | imported from 3GU |
| R5‑188236 | Correction to tested CA configuration selection criteria for Rx tests | Bureau Veritas, Ericsson | imported from 3GU |
| R5‑188237 | Correction to 8.26.7 FS3 Intra-frequency event triggered reporting | Anritsu | imported from 3GU |
| R5‑188238 | Addition to E-UTRA test frequencies for intra-band contiguous configuration for band 41 | Ericsson, Sprint | imported from 3GU |
| R5‑188239 | Updates of MU in TS 38.521-2 Annex F during RAN5#81 | NTT DOCOMO, INC. | imported from 3GU |
| R5‑188240 | Update of TR 38.905 with EN-DC A-MPR test point analyses, NS_04 | Ericsson-LG Co., LTD | imported from 3GU |
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